Specimen analyzer
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Description
The broken lines in
Claims
We claim the ornamental design for a specimen analyzer, as shown and described.
Referenced Cited
U.S. Patent Documents
D328794 | August 18, 1992 | Frenkel et al. |
D404140 | January 12, 1999 | Meguro |
D482796 | November 25, 2003 | Oyama et al. |
D588276 | March 10, 2009 | Isozaki et al. |
D637098 | May 3, 2011 | Oonuma et al. |
20090269841 | October 29, 2009 | Wojciechowski et al. |
20090325299 | December 31, 2009 | Hamada et al. |
20100210019 | August 19, 2010 | Kurono et al. |
Patent History
Patent number: D655824
Type: Grant
Filed: Mar 18, 2011
Date of Patent: Mar 13, 2012
Assignee: Sysmex Corporation (Kobe)
Inventors: Keisuke Tsutsumida (Kobe), Fumie Shibata (Tokyo), Shinya Nakajima (Kyoto)
Primary Examiner: Anhdao Doan
Attorney: Brinks Hofer Gilson & Lione
Application Number: 29/387,842
Type: Grant
Filed: Mar 18, 2011
Date of Patent: Mar 13, 2012
Assignee: Sysmex Corporation (Kobe)
Inventors: Keisuke Tsutsumida (Kobe), Fumie Shibata (Tokyo), Shinya Nakajima (Kyoto)
Primary Examiner: Anhdao Doan
Attorney: Brinks Hofer Gilson & Lione
Application Number: 29/387,842
Classifications
Current U.S. Class:
Specimen Handling, Preparation Or Testing (62) (D24/216)