Microscope
- Olympus
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Description
FIG. 1 is an enlarged rear, top and left side perspective view of microscope, showing our new design;
FIG. 2 is a front elevational view thereof;
FIG. 3 is a right side elevational view thereof;
FIG. 4 is a top plan view thereof;
FIG. 5 is a rear elevational view thereof;
FIG. 6 is a left side elevational view thereof; and,
FIG. 7 is a bottom plan view thereof.
Referenced Cited
U.S. Patent Documents
D191330 | September 1961 | Armbruster |
D215889 | November 1969 | Suzuki |
D273592 | April 24, 1984 | Armbruster |
D273685 | May 1, 1984 | Yamada |
D296904 | July 26, 1988 | Lukaszewski |
D330719 | November 3, 1992 | Ishibashi |
D345746 | April 5, 1994 | Hulbl |
D345747 | April 5, 1994 | Hulbl |
D354761 | January 24, 1995 | Komatsuzaki et al. |
1853674 | April 1932 | Engelmann |
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4283111 | August 11, 1981 | Wieber et al. |
Patent History
Patent number: D417880
Type: Grant
Filed: Nov 17, 1998
Date of Patent: Dec 21, 1999
Assignee: Olympus Optical Co., Ltd. (Tokyo)
Inventors: Yuki Wani (Hachioji), Toshinobu Miyazawa (Komagane), Tomoyuki Kawamura (Nagano-ken), Keiichi Iizuka (Ina), Minoru Inoue (Ina)
Primary Examiner: Paula A. Mortimer
Attorney: J. Warren Laff, Whitesel & Saret Whitesel
Application Number: 0/96,625
Type: Grant
Filed: Nov 17, 1998
Date of Patent: Dec 21, 1999
Assignee: Olympus Optical Co., Ltd. (Tokyo)
Inventors: Yuki Wani (Hachioji), Toshinobu Miyazawa (Komagane), Tomoyuki Kawamura (Nagano-ken), Keiichi Iizuka (Ina), Minoru Inoue (Ina)
Primary Examiner: Paula A. Mortimer
Attorney: J. Warren Laff, Whitesel & Saret Whitesel
Application Number: 0/96,625
Classifications