Abstract: A storage module for a laboratory automation system, a method of operating a laboratory automation system, and a laboratory automation system are presented. Items used by laboratory stations are stored centrally in a storage module and can be transported to the laboratory stations using a laboratory sample distribution system.

Abstract: A titration module of biochip includes a base, a plurality of titration units, a plurality of pipelines, a transfer unit, and a control unit. The plural titration units and the plural pipelines are arranged above the base, and that the titration units each is provided, at its lower end, a needle element and a reservoir which are communicated with each other. The transfer unit is arranged on the base, and includes at least one driving device for driving, selectively, the plural titration units and the plural pipelines in a lateral direction (leftward and rightward), a longitudinal direction (frontward and rearward) and a vertical direction (upward and downward), respectively. The control unit is electrically connected with the transfer unit, and controls the same for switching, selectively, the plural titration units and the plural pipelines.

Abstract: The invention relates to a method for linking an end (9) of a shaft (8) of a tachometer (7) positioned in a landing gear hub (1) and a wheel (2) mounted to rotate on said hub, the method comprising the step of equipping the wheel with a housing (14) suitable for receiving the end of the shaft of a tachometer and driving the shaft in rotation with the wheel, the housing comprising a bearing member (17) protruding inside the housing to be pushed back by the end of the shaft against an elastic member (18) to take up any play between the end of the shaft and the housing. The invention also relates to a bush ensuring application.

Abstract: A sensor arrangement for measuring a speed of a rotating component includes a rotary encoder and sensor unit. The encoder is coupled to the component, and has a magnetic surface code with alternating North and South poles. The sensor unit has a housing, connecting cable, at least one sensitive measuring element, and contacting arrangement. The element is positioned in the sensor unit such that a main detection direction of the element is angled relative to a main extension direction of the sensor unit. The contacting arrangement electrically connects the element to the cable within the housing. Rotational movement of the encoder changes a magnetic field generated by the code at the element, which is configured to detect the change over a first direction parallel to the main extension direction or over a second direction perpendicular to the main extension direction in order to determine the speed of the component.

Abstract: A method and apparatus for monitoring the structural health of a stock of columns such as lighting columns and/or columns within that stock each of which is connected to receive power from an external source or otherwise. The method comprises the steps of locating on an upper surface of each or a plurality of columns within the stock to be monitored a micro controller connected to receive power from the electrical source of the respective column. The micro controller includes an electronic chip or board which includes, in circuit, an accelerometer, a Wi-Fi/RF or 3G/4G component or the like and a global positioning system (GPS) component or the like. The micro controller is operable to detect and monitor the magnitude and direction of forces imposed on the respective column and the direction from which such forces are derived, and to transmit the received data to a remote server for analysis.

Abstract: Provided is a flow meter including a cylindrical measurement tube having an internal flow passage, and a sensor substrate including a heating resistance wire and a temperature detecting resistance wire formed on a detection surface thereof along an axis. An outer circumferential surface of the measurement tube is provided with a flat surface arranged as opposed to the detection surface, and a pair of recesses arranged so as to sandwich the internal flow passage at a position where the heating resistance element is arranged. The flat surface and the detection surface are bonded together to form a bonding area A having a width in a direction orthogonal to the axis. A width of a first portion on the axis where the pair of recesses is arranged is narrower than a width of a second portion on the axis where the pair of recesses is not arranged.

Abstract: An electronic device monitors accelerations using a motion sensor. The electronic device determines a current motion state based on the accelerations. The electronic device identifies a plurality of applications that subscribe to a motion state identification service and notifies a subset of the applications of the current motion state, the subset meeting notification criteria associated with the current motion state.

Abstract: A micromechanical z-acceleration sensor, including a seismic mass element including a torsion spring; the torsion spring including an anchor element, with the aid of which the torsion spring is connected to a substrate; the torsion spring being connected at both ends to the seismic mass element with the aid of a bar-shaped connecting element designed as normal with respect to the torsion spring in the plane of the seismic mass element.

Abstract: A micromechanical spring for a sensor element, including at least two spring sections formed along a sensing axis, the at least two spring sections each having a defined length, and the at least two spring sections having different defined widths.

Abstract: a scanning probe microscope for high-speed imaging and/or nanomechanical mapping. The microscope comprises a scanning probe comprising a cantilever with a tip at the distal end; and means for modulating a tip-sample distance separating the tip from an intended sample to be viewed with the microscope, the means for modulating being adapted to provide a direct cantilever actuation.

Abstract: The invention refers to a method for analyzing a defect of an optical element for the extreme ultra-violet wavelength range comprising at least one substrate and at least one multi-layer structure, the method comprising the steps: (a) determining first data by exposing the defect to ultra-violet radiation, (b) determining second data by scanning the defect with a scanning probe microscope, (c) determining third data by scanning the defect with a scanning particle microscope, and (d) combining the first, the second and the third data.

Abstract: Provided is a scanning probe microscope capable of performing observation with high accuracy even when a beam splitter is configured to be movable. When checking positions of a sample and a cantilever in a scanning probe microscope, by disposing an optical microscope to face a first opening portion of a top surface of a housing, and by gripping and rotating an operating portion provided on a side surface of the housing, a user rotates and moves a beam splitter held by a holding portion in the housing, and retracts the beam splitter from the field of view of the optical microscope. Therefore, the beam splitter can always be disposed in the housing, and the user can be prevented from touching the beam splitter. As a result, it is possible to prevent the beam splitter from being damaged or stains from adhering to the beam splitter. Further, the moving distance of the bears splitter 6 can be shortened. Therefore, it is possible to suppress the occurrence of a deviation in the position of the beam splitter.

Abstract: A holding device for detachably holding a magnetic sample holder or a sample body, in particular for a scanning probe microscope, wherein the holding device includes an accommodation unit for accommodating the magnetic sample holder or the sample body, a magnetic field guiding unit which, in a holding mode, is adapted for guiding a magnetic field for applying a magnetic holding force at the accommodation unit for holding the magnetic sample holder or sample body which is accommodated at the accommodation unit, and a magnetic field switching unit which is adapted for switching between at least two relative arrangements between the magnetic field guiding unit and the magnetic field switching unit, in order to selectively adjust the holding mode or a release mode, wherein in the release mode the magnetic sample holder or sample body is released for being detached from the accommodation unit.

Abstract: A test fixture includes a plug adaptable to a Universal Serial Bus (USB) Type-C receptacle, a switching circuit, and a control circuit. The plug can be utilized for coupling an electronic device under test. The switching circuit can be utilized for performing switching operations to enable first and second sets of communication paths within the test fixture in turn. The first and the second sets of communication paths are coupled to a first set of communication terminals of the plug and a second set of communication terminals of the plug, respectively. The control circuit can be utilized for controlling the switching operations, to allow a processing circuit to perform first and second sets testing operations on the electronic device through the first and the second sets of communication paths, respectively. A test system and a method for performing testing with aid of the test fixture are also provided.

Abstract: A reduced pin count (RPC) device includes an electrical circuitry in a package with uniformly distributed leads, a subset of the leads being electrically disconnected form the circuitry. A contactor pin block with sockets corresponding to the uniformly distributed leads has the sockets corresponding to the leads with electrical connections filled with test pins suitable for contacting respective leads, and the sockets corresponding to the electrically disconnected leads voided of test pins. Dummy plugs are inserted into the voided sockets to block the sockets and prevent accidental insertions of test pins.

Abstract: Method for the validation of a fuse head in an electronic detonator, wherein said detonator comprises: a reference resistor, a fuse head, at least one capacitor and switching means, wherein in a first position of the switching means, the reference resistor is connected to the at least one capacitor forming a first RC circuit, and in a second position of the switching means, the fuse head is connected to the at least one capacitor forming a second RC circuit; the method comprising the following steps: measuring at least once a first charge time; activating the switching means to the second position to replace the reference resistor in the RC circuit with the fuse head; measuring at least once a second charge time; and determining the deviation of the second charge time from the first charge time.

Abstract: A tester is described having output circuits that are operable in either power mode or driver mode. A switching circuit connects force and sense lines to one of the output circuits when in power mode, or connects the same lines separately to the output circuits when in driver mode. A further configuration allows for power to be provided through the lines separately while detecting a measure of power through each line and correcting for unknown resistances of leads connected to the lines.

Abstract: Disclosed is a directional coupler having a coupler, a forward resistive attenuator, a reflected resistive attenuator, a forward compensation capacitor, and a reflected compensation capacitor. A forward coupler side arm and reflected coupler side arm of the coupler are configured to obtain a sample of forward energy and a sample of reflected energy from the coupler transmission line section. The forward resistive attenuator and reflected resistive attenuator are configured to attenuate the sample of forward energy and the sample of reflected energy. The forward compensation capacitor and the reflected compensation capacitor are configured to receive the attenuated sample of forward energy and the attenuated sample of reflected energy and produce a frequency-compensated sample of forward energy and a frequency-compensated sample of reflected energy.

Abstract: An excitation core includes a first strip-shaped magnetic substance and a second strip-shaped magnetic substance. The first strip-shaped magnetic substance has both ends mutually overlapped with and mutually in contact with both ends of the second strip-shaped magnetic substance in a thickness direction. A sensor head includes this excitation core and a magnetism collecting body. This magnetism collecting body includes strip-shaped first magnetism collector and second magnetism collector. Both ends of the first magnetism collector and both ends of the second magnetism collector are in contact with one another to form the annular magnetism collecting body. This magnetism collecting body is disposed at an inside or an outside of the reinforcing body.

Abstract: An RF peak-detector circuit can operate over a wide range and can compensate or correct an output voltage error term that depends on the thermal voltage and the input signal voltage. At or near a minimum value of the input signal voltage range, such compensation can include a scaled base-emitter ratioing of bipolar junction transistors used to generate the output voltage, each of which can be biased by a primary current. At or near a maximum value of the input signal voltage range, this can include using an auxiliary bias current circuit that can shift auxiliary bias current between these bipolar junction transistors. The auxiliary bias current circuit can include scaled bipolar junction transistors in a cross-coupled configuration and an equivalent resistance circuit between emitters of the cross-coupled BJTs. This can provide a robust approach for improving the accuracy of an RF peak-detector circuit over a wide range.

Abstract: An electrical measuring system of a six-port circuit includes a delay line and a arithmetic unit. In a first operating mode, an electrical signal can be on the one hand transmitted directly to a first input terminal and on the other hand via the delay line to a second input terminal of the six-port circuit. In an embodiment, the measuring system is configured such that, in the second operating mode, it does not supply a signal to the first input terminal of the six-port circuit and it supplies a reference signal to the second input terminal of the six-port circuit.

Abstract: Embodiments of the invention provide a capability of determining an input impedance of a connected Device Under Test based on Waveform Monitoring of an output signal of a waveform generator. Using embodiments of the invention, the input impedance of DUT is determined from the waveform monitoring results. The impedance information of the DUT together with the actual waveform provided to the DUT allows systems according to embodiments of the invention capable of characterizing circuit behavior for performance optimizing and issue debugging for the DUT.

Abstract: A method for measuring a capacitance value of a capacitive sensor uses an integration process involving charge quantities being transferred in successive integration cycles from the capacitive sensor to an integration capacitor. The method includes performing the integration process until the number of integration cycles carried out has reached a number N of integration cycles to be carried out, wherein a starting value NStart is set to N and an end value NEnd is determined. An A/D converter measures a voltage value UCI(N) at the integration capacitor and the voltage value is added to a voltage sum value UTotal. The number N is increased by a value n, where n is at least one and is less than NDiff=NEnd?NStart. The steps are repeated until the number N exceeds the end value NEnd. The ending voltage sum value is indicative of the capacitance value of the capacitive sensor.

Abstract: A capacitive sensing system includes a controller, a node connected to one side of a capacitance, the controller configured to measure the capacitance by measuring a time for a voltage across the capacitance to reach a predetermined reference voltage, and the controller causing the time period for capacitance measurements to vary even when the capacitance is constant.

Abstract: Disclosed are various embodiments for adjusting an operational parameter of a guided surface waveguide probe according to measurements received from one or more measuring devices. A measuring device measures the conditions associated with an environment of the measuring device. The measuring devices communicates the measured data to the guided surface waveguide probe. Adjustments can be made to one or more operational parameters of the guided surface waveguide probe according to the measured data.

Abstract: An overhead power line insulator comprises a dielectric element (4) having an outside surface forming a skirt (5) with a head extended by a metal attachment fitting (7) for attaching the insulator, and a device for detecting surface leakage current flowing on the dielectric (4), the device comprising a conductive ring (8) that surrounds the fitting (7) and that is in contact with the outside surface of the dielectric (4). An electrically insulating protective element (10) is provided in the form of a collared bushing that surrounds the fitting (7), being interposed between the ring (8) and the fitting (7) and extending radially so as to overlie the ring (8) in order to protect it from environmental pollution.

Abstract: A method for detecting an electric leakage point without interrupting a power supply is provided. The method includes transmitting a unipolar direct current (DC) survey voltage signal to an electric wire of the power supply. The method includes transmitting a chain of electromagnetic wave signals generated around the electric wire to synchronize a reference time to measure an earth potential of the unipolar DC voltage signal and capture an electromagnetic tracking signal. The method includes tracing a buried route of the electric wire by analyzing the electromagnetic tracking signal according to the reference time. The method includes measuring the earth potential of the unipolar DC voltage signal on the ground according to the reference time. The method includes locating the electric leakage point by identifying a polarity of the unipolar DC voltage signal.

Abstract: A mobile earth leaking survey apparatus is provided. The apparatus includes a magnetic field sensor. The apparatus includes a plurality of electrodes configured to be capacitively coupled to ground. The apparatus includes a signal timing unit for finding and setting a time T by analyzing signals input from the magnetic field sensor, wherein the time T matches a signal start time of a survey current transmitter. The apparatus includes a signal detection unit for identifying a polarity and a magnitude of a signal from the magnetic field sensor for a predetermined discrete period of time at a predetermined interval time from the time T. The apparatus includes a potential measuring unit for measuring an earth potential value input from the plurality of electrodes.

Abstract: A method and an apparatus for fault detection in a mixed configuration power transmission line including a plurality of sections arranged between one end of the transmission line and the other end of the transmission line and including at least one overhead line section and at least one cable section are disclosed. Based on a comparison travelling wave voltage or current time derivatives at the one end and the other end of the power transmission line with selected threshold values, it is determined if there is a fault occurring in at least one cable section of the power transmission line. Embodiments utilize amplification of travelling wave voltages and/or currents which may occur at junctions between a cable section and an adjacent overhead line section in determining if the fault occurs in a cable section of the power transmission line.

Abstract: A composite insulator (1) for overhead power lines comprises a rigid core extending axially between two attachment fittings (6) and having placed thereon a shell having sheds (5, 5?) made of electrically insulating synthetic material. It includes a detector device for detecting surface leakage currents, which device includes an electrically conductive metal annular ring (7) surrounding the shell between an end shed (5?) adjacent to one of the two fittings (6) and another shed (5) adjacent to the end shed (5?) that extends radially over the ring (7). The ring (7) is connected by a conductive wire (8) passing through the end shed (5?) to be connected to an electronic unit (9) of the detector device.

Abstract: Disclosed herein are systems for monitoring and protecting an electric power system using a plurality of conductor-mounted detectors (CMDs). In one embodiment, a plurality of CMDs are coupled to an electrical conductor. Each CMD may harvest power from the electrical conductor and may monitor electrical current in the conductor. When the electrical current in the conductor exceeds a fault current threshold a fault signal may be transmitted. A receiver in communication with each of the plurality of CMDs may receive the fault signal from at least one of the plurality of CMDs. A protective action may be generated and implemented to clear the fault. A portion of the electric power system affected by the fault may be determined based on identification of each of the plurality of CMDs to transmit the fault signal.

Abstract: A field control element for a high-voltage cable accessory comprises an electrically insulating material. The electrically insulating material includes a fluorescent dye adapted to convert a first radiation having a first wavelength and generated by an electrical discharge into a second radiation having a second wavelength longer than the first wavelength.

Abstract: Semiconductor module testing equipment includes a test board, a plurality of pipe structures extending from an upper surface of the test board in a first direction and spaced apart from one another in a second direction that intersects the first direction, wherein the first and second directions are substantially parallel to a plane of the test board, at least one semiconductor module socket disposed between a pair of neighboring pipe structures of the plurality of pipe structures, and a plurality of nozzles disposed on each pipe structure of the plurality of pipe structures, wherein the plurality of nozzles is configured to discharge a fluid laterally.

Abstract: A testing system for carrying out electrical testing of at least one first through via forms an insulated via structure extending only part way through a substrate of a first body of semiconductor material. The testing system has a first electrical test circuit integrated in the first body and electrically coupled to the insulated via structure. The first electrical test circuit enables detection of at least one electrical parameter of the insulated via structure.

Abstract: A test device for a printed circuit board assembly is disclosed. The test device includes a test platform for securing a printed circuit board assembly to be tested and a positioning platform located above the test platform and for securing a plurality of test probes. The plurality of test probes are secured at the bottom of the positioning platform and the secured positions in the positioning platform thereof are adjustable to align the test points on the printed circuit board assembly to be tested.

Abstract: A method for testing the quality of a galvanic connection between a first terminal and a conductive layer of a high-voltage condenser bushing assembly is provided. The method includes providing a capacitive test circuit. The capacitive test circuit comprises the first terminal, an AC power source and a measurement unit. The method further includes providing, by the AC power source, a first test current in the capacitive test circuit. The first test current is an AC current at a first test frequency of 10 kHz or higher. The method further includes measuring, by the measurement unit, a test parameter indicative of a resistance of the galvanic connection. The method further includes determining the quality of the galvanic connection from the measured test parameter.

Abstract: Many systems implement calibration schemes to measure and correct for the non-idealities. Such systems can be complex, which makes them impractical to implement since the cost can potentially outweigh the benefits of the calibration scheme. To implement efficient and effective calibration, non-idealities or errors of a system are detected, in foreground or in background, in a piecewise fashion based on, e.g., correlations of an output signal with an uncorrelated random signal, where the correlation results are processed separately for different open intervals of an error signal. Second order and third order correction terms can be easily determined based on three open intervals. In various embodiments, the calibration scheme can detect and correct for linear errors, (linear and non-linear) memory/frequency dependent errors, static nonlinearity errors, Hammerstein-style non-linearity errors, and Wiener-style non-linearity errors (cross-terms).

Abstract: Timely testing of die on wafer reduces the cost to manufacture ICs. This disclosure describes a die test structure and process to reduce test time by adding test pads on the top surface of the die. The added test pads allow a tester to probe and test more circuits within the die simultaneously. Also, the added test pads contribute to a reduction in the amount of test wiring overhead traditionally required to access and test circuits within a die, thus reducing die size.

Abstract: An apparatus for performing a scan test of IC chip includes a shift-frequency searching unit that executes first scan test for first scan pattern whole or part of which constituting first scan section and second scan test for second scan pattern whole or part of which constituting second scan section, and searches usable shift frequency for the second scan section. The first scan pattern is scan pattern inputted to scan path right before the second scan pattern. The shift-frequency searching unit shifts the first scan section to the scan path with first shift frequency in the first scan test, shifts the second scan section to the scan path with second shift frequency in the second scan test, and determines, when both results of the first scan test and the second scan test indicate pass, the second shift frequency as the usable shift frequency for the second scan section.

Abstract: A semiconductor test apparatus capable of securely having the contact pin and the external contact terminal held in contact with each other even in case where the vertical type handler is used. The semiconductor test apparatus comprises: a test socket having a socket surface formed thereon, the socket surface having a contact pin towering therefrom; and a semiconductor transport fixture having a concave portion formed thereon, the concave portion adapted to receive therein an IC under test, wherein the test socket has a position adjustment guide provided thereon, the semiconductor transport fixture has a guide through bore formed therein, the guide through bore adapted to receive the position adjustment guide therethrough when the IC under test comes under test, and either one of the position adjustment guide or the guide through bore is formed in a tapered shape.

Abstract: The disclosure describes a novel method and apparatus for allowing response data output from the scan outputs of a circuit under test to be formatted and applied as stimulus data input to the scan inputs of the circuit under test. Also the disclosure described a novel method and apparatus for allowing the response data output from the scan outputs of a circuit under test to be formatted and used as expected data to compare against the response data output from the circuit under test. Additional embodiments are also provided and described in the disclosure.

Abstract: This disclosure describes a reduced pin bus that can be used on integrated circuits or embedded cores within integrated circuits. The bus may be used for serial access to circuits where the availability of pins on ICs or terminals on cores is limited. The bus may be used for a variety of serial communication operations such as, but not limited to, serial communication related test, emulation, debug, and/or trace operations of an IC or core design. Other aspects of the disclosure include the use of reduced pin buses for emulation, debug, and trace operations and for functional operations. In a fifth aspect of the present disclosure, an interface select circuit, FIGS. 41-49, provides for selectively using either the 5 signal interface of FIG. 41 or the 3 signal interface of FIG. 8.

Abstract: This disclosure describes a novel .method and apparatus for testing TSVs within a semiconductor device. According to embodiments illustrated and described in the disclosure, a TSV may be tested by stimulating and measuring a response from a first end of a TSV while the second end of the TSV held at ground potential. Multiple TSVs within the semiconductor device may be tested in parallel to reduce the TSV testing time according to the disclosure.

Abstract: A method can be used to generate a reference clock signal having a reference frequency. N clock sub-signals are generated, where N is greater than or equal to 2. The N clock sub-signals are successively mutually shifted out of phase by ?/N and each clock sub-signal has an elementary frequency that is equal to the reference frequency divided by N. The N clock sub-signals are propagated over propagation paths. The elementary frequency and a length of the longest propagation path are chosen so that each sub-signal has an acceptable degree of deformation. The duration of each sub-signal edge is longer than quarter of the period of the reference frequency. The reference clock signal is generated by EXCLUSIVE OR combining the propagated clock sub-signals at the end of their respective propagation paths.

Abstract: An abnormality detecting device detects abnormalities in a system including a plurality of battery assemblies each having a plurality of cells connected in series, and includes: a connecting component configured to connect and disconnect adjacent two of the battery assemblies; and a detachment detector configured to detect whether or not the connecting component has been detached.

Abstract: A method and an apparatus for calculating the SOC of a battery being charged and a battery pack including the apparatus are disclosed in the present disclosure. The method for calculating the SOC includes: obtaining a full charge voltage and a reference charging voltage curve of the battery; taking a voltage value from the approximately linear ascent stage of the reference charging voltage curve as a preset reference voltage, and obtaining a corresponding reference SOC; acquiring a current charging voltage at which a charging voltage curve corresponding to a current charging state of the battery enters into an approximately linear ascent stage; determining a compensation factor according to the preset reference voltage, the full charge voltage, and the current charging voltage; and utilizing the compensation factor and the reference SOC to calculate a current SOC corresponding to the current charging state of the battery.

Abstract: A method and device for estimating remaining available energy of a power battery is provided. The method includes: estimating, under current state, maximum available energy of a first cell with minimum State of Charge (SOC), and maximum available energy of a second cell with minimum of maximum available capability in the power battery; estimating remaining available energy of the first cell based on its maximum available energy and SOC, and estimating remaining available energy of the second cell based on its maximum available energy and SOC; and estimating the remaining available energy of the power battery based on the number of cells included in the power battery and the smaller one of the remaining available energy between the first and the second cell.

Abstract: A method for estimating a state of health of a battery includes calculating a measured value of a charging required time for each of preset voltage intervals in a preset voltage range in which the battery is charged; calculating an estimated value of the charging required time for each of the voltage intervals by a preset battery meta-model; and estimating the SOH having lowest error between the measured value of the charging required time and the estimating value of the charging required time by allowing the estimated value of the charging required time to iteratively approach the measured value of the charging required time.

Abstract: A method is provided for monitoring the status of a plurality of battery cells in a battery pack the method including: arranging the battery cells in at least two groups of cells; connecting the groups of cells to a sensor unit; and obtaining, by means of the sensor unit, at least one sensor measurement for each group which is indicative of the state of operation of the battery pack. The method according to the invention further includes: determining a cell measurement for each battery cell by means of an over-determined equation system which defines the cell measurement as a function of the sensor measurement; and evaluating any residual terms resulting from the equation system in order to identify any battery cell having a cell measurement which deviates from an expected value based on the remaining battery cells. A battery management system for monitoring the status of a plurality of connected battery cells as mentioned above is also provided.

Abstract: Systems and methods for assessing voltage threshold detection circuitry of individual battery cells within a battery pack supplying power to a vehicle are disclosed. One example system comprises, a plurality of battery cells within a battery pack, a plurality of voltage threshold detecting circuits detecting voltage of the plurality of battery cells, a voltage of a first battery cell of the plurality of battery cells coupled to a first voltage threshold detecting circuit of the plurality of voltage threshold detecting circuits, and a network that selectively couples a second battery cell to the first voltage detecting circuit while the first battery cell is coupled to the first voltage detecting circuit.