Abstract: A rechargeable battery which may be used with most presently available hearing aids (or other appliances) with no modification to the existing hearing aid is needed in order to use the described wireless charging system. The battery may be known a “Dynamic battery” as the battery is actively charged by means of an inductor circuit built into the battery housing itself or added onto the battery. The hearing aid may simply be placed within the charger housing (or cradle) to charge the battery. No electrical connection by either wires or electrical contacts is needed to recharge the battery, which is located inside the hearing aid housing. Moreover, the battery need not be removed from the hearing aid (or other appliance).

Abstract: A battery control system capable of relatively smoothly canceling memory effects caused to a battery mounted on a hybrid vehicle, while avoiding deterioration of the battery and vehicle performance. Upon detection of generation of charge memory effects, an HVECU changes the center of a control range for the battery's charged amount (SOC) from its ordinary value to a value in the vicinity of an upper limit of an appropriately charged range. This SOC control is continued for a predetermined amount of time for cancellation of charge memory effects. Under such control, SOC basically varies within a range lower than where excessive charging may possibly be caused, so that battery deterioration due to excessive charging and droped power consumption due to prohibited charging can be prevented.

Abstract: The invention refers to a charge/discharge protection circuit for a rechargeable battery, where the protection circuit is integrated on a single chip, including the fusible link, the load current switch and the short-circuit switch. This is achieved by dividing the functions of the fusible link, the load current switch, and the short-circuit switch into in parallel arranged T-sections, each of which is designed for only a fraction of the nominal load so that each of the easily integrated fuse segments carry only the respective fraction of the nominal current. It is important that the entire protection circuit or its control logic will not be destroyed before through an unduly high over-voltage, in which case the sequential melting of the fuse segments would no longer be guaranteed. This is handled by a semiconductor switch which short-circuits the over-voltage immediately.

Abstract: A battery monitor is provided for use with a battery of an automotive vehicle. The battery monitor can provide real time battery condition measurements and can selectively control the charging of the battery through an alternator of the vehicle based upon the measured battery condition.

Abstract: A lithium ion battery particularly configured to be able to discharge to a very low voltage, e.g. zero volts, without causing permanent damage to the battery. More particularly, the battery is configured to define a Zero Volt Crossing Potential (ZCP) which is lower than a Damage Potential Threshold (DPT). A method for using a battery capable of tolerating discharge to zero volts is also disclosed.

Abstract: The present invention relates to a free-running circuit arrangement for operating a load (La), having at least one switching element (T1, T2), a freewheeling diode that is connected in an anti-parallel fashion relative to the main current direction of the at least one switching element (T1, T2), a load circuit (L3, C6, C5) and a control resonant circuit (L2, CE,T1, CE,T2) which comprises at least one control inductor (L2) and at least one self-capacitance (CE,T1, CE,T2) of the at least one switching element (T1, T2), the at least one switching element (T1, T2) having a control electrode, a working electrode and a reference electrode, there acting between the control electrode and the working electrode a capacitance (CM,T1, CM,T2) that is coupled to the control resonant circuit (L2, CE,T1, CE,T2) in such a way that energy is fed into the control resonant circuit (L2, CE,T1, CE,T2) by the charging and discharging current (ICM,T1, ICM,T2) of this capacitance (CM,T1, CM,T2), the circuit arrangement having no comp

Abstract: A current-mode switching regulator that maintains a substantially constant maximum current limit over a virtually full range of duty cycles is provided. The regulator has a control circuit that includes a buffer circuit, an adjustable voltage clamp circuit, and a slope compensation circuit. The buffer circuit isolates a control signal from capacitive loading associated with control circuit. The threshold level of the adjustable voltage clamp circuit varies with respect to the amount of slope compensation provided to the voltage regulator. This allows a control voltage to increase as slope compensation increases so that a substantially constant maximum current limit is maintained.

Abstract: A probe apparatus with a probe network consisting of two electrical paths. One path is a dc path and the other path is an ac path. The separation of the dc and ac currents allows wide-band probing of circuits with a low mass probe tip that has acceptable input impedance.

Abstract: A Fast Fourier Transform based digital radiometer providing a frequency contiguous set of noise temperature measurements to characterize an atmospheric vertical temperature profile. The radiometer also has Doppler correction to account for velocity of a vehicle on which the radiometer is located and direction changes of a scene being measured.

Abstract: Second-order harmonic tuning of an active device, such as a transistor used in a radio frequency (RF) power amplifier circuit, is accomplished by positioning a quarter-wavelength stub along a transmission line coupled to an output of the device, such that the output is presented with a desired impedance for the second harmonic.

Abstract: A power sensing RF termination comprising a calibration means allows the user to correct for part-to-part variation, miss match loss and output offset. The power sensing RF termination comprises a first and second temperature sensitive resistors connected at a first common junction, a switching means for connecting either an RF input or a DC power reference to the first common junction, a first switch for connecting either a DC voltage source or a first current detecting resistor to the first temperature sensitive resistor, and a second current detecting resistor connected to the second temperature sensitive resistor. A first output terminal is connected to the junction between the first switch and the first temperature sensitive resistor. A second output terminal is connected to the first common junction. A third output terminal is connected to the junction between the second temperature sensitive resistor and the second current detecting resistor.

Abstract: A small sized electro-optic voltage sensor capable of accurate measurement of high levels of voltages without contact with a conductor or voltage source is provided. When placed in the presence of an electric field, the sensor receives an input beam of electromagnetic radiation into the sensor. A polarization beam displacer serves as a filter to separate the input beam into two beams with orthogonal linear polarizations. The beam displacer is oriented in such a way as to rotate the linearly polarized beams such that they enter a Pockels crystal having at a preferred angle of 45 degrees. The beam displacer is therefore capable of causing a linearly polarized beam to impinge a crystal at a desired angle independent of temperature. The Pockels electro-optic effect induces a differential phase shift on the major and minor axes of the input beam as it travels through the Pockels crystal, which causes the input beam to be elliptically polarized.

Abstract: A method for verifying a device under test includes inputting a control command, compiling the control command to a corresponding data-bus command, and simulating the result generated by the device under test after executing the data-bus command and comparing the result with an expected value. The method allows the tester to input readable hardware control commands with various methods, rather than to perform a simulation test by inputting unreadable data-bus control commands.

Abstract: An eye monitor for evaluating a binary input signal of a transmission link and for recognizing the edges of an eye diagram of the input signal is described. A decision circuit is provided which is directly connected to an integrator. The input signal and a variable threshold are provided to the decision circuit. An output signal of the integrator is used to recognize the edges of the eye diagram.

Abstract: A circuit tester (1) and method of testing the integrity of a series-wired electrical circuit are disclosed, such as a string of Christmas fairy lights powered by domestic means electricity, through the use of a tester comprising a pair of matching AC current sensors (1, 2) adapted to be positioned adjacent to a pair of wires forming part of the circuit to be tested, such as between or around a pair of wires (29, 30) extending from a fairy light bulb socket (31), the tester then feeding the signals to a matching pair of signal amplifiers (3, 4) and thereafter to a logic gate (5) which provides an output signal to a first display (6) indicating the receipt of matching signals and hence a closed circuit between the wires, and in the event of receipt of mismatching signals from the amplifiers a different output signal is sent to a second display (7) which indicates a discontinuity in the circuit between the pair of wires being tested, such as by a broken fairy light bulb in the circuit therebetween.

Abstract: A solid-state electricity meter uses a sensor to measure a current supplied to a load. In one aspect, the electricity meter housing includes a meter base, a register cover, and a meter cover. The meter base includes a plurality of meter cover lock notches disposed about a periphery of the meter base. The register cover includes a plurality of secure ramps disposed on a base portion thereof, each secure ramp having a ramped portion along one side and a land portion. The meter cover includes a plurality of locking tabs corresponding to the meter cover lock notches and further includes a plurality of meter cover locks corresponding to the secure ramps. Upon insertion of the meter cover locking tabs into the meter base lock notches and rotation of the meter cover in a predetermined clockwise or counterclockwise direction, the meter cover locks engage the corresponding secure ramps, thereby biasing the meter cover locking tabs against the backside of the meter base to provide a secure connection.

Abstract: A system and method of testing the quality of electronic device interconnections uses a pressure-sensitive medium. The interconnections of the electronic device are placed in contact with the pressure-sensitive medium. Force is then applied to the device so that an indication of the pressure exerted by each interconnection is produced by the pressure-sensitive medium. The indication of the pressure exerted by each interconnection is then analyzed to determine the quality of the connections of the electronic device.

Abstract: A prober of this invention includes a probe card, a main chuck, a shaft member fixed on and extending downwardly from the main chuck, an X table and Y table for retaining the shaft member by use of a guide to be freely movable in a vertical direction, and a contact body fixed on the shaft member. The undersurface of the contact body is made parallel to the mounting surface of the main chuck. The prober further includes an elevation body whose center coincides with an extension line downwardly extending from the test center of the probe card, and an elevation body elevating mechanism for vertically moving the elevation body and a ball provided on the upper portion of the elevation body is slidably set in contact with the undersurface of the contact body.

Abstract: An eddy current inspection probe for inspecting a preselected surface. The eddy current inspection probe includes an expandable element at least partially defining an interior space which is expandable by introducing a pressurized fluid into the interior space from a collapsed position to an expanded position for contacting the preselected surface of the component for inspecting the surface. The probe also includes an eddy current array positioned over the expandable element for generating and detecting magnetic fields in the component to inspect the preselected surface.

Abstract: The present invention provides a method for the direct measurement and quantification of the material volume loss on and beneath a first surface of a substrate and thus provides an accurate depiction of the profile of the substrate. The method of the invention comprises inducing multiple eddy currents in a test substrate to determine volume loss.

Abstract: It is an object to obtain a scanning probe microscope capable of effectively suppressing a reduction in precision in a measurement. A conductive probe (2C) has such a pyramid structure as to be expanded from a tip portion to a bottom surface (a surface on which a cantilever (1) is to be formed) and a semiconductor integrated circuit (12) is formed in a side surface of the conductive probe (2C). An amplifying circuit (12a) to be the semiconductor integrated circuit (12) amplifies an electrical characteristic signal given from the conductive probe (2C) to send the electrical characteristic signal to a signal processor (10) through a conductive cantilever (1C) and a signal cable (9) (FIG. 1).

Abstract: Magnetic resonance imaging apparatus uses an array of at least two receive coils 4, 5 to perform parallel processing to enable phase-encode gradients to be omitted during data collection, and restored during processing using parallel processing to further reduce patient time in the apparatus, pre-acquired reference data is used (modules 10, 11) to unfold the aliased target data in modules 8, 9. In accordance with the invention, the unfolding is performed against a series of representations of the reference data, varied for translational rotational and coil loading errors, and the unfolded image is chosen as that having the minimum entropy.

Abstract: In apparatus for magnetic resonance imaging equipped for parallel imaging, in the sense that an array of receive coils can be used to regenerate data at phase-encode gradients interposed between those at which measurements were taken, the full set of data is collected, which is then split into two sets with a greater separation of phase-encode gradients (FIGS. 13 and 14). These sets are then each regenerated (FIGS. 15 and 16), enabling spurious data to be excised from the original data set by comparison of the two representations.

Abstract: A magnetic resonance apparatus has a basic field magnet for providing a uniform magnetic basic field, a gradient coil system for coding within the basic field as well as a passive shim system for homogenizing the magnetic basic field. This passive shim system is composed of shim iron plates that are placed in the magnetic basic field. A device is provided with which the temperature of these shim iron plates is controlled.

Abstract: The present invention provides a magnetic field generator for MRI in which, by simplifying the component parts of the pole pieces incorporated therein, the magnetic field generator for MRI can be manufactured at a lower cost without detracting from its magnetic characteristics. Specifically, the present invention provides an inclined magnetic field generation coil for use in a magnetic field generator for MRI, the coil comprising a plurality of magnetic field regulating holes (17), an electric conductor in coiled form, and a resin base.

Abstract: An improved induction tool for formation resistivity evaluations. The tool provides electromagnetic transmitters and sensors suitable for transmitting and receiving magnetic fields in radial directions that are orthogonal to the tool's longitudinal axis with minimal susceptibility to errors associated with parasitic eddy currents induced in the metal components surrounding the transmitter and receiver coils. The present invention provides increased effective tool surface impedance by increasing self-inductance of the paths in which induced eddy currents flow on the surface of the multi-component induction instruments.

Abstract: A toy play set comprising a master toy member and two or more accessory toy members. The master toy member comprises a power source, an audio driving circuit and an audio transducer. Each of said accessory toy member is configured to receive power from said master toy member by contact and to provide visual response and/or an audio sound through a speaker located at said master toy member.

Abstract: A toy play set comprising a master toy member and two or more accessory toy members. The master toy member comprises a power source, an audio driving circuit, an audio transducer and one or more receivers. Each of said accessory toy member is configured to receive power from said master toy member by contact and to provide visual response and/or an audio sound through a speaker located at said master toy member.

Abstract: A base resistance of the battery is obtained by cyclically measuring a discharge current and a voltage between a pair of terminals of the battery, while a rush current is flowing in an electric load electrically connected to the pair of the terminals. The rush current monotonically decreases from a peak to a constant value after the rush current monotonically increases from zero to the peak. A concentration polarization resistance and an activation polarization resistance of the battery are also obtained from the discharge current and the terminal voltage. A degradation degree of the battery is obtained by multiplying the degradation degrees of the base resistance and the polarization resistances together.

Abstract: A discharge current and a voltage between a pair of terminals of a battery while a rush current is flowing in a load electrically connected to the pair of the terminals. The rush current simply decreases from a peak to a constant value after the rush current simply increases up to the peak. A first approximate equation is provided for showing a correlation between the current and the voltage in a region where the discharge current is increasing. A second approximate equation is provided for showing a correlation between the current and the voltage in a region where the discharge current is decreasing. A voltage from each of the first and second approximate equations at a point where the discharge current is zero is calculated so that a deference between the two voltages at the current zero point is obtained. The deference is determined to be a total voltage drop due to a concentration polarization of the battery.

Abstract: An apparatus to detect a breakdown in the insulation of a through-bolt in a laminated generator core is provided. The apparatus provides a ground detection circuit to generate and sense a signal in response to a ground that develops as a result of a breakdown in through-bolt insulation. Preferably, the circuit includes a signal source that generates a signal in response to insulation breakdown and a signal sensor to sense the signal so generated. The apparatus, moreover, can identify which among a plurality of through-bolts has experienced an insulation breakdown. Methods also are provided for detecting a breakdown in through-bolt insulation and identifying which among a plurality of through-bolts has experienced a breakdown in insulation.

Abstract: A method for determining the DC current flowing through an AC power meter. The internal impedance of the distribution transformer is first sensed, then the DC voltage in the AC voltage waveform is measured and finally the measured DC voltage is converted to DC current.

Abstract: This invention relates to a strobe charge apparatus for charging a capacitor using a flyback transformer.

Abstract: An integrated circuit includes analog test cells to determine if an analog signal is within a predetermined voltage or current range. The test cell uses one or more analog reference signals to establish boundaries of a test range. Different embodiments of the analog test cells selectively test multiple analog signals provided in an integrated circuit. A test system can be provided to test multiple analog signals of an integrated circuit by scanning multiple analog test cells distributed throughout the integrated circuit and providing the test data for analysis. An analog circuit of an integrated circuit can be tested at different stages in manufacturing, including during a wafer stage prior to separation of individual circuit dice. Further, analog circuitry can be tested and characterized without the need for analog or digital/analog testers. In contrast, a digital only tester can be used to test analog circuitry.

Abstract: A method is described for testing thin material wherein the material is irradiated with ultrasonic waves at least in certain areas and transmission of the ultrasonic waves through the material is determined and evaluated. The transmission of ultrasonic waves of different frequencies is thereby determined. The differences of the transmission at the different frequencies are then used to determine a criterion for evaluating the quality, in particular the porosity, of the irradiated material. Furthermore, a corresponding test device is described.

Abstract: A portable grain moisture measurement device has an automatic grain moisture measurement actuation system whenever the compaction of the grain within a test cell of the device is at a preset value and upon such automatic actuation a visual display is activated to indicate that a moisture measurement is being taken as well as the sounding of an audible alarm indicating this measurement to warn the user that further compaction of the grain is unnecessary.

Abstract: A multi-range measuring circuit for measuring a flow of electrical current between a first node and a second node. A measurement resistor is connected to the first node to develop a voltage having a high range output. A summing node connected in series with the measurement resistor acts as an input to an amplifier for developing a second voltage having a low range output having a higher scale factor than the high range output. If the capacity of the amplifier to maintain the low range as a linear function is exceeded, a bypass circuit bypasses excess current flow to the second node.

Abstract: A built-in test system for aircraft indication switches comprises a plurality of aircraft indication switches and a first resistor adding network having input resistors individually connected to first contacts of different ones of the indication switches. The test system further includes a second resistor adding network having input resistors individually connected to second contacts of different ones of the indication switches. Output circuitry is provided for coupling outputs of the first and second resistor adding networks to an electronic control unit for the aircraft.

Abstract: A test arrangement is designed to test whether one in a chain of vias or contacts has abnormally high resistance. The arrangement contains a plurality of via or contact chains and a plurality of decoders. The chains are switchably connected to a resistance measurement device. Each decoder has a unique address such that it will generate a control signal when a predetermined address is address thereon. The control signal is used to close a switch, which connect one of the chains to the resistance measurement device. By sequentially applying different addresses to the decoders, the resistance of the chains can be individually measured.

Abstract: An alignment technique can be used to align a semiconductor wafer during wafer testing. During a gross alignment process, a bump pattern on the wafer surface is located. Based on a known relative location relationship between the bump pattern and a fiducial on the wafer surface, the fiducial can be located. The wafer can then be initially aligned. During a fine alignment process, the bump pattern technique can again be used and additional alignment performed. Blurring can be used so that features other than bumps become less discernable.

Abstract: For qualification testing in product development, a test assembly contains a surrogate circuit board (7) and surrogate electronic modules (5) supported thereon. The terminals (5a-5j) of the modules are joined to respective bonding pads (2a-2j) on the circuit board to form bonded joints. The modules terminals and the wiring of the associated bonding pads is configured to produce at least one test series circuit (21) associated with each module that includes the bonded joints. A tester (9) supported on the circuit board monitors the test series circuit and produces a persistent indication (10) should a break or interruption occur in a bonded joint or any other portion of the test series circuit. This allows indications of transient breaks that occurred when the test assembly was being subjected to stresses, such as those induced by temperature excursions, mechanical vibration, and/or mechanical shock to be preserved and recorded at a later time.

Abstract: An inspection apparatus and method for test mode circuit and test ambient on an integrated circuit chip. The integrated circuit chip has an input pin, an output pin and a function circuit. The inspection apparatus has a test mode circuit and a test pattern generator. The test mode circuit is built in the integrated circuit chip to test the function circuit. The test pattern generator is coupled to the input pin to receive a test signal. According to the operation of the test mode circuit, an output signal is output from the output pin. According to the output signal, whether the test mode circuit and the test ambient are correct is determined. Thus, when problems occur while testing chips, a lot of time of analysis is saved. Whether the problems occur from the function circuit, the test mode circuit or the test ambient set up is realized.

Abstract: A system and method for the analysis of electrical characterizations of semiconductor and electronic devices that utilizes a computing device to initiate a testing procedure of an electronic device by the delivery of a test voltage or current signal to the electronic device by way of the hardware interface. The electronic device's response to the voltage or current signals is measured by the hardware interface and the responsive signal is analyzed and the results displayed on a computing device.

Abstract: A method and system for partial scan testing of integrated circuits is disclosed. The invention includes determining at least one failed functional block during testing of the integrated circuit. The failed functional block is then logically isolated from the remaining non-failing functional blocks. Scan testing of the remainder of the non-failing functional blocks then occurs to determine the integrity of the remainder of the integrated circuit. The data coming out of the failing functional block is not allowed into the other functional blocks as input data. The invention allows the integrated circuit to be used and sold at a reduced functionality for applications not requiring the failed functional block(s).

Abstract: A method of testing a power module including a control gate, an emitter, a collector, at least one power component on a dielectric substrate and a diode connected in antiparallel with the power component measures partial discharges occurring between the emitter and the collector when an alternating current voltage source superimposed on a direct current voltage source is connected between the collector and the emitter of the power module. The voltage Vtest received by the power module between the collector and the emitter verifies at all times the condition Vtest>0 so that the diode never conducts. The power component is maintained in a turned off state during the test by means of a direct current voltage source connected between the control gate and the emitter.

Abstract: A noise canceling circuit is provided in a dynamic circuit that includes a high fan-in domino gate. The noise canceling circuit decouples noise from neighboring wires in the dynamic circuit that is injected into a wire that controls the domino gate.

Abstract: A method for reducing the noise associated with a clock signal for a latch based circuit has been developed. The method includes storing a charge at a pre-determined time of the clock cycle and releasing the stored charge also at a pre-determined time of the clock cycle. The charge is released onto the power grid of the system served by the clock signal in synchronization with the operation of the latch.

Abstract: A tri-state driver arrangement has a coupler (2) for the potential-free transmission of signals between an input and an output of the tri-state driver arrangement (1) and an output driver (8) with tri-state characteristics connected to the output. In order to reduce the outlay on the circuit and the power of the driver, in a first embodiment the coupler (2) is arranged as a magnetic coupler. In a second embodiment, it is proposed that the output voltage (UOUT) of the coupler (2) is to be monitored with respect to certain threshold values (−UTH, +UTH) in order to switch the output driver (8) into the tri-state condition depending upon this output voltage.

Abstract: A receiver for bidirectional signal transmission, where signals are sent and received in both directions over a signal transmission line, has a signal line, a first hold capacitor, a signal line voltage buffer circuit, a hybrid circuit, and a decision circuit. The signal line is connected to the signal transmission line, the first hold capacitor is used to hold a signal, and the signal line voltage buffer circuit is used to buffer a voltage of the signal line. Further, the hybrid circuit is used to output a received signal by separating the received signal from the signal line voltage buffered by the buffer circuit, and the decision circuit is used to make a decision on the logic value of the received signal separated and output by the hybrid circuit.

Abstract: The invention includes digital logic devices with extremely skewed trip points and reset circuitry for rapidly propagating signal edges. Embodiments of skewed logic devices in accordance with the present invention included inverters, buffers, NOR gates, NAND gates for rapidly propagating a selected “fast” edge of an input signal. Additional embodiments include pulse stretchers, memory devices, substrates, computer systems and methods incorporating the skewed logic devices of the present invention. Each embodiment of a skewed logic device of the present invention is configured to propagate a either a fast rising edge or fast falling edge of an output signal, i.e., the “fast” edge, at rates comparable to those of domino logic. An advantage of the skewed logic devices of the present invention over conventional CMOS logic devices is rapid edge propagation. Additionally, virtually all of the input gate loading is devoted to the fast edge being propagated.