Abstract: A tamper-resistant microchip package contains fluid- or nanofluid-filled capsules, channels, or reservoirs, wherein the fluids, either alone or in combination, can destroy circuitry by etching, sintering, or thermally destructing when reverse engineering of the device is attempted. The fluids are released when the fluid-filled cavities are cut away for detailed inspection of the microchip. Nanofluids may be used for the sintering process, and also to increase the thermal conductivity of the fluid for die thermal management. Through-vias and micro vias may be incorporated into the design to increase circuitry destruction efficacy by improving fluid/chip contact. Thermal interface materials may also be utilized to facilitate chip cooling.
Type:
Application
Filed:
September 17, 2010
Publication date:
March 22, 2012
Applicant:
ENDICOTT INTERCONNECT TECHNOLOGIES, INC.
Inventors:
Rabindra N. Das, Voya R. Markovich, James J. McNamara, JR., Mark D. Poliks
Abstract: A semiconductor device includes a substrate, a semiconductor element disposed on the main surface of the substrate and generating a heat of 200° C. or more, an enclosure surrounding the semiconductor element, and a liquid sealant containing a heat-resistant oil. The enclosure controls the flow of the sealant and seals the semiconductor element.
Abstract: In one embodiment, the present invention includes a semiconductor package having a plurality of fan blades embedded within a first surface of the package, where a first group of the fan blades extend from a first side of the package and a second group of the fan blades extend from a second side of semiconductor package. The fan blades may be powered by piezoelectric devices to cause motion of the fan blades. Other embodiments are described and claimed.
Type:
Grant
Filed:
March 9, 2007
Date of Patent:
May 11, 2010
Assignee:
Intel Corporation
Inventors:
Edoardo Campini, Javier Leija, William Handley
Abstract: An LGA structure is provided having at least one semiconductor device over a substrate and a mechanical load apparatus over the semiconductor device. The structure includes a load-distributing material between the mechanical load apparatus and the substrate. Specifically, the load-distributing material is proximate a first side of the semiconductor device and a second side of the semiconductor device opposite the first side of the semiconductor device. Furthermore, the load-distributing material completely surrounds the semiconductor device and contacts the mechanical load apparatus, the substrate, and the semiconductor device. The load-distributing material can be thermally conductive and comprises an elastomer and/or a liquid. The load-distributing material comprises a LGA interposer adapted to connect the substrate to a PCB below the substrate and/or a second substrate. Moreover, the load-distributing material comprises compressible material layers and rigid material layers.
Type:
Application
Filed:
August 30, 2007
Publication date:
March 5, 2009
Applicant:
INTERNATIONAL BUSINESS MACHINES CORPORATION
Inventors:
William L. Brodsky, James A. Busby, Bruce J. Chamberlin, Mitchell G. Ferrill, David L. Questad, Robin A. Susko