Substrate for spectroscopic analysis

- HAMAMATSU PHOTONICS K.K.
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Description

1. Substrate for spectroscopic analysis

1.1 : Perspective

1.2 : Front

1.3 : Back

1.4 : Top

1.5 : Bottom

1.6 : Left

1.7 : Right

1.8 : Sectional view taken along the line 1.8-1.8 of Reproduction 1.2

1.9 : Sectional view taken along the line 1.9-1.9 of Reproduction 1.2

1.10 : Perspective view without the cover part

1.11 : Reference view showing the state in use

In the Reproductions, the broken lines are for the purpose of illustrating environment only and form no part of the claimed design. The dot-dash broken lines are for the purpose of showing the boundaries of the claim and form no part of the claimed design.

Claims

The ornamental design for a substrate for spectroscopic analysis, as shown and described.

Referenced Cited
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Patent History
Patent number: D854184
Type: Grant
Filed: Jul 5, 2017
Date of Patent: Jul 16, 2019
Assignee: HAMAMATSU PHOTONICS K.K. (Hamamatsu-shi, Shizuoka)
Inventors: Masashi Ito (Hamamatsu), Katsumi Shibayama (Hamamatsu), Kazuto Ofuji (Hamamatsu), Yoshihiro Maruyama (Hamamatsu)
Primary Examiner: Rhea Shields
Application Number: 35/504,282
Classifications