Microscope
Latest Leica Microsystems (Schweiz) AG Patents:
Description
This application is related to co-pending application Ser. No. 29/311.059, entitled “Microscope”.
The broken lines form no part of the claimed design.
Claims
The ornamental design for a microscope, as shown and described.
Referenced Cited
U.S. Patent Documents
1129502 | February 1915 | Ott |
1505418 | August 1924 | Ott |
D95670 | May 1935 | Fassin |
2170967 | August 1939 | Eppenstein et al. |
3064529 | November 1962 | Straat |
3166628 | January 1965 | Walter |
3260157 | July 1966 | Boughton |
D215889 | November 1969 | Suzuki |
3721827 | March 1973 | Reinheimer |
4168881 | September 25, 1979 | Rosenberger |
4283111 | August 11, 1981 | Wieber et al. |
4299440 | November 10, 1981 | Hodgson |
D265206 | June 29, 1982 | Weber et al. |
D273592 | April 24, 1984 | Armbruster |
D273685 | May 1, 1984 | Yamada |
4573771 | March 4, 1986 | Hill |
D291702 | September 1, 1987 | Kahute |
D296904 | July 26, 1988 | Lukaszewski |
D299357 | January 10, 1989 | Garnich et al. |
D345746 | April 5, 1994 | Holbl |
D345747 | April 5, 1994 | Holbl |
D345749 | April 5, 1994 | Hofmann-Igl |
D354761 | January 24, 1995 | Komatsuzaki et al. |
D395664 | June 30, 1998 | Nojima et al. |
D400548 | November 3, 1998 | Komatsuzaki |
D417880 | December 21, 1999 | Wani et al. |
D420028 | February 1, 2000 | Wani et al. |
6094299 | July 25, 2000 | Schau et al. |
D439258 | March 20, 2001 | Kawahata |
6479807 | November 12, 2002 | Toshimitsu |
D511786 | November 22, 2005 | Apotheloz et al. |
D525636 | July 25, 2006 | Apotheloz |
7088505 | August 8, 2006 | Harrison et al. |
7167303 | January 23, 2007 | Gilbert |
7262906 | August 28, 2007 | Gilbert et al. |
Patent History
Patent number: D607031
Type: Grant
Filed: Dec 17, 2008
Date of Patent: Dec 29, 2009
Assignee: Leica Microsystems (Schweiz) AG (Heerbrugg)
Inventor: Werner Hoelbl (Vienna)
Primary Examiner: Paula Greene
Attorney: Crowell & Moring LLP
Application Number: 29/311,060
Type: Grant
Filed: Dec 17, 2008
Date of Patent: Dec 29, 2009
Assignee: Leica Microsystems (Schweiz) AG (Heerbrugg)
Inventor: Werner Hoelbl (Vienna)
Primary Examiner: Paula Greene
Attorney: Crowell & Moring LLP
Application Number: 29/311,060
Classifications
Current U.S. Class:
Microscope (D16/131)