By Resistance Or Impedance Measuring Patents (Class 324/525)
-
Patent number: 7956616Abstract: A system and method for measuring a cable resistance in a power over Ethernet (PoE) application. A short circuit module in a powered device is designed to produce a short circuit effect upon receipt of a cable resistance detection voltage. The cable resistance detection voltage can be designed to be greater than a voltage for detection or classification and less than a voltage for powering of the powered device. The measurement of the current at a time when a short circuit effect is produced at the powered device enables a calculation of the actual resistance of the cable on a given PoE port.Type: GrantFiled: March 29, 2010Date of Patent: June 7, 2011Assignee: Broadcom CorporationInventor: James Yu
-
Patent number: 7932726Abstract: A method of improving the clean, rinse and dry processes during the manufacture of ICs, MEMS and other micro-devices to conserve solution and energy while completing the process within a specified time. An electro-chemical residue sensor (ECRS) provides in-situ and real-time measurement of residual contamination on a surface or inside void micro features within the sensor representative of conditions on production wafers. The measured impedance can be used to determine what process variables and specifically how process conditions affect the rate of change of the measured impedance. The in-situ measurements are used to design and optimize a production process and/or to monitor the production run in real-time to control the process conditions and transfer of a patterned wafer through the processes.Type: GrantFiled: January 3, 2008Date of Patent: April 26, 2011Assignee: Environmental Metrology CorporationInventors: Bert M. Vermeire, Farhang F. Shadman
-
Patent number: 7932727Abstract: Electrical and visual test structures monitor the degree of removal of conductive sacrificial layers used in micromachining processes that fabricate micro-electromechanical systems (MEMS).Type: GrantFiled: March 31, 2008Date of Patent: April 26, 2011Inventors: Christian Bolle, Flavio Pardo
-
Patent number: 7932728Abstract: A method of fabricating a MEMS device includes conditioning of an insulating layer by applying a voltage across the insulating layer via a conductive sacrificial layer for a period of time, prior to removal of the conductive sacrificial layer. This conditioning process may be used to saturate or stabilize charge accumulated within the insulating layer. The resistance across the insulating layer may also be measured to detect possible defects in the insulating layer.Type: GrantFiled: June 16, 2009Date of Patent: April 26, 2011Assignee: QUALCOMM MEMS Technologies, Inc.Inventors: Chen-Jean Chou, Chun-chen Wu, Patrick F. Brinkley
-
Patent number: 7924021Abstract: The function of a lamp circuit is tested by measuring the current and voltage. A resistance value is taken into account which is specified as a polynomial of at least the 1st order depending on the effective measured voltage on the lamp circuit. The parameters of the polynomial are determined by a quantity of measurements which correspond to the order of the polynomial, under operating conditions which are known to differ, and the specific resistance value or a value derived from it are compared with a specified value.Type: GrantFiled: November 19, 2004Date of Patent: April 12, 2011Assignee: Conti Temic Microelectronic, GmbHInventors: Uli Joos, Jochen Zwick, Nicolai Jeutner
-
Patent number: 7919967Abstract: Test methods and components are disclosed for testing the quality of a fabrication process used to form read elements in magnetic heads. A wafer is populated with one or more test components along with magnetic heads. The test components are formed by the same or similar fabrication processes as the read elements, but do not include a conductive MR sensor between the test leads. By measuring the resistance of the test components, the formation of parasitic shunts can be identified in the test components, which may indicate the formation of parasitic shunts in the read elements. Thus, the quality of the fabrication process in forming read elements in magnetic head may be determined.Type: GrantFiled: December 27, 2007Date of Patent: April 5, 2011Assignee: Hitachi Global Storage Technologies Netherlands, B.V.Inventors: Satoru Araki, Robert S. Beach, David J. Seagle
-
Publication number: 20110043214Abstract: Methods to determine the location of an arc fault include a first method utilizing the inherent resistance per unit length of the wire. A second and a third method utilize an inherent inductance per unit length of the wire. The second method derives the inherent inductance from the output voltage and a rate of current rise. The third method derives the inherent inductance from a resonant frequency of an oscillating current. The information is useful to locate a fault emanating from a wire member of a wiring harness used to distribute power about an aircraft.Type: ApplicationFiled: August 19, 2009Publication date: February 24, 2011Inventors: Frederick J. Potter, Vitaliy Mosesov
-
Patent number: 7872479Abstract: In a leak testing and leak localization arrangement for leak testing and localization for flat roofs or the like which are sealed by at least one electrically insulating sealing web (6), at least one voltage source (12) is applied between an upper side of the sealing web and below an underside of the sealing web. The upper side of the sealing web is sampled by means of a measuring device (9) provided with two measurement sensors (10, 11). In order to achieve reliable leak testing and precise leak localization with contact being made in an uncomplicated manner with the voltage source (12), web-shaped electrically conductive material is arranged on the underside of the sealing web (6) and is connected to one terminal of the voltage source (12). For this purpose, at least one metal grating web is provided as the web-shaped electrically conductive material, which web can be laid easily and is non-combustible and durable.Type: GrantFiled: April 25, 2006Date of Patent: January 18, 2011Inventors: Bernd Lorenz, Markus Bruehl, Klaus Burger
-
Patent number: 7863911Abstract: A combined manufacturable wafer and test device for measuring a tunneling-magnetoresistance property of a tunneling-magnetoresistance, sensor-layer structure. The combined manufacturable wafer and test device comprises a tunneling-magnetoresistance, sensor-layer structure disposed on a substrate. The combined manufacturable wafer and test device also comprises a plurality of partially fabricated tunneling-magnetoresistance sensors; at least one of the partially fabricated tunneling-magnetoresistance sensors is disposed at one of a plurality of first locations. The test device is disposed on the substrate at a second location different from the plurality of first locations. The test device allows measurement of the tunneling-magnetoresistance property of the tunneling-magnetoresistance, sensor-layer structure using a current-in-plane-tunneling technique.Type: GrantFiled: December 31, 2007Date of Patent: January 4, 2011Assignee: Hitachi Global Storage Technologies, Netherlands, B.V.Inventors: Ying Hong, Wipul P. Jayasekara, Daniele Mauri, David J. Seagle
-
Patent number: 7849581Abstract: Provided are fabrication, characterization and application of a nanodisk electrode, a nanopore electrode and a nanopore membrane. These three nanostructures share common fabrication steps. In one embodiment, the fabrication of a disk electrode involves sealing a sharpened internal signal transduction element (“ISTE”) into a substrate, followed by polishing of the substrate until a nanometer-sized disk of the ISTE is exposed. The fabrication of a nanopore electrode is accomplished by etching the nanodisk electrode to create a pore in the substrate, with the remaining ISTE comprising the pore base. Complete removal of the ISTE yields a nanopore membrane, in which a conical shaped pore is embedded in a thin membrane of the substrate.Type: GrantFiled: May 3, 2007Date of Patent: December 14, 2010Assignee: University of Utah Research FoundationInventors: Henry S. White, Bo Zhang, Ryan J. White, Eric N. Ervin, Gangli Wang
-
Patent number: 7825672Abstract: Methods to determine an instantaneous resistance value of an electric circuit and a measurement system to determine an instantaneous resistance value of an electric circuit are disclosed. Exemplary embodiments of the method measure an in-situ instantaneous voltage of the circuit and an in-situ instantaneous current of the circuit and calculate the instantaneous resistance. Optional temperature measurement can be included in the method and the calculated instantaneous resistance related to the measured temperature. The method can be applied to phase angle fired loads and to zero-cross (time proportioned) loads.Type: GrantFiled: June 19, 2006Date of Patent: November 2, 2010Assignees: MRL Industries, Inc., Sandvik Intellectual Property ABInventors: Kevin B. Peck, Noel Johnson, Björn Å. Larsson, Pontus K. H. Nilsson
-
Patent number: 7821413Abstract: A method for reducing the occurrence of false ground fault detections in a central office terminal is provided. The method includes generating a no-fault signal when no ground current is detected, delaying generation of a fault signal when ground current is detected at least for the duration of an expected pulse in AC induced signal, and when the ground current persists for a sufficient period, generating a signal indicating a fault condition.Type: GrantFiled: September 29, 2008Date of Patent: October 26, 2010Assignee: ADC DSL Systems, Inc.Inventors: William J. Fox, Michael Carter
-
Publication number: 20100259276Abstract: A circuit, system and method for detecting the presence of a leakage path in a multi-cell voltage source is described. The system includes a detection circuit, the detection circuit having a first amplifier and a second amplifier, a first input of the first amplifier connected to a first terminal of the voltage source and the first input of the second amplifier connected to a second terminal of the voltage source, a second input of each of the first and second amplifiers connected to a reference voltage point, and an output of each of the first and second amplifiers connected to a respective first and second output of the detection circuit; and a processor having inputs connected to the first and second outputs of the detection circuit.Type: ApplicationFiled: March 26, 2010Publication date: October 14, 2010Applicant: ANALOG DEVICES, INC.Inventor: Lawrence C. STREIT
-
Publication number: 20100225329Abstract: A load compensation method for phase-to-ground loops in distance protection. A first reactive reach is estimated assuming zero fault resistance or with a positive sequence current. A second reactive reach is estimated with a zero sequence current. A third reactive reach is estimated with a negative sequence current. An import or export condition is estimated. A fourth reactive reach for import or export condition is estimated based on the first, second and third reactive reach. A fault impedance is estimated based on the estimated fourth reactive reach.Type: ApplicationFiled: October 18, 2006Publication date: September 9, 2010Applicant: ABB Technology Ltd.Inventors: Magnus Akke, Björn Westman, Henrik Åshuvud
-
Patent number: 7786736Abstract: Methods and structural defect detectors for detecting a structural defect in composites are presented. An exemplary method includes forming a nanocomposite including a plurality of nanotubes mechanically aligned in a principal direction within a polymer matrix. A voltage is applied to the nanocomposite and a resistance of the nanocomposite is measured using the applied voltage to detect the structural defect. An exemplary structural defect detector includes a nanocomposite including a plurality of mechanically aligned nanotubes within the polymer matrix, electrodes coupled to the nanocomposite, a voltage source for applying a voltage to the electrodes, and a resistance detector for measuring a resistance of the nanocomposite that allows identification of a structural defect. The plurality of nanotubes form a conducting percolating network of sensors.Type: GrantFiled: October 2, 2007Date of Patent: August 31, 2010Assignee: University of DelawareInventors: Erik T. Thostenson, Tsu-Wei Chou
-
Patent number: 7782062Abstract: Method for establishing and possibly locating leaks in pipelines (1) for transporting liquid or gaseous media using at least one electrical conductor (2) running along the longitudinal extension of the pipeline (1) from a starting point to an end point. Accordingly, a defined test voltage (Um, UL) is applied between two electrical conductors (2) or between one electrical conductor 92) and the pipeline (1), and the resistance and/or impedance behavior between starting point and end point of the two conductors (2) or the conductor (2) and the pipeline (1) is ascertained with intact pipeline (1), and at later times, the resistance and/or impedance behavior is ascertained at the same test voltages (Um, UL) and compared to the resistance and/or impedance behavior known for the intact pipeline (1), the presence of a leak being thusly ascertained.Type: GrantFiled: July 7, 2006Date of Patent: August 24, 2010Inventor: Günther Bier
-
Patent number: 7777498Abstract: A method and apparatus is disclosed for determining power line parameter of a system. Specifically, there is provided a system for determining comprising a networked device including a voltage perturbation circuit coupled to a voltage source and configured to perturb the waveform of the voltage source, and a voltage measurement circuit coupled to the voltage source and configured to transmit voltage measurements of the waveform over a network and a remote monitoring unit, coupled to the network, and configured to receive the voltage measurements over the network and to calculate an incident energy using the voltage measurements.Type: GrantFiled: April 30, 2008Date of Patent: August 17, 2010Assignee: Rockwell Automation Technologies, Inc.Inventors: Michael L Gasperi, David L. Jensen, David T Rollay
-
Patent number: 7777505Abstract: A nanopore device includes a membrane having a nanopore extending there through forming a channel from a first side of the membrane to a second side of the membrane. The surface of the channel and first side of the membrane are modified with a hydrophobic coating. A first lipid monolayer is deposited on the first side of the membrane, and a second lipid monolayer is deposited on the second side of the membrane, wherein the hydrophobic coating causes spontaneous generation of a lipid bilayer across the nanopore orifice. Sensing entities, such as a protein ion channel, can be inserted and removed from the bilayer by adjusting transmembrane pressure, and adapter molecules can be electrostatically trapped in the ion channel by applying high transmembrane voltages, while resistance or current flow through the sensing entity can be measured electrically.Type: GrantFiled: May 2, 2007Date of Patent: August 17, 2010Assignee: University of Utah Research FoundationInventors: Henry S. White, Ryan J. White, Eric N. Ervin
-
Patent number: 7773353Abstract: An ECU determines based on a voltage from an insulation resistance decrease detector whether the insulation resistance of a power supply device decreases or not. When a load external to the vehicle is not connected to the power supply device, the ECU sets a determination threshold value for determining that the insulation resistance decreases to a normal first value. On the other hand, when the load external to the vehicle is electrically connected to the power supply device, the ECU sets the determination threshold value to a second value which is lower than the first value, in consideration of an increase in the capacitive component due to a capacitor of a Y-capacitor.Type: GrantFiled: February 1, 2007Date of Patent: August 10, 2010Assignee: Toyota Jidosha Kabushiki KaishaInventor: Kenji Uchida
-
Patent number: 7750643Abstract: Processes and systems for detecting surface anomalies in components generally includes contacting a surface of the component with a detection apparatus, wherein the detection apparatus includes at least one post, a wire extending from the post and a sensor in operative communication the wire; and sensing the surface anomaly as an increase in resistance of the wire across the surface.Type: GrantFiled: October 30, 2007Date of Patent: July 6, 2010Assignee: General Electric CompanyInventor: Curtis Wayne Rose
-
Patent number: 7749778Abstract: A method of monitoring and testing electro-migration and time dependent dielectric breakdown includes forming an addressable wiring test array, which includes a plurality or horizontally disposed metal wiring and a plurality of segmented, vertically disposed probing wiring, performing a single row continuity/resistance check to determine which row of said metal wiring is open, performing a full serpentine continuity/resistance check, and determining a position of short defects.Type: GrantFiled: January 3, 2007Date of Patent: July 6, 2010Assignee: International Business Machines CorporationInventors: Kaushik Chanda, Lawrence Clevenger, Timothy J. Dalton, Louis L. C. Hsu, Chih-Chao Yang
-
Patent number: 7746080Abstract: A system and a method for determining a position of a single phase fault to ground in a feeder line are provided. The feeder line is electrically connected to an electrical substation via a substation bus. The system includes first and second sensors electrically coupled to a transformer in the electrical substation. The system further includes a processor that determines a reactance value based on measured electrical characteristics and a predetermined constant. The processor accesses a table having a plurality of position identifiers associated with positions on the feeder line, and a plurality of reactance component values corresponding to positions on the feeder line relative to the substation bus. The processor selects a first reactance component value from the plurality of reactance component values in the table to determine the position of a fault.Type: GrantFiled: March 31, 2008Date of Patent: June 29, 2010Assignee: Consolidated Edison Company of New York, Inc.Inventor: Christopher G Jones
-
Patent number: 7719286Abstract: A first voltage, which is dropped out onto a pull-down resistor that is coupled to a first power circuit breaker, is compared to an adjustable first reference voltage in order to determine a first comparative value. A second voltage, which is dropped out onto the pull-up resistor that is coupled to the second power circuit breaker, is compared to an adjustable second reference voltage in order to determine a second comparative value. Determination then occurs according to the first comparative value and second comparative value as to whether the first output pin of the first power circuit breaker and the second output switch of the second power circuit breaker are contacted to each other. The first output pin and second output pin are connected to one another by way of a node outside the power circuit breaker.Type: GrantFiled: November 25, 2005Date of Patent: May 18, 2010Assignee: Siemens AktiengesellschaftInventors: Bastian Arndt, Gunther Wolfarth
-
Publication number: 20100111521Abstract: A signal is conducted from a controller module onto a network via a first coupling. The signal is transmitted across the network and received at one or more receiver modules via one or more second couplings. At the one or more receiver modules, the received signal is analyzed and based upon the analysis, a determination is made as to whether a fault has occurred in the network and/or where the occurrence occurred.Type: ApplicationFiled: May 12, 2009Publication date: May 6, 2010Applicant: HOWARD UNIVERSITYInventor: Charles J. Kim
-
Patent number: 7710122Abstract: The “Ground Resistance Test” provides a circuit and test setup for measuring the resistance of earth grounds. The ground resistance test uses the central office battery from a working telephone pair to source current into the “Tested Ground”. First the quiescent voltage (Vo) on the Tested Ground with respect to a removable ground rod is measured and recorded. Then the ring side of a working pair is connected to the Tested Ground and the office battery draws current (I) from the Tested Ground. The voltage (Vi) on the Tested Ground with respect to the removable ground rod is again measured with dc current flowing. Voltage fall Vf is computed as (Vi?Vo). The ohms (R) of the Tested Ground is then displayed as R=Vf/I. In the event that central office battery is unavailable, the Ground Resistance Tester will provide an optional current rod and internal battery source.Type: GrantFiled: October 25, 2007Date of Patent: May 4, 2010Assignee: Greenlee Textron Inc.Inventor: Robert Crick
-
Patent number: 7706872Abstract: A method of measuring of an electrical bio-impedance, the method being characterized in that a symmetrical bipolar pulse-form periodical excitation signal (electrical current or voltage) is applied to the input (11) of the bio-object (1), a corresponding reaction of the bio-object to the mentioned excitation signal is measured from the output (12), which is connected to the input (201) of the synchronous detector (200). A symmetrical bipolar pulse-form periodical signal is also applied to the reference input (202) of the synchronous detector (200), whereby both pulse-form signals are shortened by the predetermined time interval in each half period of the signal, said time intervals being different for the excitation and reference signals. The proposed method ensures an increased accuracy of the impedance analysis by decreasing the influence of the higher harmonics in the spectra of the excitation and reference signals of the synchronous detectors to the measurement result.Type: GrantFiled: November 28, 2003Date of Patent: April 27, 2010Assignee: Tallinn Technical UniversityInventors: Mart Min, Andres Kink, Raul Land, Toomas Parve
-
Publication number: 20100097070Abstract: A method for evaluating the integrity of a cable shield utilizing wideband noise-to-ground measurements is provided. Upon determining that trouble with the cable shield exists, a method s is provided to isolate the location of the trouble with the cable shield. The method utilizes access locations along the cable and therefore does not require opening of the cable shield to isolate the trouble in the shield.Type: ApplicationFiled: October 22, 2009Publication date: April 22, 2010Inventor: ROBERT G. CRICK
-
Patent number: 7701231Abstract: An apparatus, system, and method are disclosed for detecting cracking in a particulate filter. The method may include providing an apparatus comprising an aftertreatment device with a substrate and a substrate surface, a conductive material forming a conduction path bonded to the surface of the substrate surface, and access points configured to allow a resistance measurement of the conduction path. The method may include measuring the resistance of the conduction path, and determining if one or more cracks have occurred on the substrate surface based on the resistance measurement. The method may further include labeling the degradation level of the aftertreatment device based on the indicated amount of cracking, and replacing the aftertreatment device with an equivalent aftertreatment device, based on the degradation level, after a service event.Type: GrantFiled: March 20, 2007Date of Patent: April 20, 2010Assignee: Cummins Filtration IP, IncInventors: Thomas M. Yonushonis, Randall J. Stafford, Edgar Lara-Curzio, Amit Shyam
-
Patent number: 7684949Abstract: In an embodiment, an integrated circuit or chip is supplied to its intended application and a measurement quantity representing the state of one or a plurality of electrical connections in the chip is determined within the application environment of the chip and, if the measurement quantity determined does not correspond to predefined criteria, a corresponding signal is output.Type: GrantFiled: August 23, 2007Date of Patent: March 23, 2010Assignee: Infineon Technologies AGInventor: Henrich Koerner
-
Publication number: 20100066384Abstract: Methods, systems, and articles of manufacture consistent with the present invention determine the type of damage to a wire, the amount of damage, and the location of the damage based on the wire's broadband impedance measured from a single measurement point. The type of damage is determined by comparing the wire's calculated dielectric function, resistance and inductance to known values that correspond to types of wire damage. The amount of damage is determined by comparing the wire's low-frequency impedance phase to known low-frequency impedance phase information that corresponds to a known amount of wire damage. The location of damage is determined by comparing the wire's high-frequency impedance phase to known high-frequency impedance phase information that corresponds to a known location of wire damage.Type: ApplicationFiled: September 12, 2008Publication date: March 18, 2010Applicant: THE BOEING COMPANYInventors: Daniel N. Rogovin, Martin W. Kendig
-
Patent number: 7659732Abstract: A four-wire ohmmeter connector includes a pair of elongated members spaced apart from each other by an interconnecting web. A pair of elongated contacts are mounted on forwardly projecting portions of each of the elongated members. An insulative housing surrounds the elongated members, contacts and web. The contacts mounted on one of the elongated members are connected through separate wires to a positive probe, and the contacts mounted on the other of the elongated members are connected through separate wires to a negative probe. The elongated members are inserted into respective terminal apertures of a four-wire ohmmeter. A pair of semi-cylindrical conductive sleeves are aligned with each of the apertures, and they make contact with and compress the respective contacts that are inserted into the aperture.Type: GrantFiled: June 15, 2007Date of Patent: February 9, 2010Assignee: Fluke CorporationInventor: Monte Washburn
-
Publication number: 20100013492Abstract: A storage battery inspecting system includes a power supply unit and an inspecting unit. The inspecting unit includes two inspecting terminals to be connected to a battery soldering spot so as to detect response of the soldering spot to application of a test power signal by the power supply unit, and a control module for determining if a detected response of the soldering spot falls within a predetermined range configured in the control module, generating an indication signal if the detected response falls outside the predetermined range, and generating an inspection result corresponding to the detected response. The inspecting unit further includes an indication interface for outputting the indication signal, a transmission interface permitting supply of the inspection result to a processing device, and a control interface permitting supply of a control signal generated by the control module to a peripheral device for controlling operation of the peripheral device based on the detected response.Type: ApplicationFiled: September 23, 2009Publication date: January 21, 2010Applicants: The Department of Electrical Engineering, National Chang-Hua University of EducationInventors: Kuen-Cheng WANG, Tsair-Rong CHEN, Jeen-Sheen ROW
-
Patent number: 7646202Abstract: A method for measuring a resistance and an inductance of a permanent magnet synchronous motor (PMSM) in a static state includes inputting a rated current of the PMSM and 150% of the rated current at a state of locking an axle of the PMSM, recording corresponding voltages V100% and V150%, and dividing the voltage difference with the current difference to obtain the resistance of the PMSM. The method continues dividing an electrical period into six voltage vectors, and performing four voltage cycles for every the voltage vector. The voltage cycle includes step of outputting a quarter of the voltage V150%, and outputting the voltage V150% after the current being stable. After one of the six voltage vectors being finished, the method switches to the other voltage vectors and repeats the voltage cycles, and the method is completed till all of the six voltage vectors being finished.Type: GrantFiled: December 17, 2007Date of Patent: January 12, 2010Assignee: Delta Electronics, Inc.Inventor: Ming-Tsung Chen
-
Patent number: 7639021Abstract: An improved circuit and method for detecting dielectric breakdown and ground fault conditions is provided. The circuitry and method of the present invention include taking a continuous voltage reading of the high voltage battery and sampling the continuous voltage reading of the high voltage battery at a fixed time interval. The circuitry and method calculate a change in the continuous voltage reading of the high voltage battery over the change in time and repeatedly calculate an optimum fixed time interval and an optimum change in voltage over time. Storage of the optimum fixed time interval and optimum change in voltage over time provides for repeatedly comparing the optimum change in voltage over the fixed time interval to the constant voltage of the high voltage battery to calculate the resistance of the dielectric breakdown fault. The calculation of the resistance of the dielectric breakdown fault is carried out independently of the capacitance of the electric circuit.Type: GrantFiled: May 11, 2007Date of Patent: December 29, 2009Assignee: Temic Automotive of North America, Inc.Inventors: Edward Li, Mark Gunderson, Wen Li
-
Patent number: 7629795Abstract: A vector impedance measurement system (100) includes a first radio frequency (RF) source (101) for providing energy to a test circuit. A measurement device (111) is used for providing a first network measurement based upon the voltage and current at the terminals of the test circuit. A second RF source (103) is used for down converting the first network measurement to a second network measurement that is lower in frequency. The vector impedance system (100) operates to calculate a complex impedance using both the magnitude and phase angle of the second network measurement as determined by a processor (133). In that the lower frequency at which signal processing is performed is a fixed frequency, many sensitive parameters of the band pass filters, such as gain and phase shift, can be easily calibrated and do not change during operation, resulting in a simpler calibration process and very accurate data measurements.Type: GrantFiled: July 30, 2007Date of Patent: December 8, 2009Inventor: Robert H. Clunn
-
Publication number: 20090294022Abstract: A composite material provided with a damage detection system, the composite material comprising a fibre-reinforced polymeric matrix, wherein the fibre reinforcement comprises electrically conductive fibres and the polymeric matrix comprises a thermosetting polymer and a thermoplastic polymer, and wherein detection means are provided detect a change in resistance of the composite material, said change in resistance indicating the presence of at least one damaged area of the composite material, said detection means comprising a plurality of spaced apart electrodes mounted on an electrically insulating substrate and electrically connected to the electrically conducting fibres.Type: ApplicationFiled: December 23, 2005Publication date: December 3, 2009Applicant: UNIVERSITY OF SHEFFIELDInventors: Simon Hayes, Frank Jones
-
Publication number: 20090284264Abstract: An inductance-based cable length-to-fault measurement device and method are described. The cable under test having a per-unit-length inductance is coupled to an inductance-sensitive oscillator, and the frequency of oscillations is evaluated using the following serially coupled modules: a comparator for digitizing the oscillator output, a pre-scaler for oscillation frequency down-conversion, and a microprocessor for counting pulses from the pre-scaler. To remove environmental and manufacturing tolerance dependencies, as well as a battery voltage dependence, the measured frequency of oscillations is compared to a frequency of oscillations of the oscillator having coupled thereto a reference inductor.Type: ApplicationFiled: May 13, 2009Publication date: November 19, 2009Applicant: Acterna LLCInventor: Anthony C. Ng
-
Patent number: 7592817Abstract: A system and method for correcting alignment of a product on a tool and, more particularly, to a system and method for correcting alignment of a wafer on a chuck of a tool. The system is a tool comprising at least one contact near a circumference of the tool and a grounded contact proximate to the at least one contact. The method comprises measuring current on each branch of a circuit and calculating an angle of a wafer based on a difference in the current on each branch of the circuit.Type: GrantFiled: July 17, 2007Date of Patent: September 22, 2009Assignee: International Business Machines CorporationInventors: Robert J. Foster, Lin Zhou, Shahin Zangooie, Roger M. Young, Clemente Bottini
-
Publication number: 20090212786Abstract: The present disclosure relates to an impedance-based arc detector for CT scanners and method of use and diagnosis therewith, and more specifically, to a two- or three-way conductive probe detector system and associated signal processing unit to distinguish the location of arc faults on a CT scanner at either the high-voltage cable of an x-ray tube, an anode connected to the x-ray tube, a cathode also connected to the x-ray tube, a high-voltage well, or a power distribution unit of the tube.Type: ApplicationFiled: February 20, 2009Publication date: August 27, 2009Inventor: William E. Brach
-
Patent number: 7560935Abstract: There is a ground-fault resistance measurement circuit which measures a ground-fault resistance between a conductive frame body of electrical equipment and a charge section insulated from the frame body. This ground-fault resistance measurement circuit includes: a capacitor which is connected between the charge section and the frame body; a switch which opens and closes a connection path between the charge section and the capacitor; a charging unit which charges the capacitor to a predetermined voltage; a voltage measurement section which measures a charging voltage of the capacitor; a discharge control section which connects the capacitor and the charge section after the capacitor is charged, and discharges the capacitor; and a calculation section which calculates a resistance between the charge section and the frame body, based on a change in the charging voltage of the capacitor.Type: GrantFiled: January 30, 2007Date of Patent: July 14, 2009Assignee: Panasonic CorporationInventor: Naohisa Morimoto
-
Patent number: 7550981Abstract: A circuit and method for determining the wiper resistance of a potentiometer that includes the step of electrically coupling a sense resistor having a substantially constant sense resistance to the potentiometer third terminal. The potentiometer is electrically energized, and a potentiometer voltage, which is a voltage potential between the potentiometer first and second terminals, is determined. The wiper position is determined based at least in part on the determined potentiometer voltage. The sense resistor is electrically coupled to a potential that causes a wiper current to flow through the wiper and sense resistor. A magnitude of the wiper current is determined, and the wiper resistance is determined based at least in part on the potentiometer resistance, the determined potentiometer position, the determined wiper current magnitude, and the sense resistance.Type: GrantFiled: August 10, 2006Date of Patent: June 23, 2009Assignee: Honeywell International Inc.Inventor: Mark F. Merry
-
Patent number: 7536663Abstract: In one embodiment, a plurality of signals are sequentially driven onto a signal path. Each of the signals has a pulsewidth defined by a trigger edge and a sensor edge, and at least some of the signals having different pulsewidths. After driving each signal, the signal is sampled at or about a timing of the signal's sensor edge to thereby characterize the signal's sensor edge. The sensor edge characterizations corresponding to the different signals are then analyzed to quantify a timing error induced by an impedance variation of the signal path.Type: GrantFiled: February 25, 2005Date of Patent: May 19, 2009Assignee: Verigy (Singapore) Pte. Ltd.Inventor: Hiroshi Matsumiya
-
Patent number: 7495450Abstract: A device and method provides for measuring the electrical properties of electronic signal paths, including wires and wireless channels. The device can be used for detecting open circuits, short circuits, and the lengths of wires. The device can include a sensor configured to measure a bulk electrical inductance of said wire to produce a measurement result and a processor configured to extract a length of the wire from the measurement result of the sensor.Type: GrantFiled: May 18, 2005Date of Patent: February 24, 2009Assignee: University of Utah Research FoundationInventors: Cynthia Furse, John Mahoney, You Chung Chung, Nirmal Nath Amarnath
-
Publication number: 20090039895Abstract: A method of detecting faulty via holes of a printed circuit board. The printed circuit board including a number of electric trace segments.Type: ApplicationFiled: June 20, 2008Publication date: February 12, 2009Applicants: FuKui Precision Component (Shenzhen) Co., Ltd., FOXCONN ADVANCED TECHNOLOGY INC.Inventors: Li Xiao, I-Hsien Chiang, Chih-Yi Tu
-
Patent number: 7472026Abstract: A system and method for locating faults on multi-terminal power system transmission lines uses synchronized phasor measurements to accurately determine fault location and fault impedance regardless of fault type, fault resistance, and coupling to other adjacent power system transmission lines.Type: GrantFiled: December 22, 2006Date of Patent: December 30, 2008Assignee: General Electric CompanyInventors: William J. Premerlani, Bogdan Z. Kasztenny, Mark G. Adamiak
-
Patent number: 7459914Abstract: Systems and methods are disclosed for detecting balanced electrical leakage between a power source and a machine frame. In one embodiment, a balanced fault detection system for a machine includes a power source that is electrically insulated from a machine frame and a leakage detection switch that is connected to a ground. The balanced fault detection system also includes a leakage detection resistor that is interposed between a power source terminal and the switch having a leakage detection resistance. The balanced fault detection system further includes a voltage measuring device that measures voltages of the power source at positive and negative voltage sides of the ground and a leakage calculator that calculates a leakage resistance of the machine based on the measured voltages at the positive and negative voltage sides and the leakage detection resistance.Type: GrantFiled: October 31, 2006Date of Patent: December 2, 2008Assignee: Caterpillar Inc.Inventors: Robert Wayne Lindsey, Jennifer Leah Lindsey
-
Publication number: 20080288190Abstract: In a particular embodiment, a method is disclosed that includes receiving data related to a customer premise equipment (CPE) device and determining an impedance mismatch between a transmission line and the CPE device based on the received data. The method further includes initiating removal of a source of the impedance mismatch in response to determining the impedance mismatch.Type: ApplicationFiled: May 15, 2007Publication date: November 20, 2008Applicant: AT&T Knowledge Ventures, LPInventors: Jin Wang, Kapil Shrikhande, Richard D. Hart, Raghvendra Savoor
-
Publication number: 20080278174Abstract: An improved circuit and method for detecting dielectric breakdown and ground fault conditions is provided. The circuitry and method of the present invention include taking a continuous voltage reading of the high voltage battery and sampling the continuous voltage reading of the high voltage battery at a fixed time interval. The circuitry and method calculate a change in the continuous voltage reading of the high voltage battery over the change in time and repeatedly calculate an optimum fixed time interval and an optimum change in voltage over time. Storage of the optimum fixed time interval and optimum change in voltage over time provides for repeatedly comparing the optimum change in voltage over the fixed time interval to the constant voltage of the high voltage battery to calculate the resistance of the dielectric breakdown fault. The calculation of the resistance of the dielectric breakdown fault is carried out independently of the capacitance of the electric circuit.Type: ApplicationFiled: May 11, 2007Publication date: November 13, 2008Inventors: Edward Li, Mark Gunderson, Wen Li
-
Patent number: 7443308Abstract: A method for reducing the occurrence of false ground fault detections in a central office terminal is provided. The method includes generating a no-fault signal when no ground current is detected, delaying generation of a fault signal when ground current is detected at least for the duration of an expected pulse in AC induced signal, and when the ground current persists for a sufficient period, generating a signal indicating a fault condition.Type: GrantFiled: March 16, 2006Date of Patent: October 28, 2008Assignee: ADC DLS Systems, Inc.Inventors: William J. Fox, Michael Carter
-
Publication number: 20080255781Abstract: A method of performing transducer self-diagnostics and self-healing on an array of sensor transducers bonded to a structure for health monitoring includes measuring impedance to detect whether a transducer is missing, or a connection is damaged. Pitch-catch signals generated between one or more pairs of transducers are analyzed for detecting defects according to selected criteria of defect size and location to determine whether the sensors are damaged or partially/fully disbanded. Based on the resulting map of operational transducers, signal transmission paths are added/extended between additional pairs of transducers to maintain inspection coverage of the structure according to the selected criteria.Type: ApplicationFiled: February 28, 2008Publication date: October 16, 2008Inventors: Shawn J. Beard, Chang Zhang, Xinlin Qing