Patents Issued in November 6, 2003
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Publication number: 20030205992Abstract: A switching network with trimmable resistors lies in a control loop of a voltage generator that can be switched off from the supply voltage by a logic device. The logic device and also the switching network are driven by the same signals. The circuit configuration can be used for trimming or switching off the output voltage generated by the voltage generator during the functional test. As many settings as possible for the output voltage can be tested by a small number of control signals.Type: ApplicationFiled: May 14, 2003Publication date: November 6, 2003Inventors: Thomas Hein, Patrick Heyne, Thilo Marx, Torsten Partsch
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Publication number: 20030205993Abstract: A voltage generating circuit includes a plurality of field effect transistors at least partially having gates same in conductivity type but different in impurity concentration. The gates are different in impurity concentration by not less than one digit.Type: ApplicationFiled: June 5, 2003Publication date: November 6, 2003Inventors: Shunsuke Andoh, Hirofumi Watanabe
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Publication number: 20030205994Abstract: A current mirror circuit that uses only a single seed current, and thus only a single current source. A transistor biasing circuit is connected in between the single current source and the two transistors of the first leg of the current mirror. The transistor biasing circuit provides two functions. First, the source current itself flows through the transistors of the transistor biasing circuit to the two transistors forming the first leg of the current mirror. Second, the transistor biasing circuit biases the gates of the transistors in the current mirror so that the output transistors are at the onset of saturation.Type: ApplicationFiled: May 6, 2002Publication date: November 6, 2003Applicant: Exar CorporationInventors: Shin-Chung Chen, Timothy Tehmin Lu
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Publication number: 20030205995Abstract: An intelligent battery pack in an electronic device such as a PC, sends such information as a voltage, a current, etc. related to power consumption to a controller via a line when the PC is driven by a battery. When the AC adapter is supplying electrical power to the device, the power source is changed to the battery pack once only during the measuring time so as to display data using both measuring and communicating functions of the battery pack. Consequently, no special electric power detector is provided in the power supply system of the AC adapter.Type: ApplicationFiled: February 16, 2001Publication date: November 6, 2003Inventors: Shigefumi Odaohhara, Tetsuji Nakamura, Tomoyuki Maruichi
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Publication number: 20030205996Abstract: An inexpensive and precise magnetic field sensor which comprises a Hall element and an amplifier is provided.Type: ApplicationFiled: March 20, 2001Publication date: November 6, 2003Applicant: Matsushita Electric Industrial Co., Ltd.Inventors: Jun-Ichiro Hara, Tadata Hatanaka
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Publication number: 20030205997Abstract: A wafer probe station is equipped with an integrated environment control enclosure substantially surrounding a supporting surface for holding a test device, such enclosure limiting fluid communication between the interior and exterior of the enclosure and preferably also providing EMI shielding and a dark environment. The limited communication between the interior and exterior of the enclosure is kept substantially constant despite positioning movement of either the supporting surface or probes. The positioning mechanisms for the supporting surface and probes each are located at least partially outside of the enclosure.Type: ApplicationFiled: May 19, 2003Publication date: November 6, 2003Applicant: Cascade Microtech, Inc., an Oregon corporationInventors: Warren K. Harwood, Paul A. Tervo, Martin J. Koxxy
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Publication number: 20030205998Abstract: A target wheel sensor assembly includes a target wheel, a magnet, and two or more sensing elements placed therebetween. The magnet and the sensing elements are configured so that as the target wheel rotates each of the sensing elements outputs a respective asymmetric signal relative to the direction of rotation of the target wheel or an object mechanically connected to the wheel. Each of these asymmetric signals is differentially combined with one another to determine the direction of motion of the target wheel, and, if optionally desired, the position of the target wheel.Type: ApplicationFiled: June 3, 2003Publication date: November 6, 2003Inventors: Joseph Pierre Heremans, Bruno P. B. Lequesne, Thaddeus Schroeder, Avoki M. Omekanda
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Publication number: 20030205999Abstract: This wheel speed detector is constructed of a magnetic sensor and a magnetic ring and is integrated with the inside of a seal device. The magnetic ring constitutes a part (core bar) of the seal device. This arrangement can enable the compacting and reduction in the number of components and improve space saving and assembling workability.Type: ApplicationFiled: April 30, 2003Publication date: November 6, 2003Applicant: Koyo Seiko Co., Ltd.Inventors: Minoru Sentoku, Motoshi Kawamura, Kazutoshi Toda, Nobuyuki Seo, Naoki Morimura, Tomohiro Ishii, Kanichi Kouda, Yoshifumi Shige, Fujio Harumi
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Publication number: 20030206000Abstract: A digital eddy current proximity system including a digital impedance measuring device for digitally measuring the proximity probes impedance correlative to displacement motion and position of a metallic target object being monitored. The system further including a cable-length calibration method, an automatic material identification and calibration method, a material insensitive method, an inductive ratio method and advanced sensing characteristics.Type: ApplicationFiled: May 29, 2003Publication date: November 6, 2003Inventor: Richard D. Slates
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Publication number: 20030206001Abstract: A digital eddy current proximity system including a digital impedance measuring device for digitally measuring the proximity probes impedance correlative to displacement motion and position of a metallic target object being monitored. The system further including a cable-length calibration method, an automatic material identification and calibration method, a material insensitive method, an inductive ratio method and advanced sensing characteristics.Type: ApplicationFiled: May 29, 2003Publication date: November 6, 2003Inventor: Richard D. Slates
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Publication number: 20030206002Abstract: A digital eddy current proximity system including a digital impedance measuring device for digitally measuring the proximity probes impedance correlative to displacement motion and position of a metallic target object being monitored. The system further including a cable-length calibrations method, an automatic material identification and calibration method, a material insensitive method, an inductive-ratio method and advanced-sensing characteristics.Type: ApplicationFiled: May 29, 2003Publication date: November 6, 2003Inventor: Richard D. Slates
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Publication number: 20030206003Abstract: A digital eddy current proximity system including a digital impedance measuring device for digitally measuring the proximity probes impedance correlative to displacement motion and position Of a metallic target object being monitored. The system further including a cable-length calibration method, an automatic material identification and calibration method, a material insensitive method, an inductive ratio method and advanced sensing characteristics.Type: ApplicationFiled: June 3, 2003Publication date: November 6, 2003Inventor: Richard D. Slates
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Publication number: 20030206004Abstract: A digital eddy current proximity system including a digital impedance measuring device for digitally measuring the proximity probes impedance correlative to displacement motion and position of a metallic target object being monitored. The system further including a cable-length calibration method, an automatic material identification and calibration method, a material insensitive method, an inductive ratio method and advanced sensing characteristics.Type: ApplicationFiled: May 30, 2003Publication date: November 6, 2003Inventor: Richard D. Slates
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Apparatus for determining a gap between a proximity probe component and a conductive target material
Publication number: 20030206005Abstract: A digital eddy current proximity system including a digital impedance measuring device for digitally measuring the proximity probes impedance correlative to displacement motion and position of a metallic target object being monitored. The system further including a cable-length calibration method, an automatic material identification and calibration method, a material insensitive method, an inductive ratio method and advanced sensing characteristics.Type: ApplicationFiled: May 30, 2003Publication date: November 6, 2003Inventor: Richard D. Slates -
Publication number: 20030206006Abstract: A digital eddy current proximity system including a digital impedance measuring device for digitally measuring the proximity probes impedance correlative to displacement motion and position of a metallic target object being monitored. The system further including a cable-length calibration method, an automatic material identification and calibration method, a material insensitive method, an inductive ratio method and advanced sensing characteristics.Type: ApplicationFiled: May 30, 2003Publication date: November 6, 2003Inventor: Richard D. Slates
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Publication number: 20030206007Abstract: An inductive displacement sensor having a displaceable or rotatable, magnetically permeable measuring head, at least one measuring loop whose geometric shape varies in response to the longitudinal/rotary displacement of the measuring head, and at least one excitation loop by which a magnetic flux can be generated in the measuring head. The flux penetrates the at least one measuring loop at any point of the longitudinal/rotary displacement, essentially in the region of the measuring head, and inducing an electric measuring signal (i2). A resonant circuit, which is electrically decoupled from the outside, is arranged on the measuring head and is excited in correct phase relation by a short voltage pulse after a number of, preferably, 10 to 20 free oscillations.Type: ApplicationFiled: May 1, 2003Publication date: November 6, 2003Applicant: Balluff GmbHInventors: Ernst Gass, Sandor Pali, Arpad Melles
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Publication number: 20030206008Abstract: A method for estimating a thickness profile of a substrate sample that has undergone a physical vapor deposition (PVD) process includes obtaining initial eddy current measurement values while an eddy current probe is positioned at an initial distance relative to the substrate sample. Terminating values are obtained while the eddy current probe is positioned at a modified distance relative to the sample. An intersecting line can be calculated using the initial and terminating resistance and reactance measurements. An intersecting point between a previously defined natural intercepting curve and the intersecting line may also be determined. A reactance voltage of the intersecting point may be located along a digital calibration curve to identify a closest-two of a plurality of calibration samples.Type: ApplicationFiled: April 14, 2003Publication date: November 6, 2003Inventor: Cuong Duy Le
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Publication number: 20030206009Abstract: A system for monitoring a plurality of semiconductor fabrication systems includes a communication link between each of the semiconductor fabrication systems and the monitoring system. In operation, initial eddy current measurement values are obtained while an eddy current probe is positioned at an initial distance relative to the substrate sample, and terminating values are obtained while the eddy current probe is positioned at a modified distance relative to the sample. An intersecting line can be calculated using the initial and terminating resistance and reactance measurements. An intersecting point between a previously defined natural intercepting curve and the intersecting line may also be determined. A reactance voltage of the intersecting point may be located along a digital calibration curve to identify a closest-two of a plurality of calibration samples.Type: ApplicationFiled: April 14, 2003Publication date: November 6, 2003Inventor: Cuong Duy Le
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Publication number: 20030206010Abstract: A sensor for monitoring a conductive film in a substrate during chemical mechanical polishing generates an alternating magnetic field that impinges a substrate and induces eddy currents. The sensor can have a core, a first coil wound around a first portion of the core and a second coil wound around a second portion of the core. The sensor can be positioned on a side of the polishing surface opposite the substrate. The sensor can detect a phase difference between a drive signal and a measured signal.Type: ApplicationFiled: May 27, 2003Publication date: November 6, 2003Applicant: Applied Materials, Inc.Inventors: Hiroji Hanawa, Nils Johansson, Boguslaw Swedek, Manoocher Birang
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Publication number: 20030206011Abstract: The invention provides an offset and low frequency noise insensitive magnetic sensor which incorporates a magnetic field effect transistors (MagFETs). Methods of improving the signal to noise ratio and reducing errors from offsets when measuring magnetic fields using MagFETs are also described.Type: ApplicationFiled: May 6, 2002Publication date: November 6, 2003Applicant: University College Cork-National University of Ireland.Inventor: John Doyle
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Publication number: 20030206012Abstract: The present invention includes a technique for use with magnetic resonance imaging that includes the application of a non-linear, higher-order gradient field in the presence of a moving object to be scanned. MR data is acquired as the object moves through the non-linear gradient field. Resulting images are contiguous and do not require the patching together of data in either k-space or image space and result in an image with expanded FOV in a longitudinal direction of the moving object.Type: ApplicationFiled: May 1, 2002Publication date: November 6, 2003Inventors: Richard Scott Hinks, Kevin F. King, Jason A. Polzin
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Publication number: 20030206013Abstract: A method of inducing tag lines in an MRI image is provided which allows adjustment of tag line width and spacing. The method includes determining a desired tag line width and then selecting a parameter of a SINC modulating function, such as main lobe bandwidth, in accordance with the desired tag line width. The method also includes determining a desired tag line separation and selecting a parameter of an RF pulse train based upon the desired tag line separation. A gradient field is applied to the specimen being imaged. The RF pulse train is modulated in accordance with the SINC modulating function and the modulated RF pulse train is applied to the specimen being imaged prior to an image acquisition operation. In one embodiment of the invention, the gradient is activated between pulses of the RF pulse train and is deactivated during the RF pulses.Type: ApplicationFiled: May 3, 2002Publication date: November 6, 2003Applicant: THE TRUSTEES OF COLUMBIA UNIVERSITY IN THE CITY OF NEW YORKInventors: Ed X. Wu, Haiying Tang
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Publication number: 20030206014Abstract: In a method for designing a selective RF pulse for a magnetic resonance apparatus, a desired excitation spectrum of the RF pulse is prescribed, a time function is formed by Fourier transformation of the excitation spectrum, a part is selected from the time function that, proceeding from a region around the zero point of the Fourier transformation, extends in a direction, and the selected part is designed to substantially convert to zero at least in the aforementioned region.Type: ApplicationFiled: May 2, 2003Publication date: November 6, 2003Applicant: Siemens AktiengesellschaftInventor: Oliver Heid
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Publication number: 20030206015Abstract: In a method for determining acoustic resonances in a magnetic resonance tomography system, a resonance measurement is implemented by applying a number of alternating gradient pulses that have a fixed time spacing relative to one another, applying an excitation pulse, and obtaining one or more MR signals, the MR signal of the resonance measurement is evaluated with respect to at least one parameter characterizing the acoustic resonance of the MRT system, the aforementioned steps are repeated with variation of the time spacing of the gradient pulses, a resonance curve is formed on the basis of the value of a characteristic parameter of the resonance measurement as function of the varied time spacing, and the resonance or resonances of the MRT system are determined from the resonance curve.Type: ApplicationFiled: April 29, 2003Publication date: November 6, 2003Applicant: Siemens AktiengesellschaftInventor: Thorsten Feiweier
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Publication number: 20030206016Abstract: A variable density non-Cartesian parallel-imaging method for reconstructing a magnetic resonance (MR) image is provided. In embodiments of the invention, an MR data set is obtained by sampling first and second sampling regions, wherein a first region is sampled with a first sampling density that is higher than a second sampling density of a second region. MR images corrupted by aliasing artifacts are reconstructed from the data obtained with each one of the coil-elements of a coil array. These images can be combined into one, de-aliased image using a modified version of Cartesian SENSE. The modification allows all the available k-space lines to be used in the processing, despite the fact that different k-space regions have different sampling densities (i.e. non-Cartesian sampling). Using all available lines is advantageous in terms of signal-to-noise ratio.Type: ApplicationFiled: May 1, 2003Publication date: November 6, 2003Inventor: Bruno Madore
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Publication number: 20030206017Abstract: A method and apparatus are provided which reduce coupling between a Z-axis gradient coil and an rf coil in magnetic resonance imaging systems and an rf shield disposed between the Z-axis gradient coil and the remaining gradient coils. The reduction in coupling is accomplished by novel windings of conductor forming the Z-axis gradient coil.Type: ApplicationFiled: May 3, 2002Publication date: November 6, 2003Inventor: Eddy B. Boskamp
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Publication number: 20030206018Abstract: A magnetic resonance apparatus has a receptacle space for the acceptance of at least one carrier device equipable with shim elements and at least one hollow member for conducting a coolant that cools the shim elements, a carrier device equipable with shim elements is designed forming at least one hollow member for conducting a coolant that cools the shim elements.Type: ApplicationFiled: April 29, 2003Publication date: November 6, 2003Applicant: Siemens AktiengesellschaftInventors: Matthias Gebhardt, Norbert Gebhardt, Johann Schuster
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Publication number: 20030206019Abstract: The present invention provides a system and method wirelessly transmitting MR signals from receive coils of an RF coil assembly to a remotely located receiver system. By utilizing wireless telemetry, ghosting, SNR problems, and standing waves on shields typically associated with cabled receive coils are avoided. Furthermore, by incorporating a rechargeable battery in place of DC cables, the coaxial cable conducting large currents can be eliminated. The present invention incorporates a transmitter that transmits a modulated MR signal to a receiver at the end of the bore of the magnet of the MRI system. Modulating the MR signals with a carrier frequency enables wireless transmission of the modulated signal to the remote receiver. Preferably, the modulated signal is transmitted using a 900 MHz carrier frequency. The receiver then demodulates the received signal and transmits the resulting signal to a system control for subsequent processing and image reconstruction.Type: ApplicationFiled: May 2, 2002Publication date: November 6, 2003Inventor: Eddy B. Boskamp
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Publication number: 20030206020Abstract: A Nuclear Magnetic Resonance (NMR) probe including a temperature controlled body for providing a sample for NMR measurement such that the temperature controlled body can adapt to the sample temperature to substantially maintain the body temperature. The body encases a conduit that can contain the sample for NMR measurement. In an embodiment, the desired temperature is the operating temperature of the NMR. The body is also in communications with a temperature sensor, a heat exchanger such as a heat exchanger, and a processor that includes instructions for controlling the body temperature.Type: ApplicationFiled: May 2, 2002Publication date: November 6, 2003Inventors: Tal Cohen, Naim Levi, Uri Rapoport
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Publication number: 20030206021Abstract: A method and apparatus for creating a time-varying electrical excitation, delivering it to a system comprising at least one electronic or electrochemical element, and measuring and analyzing a time-varying electrical response developed within the system in response to the excitation. The response signal, and optionally the excitation signal, are sampled in a synchronous manner, and the sampled values are analyzed to determine various characteristics of the system, including State of Charge and State of Health. Additional analysis may be performed to: identify specific system defects; identify and quantify time-dependent processes; and, obtain values for elements of an equivalent electric circuit model. The method and apparatus may serve both as a measurement system as well as a control sub-system, and may be configured to operate in either an open-loop or closed loop manner.Type: ApplicationFiled: May 21, 2003Publication date: November 6, 2003Inventors: William H. Laletin, Kurt Salloux, Logan L. Brashear
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Publication number: 20030206022Abstract: The invention relates to an apparatus and a method for detecting a current direction in a PWM converter or an inverter having one or more upper and lower arms, each of which consists of a switching device with an anti-parallel diode. The voltage across the switching device presents a different value and a polarity that depend on the direction of the current flowing through the switching device, wherein the current direction is acquired by sampling this voltage in the period of the trigger signal being on. In a case of small current, this sampled voltage value is relatively large to the flowing current magnitude and is easy to be distinguished. Furthermore, this invention presents a method for obtaining the phase angle between the load current and the output voltage, and judging whether the output current is zero or includes DC component. As a result, this method presents high precision.Type: ApplicationFiled: May 2, 2002Publication date: November 6, 2003Applicant: Delta Electronics, Inc.Inventors: Jianping Ying, Jin Wang, Zhigan Wu
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Publication number: 20030206023Abstract: Apparatus and method for determining the triacetin content in cigarette filter plugs during the manufacture of the filter plugs from a filter tow. The apparatus including a filter tow storage container, a filter tow stretching device, a device for feeding triacetin, to the filter tow, a plug-forming device, a device for dividing the plug into portions, a first microwave sensor disposed downstream of the plug-forming device, and a second microwave sensor disposed upstream of the feed device for the triacetin. The triacetin content is determined by transmitting a high frequency electromagnetic field through the filter plug both before and after the triacetin is added and measuring the frequency shift and spread of the electromagnetic field to determine mass signals At and AO, respectivley. AO is compared to At to calculate the triacetin content of the filter plug.Type: ApplicationFiled: May 1, 2002Publication date: November 6, 2003Inventor: Rainer Herrmann
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Publication number: 20030206024Abstract: A method is provided for characterizing emulsion stability to evaluate suitability of the emulsion for use as a drilling fluid in drilling subterranean boreholes. The method provides a supplement or alternative to the standard method of determining Electrical Stability of the emulsion. In the method of the invention, Breakdown Energy is calculated. Breakdown Energy can be measured at the same test point as Electrical Stability. A digital storage oscilloscope and a computer are used in addition to an electrical stability meter.Type: ApplicationFiled: May 2, 2002Publication date: November 6, 2003Inventors: Robert J. Murphy, Dale E. Jamison
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Publication number: 20030206025Abstract: A switching regulator that has first, second, third and fourth terminals, a first power transistor disposed between the first terminal and a first node, a second power transistor disposed between the first node and a second node, a filter including a capacitor and an inductor, and a controller. The first power transistor is partitioned into a plurality of individually-addressable first transistor segments. The second node couples the second and fourth terminals. The second power transistor is partitioned into a plurality of individually-addressable second transistor segments. The inductor is disposed between the first node and the third terminal, and the capacitor is disposed between the third and fourth terminals.Type: ApplicationFiled: June 12, 2003Publication date: November 6, 2003Applicant: Volterra Semiconductor Corporation, a Delaware corporationInventors: Lawrence T. Tse, Michael A. Davis, Anthony J. Stratakos
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Publication number: 20030206026Abstract: A potentiometric sensor for wellbore applications having a permanent aqueous contact between measuring and reference electrode, whereby contact is ensured by discharging the internal solution from the reference electrode directly onto a measuring (ion-sensitive) membrane and protecting the reference junction of the reference electrode with water wet porous material, such as sintered glass. It is advantageously applied to oil-water mixtures under high pressure and/or temperature.Type: ApplicationFiled: May 4, 2001Publication date: November 6, 2003Inventors: Igor Igorevitch Diakonov, Alexander Vladimirovitch Zotov, Igor Nikolaevitch Solodov, Evgenii Grigorevitch Osadchii, Alexander D. Khoteev
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Publication number: 20030206027Abstract: In order to obtain optimum irradiation conditions of an electron beam according to the material and structure of a circuit pattern to be inspected and the kind of a failure to be detected and inspect under the optimum conditions without delay of the inspection time, an inspection device for irradiating the electron beam 19 to the sample board 9 which is a sample, detecting generated secondary electrons by the detector 7, storing obtained signals sequentially in the storage, comparing the same pattern stored in the storage by the comparison calculation unit, and extracting a failure by comparing the predetermined threshold value with the comparison signal by the failure decision unit is provided, wherein the optimum value of the irradiation energy is stored in the data base inside the device beforehand according to the structure of a sample and a recommended value of the irradiation energy suited to inspection can be searched for by inputting or selecting the irradiation energy by a user or inputting informatiType: ApplicationFiled: May 7, 2003Publication date: November 6, 2003Applicant: Hitachi, Ltd.Inventors: Mari Nozoe, Hiroyuki Shinada, Kenji Watanabe, Keiichi Saiki, Aritoshi Sugimoto, Hiroshi Morioka, Maki Tanaka, Hiroshi Miyai
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Publication number: 20030206028Abstract: In a test system, a silicon interconnect is provided that can accommodate a packaged part, such as a Land Grid Array (LGA) package. The interconnect can be made by etching a silicon substrate to form projections therefrom; forming an insulation or passivation layer through deposition or growth; depositing a seed layer over the insulation layer; depositing a metal layer over the seed layer; and etching contact members from the seed and metal layers using a single mask step. In a preferred embodiment, the metal layer is coated with another metal layer that matches the metal of the packaged part's electrical communication nodes. In an embodiment configured to receive an LGA, the contact surfaces of the silicon contact are plated in gold and are planar. Included within the scope of the current invention are at least one method of testing a land grid array package and at least one method of allowing electrical communication with a packaged part.Type: ApplicationFiled: April 25, 2003Publication date: November 6, 2003Inventor: Salman Akram
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Publication number: 20030206029Abstract: In a test system, a silicon interconnect is provided that can accommodate a packaged part, such as a Land Grid Array (LGA) package. The interconnect can be made by etching a silicon substrate to form projections therefrom; forming an insulation or passivation layer through deposition or growth; depositing a seed layer over the insulation layer; depositing a metal layer over the seed layer; and etching contact members from the seed and metal layers using a single mask step. In a preferred embodiment, the metal layer is coated with another metal layer that matches the metal of the packaged part's electrical communication nodes. In an embodiment configured to receive an LGA, the contact surfaces of the silicon contact are plated in gold and are planar. Included within the scope of the current invention are at least one method of testing a land grid array package and at least one method of allowing electrical communication with a packaged part.Type: ApplicationFiled: April 25, 2003Publication date: November 6, 2003Inventor: Salman Akram
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Publication number: 20030206030Abstract: A reusable burn-in/test fixture for testing unsingulated dice on a semiconductor wafer consists of two halves. The first half of the test fixture is a wafer cavity plate for receiving the wafer, and the second half establishes electrical communication between the wafer and electrical test equipment. A rigid substrate has conductors thereon which establish electrical contact with the wafer. The test fixture need not be opened until the burn-in and electrical test are completed. After burn-in stress and electrical test, it is possible to establish interconnection between the single die or separate and package dice into discrete parts, arrays or clusters, either as singulated parts or as arrays.Type: ApplicationFiled: April 21, 2003Publication date: November 6, 2003Inventors: Alan G. Wood, Tim J. Corbett
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Publication number: 20030206031Abstract: A system includes a support member and a computer system. The support member holds and retains a probe card, which has an array of probe tips extending therefrom. The computer system includes a software program. The software causes the computer system to perform a method including the following. A position where electrical contact occurs between at least some of the probe tips of the probe tip array and a selected surface is determined through testing. Data for the positions where electrical contact occurs is recorded. The recorded data is sorted for a shortest distance where electrical contact occurred between each probe tip tested and the selected surface during the testing. The sorted data group is plotted on a three dimensional cartesian coordinate system. The system may be used for evaluating the planarity of the probe tip array and parallelism of the probe tip array relative to the selected surface.Type: ApplicationFiled: May 3, 2002Publication date: November 6, 2003Inventor: Michael P. Harris
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Publication number: 20030206032Abstract: An alignment pin for use in aligning two structures that are to be joined or mated. The alignment pin includes a shank portion and at least one register portion configured for insertion into a mating hole and aligning the mating hole thereon. The register portion includes an outer surface comprising a plurality of contact regions separated by intervening relief regions of a lesser lateral extent than the contact regions. The contact regions may be disposed on the ends of a plurality of fins extending from the register portion and separated on either side by the relief regions. Junk slots for removing debris from between the alignment pin and the wall of the mating hole are provided by the relief regions. The present invention enables minimization of the overall physical dimensions of the surface area of the alignment pin which is in contact with the surface of the mating hole.Type: ApplicationFiled: June 5, 2003Publication date: November 6, 2003Inventor: Bryon J. Hunter
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Publication number: 20030206033Abstract: An apparatus including a circuit substrate having a plurality of contactor pins extending between two opposing surfaces; and at least one capacitor mounted on one of the two opposing surfaces of the circuit substrate.Type: ApplicationFiled: May 16, 2003Publication date: November 6, 2003Inventors: Kok Hong Chan, Chu Aun Lim, Tark Wooi Fong
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Publication number: 20030206034Abstract: A method of using adhesive tape to temporarily retain a die being temporarily held in a fixture during testing and burn-in. The method of the present invention uses a die cut piece of adhesively coated tape to hold a die in a test and burn-in fixture. Upon subsequent heating of the tape beyond the normal operating range of the adhesive coating on the tape, the die is removed from the tape, the tape is removed from the test and burn-in fixture, and the remaining adhesive, if any, is removed from the test and burn-in fixture.Type: ApplicationFiled: March 24, 2003Publication date: November 6, 2003Inventors: Walter L. Moden, John O. Jacobson
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Publication number: 20030206035Abstract: A conductive composition of titanium boronitride (TiBxNy) is disclosed for use as a conductive material. The titanium boronitride is used as conductive material in the testing and fabrication of integrated circuits. For example, the titanium boronitride is used to construct contact pads such as inline pads, backend pads, sensors or probes. Advantages of embodiments of the titanium boronitride include reduced scratching, increased hardness, finer granularity, thermal stability, good adhesion, and low bulk resistivity. Exemplary methods of creating the titanium boronitride include a sputtering process and a plasma anneal process.Type: ApplicationFiled: May 2, 2003Publication date: November 6, 2003Inventor: Yungjun Jeff Hu
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Publication number: 20030206036Abstract: A personalizable and programmable integrated circuit device including at least first and second programmable logic cells and at least one permanent electrical conductive path interconnecting the at least first and second programmable logic cells for personalization of the integrated circuit device, wherein the at least first and second programmable logic cells are programmable by the application of an electrical signal thereto.Type: ApplicationFiled: June 3, 2003Publication date: November 6, 2003Applicant: eASIC CorporationInventor: Zvi Or-Bach
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Publication number: 20030206037Abstract: A method and apparatus for evaluating logical inputs electronically using electronic logic circuits in monotonic dynamic-static pseudo-NMOS configurations. The apparatus includes alternating dynamic and static circuit portions adapted to transition monotonically in response to a common clock (or complemented clock) signal. The circuit portions include pseudo-NMOS configured switching circuits implementing logical functions.Type: ApplicationFiled: April 15, 2003Publication date: November 6, 2003Inventor: Leonard Forbes
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Publication number: 20030206038Abstract: A successive approximation routine analog-to-digital converter includes a switched-capacitor circuit that samples an input voltage into a plurality of capacitors without the need for power to be dissipated by the analog-to-digital converter. A comparator, coupled to the switched-capacitor circuit, compares a voltage across the capacitors with another voltage during each of a number of iterations. A common mode voltage of the switched-capacitor circuit is boosted during at least some of the iterations. The boost may be accomplished in many different ways and may be different for each of a single-ended, a quasi-differential and fully differential versions of the analog-to-digital converter.Type: ApplicationFiled: May 2, 2002Publication date: November 6, 2003Inventors: Michael Mueck, Michael C.W. Coln
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Publication number: 20030206039Abstract: As devices are often different in the characteristics from one another, semiconductor chips based on the devices have discrepancies in the performance.Type: ApplicationFiled: April 17, 2003Publication date: November 6, 2003Applicant: MITSUBISHI DENKI KABUSHIKI KAISHAInventors: Hiroshi Sakata, Toru Araki
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Publication number: 20030206040Abstract: As devices are often different in the characteristics from one another, semiconductor chips based on the devices have discrepancies in the performance.Type: ApplicationFiled: April 17, 2003Publication date: November 6, 2003Applicant: MITSUBISHI DENKI KABUSHIKI KAISHAInventors: Hiroshi Sakata, Toru Araki
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Publication number: 20030206041Abstract: The driver circuit for driving a switching transistor comprises a driver transformer for driving the switching transistor and an output stage for driving the driver transformer, and an output of the driver circuit is used for providing also said switching voltage. The switching voltage is derived advantageously from the primary winding of the driver transformer. Preferably a terminal of the primary winding of the driver transformer is directly wired to the gate electrode of the MOS transistor.Type: ApplicationFiled: May 2, 2003Publication date: November 6, 2003Inventors: Daniel Lopez, Jean-Paul Louvel