Using An Energy Beam Or Field, A Particle Beam Or Field, Or A Plasma (e.g., Ionization, Pecvd, Cbe, Mombe, Rf Induction, Laser) Patents (Class 117/103)
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Patent number: 5509189Abstract: An electrochemical device including a solid electrolyte and solid electrode composed of materials having different chemical compositions and characterized by different electrical properties but having the same crystalline phase is provided. A method for fabricating an electrochemical device having a solid electrode and solid electrolyte characterized by the same crystalline phase is provided.Type: GrantFiled: December 15, 1994Date of Patent: April 23, 1996Assignee: Massachusetts Institute of Technology, a MA corp.Inventors: Harry L. Tuller, Steve A. Kramer, Marlene A. Spears, Uday B. Pal
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Patent number: 5505159Abstract: In an epitaxial growth of a group III-V compound semiconductor crystal, there is provided a substrate on which group III element halide molecules are adsorbed. A beam of group V element hydride molecules is supplied toward the substrate for reaction of the group V element hydride and the group III element halide. The vibration energy of each of group V element hydride molecules is excited in the beam and the orientation of the group V element hydride molecules is aligned. As a result, the supplied group V atom directly combines with the group III atom.Type: GrantFiled: November 17, 1994Date of Patent: April 9, 1996Assignee: NEC CorporationInventors: Yuji Mochizuki, Akira Usui, Toshikazu Takada
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Patent number: 5491005Abstract: A method of growing, in a vapor phase, a gold film having high electro-migration resistance and a flat surface, and capable of being buried in contact holes disposed in an insulating film of an integrated circuit device, for example, at a practical growing rate. Dimethylgold hexafluoroacetylacetonato (DMAu(hfac)), for example, is used as a starting gas, and vapor growth is carried out under specific conditions by utilizing thermal CVD. Adhesion of the gold film can be improved by converting it to a two-layered film by the combination of plasma enhanced CVD with thermal CVD.Type: GrantFiled: October 4, 1994Date of Patent: February 13, 1996Assignee: Fujitsu LimitedInventor: Masataka Hoshino
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Patent number: 5487356Abstract: A chemical vapor deposition method for forming films or coatings of metal oxide films showing a giant magnetoresistive effect, with the metal oxides having the formula La.sub.x A.sub.1-x MnO.sub.3 wherein A is selected from the group consisting of barium, calcium, manganese, and strontium, and x is a number in the range of from 0.2 to 0.4. The method uses a liquid source delivery CVD approach, wherein source reagent solution precursor is flash vaporized and is delivered to a CVD chamber, wherein it decomposes to deposit the multicomponent metal oxide films with well-controlled stoichiometry.Type: GrantFiled: November 28, 1994Date of Patent: January 30, 1996Assignee: Advanced Technology Materials, Inc.Inventors: Yi-Oun Li, Jiming Zhang
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Patent number: 5479875Abstract: A method of forming a highly oriented diamond film having a reduced thickness with a high quality at a low cost. Surface of a single crystal substrate is cleaned, and is then left in a high vacuum of 10.sup.-6 Torr or less at a temperature between room temperature and 800.degree. C. for 15 min for releasing gas molecules absorbed on the surface of the substrate. The surface of the substrate is then processed using carbon-containing plasma for forming a barrier of obstructing a carbon component within the substrate. After that, an electric field is applied across the substrate and plasma for allowing a current to flow thereacross for a specified time, to form nuclei of diamond for synthesis of a diamond film. Thus, highly oriented diamond particles or films, in which crystal orientations thereof are epitaxial to the substrate, are synthesized.Type: GrantFiled: July 21, 1994Date of Patent: January 2, 1996Assignee: Kabushiki Kaisha Kobe Seiko ShoInventors: Takeshi Tachibana, Kimitsugu Saito, Kazushi Hayashi, Kozo Nishimura, Rie Nakamura
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Patent number: 5469806Abstract: Epitaxial growth is carried out to form crystal such as GaAs, Si, etc. by using GaCl, SiCl.sub.2, etc. In the epitaxial growth, Cl atoms are left on the crystal growth surface. The Cl atoms are removed in the form of HCl molecules by vibrationally-excited H.sub.2 molecules.Type: GrantFiled: August 20, 1993Date of Patent: November 28, 1995Assignee: NEC CorporationInventors: Yuji Mochizuki, Yoshie Chiba, Toshikazu Takada, Akira Usui
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Patent number: 5463978Abstract: A method of controlling the amount of impurity incorporation in a crystal grown by a chemical vapor deposition process. Conducted in a growth chamber, the method includes the controlling of the concentration of the crystal growing components in the growth chamber to affect the demand of particular growth sites within the growing crystal thereby controlling impurity incorporation into the growth sites.Type: GrantFiled: July 18, 1994Date of Patent: November 7, 1995Assignee: Ohio Aerospace InstituteInventors: David J. Larkin, Philip G. Neudeck, J. Anthony Powell, Lawrence G. Matus
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Patent number: 5457058Abstract: A crystal growth method for applying a crystallization treatment onto an amorphous film which includes injecting ions of the constituent material of the film into the film applied with the crystallization treatment provided with a mask to form a first region and a second region made amorphous by the ion injection, and growing a crystal from the first region to the second region by solid phase growth.Type: GrantFiled: December 30, 1992Date of Patent: October 10, 1995Assignee: Canon Kabushiki KaishaInventor: Takao Yonehara
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Patent number: 5443033Abstract: A substrate is heated in a crystal growth vessel evacuated to a ultrahigh vacuum, and gases containing component elements of a crystal to be grown on the substrate are introduced into the vessel under predetermined conditions to cause successive epitaxial growth of single molecular layers, the number of growth cycles being automatically controlled. A mass analyzer is disposed opposite to the substrate in the vessel so that the progress of crystal growth can be incessantly traced and evaluated for each of the molecular layers. An etchant gas introduction nozzle extends into the vessel to make etching treatment of the surface of the substrate in the evacuated vessel prior to the crystal growth.Type: GrantFiled: March 11, 1994Date of Patent: August 22, 1995Assignees: Research Development Corporation of Japan, Junichi Nishizawa, Oki Electric Industry Company LimitedInventors: Junichi Nishizawa, Hitoshi Abe
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Patent number: 5441012Abstract: A thin film deposition method consists of placing a wafer or substrate whose surface contains at least two kinds of materials inside a vacuum chamber or vessel, supplying a reactant gas into the vacuum chamber or vessel, the reactant gas containing molecules having a low sticking coefficient relative to at least one of the at least two kinds of materials, and allowing an epitaxial growth to occur on the other kinds of materials contained in the wafer or substrate.The method further includes setting the pressure inside the vacuum chamber or vessel filled with the reactant gas equal to a pressure range in which the mean free path (d) of the reactant gas molecules is longer than the shortest distance (L) between the wafer or substrate placed inside the vacuum chamber or vessel and the vacuum side-exposed wall of the vacuum chamber or vessel, i.e., d>L.Type: GrantFiled: January 26, 1994Date of Patent: August 15, 1995Assignees: ANELVA Corporation, NEC CorporationInventors: Ken-ichi Aketagawa, Junro Sakai, Toru Tatsumi
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Patent number: 5433170Abstract: A metal-organic chemical vapor-phase deposition process for fabricating a layer of a Group II-VI compound semiconductor using an organometallic compound based on bis(cyclopentadienyl)magnesium having a vapor pressure in the range of from 1.3.times.10 Pa to 1.3.times.10.sup.2 Pa at a temperature of 330.degree. K. The present invention also provides a light-emitting device which is fabricated by means of the metal-organic vapor-phase deposition process above. The process according to the present invention provides a magnesium-containing compound semiconductor layer having an accurately controlled composition, and it readily enables the fabrication of a compound semiconductor layer having a grated structure.Type: GrantFiled: November 4, 1994Date of Patent: July 18, 1995Assignee: Sony CorporationInventors: Atsushi Toda, Takeharu Asano
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Patent number: 5429068Abstract: A deposition method of a compound semiconductor forming a semiconductor device comprises the steps of; covering the surface of a compound semiconductor containing a V group element with a III group element with a thickness of one or more monolayers; and forming a second compound semiconductor containing a V group element different from said V group element on said III group element while utilizing said III group element as a protective film for preventing the desorption of said V group element.Type: GrantFiled: October 19, 1993Date of Patent: July 4, 1995Assignee: Fujitsu LimitedInventor: Yoshiki Sakuma
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Patent number: 5401356Abstract: The amount of dust particles deposited on a semiconductor wafer during plasma etching or CVD in manufacturing a semiconductor integrated circuit is decreased by second plasma generating electrode 28 disposed around a lower electrode 15 in a plasma etching chamber 4a. High frequency voltage is applied to the second plasma generating electrode 18 just before the stop of plasma discharge to form a sub-plasma of high density along the outer periphery of the lower electrode 15, there is formed a sub-potential distribution acting to push out negatively charged dust particles stagnating near the main surface of a semiconductor substrate 7 toward the outer periphery of the wafer. The negatively charged dust particles thus pushed out from the vicinity of the main surface of the wafer 7 are moved to the second plasma generating electrode 28 and exhausted by a vacuum pump through an exhaust port 25.Type: GrantFiled: July 31, 1992Date of Patent: March 28, 1995Assignee: Hitachi, Ltd.Inventors: Hiromichi Enami, Kiyomi Yagi, Masanori Katsuyama, Akihiko Konno
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Patent number: 5397428Abstract: A method and apparatus for enhancing the nucleation of diamond by pretreating a substrate by electrically biasing a diamond film adjacent the substrate while exposing the substrate and the thus biased diamond film to a carbon-containing plasma. The bias pretreatment may be maintained for a time period in the range of about 1 hour to 2 hours to achieve a high diamond nucleation density. Alternatively, the biasing may be continued until diamond film formation is indicated by a change in reflectivity of the surface of the substrate. The biasing pretreating may be used to nucleate diamond heteroepitaxially on a substrate having a surface film formed of a material having a relatively close lattice match to diamond, such as .beta.-silicon carbide. The apparatus includes a laser reflection interferometer to monitor the surface of the substrate.Type: GrantFiled: August 28, 1992Date of Patent: March 14, 1995Assignees: The University of North Carolina at Chapel Hill, North Carolina State UniversityInventors: Brian R. Stoner, Jeffrey T. Glass, William M. Hooke, Bradley E. Williams
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Patent number: 5386798Abstract: A method for growing a deposit upon a substrate of semiconductor material involves the utilization of pulsed laser deposition techniques within a low-pressure gas environment. The substrate and a target of a first material are positioned within a deposition chamber and a low-pressure gas atmosphere is developed within the chamber. The substrate is then heated, and the target is irradiated, so that atoms of the target material are ablated from the remainder of the target, while atoms of the gas simultaneously are adsorbed on the substrate/film surface. The ablated atoms build up upon the substrate, together with the adsorbed gas atoms to form the thin-film deposit on the substrate. By controlling the pressure of the gas of the chamber atmosphere, the composition of the formed deposit can be controlled, and films of continuously variable composition or doping can be grown from a single target of fixed composition.Type: GrantFiled: October 6, 1993Date of Patent: February 7, 1995Assignee: Martin Marietta Energy Systems, Inc.Inventors: Douglas H. Lowndes, James W. McCamy
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Patent number: 5358596Abstract: A supersonic, direct-current arcjet is designed for expansion into low pressure, the arcjet operates as mixtures of hydrogen and argon to convert molecular hydrogen to atomic hydrogen and direct the atomic hydrogen to a substrate surface. A hydrocarbon (methane or acetylene) is introduced in the arcjet plume where it is converted to hydrocarbon precursors and is directed to the substrate surface where it combines with the atomic hydrogen to produce a diamond film.Type: GrantFiled: July 2, 1992Date of Patent: October 25, 1994Assignee: The Board of Trustees of the Leland Stanford Junior UniversityInventors: Mark A. Cappelli, Michael H. Loh
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Patent number: 5349154Abstract: A swirl flow microwave plasma torch is provided for the growth of diamond films. The swirl flow torch incorporates an injection nozzle that directs reactant gases into a cylindrical flow tube extending through the center of a tuned microwave cavity. The outer surface of the nozzle comprises a contoured, conical shape that causes inert gas, directed tangentially against the outer surface of the nozzle, to swift in a helical path that surrounds and confines the reactant gas emerging from the nozzle. The tuned cavity is coupled to a microwave energy source to generate a highly localized plasma in the reactant gas in the center of the sheathing swirl of inert gas. The swirl of inert gas contains the plasma in a well-defined shape, prevents in-diffusion of undesirable gases, forms a boundary layer to prevent plasma migration, and provides flow tube cooling. The reactant gas flow forces the plasma out of the flow tube to form a plasma flame that can be impinged on a substrate to induce diamond growth.Type: GrantFiled: December 17, 1992Date of Patent: September 20, 1994Assignee: Rockwell International CorporationInventors: Alan B. Harker, Ira B. Goldberg
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Patent number: 5314570Abstract: The present invention aims at improving a hot filament CVD method and apparatus capable of enlarging the diamond-forming area in relatively easy manner and utilizing effectively the capacity of a thermoelectron radiation material and provides a process and apparatus for producing diamond with excellent productivity as well as a compact size of apparatus, which can be applied to production on a commercial scale. The feature of the present invention consists in subjecting to decomposition, excitation and activation by a thermoelectron radiation material heated at a high temperature a raw material gas comprising at least one carbon source selected from the group consisting of hydrocarbons, hydrocarbons containing oxygens and/or nitrogens in the bonded groups, carbon oxides, halogenated hydrocarbons and solid carbon, hydrogen and optionally any one of inert gases of Group VIII elements, H.sub.2 O, O.sub.2 and F.sub.Type: GrantFiled: March 13, 1992Date of Patent: May 24, 1994Assignee: Sumitomo Electric Industries Ltd.Inventors: Akihiko Ikegaya, Naoji Fujimori