Abstract: The invention relates to a device for detecting and/or determining the position of a barrier layer contained in the wall of a tubular packaging material. The device comprises an infrared source and an infrared receiver, said source and said receiver being placed so as to transmit (receive, respectively) infrared radiation through part of the wall of a tube containing a barrier layer to be analyzed. The invention also relates to a method of detecting and/or determining the position of a barrier layer contained in the wall of a tubular packaging material 15, the method comprising transmitting infrared radiation through a tube wall containing a barrier layer, receiving and analyzing said infrared radiation.

Abstract: A terahertz wave generating device includes a first light source, a second light source and an antenna. The first light source and a second light source are configured and arranged to generate pulsed lights. The antenna is configured and arranged to generate terahertz waves when irradiated by the pulsed lights generated by the first light source and the second light source. The antenna has a pair of electrodes arranged opposite each other with a gap being formed therebetween. The first light source and the second light source are configured and arranged to irradiate the pulsed lights between the electrodes at timings that are offset from each other.

Abstract: The invention generally relates to systems and methods for mass spectrometry analysis of microorganisms in samples.

Abstract: Provided are a THz-wave generation/detection module and a device including the same, which increase heating efficiency and are miniaturized. The module includes a photomixer chip, a lens, a PCB, and a package. The photomixer chip includes an active layer, an antenna, and a plurality of electrode pads. The lens is disposed on the photomixer chip. The PCB includes a plurality of solder balls connected to the electrode pads, under the photomixer chip. The package surrounds a bottom and side of the PCB, and dissipates heating of the active layer, which is transferred from the electrode pad of the photomixer chip to the PCB, to outside.

Abstract: The present invention relates to a method and a device for direct, non-deformed one-shot measurement of the transient birefringence induced in an optical medium by a perturbation lying within the terahertz frequency range. The aim of the present invention is to alleviate the drawbacks of the prior art by providing a one-shot measurement method and a one-shot measurement device, these being based on the spectral encoding/decoding principle, which are compatible with all short pulse (UV-NIR) laser sources. In this regard, the invention provides a one-shot method for measuring the transient birefringence induced in an optical medium (12) by at least one terahertz perturbation (6), the method including a step of transmitting and spectrally encoding a pulsed optical signal (2).

Abstract: A terahertz ellipsometer, the basic preferred embodiment being a sequential system having a backward wave oscillator (BWO); a first rotatable polarizer that includes a wire grid (WGP1); a rotating polarizer that includes a wire grid (RWGP); a stage (STG) for supporting a sample (S); a rotating retarder (RRET) comprising first (RP), second (RM1), third (RM2) and fourth (RM3) elements; a second rotatable polarizer that includes a wire grid (WGP2); and a Golay cell detector (DET).

Abstract: An optical proximity sensor and housing for the same are disclosed. The housing is provided with at least two support structures and at least two modules. A first of the support structures transfers vertical forces applied to one end of a module to an opposite end of the opposite module. A second of the support structures inhibits a pivoting of the modules about the first support structure.

Abstract: A system for determining a sash panel position. An example system includes a linear array of light emitting elements spaced at equal distances from one another mounted on a fume hood frame. The light emitting elements generate a light path towards a sash panel such that the sash panel blocks the light path when positioned at the light emitting element. A linear array of light sensing elements is spaced at equal distances from one another on a side opposite the sash panel. The light sensing elements receive the light path generated by corresponding light emitting elements when the sash panel does not block the light path. The light sensing elements may be on modules having shift registers with bits corresponding to the light sensing elements. The shift register stores a state of the light sensing element and outputs a series of bits indicating the state of each light sensing element.

Abstract: Support structures for positioning sensors on a physiologic tunnel for measuring physical, chemical and biological parameters of the body and to produce an action according to the measured value of the parameters. The support structure includes a sensor fitted on the support structures using a special geometry for acquiring continuous and undisturbed data on the physiology of the body. Signals are transmitted to a remote station by wireless transmission such as by electromagnetic waves, radio waves, infrared, sound and the like or by being reported locally by audio or visual transmission. The physical and chemical parameters include brain function, metabolic function, hydrodynamic function, hydration status, levels of chemical compounds in the blood, and the like. The support structure includes patches, clips, eyeglasses, head mounted gear and the like, containing passive or active sensors positioned at the end of the tunnel with sensing systems positioned on and accessing a physiologic tunnel.

Abstract: Provided is a photoconductive element which solves a problem inherent in an element for generating/detecting a terahertz wave by photoexcitation that terahertz wave generation efficiency is limited by distortions and defects of a low temperature grown semiconductor. The photoconductive element includes: a semiconductor substrate; a semiconductor low temperature growth layer; and a semiconductor layer, which is positioned between the semiconductor low temperature growth layer and the semiconductor substrate and is thinner than the semiconductor low temperature growth layer, in which the semiconductor low temperature growth layer includes a semiconductor which lattice-matches with the semiconductor layer and does not lattice-match with the semiconductor substrate.

Abstract: A measurement device that includes a device main unit including at least one cavity for accommodating an analyte containing a specimen and an aperture array structure including a plurality of apertures extending therethrough in a direction perpendicular to a principal surface thereof. The aperture array structure is fixed such that part or all of the aperture array structure is positioned in the cavity.

Abstract: Systems and methods for analyzing samples in containers are provided, where an emitter emits radiation at a first location on the container, with a portion of the radiation passing through the container and into the sample, some of the radiation is reflected within the container, a detector receives a transmission Raman signal including Raman radiation from multiple portions of the sample, and a comparator compares the transmission Raman signal with the radiation emitted by the emitter.

Abstract: A system, for calculating an object location within a portal, includes a portal map formed by a plurality of infra-red beams. The system further includes a broken beam detector for detecting and recording, in response to an object moving through the portal map, data indicative of one or more broken beams of the plurality of infra-red beams. The data includes first data indicative of an initial position of the object within the portal, second data indicative of a subsequent position of the object within the portal, and third data including one or more time records. The system also includes at least one broken beam analyzer for obtaining the data from the broken beam detector, the broken beam analyzer calculating the object location based on at least one of the first data, the second data, and the third data.

Abstract: A device to measure the characteristics of droplets within a stream of liquid droplets used in spraying includes a light source supplying light across the stream of droplets; a detector to detect change in the light level caused by a passing droplet, the detector generating a signal according to the change in light; and a processor to analyze the characteristics of the droplets in the stream based on the signal produced by the detection means. The light passes through a slit in a panel disposed between the droplet stream and the detector, so that the change in level of light detected by the detector is proportional to the diameter of the droplet.

Abstract: A rechargeable battery is externally heated to induce thermal runaway, and material expelled from the battery is analyzed.

Abstract: Methods and a computer program product for deriving temperature information with respect to surfaces within a scene that is imaged radiometrically. A time sequence of radiometric data is acquired in frames viewed from distinct angles. A three-dimensional structure of the scene is derived, allowing viewing angles and distances to the imaged surfaces to be inferred. Normalized surface areas of the imaged surfaces are calculated based on the inferred viewing angles and emissivities of the imaged surfaces are corrected accordingly. Corrections also account for background radiation impinging on the imaged surfaces. The radiometric data are converted to a perceptible temperature map of the imaged surfaces.

Abstract: An optical measurement instrument includes one or more temperature sensors (122) arranged to measure sample well specific temperatures from sample wells (111-117) arranged to store samples (103-109) to be optically measured. A processing device (121) of the optical measurement instrument is arranged to correct, using a pre-determined mathematical rule, measurement results obtained by the optical measurements on the basis of the measured sample well specific temperatures. Hence, the adverse effect caused by temperature differences between different samples on the accuracy of the temperature correction of the measurement results is mitigated.

Abstract: An apparatus for determining the effective case-hardening or nitriding depth of a steel component comprises a measuring head, including a laser source generating a variable frequency radiation for the scanning of pre-determined portions of the component to be measured; an infrared detector, configured so as to detect infrared radiation generated by the component to be measured; and computing means of spectra of the infrared radiation received; and an evolventimeter, connected to the measuring head and including first computing means suitable for computing a hardness profile of the component to be measured on the basis of a launch profile and spectra of the infrared radiation received and second computing means suitable for computing the effective case-hardening depth from the hardness profile computed.

Abstract: An apparatus configured to acquire information on an object to be measured by an electromagnetic wave pulse, the apparatus includes: a generating unit configured to generate the electromagnetic wave pulse with which the object to be measured is irradiated; a detecting unit configured to detect the electromagnetic wave pulse from the object to be measured; a casing including at least a part of a propagation path of the electromagnetic wave pulse leading from the generating unit to the detecting unit; and a measuring window unit configured to change a propagation distance of the electromagnetic wave pulse by moving a measuring window disposed in a part of the casing. The object to be measured is disposed on an opposite side of the propagation path of the electromagnetic wave pulse inside the casing by interposing the measuring window.

Abstract: The present invention relates to a terahertz imaging device comprising a terahertz source, a converter for converting terahertz radiation into thermal radiation, and a thermal detector. The converter has at least one zone sensitive to terahertz radiation, designed to absorb the terahertz radiation and vconvert the absorbed radiation into heat. This sensitive zone is close to a reference zone, of known absorption capacity, and the thermal detector is designed to measure the heat generated by the sensitive zone relative to the heat generated by the reference zone.

Abstract: Excitation light of two wavelengths is incident to an optical crystal from a first face side, and a terahertz wave THzb is generated from a second face, and the excitation light that has passed through the optical crystal is reflected, made incident to the optical crystal from the second face side, and a terahertz wave THza is generated from the first face. Terahertz waves with similar characteristics to each other are thereby generated reliably in plural directions.

Abstract: A device and method for testing a fibre-composite component, which is to be processed by means of bonding, for the presence of at least one substance out of a selection of possible contaminants. A surface heating device for regional heating of a part-zone of the fibre-composite component to be bonded is performed for desorption of contaminants. A sensor array with a plurality of sensors detects contaminants in the gas phase, and a control device ascertains and signals contaminations which are found. An extractor device can be employed to extract machining dust from the fibre-composite component to a desorption device.

Abstract: An optical device may include first and second lasers generating first and second laser beams; and a photo detector detecting the first and second laser beams. The optical detector comprises a substrate, a first impurity layer on the substrate, an absorption layer on the first impurity layer and a second impurity layer on the absorption layer. The absorption layer generates a terahertz by a beating of the first and second laser beams and has a thickness of less than 0.2 ?m.

Abstract: A device for the contactless and nondestructive testing of a surface by measuring the infrared radiation thereof has one or more incoherent electromagnetic radiation sources (1) and a detector (14) arranged on a detection axis (9), wherein the radiation sources (1) are arranged at a radial distance from the detection axis (9), at a distance from a testing area (7). In this arrangement, a pulsed or intensity-modulated excitation radiation (2) can be generated by these radiation sources (1) and applied to the surface (6) to be tested in the testing area (7) at an inclination to the detection axis (9) in the testing area (7). The detection radiation emitted by a measuring area (8) of the surface (6) to be tested can be fed to the detector (14), wherein the detector (14) is arranged on the detection axis (9) further away spatially from the testing area (7) than the radiation sources (1).

Abstract: A method for inspecting a substrate having intrinsic heterogeneous patterns for the presence of cracks comprises the steps of providing an optical device and front-side lighting on a first side of the substrate and providing near-infrared lighting on a second side of the substrate opposite to the first side. The near-infrared lighting is operable to penetrate the substrate so as to be detectable by the optical device through the substrate. One or more images are obtained by illuminating the substrate with the front-side lighting and/or the near-infrared lighting from the second side. The one or more images are thereafter processed to distinguish between the heterogeneous patterns on the substrate and any cracks present on the substrate.

Abstract: A TeraMOS sensor based on a CMOS-SOI-MEMS transistor, thermally isolated by the MEMS post-processing, designed specifically for the detection of THz radiation which may be directly integrated with the CMOS-SOI readout circuitry, in order to achieve a breakthrough in performance and cost. The TeraMOS sensor provides a low-cost, high performance THz passive or active imaging system (roughly in the range of 0.5-1.5 THz) by combining several leading technologies: Complementary Metal Oxide Semiconductor (CMOS)-Silicon on Insulator (SOI), Micro Electro Mechanical Systems (MEMS) and photonics. An array of TeraMOS sensors, integrated with readout circuitry and driving and supporting circuitry provides a monolithic focal plane array or imager. This imager is designed in a commercial CMOS-SOI Fab and the MEMS micromachining is provided as post-processing step in order to reduce cost.

Abstract: A terahertz spectrometer having a wider range of terahertz radiation source, high temporal resolution of scanning (<0.0.099 ?m or ˜0.3 pico second) over a wider range of scanning (up to ˜100 pico seconds). Also disclosed are exemplary applications of the spectrometer in biomedical, biological, pharmaceutical, and security areas.

Abstract: A terahertz-wave element includes a waveguide (2, 4, 5) that includes an electro-optic crystal and allows light to propagate therethrough, and a coupling member (7) that causes a terahertz wave to enter the waveguide (2, 4, 5). The propagation state of the light propagating through the waveguide (2, 4, 5) changes as the terahertz wave enters the waveguide (2, 4, 5) via the coupling member (7).

Abstract: A method and device are disclosed for simulating a light source having a light intensity profile that varies in time. The method includes providing a light source; using a mask to at least partially block light emitted by the light source; and adjusting the position of the mask in accordance with an electrical signal representative of the light intensity profile so as to adjust the extent to which the mask blocks light from the light source, and thereby providing the light intensity profile that varies in time. The device can include a mask to at least partially block light from a light source; and an actuator for adjusting the position of the mask in accordance with the electrical signal.

Abstract: A system and associated method for analyzing a smoking article filter is provided. An emitter emits an initial signal toward a smoking article filter. The initial signal may have a frequency between about 0.1 teraHertz and about 10 teraHertz. A sensor may detect a resultant signal resulting from interaction of the initial signal with the smoking article filter. An analysis unit may receive the resultant signal from the sensor, determine a filter status based on the resultant signal, and output an indicium indicative of the filter status. The filter status may include a capsule presence within the smoking article filter, a capsule absence from the smoking article filter, a proper insertion of a capsule into the smoking article filter, a defective insertion of a capsule into the smoking article filter, a proper capsule within the smoking article filter, and a defective capsule within the smoking article filter.

Abstract: A correlation is preliminarily obtained between a depth of damage and a ratio between a temperature gradient in temperature distribution on a surface of an area containing the damage and a temperature difference between a maximum temperature and a minimum temperature in the temperature distribution. The temperature distribution on the surface of the area containing the damage in the structure is then measured. Once the temperature distribution on the structure surface is obtained, attention is focused on temperature distribution between two points including the damaged area, so that a temperature difference between a maximum temperature and a minimum temperature in the distribution is obtained, and further a temperature gradient of an interval exhibiting temperature variation equal to or higher than a predetermined level is obtained.

Abstract: Various embodiments of a compact optical proximity sensor with a ball grid array and windowed or apertured substrate are disclosed. In one embodiment, the optical proximity sensor comprises a printed circuit board (“PCB”) substrate comprising an aperture and a lower surface having electrical contacts disposed thereon, an infrared light emitter and an infrared light detector mounted on an upper surface of the substrate, an integrated circuit located at least partially within the aperture, a molding compound being disposed between portions of the integrated circuit and substrate, an ambient light detector mounted on an upper surface of the integrated circuit, first and second molded infrared light pass components disposed over and covering the infrared light emitter and the infrared light detector, respectively, and a molded infrared light cut component disposed between and over portions of the first and second infrared light pass components.

Abstract: A soda-lime-silica glass container and related methods of manufacturing. A black-strikable glass composition having a base glass portion and a latent colorant portion is prepared. The base glass portion includes soda-lime-silica glass materials and one or more blue colorant materials, and the latent colorant portion includes cuprous oxide (Cu2O), stannous oxide (SnO), bismuth oxide (Bi2O3), and carbon (C). Glass containers may be formed from the black-strikable glass composition, and these glass containers may be heated to a temperature greater than 600 degrees Celsius to strike black therein. The glass containers formed from the black-strikable glass composition may be inspected—before or after striking—by infrared inspection equipment.

Abstract: A nanogap device for field enhancement is described, which includes: a film made of an electrically conductive material; and a nanogap formed on the film and having a gap-width between a Thomas-Fermi screening length and a skin depth, the Thomas-Fermi screening length and the skin depth being determined by an electromagnetic wave and the electrically conductive material, and system for nanoparticle detection using the device.

Abstract: Provided are a measuring device and a measuring method that use terahertz light, by which a substance to be detected can be detected with high sensitivity and high accuracy. A measuring device using a pulsed electromagnetic wave is provided with a substance detection plate, a means for generating the pulsed electromagnetic wave having amplitude intensity dependent on the amount of a substance to be detected at an irradiation position by irradiating the substance detection plate with a pulsed laser beam, and a detection means for detecting the amplitude intensity of the pulsed electromagnetic wave, and measures the change of the state of a solution containing the substance to be detected on the basis of the amplitude intensity.

Abstract: A moisture detection system for characterizing moisture on a sample includes a generator adapted to emit an incident beam of radiation from the terahertz spectrum of frequency onto the sample; a detector adapted to receive a reflected beam of radiation from the sample and measure radiation in the reflected beam; and a controller adapted to correlate the radiation in the reflected beam with an amount of moisture on the sample.

Abstract: A method and apparatus for remotely detecting, locating, and identifying chemicals and chemical compounds through optically opaque materials. Electromagnetic radiation in the Terahertz range emitted from an antenna array is modulated to excite target molecules. The apparatus then stops the excitation energy and the molecules emit an electromagnetic signature detectable by the device at standoff distances.

Abstract: An example method of detecting components of a gas includes detecting substantially all components of a gas using distinct infrared wavelengths within a portion of the infrared spectrum, the portion being less than the entire infrared spectrum.

Abstract: Methods and systems for characterizing a plasma with radiation, particularly, terahertz (THz) radiation, are disclosed. The disclosed method of characterizing a plasma includes directing THz radiation into the plasma; and detecting an emission due to interaction of the THz radiation with the plasma to characterize the plasma. A disclosed plasma characterizing device includes a means for directing THz radiation into a plasma; and a detector adapted to detect an emission emitted by the plasma due to interaction of the THz radiation with the plasma to characterize the plasma. A plasma characterizing system is also disclosed. The emission detected may be a fluorescence, a variation in fluorescence and/or an acoustic emission.

Abstract: According to an embodiment of the present disclosure, an apparatus of inspecting an overlapped substrate obtained by bonding substrates together is provided. The apparatus includes a first holding unit configured to hold and rotate the overlapped substrate, and a displacement gauge configured to measure displacements of peripheral sides of a first substrate and a second substrate constituting the overlapped substrate while rotating the overlapped substrate held by the first holding unit.

Abstract: Disclosed herein are processes, apparatuses, and systems for monitoring and/or controlling caustic concentrations in caustic scrubbers. In various aspects, the processes, apparatuses, and systems comprise a real-time online method for measuring the concentration of caustic in process scrubbers wherein a probe is coupled to a spectrometer; collecting absorption data with wavelength range from about 1000 to about 2000 nm. In a further aspect, this technique tracks the use and recharge of caustic in process scrubbers. This abstract is intended as a scanning tool for purposes of searching in the particular art and is not intended to be limiting of the present invention.

Abstract: A low-power 4×4-pixel THz camera with responsivity greater than 2.5 MV/W and sub-10 pW/?Hz NEP at 0.25 THz is integrated in 130 nm silicon without using either high-resistivity substrates or silicon lenses. Imaging results with a fully integrated radiating CMOS power source demonstrate the first entirely silicon-based THz imager.

Abstract: A device for modulating terahertz waves includes a metal layer (703) including a continuous metal portion (705) and island metal portions (707). The metal portions (705, 707) are separated by apertures (709). The device further includes a semiconductor layer (715) affixed to a bottom surface of the metal layer (703). The semiconductor layer (715) includes carrier regions (717) located below the apertures (709). The transmission of terahertz waves through the apertures (709) is modulated by changing a voltage applied across the aperture via voltage source (715). By injecting free carriers into carrier regions (717) due to a change of the voltage an extraordinary terahertz transmission effect of the metal layer (703) can be switched off. A small increase in the free-carrier absorption is significantly enhanced by the Fabry-Perot resonance, resulting in a substantial decrease in transmission.

Abstract: A measurement structure including an aperture array structure made of a metal and having a plurality of aperture portions, and a support base supporting the aperture array structure. The measurement structure is used in a measuring method by applying an electromagnetic wave to the measurement structure on which a specimen is held, detecting frequency characteristics of the electromagnetic wave transmitted through the measurement structure or reflected by the measurement structure, and measuring characteristics of the specimen. At least a first part of a surface of the aperture array structure proximal to the support base is joined to the support base, and at least a second part of the surface of the aperture array structure defines at least part of the plurality of aperture portions, the second part of the surface being proximal to the support base and not in contact with the support base.

Abstract: A terahertz wave generating device includes a plurality of light sources and an antenna. The light sources are configured to generate pulsed light. The antenna is configured to generate terahertz waves by being irradiated with the pulsed light generated by the light sources. The antenna has a plurality of pairs of electrodes with the electrodes in each of the pairs facing each other across a gap portion with a predetermined distance. The light sources is configured to irradiate the gap portions between the electrodes in the pairs with the pulsed light such that the gap portions between the electrodes of at least two of the pairs are irradiated with the pulsed light at mutually different timings.

Abstract: The present invention relates to a 3D scanner (1) which is able to make 3D modeling of the transparent objects in real-time by utilizing the thermography technique in order to make quality control in the industry; comprising a slider (2), a heater (3), a thermal camera (5) and a control unit (6).

Abstract: Disclosed are methods and apparatus for determining an unknown degree of amorphicity in a bulk-solidifying amorphous alloy. A specimen can be prepared from the alloy, irradiated with passive radiation, imaged to provide a thermal image, and the image analyzed to assess the differences in emissivities in the image. The degree of amorphicity can be determined based on the differences in thermal emissivities.

Abstract: A system for imaging a distribution of an absorbent material within an absorbent article. The system includes a radiation source and a detector positioned such that the absorbent article is situated between the radiation source and the detector. The absorbent article includes an absorbent material having a spatial distribution within the absorbent article. Infrared radiation within a particular wavelength range (e.g., 3 ?m to 3.2 ?m) is more likely to be absorbed by the absorbent material than by other materials within the absorbent article. The radiation source is configured to generate infrared radiation incident on the absorbent article. The detector is configured to detect a quantity of the infrared radiation within the particular wavelength range that was transmitted through the absorbent article. The radiation source is further configured to generate data indicative of the spatial distribution of the absorbent material based on the detected quantity of the infrared radiation.

Abstract: An apparatus visualizing internal information of an object includes a detection unit of terahertz wave, a generating unit of a time waveform of the terahertz wave, a modulation unit, an adjustment unit, and an addition unit. The modulation unit sequentially performs spatial modulation on a propagation distance for each pixel of a terahertz wave corresponding to a pixel in a horizontal direction by using a plurality of modulation patterns, and emits a plurality of terahertz waves. Based on a time amount converted from the change of the propagation distances corresponding to the modulation patterns, the adjustment unit adjusts a position on a time axis of the time waveforms of a plurality of terahertz waves and calculates a new plurality of time waveforms. The addition unit adds a new time waveform for each pixel. The apparatus can suppress reduction in signal intensity of a terahertz wave while maintaining detection sensitivity.

Abstract: A terahertz scanning reflectometer is described herein. A high sensitivity terahertz scanning reflectometer is used to measure dynamic surface deformation and delamination characteristics in real-time. A number of crucial parameters can be extracted from the reflectance measurements such as dynamic deformation, propagation velocity, and final relaxation position. A terahertz reflectometer and spectrometer are used to determine the permeation kinetics and concentration profile of active ingredients in stratum corneum.