Sample holder for ionized sample analysis
The features shown in evenly-dashed broken lines depict environmental subject matter only and form no part of the claimed design. The dot-dash broken lines in the drawings represent the bounds of the claimed subject matter, the dot-dash broken lines, themselves forming no part thereof.
The portions shown in solid-broken alternated hatching lines in
Claims
The ornamental design for a sample holder for ionized sample analysis, as shown and described.
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Type: Grant
Filed: Jul 18, 2018
Date of Patent: Nov 19, 2019
Assignee: HAMAMATSU PHOTONICS K.K. (Hamamatsu-shi, Shizuoka)
Inventors: Takayuki Ohmura (Hamamatsu), Masahiro Kotani (Hamamatsu)
Primary Examiner: Antoine Duval Davis
Application Number: 29/656,981