Abstract: The invention enables an abnormality of a temperature sensor to be simply detected. In S1, a temperature measurement is performed with each temperature sensor, and measured signals are digitalized to obtain a temperature value. Then, in S2, a detection temperature Tb? equivalent to a detected temperature of a corresponding temperature sensor is calculated with use of an arithmetic expression and a characterization factor stored in a parameter storage device, and in S3, an absolute value ?T of a temperature difference between Ta and Tb? is obtained. Subsequently, in S4, the calculated absolute value ?T is compared with a limit value ?, and when ?T is larger than the limit value ?, Ta or Tb is determined to be abnormal and an alert is issued with an alarm or the like in S5, followed by issuance of a command to a correcting device in S6 not to change a correction amount set before the abnormality occurs.

Abstract: An apparatus for the detection of a current in a protection and metering current range comprises one current sensor, which generates a voltage signal, and a voltage-limited electronic element. For metering voltage signals exceeding the upper metering voltage limit of the electronic element or for protection voltage signals exceeding the upper protection voltage limit of the electronic element an attenuation element with an attenuation factor being larger than unity is electrically connected to the current sensor. The attenuation factor is chosen in such a way that the metering voltage signal divided by the attenuation factor is smaller than or equal to the upper electronic element metering voltage limit or the protection voltage signal divided by the attenuation factor is smaller than or equal to the upper electronic element protection voltage limit.

Abstract: A camshaft phaser system includes an oil control spool valve having two opposing springs to center the spool at a rest position to lock the phaser rotor by blocking supply/vent to both the C1 and C2 chambers, obviating a conventional locking pin mechanism. A double-acting solenoid actuator moves the spool to first and second positions, supplying or venting C1 and C2, respectively. The rotor may be locked hydraulically at any position between full advance and full retard. A system for monitoring the rotational positions of the crankshaft and camshaft includes magnets disposed on opposite sides of the shaft axis. A magnetic sensing element senses the rotational direction of the magnetic field for each position of the shaft. An engine control module uses the position signal and an algorithm to lock the rotor at a desired position.

Abstract: A device and method for disclosing position of a positionable input by positioning the input over a range of positions to cause the magnitude of the directional component of a vector representing a field or force produced by a source to change from a reference magnitude or reference direction as the input is being positioned while an electric circuit that contains a sensor for sensing the directional component is changing the value of an electric signal for restoring the magnitude of the directional component being sensed by the sensor to the reference magnitude or reference direction, and using the value of the electric signal to disclose the position of the input.

Abstract: A method for evaluating a sensor signal provided by a magnetic field sensor which is arranged at a distance from an object which is rotatable about an axis of rotation is disclosed. The method includes defining an encoding pattern with a sequence of symbols, the sensor signal being dependent on the encoding pattern and at least one transmission parameter; regenerating the symbols of the encoding pattern from a corrected sensor signal using a threshold value detector to obtain an output signal; generating a filtered signal from the output signal using a filter having a plurality of filter coefficients; superposing the sensor signal and the filtered signal to obtain the corrected sensor signal; and wherein the corrected sensor signal and the output signal are used to estimate the at least one transmission parameter, and the filter coefficients are derived from the estimated transmission parameter.

Abstract: Systems and methods for magnetic field exposure indication. Exemplary embodiments include a magnetic field exposure indication system, including a main carrier body, a magnetic storage medium disposed on the main carrier body, an magnetochromic material indicator associated with the magnetic storage medium to indicate that the medium has been exposed to an a magnetic disruption, wherein the magnetochromic indicator is positioned on the main carrier body adjacent the magnetic storage medium where magnetic field disruption can be oriented to the magnetic storage medium and a comparison area disposed on the main carrier body, the comparison area including sample color regions illustrating the beginning color of an unexposed material and a color of the magnetochromic material indicator having been exposed to a magnetic disruption sufficient to damage the magnetic storage medium. Alternate exemplary embodiments include a magnetic disruption source to erase data stored on the magnetic storage medium.

Abstract: Disclosed is an assembly and method for locating magnetic objects or objects that can be magnetized, with the objects being located in non-magnetic media. To increase the detection depth for such objects and to clearly register their shape, position and structures on single detection planes, at least one sensor is arranged in a primary magnetic field of a magnetic field generator and the magnetization distribution of the magnetic field is uniform in the vicinity of the corresponding senor or its local profile is known.

Abstract: A system and method for measuring fluid flow in a wellbore in an earth formation using time-of-flight (TOF) sensing and remote detection nuclear magnetic resonance (NMR) techniques, by applying a magnetic field to the formation to polarize spins present in a portion of the formation, providing an encoding shell in the formation, selecting an encoding volume from the encoding shell, applying an encoding signal to excite the spins in the encoding volume, introducing a time delay to the encoding signal, providing a detection shell in the formation, applying a detection signal to the detection shell, detecting an NMR signal generated by the migration of spins from the encoding shell to the detection shell, and collecting TOF data corresponding to time elapsed from when a spin is encoded to when the spin reaches the detection shell.

Abstract: An apparatus and methods that can be used to determine various qualitative parameters of an earth formation from nuclear magnetic resonance (NMR) measurements. One embodiment provides a method of NMR-based remote sensing in which a nuclear spins in fluid of interest are encoded while inside an earth formation and then withdrawn into a tool module and analyzed by a sensor located in the tool module. Separate encoding and detection systems may be used, allowing each system to be independently optimized. In particular, because detection of the encoded spins may occur while the spins are inside the detector system, rather than within the earth formation (where they are encoded), the detector system may be constructed to employ a highly uniform magnetic field. This may facilitate various NMR measurements.

Abstract: With the objective of generating an imaging area including fluid with desired image quality at a subject and enhancing image quality, a first inversion recovery pulse is transmitted so as to invert spins in a second subject region which includes a first subject region used as the imaging area and is broader than the first subject region, before execution of a pulse sequence corresponding to an FSE method at every TR in an imaging sequence. After the execution of the pulse sequence corresponding to the FSE method, a second refocus pulse is transmitted so as to cause spins in a third subject region including the first subject region and wider than the first subject region to reconverge. A fast recovery pulse is transmitted to selectively recover spins in the first subject region. Thereafter, a second inversion recovery pulse is transmitted so as to invert the spins in the second subject region.

Abstract: An MRI apparatus includes a flexible upper RF coil unit having a plurality of coils which irradiate RF pulses or detect MR signals to or from an object, and a supporting unit configured to rotatably hold the RF coil unit at an upper end portion of the supporting unit, the coil unit supporting unit having a prescribed height so that the RF coil unit is placed at a position closely apart from the object. A lower portion of the supporting unit can be inserted in a guiding groove provided on an edge portion of the top plate. An upper portion of the supporting unit includes a rotatable joint member configured to rotatably hold one edge of the upper RF coil unit and a supporting arm extended from the rotatable joint member so as to support a lower surface of an edge portion of the upper RF coil.

Abstract: An NMR probe contains a metallic dewar for use in a high field magnet, the dewar characterized as having a major fraction of its inner wall made from an alloy whose weight composition includes at least 70% copper, less than 20% zinc, less than 10% nickel, less than 8% Cr, less than 4% Pb, less than 0.15% iron, less than 0.15% cobalt, and at least 3% from the set comprised of tin, silicon, aluminum, and chromium, and said inner wall further characterized as being plated with a pure metal on at least one surface.

Abstract: An integrated balun-low noise amplifier (LNA) system is included in a magnetic resonance imaging system. The integrated balun-LNA system conditions electromagnetic signals received from at least one RF receiver coil. The integrated balun-LNA system is configured to be enclosed in a balun housing. The size of the integrated balun-LNA system minimizes component area and volume thereof on or near the RF receiver coil and thus, minimizes interference with the magnetic flux field.

Abstract: A balun is included in a magnetic resonance imaging system. The balun conditions electromagnetic signals received from at least one RF receiver coil. The balun includes a balun shield having an integrated capacitor therein. The balun shield blocks unwanted feedback from effecting performance of any components contained within the balun shield.

Abstract: An NMR probe includes a coil former on which the resonant capacitance and/or tune and match capacitances are integrally implemented. Adjustable capacitances are realized in combination with a composite former including a slip glass for support of a capacitor plate. Particular advantages are realized in the context of cryostatic NMR probes.

Abstract: A magnetic resonance system has components that include a magnetic field generation unit for generation of a basic magnetic field, gradient coils for generation of a field gradient as well as a radio-frequency coil arrangement with a number of radio-frequency coils for transmission and reception of radio-frequency signals. These components can respectively be activated according to a sequence via at least one digital module and at least one analog module. The analog modules are arranged externally to a control computer controlling the digital modules. The digital modules also are arranged externally to the control computer and are associated with the analog module or modules controlled by said digital modules. A data network is provided for communication between the digital modules and the control computer and a synchronous network is provided for synchronization of the digital modules and the control computer.

Abstract: A magnetic resonance system for generation of magnetic resonance exposures of an examination subject in a patient positioning region has an antenna structure with a number of antenna elements arranged in the patient positioning region. Feed lines respectively supply the antenna elements with radio-frequency signals for emission of a radio-frequency field in the patient positioning region and/or to accept radio-frequency signals acquired by the antenna elements. The magnetic resonance system also has a radio-frequency shielding that shields an external region outside of the patient positioning region from radio-frequency signals radiated in the patient positioning region. This radio-frequency shielding has a number of feedthroughs through which the feed lines are respectively directed from the external region over a short distance to the antenna elements.

Abstract: A modular downhole apparatus to determine a formation property, the apparatus being incorporated into a drill string comprising one or more downhole tools and drill pipe, the drill pipe being of the same or various lengths, the modular downhole apparatus comprising a first module having one or more antennas, wherein the first module has connectors on both ends adapted to connect with the drill string; and a second module having one or more antennas, wherein the second module has connectors on both ends adapted to connect with the drill string; wherein the first module and the second module are spaced apart on the drill string; and wherein one or more of the one or more antennas of one or both of the modules has a dipole moment that is tilted or transverse.

Abstract: A method for measuring the resistivity of sea-bed formations is described. An electromagnetic field is generated using at least one stationary long-range transmitter. The frequency of the electromagnetic field is between and/or including the ULF/ELF range. At least one component of the electromagnetic field is measured. A conductivity distribution is determined based on the at least one measured component. The determined conductivity distribution is correlated with geological formations and/or hydrocarbon deposits.

Abstract: A method and apparatus are provided for detecting and transmitting geophysical data from a plurality of electrodes inserted into the soil utilizing a set of identical dynamically reconfigurable voltage control units located on each electrode and connected together by a communications and power cable. A test sequence is provided in each voltage control unit. Each voltage control unit records data measurements for transmission to a central data collector. Each voltage control unit incorporates and determines its positional relationship to other voltage control units by logging when the unit is attached to the electrode. Each voltage control unit I equipped with a magnetic switch for detecting when they are in contact with the electrode.

Abstract: A testing device for determines values of various electrical variables associated with a device within a process system. The testing device provides bidirectional electrical communication with a device to be monitored and automatically provides a connection configuration between a processing unit and a set of input/output ports. The connection configuration governs a bidirectional flow of electrical signals between the processing unit and the device to be monitored. The processing unit outputs a test signal and a configuration control signal to the input/output port control circuitry. The input/output port control circuitry, in response to received test and configuration control signals, automatically provides a connection configuration to direct the test signal to the device to be monitored and to direct a return signal, the return signal being generated by the monitored device in response to the test signal, to the processing unit.

Abstract: The present invention relates to a measurement arrangement for determining the characteristic line parameters by measuring the S-parameters as a function of the frequency of an electrical signal line that achieves an increased measurement bandwidth, namely a measurement bandwidth >4 GHz. To achieve this the electrical signal line under test has several neighboring signal lines which are connected to ground on one side and left open on the opposite side in an alternating manner.

Abstract: A semiconductor die includes proximity connectors proximate to a surface of the semiconductor die. This semiconductor die is configured to communicate signals with another semiconductor die via proximity communication through one or more of the proximity connectors. In particular, the proximity connectors include a first group of proximity connectors that is configured to facilitate determining a first separation between the semiconductor die and the other semiconductor die by comparing coupling capacitances between the semiconductor die and the other semiconductor die. Note that the first group of proximity connectors includes a first proximity connector and a second proximity connector, and the second proximity connector at least partially encloses an in-plane outer edge of the first proximity connector.

Abstract: A device for detecting the state of steel-reinforced concrete construction parts, having one or more sensor wires disposed at different distances from a surface of the concrete construction part. The wires are subjected to the corroding influence of the environment of the concrete construction part. The device also includes a measuring instrument, which measures the volume resistance of the sensor wires and an evaluating device, which can supply the measurement values of the measuring instrument either permanently and/or when called up, and which, evaluating from these values, draws conclusions on the depth-dependent corrosion state of the concrete construction part.

Abstract: A method and apparatus for characterising a three phase transformer (3) using a single phase power supply (1). Pairs of input terminals (H0-H3) of the transformer are sequentially energised for each energisation and the voltage between pairs of output terminals (x0-x3) of the transformer are measured. Measured voltages are processed in order to characterise the winding configuration of the transformer. Either simultaneously or subsequently the presence of neutrals on the primary and/or secondary side of the transformer are identified to enable the winding configuration to be further characterised. Subsequently any phase displacement of the transformer is determined.

Abstract: The invention is directed to an on-chip probing apparatus. In accordance with an embodiment of the present invention, the on-chip probing apparatus includes: a plurality of switches on a chip; a plurality of externally accessible probe points on the chip; and a multiplexer for controlling the plurality of switches to selectively couple an output signal of the chip to one of the plurality of probe points.

Abstract: A contacting component has a probe contact formed by plating and adapted to be contacted with a target portion. The contacting component includes an insulating substrate, a conductive circuit formed on one surface of the insulating substrate, and the probe contact is made of a conductive material and formed on the other surface of the insulating substrate. The conductive circuit and the probe contact are electrically connected in a through hole penetrating the insulating substrate. The probe contact includes a bump contact of a convex shape, the bump contact is formed by plating and having a surface which has a shape of a semispherical protrusion to be contacted with the target portion. The bump contact is made of a material containing a metal and carbon, the content of carbon falling within a range between 0.2 at % and 1.2 at %, both inclusive.

Abstract: A probe card of a semiconductor test apparatus includes a printed circuit board (PCB) in which a signal wiring and a first ground plate are provided, a needle fixture mounted at the PCB and provided to fix a plurality of needles, a second ground plate provided at the needle fixture, a plurality of signal lines connecting the signal wiring to the plurality of needles corresponding to the signal wiring, a plurality of ground lines connecting the first ground plate to the second ground plate and corresponding to the plurality of signal lines, and a connecting electrode connecting the first ground plate to the second ground plate. A method of fabricating the same is also provided.

Abstract: A broken trim die tool detection sensor. The lands of the tie bar die connect with the leads of the unit to form switches. The states of these switches indicate broken die lands or other malfunctions.

Abstract: An electronic element testing apparatus for use with a number of probes. Each probe has a lower pole and an upper pole. The apparatus includes: a first plate having a first side and a second side, the first side having an array of lower pole regions disposed thereabout, each lower pole region configured to receive a lower pole of a probe; and a plurality of signal conductor regions disposed proximate the array of lower pole regions, each signal conductor region arranged to provide a non-cable electrical path between a lower pole region and a switching circuit. The switching circuits are operable to sequentially connect each electronic element to a testing circuit via the upper and lower poles.

Abstract: Probes in a plurality of DUT probe groups can be connected in parallel to a single tester channel. In one aspect, digital potentiometers can be used to effectively switch the tester channel from a probe in one DUT probe group to a probe in another DUT probe group. In another aspect, switches in parallel with a resistor can accomplish such switching. In yet another aspect, a chip select terminal on each DUT can be used to effectively connect and disconnect internal DUT circuitry to the tester channel. Multiple DUT probe groups so connected can be used to create different patterns of DUT probe groups for testing different patterns of DUTs and thus facilitate sharing tester channels.

Abstract: A contactor configured to be electrically connected to the terminals of an electronic component is disclosed. The connector includes multiple contact electrodes contacting the terminals of the electronic component and multiple elastic electrodes each composed of an electrically conductive elastic body. The elastic electrodes generate a pressing force for pressing the contact electrodes against the terminals of the electronic component. The contact electrodes are separable from the elastic electrodes.

Abstract: A wafer-level test module is disclosed to include a base layer having multiple first apertures spaced from one another at a pitch corresponding to the pitch of the image sensor chips of an integrated circuit wafer, a cover layer having second apertures respectively axially aimed at the first apertures, and an optical layer sandwiched between the base layer and the cover layer having multiple optical lenses of which the optical axes pass through the first apertures and the second apertures, so that when one image capturing device of the image sensor chips of an integrated circuit wafer is adjusted to the image plane of one of the optical lenses and the wafer-level test module is set in alignment with the integrated circuit wafer horizontally and vertically, then the effective test light can be simultaneously projected onto the image capturing devices of the respective image sensor chips through the wafer-level test module to achieve an effective wafer-level test on multiple image sensor chips of the integrated

Abstract: A test fixture, for testing an electronic device, includes: a test platform including electrically conductive contacts protruding from a device receiving surface in the test platform; a positioning guide disposed on the device receiving surface; a device retention cover; where the test platform includes a platform magnetic member and the retention cover includes a cover magnetic member, the platform magnetic member and the cover magnetic member being mutually magnetically attractive. A method of producing an electronic device including: preparing the test fixture, for testing the electronic device; placing the electronic device using the at least one device positioning guide disposed on the device receiving surface; and placing the device retention cover upon the electronic device to apply a force to the electronic device.

Abstract: Electrical characteristics of a wafer are tested using a probe card while the wafer is placed on a wafer chuck. The wafer chuck cools the wafer to a predetermined temperature to test the electrical characteristics of the wafer at the normal temperature. Inside the wafer chuck, a plurality of thermoelectric elements are disposed in parallel with the top surface of the wafer chuck and current is applied to the thermoelectric elements. The thermoelectric elements heat or cool the wafer according to the direction of the applied current. The wafer chuck may heat the wafer to a predetermined temperature to test the electric characteristics of the wafer at a high temperature. The top surface of the wafer chuck may be heated by a heating coil installed on the wafer chuck.

Abstract: A system and method for testing devices. The system includes a plurality of pads and a decoder coupled to a plurality of devices. The decoder is configured to receive a plurality of selection signals from the plurality of pads and select a device from the plurality of devices based on at least information associated with the plurality of selection signals. Additionally, the system includes one or more pads connected to the selected device. At least one of the one or more pads is not connected to any of the plurality of devices other than the selected device. The one or more pads are used for testing the selected device.

Abstract: An integrated circuit (70) having parallel scan paths (824-842, 924-942) includes a pair or pairs of scan distributor (800,900) and scan collector (844,944) circuits. The scan paths apply stimulus test data to functional circuits (702) on the integrated circuit and receive response test data from the functional circuits. A scan distributor circuit (800) receives serial test data from a peripheral bond pad (802) and distributes it to each parallel scan path. A scan collector circuit (844) collects test data from the parallel scan paths and applies it to a peripheral bond pad (866). This enables more parallel scan paths of shorter length to connect to the functional circuits. The scan distributor and collector circuits can be respectively connected in series to provide parallel connections to more parallel scan paths. Additionally multiplexer circuits (886,890) can selectively connect pairs of scan distributor and collector circuits together.

Abstract: An adapter frame is configured to receive a non-native test instrument module and is further configured for coupling within a test head of automatic semiconductor device test equipment. The adapter frame includes interfaces for operatively connecting the test instrument module to the test head using the existing slots of the test head. Interfaces may include mechanical interfaces, such as liquid cooling interfaces and other suitable interfaces. Additional software and/or hardware components may be included on the adapter frame to integrate the non-native test instrument module into the existing test equipment.

Abstract: A method and apparatus for testing a liquid crystal display device are provided to detect a defect location precisely and rapidly without requiring a jig. The method includes providing an inspection apparatus as a removable portion of the liquid crystal display device; inspecting the display part of the liquid crystal display device using the inspection apparatus; removing the inspection apparatus from the liquid crystal display device after the inspection is completed; and attaching driving circuits to the liquid crystal display device having the inspection apparatus removed therefrom.

Abstract: A semiconductor integrated circuit for receiving a signal having been propagated through a transmission line, has a control circuit that controls on/off of a first to fourth switching circuits, wherein the control circuit turns off the first switching circuit and the second switching circuit and turns on the third switching circuit and the fourth switching circuit in a test operation mode for measuring a resistance value of the terminator resistor, and the control circuit turns on the first switching circuit and the second switching circuit and turns off the third switching circuit and the fourth switching circuit in a normal operation mode for a normal operation.

Abstract: A logic signal isolator including a micro-transformer with a primary winding and a secondary winding. A transmitter circuit drives the primary winding in response to a received input logic signal such that, in response to a first type of edge in the logic signal, at least a first amplitude signal is supplied to the primary winding and, in response to a second type of edge in the logic signal, a second different amplitude signal is supplied to the primary winding. A receiver circuit receives corresponding first amplitude and second amplitude signals from the secondary winding and reconstructs the received logic input signal from the received signals.

Abstract: A reference output circuit for generating an output clock signal for driving signals off of an integrated circuit chip uses a switched terminated load in combination with an output buffer to generate a feedback clock signal, which is used, in combination with a reference input clock signal, to generate the output clock signal. The switched terminated load uses transistors having the same size as transistors in the output buffer. The switched terminated load draws the same DC current as the output buffer. As a result, the switched terminated load and the output buffer have the same electro-migration performance. Pull-up and pull-down MOS impedances of the switched terminated load are easily adjusted during switching periods of the switched terminated load. The design of the switched terminated load minimizes variations in the terminated load impedance due to MOS impedance variations.

Abstract: A device for a line termination of two-wire lines having at least one first and second terminating resistant between the two wires is provided, the first and the second terminating resistors being connected in series, and at least one switching arrangement being provided between the two terminating resistors.

Abstract: Embodiments of early enabling synchronous elastic designs, devices and methods are presented herein.

Abstract: An FPGA architecture has top, middle and low levels. The top level of the architecture is an array of the B16×16 tiles arranged in a rectangular array and enclosed by I/O blocks on the periphery. On each of the four sides of the B16×16 tile, and also associated with each of the I/O blocks is a freeway routing channel. A B16×16 tile in the middle level of hierarchy is a sixteen by sixteen array of B1 blocks. The routing resources in the middle level of hierarchy is are expressway routing channels M1, M2, and M3 including groups of interconnect conductors. At the lowest level of the semi-hierarchical FPGA architecture, there are block connect (BC) routing channels, local mesh (LM) routing channels, and direct connect (DC) interconnect conductors. Each BC routing channel is coupled to an expressway tab to provide access for each B1 block to the expressway routing channels M1, M2, and M3, respectively.

Abstract: A logic gate is described that implements complex logic within a memory array. The logic gate receives at least three of a first storage cell signal, a second storage cell signal, a first external signal, or a second external signal at a first input circuitry and second input circuitry. The logic gate then performs one of a set of logic functions using the first storage cell signal, the second storage cell signal, the first external signal, or the second external signal. The set of logic functions includes at least one of a matching function, an OR-AND function, or an AND function.

Abstract: A system and method for implementing a state machine including a plurality of states, the state machine configured to transition from a present state to a next state in response to input. One embodiment of the system includes a plurality of state elements, each of the plurality of state elements representing one of the plurality of states of the state machine, each of the plurality of state elements receiving an on signal, an off signal, and a synchronizing signal, each of the state elements outputting a state value, each of the plurality of state elements further including a logic element to store a temporary state value, wherein the state value is updated by the temporary state value in response to the synchronizing signal, and wherein the state value of each of the plurality of state elements is synchronously updated in response to the synchronizing signal.

Abstract: A dedicated hardware block is provided for implementing crossbars and/or barrel shifters in programmable logic resources. Crossbar and/or barrel shifter circuitry may replace one or more rows, one or more columns, one or more rectangles, or any combination thereof of programmable logic regions on a programmable logic resource. The functionality of the crossbar and/or barrel shifter circuitry can further be improved by implementing time-multiplexing.

Abstract: A semiconductor integrated circuit device upon exiting from a low power mode, wakes up and re-initializes logic circuits so as to restore previous logic states of internal registers without disturbing input-output (I/O) configuration control and data states present at the time the low power mode was entered. Thus not distributing the operation of other devices connected to the semiconductor integrated circuit device previously in the low power mode. Once all internal logic and registers of the semiconductor integrated circuit device have been re-initialized, a “low power state wake-up and restore” signal may issue. This signal indicates that the I/O configuration control and data states stored in the I/O keeper cell at the time the integrated circuit device entered into the low power mode have been reinstated and control may be returned to the logic circuits and/or internal registers of the semiconductor integrated circuit device.

Abstract: A semiconductor integrated circuit device upon exiting from a low power mode, wakes up and re-initializes logic circuits so as to restore previous logic states of internal registers without disturbing input-output (I/O) configuration control and data states present at the time the low power mode was entered. Thus not distributing the operation of other devices connected to the semiconductor integrated circuit device previously in the low power mode. Once all internal logic and registers of the semiconductor integrated circuit device have been re-initialized, a “low power state wake-up and restore” signal may issue. This signal indicates that the I/O configuration control and data states stored in the I/O keeper cell at the time the integrated circuit device entered into the low power mode have been reinstated and control may be returned to the logic circuits and/or internal registers of the semiconductor integrated circuit device.