Planar Magnetron Patents (Class 204/298.19)
-
Publication number: 20010052456Abstract: A magnetron especially advantageous for low-pressure plasma sputtering or sustained self-sputtering having reduced area but full target coverage. The magnetron includes an outer pole of one magnetic surrounding an inner pole of the other polarity with a gap therebetween. The magnetron is small, primarily located on one side of the central axis, about which it is rotated. The total magnetic flux of the outer pole is at least 1.5 times that of the inner pole. Different shapes include a racetrack, an ellipse, an egg shape, a triangle, and a triangle with an arc conforming to the target periphery. The invention allows increased ionization of the sputtered atoms.Type: ApplicationFiled: July 30, 2001Publication date: December 20, 2001Inventor: Jianming Fu
-
Publication number: 20010050225Abstract: Apparatus for creating subatmospheric high plasma densities in the vicinity of a substrate in a work space for use in magnetron sputter deposition aided by ion bombardment of the substrate. Unbalanced flux lines emanating from cylindrical or frusto-conical targets cannot be captured across the work space, because the energizing magnets are cylindrical, and instead converge toward the axis of the apparatus to provide a high flux density, and therefore a high plasma density, in the vicinity of a substrate disposed in this region. The plasma profile and the coating material profile within the work space are both cylindrically symmetrical, resulting in a consistent and predictable coating on substrates.Type: ApplicationFiled: March 13, 2001Publication date: December 13, 2001Inventors: David A. Glocker, Mark M. Romach
-
Publication number: 20010050226Abstract: A target and magnetron for a plasma sputter reactor. The target has an annular vault facing the wafer to be sputter coated. Various types of magnetic means positioned around the vault create a magnetic field supporting a plasma extending over a large volume of the vault. An integrated copper via filling process includes a first step of highly ionized sputter deposition of copper, a second step of more neutral, lower-energy sputter deposition of copper to complete the seed layer, and electroplating copper into the hole to complete the metallization.Type: ApplicationFiled: July 30, 2001Publication date: December 13, 2001Inventors: Praburam Gopalraja, Jianming Fu, Fusen Chen, Girish Dixit, Zheng Xu, Sankaram Athreya, Wei D. Wang, Ashok K. Sinha
-
Publication number: 20010050220Abstract: The present invention provides a method and apparatus for achieving conformal step coverage on a substrate by ionized metal plasma deposition. A target provides a source of material to be sputtered and ionized by a plasma maintained by a coil. The ionized material is deposited on the substrate that is biased to a negative voltage. A power supply coupled to the target supplies a modulated or time-varying signal thereto during processing. Preferably, the modulated signal includes a negative voltage portion and a positive voltage portion. The negative voltage portion and the positive voltage portion are alternated to cycle between a center-strong sputter step and an edge-strong sputter step. The film quality and uniformity can be controlled by adjusting the frequency and amplitude of the signal, the duration of the positive portion of the signal, the power supplied to each of the support member and the coil, and other process parameters.Type: ApplicationFiled: November 16, 1999Publication date: December 13, 2001Applicant: Applied Materials, Inc.Inventors: TONY CHIANG, BARRY CHIN, PEIJUN DING
-
Patent number: 6328856Abstract: An apparatus for forming a multilayer film on a substrate surface comprises a multi-target sputtering source having a planar end face adapted for rotation about a central axis and including at least a pair of independently operable planar magnetron cathodes having sputtering targets composed of different materials, and a substrate mounting means for providing a stationary substrate in spaced-apart, facing relation to the sputtering source. According to the inventive method, the multi-target source is rotated about its central axis while the substrate is maintained stationary, thereby depositing a multi-layer film stack on the substrate. The invention finds particular utility in the formation of superlattice structures usable as recording medium layers in the fabrication of magnetic and magneto-optical (MO) data/information storage and retrieval media.Type: GrantFiled: March 8, 2000Date of Patent: December 11, 2001Assignee: Seagate Technology LLCInventor: Charles Frederick Brucker
-
Patent number: 6328865Abstract: There is disclosed a method and apparatus for forming a thin film of a composite metal compound. Independent targets formed of at least two different metals are sputtered so as to form on a substrate an ultra-thin film of a composite metal or an incompletely-reacted composite metal. The ultra-thin film is irradiated with the electrically neutral, activated species of a reactive gas so as to convert the composite metal or the incompletely-reacted composite metal to a composite metal compound through the reaction of the ultra-thin film with the activated species of the reactive gas. The formation of the ultra-thin film and the conversion to the composite metal compound are sequentially repeated so as to form on the substrate a thin film of the composite metal compound having a desired thickness.Type: GrantFiled: December 7, 2000Date of Patent: December 11, 2001Assignee: Shincron Co., Ltd.Inventors: Shigeharu Matsumoto, Kazuo Kikuchi, Masafumi Yamasaki, Qi Tang, Shigetaro Ogura
-
Publication number: 20010045353Abstract: A cathode assembly includes a monolithic target having a first surface and a center region. In addition, a sculpted section is formed in the first surface, and the sculpted section is generally recessed from the first surface and extends around the center in a racetrack configuration. The racetrack has a concentric centerline, and the sculpted section preferably is generally symmetric about the centerline. A magnetic field generator is disposed adjacent to the target and produces a magnetic field having an in-plane component. The magnetic field generator is tuned so that a distribution of the magnitude of the in-plane component in a direction transverse to the centerline at a point along the racetrack is characterized by two peaks that have a generally equal magnitude.Type: ApplicationFiled: June 7, 2001Publication date: November 29, 2001Applicant: VEECO INSTRUMENT INC.Inventors: Robert G. Hieronymi, Gary D. Lutz
-
Patent number: 6303008Abstract: A method and system for producing thin film alloy by a sputtering deposition process comprising using a circle-shaped aperture interposed between the target and substrate of a sputtering deposition system and establishing a rotating/oscillating relationship between the substrate and the aperture.Type: GrantFiled: September 21, 2000Date of Patent: October 16, 2001Assignee: Delphi Technologies, Inc.Inventors: Robert O. Pichulo, Gregory Keller Rasmussen, Mark Ray McClanahan
-
Patent number: 6299740Abstract: A cathode assembly includes a monolithic target having a first surface and a center region. In addition, a sculpted section is formed in the first surface, and the sculpted section is generally recessed from the first surface and extends around the center in a racetrack configuration. The racetrack has a concentric centerline, and the sculpted section preferably is generally symmetric about the centerline. A magnetic field generator is disposed adjacent to the target and produces a magnetic field having an in-plane component. The magnetic field generator is tuned so that a distribution of the magnitude of the in-plane component in a direction transverse to the centerline at a point along the racetrack is characterized by two peaks that have a generally equal magnitude.Type: GrantFiled: January 19, 2000Date of Patent: October 9, 2001Assignee: Veeco Instrument, Inc.Inventors: Robert G. Hieronymi, Gary D. Lutz
-
Patent number: 6296742Abstract: In magnetically enhanced sputtering, pulses are applied having a very high instantaneous power, of the order of at least 0.1 kW-1 MW. In such sputtering regions exist in which electrons are trapped by the magnetic field generated by magnets cooperating with the electric field between the anode (part of the wall enclosing the chamber in which sputtering is performed) and the cathode (which at the same time is the target, from which material is to be sputtered). An ionization of the gas in the chamber will then for lower applied power occur preferably in those regions causing a non-uniform erosion of the target. For very high power in the pulses or power density in the pulses the gas in these regions, and in regions adjacent thereto, will enter another state of complete ionization, which considered in energy terms is located above the unwanted state of an electric arc which is formed for a lower supplied power.Type: GrantFiled: September 10, 1999Date of Patent: October 2, 2001Assignee: Chemfilt R & D AktiebolagInventor: Vladimir Kouznetsov
-
Publication number: 20010022271Abstract: A target of an alloy of metals having different specific weights is used in a method for producing substrates that are coated with a layer comprising the same two metals by magnetron sputtering of the target. When sputtering such a target material, the metals of the alloy will sputter off with different sputtering characteristics with regard to a static angle a at which the sputtered off material leaves the target. For this reason, at the substrate to be sputter-coated, there occurs a demixing effect of these metals which will be deposited with a varying local ratio of the metals, that differs form the ratio of the metals in the alloy of the target. To counter-act this demixing phenomenon, the location of an electron trap formed by the magnetron field of the sputter source at the target with respect to the location of the substrate, is selected.Type: ApplicationFiled: February 1, 2001Publication date: September 20, 2001Inventors: Bernhard Cord, Gerd Deppich, Karl-Heinz Schuller, Oliver Keitel
-
Publication number: 20010017261Abstract: The invention relates to the deposition of material onto surfaces of a substrate, typically respective concave and convex surfaces and provides a system whereby the substrates are held in a mutually sealed relationship by a carrier during the deposition of material onto respective surfaces thereby preventing or minimising the problem of lack of adhesion of the material on the surfacesType: ApplicationFiled: February 16, 2001Publication date: August 30, 2001Inventors: John Michael Walls, Alaric Graham Spencer, Norman Henry White, Alan Robert Waugh
-
Patent number: 6280585Abstract: A sputtering apparatus in which the distance between a target and a substrate is made to be at least greater than the diameter of the circular substrate wafer and an internal gas pressure level of a vacuum chamber is held to be not higher than 1×10−1 Pa during sputtering process, thereby capable of effectively filling pores provided on the substrate without generating dust and void spaces.Type: GrantFiled: November 3, 1997Date of Patent: August 28, 2001Assignee: ULVAC, Inc.Inventors: Hisaharu Obinata, Tetsuji Kiyota, Satoru Toyoda, Yoshiyuki Kadokura
-
Patent number: 6277249Abstract: A target and magnetron for a plasma sputter reactor. The target has an annular trough facing the wafer to be sputter coated. Various types of magnetic means positioned around the trough create a magnetic field supporting a plasma extending over a large volume of the trough. For example, the magnetic means may include magnets disposed on one side within a radially inner wall of the trough and on another side outside of a radially outer wall of the trough to create a magnetic field extending across the trough, to thereby support a high-density plasma extending from the top to the bottom of the trough. The large plasma volume increases the probability that the sputtered metal atoms will become ionized. The magnetic means may include a magnetic coil, may include additional magnets in back of the trough top wall to increase sputtering there, and may include confinement magnets near the bottom of the trough sidewalls.Type: GrantFiled: March 2, 2000Date of Patent: August 21, 2001Assignee: Applied Materials Inc.Inventors: Praburam Gopalraja, Jianming Fu, Fusen Chen, Girish Dixit, Zheng Xu, Sankaram Athreya, Wei D. Wang, Ashok K. Sinha
-
Publication number: 20010013470Abstract: A mirrortron sputtering apparatus for sputtering on a substrate includes a vacuum chamber for placing therein a pair of targets spaced apart from each other with inner surfaces thereof facing each other and outer surfaces thereof positioned opposite to the inner surfaces, and magnets respectively disposed closer to the outer surfaces of the targets for forming a magnetic field between said pair of targets. The magnetic field has a magnetic field distribution with a peripheral region having a high magnetic flux density and a center region having a low magnetic flux density. In this arrangement, the substrate is set alongside a space between the pair of targets as facing said magnetic field.Type: ApplicationFiled: February 8, 2001Publication date: August 16, 2001Inventors: Toyoaki Hirata, Masahiko Naoe
-
Publication number: 20010009221Abstract: There may be used a film-forming apparatus having a substrate 4 that is rotatable around the center of one rotating axis 10 in the vertical direction situated in an inner cylinder 12, and a plurality (four in FIG. 2) of target units each comprising the pair of targets 2A, 2B (2B is under 2A serially arranged in the vertical direction inside an outer cylinder 13 opposite the surface 4a of the substrate 4, which are arranged in parallel in the circumferential direction of the inner wall of the outer cylinder 13. By employing a method whereby voltage is applied while alternately reversing the polarity to each of the targets 2A, 2B, it is possible to form a coating on the surface of a substrate by glow discharge sputtering, to accomplish destaticizing while the sputtering can be carried out using a small in-line or bell jar apparatus with small space.Type: ApplicationFiled: January 18, 2001Publication date: July 26, 2001Inventors: Toshiaki Anzaki, Kenji Mori
-
Publication number: 20010009224Abstract: A planar-type magnetron sputtering apparatus capable of forming a uniform thin coating on the entire surface of a substrate having a large area is disclosed. This sputtering apparatus has an insulating target seat, a permanent magnet closed circuit unit consisting of at least two permanent magnet closed circuits, and used for applying an electric field to the target, and a closed circuit moving unit used for continuously moving the permanent magnet closed circuit unit in one direction along an elliptical track parallel to the surface of the target. Due to the movement of permanent magnet closed circuits in one direction, the magnetron discharge tracks continuously moves along the target surface in the same direction. This sputtering apparatus thus allows the target to be uniformly etched on its surface. It is thus possible to form a desired uniform thin coating on the entire surface of a substrate having a large area.Type: ApplicationFiled: January 23, 2001Publication date: July 26, 2001Inventors: Jeon-geon Han, Kyung-hoon Nam, Jindrich Musil
-
Patent number: 6264812Abstract: A method and apparatus for generating a plasma by inductively coupling electromagnetic energy into the plasma. In one embodiment, first and second antenna coils are disposed about the circumference of the plasma containment area. The first and second antenna coils are relatively spaced along the longitudinal axis of the plasma containment area. A current is generated in the first and second antenna coils. A phase shift regulating network establishes a difference between the phase of the current in the first antenna and the phase of the current in the second antenna. The phase difference corresponds to the phase difference required to launch a helicon wave in the plasma. In a second embodiment, a chamber shield is made of a conductive material and is coupled to the RF source such that the shield functions as an RF antenna. The shield may be coupled in series to a coil surrounding the shield to increase the resultant flux density.Type: GrantFiled: November 15, 1995Date of Patent: July 24, 2001Assignee: Applied Materials, Inc.Inventors: Ivo J. Raaijmakers, Bradley O. Stimson, John Forster
-
Patent number: 6258217Abstract: A sputtering system and magnet array for depositing metal and metal-reactive gas coatings onto a substrate. The magnet array is designed for use in a rotating magnetron. The magnet array includes a plurality of magnets disposed on a plate. The plurality of magnets is arranged such that a closed-loop magnetic path is formed. The shape of the magnetic path is a double-lobe structure that includes first and second lobes that are symmetric to one another about an axis in the plane of the plate that intersects the center of rotation of the plate. The magnets are arranged in several rows. A first row of magnets has a double-lobe structure that corresponds to the first and second lobes of the magnetic path. Second and third rows of magnets are arranged in the shape of rings inside the first and second lobes of the magnetic path magnetic path. The lobe structure of the magnetic path can be circular or elliptical in shape.Type: GrantFiled: September 29, 1999Date of Patent: July 10, 2001Assignee: Plasma-Therm, Inc.Inventors: Edmond A. Richards, Paul R. Fournier, David Johnson, Abdul Lateef, David G. Lishan, Shinzo Onishi, Mark D. Kenney
-
Patent number: 6254747Abstract: A sputtering apparatus has a permanent, magnet for forming, in front of a target, a magnetic field for magnetron discharging. The permanent magnet is disposed behind the target and an RF induction discharge coil is disposed in front of the target. The permanent magnet is contained inside an evacuated cathode case which is in the form of a container and which is provided therein with a circulation passage for cooling water. The cathode case and the RF induction discharge coil are enclosed therearound by a metallic cover which has an aperture for emitting sputtered particles. To make an element for a magnetoresistance head, a substrate is transferred from a load lock chamber to a pre-treatment chamber to clean it therein by an etching apparatus. The substrate is then transferred to an ultrahigh vacuum film deposition chamber which is provided therein with a plurality of inductively coupled RF plasma-assisted magnetron sputtering apparatuses which are evacuated to an ultrahigh vacuum.Type: GrantFiled: December 10, 1997Date of Patent: July 3, 2001Assignee: Nihon Shinku Gijutsu Kabushiki KaishaInventors: Akira Hoshino, Toyoshi Uchiyama, Ken-ichi Takagi, Tadashi Yamamoto
-
Patent number: 6254745Abstract: Ionized physical vapor deposition (IPVD) is provided by a method of apparatus for sputtering conductive metal coating material from a magnetron sputtering target that is preferably annular. The sputtered material is ionized in a processing space between the target and a substrate by generating a dense plasma in the space with energy reactively coupled, preferably from a coil located outside of the vacuum chamber behind a dielectric window in the chamber wall at the center of the opening in the sputtering target. Chamber pressures are above 1 mTorr, typically in the 10-100 mTorr range, preferably between 10 and 20 mTorr. A magnetic bucket formed of an array of permanent magnets is positioned behind the inner surface of the chamber wall between the material source and the substrate.Type: GrantFiled: February 19, 1999Date of Patent: July 3, 2001Assignee: Tokyo Electron LimitedInventor: Mirko Vukovic
-
Patent number: 6251242Abstract: A target and magnetron for a plasma sputter reactor. The target has an annular trough facing the wafer to be sputter coated. Various types of magnetic means positioned around the trough create a magnetic field supporting a plasma extending over a large volume of the trough. For example, the magnetic means may include magnets disposed on one side within a radially inner wall of the trough and on another side outside of a radially outer wall of the trough to create a magnetic field extending across the trough, to thereby support a high-density plasma extending from the top to the bottom of the trough. The large plasma volume increases the probability that the sputtered metal atoms will become ionized. The magnetic means may include a magnetic coil, may include additional magnets in back of the trough top wall to increase sputtering there, and may include confinement magnets near the bottom of the trough sidewalls.Type: GrantFiled: January 21, 2000Date of Patent: June 26, 2001Assignee: Applied Materials, Inc.Inventors: Jianming Fu, Praburam Gopalraja
-
Publication number: 20010004047Abstract: In one embodiment of this invention, the apparatus for sputter deposition within an evacuated volume comprises a compact gridless ion source into which an ionizable gas is introduced and from which ions leave with directed energies at or near the sputtering threshold and a sputter target near that source, biased negative relative to the surrounding vacuum enclosure, and located within the beam of ions leaving that source. Particles sputtered from the target are deposited on a deposition substrate spaced from both the ion source and the sputter target. An energetic beam of electrons can be generated by the incident ions striking the negatively biased sputter target and the deposition substrate is located either within or outside of this beam, depending on whether the net effect of bombardment by energetic electrons is beneficial or detrimental to that particular deposition process.Type: ApplicationFiled: January 19, 2001Publication date: June 21, 2001Applicant: Kaufman & Robinson, Inc.Inventors: James R. Kahn, Harold R. Kaufman, Viacheslav V. Zhurin, David A. Baldwin, Todd L. Hylton
-
Patent number: 6248223Abstract: A sputtering apparatus which is used in a film depositing step in manufacturing a semiconductor integrated circuit or the like. In a vacuum vessel, a target and a substrate are disposed so as to be coaxial and parallel with and oppose each other, and a thin film is deposited on the inner face of a fine hole which is formed in the surface of the substrate. The target has a size Dt at which relationships that Q1=N·Q2 and that N is not smaller than 0.7, and more preferably not smaller than 0.7 and not larger than 1.2 are established between an angle Q1 satisfying tan Q1=(Dt−Ds)/2L, and an angle Q2 satisfying tan Q2=A/B where A indicates a diameter of the opening of the fine hole, B indicates a depth of the hole, Ds indicates a size of the substrate, and L indicates a distance between the target and the substrate.Type: GrantFiled: February 11, 2000Date of Patent: June 19, 2001Assignee: Anelva CorporationInventor: Masahiko Kobayashi
-
Patent number: 6238528Abstract: A plasma chamber in a semiconductor fabrication system improves the uniformity of a high density plasma by optimizing a ratio of RF power from a first coil, surrounding and inductively coupled into the high density plasma, to RF power from a second coil, positioned above a central region and inductively coupled into the high density plasma. It has also been found that an increase in RF power supplied to the second coil positioned above the central region relative to RF power suppled to the first coil surrounding the high density plasma tends to increase the relative density of the plasma toward the center of the high density plasma. It is believed that RF power supplied to the second coil positioned above the central region substrate tends to add more electrons into the central region of the high density plasma to compensate for electrons recombining with plasma ions.Type: GrantFiled: October 13, 1998Date of Patent: May 29, 2001Assignee: Applied Materials, Inc.Inventors: Zheng Xu, Fusen Chen, Jianming Fu
-
Patent number: 6235170Abstract: A hollow cathode magnetron for sputtering target material from the inner surface of a target onto an off-spaced substrate. The magnetron is in the shape of a truncated cone, also known as a conical frustum. The target cone is backed by a conical cathode maintained at a predetermined voltage for attracting gas ions into the inner surface of the target cone to sputter material therefrom. The inner surface of the cone is bounded at its inner and outer edges by magnetic pole pieces orthogonal to and extending inwardly and outwardly of the cone surface. The magnetic path is completed by a conical magnet surrounding the target and conical electrode and magnetically connected to the pole pieces to form a magnetic cage. Lines of magnetic flux extending above the target surface between the pole pieces are substantially parallel with the target surface, providing uniform erosion over the entire surface.Type: GrantFiled: January 19, 2000Date of Patent: May 22, 2001Inventor: David A. Glocker
-
Patent number: 6231725Abstract: An apparatus for sputtering material onto a workpiece, composed of: a chamber; a first target disposed in the chamber for sputtering material onto the workpiece; a holder for holding the workpiece in the chamber; a plasma generation area between the target and the holder; a coil for inductively coupling energy into the plasma generation area for generating and sustaining a plasma in the plasma generation area; and a second target disposed in the chamber below the first target and above the coil for sputtering material onto the workpiece.Type: GrantFiled: August 4, 1998Date of Patent: May 15, 2001Assignee: Applied Materials, Inc.Inventors: Jaim Nulman, Zheng Xu
-
Patent number: 6228236Abstract: A magnetron for use in a DC magnetron sputtering reactor that can rotate at a smaller diameter during a deposition phase and at a larger diameter during a cleaning phase, whereby sputter material redeposited outside of the deposition sputtering track is removed during the cleaning phase. An embodiment for a two-diameter magnetron includes a swing arm fixed on one end to the magnetron rotation motor shaft and on the other end to a pivot shaft, pivotably coupled to the magnetron. When the magnetron is rotated in different directions, hydrodynamic forces between the magnetron and the chilling water bath cause magnetron to pivot about the pivot shaft. Two mechanical detents fix the limits of the pivoting and hence establish the two diameters of rotation.Type: GrantFiled: October 22, 1999Date of Patent: May 8, 2001Assignee: Applied Materials, Inc.Inventors: Michael Rosenstein, Jianming Fu, Leif Eric Delaurentis, James van Gogh, Alan Liu
-
Patent number: 6228235Abstract: A method for controlling the operation of a magnetron source for sputtering a surface of a target in a vacuum chamber, the method including the steps of: during a low pressure phase of sputtering, causing a magnetic field generated by a the magnetron source to be confined primarily to an inner region of the surface of the target so as to reduce leakage of electrons away from the target during sputtering; and during a subsequent high pressure phase of sputtering, causing the magnetic field generated by the magnet assembly to extend into the outer region of the surface of the target so as to sputter material from the outer region of the surface of the target. The pressure of the high pressure phase of sputtering is higher than the pressure of the low pressure phase of sputtering.Type: GrantFiled: March 2, 1999Date of Patent: May 8, 2001Assignee: Applied Materials, Inc.Inventors: Avi Tepman, James van Gogh
-
Patent number: 6224724Abstract: An apparatus and method for compensating the process-related asymmetries produced in physical vapor processing of a surface. The apparatus and method may be used on either a substrate when sputtering material from a source or when using an ionized physical vapor deposition (IPVD) apparatus to either deposit a film onto or remove material from a substrate. A compensating magnet is configured and positioned to produce a compensating magnetic field. The compensating magnetic is positioned to offset the effects of chamber and process-related asymmetries, particularly those that affect the distribution of plasma processing on a substrate where the plasma has been otherwise symmetrically produced. Assymetries about an axis of the substrate, for example, are corrected, in, for example, systems such as sputter coating machines where a rotating magnet cathode or other such technique produces an initially symmetrical plasma.Type: GrantFiled: July 20, 1998Date of Patent: May 1, 2001Assignee: Tokyo Electron LimitedInventors: Thomas J. Licata, Steven D. Hurwitt
-
Patent number: 6224725Abstract: An improved unbalanced magnetron sputtering (UMS) apparatus in accordance with the invention having a conventional target and arrangement of magnets wherein a central portion of the target is backed by a first magnetic pole and the peripheral portion of the target is backed by a second magnetic pole, the poles carrying unequal numbers of lines of magnetic flux. One of the poles has a greater number of flux lines entering or leaving than does the other pole. The field lines extending from the higher flux pole which do not close in the lower flux pole extend into space in a range of directions and generally toward a substrate to be sputter coated. Adjacent the target and electrically isolated therefrom and overlying the higher flux pole is an independently-controllable auxiliary electrode, preferably a cathode, formed of a non-ferromagnetic material and having a surface facing in the same general direction as the sputterable surface of the target.Type: GrantFiled: February 2, 2000Date of Patent: May 1, 2001Assignee: Isoflux, Inc.Inventor: David A. Glocker
-
Patent number: 6221217Abstract: A magnetron sputtering system is provided that uses cooling channels in the magnetron assembly to cool the target. The magnetron sputtering system also generates low pressure region in the magnetron assembly such that the backing plate sees a pressure differential much lower than atmospheric pressure. In one embodiment, the backing plate includes a center post to support the backing plate during operation. The backing plate is reduced in thickness and provides less of a barrier to the generated magnetic field.Type: GrantFiled: December 3, 1998Date of Patent: April 24, 2001Assignee: CVC, Inc.Inventors: Mehrdad M. Moslehi, Dorian Heimanson, Cecil J. Davis, Thomas R. Omstead
-
Patent number: 6217714Abstract: In a sputtering apparatus, in a vacuum chamber having a gas supply and a gas discharge functions, a substrate is set to a supporting part therefor and a target is disposed at an electrode connected with a power source within a plane opposite to the substrate, so as to form a film while holding the substrate in a fixed state to the target. The electrode is divided into three or more electrode parts, the target is divided and disposed on the three or more electrode parts within the plane, and a magnet is arranged for each divided target at a position where a line of magnetic force on a surface of the each target is generated by each magnet.Type: GrantFiled: June 28, 1996Date of Patent: April 17, 2001Assignee: Matsushita Electric Industrial Co., Ltd.Inventors: Munekazu Nishihara, Teiichi Kimura, Isamu Aokura
-
Patent number: 6214183Abstract: A combined ion-source and sputtering magnetron apparatus of the invention comprises a vacuum working chamber that contains a sputtering magnetron, an object to be treated fixed inside the housing of the chamber, and an ion-beam source installed within the working chamber between the object and the sputtering magnetron. In a preferred embodiment, the ion source is a cold-cathode ion source with a closed loop ion-emitting slit and drift of electrons in crossed electric and magnetic fields. The ion source emits the ion beam in the radial inward or outward direction onto the surface of the magnetron target at an oblique angle to the target surface. The bombardment of the target surface with the ion beam generates a large amount of sputtered particles. In addition, the ion bombardment forms a large amount of secondary electrons which are accelerated in the direction away from the target and are held in the crossed electric and magnetic fields of the magnetron target.Type: GrantFiled: January 30, 1999Date of Patent: April 10, 2001Assignee: Advanced Ion Technology, Inc.Inventors: Yuri Maishev, James Ritter, Leonid Velikov, Alexander Shkolnik
-
Patent number: 6207028Abstract: In a sputtering device with magnetic amplification, a magnetic field is generated by means of a permanent magnet system, whose lines of force run above and penetrate the sputtering surface, whereby the permanent magnet system is formed of two dosed, coaxial circular or oval rows (7, 8) of individual magnets (5, 5′ . . . , 6, 6′ . . . ) that are connected via a yoke (15), whereby the surface of the target (3) that faces away from the rows of permanent magnets (7, 8) is formed of two partial surfaces (3a, 3b) that form an angle to each other and whereby the edge (3c) that is formed by the two partial surfaces (3a, 3b) runs parallel to the two rows (7, 8) of permanent magnets (5, 5′ . . , 6, 6′ . . . ) and whereby an insert (14) made of ferromagnetic material is inserted between the magnetic yoke (15) and the surface of the target (3) that faces the magnetic yoke (15).Type: GrantFiled: August 10, 1999Date of Patent: March 27, 2001Assignee: Leybold Systems GmbHInventors: Dieter Haas, Wolfgang Buschbeck, Jörg Krempel-Hesse
-
Patent number: 6197165Abstract: Ionized physical vapor deposition (IPVD) is provided by a method of apparatus for sputtering coating material from a compound sputtering source formed of an annular ring-shaped target with a circular target at its center, increasing deposition rate and coating uniformity. Each target is separately energized to facilitate control of the distribution of material sputtered into the chamber and the uniformity of the deposited film. The sputtered material from the targets is ionized in a processing space between the target and a substrate by generating a dense plasma in the space with energy coupled from a coil located outside of the vacuum chamber behind an annular dielectric window in the chamber wall in the central opening of the annular target and surrounding the circular target. A Faraday type shield physically shields the window to prevent coating material from coating the window, while allowing the inductive coupling of energy from the coil into the processing space.Type: GrantFiled: March 3, 1999Date of Patent: March 6, 2001Assignee: Tokyo Electron LimitedInventors: John S. Drewery, Thomas J. Licata
-
Patent number: 6183612Abstract: A sputtering cathode with a flat plate-shaped target (8) and a tub-shaped yoke (3) arranged behind the target (8), with center ridge (5) and with magnets (7,7′) for generating an enclosed tunnel of arc-shaped curved field lines (15,15′) in front of the target surface, as well as with three sheet metal cutouts (9,10,11) or groups of partial cutouts inserted into the plane between the target (8) and the end faces (12) of the tub rim of the yoke (3) facing the target (8), all the sheet metal cutouts (9,10,11) together form two gaps (a,b) extending roughly parallel to the end faces (12,13), wherein the magnets (7,7′) are each incorporated or inserted into the yoke bottom and the side surfaces of the magnets (7,7′) facing towards and away from the target (8) run flush with the yoke bottom.Type: GrantFiled: October 27, 1998Date of Patent: February 6, 2001Assignee: Leybold Systems GmbHInventors: Rolf Adam, Jörg Krempel-Hesse, Martin Bähr
-
Patent number: 6179974Abstract: This invention relates to sputtering materials onto workpieces. Sputter Apparatus which is generally indicated at 10, is provided with additional D.C. coils 23, 23, to increase uniformity of deposition.Type: GrantFiled: October 12, 1999Date of Patent: January 30, 2001Assignee: Trikon Holdings Ltd.Inventor: Keith Edward Buchanan
-
Patent number: 6176981Abstract: A plasma reactor for physical vapor deposition (PVD), also known as sputtering, which is adapted so that the atomic species sputtered from the target can self-sustain the plasma without the need of a working gas such as argon. The method is particularly useful for sputtering copper. According to the invention, a bias ring arranged around the wafer and rising somewhat above it is positively electrically biased to control the plasma potential, and hence to control the energy and directionality of the ions being sputter deposited on the wafer. The bias ring may be a separate biasing element which can be positioned at a selected height above the wafer.Type: GrantFiled: November 16, 1998Date of Patent: January 23, 2001Assignee: Applied Materials, Inc.Inventors: Liubo Hong, John Forster, Jianming Fu
-
Patent number: 6171461Abstract: A magnetron sputtering electrode for use within a magnetron sputtering device having more uniform cooling of the target with the use of a water chamber including water diverters to establish a turbulent water flow within the water chamber. The electrode also includes a direct power coupling to the cathode body to avoid degradation of the power supplied to the electrode. The electrode further includes introduction of process gas in an interstitial space between the anode shield and the cathode shield. The electrode also includes the use of removable shaped magnets providing improved target utilization and run times and a choice of erosion pattern and balanced or unbalanced sputtering by simple magnet substitution. In one embodiment, the invention includes the use of a threaded anode shield and a threaded cathode shield which significantly reduces the overall electrode size for a given target diameter.Type: GrantFiled: January 20, 1998Date of Patent: January 9, 2001Inventor: Mark A. Bernick
-
Patent number: 6171458Abstract: A spectral selective absorbing surface on solar collector elements has a very high solar absorbing ability, in the range of 96% to 97% and a low thermal emittance, in the order of 10%, and can be produced with high capacity in industrial scale. A reactive gas in an amount of 1 to 50 cm 3/min kW, preferably 10 cm 3/min kW, distributed in the coating zone provides that the metal layer deposed onto the receiving material partly oxidizes during the deposition, whereby a layer is obtained that comprises a grain mixture of metallic material and metal oxide, whereby 40% to 80%, preferably about 50%, of metallic material is embedded into the metal oxide closest to the receiving material. The metallic material is successively decreased to about zero at the surface of the layer by increasing the addition of oxygen at the end of the coating zone.Type: GrantFiled: March 10, 1999Date of Patent: January 9, 2001Assignee: Sunstrip ABInventor: Göran Hultmark
-
Patent number: 6168698Abstract: Power supply lines (41, 42) connect poles of an alternating current power source (43) to respective cathodes (58, 59) in compartments (32, 39), included among a plurality of adjacent compartments (32-39′), which together form a vacuum chamber (31) and which are connected to each other by a passageway (60). The two compartments (32, 39) with the cathodes (58, 59) are separated from each other by intermediate compartments (32′-38′), at least some of which are equipped with additional sputter cathodes (61-66).Type: GrantFiled: October 22, 1996Date of Patent: January 2, 2001Assignee: Balzers und Leybold Deutschland Holding AGInventors: Joachim Szczyrbowski, Götz Teschner, Anton Zmelty
-
Patent number: H1933Abstract: System and method for high vacuum sputtering combining magnetron sputtering and pulsed laser plasma deposition are described wherein simultaneous or sequential magnetron sputtering and pulsed laser deposition operations in a single ultra-high vacuum system provides high deposition rates with precise control of film morphology, stoichiometry, microstructure, composition gradient, and uniformity, in the deposition of high performance coatings of various metal, ceramic and diamond-like carbon materials.Type: GrantFiled: April 8, 1996Date of Patent: January 2, 2001Assignee: The United States of America as represented by the Secretary of the Air ForceInventors: Jeffrey S. Zabinski, Andrey A. Voevodin, Michael S. Donley