Sample analyzer
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Description
The broken lines shown represent unclaimed subject matter and form no part of the claimed design. Additionally, the unevenly broken lines in the drawings define the limits of the claimed design.
Claims
We claim the ornamental design for a sample analyzer, as shown and described.
Referenced Cited
Patent History
Patent number: D691732
Type: Grant
Filed: Sep 6, 2012
Date of Patent: Oct 15, 2013
Assignee: Sysmex Corporation (Kobe)
Inventors: Fumie Shibata (Tokyo), Shuhei Kaneko (Hyogo)
Primary Examiner: Anhdao Doan
Application Number: 29/431,327
Type: Grant
Filed: Sep 6, 2012
Date of Patent: Oct 15, 2013
Assignee: Sysmex Corporation (Kobe)
Inventors: Fumie Shibata (Tokyo), Shuhei Kaneko (Hyogo)
Primary Examiner: Anhdao Doan
Application Number: 29/431,327
Classifications
Current U.S. Class:
Specimen Handling, Preparation Or Testing (62) (D24/216)