Microtome
Latest LEICA MICROSYSTEMS LTD., SHANGHAI Patents:
Description
The broken lines illustrate unclaimed portions of the microtome that form no part of the claimed design.
Claims
The ornamental design for a microtome, as shown and described.
Referenced Cited
U.S. Patent Documents
Other references
3212379 | October 1965 | McCormick |
D326921 | June 9, 1992 | Holbl |
D383548 | September 9, 1997 | Hoelbl |
D668347 | October 2, 2012 | Hoelbl |
20040261597 | December 30, 2004 | Thiem |
20050059155 | March 17, 2005 | Graupner |
20050115373 | June 2, 2005 | Kunkel |
20070227330 | October 4, 2007 | Kunkel |
20080072722 | March 27, 2008 | Tanki |
- Myer Instrument Inc. Leica Microsystems RM2265. Oct. 24, 2005.
Patent History
Patent number: D872297
Type: Grant
Filed: Jan 31, 2018
Date of Patent: Jan 7, 2020
Assignee: LEICA MICROSYSTEMS LTD., SHANGHAI (Shanghai)
Inventors: Gang Zhou (Shanghai), Jingtian Zhang (Shanghai), Zheguang Fan (Shanghai), Xiang Liang (Shanghai)
Primary Examiner: Anhdao Doan
Application Number: 29/635,585
Type: Grant
Filed: Jan 31, 2018
Date of Patent: Jan 7, 2020
Assignee: LEICA MICROSYSTEMS LTD., SHANGHAI (Shanghai)
Inventors: Gang Zhou (Shanghai), Jingtian Zhang (Shanghai), Zheguang Fan (Shanghai), Xiang Liang (Shanghai)
Primary Examiner: Anhdao Doan
Application Number: 29/635,585
Classifications
Current U.S. Class:
Specimen Handling, Preparation Or Testing (62) (D24/216)