Infrared microscope
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Description
The broken lines depict portions of the infrared microscope and form no part of the claimed design.
Claims
The ornamental design for an infrared microscope, as shown and described.
Referenced Cited
U.S. Patent Documents
Other references
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- Infrared Microscope I AIM-9000 Infrared Microscope I Shimadzu, posted date May 12, 2016, (c) 2017 Shimadzu.com [online], [site visited Aug. 30, 2017], Available at http://www.shimadzu.com/news/c-od0gjn0000004mvi.html.
Patent History
Patent number: D841069
Type: Grant
Filed: May 31, 2016
Date of Patent: Feb 19, 2019
Assignee: SHIMADZU CORPORATION (Kyoto)
Inventor: Kaoru Ihara (Kyoto)
Primary Examiner: Manpreet S Matharu
Assistant Examiner: Holly E Thurman
Application Number: 29/566,423
Type: Grant
Filed: May 31, 2016
Date of Patent: Feb 19, 2019
Assignee: SHIMADZU CORPORATION (Kyoto)
Inventor: Kaoru Ihara (Kyoto)
Primary Examiner: Manpreet S Matharu
Assistant Examiner: Holly E Thurman
Application Number: 29/566,423
Classifications
Current U.S. Class:
Microscope (D16/131)