Mask for respirator
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Description
The broken lines shown in
Claims
The ornamental design for a mask for respirator, as shown and described.
Referenced Cited
U.S. Patent Documents
Foreign Patent Documents
Other references
5884624 | March 23, 1999 | Barnett et al. |
D443355 | June 5, 2001 | Gunaratnam et al. |
D468421 | January 7, 2003 | Smart |
D468823 | January 14, 2003 | Smart |
D486226 | February 3, 2004 | Guney et al. |
D489817 | May 11, 2004 | Ankey et al. |
D490343 | May 25, 2004 | Guney et al. |
D492992 | July 13, 2004 | Guney et al. |
D493885 | August 3, 2004 | Raje et al. |
D494675 | August 17, 2004 | Guney et al. |
D502261 | February 22, 2005 | Kopacko et al. |
D515204 | February 14, 2006 | Guney et al. |
D519207 | April 18, 2006 | Raje et al. |
D539901 | April 3, 2007 | McAuliffe et al. |
D1109143 | May 2001 | JP |
131674 | March 1990 | TW |
150165 | January 1991 | TW |
523367 | March 2003 | TW |
- U.S. Appl. No. 29/287,675, filed Sep. 7, 2007.
Patent History
Patent number: D582546
Type: Grant
Filed: Sep 7, 2007
Date of Patent: Dec 9, 2008
Assignee: Teijin Pharma Limited (Tokyo)
Inventors: Kazuaki Fujiura (Tokyo), Toshiki Nakamura (Tokyo), Naoki Kurai (Tokyo), Keiko Omura (Hino), Takamitsu Okayama (Hino), Masahide Takishita (Hino), Tongoh Chin (Hino), Shinya Fujimoto (Ibaraki), Satoe Matsunaga (Ibaraki), Hideharu Shimura (Osaka), Toru Hikosaka (Ibaraki)
Primary Examiner: Ian Simmons
Assistant Examiner: Christopher Lee
Attorney: Sughrue Mion, PLLC
Application Number: 29/287,676
Type: Grant
Filed: Sep 7, 2007
Date of Patent: Dec 9, 2008
Assignee: Teijin Pharma Limited (Tokyo)
Inventors: Kazuaki Fujiura (Tokyo), Toshiki Nakamura (Tokyo), Naoki Kurai (Tokyo), Keiko Omura (Hino), Takamitsu Okayama (Hino), Masahide Takishita (Hino), Tongoh Chin (Hino), Shinya Fujimoto (Ibaraki), Satoe Matsunaga (Ibaraki), Hideharu Shimura (Osaka), Toru Hikosaka (Ibaraki)
Primary Examiner: Ian Simmons
Assistant Examiner: Christopher Lee
Attorney: Sughrue Mion, PLLC
Application Number: 29/287,676
Classifications