Electron microscope
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Portions of the electron microscope shown in dashed lines in
The broken lines with long dashes in
The broken lines in
Claims
The ornamental design for an electron microscope, as shown and described.
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| D632323 | February 8, 2011 | Oonuma |
| D633538 | March 1, 2011 | Oonuma |
| D708245 | July 1, 2014 | Matoba |
| D1042788 | September 17, 2024 | Church |
| D1784907 | November 2024 | JP |
- BioSpace Jeol New Electron Microscope, earliest picturedMay 29, 2024, [online], [site visitedSep. 18, 2025]. Available via Internet, <URL: https://www.biospace.com/jeol-a-useful-tool-for-every-user-new-electron-microscope-jem-120i-released> (Year: 2024).
- Research and Health Science Education Transmission Electron Microscopy, earliest picturedOct. 14, 2023, [online], [site visitedSep. 18, 2025]. Available via Internet, <URL:https://rhse.temertymedicine.utoronto.ca/transmission-electron-microscopy-tem> (Year: 2023).
- Biospace Cryo Electron Micrscope, earliest picturedOct. 2016, [online], [site visitedSep. 18, 2025]. Available via Internet, <URL:https://www.biospace.com/jeol-a-useful-tool-for-every-user-new-electron-microscope-jem-120i-released> (Year: 2016).
- Design U.S. Appl. No. 29/955,844, filed Aug. 5, 2024.
- Design U.S. Appl. No. 29/955,853, filed Aug. 5, 2024.
Type: Grant
Filed: Aug 5, 2024
Date of Patent: Jan 13, 2026
Assignee: JEOL Ltd. (Tokyo)
Inventor: Yuji Yamazaki (Tokyo)
Primary Examiner: Joseph Kukella
Assistant Examiner: Breana Copeland
Application Number: 29/955,850