Electron microscope
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Description
The broken lines form no part of the claimed design.
Claims
The ornamental design for an electron microscope, as shown and described.
Referenced Cited
U.S. Patent Documents
Other references
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Patent History
Patent number: D633538
Type: Grant
Filed: Mar 2, 2010
Date of Patent: Mar 1, 2011
Assignee: Hitachi High-Technologies Corporation (Tokyo)
Inventors: Mitsuru Oonuma (Tokyo), Akira Omachi (Komae), Masahiko Ajima (Hitachinaka), Tomohisa Ohtaki (Hitachinaka)
Primary Examiner: Paula Greene
Attorney: Antonelli, Terry, Stout & Kraus, LLP.
Application Number: 29/356,748
Type: Grant
Filed: Mar 2, 2010
Date of Patent: Mar 1, 2011
Assignee: Hitachi High-Technologies Corporation (Tokyo)
Inventors: Mitsuru Oonuma (Tokyo), Akira Omachi (Komae), Masahiko Ajima (Hitachinaka), Tomohisa Ohtaki (Hitachinaka)
Primary Examiner: Paula Greene
Attorney: Antonelli, Terry, Stout & Kraus, LLP.
Application Number: 29/356,748
Classifications
Current U.S. Class:
Microscope (D16/131)