Infrared microscope
Latest SHIMADZU CORPORATION Patents:
- CELL ANALYSIS DEVICE
- Phase contrast x-ray imaging system and image processing method
- Method of producing stress-luminescent material, method of producing stress-luminescent body, strain measurement method, stress-luminescent body, stress-luminescent coating material, and device for producing stress-luminescent body
- Monoclonal antibody against amyloid beta, and method for measuring amyloid beta-related peptide using said antibody
- ROTARY VALVE AND METHOD FOR FORMING REINFORCED RESIN MEMBER OF ROTARY VALVE
Description
The broken lines depict portions of the infrared microscope and form no part of the claimed design.
Claims
The ornamental design for an infrared microscope, as shown and described.
Referenced Cited
U.S. Patent Documents
Other references
| D387080 | December 2, 1997 | Miyazawa |
| D392303 | March 17, 1998 | Hern |
| D527464 | August 29, 2006 | Ina |
| D622760 | August 31, 2010 | Kimura |
| D657407 | April 10, 2012 | Okamoto |
| D663338 | July 10, 2012 | Okamoto |
| D674830 | January 22, 2013 | Stoiakine |
| D681089 | April 30, 2013 | Au |
| D687475 | August 6, 2013 | Oonuma |
| D690341 | September 24, 2013 | Tsuda |
| D690754 | October 1, 2013 | Tsuda |
| D708245 | July 1, 2014 | Matoba |
| D711950 | August 26, 2014 | Matoba |
| D731910 | June 16, 2015 | Muraoka |
| D759517 | June 21, 2016 | Kawai |
| D784433 | April 18, 2017 | Weber |
| D785690 | May 2, 2017 | Klein |
- Infrared Microscope I AIM-9000 Infrared Microscope I Shimadzu, posted date May 12, 2016, (c) 2017 Shimadzu.com [online], [site visited Aug. 30, 2017], Available at http://www.shimadzu.com/news/c-od0gjn0000004mvi.html.
Patent History
Patent number: D841069
Type: Grant
Filed: May 31, 2016
Date of Patent: Feb 19, 2019
Assignee: SHIMADZU CORPORATION (Kyoto)
Inventor: Kaoru Ihara (Kyoto)
Primary Examiner: Manpreet S Matharu
Assistant Examiner: Holly E Thurman
Application Number: 29/566,423
Type: Grant
Filed: May 31, 2016
Date of Patent: Feb 19, 2019
Assignee: SHIMADZU CORPORATION (Kyoto)
Inventor: Kaoru Ihara (Kyoto)
Primary Examiner: Manpreet S Matharu
Assistant Examiner: Holly E Thurman
Application Number: 29/566,423
Classifications
Current U.S. Class:
Microscope (D16/131)