Abstract: An electric oven has an air passage structure that is designed to effectively cool down electric components. The air passage structure quickly cools down a variety of electric components on a top surface of a cavity using air introduced from outside the oven. The oven has a series of passages and openings allowing the effective movement of air past the electric components and through the oven.

Abstract: A heating plate for a substrate support assembly in a semiconductor plasma processing apparatus, comprises multiple independently controllable planar heater zones arranged in a scalable multiplexing layout, and electronics to independently control and power the planar heater zones. A substrate support assembly in which the heating plate is incorporated includes an electrostatic clamping electrode and a temperature controlled base plate. Methods for manufacturing the heating plate include bonding together ceramic or polymer sheets having planar heater zones, power supply lines, power return lines and vias.

Abstract: In general, this disclosure describes example techniques for a flexible heater system to automatically configure itself to operate over different input supply voltages. The flexible heater system may include a flexible heater that includes a first heater element and a second heater element. The flexible heater system may also include a switch circuit that may automatically couple the first heater element and the second heater element in a first configuration when an input supply voltage is at a first voltage level. The switch circuit may also automatically couple the first heater element and the second heater element in a second configuration when the input supply voltage is at a second voltage level.

Abstract: An electrical heating device includes at least one heat generating element and at least one heat emitting element having opposed surfaces that abut the heat generating element. The heat generating element includes at least one PTC heating element having strip conductors on both sides of it for the electrical supply of the PTC heating element At least one of the strip conductor is provided with at least one contact projection which protrudes beyond a PTC heating element locating face formed on the strip conductor. Also disclosed is a heat generating element having at least one strip conductor provided with at least one contact projection.

Abstract: A temperature controlled heatable object is provided in which a temperature sensor is connected to a Radio Frequency Identification (RFID) tag. The RFID tag is located within the handle of the object, and the temperature sensor is placed in contact with the object. In a first embodiment of the invention, the temperature sensor is partially imbedded within the object via a notch located in the side of the object. In a second embodiment of the invention, a temperature sensor is imbedded within a tunnel drilled within the base of the object. In a third embodiment, a temperature sensor is imbedded between the bottom of the object and a slab attached to the bottom of the object. The sensor can be located in a slot formed in either the slab or the bottom or the object. Handles and receivers for mounting the handles to the temperature controllable objects are also provided.

Abstract: A method for determining a position of a device in a reference coordinate system. The method including: receiving, at the device, less than all of GPS signals necessary to determine the position of the device in the reference coordinate system; transmitting a signal from a? illuminating source defined in the reference coordinate system; receiving the signal at a cavity waveguide disposed on the device; and determining the position of the device in the reference coordinate system based on the GPS signals and the signal received in the cavity waveguide. The signal received in the cavity waveguide can also be used to confirm a position determined by the GPS signals.

Abstract: An imaging apparatus is realized which enables a thin finger vein authentication apparatus having a thickness installable in a portable information device. A light beam emitted from an object passes through a visible light cut-off filter 20 and enters a pre-focus lens array 11. The pre-focus lens array 11 focuses the light beam on an opening of a micro aperture array 15. The light beam passed through the micro aperture array 15 diverges, but it is focused with the post-focus lens array 13 on the light detection device 30. With this structure, a thin imaging apparatus can be obtained with maintained resolution, and a finger authentication apparatus installable in a portable information device can be realized.

Abstract: An image sensor architecture provides an SNR in excess of 100 dB, without requiring the use of a mechanical shutter. The circuit components for an active pixel sensor array are separated and arranged vertically in at least two different layers in a hybrid chip structure. The top layer is preferably manufactured using a low-noise PMOS manufacturing process, and includes the photodiode and amplifier circuitry for each pixel. A bottom layer is preferably manufactured using a standard CMOS process, and includes the NMOS pixel circuit components and any digital circuitry required for signal processing. By forming the top layer in a PMOS process to optimized for forming low-noise pixels, the pixel performance can be greatly improved, compared to using CMOS. In addition, since the digital circuitry is now separated from the imaging circuitry, it can be formed using a standard CMOS process, which has been optimized for circuit speed and manufacturing cost.

Abstract: A driver assistance system for a vehicle includes an imager and a control having an image processor. The imager is disposed at or proximate to an in-cabin portion of a windshield of a vehicle and has a forward field of view to the exterior of the vehicle through the vehicle windshield. The driver assistance system identifies objects in the forward field of view of the imager via processing of captured image data by the image processor. At least in part responsive to processing of captured image data by the image processor, a determination is made that the vehicle is being operated in an urban environment. Responsive to the determination that the vehicle is being operated in an urban environment, operation of a driver assistance function of the vehicle is inhibited.

Abstract: An object is to provide a photosensor utilizing an oxide semiconductor in which a refreshing operation is unnecessary, a semiconductor device provided with the photosensor, and a light measurement method utilizing the photosensor. It is found that a constant gate current can be obtained by applying a gate voltage in a pulsed manner to a transistor including a channel formed using an oxide semiconductor, and this is applied to a photosensor. Since a refreshing operation of the photosensor is unnecessary, it is possible to measure the illuminance of light with small power consumption through a high-speed and easy measurement procedure. A transistor utilizing an oxide semiconductor having a relatively high mobility, a small S value, and a small off-state current can form a photosensor; therefore, a multifunction semiconductor device can be obtained through a small number of steps.

Abstract: An apparatus and method for measuring optical forces acting on a trapped particle. In one implementation the apparatus and method are adaptable for use in the optical train of an optical microscope that is configured to trap, with a single light beam, a particle suspended in a suspension medium between an entry cover and an exit cover of a chamber positioned on or within the microscope. The apparatus and method involves the use of a single collection lens system having a numerical aperture designed to be greater than or equal to an index of refraction index of the suspension medium intended to suspend the particle in the chamber which is placeable at or near the exit cover of the chamber of the microscope.

Abstract: A rotary position encoder for determining a rotary position of a shaft includes a rigid substrate having a planar surface and mounted on the shaft to rotate with the shaft; an optical disk having at least a transparent polycarbonate layer and a reflective layer on the transparent polycarbonate layer, affixed to the planar surface of the substrate, the optical disk having a first circumferential track encoded therein having binary data; an optics assembly for interrogating the optical disk and providing an output signal indicative of data received from the interrogation of the optical disk; and a tracking motor for driving the optics assembly radially with respect to the optical disk.

Abstract: A miniaturized optical encoder capable of obtaining a sufficient amount of light in the light receiving element is provided. An optical encoder 1 includes a scale 2 having a scale track 2? and a readhead 3 having a light source 31 that emits light to the scale track 2?, a scale-side lens 32 that transmits the light emitted from the light source 31 to the scale track 2?, and a light receiving element 33 that receives the light reflected by the scale track 2? through the scale-side lens 32. The light source 31 is arranged between the scale-side lens 32 and the light receiving element 33. An optical axis Lsrc of the light source 31 is matched with an optical axis Ls of the scale-side lens 32 in a reading direction of the scale 2 and is separated from an optical axis Ls of the scale-side lens 32 by a predetermined distance D in a direction perpendicular to the reading direction of the scale 2.

Abstract: A through casing formation evaluation tool string 1000, 2000, 3000 including a conveyance string 100, a sonic array tool 200, a pulsed neutron tool 400 and one or more downhole memory modules 160, 540, 550. A method of through casing formation evaluation and casing and cementing integrity evaluation includes lowering a tool string into a cased wellbore; concurrently collecting data with the sonic array tool and pulsed neutron tool and transmitting at least a portion of the collected data via a conveyance string to a CPU located at the surface of the earth; storing a portion of the collected data in a memory module disposed in the tool string; removing the tool string from the wellbore; processing the collected data in the CPU to obtain selected rock property data about the one or more of the geologic formations and/or cement integrity.

Abstract: An apparatus can measure characteristics of a formation surrounding a borehole. The apparatus includes a tool body having a neutron measurement section. The neutron measurement section includes a neutron source and a neutron detector arrangement spaced in an axial direction from the neutron source The apparatus also includes a density measurement section having a gamma ray source and a gamma ray detector arrangement spaced in an axial direction from the gamma ray source. The neutron measurement section and the density measurement section are positioned in the tool body so that the sections overlap in the axial direction and are azimuthally spaced apart in the tool body. The tool body also includes shielding to block a direct signal path from the neutron source to the gamma ray detector arrangement and to block a direct signal path from the gamma ray source to the neutron detector arrangement.

Abstract: To provide a method that reduces an influence of dependence of an ionizing beam in an incident direction or uneven irradiation to a sample on a result of mass spectrometry, and can measure mass distribution with high reliability. A mass distribution measuring method according to the present invention includes: changing a direction of irradiating the ionizing beam to a sample surface; acquiring a plurality of mass distribution images in a plurality of incident directions; performing image transform of the mass distribution images according to an angle formed by an incident direction of the ionizing beam and a substrate surface; synthesizing the plurality of transformed images; and outputting the synthesized mass distribution images.

Abstract: All data obtained from an A/D converter during a summation period with values exceeding a prescribed threshold is excluded from summation up to a prescribed maximum number of deletions, and the values of the remaining data are summed to find one piece of measurement data corresponding to that summation period. The number of pieces of noise data reflecting the influx of particles that cause spike-like noise is extremely small, so noise data is removed in a state in which there are no signals and no target ions are present. When target ions are present, legitimate data which is not noise data may be removed, but the number of pieces of removed data is small in comparison to the total number of pieces of data, so the effects of the removal of legitimate data essentially do not emerge in the summation results. It is therefore possible to effectively reduce spike-like noise.

Abstract: In a first-stage intermediate vacuum chamber, cluster ions causing a background noise are dominantly formed in area (A), while fragment ions are dominantly generated in area (B). Taking this fact into account, in an in-source CID analysis mode, a DC voltage higher than that applied to a skimmer is applied to a first ion guide so as to create an accelerating electric field in area (B), whereby the ions are sufficiently energized to promote the fragmentation. When the in-source CID is not performed, a DC voltage higher than that applied to the first ion guide is applied to the exit end of a desolvation tube so as to create an accelerating electric field only in area (A) without creating such a field in area (B), whereby both the formation of the cluster ions and the generation of the fragment ions are suppressed, so that a high-quality chromatogram can be obtained.

Abstract: Methods and systems to compensate for distortions created by dynamic voltage applied to an electron multiplier used in mass spectrometry. An electron multiplier has a cathode end accepting ion flow, an opposite emitter end and an interior surface. The electron multiplier produces an electron output from ions colliding with the interior surface. A variable power supply has a voltage output coupled to the cathode end and the emitter end of the electron multiplier. The voltage output changes dynamically to adjust the electron output from the electron multiplier. An anode is located in proximity to the electron multiplier. An electrometer is coupled to the anode in proximity to the electron multiplier to measure the current generated by the electron output. A low pass filter circuit is coupled to the emitter end to the ground of the electrometer to attenuate emitter voltage changes. A bias circuit is coupled to the emitter end to stabilize emitter to anode voltage difference.

Abstract: Sample excitation apparatus for a spectrometric analyzer, the apparatus comprising a sample introduction stage comprising an electrospray nebulizer for generating a nebulized sample; and a sample excitation stage arranged to operate in an atmospheric pressure environment and to receive and excite the nebulized sample in a sample excitation region for spectrometric analysis thereof. ‘Excitation’ includes ionization in ICP and MIP, flame excitation in AES, and optical excitation in AAS. For example, analyte solution (38) is fed out of the outlet end of a capillary (30,40,60,96), to a plasma source. A potential difference is applied between the capillary, its outlet end or the analyte solution and an opposing effective (counter) electrode, which may comprise a tube (64), a grid (80), or the plasma (34) itself, to promote formation of smaller droplets (46). The pressure of the plasma source is similar to the pressure in the region of the capillary outlet end.

Abstract: A system and method for laser desorption of an analyte from a specimen and capturing of the analyte in a suspended solvent to form a testing solution are described. The method can include providing a specimen supported by a desorption region of a specimen stage and desorbing an analyte from a target site of the specimen with a laser beam centered at a radiation wavelength (?). The desorption region is transparent to the radiation wavelength (?) and the sampling probe and a laser source emitting the laser beam are on opposite sides of a primary surface of the specimen stage. The system can also be arranged where the laser source and the sampling probe are on the same side of a primary surface of the specimen stage. The testing solution can then be analyzed using an analytical instrument or undergo further processing.

Abstract: A novel system and methods for accelerating analytes including, without limitation, molecular ions, biomolecules, polymers, nano- and microparticles, is provided. The invention can be useful for increasing detection sensitivity in applications such as mass spectrometry, performing collision-induced dissociation molecular structure analysis, and probing surfaces and samples using accelerated analyte.

Abstract: Methods and analysers useful for time of flight mass spectrometry are provided.

Abstract: A mass spectrum is acquired by accumulating parent ions in an ion trap, ejecting parent ions of a selected m/z ratio into a collision cell, producing fragment ions from the parent ions, and analyzing the fragment ions in a mass analyzer. The other parent ions remain stored in the ion trap, and thus the process may be repeated by mass-selectively scanning parent ions from the ion trap. In this manner, the full mass range of parent ions or any desired subset of the full mass range may be analyzed without significant ion loss or undue time expenditure. The collision cell may provide a large ion acceptance aperture and relatively smaller ion emission aperture. The collision cell may pulse ions out to the mass analyzer. The mass analyzer may be a time-of-flight analyzer. The timing of pulsing of ions out from the collision cell may be matched with the timing of pulsing of ions into the time-of-flight analyzer.

Abstract: An ion trap includes a containment region for containing ions, and a plurality of electrodes positioned on a regular polyhedral structure encompassing the containment region. An electrode is positioned on each vertex of the encompassing structure and at least one of the polygonal surfaces includes additional electrodes configured to form a plurality of quadrupoles on the surface. Alternating RF voltage is applied to the plurality of electrodes, so that directly neighboring electrodes are of equal amplitude and opposite polarity at any point in time. This configuration on the polyhedral structure forms a potential barrier for repelling the ions from each of the regular polygonal surfaces and containing them in the trap. Mass selective filters can be formed from the quadrupoles for parallel mass analysis in different m/z windows. Application of a small DC potential to a plate electrode outside the quadrupoles preferentially depletes single charged ions for enhanced signal-to-noise analysis.

Abstract: The invention comprises a charged particle beam acceleration, extraction, and/or targeting method and apparatus used in conjunction with charged particle beam radiation therapy of cancerous tumors. Novel design features of a synchrotron are described. Particularly, turning magnets, edge focusing magnets, concentrating magnetic field magnets, winding and control coils, flat surface incident magnetic field surfaces, and extraction elements are described that minimize the overall size of the synchrotron, provide a tightly controlled proton beam, directly reduce the size of required magnetic fields, directly reduces required operating power, and allow continual acceleration of protons in a synchrotron even during a process of extracting protons from the synchrotron.

Abstract: Provided is a cross-section processing and observation apparatus, including a control portion for repeatedly executing a process including slice processing by an ion beam and acquisition of a SIM image by a secondary electron emitted from a cross-section formed by the slice processing, in which the control portion divides an observation image into a plurality of areas, and finishes the process when a change has occurred between an image in one area of the plurality of areas and an image in an area, which corresponds to the one area, of an observation image of another cross-section acquired by the process.

Abstract: Provided is a high-resolution scanning electron microscope with minimal aberration, and equipped with an electro-optical configuration that can form a tilted beam having wide-angle polarization and a desired angle, without interfering with an electromagnetic lens. In the scanning electron microscope, an electromagnetic deflector (201) is disposed above a magnetic lens (207), and a control electrode (202) that accelerates or decelerates electrons is provided so at to overlap (in such a manner that the height positions overlap with respect to the vertical direction) with the electromagnetic deflector (201). In wide field polarization, electrodes are accelerated, and in tilted beam formation, electrons are decelerated.

Abstract: The invention relates to a blocking member to be placed in the diffraction plane of a TEM. It resembles the knife edge used for single sideband imaging, but blocks only electrons deflected over a small angle. As a result the Contrast Transfer Function of the TEM according to this invention will equal that of a single sideband microscope at low frequencies and that of a normal microscope for high frequencies. Preferable the highest frequency blocked by the blocking member is such that a microscope without the blocking member would show a CTF of 0.5.

Abstract: A case constituting a cassette-type detector has a first lid member which closes an opening of the case arranged therein. An exterior wall hole is provided to a corner section of the first lid member. This makes it possible to detect appropriate radiological images all the time since even if an unexpected shock is applied to the corner section, the shock is absorbed by the deformation of the corner section to prevent the damage of the built-in detection unit of the cassette-type detector.

Abstract: An infrared light detector has a first substrate having a sensor chip thereon that has an exposure surface that can be irradiated with infrared light, the sensor chip converting the incident infrared light into an electrical signal. The infrared light detector also has a second substrate having a window therein that is located adjacent to the exposure surface of the sensor chip, the window masking infrared light of a predetermined wavelength. The size (dimensions) of the window and the distance of the window with respect to the exposure surface are dimensioned to cause infrared light passing through the window to completely strike the exposure area of the sensor chip.

Abstract: In certain embodiments, a system may include a sensor platform, a cold shield, and a support system. The sensor platform supports a sensor system. The cold shield allows first radiation to reach the sensor system and prevents second radiation from reaching the sensor system. The support system is coupled to the cold shield and the platform, and supports the cold shield and maintains a separation between the cold shield and the platform.

Abstract: In a scintillator used for radiation detection, such as an X-ray CT scanner, a scintillation crystal body having a unidirectional phase separation structure is provided which has a light guide function for crosstalk prevention without using partitions. The phase separation structure includes a first crystal phase and a second crystal phase having a refractive index larger than that of the first crystal phase and which have a first principal surface and a second principal surface, these principal surfaces being not located on the same plane, the first principal surface and the second principal surface have portions to which the second crystal phase is exposed, and a portion of the second crystal phase exposed to the first principal surface and a portion of the second crystal phase exposed to the second principal surface are connected to each other.

Abstract: A radiation detection system can include optical fibers and a material disposed between the optical fibers. In an embodiment, the material can include a fluid, such as a gas, a liquid, or a non-Newtonian fluid. In another embodiment, the material can include an optical coupling material. In a particular embodiment, the optical coupling material can include a silicone rubber. In still another embodiment, the optical coupling material has a refractive index less than 1.50. In still another embodiment, the radiation detection system can have a greater signal:noise ratio, a light collection efficiency, or both as compared to a conventional radiation detection system. Corresponding methods of use are disclosed that can provide better discrimination between neutrons and gamma radiation.

Abstract: A sensor section is provided with a detection element sensitive to light and radiation so that normal operation of the sensor section can be confirmed. The function for confirming operation of the sensor section using an optical pulse signal from a light emitting element is controlled from a monitor module section for connection with the sensor section. When the optical pulse for confirming operation of the detection element is generated, output from the sensor section is excluded from operation at the monitor module section so that confirmation of operation by an optical pulse is not affected. Furthermore, a configuration for stopping the sensor operation confirmation function when the output from the sensor section is high counting rate is provided over both the sensor section and the monitor module section.

Abstract: The present invention provides a radiation detection element that allows repairing of a defect portion, and that minimizes the number of pixels from which charges cannot be read out when repaired. Namely, in two adjacent pixels that are connected to a signal line having a defect portion where a defect has occurred and that are adjacent to the defect portion, the signal lines and the parallel lines are short-circuited to configure a parallel circuit parallel to the defect portion.

Abstract: The invention relates to an image acquisition device enabling a dental radiological image to be obtained, the device comprising a matrix sensor (C) having integrated therein a plurality of image acquisition photodiodes (DA) sensitive to irradiation and at least one detection photodiode (DD) also sensitive to irradiation, the device also comprising a control module (M) for controlling the sensor (C) and suitable for periodically reading the detection photodiode (DD) and for causing the sensor (C) to change over (SBA) between at least two modes: a standby mode and an acquisition mode (ACQ).

Abstract: In a radiation image conversion panel (10), a radiation conversion layer (2) for converting an incident radiation into light is formed on a substrate (1). The radiation conversion layer (2) has a reflective layer (3), on a side opposite from a light exit surface (2a) for emitting the light, for reflecting the light to the exit surface (2a) side, while the reflective layer (3) has a helical structure comprising helically stacked phosphor crystals. Thus constructed radiation image conversion panel (10) can enhance the reflectance without forming a reflective layer made of a thin metal film or the like and exhibit a reflectance higher than that in the case where the reflective layer is formed by spherical crystal particles.

Abstract: An x-ray detector that is suitable for both imaging and dose rate measurement has a hybrid photoactive layer arranged between an electrode and a substrate. The hybrid photoactive layer includes a number of scintillators as well as a bulk heterojunction and is designed to produce indirect x-ray conversion. The bulk heterojunction absorbs the scintillator radiation to form electron-hole pairs that are detected electrically. The production takes place by a spraying process, in particular a co-spraying process of bulk heterojunction solution and scintillator particle suspension.

Abstract: A flat panel detector has an imaging area, in which pixels are arrayed in a matrix and signal lines for reading out electric signals from the pixels are provided, to detect an image of a subject from x-rays which are incident on the imaging area after penetrating the subject. Detective elements are arranged in the imaging area, to output electric signals corresponding to incident x-rays. Based on previously stored sensitivity data on the detective elements, high-sensitivity elements are selected from among the detective elements. The start of radiation and the end of radiation of x-rays toward the imaging area are detected by monitoring the electric signals from the selected high-sensitivity elements, to control operation of the imaging device on the basis of the detected start and end of radiation.

Abstract: The invention comprises a charged particle cancer therapy system or synchrotron system using a single power supply electrically connected to a plurality of magnet sections to provide a uniform current to a plurality of magnets at a given period in time. Optionally, one or more switches introduce a corresponding one or more resistors into a circuit linking the power supply to a magnet or an inductor during an applied power recovery phase between acceleration cycles of the synchrotron, which reduces time of reduction in power from an active applied power to a power suitable for use with a subsequent injection of charged particles into the synchrotron.

Abstract: A particle-optical arrangement comprises a charged-particle source for generating a beam of charged particles; a multi-aperture plate arranged in a beam path of the beam of charged particles, wherein the multi-aperture plate has a plurality of apertures formed therein in a predetermined first array pattern, wherein a plurality of charged-particle beamlets is formed from the beam of charged particles downstream of the multi-aperture plate, and wherein a plurality of beam spots is formed in an image plane of the apparatus by the plurality of beamlets, the plurality of beam spots being arranged in a second array pattern; and a particle-optical element for manipulating the beam of charged particles and/or the plurality of beamlets; wherein the first array pattern has a first pattern regularity in a first direction, and the second array pattern has a second pattern regularity in a second direction electron-optically corresponding to the first direction, and wherein the second regularity is higher than the first re

Abstract: A drawing apparatus which performs drawing on a substrate with a plurality of charged particle beams includes: a blanking deflector located in a vacuum chamber and configured to blank each of the plurality of charged particle beams; a device located in an external chamber in which a gas pressure is higher than a gas pressure in the vacuum chamber, and configured to control the blanking deflector; and a first substrate facing the blanking deflector. The first substrate constitutes a partition which separates the vacuum chamber and the external chamber in a region, of the first substrate, facing the blanking deflector, and includes an electrode which fills a via formed in the region. The device is electrically connected to the blanking deflector via the electrode.

Abstract: An elongated member is formed which has a frontal and a distal end, and a length axis. The frontal end satisfies vacuum sealing and maneuverability specifications of a sample holder for a particle beam microscope. The elongated member includes a tubular section defining an axial cavity along the length axis, and having an orifice toward the distal end of the elongated member. The resulting device is characterized as being a sample holder for use in particle beam microscopes. The sample holder enables the examination of high aspect ratio samples by accommodating them in its axial cavity. The examination can take place without prior modification of the high aspect ratio samples.

Abstract: A beam extraction process (interruption and restart) is appropriately performed when a failure occurs during irradiation of a spot group. A charged particle irradiation system includes a synchrotron 12 and a scanning irradiation unit 15 that scans an ion beam extracted from the synchrotron over a subject. The extraction of the ion beam from the synchrotron is stopped on the basis of a beam extraction stop command. Scanning magnets 5A and 5B are controlled to change a point (spot) to be irradiated with the ion beam, while the extraction of the ion beam is stopped. The extraction of the ion beam from the synchrotron is restarted after the change of the spot to be irradiated. When a relatively minor failure in which continuous irradiation would be possible occurs during irradiation of a certain spot with the beam, the extraction of the beam is not immediately stopped.

Abstract: A scanning system including a scanning element, a beam profiler, analysis system, and a ZFE-limiting element, is disclosed. The scanning element is configured to scan an ion beam over an ion beam scan path. The beam profiler measures beam current of the ion beam as it is scanned over the ion beam scan path, and the analysis system analyzes the measured beam current to detect a ZFE condition. The ZFE-limiting element, which is upstream of the beam profiler and is coupled to the analysis system via a feedback path, is configured to selectively apply an electric field to the scanned ion beam based on whether the ZFE condition is detected. The selectively applied electric field induces a change in the scanned beam to limit the ZFE condition.

Abstract: The present embodiments relate to a method for operating a particle therapy system. The particle therapy system includes a particle generation device, a beam generating device for generating a particle beam from at least one portion of the generated irradiation particles, a measuring device for automatically measuring a particle beam intensity of the particle beam, and a particle beam influencing device. The particle beam influencing device is configured to adjust the particle beam intensity as a function of the measured particle beam intensity and a predefined setpoint value for the particle beam intensity.

Abstract: An EUV projection lens includes a substrate and concentric diffraction patterns on the substrate. The concentric diffraction patterns have an out-of phase height with respect to EUV light and include a material through which the EUV light has a transmittance higher than about 50% at the out-of phase height. The EUV projection lens has a high first order diffraction light efficiency and an optic system having the EUV projection lens has a high resolution.

Abstract: A multilevel MLC includes a first set and a second set of a plurality of pairs of beam blocking leaves arranged adjacent one another. Leaves of each pair in the first set are disposed in an opposed relationship and longitudinally movable relative to each other in a first direction. Leaves of each pair in the second set are disposed in an opposed relationship and longitudinally movable relative to each other in a second direction generally parallel to the first direction. The first and second sets of pairs of leaves are disposed in different planes.

Abstract: A method of using automatic whole body personnel contamination monitors and/or means for decontaminating individuals exposed to radioactive material contamination is provided. The inventive method involves the use of these monitors and/or decontamination means in intermodal containers of mobile-unit structures dedicated to responding to radiological emergency situations. Also provided are such mobile-unit structures, as well as systems that employ such mobile-unit structures.