Abstract: Exemplary embodiments provide a vertical alignment type liquid crystal display device capable of enhancing a response speed and display characteristics in a specific viewing angle direction. In a liquid crystal display device of an exemplary embodiment of the present invention, a vertical alignment type liquid crystal layer is interposed between a pair of substrates, and display is performed in predetermined dot regions (D1, D2, and D3). A plurality of sub-dot regions (island-shaped portions) are provided in the dot region D1, and the plurality of sub-dot regions is electrically connected to each other by connecting portions in the dot region D1. Each sub-dot region is provided with a convex portion to regulate the alignment direction of the vertically aligned liquid crystal molecules such that the liquid crystal molecules, are inclined substantially in a radial direction around the convex portion, and the convex portion is arranged so as to deviate from the center of the sub-dot region.

Abstract: The invention relates to an LCD panel for preventing the generation of blur due to ionic impurities. The LCD panel comprises a first substrate having a common electrode; a second substrate having an active area; a seal pattern along the periphery of said active area between said first substrate and said second substrate; a liquid crystal layer between said first substrate and said second substrate in said active area; and an electrode pattern between said seal pattern and said second substrate. Alternatively, the seal pattern has outwardly projecting corner portions. An electric field is generated between the electrode pattern and the common electrode so that the ionic impurities are prevented from penetrating into the active area, and the ionic impurities in liquid crystal are captured in the seal pattern portion to prevent the generation of blur due to ionic impurities.

Abstract: The invention reduces or suppresses outside light reflection without reducing or substantially reducing the light emitting strength from a light-emitting element. An apparatus of the invention includes a light-emitting element. A wavelength correcting unit, a planar polarization beam splitter, and a polarizing plate are also included.

Abstract: A touch sensor type liquid crystal display is disclosed to provide a touch sensor type liquid crystal display which can endure long-time use while achieving a weight reduction. The touch sensor type liquid crystal display includes: a liquid crystal display panel 2 having an array substrate 14 and a color filter substrate 13, which are arranged oppositely to each other by interpolating a liquid crystal layer 18; and a touch sensor panel 3 having a movable electrode plate 4 and a fixed electrode plate 5, which are arranged oppositely to each other by a specified gap. These panels 2 and 3 are laminated together. A gap controlling spacer 19 is fixed in the array substrate 14 to restrict a spacer movement in a planar direction.

Abstract: The invention relates to a liquid crystal display in which a polymeric component included in a liquid crystal layer is polymerized while adjusting a voltage applied to the liquid crystal layer to regulate the direction of alignment of liquid crystal molecules during polymerization and a method of manufacturing the same. The invention provides a liquid crystal display in which image sticking is mitigated and a method of manufacturing the same. In a method of manufacturing a liquid crystal display in which a liquid crystal composition including a polymeric component that is optically or thermally polymerized is sealed between substrates and in which the polymeric component is polymerized while applying a voltage to the liquid crystal composition to regulate the direction of alignment of liquid crystal molecules during driving, a configuration is employed such that a polymerization initiator in the liquid crystal composition has a concentration x that satisfies 0?x?0.

Abstract: A method of joining two panels during the manufacturing of a LCD display employing the ODF (One Drop Fill) assembly technique. Using this method, the liquid crystal is deposited on one of the substrate's interior to the glue seal. The glue seal is pre-deposited near the peripheral edge of the substrates. The two substrates are then brought in contact with one another. The glue seal must be cured rapidly in order to seal the entire periphery while avoiding contamination between the glue seal, in the liquid state and the liquid crystal. The present invention teaches the use of a non-epoxy glue sealant, which is cured using photoinitiators. Experimental research has discovered the use of photons that are derived from laser beams and the control thereof. This allows for a faster, lower temperature cure.

Abstract: A radiation-curing liquid crystal having cholesteric regularity is applied to a glass substrate 11 provided with an alignment layer 12 to form a first cholesteric liquid crystal film 13 in the uncured state (FIG. 2(a)). Radiation 20 is then selectively applied, through a photomask 14, to the desired portions of the first cholesteric liquid crystal film 13 to partially cure it (FIG. 2(b)); thereafter, the first cholesteric liquid crystal film 13 is immersed in an organic solvent 22 to remove the uncured portions 13b thereof (FIG. 2(c)), thereby forming the first cholesteric liquid crystal film 13 in a desired pattern (FIG. 2(d)). Then, in the same manner as described above, a radiation-curing liquid crystal having cholesteric regularity is applied to the surface of the formed first cholesteric liquid crystal film 13 and the alignment layer 12 to form a second cholesteric liquid crystal film 13? in the uncured state (FIG. 2(e)).

Abstract: A method for converting a sequence of scan-only film captured images into a sequence of modified images that provide the appearance of images captured by a photographic film reproduction system; the photographic film reproduction system being includes photographic motion picture negative film printed onto a motion picture print film that is displayed, or a reversal motion picture system in which the reversal film is displayed, or a photographic motion picture film electro-optically scanned to standard format video by a telecine and further displayed, or a photographic motion picture film electro-optically scanned by a scanner suitable for producing digital data intended for additional digital image manipulation and further preparation as a digital master for electronic distribution such as digital theatrical projection or various types of broadcast video; or recorded out to another photographic film to be used as a printing master for producing distribution optical prints for theatrical projection.

Abstract: An integrated lithographic fabrication cluster system, as presented herein, comprises an exposure apparatus to expose a pattern onto a substrate with an associated exposure controller to control the exposure apparatus and a track apparatus interconnecting a plurality of processing modules with an associated track controller to control the track apparatus. The cluster system also comprises a wafer handling apparatus coupled to the exposure apparatus and track apparatus that is configured to transfer substrates between the processing modules utilized by the exposure apparatus and track apparatus and a wafer handling controller to control the wafer handling apparatus. The cluster system further comprises a cluster controller that communicates control information to at least one of the exposure controller, the track controller, and the wafer handling controller to manage operations of the exposure apparatus, the track apparatus, and the wafer handling apparatus during the lithographic fabrication process.

Abstract: An optical arrangement with a light source includes an optical element that is fastened in a mount. The light source emits radiation and the optical element is acted on thereby such that the heat that results lacks symmetry corresponding to the shape of the optical element. A connecting structure is provided between the optical element and the mount and has a symmetry that does not correspond to the shape of the optical element and effects an at least partial homogenization of the temperature distribution in the optical element.

Abstract: A lithographic projection apparatus is disclosed. The apparatus includes a substrate support for supporting at least one substrate, a radiation system for providing at least one beam of radiation, and a vacuum chamber. The vacuum chamber includes a patterning device and/or a projection system. The patterning device is arranged for patterning the beam of radiation according to a desired pattern, and the projection system is arranged for projecting the patterned beam of radiation onto a target portion of the substrate. The apparatus also includes at least one thermal shield for thermally conditioning at least part of the apparatus. The thermal shield includes particle transmission channels for transmitting particles through the shield, from a first side of the shield to a second side of the shield.

Abstract: A radiation system for multiplexing radiation includes two radiation sub-sources. The sub-sources each provide a certain amount of radiation. The system further includes a member with reflecting surfaces. The surfaces are arranged in such a way that they receive the radiation from the sub-sources and combine this radiation. The radiation sub-sources may operate simultaneously or alternately. The surfaces may perform functions such as filtering or (de)magnifying.

Abstract: An objective having an apical lens and a lens frame which supports the apical lens, includes an elastic member which supports the lens frame by exerting a bias force in a central axial direction of the apical lens, and an apex of the lens frame has a convex portion which projects outward in the central axial direction more than an apical surface of the apical lens.

Abstract: A lithographic apparatus includes an illumination system configured to provide a beam of radiation of radiation; a support configured to support a patterning device configured to impart a pattern to the beam of radiation; a substrate table configured to hold a substrate; a projection system configured to project the patterned beam onto a target portion of the substrate, the projection system and/or illumination system including a focusing element; a plurality of stop discs each having an aperture therethrough different from the size and/or shape of the apertures of the other stop discs; and a mechanism configured to exchangeably place a selected one of the stop discs adjacent to the focusing element.

Abstract: An exposure apparatus that irradiates excitation laser onto a target, and generates from generated plasma a light source for generating illumination light of an extreme ultraviolet region or an X-ray region includes an illumination optical system that uses the illumination light to illuminate a catoptric reticle that forms a pattern to be transferred, the illumination optical system including a first mirror closest to the light source, an ellipsoidal mirror for condensing the illumination light in front of the first mirror in the illumination optical system, and a projection optical system that reduces and projects the pattern reflected on the reticle onto an object to be exposed, wherein light where an optical-axis direction of the excitation laser proceeds beyond a position that generates the plasma by the excitation laser does not interfere with components in the exposure apparatus including the illumination and projection optical systems, and the ellipsoidal mirror.

Abstract: A distance measuring device for a vehicle emits electromagnetic waves forward for a scan both in horizontal and vertical directions. It is judged from received light whether or not the distance to a detected object is within a specified preset range. If the distance is found to be within this range and if at least two specified conditions are satisfied, this object is regarded as a vehicle in the subsequent scans and a flag is set to this effect. One of these two conditions requires this object to have been judged as being a front going vehicle continuously over a time longer than a preset minimum time length. The second condition is that the difference between the distance to this object measured by a scan that is the highest or nearly the highest in the vertical direction and the measured distance to a front going vehicle corresponding to the object is within a predetermined range.

Abstract: In a laser detecting and ranging apparatus in which a light signal is intensity-modulated with a modulating frequency consisting of a frequency in the microwave band for thereby detecting a Doppler frequency relating to the modulating frequency, high reception sensitivity is realized.

Abstract: A monitoring device (1) for spatial areas (2) includes emitters (3) that emit radiation pulses that are reflected by objects located within the spatial areas (2) toward receivers (4). The receivers (4) are connected to a run time determining unit (9) with whose aid a distance image of an object within the spatial areas (2) can be generated. A selection unit (10) evaluates the distance images and generates a detection signal at an output (11) when predetermined distance values occur in the distance images.

Abstract: A contact free optical motion sensor for an inertial reference system. One or more image acquisition systems are adapted to produce a series of overlapping images of a gas bearing supported spherical inertial sensor assembly. A controller coupled to receive the series of overlapping images applies a delta detection algorithm to the series of overlapping images to determine the distance, the direction of movement of the inertial sensor assembly and the resulting relative position of the gas bearing supported spherical inertial sensor assembly. The controller further calculates the rotational velocity of the inertial sensor assembly based on a time sequence between the received series of image signals and the distance moved.

Abstract: Systems and methods for measuring stress in a specimen are provided. One system includes an optical subsystem configured to measure stress-induced birefringence in patterned structures formed on the specimen. In some embodiments, the optical subsystem may be configured as a spectroscopic ellipsometer, a multi-angle laser ellipsometer, a polarimeter, a polarized reflectometer, or some combination thereof. The system also includes a processor coupled to the optical subsystem. The processor is configured to determine stress in a material of the patterned structures using the stress-induced birefringence measurements. One method includes measuring stress-induced birefringence in patterned structures formed on the specimen using an optical technique. The method also includes determining stress in a material of the patterned structures using the stress-induced birefringence measurements.

Abstract: A CW lightwave modulated by a continuously reiterated pseudorandom (PN) code sequence is launched into an end of a span of ordinary optical fiber cable. Portions of the launched lightwave back propagate to the launch end from a continuum of locations along the span because of innate fiber properties including Rayleigh scattering. This is picked off the launch end and heterodyned producing a r.f. beat signal. The r.f. beat signal is processed by a plurality (which can be thousands) of correlator pseudonoise code sequence demodulation and phase demodulator units operated in different delay time relationships to the timing base of the reiterated modulation sequences. Pairs of outputs of the units are connected to respective substractor circuits, each providing a signal representative of a differential signal between acoustic, or other forms of, signals incident the bounds of virtual increments of the span.

Abstract: A system capable of determining wavefront characteristics, such as air induced wavefront aberrations, includes a field programmable gate array (FPGA) device executing a phase diversity algorithm. The FPGA device can be a stand-alone device or comprise multiple FPGAs. The device receives an “in-focus” and an “out-of-focus” image having a known optical difference from that of the “in-focus” image. The device then performs as many phase diversity algorithm iterations as desired to reach an expression for the wavefront aberrations induced on the collected image data. The resulting wavefront data may be used to produce an enhanced image of the original image data. Example applications include remote sensors and targeting systems, and both passive imaging and active projection systems that compensate for wavefront anomalies.

Abstract: Optical corrosion monitoring and detection systems as well as methods to detect and monitor corrosion under process conditions and generally in real time using electromagnetic radiation, particularly light. The systems generally provide for incident light to be allowed to reflect from a coating which is exposed to the corroding action of the process stream. As the coating is corroded, the intensity, or other function, of the incident light is changed and this change is detected and used to extrapolate a level of corrosion.

Abstract: An inspection system for inspecting an object, the system comprising an illuminator including at least one pulsed light source, a detector assembly, and a relative motion provider operative to provide motion of the object relative to the detector assembly, along an axis of motion, the detector assembly comprising a plurality of 2-dimensional detector units whose active areas are arranged at intervals.

Abstract: A problem in the inspection of transparent wafers and disks is the detection of top surface particles. More precisely, it is being able to assign a scattering site as being due to a particle at the top or bottom surface of a transparent wafer. A method of the present invention is to use an elliptical mirror, with a pinhole at its top focus, together with a focused beam. The focused beam will diverge as it passes through the transparent wafer and as a result any particle on the bottom surface will see a lower optical intensity and will appear weaker than a top surface particle. The suppression of scattered light from the bottom surface occurs because the source of the scattered light (the bottom surface) is far from the bottom foci of the elliptical mirror.

Abstract: A method for depth-resolved optical detection of a specimen comprises the steps of providing a scanning movement over the specimen or at least a part of the specimen of an illumination light distribution of at least one wavelength which is generated on or in the specimen, providing detection particularly of the light which is influenced based on interaction with the specimen, especially fluorescent light and/or reflected light and/or luminescent light and/or scattered and/or transmitted light, the illumination light having a modulation in at least one spatial direction, and carrying out the scanning movement and detection associated with the scanning with the scanning movement at least in a first and a second different phase position of the modulation and/or first and second frequency of the periodicity of the modulation and calculating at least one optical section image through the specimen or through part of the specimen. Other methods and arrangements are disclosed.

Abstract: A system and method for determining porosity of a material enables rapid testing of materials by detecting test particle penetration. The material is held by a test chamber wherein a test particle solution covers a surface of the material. The test chamber is pressurized to a predetermined pressure, predetermined temperature and for a predetermined time. After the pressure is released the test particle penetration/diffusion into the material is then detected through differential fluorescence of the test particle.

Abstract: A flat spatial response LIDAR apparatus for detecting particles within a short range is provided. The apparatus includes a light source projecting a light beam which is back-scattered by the particles to be detected. The back-scattered light is received, detected and analyzed. A spatial filter spatially filters the received back-scattered light in order to flatten the spatial response of the apparatus, so that a same concentration of particles at any distance within the short range will generate a signal of substantially the same intensity. This is for example accomplished by a properly profiled mask disposed in front of the detector, or a plurality of spatially distributed waveguides. As a result, the LIDAR apparatus can compensate for the 1/r2 dependence, or other dependences of the back-scattered light on the distance r.

Abstract: A system for determining polarization profiles of points in a scene from video frames using Stokes parameters includes a scene having a region that emits scene light rays that correspond to the points in the scene, a color filter, a Stokes filter that includes a rotating retarder having angular positions ?, and a first linear polarizer having a transmission axis, a correlator that emits a correlator light ray, and that comprises a uniform light source, a second linear polarizer, and a fixed retarder, a video camera having a video frame, and a computer system.

Abstract: A sample sequestering system which allows access to a subspace in a chamber encompassed generally enclosed space, for use in entering and removing a sample when the subspace is opened to atmosphere. Sufficient purge gas is flowed from within the generally enclosed space into the subspace discourage atmospheric contaminates from entering into the subspace. Contained within the generally enclosed space is a spectrophotometer, ellipsometer or polarimeter or the like system which operates at wavelengths, (eg. UV), which are adversely affected, (eg. absorbed), by typical atmospheric contents.

Abstract: An alignment device and method for delivering a light beam to an optical application, such as an optical trap having a pair of lenses with overlapping focal regions for trapping a particle therein. The alignment device includes a light source for generating a beam of light, a support member, an optical fiber, a collimating lens, and actuators. The optical fiber includes an input end for receiving the beam of light, and a generally rigid portion extending from the support member and terminating in a delivery end for emitting the beam of light. The collimating lens collimates the emitted beam of light. The actuators exert forces on the generally rigid portion such that it pivots about a pivot point of the optical fiber at the support member. The collimated beam of light pivots about an optical pivot point as the optical fiber pivots about the pivot point.

Abstract: An alignment apparatus 10 comprises a table 11 which is provided rotatably in a plane, and equipped with a loading plane 12A capable of sucking a wafer W, a shift mechanism 30 that moves the table 11 in the X- and Y-axis directions, and a sensor 50 that detects the position of the peripheral edge of the wafer W. The loading plane 12A is provided so as to come to a position inside the periphery of the wafer W. On the other hand, outside the table 11, a receiving member 15, which is positioned on the generally same plane as the loading plane 12A, is provided, and the receiving member 15 is provided with a plane configuration larger than the wafer W.

Abstract: Methods and apparatus for measuring an electromagnetic radiation response property associated with a substrate and calibrating an electromagnetic measurement device are disclosed. The methods and apparatus generate electromagnetic waves and capture a portion of the generated waves after the waves pass through a first polarized filter, reflect from a substrate, and pass through a second polarized filter arranged in a cross polar arrangement with respect to the first polarized filter. In addition, the apparatus captures electromagnetic waves that pass through an attenuating filter and reflect from one or more calibration standards. Digital data is determined from the captured electromagnetic waves. The digital data is used to recalibrate the apparatus.

Abstract: An imaging apparatus has input optics for obtaining a multispectral image bearing light and a programmable spectral switching section. The programmable spectral switching section has a first lens for directing light toward a dichroic separator that separates the multispectral image bearing light into a plurality of discrete spectral bands, each directed to an optical switch. Each optical switch is selectively enabled to redirect its corresponding spectral band back through the first lens as switched spectral band light. A light path selector element directs switched spectral band light toward an image forming section that has a sensor lens for directing switched spectral band light toward an image sensor. The image sensor forms image data according switched spectral band light from each optical switch. A control logic processor communicates with optical switches and with the sensor, providing instructions for enablement of optical switches and obtaining sensor data.

Abstract: Provided are an optical detection apparatus which can measure multi-channel samples at high speed and various wavelengths using an optical detector and a multi-channel sample analyzer employing the same. The optical detection apparatus includes an optical detector; a filter wheel having at least two color filters connected to each other in the shape of a disk; a plurality of optical channels through which a plurality of beams of light enter the filter wheel; and a mirror unit including a plurality of mirrors for sequentially reflecting the plurality of beams of light transmitted through the filter wheel to the optical detector, wherein the mirror unit rotates together with the filter wheel.

Abstract: A method and apparatus for optically interrogating a particle comprising obtaining a plurality of optical interrogations from a plurality of orientations relative the particle. In one aspect, the particle is tumbled relative to optical interrogation direction and reflected or transmitted energy is collected and added into a single spectrum that represents a complete spectral composition of the sample.

Abstract: A method and apparatus for optically interrogating a particle comprising obtaining a plurality of optical interrogations from a plurality of orientations relative the particle. In one aspect, the particle is tumbled relative to optical interrogation direction and reflected or transmitted energy is collected and weight of one or several seeds is derived.

Abstract: The present invention is directed to an article comprising a thermoplastic polymer film and a discontinuous metallic nanoparticle coating, of an average size less than 100 nm, and the process for preparing the same. The coated film may be further stretched or shrunk to shift the absorbance peak maximum to the desired degree. The coating is formed by depositing a discontinuous layer of metallic nanoparticles by a physical vapor deposition method.

Abstract: A process for parallel and automated evaluation of the blushing of multiple samples of dispersion films, comprising: providing an illuminated array of spatially separated samples of dispersion films, imaging the array of samples by means of CCD camera at different times and digitizing the images, automatically determining multiple brightness for each sample at different times from the different digitized images for at least a portion of the samples, determining values of a parameter characteristic of the kinetics of the blushing from the different brightnesses, and comparing the values of the characteristic parameter for individual samples.

Abstract: Fiber optic gyroscopes having integrated power measurement capabilities and related methods and apparatus. More particularly, fiber optic gyroscopes having an integrated method for determining the optical power by applying an electronic stimulated rate internal to the closed loop digital electronics of the gyroscopes and monitoring the counts out per second (COPS) using each gyroscope's counts output signal. Knowing a COPS value, the optical power can be determined by dividing a constant K by the COPS value, i.e. Optical Power=K/COPS. The value of K is specific to each gyroscope, and can be calculated or measured.

Abstract: An optical lens system includes a lens surface capable of forming concentric interference patterns on an object as if light emitted from a single light source were virtually emitted from two or more light sources within a plane containing an optical axis of the single light source.

Abstract: In general, in one aspect, the invention features a method for determining the location of an alignment mark on a stage including measuring a location, x1, of a stage along a first measurement axis using an interferometry system, measuring a location, x2, of the stage along a second measurement axis parallel to the first measurement axis, and determining a location of the alignment mark along a third axis parallel to the first measurement axis based on x1, x2, and a correction term, ?3, calculated from predetermined information including information characterizing imperfections in the interferometry system determined using the interferometry system and the stage.

Abstract: An anodizing system for forming a anodized coating on at least a portion of a substrate thereby creating an anodized substrate is disclosed. The anodizing system includes a bath, a coating thickness monitor, at least one probe and at least one controller. The coating thickness monitor includes at least one radiation source directed at at least a portion of the anodized substrate; at least one probe for capturing at least a portion of the radiation reflected and refracted by the anodized coating on the anodized substrate, the captured radiation being at least a portion of the radiation directed the anodized substrate from the radiation source; and at least one detector in communication with the at least one probe, the at least one detector capable of processing the captured radiation to allow a determination of at least the thickness.

Abstract: A position measuring device for detecting the spatial position of a movable element in relation to a base body, the device including a linear measuring device that measures a distance between a movable element and a base body and an angle-measuring apparatus that measures an angle between the movable element and the base body. A light source that directs light along a beam path, a detector within the beam path and a grating within the beam path between the light source and the detector. For measuring the angle, the beam path extends between the movable element and the base body so that an intensity strip pattern is created by illuminating the grating by the light source, whose position relative to the detector is a measure of the angle.

Abstract: A structure formed on a wafer can be examined by directing an incident pulse at the structure, the incident pulse being a sub-picosecond optical pulse. A diffraction pulse resulting from the incident pulse diffracting from the structure is measured. A characteristic of the profile of the structure is then determined based on the measured diffraction pulse.

Abstract: A surface of a dynamic object such as a polygon mirror is measured to determine configuration. In measuring the surface configuration, a light is emitted onto the surface, and interference stripes are analyzed to determine the surface configuration. In analysis of the interference stripes, a correct sign for the peak frequency is required so as to measure a configuration at a high precision level without much prior preparation. The correct sign is obtained in a substantially improved manner by using a relationship between the object light that has been reflected by an object to be measured and the reference light that has been emitted from the light source.

Abstract: A phase shifting interferometric method and apparatus comprises generating at least four different phase shifts and recording interferograms corresponding to the different phase settings and recording interferograms corresponding to the different phase settings. In the analysis of the recorded interferograms the generated phase shifts between the at least four different phase settings are determined from the measurement, i.e. from the recorded interferograms. A model simulating the interferogram intensities may be used for determining the phase shifts. The phase shifts are free adaptable parameters of the model.

Abstract: Beam shearing apparatus for introducing a lateral shear between the components of a light beam. The apparatus is an optical assembly having a polarizing interface and input and output facets and two reflecting surfaces one of which is arranged at an angle generally opposite the input facet and the other of which is arranged at an angle generally opposite the output facet.

Abstract: A method for calibrating a laser three-dimensional digitizing sensor. First, a three-dimensional coordinator X-Y-Z is defined and a calibrating surface is provided. Second, a first mapping table of a two-dimensional digital image to the Z axis is established by translating the calibrating surface along the Z axis. Subsequently, the calibrating surface rotates along the Y axis by a predetermined angle and translates along the Z axis to establish the second mapping table of the two-dimensional digital image and the X axis according to the first mapping table.

Abstract: An optical 3D digitizer with an enlarged non-ambiguity zone, comprising a structured light projector for projecting a fringe pattern over a target area, the fringe pattern having a shiftable position over the target area is disclosed. First and second cameras having overlapping measurement fields are directed toward the target area and positioned with respect to the projector to define distinct triangulation planes therewith. The second camera has a larger non-ambiguity depth than the first camera.