Abstract: The disclosed semiconductor testing socket comprises a testing socket body, a guiding frame, and a height adjusting mechanism. The guiding frame is mounted above the testing socket body and is provided with a central insertion opening. The height adjusting mechanism is embedded at the edges of the central insertion opening. The height adjusting mechanism comprises an operable part that can be operated and a movable part that can be moved between a first position located outside the central insertion opening and a second position located within the central insertion opening by operating the operable part. The movable part comprises a supporting surface configured for supporting a specimen to be tested when located at the second position.

Abstract: A measurement unit includes: a ground portion forming a part of a line configured to provide continuity for grounding electric potential, the ground portion including a surface forming a plane at one end of the ground portion; a signal portion forming a part of a line configured to provide continuity for a signal for measurement, the signal portion including an end portion configured to come out in a plane that is same as the plane of the ground portion; an insulative dielectric portion provided between the ground portion and the signal portion; an electrically conductive first contact probe configured to expand and contract along a longitudinal axis, the first contact probe coming into contact with the signal portion; and an electrically conductive second contact probe configured to expand and contract along a longitudinal axis, the second contact probe coming into contact with the ground portion.

Abstract: A probe head structure is provided. The probe head structure includes a flexible substrate having a top surface and a bottom surface. The probe head structure includes a first probe pillar passing through the flexible substrate. The probe head structure includes a redistribution structure on the top surface of the flexible substrate and the first probe pillar. The probe head structure includes a wiring substrate over the redistribution structure. The probe head structure includes a first conductive bump connected between the wiring substrate and the redistribution structure.

Abstract: A semiconductor wafer testing apparatus tests a device under test (DUT) on a semiconductor wafer. The semiconductor wafer testing apparatus includes a first wiring board including first connectors and that is electrically connected to a probe card having probes that contact the DUT, second wiring boards each including a second connector configured to be fitted to a respective one of the first connectors, and adjusting mechanisms that adjust a flatness of the first wiring board by changing a position of the second wiring boards along a normal direction of the first wiring board when the first connectors are fitted to the second connectors.

Abstract: The invention relates to a resistor, in particular a low-resistance current-sensing resistor, with two connection parts made of a conductor material and a resistor element made of a resistor material. Furthermore, the resistor has two pairs of voltage measuring contacts for measuring the voltage dropping across the resistor element in two separate voltage measuring channels. The invention provides that the two pairs of voltage measuring contacts are arranged crosswise so that a connection line of the two voltage measuring contacts of the first pair of voltage measuring contacts intersects with a connection line of the two voltage measuring contacts of the second pair of voltage measuring contacts in a top view of the resistor.

Abstract: A current sensor me includes an electrically conductive busbar with an upper side and a lower side. A cutout is formed adjacent to a tapering of the busbar. A carrier of a magnetic detection element is positioned relative to the cutout such that the magnetic detection element is positioned one of above the upper side or below the lower side of the busbar relative to the busbar.

Abstract: An absence of voltage indicator has an isolation circuit, an FM modulator attached to the isolation circuit, a reference oscillator, and a mixer attached to the reference oscillator and the FM modulator, wherein the output of the mixer is the difference of the two signals. In one embodiment, the FM modulator includes a variable capacitor which varies in response to a voltage in parallel to a fixed capacitor and an inductor in parallel to the capacitors.

Abstract: A power stage, comprising of multiple power MOSFETs and control and monitoring circuits, is an important part of voltage regulators. The voltage regulator controller typically monitors the power stage output current to implement control and protection functions. Traditional power stages mostly adapt monolithic solutions, suffering from performance inefficiencies due to the LDMOS process, while co-packaged solutions with combined VDMOS and LDMOS processes suffer from potential large current monitoring errors due to different operating temperatures. The current invention proposes a current monitoring circuit with temperature compensation to cancel the temperature coefficient mismatch between the external power MOSFET and the current monitoring circuit.

Abstract: A method for determining charging information with regard to a charging operation at a non-public location includes receiving metering data from an electricity meter for a charging point, the electricity meter being configured to capture metering data relating to a charging current provided at the charging point. The method also includes receiving, from a vehicle, charging operation data with regard to a charging operation of the vehicle at the charging point, the charging operation data including time information with regard to a beginning and an end of the charging operation. The method also includes determining, based on the metering data and the charging operation data, charging information about a total amount of power which has been provided by the charging point to the vehicle during the charging operation.

Abstract: A non-destructive measurement method and apparatus for the turn-to-turn resistivity distribution (TTRD) in non-insulation (NI) superconducting coils. The method includes: during the discharging or charging process, obtaining experimental values of voltage varying over preset time at different positions of the test coil; dividing the test coil into a plurality of measurement units and obtaining basic circuit elements; then constructing a preset equivalent circuit model including the basic circuit elements; based on the constructed equivalent circuit model, obtaining the first simulated values of voltage varying over preset time at different positions of the test coil; finally, determining the TTRD of the test coil based on the fitness value between experimental values and the first simulated values. When there is high fitness value between the first simulated values and experimental values, the TTRD corresponding to the first simulated values is considered as the TTRD within the test coil.

Abstract: A mounting apparatus for a modular antenna is described, wherein the mounting apparatus is attachable to a plurality of different radiation apparatus or modules and/or to a plurality of different feeding apparatus or modules. The mounting apparatus has a surface facing a measurement direction, wherein the surface is configured such that a surface parameter of the mounting apparatus is smaller than a predefined threshold, wherein the surface parameter is associated with a ratio of a first projected area and a second projected area. The first projected area corresponds to an area confined by the surface of the mounting apparatus facing the measurement direction and projected onto a plane being perpendicular to the measurement direction. The second projected area corresponds to an aperture of the modular antenna projected onto the plane being perpendicular to the measurement direction. Further, a modular antenna and an over-the-air measurement system are described.

Abstract: The inspecting device is an inspecting device that generates a spatial distribution image of an electric field, the inspecting device including: an electric field obtainer that measures the spatial distribution of the electric field at at least one measurement position determined relative to a scanning position, outside an object that emits the electric field; a scanner, by scanning the electric field obtainer, that obtains a measurement result of the spatial distribution of the electric field at a plurality of measurement positions determined relative to a plurality of scanning positions; and a calculator that calculates the spatial distribution of the electric field in a region including a surface of the object using the measurement result of the spatial distribution of the electric field as a boundary condition, and generates the spatial distribution image that shows the spatial distribution that has been calculated.

Abstract: Systems, methods, and media for E-field determination are provided.

Abstract: The invention relates to the field of magnetic resonance, and in particular to determining a location of an error in a supply or signal line. Due to the rugged environment for MR systems in hospitals supply or signal lines of MR systems are error prone. For serviceability and part replacement it is important to locate the error in the supply or signal line or to identify the subunit of the supply or signal line in which the error occurred. The basic idea of the invention is to use an additional impedance, that is coupled to the supply or signal line of the MR system in the region of interconnection for locating the error in the supply or signal line. The additional impedance provides a reference impedance value. By measuring the impedance and comparing the measured impedance to the reference impedance value, the error in the supply or signal line can be located. In one embodiment the additional impedance is realized as additional capacitance and provided as a capacitor.

Abstract: A method for estimating a voltage support strength of a renewable energy grid-connected power system. A first short-circuit ratio index of a renewable energy grid-connected power system is determined based on a short-circuit capacity provided for a grid connection point by an alternating-current system, An equivalent grid connection capacity of renewable energy at the grid connection point is determined. A second short-circuit ratio index of the renewable energy grid-connected power system is determined based on a voltage variation at a position where the renewable energy is connected to the grid connection point. A critical short-circuit ratio of the renewable energy grid-connected power system determined based on a parameter of the alternating-current system and an equivalent maximum transmission power.

Abstract: A method for assessing the aging or monitoring the status of an electrical device that has a solid insulation arrangement and a liquid and/or gaseous insulating medium in contact with the solid insulation arrangement. In a first step S1, a thermo-hydraulic aging model is provided and a simulation for the electrical device is carried out. S2) local temperatures are calculated for various areas of the electrical device in the scope of the simulation; and S3) amounts of at least one aging product, which arises due to the aging of the solid insulation arrangement and passes into the insulating medium, are calculated for the various areas. There is also provided a corresponding computer program and a computer-readable medium.

Abstract: An arc detection assembly is provided and includes a first conductor comprising a first terminal end, a second conductor comprising a second terminal end, an enclosure to partially enclose a space in which the first and second terminal ends are engageable to form an electrical connection and an optical detection system. The optical detection system includes an optical element within the enclosure with a line-of-sight to an engagement of the first and second terminal ends and a sensor. The sensor is displaced from the enclosure and coupled to the optical element. The sensor is configured to determine when the optical element senses an arcing condition between the first and second terminal ends.

Abstract: A secondary battery cell insulation test apparatus may include: a first probe portion disposed to be in contact with a case of a secondary battery cell; a second probe portion disposed to be in contact with an electrode tab of the secondary battery cell; and a tester for measuring insulation resistance of the secondary battery cell in a state in which the first probe portion and the second probe portion are disposed to be in contact with the secondary battery cell, wherein the first probe portion is in line contact or surface contact with the case.

Abstract: A method includes providing a semiconductor package comprising an encapsulant body and a plurality of leads that protrude out from the encapsulant body, providing a semiconductor device testing apparatus including a package holder, a plurality of contact test probes, and a lead extender, arranging the semiconductor package within the package holder, actuating the semiconductor device testing apparatus such that a first one of the contact test probes directly contacts a first one of the leads and such that a second one of the contact test probes directly contacts the lead extender, and applying a test current to the semiconductor package such that part of the test current flows through the first one of the contact test probes directly contacting the first one of the leads and such that part of the test current flows through the second one of the contact test probes directly contacting the lead extender.

Abstract: A test system includes a to-be-tested die including a to-be-tested transistor and a sense transistor, and a test device including a signal amplifying unit, a testing unit, and a probe card connecting the signal amplifying unit and the testing unit to the die. The signal amplifying unit has a first terminal connected to the to-be-tested transistor, and second and third terminals connected to the sense transistor. The signal amplifying unit stabilizes voltages at the second and third terminals based on a voltage at the first terminal, and generates an amplification voltage based on the voltages at the first to third terminals. The testing unit provides test signals to the to-be-tested transistor, determines magnitudes of currents flowing through the to-be-tested transistor and the sense transistor based on the test signals, the amplification voltage and a predetermined resistance, and thus acquires a current ratio to determine whether the die is defective.

Abstract: A testing device and a testing method thereof. The testing device includes a controller and a data storage device. The controller receives multiple command sequences respectively sent by application platforms through an input interface. The data storage device stores multiple circuit information corresponding to each of the application platforms and each of the command sequences corresponding to each of the application platforms. The controller, during a test period, is connected to at least one device under test through an output interface. The controller executes a test operation on the at least one device under test according to each of the circuit information corresponding to each of the application platforms and each of the command sequences corresponding to each of the application platforms.

Abstract: Apparatuses, systems, methods, and computer program products for massively independent testers systems are disclosed. An apparatus includes a controller, a substrate, a device interface board, multiple tester modules mounted on the substrate, and/or one or more interface buses. One or more components for tester modules are mounted on a device interface board. Tester modules are configured to perform both independent functional and parametric tests. One or more interface buses are in communication with a controller, multiple tester modules, and/or a device interface board to provide one or more of power and a communication link.

Abstract: Embodiments of the present invention provide a DUT air duct shroud that can receive and house DUTs of a specific form factor, and can advantageously be adapted to house and cool DUTs of a different (e.g., narrower) form factor. The DUT shrouds described herein guide the DUT into the correct position and orientation to be received by the test system for quick and convenient installation, and advantageously redirect the air flow to the narrower form factor for effective cooling during testing. The DUT shrouds can be used in conjunction with device interface boards and similar components used to test memory devices and computer hardware using active cooling systems, and embodiments are also operable to house and cool consumer memory devices of different form factors.

Abstract: Systems, methods, and circuitry are provided for a sorting array. In one example, a sorting array element includes an output register and control circuitry. The output register is configured to store an output value. In response to a cell under test (CUT) load signal the output register stores a CUT value and in response to a first register shift signal from a previous sorting array element the output register stores contents of an output register of the previous sorting array element. The control circuitry is configured to generate the CUT load signal and a second register shift signal for a subsequent sorting array element based on relative magnitudes of the CUT value, the output value, and an output value stored in the output register of the previous sorting array element.

Abstract: A system-on-chip includes a clock generation circuit configured to generate a reference clock of a first phase; a transmission circuit comprising a serializer configured to serialize data according to the reference clock of the first phase; a reception circuit comprising a clock data recovery (CDR) circuit configured to receive the serialized data and generate a first recovery clock and recovery data; and a Built In Self Test (BIST) circuit including a CDR performance monitoring circuit configured to generate a control signal provided to a delay controller configured to delay a clock signal by a preset phase difference, and the delay controller configured to delay the clock signal in response to the control signal by the preset phase difference and provide the delayed clock signal to the transmission circuit.

Abstract: According to one or more embodiments of the disclosure, an apparatus comprising a plurality of active regions on a semiconductor substrate, an active bridge region connecting two active regions among the plurality of active regions, and a plurality of test circuit elements on the active bridge region and the two active regions.

Abstract: The present invention relates to a test method for testing the disconnection function of a main switch device (110) of an electrical connection device (100) of a fuel cell system (200), the method having the following steps: generating a voltage variation (VV) on the low-voltage side (LVS) of a transformer device (120), switching a negative main switch (112) of the main switch device (110), detecting a voltage difference (VD) between a low voltage (LV) of the low-voltage side (LVS) of the transformer device (120) and a system voltage (SV) of the fuel cell system (200), comparing the voltage difference (VD) detected with a zero value (NW).

Abstract: An abnormality diagnosis device performs determination for at least one of abnormality of an electric motor driven by an inverter driven at a predetermined operation frequency and abnormality of a motive power transmission mechanism which transmits motive power from the electric motor to a load, wherein spectrum peaks extracted through FFT analysis of detected current of the electric motor are analyzed, and frequencies of spectrum peaks due to noise of the inverter are acquired in advance using the operation frequency and the frequencies of sideband waves with respect to the operation frequency. In abnormality diagnosis, abnormality determination is performed after spectrum peaks due to noise of the inverter are extracted from spectrum peaks extracted through FFT analysis of detected current of the electric motor.

Abstract: A short circuit detection device for a rotating electrical machine includes: a signal processing device including a signal acquisition unit, a signal decomposing unit, a specific frequency component reducing unit, a signal conversion unit, and a short circuit detection unit; and a magnetic detector placed inside a stator, and detects short circuit of a field winding. The signal decomposing unit decomposes a voltage signal from the signal acquisition unit into a plurality of frequency components having different orders. The specific frequency component reducing unit reduces frequency components for odd-number orders and frequency components for even-number orders higher than a threshold less than a fundamental order of a slot harmonic. The signal conversion unit performs conversion to a voltage signal. The short circuit detection unit generates a difference waveform between voltage signals corresponding to magnetic poles, and detects short circuit of the field winding and a short circuit position thereof.

Abstract: A secondary battery cell insulation test apparatus In an embodiment of the present disclosure may include: a first probe portion disposed to be in contact with a case of a secondary battery cell; a second probe portion disposed to be contact with an electrode tab of the secondary battery cell; and a tester for measuring insulation resistance of the secondary battery cell in a state in which the first probe portion and the second probe portion are disposed to be in contact with the secondary battery cell, wherein the first probe portion may include a probe assembly to contact the case at a plurality of points.

Abstract: Circuitry for processing an analyte signal obtained from an electrochemical cell, the circuitry comprising: measurement circuitry having a first input coupled to a first electrode of the electrochemical cell, the measurement circuitry configured to convert the analyte signal at the first electrode to a first analog output signal; a first analog-to-digital converter (ADC) having an first ADC input for receiving the first analog output signal, the first ADC configured to convert the first analog output signal to a first digital output signal at a first ADC output; drive circuitry; and control circuitry, wherein the circuitry is operable in one or more of a calibration mode and a measurement mode, wherein, in the calibration mode, the drive circuitry is configured to apply a calibration signal at the first input of the measurement circuitry, the control circuitry configured to calibrate the measurement circuitry based on the first analog output signal or the first digital output signal responsive to the calibrat

Abstract: The present disclosure provides techniques and solutions for obtaining state of charge estimates for one or more battery cells. A set of values is obtained for a set of one or more battery cells. The set of values includes a least one voltage measurement, at least one present current measurement, and at least one temperature measurement. The set of input values is submitted to a state of charge estimation model, as well as at least one prior current value for the set of one or more battery cells. A state of charge estimate is received for the set of one or more battery cells. In various implementations, the state of charge estimation model can be implemented as a machine learning model or as a lookup table. An estimate from the charge estimation model may be combined with one or more other state of charge estimates.

Abstract: A system for control of a battery system includes a processor electrically connected to the battery system. The processor is configured to perform, in real time during a charging process, acquiring a set of charging parameter measurements, and estimating a dynamic performance variable in real time, the dynamic performance variable related to an electrochemical phenomenon occurring within the battery system during the charging process. The processor is also configured to perform, in real time during the charging process, determining a charging limit based on the dynamic performance variable and a model of the battery system, predicting a future state of the battery system, generating a target current profile based on the future state and the charging limit, the target current profile configured to maintain the dynamic performance variable within the charging limit, and controlling the current applied to the battery system based on the target current profile.

Abstract: A power supply monitoring device is applied to a power supply system. The system includes a first system having a first load and a second system having a second load. The first and second systems are connectable by an inter-system switch. The second system is connected with a power supply unit. In the first system, loads are connected in parallel as the first load, and fuses are provided to energization paths connected to the loads. The device includes a monitoring unit monitoring voltage reduction in the first system when the first and second loads are driven in a state in which the inter-system switch is closed, and a switch operation unit allowing the inter-system switch to conduct electricity in a state in which a conduction current in the inter-system switch is limited during a time period from voltage reduction, if the monitoring unit determines that the voltage reduction has occurred.

Abstract: A state determination device for a fuel cell stack includes: a fuel cell stack including at least one cell; and a control device that performs a state determination of the fuel cell stack by applying a measurement load waveform to the cell. The control device: generates a learning waveform; generates a measurement load waveform to be used this time by using, as reference values, membrane resistance, charge transfer resistance, and diffusion resistance in a relationship between a measurement frequency and an impedance that are generated based on the learning waveform; applies, to the cell, a waveform with an amplitude and frequencies that are calculated based on the measurement load waveform; and performs the state determination by measuring an alternating-current impedance by discharging, from the cell, a current or a voltage corresponding to a frequency of the measurement load waveform.

Abstract: An electrochemical impedance spectroscopy (EIS) current measurement system for measuring a current through a cell arrangement including one or more electrochemical cells can include a parallel arrangement of a plurality of sense resistors, which can be configured to be placed in series with the cell arrangement, and voltage measurement circuitry, which can be configured to measure respective voltages across corresponding ones of the sense resistors.

Abstract: An electrochemical impedance spectroscopy (EIS) current measurement system for measuring a current through a cell arrangement including one or more electrochemical cells can include a sense resistor arrangement, which can be configured to be placed in series with the cell arrangement, and voltage measurement circuitry, which can be configured to measure a voltage across the sense resistor arrangement, including to measure at least a direct current (DC) component of the voltage, where a current through the sense resistor arrangement can have a DC component and an alternating current (AC) component.

Abstract: A method for selecting one or more gain values in an electrochemical impedance spectroscopy (EIS) current measurement system to provide an improved signal-to-noise characteristic can include selecting a larger one of an electrochemical cell arrangement impedance indication value and a sense resistor arrangement impedance indication value and using the selected impedance indication value as a determined impedance indication value. The method can also include determining, for a plurality of gain setting combinations, an EIS excitation current value at which current measurement circuitry of the current measurement system will reach a specified amount of a non-saturation range of the current measurement system when measuring the determined impedance indication value.

Abstract: An energy storage system is provided and comprises a battery management unit; a controller configured to start an idle condition timer, measure a voltage of a battery cell of a battery connected to the battery management unit while the battery is idle, after the idle condition timer has expired, start a steady condition timer, measure the voltage of the battery cell while the battery is on, after the steady condition timer has expired, calculate a total resistance of the battery cell, and calculate an open circuit voltage of the battery cell using the total resistance.

Abstract: A drive system includes: a first electrical network configured to convert time-varying power to direct current (DC) power; a second electrical network configured to convert DC power to time-varying power; an energy storage apparatus electrically connected to the first electrical network and the second electrical network; an estimation circuit including: an isolation switch configured to isolate the energy storage apparatus from the second electrical network, a discharge control switch, and an electrical sensor configured to measure electrical data related to the energy storage apparatus; and a control system configured to estimate a remaining life of the energy storage apparatus based on data measured by the sensor while the capacitive network is isolated.

Abstract: A system and method are described for monitoring batteries at various phases of their lifecycle. The batteries may be monitored in non-operational and operational states. The monitoring may be done wirelessly. The information gathered from monitoring the batteries may be used to make decisions about the use of a battery.

Abstract: It is an object to provide a technology that can simplify wiring for a battery sensing unit. A battery sensing unit including a circuit board; a monitoring circuit that is mounted on the circuit board and is configured to monitor the state of the battery pack; and a first connector and a second connector that are mounted on the circuit board and are for connecting the monitoring circuit to an external device. The circuit board is provided spanning from a first end portion to a second end portion of the battery pack in an arrangement direction in which the plurality of battery cells are arranged, the first connector is provided at the first end portion and the second connector is provided at the second end portion, and the circuit board includes a conductive pattern that connects the first connector and the second connector to the monitoring circuit.

Abstract: The present invention relates to a system for diagnosing a battery cell by using a direct BMS, and more particularly, to a system for diagnosing a battery cell by using a direct BMS, in which the direct BMS physically and electrically makes direct contact with an electrode of each of battery cells to measure a voltage of each of the battery cells and currents of the battery cells, calculate an impedance of each of the battery cells based on the measured voltage and the measured current, diagnose a state of each of the battery cells through the impedance, and wirelessly transmit a diagnosis result to a master BMS.

Abstract: A tester apparatus is provided. Slot assemblies are removably mounted to a frame. Each slot assembly allows for individual heating and temperature control of a respective cartridge that is inserted into the slot assembly. A closed loop air path is defined by the frame and a heater and cooler are located in the closed loop air path to cool or heat the cartridge with air. Individual cartridges can be inserted or be removed while other cartridges are in various stages of being tested or in various stages of temperature ramps.

Abstract: A ground fault detection system for a power system having a DC link, a battery bank, a link capacitor unit connected to the DC link, and plural power converters connected to the DC link. The power converters convert first DC power from the DC link to at least one of AC power or second DC power for powering at least one electrical load. A control unit disconnects the battery bank from the DC link responsive to detection of a ground fault, to deactivate operation of the power converters, and to sequentially at least partially activate, with power from the link capacitor unit, each of the power converters individually until a sensed voltage signal of the DC link is indicative of the ground fault being associated with one of the power converters.

Abstract: A method for checking an interface for the wired transmission of electrical signals to an electronics unit, arranged in a vacuum-tight housing, of an optics module comprises: a) coupling a first bundle of the interface to the electronics unit; b) connecting a test device to a free end of the first bundle; c) applying an electrical test signal generated by the test device to a specific pair of electrical lines of the first bundle; d) acquiring an electrical response signal from the specific pair of electrical lines; e) comparing the acquired response signal with a response signal predetermined for the specific pair, and f) determining whether a defect is present in one of the electrical lines of the pair on the basis of the comparison.

Abstract: A method of evaluating a power storage device comprises the following (a) to (d) in this order: (a) placing a metal piece on an outer surface of an electrode assembly; (b) pushing the metal piece into the electrode assembly; (c) detecting a short circuit based on a change in potential difference between an electrode inside the electrode assembly and the metal piece; and (d) stopping the pushing the metal piece. The (b) includes using a push jig and a guide jig. The guide jig is provided with a through hole. The push jig is inserted into the through hole. The metal piece has a ring shape. The metal piece is placed inside the through hole. A hardness of the push jig is equal to or more than a hardness of the metal piece.

Abstract: A platform provides precise thermal regulation of cryogenic electronic circuits. The platform includes a cold distribution plate, cold blades, heaters, and a thermal regulator. The cold distribution plate couples to a cryogenic cooler for cooling the cold distribution plate. The cold blades contact and extend from a periphery of the cold distribution plate. The cold blades support and cool the cryogenic electronic circuits, which include a respective cryogenic electronic circuit disposed on each of the cold blades. The heaters heat the cold blades, with the heaters including a respective heater disposed at each of the cold blades. The thermal regulator controls the heaters to maintain a predetermined temperature at each of the cryogenic electronic circuits.

Abstract: A device (10) and a method for determining the magnetic flux density are disclosure which provide a simple and cost-effective sensor unit which still has a good usability. In particular, a correspondingly produced sensor is also very small and can be used in a mobile manner.

Abstract: The invention discloses a fluxgate chip packaging structure thereof. The fluxgate chip packaging structure comprises a fluxgate bare chip, a conductive pin, and a packaging layer wrapping the fluxgate bare chip and a pin tail of the conductive pin; and the fluxgate bare chip is electrically connected to the pin tail. Based on the fluxgate bare chip, the fluxgate chip packaging structure forms a universal chip which can be applied to a fluxgate current sensor; during use, the fluxgate bare chip can be quickly connected to the fluxgate current sensor through the conductive pin, and the fluxgate chip packaging structure can be matched with the internal structure of existing fluxgate current sensors to realize magnetic field detection of sensors; and the fluxgate chip packaging structure can completely replace traditional enameled wire probes, thus greatly reducing the probe size.