Abstract: The invention relates to a spot-generator (10) having: an entrance surface (12) for receiving an incident light beam (20) and an exit surface (14) for transmitting the light beam, the entrance surface defining an entrance side (16) and the exit surface defining an exit side (18), wherein the spot generator is designed to modulate the incident light beam to generate on the exit side a plurality of separate light spots. According to the invention, the plurality of light spots comprises a first light spot (22) generated in a first focal plane (24) and a second light spot (26) generated in a second focal plane (28), the first focal plane and the second focal plane being essentially perpendicular to the mean propagation direction of the exit light beam, and wherein the first light spot (22) differs from every other light spot generated on the exit side by the spot generator in the projection of its position on a plane essentially perpendicular to the mean propagation direction of the exit light beam.

Abstract: The present invention discloses methods and systems for improved focusing of imaging systems for the acquisition of high-quality focused tissue image data. A light emitter (L) aims a focusing light beam (FLB) towards an object of interest (O) so that the focusing light beam (FLB) is at an angle relative to the optical axis (OA) of the imager (I). If the object of interest (O) is out of focus, the focusing light spot (FLS) will appear above or below the focal point in the image (I). The pixel difference between the center of the focusing light spot (FLS) and the focal point indicates the range adjustment value. The range between the imager (I) and the object of interest (O) can then be adjusted according to the range adjustment value using a lookup table or calculations.

Abstract: To increase spatial resolution by observing a sample based on saturated fluorescence components. A fluorescence microscope according to the present invention includes: a laser light source 10 emitting laser light as excitation light; an objective lens 13 focusing the laser light and applying the focused laser light to a sample 14; a detector 22 detecting fluorescence generated in the sample 14 with the laser light; and a stage 15 scanning the sample 14 while moving the sample 14 relative to the laser light, wherein the laser light is applied to the sample with varying intensities such that saturation of fluorescence occurs at the maximum intensity of the laser light, and fluorescence is detected with the detector in accordance with intensity of the laser light, and the sample is observed based on the saturation components of fluorescence.

Abstract: A microscopy method is provided for generating an image of an image field passing in a predetermined depth of a sample to be examined, comprising a plurality of illumination steps, in which a part of the image field is in each case illuminated with a focused illumination beam bundle, which effects the generation of sample radiation on account of an interaction with the sample, detection steps, in which the sample radiation generated is detected, and an evaluation step, in which the image is generated on the basis of the sample radiation detected, wherein a first and second detection step are carried out during each illumination step, wherein sample radiation generated at the focus and outside the focus is detected in the first detection step and a smaller proportion of the sample radiation generated at the focus than in the first detection step and also sample radiation generated outside the focus are detected in the second detection step, and wherein the sample radiation detected in the second detection step

Abstract: Provided is a scanning probe microscope (SPM), a probe of which can be automatically replaced and the replacement probe can be attached onto an exact position. The SPM includes a first scanner that has a carrier holder, and changes a position of the carrier holder in a straight line; a second scanner changing a position of a sample on a plane; and a tray being able to store a spare carrier and a spare probe attached to the spare carrier. The carrier holder includes a plurality of protrusions.

Abstract: A device assembly (16) for a precision apparatus (10) includes a device housing (30), a device (32), a device mover assembly (34), and a measurement system (36). The device mover assembly (34) moves the device (32) relative to the device housing (30) about a first axis and about a second axis that is orthogonal to the first axis. The measurement system (36) monitors movement of the device (32). The measurement system (36) monitors movement of the device (32) and can include a first sensor assembly (260) that monitors movement about the first axis and a second sensor assembly (262) that monitors movement about a second axis. Each sensor assembly (260) (262) can include a sensor adjuster (474) (476) that adjusts the position of a portion of the respective sensor assembly (260) (262) to independently tune the sensor assemblies (260) (262) and independently enhance the performance of each sensor assembly (260) (262). Further, each sensor assembly (260) (262) can be a magnetic type sensor.

Abstract: A clear fluorescence image is easily obtained irrespective of variation of scattering due to variation of the depth of a focus position in a specimen.

Abstract: The invention is directed at a method and apparatus for auto-focusing an infinity corrected microscope. Light beams are directed and then converged towards a specimen of interest and at least one image is formed from the reflected light. The image, or images, are then reviewed and calibration measurements are retrieved from the image. These calibration measurement are then used to determine focusing measurements which are used to auto-focus the microscope.

Abstract: A method and apparatus for assessing a height of a specimen includes an electron beam unit having an electron beam source, lenses, a table for setting a specimen and controllable in a height direction, and a detector, and a height detection system for detecting height of the specimen set on the table while the specimen is irradiated by an electron beam. The height detection system further includes an illumination system, a collection system, first and second detectors, a device configured to receive output signals from the first and second detectors while the specimen is irradiated by the electron beam and to generate a comparison signal from the output signals, wherein the comparison signal is responsive to the height of the specimen.

Abstract: A focus error detecting optical system has an optical parameter which makes a focus lock-in range by a focus error signal be a value capable of detecting focus on a front surface of a cover glass and focus on a back surface thereof separately. A control section, based on the focus error signal obtained by the focus error detecting optical system, brings a focal point of an observational optical system to a focus position. Further, focus error detecting optical systems include optical units each having an optical parameter corresponding to a numerical aperture of respective objective lenses. A control section selects the optical unit of the focus error detecting optical system corresponding to the objective lens in use. The control section, using a focus error signal obtained by the selected focus error detecting optical system, brings a focal point of an observational optical system to a focus position.

Abstract: An optical phase microscope using rotating-¼ wavelength plate with pinhole in the center position and Fourier transformed lens is provided. The optical phase microscope comprises an optical image generator that acquires images for a specimen to be observed, an object plane onto which light beams of the images acquired from the optical image generator are projected, a first transform lens that performs primary Fourier transformation on the light beams passing through the object plane, a ¼ wavelength plate with pinhole at the center position that is positioned to be spaced by a focal distance of the first transform lens from the first transform lens, a secondary transform lens that performs secondary Fourier transformation on the light beams passing through the ¼ wavelength plate, and a phase image generator including a photo detector on which the images of the light beams subjected to the secondary Fourier transformation is focused.

Abstract: The present invention relates to the analysis of specimens. Specifically, the invention relates to methods and apparatus for reviewing specimen slides, including apparatus for holding the slides. The invention also relates to an automatic focusing method for an imaging system and methods for accommodating vibration in the imaging system. In particular, the methods and apparatus may be applied to the automated analysis of cytological specimen slides.

Abstract: A microscope apparatus comprises a focusing unit for changing the relative position between a specimen and the focus position of an object lens; and a setup unit for setting a plurality of import regions in the optical axis of the object lens, with a position at which a specimen is focused being established as a reference. It further comprises a control unit for obtaining a plurality of extended time exposure images by changing the relative positions from each respective start position to the end position of each of the plurality of import regions by means of the focusing unit under an import condition determined by desired exposure time and emission light volume; and an image generation unit for generating a focal-depth enlarged image by adding together the obtained plurality of extended time exposure images.

Abstract: A scanning microscope with a light source which emits illumination light for illuminating a specimen, with at least a first detector for detecting the detection light proceeding from the specimen, and with an objective through which the specimen can be illuminated and detected, wherein the objective is arranged in an illumination beam path and in a detection beam path, and with a second detector for non-descanned detection of the detection light proceeding from the specimen, wherein a compact assembly is provided which comprises a housing which is attached to a microscope stand and which has at least one receptacle for a microscope objective for the illumination beam path and/or detection beam path of the scanning microscope, wherein at least the second detector is arranged in the housing and can be acted upon by specimen light.

Abstract: Provided is a microscope equipped with an automatic focusing mechanism, comprising an illumination light source; an objective lens for focusing first light emitted from the illumination light source onto an object to be detected; an illumination light source for imaging the first light that is reflected by the object to be detected and passes through the objective lens; and a focal-point detector for detecting a positional shift of a microtiter plate from a focal position of the objective lens, wherein the focal-point detector includes a focal-point-detection light source for emitting focal-point-detection light serving as second light, a focal-point detection light acquisition unit on which the focal-point-detection light is focused, and a region setting unit which can set an in-focus assessable region of the focal-point-detection light acquired by the focal-point detection light acquisition unit to any position on the focal-point detection light acquisition unit.

Abstract: A method of capturing a focused image of a continuously moving slide/objective arrangement is provided. A frame grabber device is triggered to capture an image of the slide through an objective at a first focus level as the slide continuously moves laterally relative to the objective. Alternatingly with triggering the frame grabber device, the objective is triggered to move to a second focus level after capture of the image of the slide. The objective moves in discrete steps, oscillating between minimum and maximum focus levels. The frame grabber device is triggered at a frequency as the slide continuously moves laterally relative to the objective so multiple images at different focus levels overlap, whereby a slide portion is common to each. The image having the maximum contrast value within overlapping images represents an optimum focus level for the slide portion, and thus the focused image. Associated apparatuses and methods are also provided.

Abstract: A microscope, particularly a laser scanning microscope, with an adaptive optical device in the microscope beam path, comprising two reflective adaptive elements, at least one of which is constructed as an adaptive optical element, both of which are oriented with their reflector surface vertical to the optical axes of the microscope beam path, and a polarizing beam splitter whose splitter layer is located in the vertex of two orthogonal arms of the microscope beam path or two orthogonal portions of a folded microscope beam path, wherein a first adaptive element is associated with one arm and the other adaptive element is associated with the second arm, and a quarter-wave plate is located in each arm between the beam splitter and reflective adaptive element, and a detection device to which the detection light is directed and which is linked to the adaptive elements by evaluating and adjusting devices.

Abstract: The invention relates to an autofocus system for an optical instrument (1) that images a specimen (11), having an irradiation optical system (7) for generating an irradiation beam path that generates an autofocus pattern on the specimen (11), the irradiation beam path being directed onto the specimen by means of a deflection element (10), and having an autofocus analysis unit (19) to which is conveyed, by means of a deflection element (15), a detector beam path that encompasses radiation, reflected from the specimen (11), of the irradiation beam path, a micromirror array (20) having individually controllable and adjustable micromirrors being provided in combined fashion as a deflection element (10) for the irradiation beam path and as a deflection element (15) for the detector beam path.

Abstract: A sensor assembly including a detector; a first arrangement for enhancing the resolution of the detector; and a second arrangement for increasing the field-of-view of the detector. In a specific implementation, the detector is a focal plane array of detectors, the first arrangement is a Hadamard mask and the second arrangement is a telescope array with a field-bias element operationally coupled thereto. The field bias optical element is implemented with a prism and grating such as a grism. An arrangement is included for actuating the mask to selectively enable a desired level of resolution and another arrangement is included for actuating the field bias element to select a desired field of view. An arrangement for effecting image motion compensation is included along with an imager, an image processor and a data processor. The telescope array may include refractive elements, reflective elements, and/or catadioptric elements. Likewise, the imager may be refractive, reflective and/or catadioptric.

Abstract: The invention relates to a tilting adjustable surface profilometer, comprising an apparatus capable of adjusting an image acquiring angle. The apparatus includes two types of frameworks. One is a translation-stage-type tilting adjustable surface profilometer, which is enabled by the translations of two translation stage with the rotation of a rotary rack, a surface profile with an omni-directional angle of a sample can be obtained. The other framework is a surface profilometer with an arc-trajectory tilting apparatus, which is enabled by guiding the surface profilometer to slide along the arc rails with the rotations of the rotary rack, a surface profile with an omni-directional angle of a sample can be obtained.

Abstract: The invention relates to a near-field antenna comprising a dielectric shaped body having a tip. The shaped body is characterized in that at least the surface of the tip is metallized, thereby enhancing the sensitivity of devices comprising the near-field antenna, for example, spectroscopes, microscopes or read-write heads.

Abstract: A method of capturing a focused image of a continuously moving slide/objective arrangement is provided. A frame grabber device is triggered to capture an image of the slide through an objective at a first focus level as the slide continuously moves laterally relative to the objective. Alternatingly with triggering the frame grabber device, the objective is triggered to move to a second focus level after capture of the image of the slide. The objective moves in discrete steps, oscillating between minimum and maximum focus levels. The frame grabber device is triggered at a frequency as the slide continuously moves laterally relative to the objective so multiple images at different focus levels overlap, whereby a slide portion is common to each. The image having the maximum contrast value within overlapping images represents an optimum focus level for the slide portion, and thus the focused image. Associated apparatuses and methods are also provided.

Abstract: The present invention relates to an analysis apparatus, in particular a spectroscopic analysis apparatus, for analyzing an object, such as blood of a patient, and a corresponding analysis method. To aim the confocal detection volume inside a blood vessel orthogonal polarized spectral imaging (OPSI) is used to locate blood capillaries in the skin. An imaging system (img) with slightly shifted imaging planes (i1, i2) for OPS imaging of blood vessels is proposed to provide auto-focusing. The confocal Raman detection plane (dp) is located in between these two imaging planes (i1, i2). Based on measured amount of defocus for the imaging planes (i1, i2), the focusing of the imaging system (img), the excitation system (exs) for exciting the target region and the detection plane (dp) is located inside the blood vessel (V). Thus, continuous auto-focusing with high accuracy can be achieved. The invention relates also to an optical tracking system for continuously tracking a point of a moving object (obj).

Abstract: The invention relates to a measuring device and a method based on a confocal microscopy principle. The inventive device comprises a light source (1), a diaphragm unit (3) for limiting a beam, an imagine optical system (4) for focusing the light (5) which is irradiated by said source on a measurable object (6) and passes through said diaphragm unit. Said device also comprises an optical system (10) for receiving the light (5) reflected from the object and passing through said optical system or another diaphragm unit disposed in an observation beam (7) and an image receiver (10) which is provided with at least two radiation-sensitive sensor elements (13, 14) (pixel).

Abstract: A digital optical microscope includes a primary image sensor that generates a primary image of a sample at a primary frame rate, an auxiliary image sensor that generates an auxiliary image of the sample at an auxiliary frame rate that is faster than the primary frame rate, and a controller that adjusts a focal distance between an objective lens and the sample along an optical axis in response to the auxiliary image, thereby autofocusing the primary image on the sample. The primary image sensor generates the primary image in response to the autofocusing.

Abstract: A focusing method for an examination apparatus that can quickly and easily perform focusing for fluoroscopy is provided. The focusing method, for an examination apparatus that can observe fluorescence emitted from a specimen, includes a first step of irradiating the specimen with light via an objective lens to generate reflected light and fluorescence; a second step of performing focusing with respect to the surface of the specimen using the reflected light from the specimen; and a third step of performing focusing for the fluorescence based on the focal position of the specimen surface in the second step.

Abstract: Various types of optical members can be electrically inserted/extracted to/from an optical path. The state of the insertion/extraction or the state of opening/closing is detected by a sensor. An operating unit obtains various types of instructions. A controlling unit comprises a memory. The memory records a plurality of states of the insertion/extraction of an optical member in/from an optical path or the state of opening/closing, which is detected by the sensor, as an observation state. A controlling circuit switches an observation state to any of observation states recorded in the memory by controlling the insertion/extraction or the opening/closing each time the operating unit obtains an instruction to request the setting of an observation state.

Abstract: A focus sensing system adaptable for use in microscopes or other optical systems incorporates a selective beam block. An outgoing reference beam, incident upon a target to be inspected, is reflected to become an incoming reference beam. A beam block inserted within the optical system selectively rejects unwanted reflections from surfaces other than the target allowing the desired incoming reference beam to be photodetected without interference from reflections off of surfaces that are not of interest. The photodetector generates an electronic signal corresponding to the displacement of the target from the ideal focal point. The electrical signal may be used to drive a servomechanism to displace either the target or the microscope objective lens to bring the target into focus.

Abstract: The invention is directed to a method and a device for imaging structures either in the focal plane of the objective of a microscope or in the pupil of the objective or in the respective conjugate planes. For this purpose, the optical data of the imaging systems and the illumination wavelengths or fluorescence wavelengths are taken into account when determining the optimal position of the structures.

Abstract: An apparatus and method for optically analyzing samples in a biological sample container containing samples arranged at different locations on the base of the container. An optical acquisition device is provided comprising a detector and an objective. The position of the upper and lower surfaces of the base at each of the sample locations is determined by a confocal polychromatic displacement sensor. Light is collected from each of the sample locations by adjusting the focal plane to be coincident with, or vertically offset from, the upper surface of the base, as determined from the displacement sensor. This allows for rapid scanning of large numbers of samples in a multi-well plate or other biological sample containers.

Abstract: A system and method for imaging one or more objects in the presence of unknown phase and amplitude aberrations is described. Multiple images are collected so as to have measurement diversity and processed using a model-based approach to estimate the aberrations. An incoherent imaging model may be constructed to estimate the dependence of the imagery upon the object and the optical system, including the aberrations. A probability density function may then be calculated using the estimated model. Next, a maximum-likelihood estimate may be calculated and optimized, thus yielding a close approximation of the phase and amplitude aberrations. The estimates may then be used to estimate an image of the object or correct the system for future imaging.

Abstract: In a laser scanning microscope comprising an infrared pulse laser; an objective lens focusing an infrared light from the infrared pulse laser on a sample; a condenser lens disposed on an opposite side of the objective lens across the sample for collecting an observation light that is generated by a nonlinear optical effect and has a wavelength shorter than a wavelength of the infrared light; a visible light detector detecting the observation light collected by the condenser lens, an IR partial transmission filter having partially-modified transmission characteristics for the infrared light is disposed near a front focal position of the condenser lens, and an infrared light detector detecting, through the IR partial transmission filter, a transmitted light from the sample collected by the condenser lens, is provided.

Abstract: An electron beam apparatus comprises a TDI sensor 64 and a feed-through device 50. The feed-through device has a socket contact 54 for interconnecting a pin 52 attached to a flanged 51 for separating different environments and the other pin 53 making a pair with the pin 52, in which the pin 52, the other pin 53 and the socket contact 54 together construct a connecting block, and the socket contact 54 has an elastic member 61. Accordingly, even if a large number of connecting blocks are provided, the connecting force may be kept to such a low level as to prevent the breakage in the sensor. The pin 53 is connected with the TDI sensor 64, in which a pixel array has been adaptively configured based on the optical characteristic of an image projecting optical system. That sensor has a number of integration stages that can reduce the field of view of the image projecting optical system to as small as possible so that a maximal acceptable distortion within the field of view may be set larger.

Abstract: A method and system for creating a digital, virtual slide having optimum image quality characteristics. Multiple regions of a physical slide are identified as well as at least two focus z-positions z1, and z2. Each region of the physical slide is scanned (imaged) at the first z position, so as to produce a first set of digital images of each defined region. Each region of the physical slide is also scanned (imaged) at the second z position, so as to produce a second set of digital images of each defined region. Each image of each set is evaluated against a focus quality metric and, for each region, either the first or second image, corresponding to that region, is selected that exhibits a focus quality metric corresponding to a desired focus quality. These images are then merged into a digital virtual slide. Additional focus z-positions may be included, and the multiple z-positions may be scanned seriatim, sequentially, and/or in overlapping fashion.

Abstract: An apparatus and method were used to track the movement of fluorescent particles in three dimensions. Control software was used with the apparatus to implement a tracking algorithm for tracking the motion of the individual particles in glycerol/water mixtures. Monte Carlo simulations suggest that the tracking algorithms in combination with the apparatus may be used for tracking the motion of single fluorescent or fluorescently labeled biomolecules in three dimensions.

Abstract: A device for optically examining an object includes a lens, an object stage for receiving the object, and an image-recording apparatus for recording a series of individual images of the object in a number of planes. A piezo-controlled apparatus is provided for adjusting the distance between the lens and the object, and an image-generating apparatus is provided for generating a multifocus image from the series of individual images.

Abstract: The invention relates to a scanning microscope comprising a beam deflecting device (11), which directs an illuminating light beam (5) over or through a sample (21), and comprising a detector (33) for receiving detection light (23) exiting the sample. The scanning microscope comprises an extracting port (67) or another detector (37) and comprises a redirecting device (27), which is synchronized with the beam deflecting device and which directs the detection light according to the deflecting position of the beam deflecting device either to the detector or to the extracting port or to the other detector.

Abstract: The invention refers to a process for determining the focus position when imaging a specimen (4) with a field stop imaged onto the specimen detecting this image using a position-sensitive receiving-device inclined relative to the field stop defining the focus position by means of intensity distribution in the receiving device. The invention also refers to set-ups as regards implementation of the process according to the invention.

Abstract: For a confocal scanning electron microscope (1) an optical zoom system (41) with linear scanning is provided, which not only makes a zoom function possible, in that a variable magnification of an image is possible, but rather which additionally produces a pupil image in the illuminating beam path (IB) [BS] and thereby makes a variable imaging length possible (distance between the original pupil (En.P) [EP] and the imaged/reproduced pupil (Ex.P) [AP]) so that axially varying objective pupil positions can thereby be compensated.

Abstract: A scanning microscope with a first and at least one other detection channel is disclosed. The first detection channel comprises at least one first detector and the other detection channel comprises at least one other detector to detect the detection light given off by a sample. A switching mechanism is provided that selectively directs the detection light into the first or into the other detection channel.

Abstract: A microscopic imaging system includes a receiving means (2) for receiving an article (4) to be imaged, a linear optical detector (16), focussing means (10) for focussing an image of an article in the receiving means onto the detector, scanning means (6) for producing relative movement between the image and the detector in a direction substantially perpendicular to the axis of the detector, and an optical correcting element (14) for reducing aberrations in the image focussed onto the detector.

Abstract: The invention relates to an apparatus and a method for a scanning probe microscope, comprising a measuring assembly which includes a lateral shifting unit to displace a probe in a plane, a vertical shifting unit to displace the probe in a direction perpendicular to the plane, and a specimen support to receive a specimen. A condenser light path is formed through the measuring assembly so that the specimen support is located in the area of an end of the condenser light path.

Abstract: The invention relates to a method for adjusting focus in an automated microscope. The method may comprise the steps of: providing an optical detector for image acquisition, wherein the optical detector comprises an array of sensor pixels; designating a region of interest in the array of sensor pixels to emulate a confocal aperture; directing a light beam to illuminate an object according to a predefined pattern, thereby forming an image of the illuminated pattern at the optical detector, wherein the image of the illuminated pattern substantially overlaps the designated region of interest; detecting a light intensity from sensor pixels located within the designated region of interest; and adjusting a relative focal position of an objective lens based on the detected light intensity.

Abstract: A device for measuring the optical properties of an object, particularly of a chemical and/or biological sample, comprises an illumination light source for illuminating the object. Further, an excitation light source is provided for illuminating the object, wherein the radiation of the excitation light source being suited to change the optical properties of the object. Further, the excitation radiation is focused in a measurement volume arranged within the object. By means of a detector device, there can be detected preferably the transmission of the illumination radiation through the object within the measurement volume.

Abstract: The present invention relates to the analysis of specimens. Specifically, the invention relates to methods and apparatus for reviewing specimen slides, including apparatus for holding the slides. The invention also relates to an automatic focusing method for an imaging system and methods for accommodating vibration in the imaging system. In particular, the methods and apparatus may be applied to the automated analysis of cytological specimen slides.

Abstract: An image acquisition apparatus is disclosed that includes: an image pickup element that acquires images obtained using a microscope; a change detector that detects the amount of change between an image acquired by the image pickup element and a subsequent image acquired by the image pickup element; and a data-reduction processor that enables reduced-data images to be output, as well as images that have not been subject to data reduction or that have been subject to a different rate of data-reduction depending on the amount of change detected by the change detector. An image recording system that uses the image acquisition apparatus is also disclosed, as well as an associated method.

Abstract: The present invention provides a focus detection apparatus. In the focus detection apparatus, a luminous flux deformation member is provided to deform a sectional shape of a luminous flux emitted from a light source, and thereby a light quantity difference and a light intensity difference are decreased in light beams which are emitted to a sample surface and received by a photodetector even if objective lenses to be used are differ from each other in a pupil diameter. Consequently, the sample is irradiated with a single spot or multi spots to determine whether or not a focused state is obtained.

Abstract: The present invention relates to optical tweezers having a structure for realizing a great object-trapping force. The optical tweezers form an optical trap for trapping an object in, and in the vicinity of, each of plural trapping positions by converging output beams in each of the trapping positions. The optical tweezers comprise light emitting means for outputting a reading light, hologram generating means for generating an output hologram by arranging plural partial holograms two-dimensionally such that each partial hologram causes an output beam to converge in a corresponding trapping position, and a spatial light modulator for generating plural output beams, each of which has been phase-modulated in accordance with the output hologram, from the reading light which reaches the spatial light modulator.

Abstract: A method and system for creating a digital, virtual slide having optimum image quality characteristics. Multiple regions of a physical slide are identified as well as at least two focus z-positions z1, and z2. Each region of the physical slide is scanned (imaged) at the first z position, so as to produce a first set of digital images of each defined region. Each region of the physical slide is also scanned (imaged) at the second z position, so as to produce a second set of digital images of each defined region. Each image of each set is evaluated against a focus quality metric and, for each region, either the first or second image, corresponding to that region, is selected that exhibits a focus quality metric corresponding to a desired focus quality. These images are then merged into a digital virtual slide. Additional focus z-positions may be included, and the multiple z-positions may be scanned seriatim, sequentially, and/or in overlapping fashion.

Abstract: The invention provides a confocal microscope comprising a light source; a light scanning unit; an array device; a line-beam generating unit for imaging illumination light in the form of a straight line extending, on the array device, in a direction intersecting the scanning direction of the light scanning unit; an objective lens for imaging the illumination light reflected or transmitted at the array device on a specimen; a beamsplitter, between the array device and the light scanning unit, for splitting off from the illumination light detection light from the specimen; a two-dimensional image-acquisition unit for acquiring the split off detection light; and a control unit for controlling the light scanning unit and the array device, wherein the array device is disposed in an optically conjugate positional relationship with a focal plane of the objective lens, and the control unit performs control so as to synchronize the light scanning unit and the array device.