Electron microscope

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Description

FIG. 1 is a front, top and right side perspective view of electron microscope showing our new design;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a rear elevational view thereof;

FIG. 4 is a left side elevational view thereof;

FIG. 5 is a right side elevational view thereof;

FIG. 6 is a top plan view thereof; and,

FIG. 7 is a bottom plan view thereof.

The broken lines form no part of the claimed design.

Claims

We claim the ornamental design for an electron microscope, as shown and described.

Referenced Cited
U.S. Patent Documents
D141832 July 1945 Holley
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D182698 April 1958 Wells
3551019 December 1970 Michel
D225580 December 1972 Reinecke
D299861 February 14, 1989 Hunsdale et al.
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D332616 January 19, 1993 Hashimoto et al.
D491272 June 8, 2004 Alden et al.
D527464 August 29, 2006 Ina et al.
D574280 August 5, 2008 Wakamatsu et al.
D591864 May 5, 2009 Schmidt
D607569 January 5, 2010 Yukikado et al.
Foreign Patent Documents
D11233735 March 2005 JP
Patent History
Patent number: D625749
Type: Grant
Filed: Jun 30, 2009
Date of Patent: Oct 19, 2010
Assignee: Hitachi High-Technologies Corporation (Tokyo)
Inventors: Mitsuru Oonuma (Tokyo), Akira Omachi (Komae), Masahiko Ajima (Hitachinaka), Tomohisa Ohtaki (Hitachinaka)
Primary Examiner: Paula Greene
Attorney: Antonelli, Terry, Stout & Kraus, LLP.
Application Number: 29/339,397
Classifications
Current U.S. Class: Microscope (D16/131)