Abstract: An electronic drive for vector control of an induction motor controls slip and operating frequency in response to changes in stator voltage. The drive includes a torque control loop, a flux control loop and a frequency control loop. The control is based on a commanded stator current that is resolved into a torque-producing, or q-axis, current component and a flux-producing, or d-axis, current component that are in quadrature. The frequency control loop includes slip control in which a slip frequency command is produces based on a value for the leakage inductance of the motor. The leakage inductance value dynamically varies as a function of the q-axis current reference command.

Abstract: The battery charger is provided with temperature detection sections 12 to contact and detect the temperature of AA batteries 2A and AAA batteries 2B loaded in a battery pocket 3, and a charging circuit to detect battery temperature and control battery 2 charging. The battery charger is provided with AA battery 2A holders 11, which are circular openings 13 in the case 1, and AAA battery 2B holders 11, which are flexible arches 14. An AAA battery 2B is inserted into a flexible arch 14 and retained in a fixed position in the battery pocket 3. An AA battery 2A is not inserted into a flexible arch 14, but rather moves the flexible arch 14 causing it to incline, and is inserted into a circular opening 13 for retention in a fixed position in the battery pocket 3. The battery charger charges batteries 2 set in fixed positions in the battery pocket 3 while detecting battery 2 temperature via the temperature detection sections 12.

Abstract: In accordance with an embodiment of the present invention, two transistors are simultaneously controlled by a controller to control the application of power to a load and monitor a voltage level at the load. The controller may control the application of power to a number of loads simultaneously and may further provide voltage tracking for the loads.

Abstract: A process field device for coupling to a two wire process control loop includes a field device circuitry and a switching regulator to power the circuitry. A series regulator provides a regulated supply voltage to the switching regulator. A noise filter reduces the amount of noise from the switching regulator which enters the two wire process control loop.

Abstract: A DC—DC converter is disclosed that includes a constant voltage circuit outputting a first voltage, a charge pump circuit outputting a second voltage, a current detection circuit converting the output current of the constant voltage circuit into a third voltage and outputting the third voltage, a first detection circuit detecting the first voltage and outputting a first detection voltage proportional thereto, a first overcurrent protection circuit comparing the third voltage and the first detection voltage and reducing the output first voltage and current of the constant voltage circuit when the third voltage exceeds the first detection voltage, a second detection circuit detecting the second voltage and outputting a second detection voltage proportonal thereto, and a second overcurrent protection circuit comparing the third voltage and the second detection voltage and reducing the output first voltage and current of the constant voltage circuit when the third voltage exceeds the second detection voltage.

Abstract: An embodiment of a method for measuring an RMS voltage of an arbitrary time-varying waveform includes: a) coupling said arbitrary time-varying waveform to said thermally sensitive device; b) decoupling said arbitrary time-varying waveform from said thermally sensitive device; c) coupling said thermally sensitive device to said controlled DC voltage source; d) measuring a current through said thermally sensitive device at least two points in time; e) determining a change in said current over said at least two points in time; f) if said current is increasing between said at least two points in time, then decrease said controlled DC voltage source responsive to determining that said current is increasing; g) if said current is decreasing between said at least two points in time, then increase said controlled DC voltage source responsive to determining that said current is decreasing; and h) repeating steps a)–g).

Abstract: The present invention includes a system with a sensor to detect a change in one or more physical characteristics and provide a corresponding electrical sensor signal, a controller including a power source for the sensor, and transient suppression circuitry. This circuitry is coupled between the sensor and the power source of the controller, and includes a first thermistor to protect the sensor from a power surge from the controller and/or power source.

Abstract: A tool for disuniting two wafers, at least one of which is for use in fabricating substrates for microelectronics, optoelectronics, or optics, the tool comprising two gripper members suitable for being fixed temporarily to respective opposite faces of the two wafers that are united with each other, and a disuniting control device suitable for moving said members relative to each other. The tool is remarkable in that the disuniting control device comprises an actuator for positively displacing said gripper members and for inducing controlled flexing in at least one of said members. This makes it easier to disunite the wafers while reducing the risk of damaging them. The invention is applicable to disuniting wafers that have been weakened by implantation, that have been temporarily bonded together, etc.

Abstract: A parametric measuring circuit for minimizing an oscillation effect is provided. The parametric measuring circuit comprises an input detection circuit, an oscillation effect eliminating logic circuit and an output selection circuit. The input detection circuit receives an input signal from an external input terminal and outputs the detection signal. The oscillation effect eliminating logic circuit is coupled to the input detection circuit for reducing/eliminating oscillation effect and outputting the detection signal. The output selection circuit is coupled to the oscillation effect eliminating logic circuit to select and transmit either the output signal generated from the internal circuit or the detection signal to the output terminal.

Abstract: An apparatus for calibrating a probe station includes a disk having a flat bottom surface, a plurality of thermosensors for measuring a temperature of a wafer chuck of the probe station, the plurality of thermosensors being disposed at predetermined positions on a top surface of the disk, and a level disposed at a predetermined position on the top surface of the disk.

Abstract: Techniques for automating test pad insertion in a printed circuit board (PCB) design and fixture probe insertion in a PCB tester fixture are presented. A probe location algorithm predictably determines respective preferred probing locations from among respective sets of potential probing locations associated with a number of respective nets in a PCB design. Test pads, preferably in the form of bead probes, are added to the PCB design at the respective preferred probing locations along with, where feasible, one or more alternate probing locations chosen from among remaining ones of the respective sets of potential probing locations. During fixture design, nets with multiple test pads implemented in the PCB design are processed by the same probe location algorithm used during PCB design to determine the associated preferred and alternate probing locations for said respective nets.

Abstract: An electrical property evaluation apparatus for measuring an electrical property of an object includes a magnetic field generating mechanism that generates a magnetic field in a target area on the object, and a magnetic sensor for measuring the magnetic field near the target area. A cantilever having a conducting probe is supported so that the probe can be brought into contact with the target area. A bending measurement mechanism measures an amount of bending of the cantilever when the probe is brought into contact with the object. A control section controls a moving mechanism to maintain the bending amount of the cantilever constant. A voltage source applies a voltage to the probe, and an electrical property measuring section measures a current or an electrical resistance between the probe and the object in contact with each other.

Abstract: On a single chip are formed a plurality of magnetoresistance effect elements provided with pinned layers having fixed magnetization axes in the directions that cross each other. On a substrate 10 are formed magnetic layers that will become two magnetic tunnel effect elements 11, 21 as magnetoresistance effect elements. Magnetic-field-applying magnetic layers made of NiCo are formed to sandwich the magnetic layers in plan view. A magnetic field is applied to the magnetic-field-applying magnetic layers. The magnetic field is removed after the magnetic-field-applying magnetic layers are magnetized in the direction shown by arrow A.

Abstract: A direction sensor has first and second bridge circuits, each of the bridge circuits including at least two detecting elements formed on a main surface of a substrate and connected in series, their longitudinal directions crossing each other. The sensor also has first and second magnetic bias application parts respectively facing toward the first and the second bridge circuits. The directions of the magnetic fields of the magnetic bias application parts are different from each other. The direction sensor does not require a holder or a coil, so that miniaturization of the sensor is feasible.

Abstract: Nuclear magnetic resonance (NMR) signals are detected in microtesla fields. Prepolarization in millitesla fields is followed by detection with an untuned dc superconducting quantum interference device (SQUID) magnetometer. Because the sensitivity of the SQUID is frequency independent, both signal-to-noise ratio (SNR) and spectral resolution are enhanced by detecting the NMR signal in extremely low magnetic fields, where the NMR lines become very narrow even for grossly inhomogeneous measurement fields. Additional signal to noise benefits are obtained by use of a low noise polarization coil, comprising litz wire or superconducting materials. MRI in ultralow magnetic field is based on the NMR at ultralow fields. Gradient magnetic fields are applied, and images are constructed from the detected NMR signals.

Abstract: MRI signals from two species such as fat and water are separated by repeatedly applying a steady state free precession (SSFP) sequence to an object with the phase of each RF excitation pulse in a sequence being increased by 2?n/N radians on each repetition, where acquisition number n ranges from 1 to N. Alternatively, center frequency for each scan is incremented compared with the first scan center frequency. Images are reconstructed from the acquired signals and summed. Slowing varying phase due to sources other than chemical shift can be removed. Species signals are separated based on phase (sign) of the summed image signals.

Abstract: Collecting first and second echoes and third or fourth echoes, controlling a unit to supply a coil with a base pulse during a period of collecting the echoes, and to further supply the coil with a unit pulse before the period of collecting the third or fourth echoes, measuring an amount of deviation of a peak position of the second echo from a peak position of the first echo, measuring an amount of shift of a peak position of the third or fourth echoes from the peak position of the first or second echoes, determining a correction energy based on the amount of shift, an energy of the unit pulse, and the amount of deviation, and controlling, during the actual scanning, the unit to supply the coil with the base pulse, and to further supply the coil with a correction pulse of the determined correction energy.

Abstract: In a method for controlling a radio-frequency device, and a magnetic resonance tomography system and a radio-frequency control device wherein the method is implemented, the RF device of a magnetic resonance tomography system is emitted during a magnetic resonance measurement of an examination subject that is moving relative to the transmission field of the RF device. The RF device emits RF pulses at chronological intervals, and measurement values are measured at chronological intervals. At chronological intervals, position values are determined that represent a current position of the examination subject relative to the transmission field. On the basis of the measurement values and the position values, exposure values are determined that represent a physiological degree of effectiveness that the RF pulses have on the subject exposed to the RF pulses. Based on a multiplicity of exposure values, exposure control values are respectively formed.

Abstract: A multi-coil NMR probe using nonmagnetic diodes as switches located in close proximity to the radio-frequency circuit of the sample coils within the probe.

Abstract: With a view to providing a receiving coil which permits a subject to assume a supine position when radiographing the breast of the subject, thereby improving the working efficiency, a receiving coil for receiving a magnetic resonance signal from the breast of a subject lying within a static magnetic field space is provided in each of a first cup and a second cup of a brassiere which cups receive the breast of the subject SU therein.

Abstract: A magnet for an NMR an analyzer includes a superconductor coil which is operated under a permanent current mode so as to generate a magnetic field in a space surrounded by the superconductor coil, and which enables a sample to be inserted into a measurement space in the magnetic space for analization. The superconductor coil includes a first access port for enabling access to the measurement space and a second access port for enabling insertion of the sample into the measurement space in a direction different from a direction of the first access port. An effective diameter of the first access port is larger than an effective diameter of the second access port when the effective diameters of the first and second access ports are defined as a diameter of a cylinder that is insertable into the first and second access ports.

Abstract: A nuclear magnetic resonance (NMR) probe circuit is used with a sample coil tuned to a primary frequency f1. The circuit is arranged to have a plurality of points of electric field minima at the f1 frequency. One or more additional frequencies may be coupled to the circuit at these points, without interaction with f1. The probe circuit also uses an impedance coupled between two of the minima points that affects the frequency response at the additional frequency or frequencies, without affecting the frequency response at f1. The impedance may be made adjustable to allow tuning of the relative frequency resonances.

Abstract: A method of monitoring a power distribution unit (306) may include providing a power distribution unit frame (310), where the power distribution unit frame has a 2U form factor (312), and where the power distribution unit frame is coupled to mount in an embedded computer frame (102). An alarm module (418) may be coupled to a circuit breaker connection site (214) in the power distribution unit frame. The alarm module may detect whether a circuit breaker (416) is coupled to the circuit breaker connection site via a set of auxiliary contacts (439). If the alarm module detects the circuit breaker, the alarm module monitors a set of shelf conditions. If the alarm module fails to detect the circuit breaker, the alarm module does not monitor the set of shelf conditions.

Abstract: A method for determining the voltage sensitivity of the distance between the mirrors of a Fabry-Perot interferometer in a measuring device, which is intended to measure a predefined gas (CO2), of which at least one absorption maximum or minimum is known. At least two calibration point are defined device specifically using a reference gas (N2) in controlled conditions. A ‘virtual’ signal-control-voltage sensitivity curve, is formed with the aid of the calibration points formed using the reference gas (N2), ratios of the measurement points of the predefined gas (CO2) and of the corresponding values of the reference-gas curve are formed, and at least one voltage value corresponding to the minimum or maximum is defined from the ratios, in which case, on the basis of the wavelengths of the absorption minima or maxima of the gases (CO2, N2) being measured, the voltage sensitivity of the distance between the mirrors can be defined unequivocally.

Abstract: A wiring test structure includes a plurality of wiring traces configured in an interleaving spiral pattern. At least one of the plurality of wiring traces configured for open circuit testing therein, and at least a pair of the plurality of wiring traces is configured for short circuit testing therebetween.

Abstract: A method and motor controller for sensing motor winding current. An FET drive transistor has its ON resistance periodically increased to about five times the normal ON resistance for short sensing intervals during motor drive. An analog-to-digital converting senses the voltage across this FET during the sensing intervals. The resulting digital signal is used to calculate motor current. The time at high ON resistance is much less than the time at normal. The ON resistance can be changed using two FETs or one FET with gate fingers over differing parts of the channel region.

Abstract: Methods and systems for reliable arc detecting in systems having power signals that experience decay or increase in amplitude. One embodiment of a system for detecting electrical arcs by monitoring an alternating current power supply comprises a sampling circuit which samples electrical signals. It further comprises a delay circuit which receives the sampling circuit output and stores a time history of the output over an interval including a past, present and future versions of the history. Causal/non-causal logic compares the present version with the past and future versions to determine which will be used as an arc monitoring version to compare the present version to for arc monitoring. A dynamic processing module compensates for any amplitude differences between the present version and the arc monitoring version. An arc monitoring circuit analyzes the present version and adjusted arc monitoring version to determine if an arc signal is present.

Abstract: A process and circuit for the connection of electrical loads to the terminals of an amplifier, and for detection of a possible connection defect of said electrical loads. An electrical load is connected to two terminals of the amplifier according to a complete-bridge mounting. At least one second electrical load is connected according to a half-bridge mounting. In a preliminary phase, reference values representative of the currents flowing in each of the connection branches are memorized and measured and there are detected from these measurements and memorized, the reference values of the currents flowing through each of the terminals. During operation of the amplifier, the current passing through each of the two terminals is measured and compared to the corresponding memorized reference value, so as to detect therefrom the connection branch or branches which suffer a connection defect of an electrical load.

Abstract: A method and an apparatus is described to measure at least one physical parameter of a substance such as moisture and salt content. This is done by transmitting a microwave beam through the material to be measured and detect only a reflection of a predetermined polarity of the transmitted waves. To accomplish this a polarizing plate is used so that only cross-polarized microwaves, which pass through the substance are detected and the co-polar reflections from surrounding structures are excluded. The object can either be moving as on a conveyer belt or in a rest position.

Abstract: A capacitive sensor assembly for a robot to prevent damage to the robot when it moves in an undesired manner is disclosed. The robot may be used in conjunction with semiconductor fabrication applications. The capacitive sensor assembly can include a hit contact, one or more fixed contacts, one or more damping springs, and a capacitive sensor. The hit contact comes into contact with a barrier as a result of undesired movement by the robot. The damping springs are compressed against the fixed contacts when the hit contact comes into contact with the barrier. The capacitive sensor has a capacitance that changes as the hit contact comes into contact with the barrier. The capacitance of the capacitive sensor is used to detect the robot coming into contact with the barrier, so that damage to the robot can be prevented.

Abstract: An area-change sensing through capacitive techniques is disclosed. In one embodiment, a first conductive surface is substantially parallel to a second conductive surface. The first conductive surface may be moveable relative to the second conductive surface in a direction substantially parallel to the second conductive surface. A processing module may detect an overlap area between the first conductive surface and the second conductive surface. In addition, a reference surface may be substantially parallel to the first conductive surface and the second conductive surface. The processing module may be configured to measure a reference capacitance between the reference surface and a selected surface of the first conductive surface and the second conductive surface.

Abstract: Various methods and systems for determining one or more properties of a specimen are provided. One system for determining a property of a specimen is configured to illuminate a specimen with different wavelengths of light substantially simultaneously. The different wavelengths of light are modulated at substantially the same frequency. The system is also configured to perform at least two measurements on the specimen. A minority carrier diffusion length of the specimen may be determined from the measurements and absorption coefficients of the specimen at the different wavelengths. Another system for detecting defects on a specimen is configured to deposit a charge at multiple locations on an upper surface of the specimen. This system is also configured to measure a vibration of a probe at the multiple locations. Defects may be detected on the specimen using a two-dimensional map of the specimen generated from the measured surface voltages.

Abstract: A signal acquisition probing system uses a micro-cavity laser to acquire an electrical signal from a device under test. The micro-cavity laser has a VCSEL gain medium and an electro-optic optical resonant cavity. The micro-cavity laser is pumped by an external laser source and generates a frequency modulated optical signal derived from the device under test electrical signal creating an electro-magnetic field distribution in electro-optic material in the micro-cavity laser that overlaps the optical path of the optical signal propagating in the electro-optic material. The frequency modulated optical signal is coupled to an optical receiver which converts the frequency modulated optical signal to an electrical signal. The electrical signal is coupled to measurement test instrument for processing and displaying of the electrical signal.

Abstract: An improved chuck with lift pins within a probe station.

Abstract: An integrated circuit (IC) package testing apparatus integrates a temperature sensor, heater (or cooler), and controller within a single modular unit. The controller is a microprocessor embedded within the modular unit and in communication with the sensor and heater. The controller allows a selected testing temperature to be input by a user via a communications link to the controller. Each IC package has its testing temperature individually controlled by a controller. The module is easily attached and removed from an open-top socket through the use of latches on the testing socket. Many IC packages can be quickly placed and removed from testing sockets when a matrix of sensors and heaters (or coolers) are located on a single top attach plate with the sensors and heaters (or coolers) individually spring-loaded on the single top attach plate.

Abstract: An integrated device includes a redundant bond pad for accessing internal circuitry in the event that the main bond pad for that circuitry is difficult to access with testing equipment. Signals from the redundant bond pad are biased to ground during normal operations of the integrated device. In order to test the relevant internal circuitry, a voltage is applied to a Test Mode Enable bond pad, overcoming the bias that grounds the redundant bond pad. In addition, the signal from the Test Mode Enable bond pad serves to ground any transmission from the main bond pad. As a result, the redundant bond pad may be used to test the relevant internal circuitry given its accessible location in relation to the testing equipment.

Abstract: To provide a sensor device for determining the layer thickness of a thin layer of an electrically conducting or semiconducting material which can be used in a simple and low-cost way, it is proposed that the said sensor device comprises one or more inductive proximity sensors which can be positioned at a distance from the layer, an inductive proximity sensor having an oscillator with a frequency which is adapted with respect to the material and the thickness range of the layer to be measured.

Abstract: A semiconductor test device for acquiring a multiplexed clock signal from LSI output data and using the clock to test the LSI. The device includes a time interpolator and registers connected in series. The time interpolator has flip-flops connected in parallel for receiving output data from an LSI under test, a delay circuit for successively inputting strobes delayed at a constant timing interval to the flip-flops and outputting time-series level data, and an encoder for receiving the time-series level data from the flip-flops and encoding it into position data indicating an edge timing. The registers successively store position data from the encoder and output them at a predetermined timing. The device further includes a digital filter for outputting the position data from the registers as a recovery clock.

Abstract: A testing device for testing integrated circuits is disclosed including a first board configured to connect to a specific integrated circuit being tested. A second board is removably connected to the first board and is configurable to test a variety of integrated circuits. An MCU located on the second board controls the testing of the specific integrated circuit being tested. At least one connector enables connection between the first board and the second board.

Abstract: Noise reduction for application of structural test patterns to a Device Under Test (DUT) is accomplished with a capacitor “booster” bypass network on the probe card in which the capacitors are charged to a much higher voltage Vboost than the DUT power supply voltage VDD. Charging the capacitors to a voltage N×VDD allows the buster network to store N times the charge of a conventionally configured capacitance network, and effectively provides N times the capacitance of the original network in the same physical space.

Abstract: A parallel compression test circuit of a memory device disperses peak current and reduce noise by operating input/output amplifiers at different timings in a parallel compression test mode. The parallel compression test circuit comprises an input/output amplification control unit for activating a plurality of input/output amplifiers connected to a selected bank in a normal mode, and activating the plurality of input/output amplifiers in each bank at different timings in a test mode.

Abstract: Buffer circuits and techniques that reduce skew between rising and falling times of output data as process conditions vary are provided. One or more process-dependent current sources may be utilized to compensate for process variations by supplementing the current drive of transistors used to precharge (PMOS) or discharge (NMOS) an output node of a secondary (e.g., inverter) stage of the buffer circuit.

Abstract: A transmission line driver with slew rate control includes high and low side ramp generators for generating charge and discharge ramp signals, respectively, which are input to respective comparators and a pair of source follower transistors. A pair of additional transistors is connected to the pair of source follower transistors and a pair of staggered drivers is connected to the pair of additional transistors.

Abstract: The present invention aims to provide a programmable logic device (PLD), and a related control program, capable of improving a product yield by avoiding a defect point according to defect point detected after PLD fabrication. The PLD includes a plurality of logical blocks including programmable logic circuits; storage in which both circuit information specifying path connecting the plurality of logical blocks using information specifying resources included in the path and defect point information specifying fault resource are stored in advance; replacement control section which refers to defect point information, decides whether fault resource is included in the path specified by circuit information, and when fault path is included, obtains replacement path, and rewrites circuit information with data identifying resources included in replacement path; and wiring resource section which reads out circuit information stored in storage, and forms a predetermined logic circuit based on readout circuit information.

Abstract: Structures and methods for testing a re-programmable logic block embedded in a one-time programmable fabric in a PLD. The re-programmable logic block is tested without using the one-time programmable resources needed for implementing user circuits, by including a multiple input signature register (MISR) circuit coupled to receive output data from the re-programmable logic portion of the PLD. In some embodiments, a tester operating at a first and lower clock frequency can be used to test a re-programmable logic block operating at a second and higher clock frequency. In some of these embodiments, the one-time programmable fabric is tested at the first clock frequency.

Abstract: An integrated circuit (IC) is disclosed having circuitry arranged in a plurality of columns. A column in the IC is essentially a series of aligned circuit elements of the same type that extends from a first edge of the IC to a second edge. In addition there may be a center column having circuit elements of different types.

Abstract: Pullup and pulldown structures can be formed using nanoscale programmable junctions. These devices can be integrated into nanoscale circuit designs and can be programmably configured, e.g., desired resistance values set. Additionally, the pullup and pulldown devices allow for convenient integration of nanoscale devices with microscale devices.

Abstract: A circuit board includes a large scale logic device and at least one outrigger device wherein signals having a transmission delay budget that exceed a threshold value are produced to the outrigger device for coupling to circuit devices of the circuit board that are external to the large scale logic device. One embodiment of the invention comprises a plurality of outrigger devices that communicate with the large scale logic device by way of parallel data buses, as well as multi-gigabit transceiver data lines. Logic within the outrigger devices is generally limited to signal routing and transmission logic. The large scale logic device further comprises logic to transmit and receive signals to and from the outrigger devices in a way that is transparent to internal logic of the large scale logic device.

Abstract: In accordance with an embodiment of the present invention, a programmable logic device includes a plurality of logic blocks, a plurality of memory blocks, and a plurality of continuation routing paths associated with the memory blocks. A plurality of continuation multiplexers, coupled to the continuation routing paths, are adapted to route signals between the memory blocks, between the logic blocks, and/or between the memory blocks and the logic blocks.

Abstract: It is configured by plurality of NAND circuits connected in series through a plurality of inverters, and a plurality of NOR circuits connected in series through the plurality of inverters. Each of a plurality of source signal lines provided in a pixel portion is connected to one input terminal of a NAND circuit and a NOR circuit, and an output of an inspection is obtained from final lines of the NAND circuit and the NOR circuit connected in series. In this manner, an inspecting circuit which is capable of determining a defect simply and accurately by using a small-scale circuit, and a method thereof are provided.