Patents Issued in April 28, 2020
  • Patent number: 10634598
    Abstract: A particle sizing system is provided that includes an optical source generating a light beam for illuminating particles in a monitored volume, a plurality of light deflectors, each positioned to receive and deflect light scattered by the particles, and an image capture device collecting scattered light deflected by each light deflector. The image capture device outputs an image including a plurality of sub-images, each generated from the collected light deflected from a respective one of the light deflectors. Each particle is imaged as a spot in each sub-image, the plurality of spots associated with each particle corresponding to a plurality of scattering angles. The system also includes a processing unit configured to identify the spots associated with the each particle in the sub-images, compute a spot parameter associated with each spot, and determine the size of each particle from its related spot parameters. A particle sizing method is also provided.
    Type: Grant
    Filed: October 2, 2015
    Date of Patent: April 28, 2020
    Assignee: INSTITUT NATIONAL D'OPTIQUE
    Inventor: Daniel Cantin
  • Patent number: 10634599
    Abstract: A particle-measuring apparatus (1) for determining the particle mass concentration in aerosols having different properties has an aerosol photometer (2), by means of which a photometer measured value, which is dependent on the particle mass concentration in the aerosol, can be measured, and an evaluation unit (9), into which photometer measured values measured by the aerosol photometer (2) can be input and in which the input photometer measured values can be processed in order to output corrected particle mass concentration values.
    Type: Grant
    Filed: February 5, 2018
    Date of Patent: April 28, 2020
    Assignee: paragon GMBH & Co. KGaA
    Inventor: Ralf Moenkemoeller
  • Patent number: 10634600
    Abstract: A device for condensing vapor on condensation nuclei, especially for a particle counter, includes an inlet, via which a gas stream carrying particles as condensation nuclei enters into a feed channel; with a saturation channel. An evaporation unit extends over at least a part of the saturation channel. In the evaporation unit a working liquid can be evaporated in the saturation channel. An outlet leads to a measuring unit. At least one flow passage is provided from the feed channel towards the saturation channel. The at least one flow channel is directed at an angle greater than 90° in relation to a direction in which the feed channel extends.
    Type: Grant
    Filed: April 14, 2016
    Date of Patent: April 28, 2020
    Assignee: PALAS GMBH PARTIKEL-UND LASERMESSTECHNIK
    Inventors: Leander Mölter, Maximilian Weiss
  • Patent number: 10634601
    Abstract: A method of manufacturing a nozzle assembly may include the step of over molding a nozzle housing, or a portion of a nozzle housing, onto at least one nozzle component, such as an injection tube. Nozzle assemblies and flow cytometers incorporating nozzle assemblies may include any combination of straight smooth injection tubes, improved features for securing a nozzle assembly, improved features for debubbling a nozzle assembly, and aggressive orienting geometries. A method of sorting cells may include the step of magnetically coupling a nozzle assembly with a flow cytometer.
    Type: Grant
    Filed: March 14, 2013
    Date of Patent: April 28, 2020
    Assignee: Inguran, LLC
    Inventors: Kris Buchanan, Johnathan Charles Sharpe, Kenneth Michael Evans
  • Patent number: 10634602
    Abstract: The disclosure relates to devices and methods for analyzing particles in a sample. In various embodiments, the present disclosure provides devices and methods for cytometry and additional analysis. In various embodiments, the present disclosure provides a cartridge device and a reader instrument device, wherein the reader instrument device receives, operates, and/or actuates the cartridge device. In various embodiments, the present disclosure provides a method of using a device as disclosed herein for analyzing particles in a sample.
    Type: Grant
    Filed: November 3, 2017
    Date of Patent: April 28, 2020
    Assignee: CYTOCHIP INC.
    Inventors: Wendian Shi, Yuzhe Ding
  • Patent number: 10634603
    Abstract: A particle-measuring apparatus (1) has an optical particle sensor (2, 3, 5, 6). By means of the optical particle sensor (2, 3, 5, 6) a particle mass concentration in an aerosol volume can be detected. Furthermore, the particle-measuring apparatus (1) has a measurement chamber (7), in which the aerosol volume to be examined with regard to the particle mass concentration by means of the optical particle sensor (2, 3, 5, 6) can be received, and a conveying device (11), by means of which the aerosol can be introduced into the measurement chamber (7). In order to prevent the particle-measuring apparatus (1) from being adversely affected during operation as a result of dirt or particle deposits, it is proposed that the delivery rate of the conveying device (11) of the particle-measuring apparatus (1) is adjustable.
    Type: Grant
    Filed: February 5, 2018
    Date of Patent: April 28, 2020
    Assignee: paragon GmbH & Co. KGaA
    Inventor: Ralf Moenkemoeller
  • Patent number: 10634604
    Abstract: An in-line holographic microscope can be used to analyze on a frame-by-frame basis a video stream to track individual colloidal particles' three-dimensional motions. The system and method can provide real time nanometer resolution, and simultaneously measure particle sizes and refractive indexes. Through a combination of applying a combination of Lorenz-Mie analysis with selected hardware and software methods, this analysis can be carried out in near real time. An efficient particle identification methodology automates initial position estimation with sufficient accuracy to enable unattended holographic tracking and characterization.
    Type: Grant
    Filed: July 31, 2017
    Date of Patent: April 28, 2020
    Assignee: NEW YORK UNIVERSITY
    Inventors: David G. Grier, Fook Chiong Cheong, Ke Xiao
  • Patent number: 10634605
    Abstract: The present invention relates to a method for predicting the physical properties of polymers. More specifically, the present invention relates to a method for predicting long-term stability of polymers using a molecular weight distribution curve.
    Type: Grant
    Filed: October 12, 2017
    Date of Patent: April 28, 2020
    Assignee: LG Chem, Ltd.
    Inventors: Yoon Ki Hong, Hyuck Ju Kwon, Eun Kyoung Song, Dae Sik Hong, Ye Jin Lee, Joong Soo Kim, Eun Young Shin, Young Suk You, Ki Soo Lee
  • Patent number: 10634606
    Abstract: An arrangement for measuring gas concentrations in a gas absorption method, wherein the arrangement includes a plurality of light sources, a measuring cell, at least one measuring receiver and an evaluation apparatus. The measuring cell has a narrow, longitudinally-extended beam path with an entrance-side opening diameter B and an absorption length L with L>B, wherein the measuring cell has a gas inlet and a gas outlet wherein a plurality of light sources of different wavelength spectra is grouped into a first light source group wherein an optical homogeniser is interposed between the first light source group and the measuring cell, wherein, in particular, the homogeniser is coupled to the light source group directly or via a common optical assembly.
    Type: Grant
    Filed: June 30, 2017
    Date of Patent: April 28, 2020
    Assignee: bluepoint medical GmbH & Co. KG
    Inventor: Bernd Lindner
  • Patent number: 10634607
    Abstract: A snapshot ellipsometer or polarimeter which does not require temporally modulated element(s) to measure a sample, but instead uses one or more spatially varying compensators, (eg. microretarder arrays and compound prisms), to vary the polarization state within a measurement beam of electromagnetic radiation. Analysis of the intensity profile of the beam after interaction with the spatially varying compensator(s) and the sample allows sample parameters to be characterized without any moving optics.
    Type: Grant
    Filed: October 12, 2018
    Date of Patent: April 28, 2020
    Assignee: J.A. WOOLLAM CO., INC.
    Inventors: Griffin A. P. Hovorka, Jeremy A. Van Derslice
  • Patent number: 10634608
    Abstract: The present invention provides a system for measuring concentrations of trace gases in gas mixtures using an absorption spectroscopy method. The system comprising: a resonant optical cavity containing a gas mixture, a continuous-wave external cavity laser, a detector system for measuring an absorption of laser light by the gas in the resonant optical cavity, wherein the ratio of the round-trip length of the external cavity laser to the round-trip length of the resonant optical cavity or its inverse value is between N?0.2 and N+0.2, where N is a positive integer number.
    Type: Grant
    Filed: May 18, 2019
    Date of Patent: April 28, 2020
    Inventor: Serguei Koulikov
  • Patent number: 10634609
    Abstract: A sensor system is for measuring the profile of a snowpack along a snowpack passage. The sensor system has a probe and at least one processor. The probe has at least one first sensor set. The first sensor set has at least one first photoemitter for emitting light and at least one first photodetector for detecting light. A processor is provided for receiving output signals from the first sensor set. The processor is for calculating a snowpack profile.
    Type: Grant
    Filed: September 28, 2016
    Date of Patent: April 28, 2020
    Assignee: REALTIME ADVENTURE DATA, INC.
    Inventors: Micah J. Johnson, Ryan Stevenson, Drew Eldred
  • Patent number: 10634610
    Abstract: A method for determining a basicity index of a liquid body comprising: (a) detecting an intensity of an infrared signal passing through a sample of the liquid body; (b) calculating a transmittance value of infrared waves through the sample for p wave numbers, wherein p in a natural integer greater than or equal to two; and (c) determining the basicity index of the liquid body, BN, wherein of BN=Tr·M(p×1)+R, Tr is a set of transmittance values calculated in step b, M(p×1) is a set of data of a model, the set of data containing coefficients determined from measured basicity index values and measured transmittance values of reference liquid bodies, and R is a residue of the model, determined from the measured basicity index values and the measured transmittance values of the reference liquid bodies.
    Type: Grant
    Filed: July 26, 2016
    Date of Patent: April 28, 2020
    Assignee: WIKA TECH S.A.S.
    Inventors: Mustapha Adjali, Raphael Juston, François Chaudoreille
  • Patent number: 10634611
    Abstract: The present invention provides a measuring apparatus having a housing in which an opening is formed, and measuring a reflection characteristic of a target region to be measured via the opening, the apparatus comprising an imaging device provided in the housing, and configured to capture an image of an imaging region via the opening, a detector configured to detect light reflected from the target region, which is a portion of the imaging region, a processor configured to obtain a reflection characteristic of the target region based on the light detected by the detecting unit, and a display unit configured to display the image of the imaging region captured by the imaging unit, wherein the image of the imaging region displayed by the display unit includes information indicating the target region.
    Type: Grant
    Filed: October 17, 2017
    Date of Patent: April 28, 2020
    Assignee: CANON KABUSHIKI KAISHA
    Inventor: Hiroshi Kawanago
  • Patent number: 10634612
    Abstract: Herein is described a method for assessing primer composition coat weight on a print substrate. The method comprises providing a primed print substrate and spectroscopically analysing the primed print substrate using Fourier transform infrared (FTIR) spectroscopy by attenuated total reflectance (ATR) to produce a FTIR spectrum. A primer peak in the FTIR spectrum characteristic of the primer composition, and a print substrate peak characteristic of the print substrate are then identified and compared to assess the primer coat weight on the print substrate of the primed print substrate.
    Type: Grant
    Filed: July 19, 2016
    Date of Patent: April 28, 2020
    Assignee: HP Indigo B.V.
    Inventors: Eviatar Golan, Maxim Shlimovich
  • Patent number: 10634613
    Abstract: A molybdenum disulfide-containing biosensing chip includes a transparent substrate; a metal layer disposed on the transparent substrate; and a molybdenum disulfide layer disposed on the metal layer; wherein the molybdenum disulfide layer is carboxyl (—COOH)-modified. The carboxyl (—COOH)-modified molybdenum disulfide layer effectively enhances sensitivity of a detection device having the biosensing chip. The biosensing chip is applicable to detection of various biological molecules.
    Type: Grant
    Filed: March 29, 2018
    Date of Patent: April 28, 2020
    Assignee: NATIONAL TAIWAN NORMAL UNIVERSITY
    Inventors: Nan-Fu Chiu, Ting-Li Lin
  • Patent number: 10634614
    Abstract: Devices and methods are disclosed for the substantially uniform epi-illumination of samples such as western blots using high power lasers. The uniformity of illumination is provided by particular configurations of optical diffusers, spatial or temporal laser modalities, or numbers of lasers. The increased excitation light produced by the high power lasers can enhance fluorescence emission signal strength and reduce required imaging exposure times.
    Type: Grant
    Filed: August 23, 2018
    Date of Patent: April 28, 2020
    Assignee: Bio-Rad Laboratories, Inc.
    Inventors: Evan Thrush, Steven Swihart
  • Patent number: 10634615
    Abstract: A method for correcting a fluorescence image of an object, for example a biological tissue that can include fluorescent agents. The distance between a fluorescence probe generating the fluorescence image and the object examined is measured. This distance is used to apply a correction function to the fluorescence image. The method may find application in perioperative fluorescence imaging for diagnosis and monitoring of evolution of pathologies, for example of cancers.
    Type: Grant
    Filed: May 11, 2016
    Date of Patent: April 28, 2020
    Assignees: Commissariat a l'energie atomique et aux energies alternatives, FLUOPTICS
    Inventors: Philippe Rizo, Anthony Daures
  • Patent number: 10634616
    Abstract: An optical immersion probe assembly with an alignment mechanism is described. The alignment mechanism ensures that proper alignment is achieved between an optical fiber head and an optical immersion probe whenever the optical immersion probe is coupled to the optical fiber head. The alignment mechanism may include a notch defined in a portion of a first annular end surface of the optical fiber head, and a projection on a periphery of the optical immersion probe. The projection on the probe may be positioned a distance from a second annular end surface of the optical immersion probe, and sized to be received within the notch of the optical fiber head. Also described herein are techniques and processes for manufacturing the components of an optical immersion probe assembly, and for assembling the optical immersion probe assembly.
    Type: Grant
    Filed: December 26, 2018
    Date of Patent: April 28, 2020
    Assignee: MarqMetrix, Inc.
    Inventors: Brian James Marquardt, Giora Proskurowski, Alex McNeill
  • Patent number: 10634617
    Abstract: An installation for the optical inspection of surface regions of objects, such as painted vehicle bodies, includes a test light device, by which objects located in a test region can be irradiated with a test light and by which a test pattern can be generated on the surface region. A lighting system includes a plurality of lighting units, by which test light can be emitted. The light intensity of the test light or both the color of light and the light intensity of the test light can be optionally adjusted by the lighting units.
    Type: Grant
    Filed: June 14, 2016
    Date of Patent: April 28, 2020
    Assignee: EISENMANN SE
    Inventors: Jürgen Röckle, Jan Reiner Hammermann, Axel Halbmeyer
  • Patent number: 10634618
    Abstract: The invention provides an apparatus for inspecting a light transmissible optical component. The apparatus comprises an image capturing module arranged on a first side of a support configured to hold a light transmissible optical component whilst it is being inspected. The apparatus includes an illumination device configured to shape light from a light source and to illuminate a selected portion of a surface of said light transmissible optical component with said shaped light to enable the image capturing module to capture any of a bright field image, a dark field image, or a combined bright field and dark field image of the light transmissible optical component being held by the support.
    Type: Grant
    Filed: January 23, 2018
    Date of Patent: April 28, 2020
    Assignee: Hong Kong Applied Science and Technology Research Institute Company Limited
    Inventors: Vladislav Nikitin, Wang Fei Ng, Ka Kit Wong, Xiaozhe Ren, Ying Liu
  • Patent number: 10634619
    Abstract: A display inspection device includes a light source, a light condenser unit, a light splitter unit, and a photoelectric converter that are arranged, in sequence, externally of a display-to-be-inspected. The light condenser unit provides constant-frequency excitement to the inspection light beam so as to make constant-frequency variation of focus of the inspection light beam. The range of variation of the focus of the inspection light beam always covers a focus point on a surface of the display-to-be-inspected so that the inspection device possess an active focusing function, allowing a surface configuration, reflectivity, or defect of the display-to-be-inspected to be reflected in variation of intensity of a reflected light beam and also allowing the focusing point of the inspection light beam not to be constrained to focus on the surface of an objected-to-be-inspected thereby greatly increasing an inspection range of the device and improving inspection efficiency.
    Type: Grant
    Filed: September 1, 2018
    Date of Patent: April 28, 2020
    Assignee: Wuhan China Star Optoelectronics Technology Co., Ltd
    Inventor: Zhe Liu
  • Patent number: 10634620
    Abstract: A test system for determining a surface characteristic of a chip facet comprises a chip, which has a facet and includes a waveguide, a detector, and a processor. The on-chip waveguide is configured to direct test light towards the facet, where a portion of the test light is reflected and a portion of the test light is transmitted. The detector is configured to measure an amount of the reflected portion or the transmitted portion, and the processor is configured to determine a surface characteristic of the facet, such as a facet angle, a facet curvature, and/or a facet roughness, on the basis of the measured amount.
    Type: Grant
    Filed: August 20, 2019
    Date of Patent: April 28, 2020
    Assignee: Elenion Technologies, LLC
    Inventors: Matthew Akio Streshinsky, Ari Novack, Michael J. Hochberg
  • Patent number: 10634621
    Abstract: A learning procedure involves generating a non-defective product learning model by conducting machine learning using non-defective product data as teacher data, and generating a defective product learning model for each defect type by conducting machine learning for each defect type using defective product data as teacher data. A calculating procedure involves calculating the likelihood of a non-defective product from output data calculated using the non-defective product learning model to which target product data is input, and calculating the likelihood of a defective product for each defect type from output data calculated using the defective product learning model to which the target product data is input. A determining procedure involves determining that the target product data is data on a defective product having an unknown defect when the likelihood of a non-defective product and the likelihood of a defective product for each defect type satisfy a predetermined requirement.
    Type: Grant
    Filed: May 21, 2019
    Date of Patent: April 28, 2020
    Assignee: JTEKT CORPORATION
    Inventors: Masaaki Kano, Akiyoshi Nakase
  • Patent number: 10634622
    Abstract: A method of identifying a wafer defect region is disclosed. The method includes preparing a sample wafer, forming a primary oxide film on the sample wafer at a temperature of 800° C. to 1000° C., forming a secondary oxide film on the primary oxide film at a temperature of 1000° C. to 1100° C., forming a tertiary oxide film on the secondary oxide film at a temperature of 1100° C. to 1200° C., removing the primary to tertiary oxide films, etching one surface of the sample wafer from which the primary to tertiary oxide films are removed to form haze on one surface of the sample wafer, and identifying a defect region of the sample wafer based on the haze.
    Type: Grant
    Filed: November 29, 2018
    Date of Patent: April 28, 2020
    Assignee: SK SILTRON CO., LTD.
    Inventor: Jae Hyeong Lee
  • Patent number: 10634623
    Abstract: Disclosed are methods and apparatus for inspecting an extreme ultraviolet (EUV) reticle using an optical inspection tool. An inspection tool having a pupil filter positioned at an imaging pupil is used to obtain a test image or signal from an output beam that is reflected and scattered from a test portion of an EUV test reticle. The pupil filter is configured to provide phase contrast in the output beam. A reference image or signal is obtained for a reference reticle portion that is designed to be identical to the test reticle portion. The test and reference images or signals are compared and it is determined whether the test reticle portion has any candidate defects based on such comparison. For each of a plurality of test reticle portions of the reticle, the operations for using the inspection tool, obtaining a reference image or signal, comparing, and determining are repeated. A defect report is generated based on any candidate defects that have been determined to be present.
    Type: Grant
    Filed: May 11, 2017
    Date of Patent: April 28, 2020
    Assignee: KLA-Tencor Corporation
    Inventors: Qiang Zhang, Rui-fang Shi
  • Patent number: 10634624
    Abstract: The device relates to a method and a device (10) for determining an irradiation plan for a particle irradiation unit (20). In the method, a target volume (6) within a test object (14; 18) is irradiated with a particle beam (16) using the particle irradiation unit (20) according to the irradiation plan. The radiation plan is determined in order to apply the energy of the particle beam (16) according to a predetermined dose distribution in the target volume (6), the target volume (6) and the predetermined dose distribution being pre-set. When determining the irradiation plan, irradiation duration is also taken into account, the irradiation plan being determined such that the irradiation duration is as short as possible.
    Type: Grant
    Filed: March 28, 2013
    Date of Patent: April 28, 2020
    Assignee: Siemens Aktiengesellschaft
    Inventors: Thilo Elsässer, Alexander Gemmel, Thomas Hansmann, Eike Rietzel
  • Patent number: 10634625
    Abstract: A transfer system includes a robot arm configured to hold a core, which is tubular, of at least one separator roll from a side of a first side surface of the at least one separator roll. The at least one separator roll includes the core and a separator, wound around an outer circumferential surface of the core. The robot arm is further configured to take out the at least one separator roll from a rack. A defect inspection device is configured to hold the core from a side of a second side surface of the at least one separator roll, receive the at least one separator roll from the robot arm, and inspect, for a defect, the at least one separator roll thus received.
    Type: Grant
    Filed: March 28, 2018
    Date of Patent: April 28, 2020
    Assignee: SUMITOMO CHEMICAL COMPANY, LIMITED
    Inventors: Yoshitaka Shinomiya, Yasuyuki Kondo, Koji Kashu
  • Patent number: 10634626
    Abstract: An apparatus and method for inducing high-speed wobble motions to a sample of interest is provided. After the sample is securely attached to a sample mounting block, the sample is variably tilted by using a hexapod stage and simultaneously rotated at a high speed about a rotation axis that is substantially perpendicular to a planar top surface of the hexapod stage. The position of the sample is continuously adjusted during the wobble motion to align a surface center of the sample with a testing center of an X-ray diffractometer. The simultaneous variable tilting and high-speed rotation of the sample induces wobble motions to the sample for randomizing orientations of a sample material's crystallites relative to the source and detector of an X-ray diffractometer.
    Type: Grant
    Filed: September 24, 2018
    Date of Patent: April 28, 2020
    Assignee: International Business Machines Corporation
    Inventors: Madhana Sunder, Conor R. Thomas
  • Patent number: 10634627
    Abstract: An autonomously mobile backscatter detection apparatus and method is disclosed. In one aspect, the apparatus includes a mobile platform configured to move freely in a horizontal plane. The apparatus further includes a backscatter detection imaging apparatus, arranged on the mobile platform, configured to acquire an image of an item to be inspected.
    Type: Grant
    Filed: May 31, 2017
    Date of Patent: April 28, 2020
    Assignee: Nuctech Company Limited
    Inventors: Ziran Zhao, Zhiqiang Chen, Dong Lin, An Cang, Jin Cui, Bin Hu, Chaoyan Zhang
  • Patent number: 10634628
    Abstract: An apparatus for X-ray measurement, includes an X-ray source, an X-ray detector, an optical inclinometer, and a processor. The X-ray source is configured to generate and direct an X-ray beam to be incident at a grazing angle on a surface of a sample. The X-ray detector is configured to measure X-ray fluorescence emitted from the surface of the sample in response to being excited by the X-ray beam. The optical inclinometer is configured to measure an inclination of the surface of the sample. The processor is configured to calibrate the grazing angle of the X-ray beam based on the measured inclination, and to further fine-tune the grazing angle based on the X-ray fluorescence measured by the X-ray detector.
    Type: Grant
    Filed: May 31, 2018
    Date of Patent: April 28, 2020
    Assignee: BRUKER TECHNOLOGIES LTD.
    Inventors: Nikolai Kasper, Juliette P. M. van der Meer, Elad Yaacov Schwarcz, Matthew Wormington
  • Patent number: 10634629
    Abstract: A method and system to develop the age and history of a crack by exposing a specimen or component to varying predetermined temperature range that covers the designated service temperatures and measuring the thickness of the oxide across the specimen along the thickness direction.
    Type: Grant
    Filed: May 23, 2018
    Date of Patent: April 28, 2020
    Assignees: Board of Trustees of the University of Arkansas, Chun-Ang University Industry-Academic Cooperation Foundation
    Inventors: Ashok Saxena, Ralph Edward Huneycutt, IV, Kee Bong Yoon
  • Patent number: 10634630
    Abstract: A method for determining the solids content, fines content and/or particle size distribution of the solids in an oil sands process stream test sample comprising bitumen, solids and water using low-field time-domain NMR is provided which involves building a non-solids partial least squares calibration model using oil sands process streams calibration samples having a known bitumen content, solids content, water content, fines content and/or particle size distribution by subjecting the calibration samples to a first T1-weighted T2 measurement NMR pulse sequence that maximizes very fast relaxing signals and a second T1-weighted T2 measurement NMR pulse sequence that maximizes slow relaxing signals. The measurement of other sample properties strongly correlated with surface area, such as methylene blue index, can also be measured using a partial least squares calibration model.
    Type: Grant
    Filed: April 3, 2017
    Date of Patent: April 28, 2020
    Assignee: SYNCRUDE CANADA LTD.
    Inventor: Richard Paproski
  • Patent number: 10634631
    Abstract: Various methods of diagnosing defects and disbonds in devices and materials are disclosed. In some embodiments, the methods involve cooling a portion of a material or device, heating a portion of the material or device with a heating instrument, terminating the application of heat to the material or device, and imaging the material or device using a thermal imager after heat is removed. In certain variants, disbonds and/or defects can be visualized as hotter areas and spots on the material through the thermal image.
    Type: Grant
    Filed: February 14, 2017
    Date of Patent: April 28, 2020
    Assignee: ITT MANUFACTURING ENTERPRISES LLC
    Inventors: A. David Sandiford, Tao Jiang
  • Patent number: 10634632
    Abstract: Systems and methods for non-destructive inspection (NDI) of target objects having non-planar surfaces (such as aircraft components having internal stiffeners). A robotic NDI platform is equipped with an NDI sensor and a laser-based alignment system. The laser-based alignment system is operated in a manner to acquire surface profile information in an area of interest on a non-planar surface of the target object. Then the acquired surface profile data is processed by a computer to generate a motion plan for automatically guiding the robotic NDI platform and the NDI sensor to the correct locations, where images of the area of interest may be captured.
    Type: Grant
    Filed: April 25, 2018
    Date of Patent: April 28, 2020
    Assignee: The Boeing Company
    Inventors: James J. Troy, Scott W. Lea, Gary E. Georgeson, Daniel James Wright
  • Patent number: 10634633
    Abstract: The present disclosure enables apparatus and methods for tracking medications and/or product units via smart-packaging concepts. Embodiments include sensors that monitor the state of a blister-card package having an unpatterned lidding film by measuring the impedance of each dispensing region of the lidding film that defines a portion of a blister. In some embodiments, the impedance is measured via a plurality of contact points arranged on opposite sides of each dispensing region, where the contact points are resistively or capacitively coupled with the lidding film. In some embodiments, the impedance map of a measurement region on the blister card is derived via electrical impedance tomography or electrical resistance tomography, where the measurement region includes a plurality of dispensing regions.
    Type: Grant
    Filed: October 10, 2018
    Date of Patent: April 28, 2020
    Assignee: QuantaEd, LLC
    Inventor: Mehran Mehregany
  • Patent number: 10634634
    Abstract: Disclosed is a microsensor package. Particularly, disclosed is a microsensor package, in which a sensing chip is packaged by using PCBs stacked on top of one another, whereby the thickness of the package slim can be kept slim, and at the same time, it can be manufactured at a low cost and can be easily manufactured.
    Type: Grant
    Filed: September 12, 2017
    Date of Patent: April 28, 2020
    Assignee: POINT ENGINEERING CO., LTD.
    Inventors: Bum Mo Ahn, Seung Ho Park, Sung Hyun Byun
  • Patent number: 10634635
    Abstract: A dielectric constant microscope to observe a shape of a micro organic specimen includes first and second insulating films that are disposed to oppose each other such that the organic specimen along with the solution is interposed therebetween, and application-side conductive films P1 to Pn (where n is an integer greater than 1). The application-side conductive films are separated from each other on an outward surface of the first insulating film. Additionally, the dielectric constant microscope includes measurement-side conductive films p1 to pm (where m is an integer greater than 1) that are separated from each other on an outward surface of the second insulating film.
    Type: Grant
    Filed: March 7, 2017
    Date of Patent: April 28, 2020
    Inventor: Toshihiko Ogura
  • Patent number: 10634636
    Abstract: A relative humidity sensor is disclosed. The relative humidity sensor includes a first electrode and a second electrode disposed above a dielectric substrate. A humidity sensitive layer is disposed above at least one of the first electrode and the second electrode, where the humidity sensitive layer comprises a curable composition comprising cellulose acetate butyrate and a hydrophobic filler. In some embodiments, a dust protection layer is disposed above the humidity sensitive layer.
    Type: Grant
    Filed: February 2, 2017
    Date of Patent: April 28, 2020
    Assignee: HONEYWELL INTERNATIONAL INC.
    Inventors: Bogdan-Catalin Serban, Mihai Brezeanu, Octavian Buiu, Cornel P. Cobianu
  • Patent number: 10634637
    Abstract: Methods and sensors for selective fluid sensing are provided. A sensor includes a resonant inductor-capacitor-resistor (LCR) circuit and a sensing material disposed over the LCR circuit. The sensing material includes a coordination compound of a ligand and a metal nanoparticle. The coordination compound has the formula: (X)n-M, where X includes an alkylamine group having the formula (R—NH2), an alkylphosphine having the formula (R3—P), an alkylphosphine oxide having the formula (R3P?O), an alkyldithiocarbamate having the formula (R2NCS2), an alkylxanthate having the formula (ROCS2), or any combination thereof, R includes an alkyl group, n is 1, 2, or 3, and M includes the metal nanoparticle of gold, silver, platinum, palladium, alloys thereof, highly conductive metal nanoparticles, or any combination thereof. The sensing material is configured to allow selective detection of at least six different analyte fluids from an analyzed fluid mixture.
    Type: Grant
    Filed: October 26, 2017
    Date of Patent: April 28, 2020
    Assignee: General Electric Company
    Inventors: Radislav Alexandrovich Potyrailo, Cheryl Margaret Surman, Binil Kandapallil
  • Patent number: 10634638
    Abstract: A solid state electrolyte and method of preparation is provided. The solid state electrolyte includes a plasticized polymer matrix with non-dissolved salt crystals embedded in the polymer matrix and wherein the non-dissolved crystals are suitable for dissolving ions in the plasticized polymer. The method of preparation includes dissolving a plasticizer and a polymer matrix in an organic solvent to obtain a plasticized polymer matrix; and mixing the salt crystals with the plasticized polymer matrix, wherein the weight ratio of salt crystals versus plasticizer and polymer matrix and organic solvent is above saturation concentration such that non-dissolved salt crystals are embedded in the plasticized polymer matrix.
    Type: Grant
    Filed: June 27, 2017
    Date of Patent: April 28, 2020
    Assignee: Stichting IMEC Nederland
    Inventors: Van Anh Dam, Daan Wouters, Alexander Farrell
  • Patent number: 10634639
    Abstract: A method for producing a gas sensor element (10), the gas sensor element including a diffusive porous layer (113) disposed in a measurement chamber (111) and exposed to the outside and a ceramic insulating layer (115) forming sidewalls of the measurement chamber. The method includes transferring green diffusive porous layer pieces (113x) cut in advance so as to have prescribed dimensions onto a first ceramic green sheet (110x); applying an insulating paste which later becomes the ceramic insulating layer to the first ceramic green sheet; laminating the first ceramic green sheet onto a second ceramic green sheet (120x) to form a ceramic laminate (200x); cutting the ceramic laminate along prescribed cutting lines C to obtain a plurality of gas sensor element pieces 10x; and firing the gas sensor element pieces.
    Type: Grant
    Filed: May 8, 2018
    Date of Patent: April 28, 2020
    Assignee: NGK SPARK PLUG CO., LTD.
    Inventors: Ai Igarashi, Kouji Toida, Akinori Kojima, Akihiro Hara, Hitoshi Furuta
  • Patent number: 10634640
    Abstract: A gas sensor includes a sensor element having a measuring electrode and a reference electrode, a housing accommodating the sensor element, and an element cover including an inner cover having an inner side wall section and an inner bottom wall section, and an outer cover having an outer side wall section and an outer bottom wall section. Inner side surface holes and outer side surface holes are formed in the inner side wall section and the outer side wall section. Inner bottom surface holes and outer bottom surface holes are formed in the inner bottom wall section and the outer bottom wall section. The ratio of the total surface area of the outer side surface holes with respect to the total surface area of the inner bottom surface holes is 8 to 47. The total surface area of the inner side surface holes is 2 to 8 mm2.
    Type: Grant
    Filed: June 29, 2015
    Date of Patent: April 28, 2020
    Assignee: DENSO CORPORATION
    Inventors: Keisuke Mizutani, Nobuyuki Tsuji
  • Patent number: 10634641
    Abstract: A sensor system includes a common gas chamber and a reference gas chamber respectively configured to receive an exhaust gas and a reference gas. A Nernst cell is exposed to the common gas chamber and the reference air chamber. The Nernst cell provides a reference signal indicative of an oxygen difference between the common gas chamber and the reference air chamber. An oxygen electrochemical pump cell is exposed to the common gas chamber and exhaust gas and provides an oxygen signal indicative of an oxygen only concentration. A NOx electrochemical cell is exposed to the common gas chamber and provides a NOx signal indicative of a NOx concentration. A processor is in communication with the Nernst cell, the oxygen-only electrochemical pump cell and NOx electrochemical cells. The processor outputs oxygen and NOx signals and provide a NOx concentration and oxygen concentration of the exhaust.
    Type: Grant
    Filed: March 2, 2017
    Date of Patent: April 28, 2020
    Assignee: DELPHI TECHNOLOGIES IP LIMITED
    Inventors: Da Yu Wang, David M. Racine, Sheng Yao
  • Patent number: 10634642
    Abstract: An assay device (10) is provided. The device comprises an integrated circuit (IC) (16) comprising a plurality of ISFETs (18); an over-moulded layer (17) which partially covers the IC, such that the plurality of ISFETs remain uncovered; and a film (20) provided across substantially the entire IC. The film acts as a passivation and/or sensing layer for each of the ISFETs. In addition, the film acts as a barrier layer to encase the over-moulded layer.
    Type: Grant
    Filed: May 15, 2017
    Date of Patent: April 28, 2020
    Assignee: DNAE GROUP HOLDINGS LIMITED
    Inventor: Zahid Ansari
  • Patent number: 10634643
    Abstract: A NOx sensor includes a pump cell, a monitor cell, and a sensor cell, and the pump cell discharges an oxygen in an exhaust gas introduced into a chamber. The sensor cell outputs a detected signal depending on a concentration of a NOx according to a gas after the oxygen is discharged. A microcomputer of a sensor control circuit temporarily changes an amount of the oxygen discharged by the pump cell, and then calculates output change amounts ?Ip, ?Is, and ?Im of the cells. The microcomputer performs a correction of the concentration of the NOx detected by the sensor cell and a deterioration diagnosis of the sensor cell, based on the output change amounts ?Ip, ?Is, and ?Im of the cells. When the sensor cell current Is is smaller than the monitor cell current Im, the microcomputer determines that the NOx sensor has an abnormality.
    Type: Grant
    Filed: December 11, 2017
    Date of Patent: April 28, 2020
    Assignee: DENSO CORPORATION
    Inventors: Ryozo Kayama, Yukihiro Yamashita, Yoshihiro Sakashita
  • Patent number: 10634644
    Abstract: To suppress baseline current other than baseline current derived from the ionization of impurities, and to achieve the enhancement of the SN ratio of a detection signal and the improvement of the lower limit of detection, the inner diameter of a bias electrode for collecting an ion derived from a sample component is made smaller than the inner diameter of an insulating member separating the bias electrode and a collector electrode. Light emitted from plasma formed by dielectric barrier discharge is shielded by the bias electrode, so that the light is not cast directly on the surface of the insulating member. Therefore, the photoelectric effect caused by casting light of high energy does not occur on the surface of the insulating member, whereby a decrease in electric resistance of the surface can be prevented.
    Type: Grant
    Filed: May 19, 2016
    Date of Patent: April 28, 2020
    Assignee: SHIMADZU CORPORATION
    Inventor: Kei Shinada
  • Patent number: 10634645
    Abstract: An eddy current probe for nondestructive evaluation of an object made of an electrically conductive material with a planar or curved surface, comprising: an excitation portion, consisting of a plurality of multi-turn conductive coils and a bar core, the bar core having a primary surface in proximity to the outer surface of the object to be inspected, each multi-turn coil formed by winding a conductor along the core with each wound equally spaced and parallel on the primary surface of the core, multi-turn coils intersecting from one to another on the primary surface of the core and forming a plurality of congruent grid shapes with the winding conductors, each multi-turn coil is energized by an AC current with each of AC currents at a phase difference from one to another; and a sensing portion, consisting of a plurality of magnetic field sensors with each of the sensors positioned in proximity to the symmetric center of congruent grid shapes, each magnetic field sensor having a sensitivity axis is placed with i
    Type: Grant
    Filed: June 1, 2018
    Date of Patent: April 28, 2020
    Assignee: LabSys LLC
    Inventors: Xiaopeng Bi, Stanley Zuo, Yue Huang
  • Patent number: 10634646
    Abstract: The present invention relates to a system and method for molecular and/or atomic level detection of elements forming contraband such as concealed explosives, drugs, smuggled goods, etc., through the use of an acoustic frequency detector having a crystalline transducer module and elemental and mass comparator. The present invention can be employed in a non-destructive manner for the mobile and stationary inspection of objects such as luggage, persons, containers, etc., through a combination of computer-aided techniques and algorithms combined with a crystalline and oil enhanced transducer that, upon return of a system-generated acoustic signal, are used to screen and confirm explosive threats and/or other contraband.
    Type: Grant
    Filed: April 27, 2019
    Date of Patent: April 28, 2020
    Assignee: GTBM, Inc.
    Inventors: Vincent Tortoriello, Richard Picolli
  • Patent number: 10634647
    Abstract: An abnormal noise detection method of a steering system is configured to detect an abnormal noise from the steering system. The steering system includes a column shaft configured to rotatably support a steering wheel and is configured to steer a wheel in response to rotations of the column shaft. The method includes measuring a sound from an end portion of the column shaft on a steering wheel-side by using a microphone arranged to face the end portion of the column shaft, and generating an abnormal noise detection signal due to the steering system from a sound signal to be output from the microphone.
    Type: Grant
    Filed: March 30, 2017
    Date of Patent: April 28, 2020
    Assignee: NSK LTD.
    Inventors: Yoshihiro Sato, Yasushi Muto, Masayuki Kanatsu