Electron microscope

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Description

FIG. 1 is a front, top and right side perspective view of an electron microscope showing our new design;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a rear elevational view thereof;

FIG. 4 is a left side elevational view thereof;

FIG. 5 is a right side elevational view thereof;

FIG. 6 is a top plan view thereof; and,

FIG. 7 is a bottom plan view thereof.

The broken lines form no part of the claimed design.

Claims

The ornamental design for an electron microscope, as shown and described.

Referenced Cited
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Patent History
Patent number: D633538
Type: Grant
Filed: Mar 2, 2010
Date of Patent: Mar 1, 2011
Assignee: Hitachi High-Technologies Corporation (Tokyo)
Inventors: Mitsuru Oonuma (Tokyo), Akira Omachi (Komae), Masahiko Ajima (Hitachinaka), Tomohisa Ohtaki (Hitachinaka)
Primary Examiner: Paula Greene
Attorney: Antonelli, Terry, Stout & Kraus, LLP.
Application Number: 29/356,748
Classifications
Current U.S. Class: Microscope (D16/131)