Abstract: The aim of this invention focuses on the development of a high-efficiency bidirectional converter for power sources with great voltage diversity. In traditional bidirectional converters, the circuit topology with transformer form is the common usual. Moreover, the soft-switching techniques including zero-voltage-switching (ZVS) or zero-current-switching (ZCS) are usually used for alleviating the corresponding switching losses. However, there are four and upward power semiconductor switches in these circuit schemes. By this way, it will result in the increase of production cost, and the degeneration of conversion efficiency. The coupled-inductor bidirectional scheme in the proposed converter only adopts three power semiconductor switches to accomplish the objective of bidirectional current control. Under the situation of non-isolation circuit topology, it still possesses the protection of electric safety for operators.

Abstract: A controller (1) comprises a comparator (10) which compares an input signal (Vo) with a reference signal (Vr) to obtain an error signal (ER). An integrator (11) applies an integrating action on the error signal (ER) to obtain a control signal (ICO). The integrator (11) allows influencing the integrating action. A copy circuit (81) supplies a copy control signal (ICOC) being proportional to the control signal (ICO). A determination circuit (85) determines whether the copy control signal (ICOC) reaches a limit value (IMIN, IMAX). An influencing circuit (83) influences the integrating action to limit the control signal (ICO) when the copy control signal (ICOC) reaches the limit value (IMIN, IMAX).

Abstract: An inductive power transfer system comprises a primary unit (10), having a primary coil (12) and an electrical drive unit (14) which applies electrical drive signals to the primary coil so as to generate an electromagnetic field. The system also comprises at least one secondary device (30), separable from the primary unit and having a secondary coil (32) which couples with the field when the secondary device is in proximity to the primary unit. A control unit (16) causes a circuit including said primary coil to operate, during a measurement period, in an undriven resonating condition. In this condition the application of the drive signals to the primary coil by the electrical drive unit is suspended so that energy stored in the circuit decays over the course of the period. A decay measurement unit (18) takes one or more measures of such energy decay during the measurement period.

Abstract: A current-to-voltage detection circuit includes a detection circuit, a reference voltage component, a resistor component, a load, a detection part, and an amplifier, wherein the detection circuit uses the reference voltage component to produce a fixed reference voltage which come up with a reference potential at a point B. When the load is turned on to form a system loop, a grounding end of the detection part can produce a reference potential of tiny mV at a point A; whereas a common reference potential is produced at a point C upon comparing the point A with the point B. When the reference potential at the point A is greater than the reference potential at the point B, a voltage at the output end of amplifier is converted from a low potential into a high potential, and a circuit of related system can be controlled by a change between the potentials.

Abstract: A novel method is described that enables the measurement of the phase of the spectral components generated by an harmonic phase reference generator without using a calibrated sampling oscilloscope. First one uses a vector network analyzer to measure the output reflection coefficient of an harmonic phase transfer standard and of the harmonic phase reference generator that needs to be characterized. Next one connects the transfer standard to a microwave receiver and one measures the spectral components that are generated by the transfer standard. One then connects the harmonic phase reference generator to be characterized to the microwave receiver. The spectral components of the harmonic phase reference generator to be characterized are calculated by using the spectrum of the transfer standard as measured by the receiver. The spectrum of the harmonic phase reference generator to be characterized as measured by the receiver and the known spectrum of the transfer standard.

Abstract: To provide a method for the self-testing of a reference voltage in electronic components, by means of which method there is specified a circuit arrangement for a self-test of the reference voltage that can be implemented in the form of an on-chip test, i.e. for which no external reference voltage source is required, provision is made for the reference voltage (Uref) to be fed to a voltage-controlled oscillator whose output forms the input to a Wien-Robinson bridge whose output signal is checked in a phase detector for its phase shift relative to the input to the Wien-Robinson bridge to check the balance of the Wien-Robinson bridge, the Wien-Robinson bridge being set to be balanced at a frequency (?ref.test) that is generated in the oscillator at the nominal value (Uref.tes) selected for the reference voltage (Uref), and a pass signal is generated if the bridge is balanced and a fail signal is generated if it is not.

Abstract: A current sensing system for sensing an output current of a Switch Mode Power Supply (SMPS), the SMPS including a magnetic energy storage device for transferring power from an input side to an output side of the SMPS, the current sensing system comprising: a flux model system to generate a waveform representing a magnetic flux in said magnetic energy storage device; and an output current model system to generate an output current sensing signal responsive to said magnetic flux waveform.

Abstract: A method of testing power-on reset circuitry in an integrated circuit comprises establishing the a first state of the integrated circuit that is different from a normal reset state of the circuit, lowering the VCC power supply voltage from a normal high operating level VH to a specified lower level VP then raising it back to the normal high level, then determining whether or not the integrated circuit has assumed the reset state. The testing can repeated with a plurality of lower VCC levels VP and under a variety of operating conditions to characterize resetting parameters and to designate pass/fail results for individual chips. If an AC voltage detector is part of the power-on reset circuitry, then it can tested separately, and DC testing occurs with very slow ramp rates for lowering and raising the power supply voltage.

Abstract: A method and apparatus are provided for obtaining the rotational speed of a pump system or other suitable rotating equipment having a self-contained pump electrical equipment power supply. The method features, before being rectified, directing one phase of AC power through a zero crossing circuit that identifies an instant of time the AC voltage crosses from one polarity to the other polarity and triggers a square wave pulse for each instant time. In operation, the AC voltage is detected when it crosses from a negative polarity to a positive polarity, or vice versa. The method also includes steps for measuring the period of the square wave pulse and calculating the speed of the pump or other rotating equipment.

Abstract: A position measuring device has an incremental dimensional standard, an associated scanning unit that emits at least two analog, phase-shifted, periodic output signals, and a monitoring device, and the value of the output signals codes a state of the monitoring device.

Abstract: A magnetic encoder which is used in a wheel bearing, that forms a pulse train by virtue of a magnetic force, and generates a code, comprises a magnetic ring, a reinforcing ring, and a protecting cover. The magnetic ring is fixed to the reinforcing ring and circumferentially magnetized with alternate S poles and N poles. The protecting cover is made of a non-magnetic material and covers the magnetic ring. A plural number of welds are provided between an end part and/or end parts on a radial inner circumferential side and/or a radial outer circumferential side of the protecting cover, and the reinforcing ring.

Abstract: A magnetic sensor for determining positions of an activation magnet along a monitored distance with at least two sensor elements. Both sensor elements are subjected to at least one component of a magnetic field of the activation magnet. An evaluation unit coupled to the sensor element generates at least one switching element that corresponds to a desired magnet position. Each sensor element is operative over the entire monitored distance, and for each desired magnet position there is one unambiguous group of signal values which is used by the sensor elements for generating the switching signals in the evaluation unit.

Abstract: A sensor arrangement for sensing at least one position of a movably mounted element in a sensing direction is disclosed. The sensor arrangement includes a magnetic arrangement which has a magnetic field distribution in the sensing direction, and includes a magnetic field sensor. The magnetic arrangement and the magnetic field sensor are arranged in such a way that the magnetic field sensor senses different magnetic field strengths in different positions of the movable element in the sensing direction. The magnetic arrangement has at least two magnets whose magnetic field distributions are combined with one another in such a way that an approximately linear characteristic curve of the sensor arrangement occurs at least over a section in the sensing direction.

Abstract: It is an object to provide a new rotational position sensor, compound rotational position sensor and motor operated power steering device capable of detecting the rotational position of a rotation detection shaft of which a steering shaft is representative. According to a compound rotational position sensor of the present invention, the number of times a steering shaft has rotated from a reference position is identified by a rotational position sensor and the angle of rotation for one turn of the steering shaft is identified by an encoder. Furthermore, the current angle of rotation of the steering shaft may be specified as an absolute angle of rotation from the reference position based on these two pieces of rotational position information. Furthermore, since a magnetic circuit that is closed by the steering shaft and the base part is formed, the efficiency of the electromagnetic induction is improved, and the electric power consumed can be controlled.

Abstract: The present invention relates to a measuring tool for measuring magnetic properties of a magnetic sample in a closed loop, comprising an electromagnet (1) in a closed loop arrangement with two pole pieces (3) connected to a yoke (2), said pole pieces (3) forming a gap (4) for the placement of the sample (5), a search coil (6) for the measurement of a flux density B of the sample (5) and a magnetic field sensor (7) for the measurement of a magnetic field strength H in the gap (4) between said pole pieces (3). The pole pieces (3) comprise heater elements (8) for heating the pole pieces (3) to temperatures of at least 4000 C and are thermally insulated against the yoke (2) of the electromagnet (1). The pole pieces (3), the search coil (6) and the magnetic field sensor (7) are made of materials which resist said high temperatures. The measuring tool allows the non-destructive measurement of magnetic properties of magnetic samples in closed circle up to 500° C.

Abstract: A commodity inspection system attaches a ferromagnetic body to a genuine commodity in advance and detects the magnetic characteristic of the ferromagnetic body so as to judge whether the inspection object is a genuine commodity. The system includes: an magnetization coil for applying a magnetic field changing at a predetermined frequency to a inspection object; a detection coil for detecting the change of the magnetic flux density caused by the magnetic field change; an FFT unit for acquiring a frequency spectrum corresponding to magnetic flux density change; and a judgment unit for judging whether the inspection object is a genuine commodity according to the acquired frequency spectrum. The ferromagnetic body causes a steep magnetization reversal when a magnetic field exceeding its coercive force is applied.

Abstract: At least one magnetic field sensing device and an RF transceiver are integrated in a discrete, single-chip package. Rather than requiring at least two separate chips to wirelessly transmit the device output, an integrated, single chip solution can be used. The single chip integration of the at least one magnetic field sensing device and the RF transceiver can reduce the physical space required and, therefore, allow such devices to be smaller, lighter, and possibly more portable.

Abstract: A battery monitor apparatus and method for an automotive battery system including a battery for supplying power to in-vehicle electrical equipment and sensors for detecting battery voltage, the charge/discharge current and the battery temperature are disclosed. The capacitance and the internal actual resistance of the battery are calculated at the time of starting the engine. Further, the theoretical internal resistance of the battery corresponding to the ambient temperature and the battery open-circuit voltage during the stationary engine state are detected in advance. Based on the change in the battery open-circuit voltage, the battery change is provisionally determined. After that, battery change or degeneration can be determined based on battery capacitance, the actual and theoretical internal resistance values of the battery, the battery open-circuit voltage and the provisional battery change determination value.

Abstract: Two coil forming elements (12, 14) formed of conductor layers and a contact means (19), which is formed in an interlayer dielectric film (13) interposed between the conductor layers and brings the upper and lower coil forming elements into contact with each other through a via hole form a stacked coil (10). One end of the stacked coil is connected to an upper grounding layer (27) of a strip line (20), and the other end of the stacked coil is connected to a strip conductor (23) of the strip line. The number of turns of the stacked coil is larger than 1. A magnetic flux penetrating through the stacked coil increases to be able to induce a relatively large electromotive force. Thus, a high spatial resolution can be obtained easily.

Abstract: A magnetic resonance imaging apparatus includes a main magnet (20) that surrounds an examination region (18) and generates a main magnetic field in the examination region. A magnetic field gradient system (30) is disposed outside of the main magnet. The magnetic field gradient system includes a ferromagnetic yoke (32), and a plurality of magnetic field gradient coils (34) magnetically coupled with the ferromagnetic yoke and selectively producing magnetic flux in the ferromagnetic yoke. The magnetic flux in the ferromagnetic yoke produces selected magnetic field gradients in the examination region.

Abstract: The magnetic resonance imaging system 1 according to the invention comprises a data acquisition system 11 with a main magnet 12 with an imaging volume (not shown) therein. Gradient system (G) arranged for generating field gradients Gx indicated as 14, Gy indicated as 16 and Gz indicated as 17 is provided. An RF excitation system (10) is provided for generating radio-frequency (RF) pulses for flipping aligned spins into a transverse plane such as the XY plane or to have a component in the XY plane. The system (10) for flipping the spins comprises RF coils (not shown) in the magnet 12 and a pulse transmitter 18. The pulse transmitter frequency may be supplied by a synthesizer 19 and can be controlled by a control system 21. The control system 21 is arranged to control the time and amplitude of the outputs of the various component parts making up the magnetic resonance apparatus.

Abstract: In a method for manufacturing a gradient coil system for a magnetic resonance apparatus, the conductor arrangement of the gradient coil system is produced by successively applying respective layers of metal powder sinter material on a workpiece platform, and successively sintering the respective layers by the application of radiation, such as laser radiation, to the individual layers, and the conductor arrangement is assembled with other components to produce the gradient coil system. A gradient coil system manufactured in accordance with this method includes a number of assembled components, including an electrical conductor arrangement, with the electrical conductor arrangement having conductors formed by radiation-sintered metal powder material.

Abstract: A magnetic resonance force microscope (MRFM) generator for producing an RF magnetic field uniformly over the whole of a sample. A cantilever with magnetic probe tip is self-excited. Under this condition, spins in the sample are controlled to produce a magnetic resonance force. A frequency demodulator measures the resonant frequency of the cantilever from the output detection signal from a cantilever displacement-measuring instrument based on the magnetic resonance force.

Abstract: A method includes heating a MRI shim with a heater to reduce a temperature rise per unit of time during a gradient operation of a MRI system.

Abstract: In a nuclear magnetic resonance spectrometer, the shape of a detection coil is changed from a conventional cage type to a solenoid type of higher sensitivity. Accordingly, differing from the conventional superconductive magnet of multilayer air core solenoids, a superconductive magnet is right and left divided to split magnets for generating 11 T preferably, 14.1 T in the horizontal direction, and the magnetic field uniformity is set to 0.001 ppm or less and the temporal stability is set to 0.001 ppm or less.

Abstract: Systems and methods for downhole communication and measurement utilizing an improved metallic tubular having an elongated body with tubular walls and a central bore adapted to receive a run-in tool. The tubular including slotted stations to provide through-tubular signal transmission and/or reception. Hydraulic isolation between the interior and exterior of the tubular is provided by pressure barrier means at the slotted stations. Sensors and/or sources are mounted on the run-in tool, which is adapted for transmission through a drill string to engage within the tubular in alignment with the slotted stations. A run-in tool configuration includes a modulator for real-time wireless communication with the surface and/or remote downhole tools. A tubular and run-in tool configuration also includes inductive couplers for wireless signal data transfer. A method for measuring a formation characteristic utilizing a run-in tool adapted with an interchangeable end segment for multi-mode downhole transport.

Abstract: A transmitter on a bottomhole assembly (BHA) is used for generating a transient electromagnetic signal in an earth formation. A receiver on the BHA receives signals that are indicative of formation resistivity and distances to bed boundaries. A combination of electromagnetic shielding and magnetostatic shielding enables determination of distance to an interface ahead of the drillbit.

Abstract: A resistivity sub including a resistivity sensor forms part of a bottom hole drilling assembly. The sensor is maintained at a substantially fixed offset from the wall of a borehole during drilling operations by, for example, a stabilizer. In WBM, galvanic sensors may be used, with or without commonly used focusing methods, for obtaining a resistivity image of the borehole wall. In OBM, capacitive coupling may be used. The apparatus is capable of using other types of sensors, such as induction, MPR, shielded dipole, quadrupole, and GPR sensors. It is emphasized that this abstract is provided to comply with the rules requiring an abstract which will allow a searcher or other reader to quickly ascertain the subject matter of the technical disclosure. It is submitted with the understanding that it will not be used to interpret or limit the scope or meaning of the claims. 37 CFR 1.

Abstract: A surface voltmeter comprises a stage having a conductive surface, a vibrating electrode, a vibration part, and an elevation mechanism. While vibrating the vibrating electrode, displacement current from the conductive surface is acquired. A control part controls electrode voltage so that the displacement current becomes a value specified by a computer, and acquires a relationship between the displacement current and the electrode voltage while changing the displacement current. Acquisition of the relationship is performed a plurality of times while changing distance between the vibrating electrode and an object, the electrode voltage which is independent from the distance between the vibrating electrode and the object is obtained as reference voltage, and surface voltage on the object is obtained on the basis of the reference voltage.

Abstract: Methods and apparatuses to repair defects in a circuit, such as during or subsequent to the manufacture of the circuit. Defects may be detected through, for example, optical processing of an acquired image of the circuit or by measuring the strength of a signal emitted across a pair of conductor plates. If defects are detected, conductive particles may be applied to the circuit to correct the detected defects.

Abstract: A method and system to eliminate the VSWR effect in measurements results are provided. Multiple measurements of the signal under test are taken to cancel out the VSWR effects and leave only the actual magnitude of the signal under test. Multiple measurements may be taken with the phase of the signal shifted. The phase of the signal under test should be shifted so as to cancel out the VSWR effects. For example, for each measurement taken of the signal under test, a corresponding measurement should be taken with the phase of the signal under test inverted.

Abstract: A method of providing an operating signal to an electrical device such as a telephone or FAX machine at a prescribed voltage and frequency, e.g., 100 volts at 25 Hz. Electrical power is generated as DC and converted to AC at a voltage substantially below the prescribed voltage. This signal is applied to the input stage of a boost transformer with the signal at the output stage being substantially equal to the prescribed voltage at a frequency substantially higher than the prescribed frequency, e.g., 2,500 Hz. The signal at the output stage is modulated to provide periods of 1/25 Hz duration alternating between the high voltage, high frequency signal and no signal, i.e., periods of silence or zero voltage, before being applied to the target device. Since that device is designed not to respond to the high frequency signals, the effect is that of a signal being applied at a 25 Hz frequency.

Abstract: A probe includes a tubular conductor having an aperture at one end thereof. An electromagnetic wave transmitting unit for transmitting an electromagnetic wave, via the tubular conductor, to a position distant from the aperture is disposed at one of the inside and the outside of the tubular conductor, and an electromagnetic wave receiving unit for receiving an electromagnetic wave, via the tubular conductor, from the position distant from the aperture is disposed in the other of the inside and the outside of the tubular conductor. The size of the aperture is smaller than or equal to the wavelength of the electromagnetic waves. The electromagnetic waves transmitted and received at the outside and the inside of the tubular conductor are coupled through the aperture. When an analyte to be observed is disposed so as to face the aperture, information of the analyte is obtained on the basis of a change in the coupling of the electromagnetic waves through the aperture.

Abstract: The electronic interface circuit (1) of a capacitive sensor (2) is used for measuring a physical parameter, such as an acceleration. The sensor includes two differential mounted capacitors (C1, C2) whose common electrode (Cm) can move relative to each other fixed electrode in order to alter the capacitive value of each capacitor. The electronic circuit includes a charge transfer amplifier unit (4) connected to the common electrode (Cm), a first integrator unit (5) for integrating the charges supplied by the charge transfer amplifier and a first excitation unit (3) arranged between the output of the first integrator unit and the sensor for polarizing each fixed electrode of the capacitors to a determined voltage value.

Abstract: The present disclosure provides several systems. In general, it provides E-field sensor systems that utilize at least one electrode 100 adapted for creating an E-field in an area 210 within a detection volume where fluid presence 400 or presence of a solid body 300 is to be detected. The electrical field sensor is configured to generate a detected signal responsive to a change in capacitance of the electric field, and is communicatively coupled to the electrode 100. In addition, a processor 275 is configured to determine a quantitative measure of a fluid or solid body within the detection volume in accordance with a capacitive relationship with the detection volume. Described are examples of the system for fluid presence detection, fluid level measurement and measurement of proximity to a solid object.

Abstract: A capacitor apparatus according to the present invention is configured to charge electric charge in capacitors C1 and C2 and discharge electric charge from the capacitors C1 and C2 at normal operation time. The capacitor apparatus includes an internal resistance detection means 2 for detecting the internal resistance value of the capacitors C1 and C2 and an inter-capacitor charging/discharging control means 1 for controlling charging/discharging operation between the capacitors C1 and C2. When the internal resistance detection means 2 detects a resistance value more than a predetermined value, the inter-capacitor charging/discharging control means 1 performs charging/discharging control between the capacitors C1 and C2 to cause the capacitors C1 and C2 to self-heat.

Abstract: A method for detecting moisture in a display device having at least one display element includes incorporating at least one moisture detector in a predetermined location of the display device, the moisture detector including a material layer comprising metal formed between a first electrode and a second electrode. One or more display elements are encapsulated between a first and second shields. A resistance of the material layer is detected so as to determine a level of moisture.

Abstract: An apparatus for predicting the reliability of an electronic system is provided. The apparatus includes at least one component, a stress sensor operable to measure stress of the at least one component, a resistance sensor operable to measure an electrical resistance of the at least one component, and an electronic control system coupled to the stress sensor and resistance sensor operable to predict the reliability of the electronic system using the stress and electrical resistance of the at least one component.

Abstract: A method and apparatus for reducing or eliminating crosstalk between a plurality of electron beams is described. The plurality of electron beams may produce test areas on a large area substrate that are adjacent wherein secondary electrons from one test area may be detected in an adjacent test area. In one embodiment, the timing of a primary beam emission and detection of secondary electrons from that primary beam is controlled to eliminate or reduce the possibility of detection of secondary electrons from another primary beam.

Abstract: A probe card has a plurality of probe needle groups arranged in a predetermined pattern. The predetermined pattern is obtained by assuming a plurality of unit regions 11-14 arranged adjacent to each other to form a chip group region. The number of unit regions is equal in number to indexes. One of the unit regions included in the chip group regions is defined as a specific unit region. A plurality of the chip group regions are arranged without space therebetween to cover a size of a wafer. The arranged chip group regions form a virtual cover pattern. The arrangement of the specific unit regions is extracted to form the predetermined pattern. Each probe needle group is arranged at the position corresponding to each specific unit region of the predetermined pattern.

Abstract: The objective of the present invention is to provide a type of probe assembly with a long lifetime and low cost, as well as a type of probe card using same. Probe assembly 100 attached on the probe card has probe holder 200 that holds plural probes Q at prescribed positions and leaf spring mechanism 300 with probe holder 200 attached on it. Said leaf spring mechanism 300 has leaf spring cover 360 connected to probe card base plate 410 and leaf spring 330, as well as pin row base plate 310 with probe holder 200 attached on it. When the bump electrodes are contacted, pin row base plate 310 can move towards leaf spring cover 360 via leaf spring 330.

Abstract: A method and apparatus for performing automated alignment of probes of a probe card is provided. The desired horizontal location for a probe is compared with the actual horizontal position for the probe to determine a horizontal correction distance and a horizontal correction direction to correct a horizontal alignment for the probe. A first tool automatically corrects the horizontal alignment for the probe based on the horizontal correction distance and the horizontal correction direction. Upon determining that an actual vertical position of the probe is closer to the probe card than a desired vertical position, a second tool automatically changes the actual vertical position of the probe to the desired vertical position. Upon determining that the actual vertical position of the probe is farther from the probe card than the desired vertical position, a third tool automatically changes the actual vertical position of the probe to the desired vertical position.

Abstract: Method and apparatus for electrical testing of a device under test (DUT) that employs a connection board with signal contacts for applying test signals and a space transformer that has low pitch contacts arranged on one or more circumferential shelves that define an enclosure in the space transformer. The apparatus has a substrate with fine pitch contacts positioned such that these are within the enclosure. A set of wire bonds is used for pitch reduction by interconnecting the fine pitch contacts with the low pitch contacts arranged on the shelves. The probes are connected to the fine pitch contacts and are used to apply the test signals to a DUT by contacting its pads. In some embodiments, the fine pitch contacts may be embodied by plugs or by blind metal vias.

Abstract: A probe comprises a first and a second arm portions extending in the rightward and leftward direction at a vertical interval, a first and a second connecting portions connecting the first and second arm portions respectively at their front end portion and base end portion, and a needle point portion following one side in the upward and downward direction of the first connecting portion. At least one of the first and second arm portions has at least one of the whole arm portion, an edge portion on one side in the upward and downward direction of the arm portion, and an edge portion on the other side in the upward and downward direction of the arm portion made arcuate.

Abstract: A method and apparatus is provided for characterizing a contactor for automated semiconductor device testing, the method first comprising placing the contactor on a contactor test board positioned within an automated test apparatus. A first probe of the automated test apparatus is contacted to a conductive layer of the contactor test board, and a second probe is placed on a contactor pin of the contactor, wherein the contactor pin is operable to linearly translate within the contactor. A predetermined pressure is applied to the contactor pin via the second probe, wherein the contactor pin is translated toward the contactor test board. An electrical characteristic of the contactor pin is measured between the first probe and the second probe and compared to a desired electrical characteristic, wherein a condition of the contactor pin is determined, based on the comparison of the measured electrical characteristic and the desired electrical characteristic.

Abstract: An apparatus of measuring characteristics of a plurality of semiconductor devices with a plurality of measurement units is disclosed. The apparatus includes a parallel measurement executability determination section and a plurality of measurement function sections. The parallel measurement executability determination section identifies sets of a semiconductor device and a measurement function, which are able to be measured in parallel based on connection information of the semiconductor devices. The plurality of measurement function sections use a first abstractive name which abstractively identifies the plurality of measurement units for the sets of the measurement functions and the semiconductor device which are able to be measured in parallel by the parallel measurement executability determination section.

Abstract: The present invention provides a structure and fabricating method of forming conductive traces on a printed circuit board. The method comprises the steps of (a) providing an insulating substrate; (b) forming grooves on the insulating substrate; and (c) filling a first colloid which has a bridging effect with the insulating substrate into the grooves; and (d) filling a second colloid which reacts with the first colloid into the conductive traces.

Abstract: Pusher assemblies for use in microelectronic device testing systems and methods for using such pusher assemblies are disclosed herein. One particular embodiment of such a pusher assembly comprises a plate having a first side and a second side opposite the first side. An engagement assembly is removably coupled to the second side of the plate and positioned to contact a microfeature device being tested. The pusher assembly can include an urging member proximate the first side of the plate and configured to move the engagement assembly toward the device being tested. The pusher assembly can also include a heat transfer unit carried by the first side of the plate. In several embodiments, the pusher assembly can further include a plurality of pins carried by the engagement assembly such that the pins extend through the plate and engage the urging member to restrict axial movement of the urging member toward the device being tested.

Abstract: An apparatus, a method and a system to test a device. An input/output (I/O) block communicates with an external tester to receive test data and to send test result using first and second communication modes. A logic block parses the test data. A memory stores microcode from the parsed test data. The microcode contains a test program to test a circuit. A controller executes the test program.

Abstract: A CMOS circuit characteristic automatic adjustment apparatus includes a replica signal generation circuit for generating a replica signal capable of minimizing a drain voltage of an MOS transistor in a target circuit, a replica circuit for receiving the replica signal, voltage buffers for receiving respective drain voltages of MOS transistors in the target circuit and the replica circuit, respectively, MOS transistors for receiving respective output voltages of the voltage buffers, a comparison circuit for comparing respective sizes of currents flowing in the MOS transistors, respectively, and an adjustment circuit for adjusting, based on a comparison result, operation states of the target circuit and the replica circuit.