Abstract: A current sensor includes: several magnetic-field-sensitive components which are disposed on a support such as to be distributed around a conductor through which a current to be measured flows, and a processing circuit which receives an output signal from the components, each component having at least one first terminal which is connected to a summing point by a summing resistor and a second terminal which is connected to a common point. Moreover, all of the resistors are connected to a first conductor which is connected to the summing point and all of the second terminals are connected to a second conductor which is connected to the common point. The support includes a printed circuit, while the two conductors include conductor tracks of the printed circuit, which are routed in a zigzag manner on the printed circuit such as to form a bunched or braided conductor.

Abstract: Disclosed is a vacuum housing for a magnetic resonance apparatus having a recess for leading through lead wires to elements located inside the vacuum housing, and a first lead-through bushing module. The first lead-through bushing module is provided with a first closing plate which is configured so as to vacuum-tightly seal the recess along with a second closing plate. The first bushing module is also provided with a first structural component that is to be at least partially led through the recess during assembly of the lead-through bushing module and whose size defines a minimum size of the recess, which is greater than the size of the first closing plate.

Abstract: Determining multiple routes for multiple passenger groups, includes sending to a scheduler, multiple individual queries with a bias to produce individual solutions that meet joint travel requirements, merging results from the multiple individual queries to produce joint solutions for the passenger groups and returning the joint solutions.

Abstract: A device for measuring current comprises a magnetic field sensor (2) for measuring the magnetic field produced by a current I flowing through a current conductor (1) and a yoke (3) of a magnetic material with a relative permeability of at least 100. The magnetic field sensor (2) preferably comprises a semiconductor chip with at least one Hall element and an electronic circuit for the operation of the Hall element. Two magnetic field concentrators (7, 8) separated by an air gap (6) are arranged on a surface of the semiconductor chip such that field lines (9) of the magnetic field (see FIG. 3) that issue from the first magnetic field concentrator (7) in the vicinity of the air gap (6) and impinge on the second magnetic field concentrator (8) in the vicinity of the air gap (6) pass through the at least one Hall element.

Abstract: Embodiments include systems and methods for measurement of signal propagation delay between Input/Output (IO) Loopback (IOLB) circuits. Embodiments include measurement of an output delay time of a first IOLB circuit and measurement of an input delay time of a second IOLB circuit. Embodiments also include measurement of a total delay time from an internal point of the first IOLB circuit to an internal point of the second IOLB circuit. Embodiments subtract from the measured total delay time, the measured output delay time of the first IOLB circuit and the measured input delay time of the second IOLB circuit to determine the time of flight of a signal between the I/O pads of the two IOLB circuits.

Abstract: Packaged integrated circuits (ICs) of some types, such as processors, are graded and sold according to a performance scale, such as maximum specified clock speed, set by the manufacturer as a result of testing. As a record of this grading some part of the package, usually the upper surface, is marked with the specified performance attribute. However, criminal activity has developed where the packaging is relabelled to show a higher specification so the ICs can be fraudulently resold at a higher price. To address this problem, the invention envisages that manufacturers maintaining a product database for each packaged IC which logs not only the performance specification, but also a digital signature derived from a speckle pattern obtained from the packaging. Subsequently, any packaged IC can be rescanned to interrogate its speckle pattern and recompute the signature. The signature is then used to find the product in the database, whereby the originally specified performance attribute is retrieved.

Abstract: A wide bandwidth attenuator input circuit for a measurement probe has a Z0 attenuator circuit coupled in series with a compensated RC attenuator circuit. The series attenuator elements of the Z0 and the compensated RC attenuator circuits are coupled via a controlled impedance transmission line to the shunt attenuator elements of the Z0 and the compensated RC attenuator circuits. The shunt element of the Z0 attenuator element terminates the transmission line in its characteristic impedance. The junction of the series and shunt attenuator elements are coupled to the input of a buffer amplifier. At low and intermediate frequencies, the compensated RC attenuator circuit attenuates an input signal while at high frequencies, the compensated RC attenuator circuit acts as a short and the Z0 attenuator circuits attenuates the input signal.

Abstract: A wide bandwidth attenuator input circuit for a measurement probe has a Z0 attenuator circuit coupled in series with a compensated RC attenuator circuit. The series attenuator elements of the Z0 and the compensated RC attenuator circuits are coupled via a controlled impedance transmission line to the shunt attenuator elements of the Z0 and the compensated RC attenuator circuits. The shunt element of the Z0 attenuator element terminates the transmission line in its characteristic impedance. The junction of the series and shunt attenuator elements are coupled to the input of a buffer amplifier. At low and intermediate frequencies, the compensated RC attenuator circuit attenuates an input signal while at high frequencies, the compensated RC attenuator circuit acts as a short and the Z0 attenuator circuits attenuates the input signal.

Abstract: Apparatus and methods for detecting passing magnetic articles using a first, True Power On State (TPOS) detector during a first time interval and transitioning to a second, running mode detector after the first time interval, when the output of the second detector is accurate. A phase comparator is responsive to the output signal of the first and second detectors and provides a control signal indicative of a change in the phase relationship between the two output signals. An output switch controlled by the phase comparator provides, as the detector output signal, the first detector output signal during the first time interval and the second detector output signal thereafter.

Abstract: Provided is a magnetic encoder device capable of detecting a rotating angle of an actuator having a cavity structure. The magnetic encoder device includes a ring-shaped rotating body 11, a ring-shaped permanent magnet 12 which is inscribed in and fixed to an inner circumferential side of the ring-shaped rotating body 11 and magnetized in a direction perpendicular to a center axis of the rotating body 11, and a fixed body 13 which is disposed on an inner circumferential side of the permanent magnet 12 through an air gap and has a circular circumference and a cavity, and a magnetic field detecting element 14 disposed on an outer circumferential side of the fixed body 13 through the permanent magnet 12 and the air gap.

Abstract: A GMR angle sensor for vehicles includes a GMR element in which the element resistance is changed in response to an external magnetic field, lead conductors connected to either end of the GMR element, and a protective layer that seals the GMR element and the lead conductors, wherein the protective layer has a laminated structure including an oxidation-resistant inorganic film that ensures that the GMR element and the lead conductors are sufficiently insulated and a silicone-based organic film laminated on the inorganic film.

Abstract: Methods and systems a method of assembling a proximity probe are provided. The method includes determining a coil wire dimension and coil geometry for the probe such that a resistance versus temperature profile of the coil is approximately constant when the coil is excited with an excitation frequency of approximately 150 kilohertz to approximately 350 kilohertz, and adjusting the coil geometry such that a resistance versus temperature profile of the coil is substantially constant.

Abstract: The invention relates to an improved micro-fluxgate magnetometer capable of reducing noise phenomena that can occur when measuring a magnetic field, in a simple manner, and a method for manufacturing such a magnetometer in thin layers.

Abstract: A inventive flow-meter uses a measuring method which is based on the passage time of fluid molecules in a single sensor, without using any magnetic field gradient for the measurement of said fluid mean velocity. This method consists of the ultrafast irradiation of hydrogen nuclei from fluid molecules through pulses which are repeated every short time intervals, following a Carr-Purcell-Meiboom-Gill (CPMG) type sequence.

Abstract: A magnetic resonance imaging system comprises a receiver system to acquire magnetic resonance signals. A control system controls the receiver system to reform an acquisition sequence to acquire the magnetic resonance signals in several acquisition segments. Respective groups of acquisition segments involve acquisition of magnetic resonance signals in different RF-receiver frequency bands. In the respective groups of acquisition segments, magnetic resonance signals are acquired from different nuclei having different gyromagnetic ratios. According to the invention, reconstruction of different types of information carried by the respective nuclei is made possible. For example, imaging of the anatomy of a patient to be examined is performed on the basis of proton magnetic resonance imaging. Imaging of a targeted contrast agent is achieved on the basis of 19F magnetic resonance imaging. Localisation of a invasive device, such as a catheter, is also performed on the basis of e.g. 19F magnetic resonance imaging.

Abstract: In one embodiment, the present invention includes a method for obtaining magnetic resonance (MR) data of a phantom located in a magnetic resonance imaging (MRI) system with multiple bandwidths. The data may then be processed to determine magnetic field homogeneity of the MRI system.

Abstract: The present invention relates to a method of acquiring a parallel magnetic resonance image and a method thereof, and more particularly, to a method of acquiring a magnetic resonance image using a radial k-space trajectory, and an apparatus thereof. A method of reconstructing a parallel magnetic resonance image using a radial k-space trajectory comprises acquiring magnetic resonance data according to the radial k-space trajectory, setting a rotation relation between the radial k-space trajectory and a Cartesian k-space trajectory, and reconstructing a magnetic resonance image from the magnetic resonance data based on the rotation relation.

Abstract: The invention relates to storage space (3) for elements (2) which are used in a medical activity, comprising a plurality of partitions (4) which are each dedicated to receiving a certain type of element (2) assigned to a predetermined medical activity, a user interface (6) for selecting a preferred medical activity from a plurality of medical activities, wherein each partition (4) comprises signalling means (5) which provide a signal, dependent on the selected medical activity, to indicate the correct element (2) to be used for the selected activity. In this manner the medical staff is offered ‘intelligent’ management of medical accessories and space, which helps the staff in organizing elements in an efficient and timesaving manner. In addition, a more flexible working environment contributes to the clinical staff feeling freer at work.

Abstract: The invention provides a magnetic resonance system and method of measuring continuous regions at high speed without decreasing SN. As a receive system, multiple RF coil sets a, b comprising multiple RF coils a1, a2, b1, b2 are disposed in positions where there is no spatial interference with at least one of the RF coils of an adjacent coil set, the RF coils constituting each coil set are changed over one by one, sets of RF coils which do not interfere mutually are activated, and signals are simultaneously acquired from a number of regions equivalent to the number n of coil sets. Hence, if the number of coil sets is set to n, the measurement time can be shortened to 1/n. Alternatively, the SN can be improved by in times.

Abstract: A magnetic resonance imaging apparatus includes a gantry with a gradient coil which applies a gradient magnetic field to a subject in a static magnetic field, a bed which slides a top board in a longitudinal direction of the top board with the subject placed thereon, a high-frequency coil which applies the gradient magnetic field and a high-frequency pulse signal to the subject, and detects a magnetic resonance signal emitted from the subject, and a damping member which damps noise which occurs when the gradient coil is driven, or a support member which supports the gradient coil, the damping member or the support member providing an asymmetrical structure with respect to a plane perpendicular to the longitudinal direction.

Abstract: A magnetic resonance imaging apparatus includes a collector which collects magnetic resonance signals emitted from a region of interest of a subject, and a correction magnetic field generator which generates a correction magnetic field to correct the nonuniformity of a static magnetic field on the basis of magnetic resonance signals which are contained in the magnetic resonance signals collected by the collector, are emitted from a specific region which forms a portion of the region of interest.

Abstract: In an NMR apparatus provided with a split type magnet, in order to position a probe at a high precision in a narrow homogeneous magnetic field space, a positioning of a center of a probe coil is first located to a proper position by inserting an NMR probe from a horizontal bore. At this position, a sample tube is inserted from a vertical bore, and an NMR signal is measured from the probe coil. An NMR signal measuring apparatus amplifies the NMR signal from the probe coil, and executes an A/D conversion so as to determine an NMR spectrum signal, and an NMR signal analyzing apparatus compares the NMR spectrum signal. A probe is set at a position where a sharpness of the spectrum is largest, that is, a magnetic field homogeneity coefficient is high, by repeating the operations mentioned above.

Abstract: An implementation of an optical transmission path for NMR signals from local coils in magnetic resonance imaging employs a photomodulator that may be incorporated into a connecting optical cable to be shared among multiple local coils and to provide for connection and disconnection at an electrical interface eliminating the need for optical connectors.

Abstract: In some embodiments, a method and apparatus for simulating electrostatic discharge events in manufacturing and calibrating monitoring equipment are presented. In this regard, a device is introduced to simulate an ESD event by discharging a stored charge and measuring in situ the quantity of charge discharged. Other embodiments are also disclosed and claimed.

Abstract: An electronic device includes a main body, a drive mechanism configured to move the main body, a detector having a plurality of sensors mounted in the main body for detecting distances to an object which is present in a space around the main body, a calculator configured to calculate a direction of the object relative to the main body based on the detected distances, and a controller configured to control the drive mechanism to change an orientation of the main body dependent on the calculated direction.

Abstract: An apparatus for testing the life of a leakage current protection device having a leakage current detection circuit. In one embodiment, the apparatus a trip mechanism state generator, a fault alarm generator, a ground fault simulation unit. In operation, the ground fault simulation unit generates a simulated ground fault signal during every positive half-wave of an AC power, the simulated ground fault signal is detected by the leakage current detection circuit, the leakage current detection circuit responsively generates a signal to turn a switching device into its conductive state so as to allow a current to pass therethrough, the passed current is converted into a DC voltage in accordance with a trip mechanism state generated by the trip mechanism state generator, the fault alarm circuit receives and analyzes the DC voltage and indicates whether a fault exists in the leakage current protection device.

Abstract: The present invention relates to an apparatus to measure water level in a water reservoir by measuring electrical conductivity between electrodes, including a reference electrode, at least one measuring electrode projecting into the water reservoir, and at least one electronic detection circuit to detect a presence of water based on the conductivity measurement.

Abstract: To reduce power consumption in transmitting biometric information signal by wireless. A heart beat detecting circuit amplifies a heart beat signal from an electrode and outputs a biometric detecting signal A having a predetermined time width in synchronism with heart beat of the heart. A voltage comparator, a pulse counting circuit and a control signal generating circuit control an antenna driving circuit such that an antenna circuit is driven when a signal level of a drive signal for driving the antenna circuit by the antenna driving circuit is lowered during a time period of outputting the biometric detecting signal A. The antenna driving circuit excites a resonance circuit comprising a coil L and a capacitor C for an antenna of the antenna circuit in response to the control. A biometric information signal of a burst signal type in correspondence with the heart beat signal is outputted by wireless from the antenna coil L, thereby, power consumption in transmitting by wireless is reduced.

Abstract: A power supply history monitor. The monitor receives a short duration anomalous signal, e.g., from a power supply, and produces a digitized signal representing the anomalous signal as an output. The monitor receives a signal from a signal input, and includes an analog delay element in series with the signal input, a sample and hold element receiving a signal from the analog delay element, an analog signal processor receiving an output of the sample and hold element, and an analog to digital converter receiving an analog output of the analog signal processor. The output of the power supply history monitor is a digital output.

Abstract: The lower power on-chip power supply noise sensor detects high frequency overshoots and undershoots of the power supply voltage. The sensor has two resistor chains that span the full power rail, with a reactive element to form a low pass filter as part of one of the resistor chains. By this expedient the high frequency transient behavior differs between the two chains, while the low frequency behavior is equivalent. This allows a voltage comparison to be made with comparators. The comparator output can be latched or transmitted as a sampling signal.

Abstract: A system for testing radio frequency (RF) communications of a device capable of such communications is provided. The system includes a chamber for isolating the device from RF interference, an antenna that is suitable for RF communications with the device wherein the antenna is capable of communications over a range of frequencies, the antenna being located within the chamber, and a digital communication link for providing non-RF communications with the device.

Abstract: Capacitance measurement apparatus that enhances the sensitivity and accuracy of capacitive transducers, proximity sensors, and touchless switches. Each of two capacitors (C1, C2) under measurement has one end connected to ground and is kept at substantially the same voltage potential by operational amplifier (A1) or amplifiers (A0, A1) using negative feedback. The apparatus is driven by a periodic e.g. sinusoidal signal source (G1) or sources (G1, G2) and includes a difference amplifier (A2) operative to produce an electrical signal having a linear relationship with a specified arithmetic function of the capacitances of the two capacitors (C1, C2). A touchless switch is implemented using the capacitance measurement apparatus. The touchless switch includes two sensor electrodes (E1, E2) that correspond to the two capacitors (C1, C2) under measurement and in one embodiment has a front surface in the form of a container.

Abstract: A method for measuring the degree of fiber concentration in a pulp in a machine, in particular a refiner for the manufacture of paper pulp, which machine includes a stator and an opposing rotor, which form a grinding gap for the pulp. The stator is provided with at least one sensor device, designed to interact with a rotor surface and including an impedance meter body with a sensor surface which impedance meter body is mounted in the stator in such a way that it can move axially. Measurements of the impedance between the rotor surface and the sensor surface are carried out during an axial movement of the impedance meter body and the measured impedance differences are utilized together with the size of the movement to determine the dielectric constant of the pulp, from which the degree of fiber concentration in the pulp is derived.

Abstract: A method of measuring flat-band status capacitance of a gate oxide in a MOS transistor device, comprises: mounting a measurement object wafer in a probe station connected to a capacitance measuring unit; measuring accumulation capacitance (Cox) of a gate oxide of the wafer using the capacitance measuring unit; measuring capacitance (Cmeas) from the gate while changing a gate voltage (Vgs) of the wafer using the capacitance measuring unit; computing the thickness of a depletion layer (Winv) using the measured accumulation capacitance (Cox) and the measured gate capacitance (Cmeas); computing bulk density (Nx) on the basis of the gate voltage (Vgs) in the case that depth of a depletion layer is 90% of a predetermined reference depth; computing debye length LD using the bulk density (Nx); and computing flat-band status capacitance using the accumulation capacitance (Cox) of the gate oxide and the debye length LD.

Abstract: An electronic circuit and method to determine a resistance value of a resistive element. The circuit includes a current source coupled in series with the resistive element. The current source is configured to force a predetermined value of current through the resistive element and includes a transconducting device coupled to the current source. The transconducting device is configured to sense a voltage across the resistive element and transform the voltage into an output current of the transconducting device such that the output current is not dependent upon any other terminal voltages of the transconducting device.

Abstract: Improved methods and apparatuses for automatically and accurately maintaining the alignment of a wafer prober to the bonding pads of a semiconductor device in the presence of motion disturbances are provided. In one embodiment of one aspect of the invention, a feedback control system incorporating information from a number of acceleration and/or velocity sensors is used to maintain the desired contact position in the presence of motion disturbances. Other aspects and other embodiments are also described.

Abstract: A locking mechanism and method for selectively fixing and allowing movement of a tip portion of a probe relative to a rigid portion of the probe are provided. The mechanism comprises a locking ball joint for selectively locking and allowing relative movement between the tip portion and the rigid portion and a sleeve about the ball joint. The locking ball joint is locked by the placement of the sleeve in a first position, thereby fixing the position of the tip portion relative to the rigid portion, and released by the placement of the sleeve in a second position, thereby allowing movement of the tip portion relative to the rigid portion.

Abstract: An improved method and apparatus for automatically and accurately aligning a wafer prober to the bonding pads of a semiconductor device are provided. In one embodiment of one aspect of the invention, a multi-loop feedback control system incorporating information from a number of sensors is used to maintain the desired contact position in the presence of disturbances. Other aspects and other embodiments are also described.

Abstract: There is provided a system and method for detecting abnormalities in a probe card. A reference image value of a normal contacting pad is set, an image value of a pad is extracted when an error occurs, and the extracted image value is compared to the reference image value. An alarm can be issued when the extracted image value is greater than the reference image value, and the probe card is inspected. The contacting state of the scanning probes and the pads can be automatically checked for abnormalities of the probe card during electrical testing, to accurately determine the contacting status of the scanning probes and the pads, and to not rely on an operator's subjectivity and level of expertise.

Abstract: Regulating a direct current-to-direct current (DC-DC) converter, a semiconductor switch having an improved current sensing technique is used to switch a DC voltage input at a predefined frequency. The switch includes a control pin to receive a control signal for controlling a current flowing between an input pin and an output pin. The switch also includes a Kelvin sense pin electrically coupled to an output pad located on a semiconductor die of the device for sensing the current. An electrical path from the output pad to the output pin in the form of a conductive lead wire has a predefined resistance. The current is Kelvin current sensed using the predefined resistance to tightly control deviation in the current beyond a predefined range.

Abstract: The invention provides a semiconductor device that can inspect the connection states of power source terminals and grounding terminals of a test LSI at a low cost and in a short time, and an inspection method for the same. Switches SW1 to SW3 are provided between a plurality of power source terminals PD1 to PD3 and a power source line 10 inside the test LSI 4. A switch SWT is provided between the power source line and a grounding line 11 inside the test LSI. When inspecting the connection state of a certain power source terminal, the switch connected between the power source terminal and the power source line is closed, the switch SWT between the power source line and the grounding line is closed, and remaining switches are opened. A voltage is supplied between the power source terminal and a grounding terminal, and whether or not the power source terminal is in the connected state is determined by whether or not a current flows.

Abstract: A circuit device having superior mechanical strength at the interface between a circuit board and heat sink and superior efficiency for radiating heat from a circuit element to the heat sink through the circuit board. The circuit device includes the metal-based insulation board for installing the circuit element, and the heat sink, over which the insulation board is installed with a paste arranged therebetween. The insulation board has a projection arranged on the surface facing the heat sink along a peripheral portion. At least part of the projection contacts the heat sink through the paste layer.

Abstract: The present invention relates to an optoelectronic sensor for demodulating a modulated photon flux (50), and to a measuring device, in particular for 3D distance measurement, having at least one optoelectronic sensor of this type. The optoelectronic sensor has at least two collecting zones (20, 22) introduced in a semiconductor region (10), which collecting zones are for example diffused into the semiconductor region and doped inversely with respect to the semiconductor region (10). The collecting zones (20, 22) serve for collecting and tapping off minority carriers generated upon penetration of a modulated photon flux (50). Furthermore, at least two control zones (32, 34) are introduced in the semiconductor region (10), which control zones generate a drift field in a manner dependent on a control voltage that can be applied to the control zones (32, 34), the control zones (32, 34) being of the same doping type as the semiconductor region (10).

Abstract: A packaged semiconductor chip is provided which includes a semiconductor chip and a package element. The semiconductor chip includes a plurality of semiconductor devices and a plurality of conductive features disposed at an exterior face of the semiconductor chip. The package element has a plurality of external features conductively connected to the plurality of conductive features of the semiconductor chip. The semiconductor chip includes a monitored element including a conductive interconnect that conductively interconnects a first node of the semiconductor chip to a second node of the semiconductor chip. A detection circuit in the semiconductor chip is operable to compare a variable voltage drop across the monitored element with a reference voltage drop across a reference element on the chip at a plurality of different times during a lifetime of the packaged semiconductor chip so as to detect when the resistance of the monitored element is over threshold.

Abstract: An active cancellation matrix for process parameter measurements provides feedback paths for each test location wherein each feedback path is used to sense the applied voltage and the sensed voltage is used to adjust the source voltage for any variations along the input path. The devices under test are arranged in a row and column array, and the feedback and voltage input paths are formed along respective rails which extend generally parallel to a row of devices under test. Selectors are used to selectively route the outputs of the test nodes to a measurement unit such as a current sensor. The input voltages can be varied to establish current-voltage (I-V) curves for the devices under various conditions. In the example where the devices under test are transistors, each source input includes three voltage inputs (rails) for a drain voltage, a source voltage, and a gate voltage.

Abstract: An improved method and apparatus for automatically aligning probe pins to the test or bond pads of semiconductor devices under changing conditions. In at least one embodiment, a dynamic model is used to predict an impact of changing conditions to wafer probing process. This reduces the need for frequent measurements and calibrations during probing and testing, thereby increasing the number of dice that can be probed and tested in a given period of time and increasing the accuracy of probing at the same time. Embodiments of the present invention also make it possible to adjust positions of probe pins and pads in response to the changing conditions while they are in contact with each other.

Abstract: An apparatus and method for testing an integrated circuit in a target electronic application, wherein the apparatus comprises a socket for receiving the integrated circuit, a modified commercial electronic product which models the target electronic application, and an electrical connection between the socket and the modified commercial electronic product. The method of testing an integrated circuit comprises placing an integrated circuit in a socket that is coupled to a circuit board substantially identical to that of a circuit board configured to include the integrated circuit, but which does not include the integrated circuit, and testing the integrated circuit. A method of making such a tester mechanically attaching a socket to a modified commercial electronic product and electrically connencting an integrated circuit and the modified commercial electronic product. This approach allows for cheaper, more comprehensive, and more accurate testing of an integrated circuit.

Abstract: The proposed single chip device includes a plurality of sense units arranged in a matrix form and each including a metal layer swingable in plural degrees of freedom, a metal post running vertically through a center point of the sense units and connected with the metal layer, an electrode structure disposed below and in parallel with the metal layer and including a plurality of activation electrodes each forming a capacitance with the metal layer, a plurality of sense electrodes sensing a plurality of capacitances formed between the activation electrodes and the metal layer, respectively, to obtain capacitance signals for the capacitances and a stop member to limit the metal layer to swing over a specific range and a circuit receiving the capacitance signals for the capacitances. And the provided device is deposited on an object to determine an inertia of the object.

Abstract: A surface electron emission device array and a TFT inspection system for inspecting a TFT array using a surface electron emission device array may be provided. The TFT inspection system may include a surface electron emission device array, which may have a first electrode disposed to face the TFT array in a first direction, a second electrode disposed in a second direction intersecting the first direction in a region corresponding to a region in which the first electrode and a corresponding pixel electrode of the TFT array may be formed, and an insulating layer interposed between the first electrode and the second electrode.

Abstract: A method and apparatus are provided for detection and prevention of bulk complementary metal oxide semiconductor (CMOS) latchup. A separate power distribution is provided for coupling a positive voltage supply rail to the N well and a ground voltage supply rail to the P well of the CMOS circuit. At least one sensor monitors current flow in a bias voltage applied to at least one of an N well and a P well of the CMOS circuitry. A latchup event is detected responsive to a predefined increase in the monitored current flow. A switch temporarily interrupts the connection of at least one of the N well and the P well to the respective voltage supply rail when the latchup event is detected.