Substrates for spectroscopic analysis
1.-2. Substrates for spectroscopic analysis
In the reproductions, the broken lines are for the purpose of illustrating environment only and form no part of the claimed design. The dot-dash broken lines are for the purpose of showing the boundaries of the claim and form no part of the claimed design.
Claims
The ornamental design for a substrate for spectroscopic analysis, as shown and described.
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Type: Grant
Filed: Jul 5, 2017
Date of Patent: Mar 12, 2019
Assignee: HAMAMATSU PHOTONICS K.K. (Hamamatsu-shi, Shizuoka)
Inventors: Masashi Ito (Hamamatsu), Katsumi Shibayama (Hamamatsu), Kazuto Ofuji (Hamamatsu), Yoshihiro Maruyama (Hamamatsu)
Primary Examiner: Rhea Shields
Application Number: 35/504,264