Specimen analyzer

- Sysmex Corporation
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Description

FIG. 1 is a front view of a specimen analyzer of the present invention;

FIG. 2 is a rear view thereof;

FIG. 3 is a first side view thereof;

FIG. 4 is a second side view thereof;

FIG. 5 is a top view thereof;

FIG. 6 is a bottom view thereof; and,

FIG. 7 is a front and top perspective view thereof.

The broken lines in the drawing views are included for the purpose of illustrating portions of the specimen analyzer that form no part of the claimed design.

Claims

I claim the ornamental design for a specimen analyzer, as shown and described.

Referenced Cited
U.S. Patent Documents
4039286 August 2, 1977 Keller et al.
D280662 September 17, 1985 Bartfay et al.
D328794 August 18, 1992 Frenkel et al.
D404140 January 12, 1999 Meguro
D482796 November 25, 2003 Oyama et al.
D588276 March 10, 2009 Isozaki et al.
7678331 March 16, 2010 Shanafelter
D637098 May 3, 2011 Oonuma et al.
20090269841 October 29, 2009 Wojciechowski et al.
20090325299 December 31, 2009 Hamada et al.
20100210019 August 19, 2010 Kurono et al.
Patent History
Patent number: D657067
Type: Grant
Filed: Dec 28, 2010
Date of Patent: Apr 3, 2012
Assignee: Sysmex Corporation (Kobe)
Inventor: Fumie Shibata (Tokyo)
Primary Examiner: Anhdao Doan
Attorney: Brinks Hofer Gilson & Lione
Application Number: 29/382,021
Classifications
Current U.S. Class: Specimen Handling, Preparation Or Testing (62) (D24/216)