Specimen analyzer

- Sysmex Corporation
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Description

FIG. 1 is a front view of a specimen analyzer of the present invention;

FIG. 2 is a rear view thereof;

FIG. 3 is a right side view thereof;

FIG. 4 is a left side view thereof;

FIG. 5 is a top view thereof;

FIG. 6 is a bottom view thereof;

FIG. 7 is a top and front perspective view thereof; and,

FIG. 8 is a top and front perspective view thereof shown in an environmental use.

The broken lines in FIG. 8 represent the environmental subject matter, and the broken lines in FIGS. 2 and 4 are included for the purpose of illustrating portions of the specimen analyzer that form no part of the claimed design. None of the broken lines form a part of the claimed design.

Claims

We claim the ornamental design for a specimen analyzer, as shown and described.

Referenced Cited
U.S. Patent Documents
D328794 August 18, 1992 Frenkel et al.
D404140 January 12, 1999 Meguro
D482796 November 25, 2003 Oyama et al.
D588276 March 10, 2009 Isozaki et al.
D637098 May 3, 2011 Oonuma et al.
20090269841 October 29, 2009 Wojciechowski et al.
20090325299 December 31, 2009 Hamada et al.
20100210019 August 19, 2010 Kurono et al.
Patent History
Patent number: D655824
Type: Grant
Filed: Mar 18, 2011
Date of Patent: Mar 13, 2012
Assignee: Sysmex Corporation (Kobe)
Inventors: Keisuke Tsutsumida (Kobe), Fumie Shibata (Tokyo), Shinya Nakajima (Kyoto)
Primary Examiner: Anhdao Doan
Attorney: Brinks Hofer Gilson & Lione
Application Number: 29/387,842
Classifications
Current U.S. Class: Specimen Handling, Preparation Or Testing (62) (D24/216)