Portable test instrument

- JENTEK Sensors, Inc.
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Description

FIG. 1 is a front perspective view of the portable test instrument;

FIG. 2 is a back perspective view thereof;

FIG. 3 is a top view thereof;

FIG. 4 is a bottom view thereof;

FIG. 5 is a left side view thereof;

FIG. 6 is a back view thereof; and,

FIG. 7 is a front view thereof.

The broken lines shown in the figures are for the purpose of illustrating the environmental structure and form no part of the claimed design. The unevenly-spaced broken line at the front end and visible in FIGS. 2-5 illustrate the boundary of the claimed design and form no part thereof.

The right side of the portable test instrument is a mirror image of the left side of the portable test instrument depicted in FIG. 5.

The shade lines in the figures show contour and not surface ornamentation.

Claims

The ornamental design for a portable test instrument, substantially as shown and described.

Referenced Cited
U.S. Patent Documents
5117182 May 26, 1992 Cecco
D339994 October 5, 1993 Rohmann
5914595 June 22, 1999 Piriou
D514963 February 14, 2006 Shionoiri
D841497 February 26, 2019 Blair et al.
20040257072 December 23, 2004 Samson
20110089937 April 21, 2011 Petrosky
20150323502 November 12, 2015 Suetsugu
Patent History
Patent number: D857534
Type: Grant
Filed: Oct 15, 2018
Date of Patent: Aug 27, 2019
Assignee: JENTEK Sensors, Inc. (Marlborough, MA)
Inventors: Todd M Dunford (Amherst, MA), Neil J Goldfine (Cocoa Beach, FL), Stuart D Chaplan (Watertown, MA), Yanko K Sheiretov (Waltham, MA), Scott A Denenberg (Newton, MA)
Primary Examiner: Antoine Duval Davis
Application Number: 29/666,705