Abstract: An autofocus device is disclosed, including a focusing lens which is movable. A laser beam passes through the focusing lens toward a focal plane; and a detector collects laser scatter from a nonfocal position outside of the focal plane. The device determines, from the collected laser scatter, the nonfocal position of the scattering source, and moves the focusing lens, based on the determined nonfocal position, such that the scattering source is at an origin of the focal plane.

Abstract: A microscopy system and method of focusing the same are disclosed herein. The microscopy system may include an objective, and imaging device, an illumination source, an epi-illumination module, and a controller. The imaging device is configured to capture a single image of a specimen positioned on a stage of the microscopy system. The illumination source is configured to illuminate the specimen positioned on the stage. The epi-illumination module includes a focusing mechanism in a first primary optical path of a light generated by the illumination source. The focusing mechanism is tilted in relation to a plane perpendicular to the first primary optical path. The controller is in communication with the illumination source. The controller is configured to focus the microscopy system based on a pattern produced by the focusing mechanism on the single image captured by the imaging device.

Abstract: Methods and systems are provided for microscope auto-focusing. In one example, a method for microscope auto-focusing comprises: acquiring a plurality of contrast samples of an imaged subject; modeling a contrast distribution based on the plurality of contrast samples; acquiring an additional contrast sample based on the contrast distribution; modeling a corrected contrast distribution based on the additional contrast sample and the plurality of contrast samples; and focusing the imaged subject based on the corrected contrast distribution.

Abstract: We describe in this application systems and methods for autofocusing in imaging mass spectrometry. The present application describes improvements over current IMS and IMC apparatus and methods through an autofocus component including a plurality of apertures in the autofocus system, such as a plurality of apertures arranged in 2 dimensions. As a plurality of apertures is used, the autofocus system provides redundancy in the event that measurement of focus on the sample from the illuminating radiation passed through one or more of the apertures fails so as to reduce the number of unsuccessful autofocus attempts.

Abstract: An image processing apparatus for determining a focused output image in a passive autofocus system is configured to retrieve a set of input images and compute a baseline estimate for at least one input image. The baseline estimate represents image structures in the input image. The image structures have a length scale larger than a predetermined image feature length scale. The image processing apparatus is further configured to compute a set of output images, wherein each output image of the set of output images is computed based on one of a different input image of the set of input images and the at least one baseline estimate for the different input image and the at least one baseline estimate for a respective different input image. The image processing apparatus is further configured to determine one output image of the set of output images as the focused output image.

Abstract: A method and system for autofocusing an objective lens in a microscope system are disclosed. A decentered aperture is disposed in an optical path between an objective lens and an image plane of an image capturing device and a plurality of reference images are captured. Each reference image is captured when the objective lens is positioned at a corresponding z-position of a plurality of z-positions along an axis of travel of the objective lens and the optical path is at least partially occluded by the decentered aperture. At least one reference image of the plurality of the reference images is associated with a best focus position. The plurality of reference images are analyzed to develop a plurality of pattern locations, wherein each pattern location represents a position of a pattern formed on the image plane when a corresponding reference image was captured. The objective lens is positioned in accordance with the best focus position and the plurality of pattern locations.

Abstract: A microscope device includes an objective (1); an actuator (6) for adjustment of a distance in a focusing direction z, an absolute z-position detector (7) for measuring a z-position. The device further includes an autofocus light source (11); a first optical arrangement (12, 13) for generating a focused spot (31) of autofocus light from the light source in the backfocal plane (14) of the objective (1) at a position offset from the optical axis of the objective by a lateral offset distance (d) The objective generates a collimated incoming beam (22) of autofocus light, which is directed at an oblique angle (?) relative to the optical axis (15) of the objective onto the substrate. The microscope may further include a second optical arrangement (13, 16) for generating collimated outgoing beams (34, 35) of autofocus light and directing the collimated outgoing beam onto a detector-array (17).

Abstract: Methods and systems are provided for synchronizing image capture at a multi-detector imaging system. In one example, a method includes coordinating cycling of each microscope assembly of the multi-detector imaging system through a selection of illumination channels, each microscope assembly configured to obtain an image of a portion of one of more than one microplate wells simultaneously, to generate complete images of the more than one microplate wells concurrently.

Abstract: Systems, methods, and devices for identifying a reference focal surface in connection with light microscopy. A method includes identifying a fiducial marker printed on a surface of a coverslip or a slide used in connection with optical microscopy. The method includes focusing the optical microscope on the fiducial marker to calculate a focal distance of the fiducial marker. The method includes calculating a reference focal surface defining the surface of the coverslip or the slide based on the focal distance of the fiducial marker.

Abstract: Systems, methods, and devices for identifying a reference focal surface in connection with light microscopy. A method includes identifying a fiducial marker printed on a surface of a coverslip or a slide used in connection with optical microscopy. The method includes focusing the optical microscope on the fiducial marker to calculate a focal distance of the fiducial marker. The method includes calculating a reference focal surface defining the surface of the coverslip or the slide based on the focal distance of the fiducial marker.

Abstract: A system of digitalizing a slide, comprising at least one imaging device and a computing device communicatively connected to the imaging device, wherein the computing device is configured to scan each slide of a plurality of slides at the imaging device to generate an initial slide image and associated scanning metadata for each slide, determine a quality control metric for each slide as a function of the initial slide image and the associated scanning metadata, wherein determining the quality control metric includes flagging the slide based on the determined quality control metric, generate at least one scanning profile as a function of the scanning metadata based on the quality control metric, and re-scan the flagged slides at the imaging device using the at least one scanning profile.

Abstract: A confocal microscope includes a housing, which may be printed, and which includes mounts for receiving optical and other components of the microscope. The positions of the mounts are pre-determined so as to obviate the need for complex calibration of the components. The components and optical path lengths are selected in order to optimise the size of the microscope.

Abstract: The present invention is related to a method, a computer program, and apparatus for adapting an estimator for use in a microscope for estimating a position of an emitter in a sample based on a method, in which the sample is illuminated with light at one or more sets of probe positions and fluorescence photons are acquired for the sets of probe positions. The invention is further related to a microscope, which makes use of such a method or apparatus. The sample is illuminated with light at one or more sets of probe positions and fluorescence photons are acquired for the sets of probe positions. Photon counts of the acquired photons are then added to vectors of photon counts or sums of photon counts are determined for the sets of probe positions. A value representative of background noise is determined and used for adapting the estimator in real-time.

Abstract: This document describes a system and method for selectively switching the fast-wet-etching direction of crystalline silicon, c-Si, nanostructures between the (100) and the (110) crystallographic planes of c-Si by a simple method of sample agitation. This method effectively allows the invention to achieve anisotropic and isotropic wet-etching of c-Si.

Abstract: An automatic focus system for an optical microscope that facilitates faster focusing by using at least two offset focusing cameras. Each offset focusing camera can be positioned on a different side of an image forming conjugate plane so that their sharpness curves intersect at the image forming conjugate plane. Focus of a specimen can be adjusted by using sharpness values determined from images taken by the offset focusing cameras.

Abstract: An imaging system includes a light source emitting light at least a first excitation wavelength band to excite a first fluorescence material emitting a first fluorescence in a near-infrared wavelength band and light a second excitation wavelength band to excite a second fluorescence material emitting a second fluorescence in a visible wavelength band, a first image sensor receiving light including the first fluorescence and outputs a first imaging signal, a second image sensor receives light including the second fluorescence and output a second imaging signal, an optical element that separates the first fluorescence into a first optical branch and the second fluorescence into a second optical branch; and a pass filter in the first optical branch transmitting light having a near-infrared wavelength band and block light having a wavelength equal to or less than a predetermined wavelength belonging the visible wavelength band.

Abstract: Embodiments of this disclosure comprise of an optical cube, a light source, a cube holder connection point, a plurality of pins, a plurality of cavities sized and configured to receive said pins, a magnet, and a magnetic element located to attract and adhere to said magnet. An optical device with coaxial illumination for reflected light and fluorescence detection includes one or more optical cubes to redirect light along the optical axis. The cube holder connection point can be in a fixed position, moved translationally, or moved rotationally to engage a cube within the optical device. An optical cube can be attached to the cube holder connection point utilizing locating pins and magnetic coupling to constrain all 6 degrees of freedom. Use of such devices reduces the need to use screws or other locking hardware and permits a larger number of optical cubes to be inserted in the same area and makes it easier to exchange optical cubes.

Abstract: For forming and shifting a light intensity distribution in a focal area of an objective lens, portions of coherent input light are one by one directed into non-identical two-dimensional pupil areas of a pupil of the objective lens. Each of the portions of coherent input light is collimated in the pupil. The pupil areas include a pair of two pupil areas which are axially symmetrically arranged on opposite sides of an optical axis of the objective lens. At least one of the two discrete portions of coherent input light that are directed into the pair of pupil areas is separately modulated with regard to its phase by means of an electro optical modulator such as to form the light intensity distribution in the focal area with a local intensity minimum delimited by intensity maxima and to shift the local intensity minimum laterally with regard to the optical axis.

Abstract: A multispectral harmonisation device intended to align the optical channels of an optronic system that includes at least two directional optical sources emitting respective optical beams of various wavelengths belonging to various spectral bands and comprises a parabolic mirror and means for positioning and orienting each of the optical sources so that each of the optical beams emitted by the optical sources passes through the optical focus of the parabolic mirror before being reflected by said parabolic mirror so that all the optical beams form, by reflection on the parabolic mirror, a multispectral collimated beam.

Abstract: A vision system (10) for a motor vehicle includes a stereo imaging apparatus (11) adapted to capture images from a surrounding of the motor vehicle, a disparity calculation block (17) adapted to calculate a stereo disparity of left/right images captured by the stereo imaging apparatus (11), and a processing device (14) adapted to perform image processing of images captured by the imaging apparatus (11). The vision system is adapted to perform time sharing of the disparity calculation block (17) between the stereo disparity calculation and calculation of a one-dimensional optical flow of captured images in a horizontal direction only.

Abstract: A multi-depth confocal imaging system includes at least one light source configured to provide excitation beams and an objective lens. The excitation beams are focused into a sample at a first plurality of focus depths along an excitation direction through the objective lens. An image sensor receives emissions from the sample via the objective lens, wherein the emissions define foci relative to the image sensor at a second plurality of focus depths.

Abstract: A quantum dot microscope apparatus is provided. A further aspect employs a tilted or tapered end or tip on a microscopic probe. Another aspect of the present apparatus employs a probe including a quantum dot with only one tunneling lead connected to a power source. A manufacturing aspect includes creating a tapered or asymmetrically shaped specimen-facing end of a probe where a quantum dot is located on the end. A further manufacturing aspect includes using focused ion-beam milling to create a tip or end of a quantum dot microscope probe.

Abstract: A light microscope includes a scan illumination unit, which is designed to illuminate a specimen having a line focus produced by an illumination light beam and moved transversely to a light propagation direction. A descanned detection unit is designed to produce a stationary first line image of a target region from detection light that originates from a target region of the specimen illuminated with the moving line focus. The scan illumination unit and the descanned detection unit have a common objective, which is designed to receive both the illumination light beam and the detection light. The descanned detection unit contains a dispersive element, which is designed to spectrally split the detection light in order to generate multiple second line images, corresponding to the first line image, with different spectral compositions.

Abstract: An image sensor for recording incident radiation may include a first layer for filtering the incident radiation by attenuating incident radiation with a frequency below a cutoff frequency and a second light-sensitive layer for absorbing radiation passing through the first layer. The first layer may precede the second light-sensitive layer in a direction of propagation of the incident radiation and the first layer includes at least one aperture passing through the first layer to the second light-sensitive layer for propagating radiation therethrough. The cross sectional size of the at least one aperture may be configured to provide a cutoff frequency so that incident radiation with a frequency below the cutoff frequency is attenuated inside the at least one aperture and incident radiation with a frequency above the cutoff frequency propagates through the at least one aperture.

Abstract: An automatic focus system for an optical microscope that facilitates faster focusing by using at least two cameras. The first camera can be positioned in a first image forming conjugate plane and receives light from a first illumination source that transmits light in a first wavelength range. The second camera can be positioned at an offset distance from the first image forming conjugate plane and receives light from a second illumination source that transmits light in a second wavelength range.

Abstract: An apparatus for evaluating focus, including (a) a stage configured to hold a specimen; and (b) an optical train including a radiation source, calibration optic, objective and detector, the optical train forming a first path wherein radiation from the radiation source is directed to the calibration optic and then a first portion of the radiation is directed to the detector, thereby forming a first image on the detector, wherein a second portion of the radiation follows a second path from the calibration optic then through the objective to the specimen, wherein the optical train forms a third path wherein radiation reflected from the specimen is transmitted through the objective, then to the detector, thereby forming a second image on the detector, and wherein the radiation that forms the first image is astigmatic.

Abstract: In a case where a microscope apparatus main body scans the bottom surface of the cultivation container by synchronously controlling a piezoelectric element and an actuator serving as optical axis-directional transport devices having different properties from each other, an objective lens of the imaging optical system is transported to a focus position in the optical axis direction.

Abstract: A 3D scanner system includes a scanning device capable of recording first and second data sets of a surface of an object when operating in a first configuration and a second configuration, respectively. A measurement unit is configured for measuring a distance from the scanning device to the surface. A control controls an operation of the scanning device based on the distance measured by the measurement unit, where the scanning device operates in the first configuration when the measured distance is within a first range of distances from the surface and the scanning device operates in the second configuration when the measured distance is within a second range of distances; and a data processor is configured to combine one or more first data sets and one or more second data sets to create a combined virtual 3D model of the object surface.

Abstract: A method and system for autofocusing an objective lens in a microscope system are disclosed. A decentered aperture is disposed in an optical path between an objective lens and an image plane of an image capturing device and a plurality of reference images are captured. Each reference image is captured when the objective lens is positioned at a corresponding z-position of a plurality of z-positions along an axis of travel of the objective lens and the optical path is at least partially occluded by the decentered aperture. At least one reference image of the plurality of the reference images is associated with a best focus position. The plurality of reference images are analyzed to develop a plurality of pattern locations, wherein each pattern location represents a position of a pattern formed on the image plane when a corresponding reference image was captured. The objective lens is positioned in accordance with the best focus position and the plurality of pattern locations.

Abstract: Method for calibrating a phase mask in a beam path of an optical device with the steps: the phase mask is actuated successively with different patterns of grey levels, wherein a first grey level of a first quantity of segments remains constant and a second grey level of a second quantity of segments is varied from one pattern to the next, light of the optical device impinges on the phase mask, at least one part of the total intensity of the light in the beam path is measured downstream of the phase mask for the different patterns, and a characteristic of the measured intensity is obtained in dependence on the second grey level, a relationship between the second grey level and a phase shift, being imprinted by the phase mask, is obtained from the characteristic and an actuation of the phase mask is calibrated based on the obtained relationship.

Abstract: System and methods are provided for distributed microscopy. A plurality of microscopes may capture images and send them to a media server. The microscopes and the media server may be part of a local area network. The microscopes may each have a distinct network address. The media server may communicate with an operations console, which may be used to view images captured by the microscopes. The operations console may also accept user input which may be used to selectively control the microscopes.

Abstract: A metrology system is provided including a projected pattern for points-from-focus type processes. The metrology system includes an objective lens portion, a light source, a pattern projection portion and a camera. Different lenses (e.g., objective lenses) having different magnifications and cutoff frequencies may be utilized in the system. The pattern projection portion includes a pattern component with a pattern. At least a majority of the area of the pattern includes pattern portions that are not recurring at regular intervals across the pattern (e.g., as corresponding to a diverse spectrum of spatial frequencies that result in a relatively flat power spectrum over a desired range and with which different lenses with different cutoff frequencies may be utilized). The pattern is projected on a workpiece surface (e.g., for producing contrast) and an image stack is acquired, from which focus curve data is determined that indicates 3 dimensional positions of workpiece surface points.

Abstract: An autofocus device includes a stage, a magnifying optical system, a light source device, an iris which is arranged at a position opposite to a sample of the magnifying optical system and configured to limit a light beam emitted from the light source device, and an AF camera which receives, via the magnifying optical system, a reflected light beam which is reflected from a reflection surface after the light beam reaches a glass member via the iris and the magnifying optical system. The light source device emits the light beam at a non-zero angle relative to the axis of the magnifying optical system. The control unit adjusts the position of the stage so as to match the position of a captured image of a shield with a target position. With such a configuration, it is possible to achieve the autofocus at high speed.

Abstract: This disclosure relates to a method for measuring an electric field in the near-field region of an optically excited sample. The method includes optically exciting at least part of the sample. This step includes directing excitation light onto an interface between the sample and a medium. The excitation light is incident onto the interface under an angle of incidence such that total internal reflection of the excitation light occurs at the interface. The method further includes measuring the electric field using a terahertz near-field probe, wherein the terahertz near-field probe is positioned on one side of the interface and the excitation light approaches the interface on another side of the interface. This disclosure further relates to a system and computer program for measuring an electric field in the near-field region of an optically excited sample.

Abstract: Embodiments of the present invention provide an apparatus for determining spectral information of a three-dimensional object, comprising a cavity (110) for location in relation to the object, an imaging light source (120) located in relation to the cavity, wherein the imaging source is controllable to selectively emit light in a plurality of wavelength ranges, structured light source (130) for emitting structured illumination toward the object, wherein the structured light source comprises a plurality of illumination devices arranged around the cavity, one or more imaging devices (140) for generating image data relating to at least a portion of the object, a control unit, wherein the control unit (1100) is arranged to control the structured light source to emit the structured illumination and to control the imaging light source to emit light in a selected one or more of the plurality of wavelength ranges, a data storage unit (1120) arranged to store image data corresponding to the structured illumination and

Abstract: Techniques are provided to re-arrange the placement of a photodiode within an illumination system to achieve improved characteristics and reduced form factor. An illumination system includes a laser assembly, a MEMS mirror system, a beam combiner, and a photodiode. The laser assembly includes RGB lasers, and the MEMS mirror system redirects laser light produced by the RGB lasers to illuminate pixels in an image frame. The beam combiner combines the laser light. The photodiode is provided to determine a power output of the laser assembly by receiving and measuring some of the laser light. The photodiode may be beneficially positioned before or after collimating optics and/or the beam combiner.

Abstract: An inspection device of the present invention includes: THz wave irradiation unit for irradiating a specimen with THz waves; a THz wave sensing unit for detecting transmitted waves or reflected waves of the THz waves emitted to the specimen; and an information processing unit for acquiring intensity distribution of the transmitted waves of the reflected waves of the specimen from the intensity data of the transmitted waves or the reflected waves of the specimen irradiated with the THz waves, wherein the information processing unit acquires 2-dimensional intensity distribution of the transmitted waves or reflected waves, and detects whether a foreign matter is adhering to the specimen by comparing the intensity distribution obtained when the specimen without attachment of the foreign matter is detected and the intensity distribution obtained when the specimen is detected at the time of inspection. The specimen is a sheet of paper, for example.

Abstract: The alignment apparatus performs alignment of an object in a first direction along a surface of the object, based on a position of a predetermined target formed on the surface, and includes a holding unit that holds the object to be moved, an acquisition unit that acquires an image of the predetermined target formed on the surface of the object held by the holding unit, and a controller that drives the holding unit to realize a relative distance between the object and the acquisition unit in a second direction perpendicular to the surface of the object, a relative tilt between the object and the acquisition unit, or the distance and the tilt, the distance and the tilt being determined based on a correlation degree between the image acquired by the acquisition unit and a template, and detects a position of the predetermined target in the first direction based on the correlation degree.

Abstract: An inner surface image inspection apparatus includes: an image-capturing unit; a lens-barrel attached in front of the image-capturing unit, the lens-barrel containing lenses; an insert unit of a cylindrical shape attached to a leading end of the lens-barrel, the insert unit adapted to be inserted into the hole of the inspection object; a mirror disposed in the insert unit in such a manner that a reflecting surface of the mirror is inclined relative to the optical axis of the lenses of the optical system; and a linear motion mechanism configured to move the mirror in parallel to the optical axis.

Abstract: Provided is an information processing device including an image analysis unit which divides an entire image in which an entire observation target region is imaged into a plurality of regions, and then judges whether an observation target is present in each region, and an imaging control unit which controls imaging of partial images with a magnification higher than a magnification of the entire image corresponding to the regions based on judgment results of the image analysis unit.

Abstract: An image capturing apparatus capable of interchanging a lens unit includes a processing unit configured to perform image correction processing based on data acquired by an acquisition unit. In the image capturing apparatus, the acquired data includes information of a first shooting condition, configured in a discrete manner, information of a plurality of second shooting conditions provided for each information of the first shooting condition, and correction information corresponding to a combination of the information of the first shooting condition and the information of the second shooting condition.

Abstract: In some aspects, the present disclosure provides methods for identifying a disease in an epithelial tissue of a subject. Methods for identifying a disease in an epithelial tissue comprise the generation of a depth profile of the epithelial tissue using signals generated from the tissue by pulses of light directed towards a surface of the epithelial tissue. In some aspects, the present disclosure provides apparatuses consistent with the methods herein.

Abstract: A medical apparatus is described for providing visualization of a surgical site. The medical apparatus includes an electronic display disposed within a display housing, the electronic display configured to produce a two-dimensional image. The medical apparatus includes a display optical system disposed within the display housing, the display optical system comprising a plurality of lens elements disposed along an optical path. The display optical system is configured to receive the two-dimensional image from the electronic display, produce a beam with a cross-section that remains substantially constant along the optical path, and produce a collimated beam exiting the opening in the display housing. The medical apparatus can also include an auxiliary video camera configured to provide an oblique view of a patient on the electronic display without requiring a surgeon to adjust their viewing angle through oculars viewing the electronic display.

Abstract: Apparatus and methods are described for use with a digital microscope unit that includes a digital microscope. A biological cell sample disposed within a sample carrier, is received into the digital microscope unit. For at least one imaging field of the biological cell sample, it is determined that, within the imaging field, there is a variation in the focal depth of the biological sample with respect to the microscope. At least one image of the imaging field is captured. A characteristic of the biological sample is determined by analyzing the captured image of the imaging field, the analyzing including, in response to determining that there is a variation in the focal depth of the biological sample with respect to the microscope, accounting for the variation in the focal depth of the biological sample with respect to the microscope. Other applications are also described.

Abstract: Systems and methods for autofocusing an objective lens in a microscope system. A self-calibrating autofocus system includes a light source, a decentered aperture, and image-capturing device. The system may be connected to the microscope system so that the light source generates a light on an optical path that includes the objective lens and a plate having a reference surface proximal to a sample holding component. The image capturing device images a reflection of light from the reference surface as the objective lens moves to a series of z-positions. A reference calibration slope is generated for the objective lens by determining positions of the images taken at the z-positions of the objective lens. At least one image having a particular attribute corresponds to a best focus position. The objective lens is moved to predicted best focus or preferred offset from calibrated best focus using the reference calibration slope.

Abstract: A laser microscope system includes a microscope and a lens defining an optical axis and a rear focal plane, as well as a laser and an optical laser system coupling a laser beam into the microscope such that it passes through the rear focal plane of the lens at a fixed point. The optical laser system has an offset lens movable along an axis of the laser beam path to move the laser beam focus in the direction of the optical axis. The optical laser system has a compensating lens arranged in the laser beam path and movable along the axis of the laser beam path. A controller and/or a mechanical coupling device carries out a movement of the compensating lens along the axis of the laser beam path when the lens is moved such that the laser beam continues to pass through the fixed point.

Abstract: There are provided an information processing apparatus, an information processing method, a program, and a microscope system which can compose a microscopically observed image having a wide field of view and a high resolution by highly accurately stitching a plurality of digital images together. An image acquisition unit provided in the information processing apparatus acquires a first partial image and a second partial image each formed by imaging a part of an observation target area, and a stitching position adjustment unit adjusts a stitching position of the second partial image with respect to the first partial image. The image acquisition unit controls drive of the microscope such that a partial image including a specimen is acquired as the second partial image when the first partial image includes a foreign matter.

Abstract: A super-resolution lattice light field microscopic imaging system includes: a microscope configured to magnify a sample and image the sample onto a first image plane of the microscope; a first relay lens configured to match a numerical aperture of an objective with that of a microlens array; a 2D scanning galvo configured to rotate an angle of a light path in the frequency domain plane; an illuminating system configured to provide uniform illumination on the microlens array to generate SIM pattern illumination; the microlens array, configured to modulate a light beam with a preset angle to a target spatial position at a back focal plane of the microlens array to obtain a modulated image; an image sensor configured to record the modulated image; and a reconstruction module configured to reconstruct a 3D structure of the sample based on the modulated image.

Abstract: Apparatus and methods for scanning a 2D or 3D image of a specimen without relative Z-axis motion between the specimen and the objective lens. In an embodiment, the apparatus includes a tilted camera having individual lines of pixels. Each line of pixels can be separately processed and is at a different image plane with respect to the stage. The depth of field of each line of pixels abuts, slightly overlaps, or is slightly spaced apart from the adjacent lines of pixels in the tilted camera. The angle of the tilt determines the relationship (abut, overlapping, or spaced) of the adjacent lines of pixels. The individual image lines produced by each line of pixels can be combined into a 3D volume image of a sample. Also, the highest-contrast line at each X-Y location can be combined into an in-focus 2D image of the sample.

Abstract: An eye surgery system 1 comprises microscopy optics 3 and an OCT device 5 to generate a light-optical image and an OCT image of an eye fundus 11, a controller 29 and a visualization system 13, 41, 83. The controller comprises a data interface 97 for receiving a preoperative OCT image and may control the visualization system to display a representation of the received preoperative OCT image. The controller may control the OCT device 5 to record an intraoperative OCT image and may control the visualization system to display a representation of the recorded intraoperative OCT image. The controller may adjust a magnification of the representation of the intraoperative OCT image and/or a magnification of the representation of the preoperative OCT image so that the magnifications of the representation of the intraoperative OCT image and the magnification of the representation of the preoperative OCT image are equal.