Sample analyzer

- Sysmex Corporation
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Description

FIG. 1 is a front perspective view of a sample analyzer of the present invention;

FIG. 2 is a front view thereof;

FIG. 3 is a rear view thereof;

FIG. 4 is a first side view thereof;

FIG. 5 is a second side view thereof;

FIG. 6 is a top view thereof; and,

FIG. 7 is a bottom view thereof.

The broken lines shown represent unclaimed subject matter and form no part of the claimed design. Additionally, the unevenly broken lines in the drawings define the limits of the claimed design.

Claims

We claim the ornamental design for a sample analyzer, as shown and described.

Referenced Cited
U.S. Patent Documents
D491272 June 8, 2004 Alden et al.
D549827 August 28, 2007 Maeno et al.
D657068 April 3, 2012 Shibata
D670402 November 6, 2012 Shibata
D682441 May 14, 2013 Kim
Patent History
Patent number: D691732
Type: Grant
Filed: Sep 6, 2012
Date of Patent: Oct 15, 2013
Assignee: Sysmex Corporation (Kobe)
Inventors: Fumie Shibata (Tokyo), Shuhei Kaneko (Hyogo)
Primary Examiner: Anhdao Doan
Application Number: 29/431,327
Classifications