Portion of a cover for an electron microscope

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Description

FIG. 1 is a front, top and right side perspective view of a portion of a cover for an electron microscope showing our new design;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a rear elevational view thereof;

FIG. 4 is a left side elevational view thereof;

FIG. 5 is a right side elevational view thereof;

FIG. 6 is a top plan view thereof; and,

FIG. 7 is a bottom plan view thereof.

The long and short dashed lines immediately adjacent the shaded area represent the bounds of the claimed design while all other broken lines are directed to an environment and form no part of the claimed design.

Claims

We claim the ornamental design for a portion of a cover for an electron microscope, as shown and described.

Referenced Cited
U.S. Patent Documents
1274389 August 1918 Curran
1961022 May 1934 Teller et al.
D112253 November 1938 Hayes
3070852 January 1963 Hilliker
3297284 January 1967 Pellerin
D220455 April 1971 Mason
D223669 May 1972 Nishino et al.
3814356 June 1974 Coleman et al.
3835320 September 1974 Helwig
D264752 June 1, 1982 Leotta
4514021 April 30, 1985 Sundermeier et al.
4523094 June 11, 1985 Rossow
4669790 June 2, 1987 Briggs
4720876 January 26, 1988 Tomei et al.
D303267 September 5, 1989 Takahashi et al.
D332616 January 19, 1993 Hashimoto et al.
5350921 September 27, 1994 Aoyama et al.
5480199 January 2, 1996 Husting
5577817 November 26, 1996 Reynolds
D381031 July 15, 1997 Miyata et al.
5864138 January 26, 1999 Miyata et al.
D420015 February 1, 2000 DeBoer
6019447 February 1, 2000 Jackovin
6084239 July 4, 2000 Miyata et al.
D571385 June 17, 2008 Onuma et al.
D599688 September 8, 2009 Ito
D608810 January 26, 2010 Stoiakine
D623211 September 7, 2010 Oonuma et al.
D625749 October 19, 2010 Oonuma et al.
D626579 November 2, 2010 Oonuma et al.
D632314 February 8, 2011 Kristiansen et al.
D632323 February 8, 2011 Oonuma et al.
D633537 March 1, 2011 Oonuma et al.
D633538 March 1, 2011 Oonuma et al.
D635167 March 29, 2011 Oonuma et al.
D635168 March 29, 2011 Oonuma et al.
D636005 April 12, 2011 Oonuma et al.
D638046 May 17, 2011 Noda et al.
D644258 August 30, 2011 Noda et al.
D684609 June 18, 2013 Seo et al.
D687475 August 6, 2013 Oonuma et al.
20030227236 December 11, 2003 Brooks
20080150404 June 26, 2008 Ono
Foreign Patent Documents
D1295901 March 2007 JP
D1321994 February 2008 JP
Other references
  • Hitachi High-Technologies Corporation, News Release, Hitachi High-Technologies Launches Sale of New SU9000 Scanning Electron Microscope, Field Emission Scanning Electron Microscope Featuring Ultra-High Resolution Imaging, Apr. 19, 2011 in English.
  • Jeol News, Introduction of New Products, High Throughput Electron Microscope, Electron Microscope, JEM-2800, Jul. 2011, vol. 46, No. 1, in English.
  • Imaging & Microscopy, Imaging-GIT.com, Fei Ultra-High Resolution Titan, Issue 1, Nov. 1, 2007, in English.
Patent History
Patent number: D711950
Type: Grant
Filed: May 30, 2013
Date of Patent: Aug 26, 2014
Assignee: Hitachi High-Technologies Corporation (Tokyo)
Inventors: Kosuke Matoba (Tokyo), Hiroyuki Suzuki (Hitachinaka), Hirofumi Sato (Hitachinaka), Naoki Sakamoto (Naka), Toshiyuki Moriya (Tokorozawa)
Primary Examiner: Paula Greene
Application Number: 29/456,329
Classifications
Current U.S. Class: Microscope (D16/131)