Electron microscope

- JEOL Ltd.
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Description

FIG. 1 is a frontward perspective view of a left side of an electron microscope showing my new design;

FIG. 2 is a frontward perspective view of a right side thereof;

FIG. 3 is another perspective view thereof, showing the electron microscope in an opened position;

FIG. 4 is a front elevational view thereof;

FIG. 5 is a rear elevational view thereof;

FIG. 6 is a right side elevational view thereof;

FIG. 7 is a left side elevational view thereof;

FIG. 8 is a top plan view thereof;

FIG. 9 is an enlarged bottom plan view thereof;

FIG. 10 is a cross-sectional view thereof taken along lines A-A in FIG. 4; and,

FIG. 11 is an enlarged view thereof showing details enclosed by lines B-B and C-C in FIG. 10.

The broken lines in FIG. 9 depict portions of the electron microscope that form no part of the claimed design.

Portions of the electron microscope shown in dashed lines in FIG. 11 depict unclaimed portions of the electron microscope that are included for illustrative purposes showing boundaries of the enlarged view of FIG. 11.

Claims

The ornamental design for an electron microscope, as shown and described.

Referenced Cited
U.S. Patent Documents
D625749 October 19, 2010 Oonuma
D632323 February 8, 2011 Oonuma
D633538 March 1, 2011 Oonuma
D708245 July 1, 2014 Matoba
D1042788 September 17, 2024 Church
Foreign Patent Documents
D1784907 November 2024 JP
Other references
  • BioSpace Jeol New Electron Microscope, earliest pictured May 29, 2024, [online], [site visited Sep. 18, 2025]. Available via Internet, <URL: https://www.biospace.com/jeol-a-useful-tool-for-every-user-new-electron-microscope-jem-120i-released> (Year: 2024).
  • Research and Health Science Education Transmission Electron Microscopy, earliest pictured Oct. 14, 2023, [online], [site visited Sep. 18, 2025]. Available via Internet, <URL:https://rhse.temertymedicine.utoronto.ca/transmission-electron-microscopy-tem> (Year: 2023).
  • Biospace Cryo Electron Micrscope, earliest pictured Oct. 2016, [online], [site visited Sep. 18, 2025]. Available via Internet, <URL:https://www.biospace.com/jeol-a-useful-tool-for-every-user-new-electron-microscope-jem-120i-released> (Year: 2016).
  • Design U.S. Appl. No. 29/955,850, filed Aug. 5, 2024.
  • Design U.S. Appl. No. 29/955,853, filed Aug. 5, 2024.
Patent History
Patent number: D1135985
Type: Grant
Filed: Aug 5, 2024
Date of Patent: Jul 21, 2026
Assignee: JEOL Ltd. (Tokyo)
Inventor: Yuji Yamazaki (Tokyo)
Primary Examiner: Joseph Kukella
Assistant Examiner: Breana Copeland
Application Number: 29/955,844
Classifications
Current U.S. Class: Microscope (D16/131)