Semiconductor device
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Description
FIG. 1 is a top, front and right side perspective view of semiconductor device showing our new design;
FIG. 2 is a front elevational view thereof;
FIG. 3 is a top plan view thereof;
FIG. 4 is a bottom plan view thereof;
FIG. 5 is a rear elevational view thereof; and,
FIG. 6 is a right side view thereo, the left side being a mirror image of the side shown.
Referenced Cited
U.S. Patent Documents
Foreign Patent Documents
Other references
D288922 | March 24, 1987 | Olla |
D357901 | May 2, 1995 | Horman |
3762039 | October 1973 | Douglass et al. |
4012766 | March 15, 1977 | Phillips et al. |
5095360 | March 10, 1992 | Kizaki et al. |
5-15449 | February 1993 | JPX |
7-250485 | September 1995 | JPX |
- Toshiba GTR Module 1989, p. 26. Mitsubishi '85 M53200P Series, 1985.
Patent History
Patent number: D401912
Type: Grant
Filed: May 28, 1996
Date of Patent: Dec 1, 1998
Assignee: Mitsubishi Denki Kabushiki Kaisha (Tokyo)
Inventors: Gorab Majumdar (Tokyo), Satoshi Mori (Tokyo), Sukehisa Noda (Tokyo), Tooru Iwagami (Tokyo), Yoshio Takagi (Tokyo), Hisashi Kawafuji (Tokyo)
Primary Examiner: Jeffrey Asch
Assistant Examiner: Cathron B. Matta
Law Firm: Oblon, Spivak, McClelland, Maier & Neustadt, P.C.
Application Number: 0/55,038
Type: Grant
Filed: May 28, 1996
Date of Patent: Dec 1, 1998
Assignee: Mitsubishi Denki Kabushiki Kaisha (Tokyo)
Inventors: Gorab Majumdar (Tokyo), Satoshi Mori (Tokyo), Sukehisa Noda (Tokyo), Tooru Iwagami (Tokyo), Yoshio Takagi (Tokyo), Hisashi Kawafuji (Tokyo)
Primary Examiner: Jeffrey Asch
Assistant Examiner: Cathron B. Matta
Law Firm: Oblon, Spivak, McClelland, Maier & Neustadt, P.C.
Application Number: 0/55,038
Classifications
Current U.S. Class:
Semiconductor, Transistor Or Integrated Circuit (24) (D13/182)
International Classification: 1303;
International Classification: 1303;