Electron microscope

- JEOL Ltd.
Skip to: Description  ·  Claims  ·  References Cited  · Patent History  ·  Patent History
Description

FIG. 1 is a frontward perspective view of an electron microscope showing my new design;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a rear elevational view thereof;

FIG. 4 is a right side elevational view thereof;

FIG. 5 is a left side elevational view thereof;

FIG. 6 is a top plan view thereof;

FIG. 7 is a bottom plan view thereof;

FIG. 8 is a cross-sectional view thereof taken along line A-A in FIG. 2;

FIG. 9 is an enlarged view thereof showing details enclosed by lines B-B and C-C in FIG. 8; and,

FIG. 10 is another front view thereof.

Portions of the electron microscope shown in dashed lines in FIGS. 1-10 depict unclaimed portions of the electron microscope that are included for environmental purposes only.

The broken lines with long dashes in FIG. 9 are for illustrative purposes showing boundaries of the enlarged view of FIG. 9 and form no part of the claimed design.

The broken lines in FIG. 10 depict a Light Emitting Diode (LED) of the electron microscope and form no part of the claimed design.

Claims

The ornamental design for an electron microscope, as shown and described.

Referenced Cited
U.S. Patent Documents
D625749 October 19, 2010 Oonuma
D632323 February 8, 2011 Oonuma
D633538 March 1, 2011 Oonuma
D708245 July 1, 2014 Matoba
D1042788 September 17, 2024 Church
Foreign Patent Documents
D1784907 November 2024 JP
Other references
  • BioSpace Jeol New Electron Microscope, earliest picturedMay 29, 2024, [online], [site visitedSep. 18, 2025]. Available via Internet, <URL: https://www.biospace.com/jeol-a-useful-tool-for-every-user-new-electron-microscope-jem-120i-released> (Year: 2024).
  • Research and Health Science Education Transmission Electron Microscopy, earliest picturedOct. 14, 2023, [online], [site visitedSep. 18, 2025]. Available via Internet, <URL:https://rhse.temertymedicine.utoronto.ca/transmission-electron-microscopy-tem> (Year: 2023).
  • Biospace Cryo Electron Micrscope, earliest picturedOct. 2016, [online], [site visitedSep. 18, 2025]. Available via Internet, <URL:https://www.biospace.com/jeol-a-useful-tool-for-every-user-new-electron-microscope-jem-120i-released> (Year: 2016).
  • Design U.S. Appl. No. 29/955,844, filed Aug. 5, 2024.
  • Design U.S. Appl. No. 29/955,853, filed Aug. 5, 2024.
Patent History
Patent number: D1109207
Type: Grant
Filed: Aug 5, 2024
Date of Patent: Jan 13, 2026
Assignee: JEOL Ltd. (Tokyo)
Inventor: Yuji Yamazaki (Tokyo)
Primary Examiner: Joseph Kukella
Assistant Examiner: Breana Copeland
Application Number: 29/955,850
Classifications
Current U.S. Class: Microscope (D16/131)