Electron microscope
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The broken lines in
Portions of the electron microscope shown in dashed lines in
Claims
The ornamental design for an electron microscope, as shown and described.
| D625749 | October 19, 2010 | Oonuma |
| D632323 | February 8, 2011 | Oonuma |
| D633538 | March 1, 2011 | Oonuma |
| D708245 | July 1, 2014 | Matoba |
| D1042788 | September 17, 2024 | Church |
| D1784907 | November 2024 | JP |
- BioSpace Jeol New Electron Microscope, earliest pictured May 29, 2024, [online], [site visited Sep. 18, 2025]. Available via Internet, <URL: https://www.biospace.com/jeol-a-useful-tool-for-every-user-new-electron-microscope-jem-120i-released> (Year: 2024).
- Research and Health Science Education Transmission Electron Microscopy, earliest pictured Oct. 14, 2023, [online], [site visited Sep. 18, 2025]. Available via Internet, <URL:https://rhse.temertymedicine.utoronto.ca/transmission-electron-microscopy-tem> (Year: 2023).
- Biospace Cryo Electron Micrscope, earliest pictured Oct. 2016, [online], [site visited Sep. 18, 2025]. Available via Internet, <URL:https://www.biospace.com/jeol-a-useful-tool-for-every-user-new-electron-microscope-jem-120i-released> (Year: 2016).
- Design U.S. Appl. No. 29/955,850, filed Aug. 5, 2024.
- Design U.S. Appl. No. 29/955,853, filed Aug. 5, 2024.
Type: Grant
Filed: Aug 5, 2024
Date of Patent: Jul 21, 2026
Assignee: JEOL Ltd. (Tokyo)
Inventor: Yuji Yamazaki (Tokyo)
Primary Examiner: Joseph Kukella
Assistant Examiner: Breana Copeland
Application Number: 29/955,844