Abstract: A micro tool set is described in which all of the tools are formed from stock no larger than 1.0 mm in diameter. Each tool is laser machined from stock no larger than 1.0 micron in diameter. Various shapes are “carved” from the original stock such that the finished tool does not extend beyond the nominal cylindrical shape of the stock. The tools are specifically adapted to be used for the repair of semiconductor test probe head wires.

Abstract: An air bearing drive system has a base, a moving portion, an air bearing for forming an air film gap between the base and the moving portion, air nozzles and a suction inlet. The air nozzles and suction inlet are formed on the base. The air nozzles blow air toward the moving portion so as to exert a levitation force on the moving portion. The suction inlet applies suction to the air film gap so as to attract the moving portion toward the base and thereby exert an attraction force on the moving portion. An air supplying device supplies air to the air nozzles. A vacuum source applies suction to the suction inlets. Two adjusting devices are adapted to adjust the levitation force produced by the air issuing from the air nozzles and the attraction force of air drawn into the suction inlet so as to provide an accurate and low cost air bearing drive system.

Abstract: The present invention discloses an inspection apparatus and method of electrode patterns using roiling wire probes. It includes rolling wire probes, at least one more, having a rolling wire rotating to be performed a rolling contact shplessly across the electrode patterns; a control unit for controlling operations of the inspection apparatus wholly and discriminating the electrical characteristics according to the electrical signal sensed through the rolling wire provided to the rolling wire probe. According to the present invention, there is an advantage that the inspection method can be used flexibly up to electrode patterns having various forms regardless of the change of model or design of the product, unlike the inspection method of the conventional art by the test pin block. In the present invention, an advantage, which when inspecting a scratch also does not generated in the pixel portion, thereby increasing yield of the finished goods.

Abstract: This invention is a method for nondestructively determining the deterioration of determining ferromagnetic materials by quantifying the change in brittleness with aging of the materials. This invention supposes acquirement of an embrittlement coefficient b by measuring a magnetic susceptibility &khgr;b of ferromagnetic materials under a magnetic field having a specified intensity H. And the coefficient b of the ferromagnetic materials is calculated by putting the intensity H and the susceptibility &khgr;b into an equation: b=&khgr;bH2. By the coefficient b, a correlation between the coefficient b and a referenced embrittlement factor of materials like said determining materials is obtained previously. Said coefficient b of said determining materials in the initial and the deteriorated states is acquired. The factor corresponding to the coefficient b is obtained from the correlation. It is possible to quantify the change by comparing the values of the factor in the initial and deteriorated states.

Abstract: A position sensor for a medical device comprises a core made of a high permeable material such as Wiegand effect material comprising a mixture of cobalt, vanadium, and iron. The position sensor has an outer diameter of approximately 0.4 mm and is used in a medical device having an outer diameter of approximately 0.67 mm.

Abstract: A sensor assembly includes a spool that has magnetic filaments incorporated therein. The magnetic filaments are magnetized to create a magnetic flux around the spool. A coil is wound around the spool such that it is within the magnetic flux field generated by the spool. A target wheel having plural teeth and plural slots is placed so that its outer periphery is slightly spaced from the target wheel. As the target wheel rotates, it induces changes in the magnetic flux density sensed by the coil. The changes in flux density can be used to determine the angular position and angular speed of the target wheel and a moving part attached thereto. Since the spool is magnetized, the need for a separate magnet is obviated.

Abstract: A displacement detector has a contact sensor incorporating a differential transformer and a circuit for adjusting the amplitude of the driving signal for driving a differential transformer of the sensor by feeding back as a standard signal the driving signal through an amplifier and an AC-DC converter as a standard signal. The sensor has a housing containing a mobile member. The mobile member has a shaft with a hole. An outer tubular body of a linear bush and a ball guide each have a hole, and a pin is inserted through these holes movably in the direction of movement of the mobile member such that the rotation of the mobile member is prevented.

Abstract: A surgical sponge is provided and adapted to prevent unaccounted disposal thereof. The sponge includes an absorbent pad and a visually identifiable member attached to the pad. The visually identifiable member assists in identification and accounting in a surgical environment. Finally, a metallic tag of sufficient size is incorporated with the sponge to provide detection by a metal detector device upon disposal of the sponge.

Abstract: A magnetic impedance element including a substrate made of a non-magnetic material, a thin-film magnetic core formed on said substrate, and first and second electrodes disposed on both ends of said thin-film magnetic core in a longitudinal direction thereof, characterized in that said thin-film magnetic core is formed by laminating a plurality of magnetic films through non-magnetic thin-films.

Abstract: The present invention provides a highly sensitive TMR device. Since a TMR device is normally manufactured by a thin-film formation technique, the size and weight can be reduced. The thickness of a first spin polarization layer that is stacked on a soft magnetic layer for assisting magnetic field sensing operations and has a higher magnetoresistance and a higher spin polarization rate than the soft magnetic layer is adjusted to a value that is smaller than the thickness of a tunneling layer or smaller than 2 nm, whichever is smaller. With the first spin polarization layer having such a thickness, both a low magnetoresistance and a desirable TMR rate can be obtained. As a result, the magnetic field sensitivity of the TMR device as a sensor can be increased.

Abstract: A sensor coil is provided on a core which forms a magnetic circuit for driving a linear motor, and the core is excited by electrifying the sensor coil at a high frequency. The high-frequency excitation is carried out in such a manner that the sensor coil is not magnetically saturated, and an eddy current is generated in the core. The impedance of the sensor coil is detected in this state and the quantity of a magnetic flux generated in the core constituting the magnetic circuit is detected on the basis of the impedance. Thus, the influence on the magnetic circuit itself is reduced and higher accuracy, miniaturization and lower power consumption are realized.

Abstract: NMR data are acquired with variable spacing between refocusing pulses, giving data with a variable interecho time TE. Under certain conditions, diffusion effects can be neglected and data acquired with a multiple TE spacing may be used to obtain a T2 distribution with increased resolution and reduced power requirements. In gas reservoirs, the maximum TE may be determined from diffusion considerations using a dual wait time pulse sequence and this maximum TE is used to acquire data with dual TE.

Abstract: NMR measurements made in a borehole are susceptible to contamination by signals from the borehole fluid. Correction is made for this contamination by using a standoff measuring device to determine the fractional volume of the region of investigation of the NMR tool that lies within the borehole. Using known or determined characteristics of the borehole fluid, a correction is made either to the NMR signals prior to processing or to the processed results of the uncorrected signals.

Abstract: Nuclear magnetic resonance techniques are used in a fluid sampling tool that extracts a fluid from subsurface earth formations into a flow channel within the tool. The magnetic resonance techniques involve applying a static magnetic field and an oscillating magnetic field to the fluid in the flow channel, and magnetic resonance signals are detected from the fluid and analyzed to extract information about the fluid such as composition, viscosity, etc.

Abstract: Measurements from many logging instruments such as Gamma ray counts from a pulsed neutron instrument, and amplitudes of spin-echo signals from a NMR instrument, typically have a spectrum that contains a plurality of exponentially decaying components. The slowest decaying component is obtained by fitting a single exponential over the tail end of the data and selecting a beginning for the fitting window that minimizes the product of the chi-square and the standard error of the fit. The single determined component may be subtracted from the data and the process repeated to give additional components. The determined components are indicative of thermal neutron capture cross-sections (in the case of a pulsed neutron instrument) and of the distribution of relaxation times and fluids within the pores of a rock in the case of a NMR instrument.

Abstract: An MRI apparatus and method useful for both industrial applications and medical applications is provided. The apparatus and procedures are capable of estimating the value of a continuous property, such as concentration, viscosity or the like by interpolating or extrapolating from a model derived from training sets of data representing measurements of samples with known properties. A number of techniques are provided for objectifying the analysis. Cluster analysis techniques can be used to supplement, assist or replace subjective judgments by trained operators. Calculations or judgments regarding similarity can be made with respect to stored libraries of signatures, particularly where the library of stored signatures is obtained objectively, e.g., using cluster analysis, standardization and calibration. The signatures can be expanded signatures which include non-MR as well as MR data.

Abstract: The temperature of permanent magnet blocks embedded in several positions in permanent magnets and base yokes will be adjusted by device of a heater to improve the static field uniformity.

Abstract: A main field magnet arrangement for a one-sided magnet resonance device produces a homogeneous magnetic field B in a working volume (4). The working volume (4) and the main field magnet (1) are disposed on different sides of a plane E and the main field magnet (1) has a geometric shape which permits disposal of a radio frequency (RF) receiver coil system and optionally a gradient coil system on the same side of the plane E as the main field magnet (1). Field-generating elements of permanent-magnetic material form a radially outer part (2) and a radially inner part (3) relative to an axis A extending through the center of the working volume (4), wherein the surface, facing the working volume (4), of the radially inner part (3) is axially further spaced apart from the center of the working volume (4) than the surface of the radially outer part (2) facing the working volume (4), such that a depression (5) is formed in the radially inner part (3) in the axial direction.

Abstract: A magnetic resonance apparatus has a basic field magnet with an inner unit, an outer unit and at least one middle unit that are essentially hollow-cylindrical and are electrically conductive and that are arranged inside one another such that the inner unit is enveloped by the middle unit and the middle unit is enveloped by the outer unit, and a gradient coil system which induces eddy currents at least in regions of the outer unit. At least the inner cylindrical jackets of the units are matched to one another in term of mechanical properties according so that the middle unit effectively damps oscillatory transmission from the outer unit to the inner unit that would otherwise occur due to magnetic coupling.

Abstract: A firing or ignition state discrimination system for an internal combustion engines having a spark plug which produces spark discharge when supplied with discharge current from an ignition coil to ignite air-fuel mixture in the combustion chamber. In the system, ionic-current that flows during combustion of the air-fuel mixture is detected at a predetermined first timing and leakage current that flows across electrodes of the spark plug is detected at a predetermined second timing which is later than the predetermined first timing. The firing or ignition state of the engine is discriminated to one from among normal, misfiring, spark plug fouling, and failure in ignition system or in fuel supply system based on the detected ionic-current and leakage current and presence or absence of fuel cutoff to the engine. With this, it becomes possible to accurately discriminates the firing or ignition state of the spark plug and to inform the fact to the vehicle operator if desired.

Abstract: An improved system for measuring spark plug suppressor resistance under simulating operating conditions includes a controller, a high voltage power supply, a mounting fixture, and a non-contact IR temperature detector. The controller commands the high voltage power supply to source a preselected level of current through the spark plug having a magnitude consistent with actual spark currents. The current sourcing establishes a self-heating arrangement, and the heightened spark plug temperatures and associated resistance simulate actual engine operating conditions. The controller outputs a display of measured resistance values as a function of time, and overlays a trace of the corresponding temperature values.

Abstract: To test the ESD resistance of a semiconductor component (1), for example of a NOS transistor, which can be used as an PSD protective element in a chip (2), a direct current characteristic of the semiconductor component (1) is monitored and the ESD resistance of the respective semiconductor component (1) is inferred depending on this. In particular, the direct current failure threshold of the semiconductor component (1) at which an increased leakage current occurs in the non-conducting direction of the semiconductor component (1) can be monitored in operation of the semiconductor coponent (1) using an applied direct current (Io) and the ESD resistance of the semiconductor component (1) inferred depending on a change in this direct current failure threshold.

Abstract: A electrostatic sensing device for sensing a voltage from a electrostatic device, includes a first actuator having a first membrane and a first electrode, the first membrane being moveable and a second actuator having a second membrane and a second electrode, the second membrane being moveable. Additionally, a control device controls the first actuator and the second actuator to alternatively charge the first actuator with a first charge and the second actuator with a second charge, and a circuit outputs a first voltage linearly based on the first charge and a second voltage linearly based on the second charge.

Abstract: It is sought to provide an ion measuring device, which can accurately and readily measure both positive and negative ion data and realize its size and thickness reduction.

Abstract: A portable and easy to use tester for validating the accuracy of wiring diagram manuals and for testing modifications and new installations for proper wiring. The invention also provides an easy way to create a wire list describing all the interconnections between attached connectors. The tester can also be used as a troubleshooting tool without having a previously learned cable reference. The invention further tests wiring insulation in a wiring harness and identifies poor wire to wire and wire to ground insulation. Finally the present invention provides a system for generating a wiring diagram based upon the results of a wiring validation series of checks/tests.

Abstract: The present invention relates to a method for testing a conductor element (20) applicable to locating, a continuity defect of the conductor element, the conductor element having, relative to a reference conductor, an insulation resistance and a leak capacitance. According to the present invention, the method comprises a step of injecting into the conductor element at least two currents (i1, i2) of different frequencies by means of a current or voltage generator (23), one terminal of which is connected to the reference conductor, at least one step of measuring the amplitudes of currents at one measuring point (Pi) chosen along the conductor element, and a step of calculating the imaginary part of currents and/or calculating the leak capacitance of the conductor element downstream from the measuring point (P1).

Abstract: In order to detect performance parameter variations at different locations, local parameter detectors are located at the various local locations. One of the local locations is selected as the reference location while the other local locations are selected as destination locations. The reference location is utilized to determine a reference parameter value, while each destination location compares its local parameter value to the reference parameter value. The parameter values are current encoded and the reference parameter value is sent to the other locations for the comparisons. The comparison at the destination locations each generates a corrective signal to compensate for the difference in the parameter value between the locations. Parameter compensation is provided to reduce performance skew among the distributed locations.

Abstract: A method for measuring bioelectric impedance in real time, in the presence of interference and noise is disclosed. A small electric current is injected into a biopotential electrode system, and then the measurement is tested for contamination by electrical interference or other noise sources.

Abstract: An apparatus and method for measuring a change in capacitance are provided. The apparatus includes a first gain adjuster, a second gain adjuster, an amplifier, a demodulator, a controller, and a change measuring unit. The first gain adjuster adjusts the gain of an input signal and outputs the gain-adjusted input signal to the first terminal as a first modulating signal, while the second gain adjuster adjusts the gain of an inverted input signal and outputs the gain-adjusted inverted input signal to the second terminal as a second modulating signal. The amplifier amplifies a modulated signal output from a junction between the first and second capacitors and outputs the amplified result. The demodulator that demodulates the amplified result received from the amplifier in response to a control signal and outputs the demodulated result. The controller generates the control signal per unit period of the input signal and outputs the generated control signal to the demodulator.

Abstract: The present invention relates to a system for nulling drive feedthrough error in a sensor having first and second drive electrodes which impart vibratory motion to first and second proof masses in response to first and second opposite phase drive signals, and having first and second capacitances defined between the drive electrodes and their associated proof masses. A mismatch between the first and the second capacitance is measured. Drive feedthrough caused by the measured capacitance mismatch is nulled by adjusting the relative amplitudes of the first and second opposite phase drive signals, whereby the ratio of the amplitudes is proportional to the ratio of the first and second capacitances. A servo loop may adaptively effect the ratio of amplitudes.

Abstract: A temperature detection device is provided for an electronic circuit, in particular for a HF tuner. The temperature detection device comprises a temperature detector, an analog-to-digital converter and a standardized serial bus. At its output the temperature detector makes available a temperature-dependent voltage that is a predetermined function of the temperature. The temperature-dependent voltage is applied to the input of the analog-to-digital converter. On its output side, the analog-to-digital converter is coupled to the standardized serial bus.

Abstract: A conductor is disposed within an area where electric coupling and magnetic coupling take place between the conductor and a device-under-test (DUT) in at least a portion of frequency band width, and the value of composite currents that is outputted in a plurality of directions different from each other against the DUT, is measured. Based on the measured plurality of values of the composite currents, the first electric current due to electric coupling between the DUT and the conductor and the second electric current due to magnetic coupling between the DUT and the conductor are calculated. From these first and second electric current values, electric field intensity and magnetic field intensity are calculated.

Abstract: In a conductive contact member typically used in fixtures for testing semiconductor devices and circuit boards having solder balls or terminals having solder deposited thereon, and electric sockets for semiconductor devices, a layer of highly electrically conductive material resistant to solder deposition is formed at least over a conductive contact part of the conductive contact member so that transfer of solder of the object to be tested onto the conductive contact member can be reduced and the number of possible contacts that can be effected before the cleaning of the solder deposition on the contact part becomes necessary can be increased. Therefore, the run time of the test line can be increased, and the maintenance cost can be reduced.

Abstract: An object of the present invention is to provide an inspecting device equipped with a probe card capable of inspecting an object to be inspected appropriately even at heating or cooling time. The inspecting device of the present invention is an inspecting device equipped with a performance substrate provided with a terminal for inspection; a contactor substrate provided with a probe contacting an object to be inspected; and a probe card intervening between the probe of conductor substrate and a terminal of performance substrate, wherein the probe card is a multi-layered substrate in which a resin thin film is laminated on a ceramic board.

Abstract: A pass through test system for testing an electronic module includes an interface board, and test contactors movably mounted to the interface board for electrically engaging terminal contacts on the module with a zero insertion force on the modules. The interface board is configured for mounting to an automated or manual pass through test handler in electrical communication with test circuitry. In a first embodiment the interface board includes test pads in electrical communication with the test circuitry, and rotatable test contactors having spring contacts configured to simultaneously engage the test pads and the terminal contacts on the module. In a second embodiment the interface board includes test pads in electrical communication with the test circuitry, and slidable test contactors having beam leads configured to simultaneously engage the test pads and the terminal contacts on the module.

Abstract: A probe assembly provides the capability to test integrated circuit (“IC”) packages mounted onto ball grid arrays. The method comprises the step of first creating the lay out of the flexible attachment. Top and bottom rigid PC Boards are lain out and drilled. The drill creates holes that are the press fit diameter of nail pin. The holes are then plated with an annular ring on the outer exposed surface. The next step comprises laminating the flexible circuit between the two rigid PC Boards. Press fit nail pins are inserted through the holds in one side of the laminate sandwich until flush with the surface of the PC Board. Solder preforms are soldered the bottom surface of the laminate sandwich. The preforms mechanically and electrically attach the pins to the bottom rigid PC Board. A BGA socket can then be attached to the pins extending from the bottom of the laminated Flex-Rigid-Flex assembly.

Abstract: An assembly, including a tool for measuring an applied force and its centroid relative to the center of the tool. A method of measuring and adjusting a force and its centroid applied to a semiconductor chip in a socket by an abutting heat sink consisting of the steps of inserting the tool in the socket, applying a heat sink on said tool, measuring the applied force and its centroid with respect to the center of the tool, adjusting the heat sink until the centroid of the applied force is substantially aligned with the center of the tool, removing the heat sink and tool, from the socket, substituting a semiconductor chip for the tool and reapplying the heat sink whereby the centroid of the force applied by said heat sink is substantially aligned with the center surface of the semiconductor chip in said semiconductor device.

Abstract: An electronic module test assembly comprising a frame, an array of contact pins, and at least one latch. The frame has a recess formed therein for receiving an electronic module. The array of contact pins is anchored to the frame. The contact pins have resiliently depressible terminals forming a resiliently depressible contact array in the recess. The latch is movably mounted to the frame for latching the electronic module to the frame. The latch is movable relative to the frame and engages an outer edge of the electronic module when the electronic module is disposed against the resiliently depressible contact array. The resiliently depressible contact array biases the electronic module against the latch.

Abstract: An automated multi-chip module (MCM) handler for automated module testing which employs a module feed employing a plurality of stackable magazines, the leading one of which in an input stack is positively displaced through an indexing device which positively retrieves each MCM, guides it at a test site, and positively ejects a tested MCM from the test site for sort and direction along an inclined track to either a shipping tray or a discard bin. After a magazine is emptied of MCMs, it continues to an output location where it is stacked with other empty magazines. The test site includes a mechanism for positively engaging and aligning each MCM before engagement by the test contacts. A particularly suitable magazine for use with the handler is also disclosed, as is a method of module handling.

Abstract: A tape carrier package (TCP) testing method is performed by means of a TCP testing system that comprises a main test unit, a recorder and a hardware interface coupled with the main test unit and the recorder. Each tape carrier package is submitted to a first testing in the main test unit without being discarded regardless of the testing results provided by the main test unit. Each tape carrier package is attributed an identification code. The testing results obtained are recorded correspondingly to the identification codes through the hardware interface into the recorder. The recorded testing results are subsequently analyzed by an engineer and a re-testing is achieved to recover tape carrier packages initially tested defective. The packages that are tested defective in the second testing are discarded.

Abstract: Disclosed is a technique capable of improving a yield of a semiconductor device by measuring a plurality of TEGs arranged in a scribe region. A first electrode pad connected to each terminal of a TEG is formed as a rectangular, minute, isolated pattern having a side length of about 0.5 &mgr;m or shorter and constituted of an uppermost layer wiring on a semiconductor substrate, and therefore, a great number of TEGs can be laid in a first scribe region. The characteristic evaluation or the failure analysis is performed by contacting a nanoprobe having a tip radius of curvature of 0.05 &mgr;m to 0.8 &mgr;m to the first electrode pad.

Abstract: Improved methods and apparatuses are provided for conducting bi-directional signaling and testing. The outputs of at least two driver circuits are connected to a resistive network. The output signals from the driver circuits are combined through the resistive network to produce a resultant signal that is an attenuated version of at least one of the output signals. The resistive network and the driver circuits are configured such that the resultant signal is provided to an output node of the resistive network but not to an input node of the resistive network. An input/output node of an external circuit is connected to the input node of the resistive network, wherein the external circuit is configured to receive the resultant signal and output an external signal. An input node of a receiver circuit is connected to the output node of the resistive network.

Abstract: A testing device for a semiconductor component including at least one first contact. The testing device contains at least one second contact for producing an electrical connection to the first contact. The second contact is immobile relative to the testing device.

Abstract: A method of engaging electrically conductive test pads on a semiconductor substrate having integrated circuitry for operability testing thereof includes: a) providing an engagement probe having an outer surface comprising a grouping at a plurality of electrically conductive projecting apexes positioned in proximity to one another to engage a single test pad on a semiconductor substrate; b) engaging the grouping of apexes with the single test pad on the semiconductor substrate; and c) sending an electric signal between the grouping of apexes and test pad to evaluate operability of integrated circuitry on the semiconductor substrate. Constructions and methods are disclosed for forming testing apparatus comprising an engagement probe having an outer surface comprising a grouping of a plurality of electrically conductive projecting apexes positioned in proximity to one another to engage a single test pad on a semiconductor substrate.

Abstract: A driver operable with two power supplies, and provides, among other things, a high data communication rate, stabilized operating parameters including voltage output high, voltage output low, and on resistance, and edge rate over a wide range of variations in manufacturing process, operating voltages and temperature.

Abstract: The system and method of the present invention provides an innovative bus system of lines which can be programmed and to provide data, control and address information to the logic circuits interconnected by the bus system. This flexible structure and process enables a configurable system to be created to programmably connect one or more logic circuits, such as megacells. The programmability of the bus system enables the cascading of multiple megacells in an arbitrary fashion (i.e., wide, deep or both) and the sharing of common lines for system level communication.

Abstract: A voltage level shifter comprises an input stage in the form of cross-coupled source followers and an output stage in the form of an amplifier AMP, which may have single-ended or differential inputs. The source followers comprise the transistors M1 and M2 and the transistors M3 and M4. Differential inputs IN and !IN are connected to the gates of the transistors M2 and M4. A bias voltage is supplied to the gate of the transistor M1 from a node B to which the drain of the transistor M3 and the source of the transistor M4 are connected. Similarly, a bias voltage is supplied to the gate of the transistor M3 from a node A to which the drain of the transistor M1 and the source of the transistor M2 are connected.

Abstract: A decode circuit for selecting one of a plurality of output lines in dependence on the status of a plurality of input lines, the circuit comprising: a first decode arrangement comprising: a first decode node; first precharging circuitry for charging the first decode node to a charging potential; first discharging circuitry comprising a plurality of switching means each operable in dependence on the status of a respective one of the input lines to couple the first decode node to a discharging potential; and first selection circuitry coupled to a respective one of the output lines and operable in response to a first enable signal to select that output line if the first decode node has not discharged; and a second decode arrangement comprising: a second decode node; second precharging circuitry for charging the second decode node to a charging potential; second discharging circuitry comprising a plurality of switching means each operable in dependence on the status of a respective one of the input lines to coupl

Abstract: A MOSFET logic circuit for performing a logic OR operation is presented including three transistors, wherein at least two input signals are provided to the circuit and an output signal indicative of an OR operation performed on a first and second input signal of the at least two input signals is output from the circuit.

Abstract: In a current mode logic (CML) circuit, a high impedance state is implemented at the output for a bi-directional buffer. The output common mode voltage can be adjusted at the same time, which is particularly useful for a CML off-chip driver.