Semiconductor testing machine

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Description

FIG. 1 is a front, top and right side perspective view of a semiconductor testing machine showing our new design;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a rear elevational view thereof;

FIG. 4 is a top plan view thereof;

FIG. 5 is a bottom plan view thereof;

FIG. 6 is a right side elevational view thereof; and,

FIG. 7 is a left side elevational view thereof.

Claims

The ornamental design for a semiconductor testing machine, as shown.

Referenced Cited
U.S. Patent Documents
D350490 September 13, 1994 Takao
D365584 December 26, 1995 Nakagome et al.
D447967 September 18, 2001 Terada et al.
Patent History
Patent number: D637098
Type: Grant
Filed: Apr 26, 2010
Date of Patent: May 3, 2011
Assignee: Hitachi High-Technologies Corporation (Tokyo)
Inventors: Mitsuru Oonuma (Tokyo), Akira Omachi (Komae), Kazuhiko Nishiyama (Hino), Hiroyuki Suzuki (Hitachinaka), Yasuhiko Nara (Hitachinaka)
Primary Examiner: Antoine D Davis
Attorney: Antonelli, Terry, Stout & Kraus, LLP.
Application Number: 29/360,394
Classifications
Current U.S. Class: Electrical Property (D10/75)