Instruments And Devices For Fault Testing Patents (Class 324/555)
  • Patent number: 10404416
    Abstract: A method of operating a transmission system (1) having a first network (2) and at least one second network (3), data being exchanged between these at least two networks (2, 3) in that data of the first network (2) is fed to duplication means (4), the inputted data being transmitted wirelessly to separator means (5) via at least two transmission paths (6, 7) using PRP and forwarded from the separator means (5) to the connected second network (3), characterized in that the data is transmitted in the form of data packets, and it is ascertained whether or not a data packet was transmitted, and it is determined based thereon whether or not the transmission system (1) is operating in a fault-free manner.
    Type: Grant
    Filed: April 9, 2015
    Date of Patent: September 3, 2019
    Assignee: HIRSCHMANN AUTOMATION AND CONTROL GMBH
    Inventor: Tobias Heer
  • Patent number: 10340911
    Abstract: A method for programming a two-wire sensor having at least two sensor units. The method comprises the following steps of: switching on the at least two sensor units, activating one of the at least two sensor units, capturing operating states of the at least two sensor units; detecting an operating state in which one individual sensor unit is active; and sending a programming command to the detected active sensor unit.
    Type: Grant
    Filed: August 21, 2018
    Date of Patent: July 2, 2019
    Assignee: TDK - Micronas GmbH
    Inventors: Hans-Jörg Fink, Tomas Kauter
  • Patent number: 10234495
    Abstract: The present invention discloses a decision tree SVM fault diagnosis method of a photovoltaic diode-clamped three-level inverter in view of fault diagnosis problems of the photovoltaic three-level inverter in a photovoltaic microgrid. Taking an inverting state for example, firstly, analyzing running conditions of an inverter main circuit and performing fault classification, then taking the middle, upper and lower bridge leg voltages as measurement signals, extracting feature signals with a wavelet multiscale decomposition method, and thereby generating a decision tree SVM fault classification model with a particle swarm clustering algorithm, to finally achieve multi-mode fault diagnosis of the photovoltaic diode-clamped three-level inverter. Advantages of the present invention are that, this algorithm can obviously distinguish various fault states of the photovoltaic diode-clamped three-level inverter, complete the failure diagnostic task with fewer classification models And the diagnosis precision is high.
    Type: Grant
    Filed: December 30, 2016
    Date of Patent: March 19, 2019
    Assignee: JIANGNAN UNIVERSITY
    Inventors: Hongfeng Tao, Chaochao Zhou, Yan Liu, Yajun Tong
  • Patent number: 10104560
    Abstract: A machine for testing the parts and functions of a mobile phone includes a supporting mechanism, a platform, a receiving portion, and a detecting mechanism. The supporting mechanism is mounted in a box. The platform is slidably mounted on the supporting mechanism. The receiving portion is used to receive the mobile phone. The receiving portion is rotatably mounted on the platform. Devices within the machine are operated to test the mobile phone. A mobile phone testing system used in the testing machine is also described.
    Type: Grant
    Filed: March 16, 2016
    Date of Patent: October 16, 2018
    Assignees: HONGFUJIN PRECISION ELECTRONICS (ZHENGZHOU) CO., LTD., HON HAI PRECISION INDUSTRY CO., LTD.
    Inventors: Yu-Ching Liu, Wei-Da Yang, Po-Lin Su, Jie-Peng Kang, Xue-Rui Deng, Liu-Ming Zhang, Rui Li, Su-Min Li, Yong-Qiang Han, Guang-Xing Wang
  • Patent number: 9658287
    Abstract: A handler apparatus adjusts a position of an actuator and enhances positional accuracy of a device under test. Provided is a handler apparatus that conveys a device under test to a test socket, including: an actuator that, prior to fitting of a device holder holding the device under test to the test socket, fits the device holder, and adjusts a position of the device under test on the device holder; and an actuator adjusting section that adjusts an amount of driving of the actuator by causing the actuator to fit an actuator fitting unit.
    Type: Grant
    Filed: August 29, 2014
    Date of Patent: May 23, 2017
    Assignee: ADVANTEST CORPORATION
    Inventors: Tsuyoshi Yamashita, Mitsunori Aizawa, Hiromitsu Horino, Yuya Yamada, Masataka Onozawa
  • Patent number: 9553622
    Abstract: According to an embodiment, a reception circuit is configured to receive a reception signal from a transmission circuit through a receiving AC coupling element. The transmission circuit transmits a transmission signal through a transmitting AC coupling element. The receiving AC coupling element is AC coupled to the transmitting AC coupling element. The reception circuit includes a variable gain amplifier, a hysteresis circuit and a first control circuit. The variable gain amplifier is configured to amplify the reception signal with a variable gain to output an amplified signal. The hysteresis circuit has hysteresis in an input/output characteristic, and is configured to output an output signal according to the amplified signal. The first control circuit is configured to control the gain so that an amplitude of the amplified signal approximates a reference amplitude.
    Type: Grant
    Filed: September 4, 2015
    Date of Patent: January 24, 2017
    Assignee: Kabushiki Kaisha Toshiba
    Inventor: Shinsuke Fujii
  • Patent number: 9459302
    Abstract: Disclosed is a device under test (DUT) tester using a redriver. The DUT tester more effectively tests the DUT, which is a predetermined semiconductor device, by applying an electrical signal to the DUT and measuring the electrical signal. The DUT tester includes a DUT test unit, a printed circuit board (PCB) provided therein with connectors for the connection with the DUT test unit, one DUT or more horizontally arranged on the PCB, and redrivers horizontally provided under the PCB and one-to-one matched with one DUT or more to compensate for the distortion of the signal integrity of test signals caused according to the variation of the transmission distance.
    Type: Grant
    Filed: June 19, 2013
    Date of Patent: October 4, 2016
    Assignee: UNITEST INC
    Inventor: Jin An Oh
  • Patent number: 9442163
    Abstract: Methods and systems for compensating for temperature variation in the performance of electronic circuits and systems are disclosed. In some embodiments, the systems are configured to store compensation parameters determined in calibration, where the compensation parameters are used by the systems to modify performance. In some embodiments, the systems are part of an automatic test equipment (ATE) system.
    Type: Grant
    Filed: August 6, 2013
    Date of Patent: September 13, 2016
    Assignee: Analog Test Engines
    Inventor: Jeffrey Allen King
  • Patent number: 9423461
    Abstract: Methods and systems for compensating for temperature variation in the performance of electronic circuits and systems are disclosed. In some embodiments, the systems are configured to store compensation parameters determined in calibration, where the compensation parameters are used by the systems to modify performance. In some embodiments, the systems are part of an automatic test equipment (ATE) system.
    Type: Grant
    Filed: August 6, 2013
    Date of Patent: August 23, 2016
    Assignee: Analog Test Engines
    Inventor: Jeffrey Allen King
  • Patent number: 9418251
    Abstract: A mesh grid protection system is provided. The system includes assertion logic configured to transmit a first set of signals on a first set of grid lines and a second set of grid lines. The system also includes transformation logic to transform the first set of signals to generate a second set of signals, to transmit the second set of signals on a third set of grid lines that are coupled to the first set of grid lines, and to transmit the second set of signals on a fourth set of grid lines that are coupled to the second set of grid lines. In addition, the system includes verification logic to compare the second set of signals on the third and fourth set of grid lines to an expected set of signals.
    Type: Grant
    Filed: September 29, 2015
    Date of Patent: August 16, 2016
    Assignee: Broadcom Corporation
    Inventors: Kambiz Rahimi, Mark Buer, Rolando Ogot
  • Publication number: 20150145525
    Abstract: Disclosed is an overcurrent simulation method when a nail penetrates a secondary battery and a recording medium storing the program. The overcurrent simulation method according to the present disclosure constructs a safety device and a secondary battery equivalent circuit, and produces a nail penetration effect by changing a resistance value. In this instance, various current simulations may be obtained by changing a first metal sheet and a second metal sheet included in the safety device, and a resistance value limiting an overcurrent may be calculated.
    Type: Application
    Filed: October 28, 2014
    Publication date: May 28, 2015
    Applicant: LG CHEM, LTD.
    Inventors: Se-Wook SEO, Dal-Mo KANG, Seung-Hun JUNG
  • Patent number: 9033620
    Abstract: A geomembrane liner for a containment system including liner panels and connected by a seam at overlapped edges, with the top panel having a conductive lower surface which is non-conductive across the seam. Heat welding of the seams is accomplished by a welder having a heating unit with a projection which interrupts the conductive lower surface of the top panel before forming the seam. Such seams may be used separately or selectively with a lined containment system having a plurality of liner panels covering at least a portion of the containment system bottom. The liner panels have a conductive lower surface and overlap with adjacent panels, and conductive members underlie adjacent panels and contact the conductive lower surface of both adjacent panels to provide an electrical connection between the conductive lower surfaces of the adjacent panels.
    Type: Grant
    Filed: February 11, 2013
    Date of Patent: May 19, 2015
    Assignee: GSE Environmental, LLC
    Inventors: Jimmie Gordon Youngblood, Jr., David James Gallagher, Edward Joseph Zimmel
  • Patent number: 9030206
    Abstract: In a process plant, a first series of measurements from a coupling interface are received. The first series of measurements are stored. A second series of measurements from a coupling interface are received. The second series of measurements. The first series and second series of measurements are compared. An indication of loss of clamping force is generated if the first series of measurements deviates from the second series of measurements.
    Type: Grant
    Filed: April 19, 2012
    Date of Patent: May 12, 2015
    Assignee: Fisher Controls International LLC
    Inventor: Shawn W. Anderson
  • Patent number: 9030210
    Abstract: The invention is related to an insulation deterioration diagnostic apparatus for an electric path connected between an inverter device and an inverter-driven load device, including: a zero-phase current transformer having an annular magnetic core, a magnetizing coil wound around the magnetic core, and a detecting coil wound around the magnetic core, the transformer being for detecting a zero-phase current of an electric path; a magnetization control circuit for supplying an alternating current having a frequency at least twice as high as a drive frequency of the load device to the magnetizing coil to magnetize the magnetic core; and a frequency extracting circuit for extracting a frequency component identical to the drive frequency fd, from the output signal of the detecting coil, whereby precisely measuring a current leaking from an inverter-driven load device over a wide range of frequencies.
    Type: Grant
    Filed: April 4, 2011
    Date of Patent: May 12, 2015
    Assignee: Mitsubishi Electric Corporation
    Inventors: Yoshimasa Watanabe, Yoshiharu Kaneda, Hiroshi Nishizawa, Toru Oka
  • Patent number: 8970220
    Abstract: A combination lighting tester tool. The combination lighting tester tool includes at least three independent testing tools for identifying and diagnosing a problem in a lighting system. For example, the tester includes a lamp testing function in which a high voltage test signal is generated and transmitted using an antenna. When the test signal is in proximity to a gas filled lamp, the voltage is of sufficient magnitude to ionize the gas inside the lamp, causing the lamp to illuminate. The tester also includes a ballast testing function in which the power lines or wires connecting a ballast to a lamp or lighting fixture are tested, and a filament tester for testing the filaments in a lamp for continuity or resistance. The tester also includes a worklight for illuminating an area under test and one or more display devices (e.g., LEDs, an LCD display, or the like) which provide an indication of, for example, a test being performed or a result of a test.
    Type: Grant
    Filed: July 8, 2011
    Date of Patent: March 3, 2015
    Assignee: Milwaukee Electric Tool Corporation
    Inventors: Jonathan P. Morrow, Evans H. Nguyen, Hu Zenghong, Lin Jianqin
  • Publication number: 20150048862
    Abstract: A method and apparatus for detecting substrate arcing and breakage within a processing chamber is provided. A controller monitors chamber data, e.g., parameters such as RF signals, voltages, and other electrical parameters, during operation of the processing chamber, and analyzes the chamber data for abnormal spikes and trends. Using such data mining and analysis, the controller can detect broken substrates without relying on glass presence sensors on robots, but rather based on the chamber data.
    Type: Application
    Filed: August 13, 2014
    Publication date: February 19, 2015
    Inventors: Shuo NA, Kelby YANCY, Chunsheng CHEN, Ilias ILIOPOULOS
  • Patent number: 8947096
    Abstract: A new portable, self-contained device for testing the full cycle of trailer light modes without additional manual actuation by the user and for identifying where and what type of specific error occurred, if any are detected. The inventive device generally comprises a compact portable housing with a fixedly attached handle and a removable housing top. Within the compact portable housing is a self-contained, rechargeable 12 volt power source to power all functionality over a sustained period of time. Also within the compact portable housing is a light mode control means that allows the device to cycle through multiple light modes for testing, and an error detection analysis means that indicates where and what type of fault is detected.
    Type: Grant
    Filed: April 12, 2010
    Date of Patent: February 3, 2015
    Inventor: Paul Wolf
  • Patent number: 8933721
    Abstract: An embodiment method of diagnosing a power source arrangement includes a plurality of n power sources connected in series between output terminals, wherein n?2. At least two different groups of power sources are selected from the power source arrangement. A voltage of each of the at least two different groups is measured between the output terminals. During the measurement of the voltage of one group, the power sources of the power source arrangement that do not belong to the one group are bypassed. The at least two measured voltages obtained through measuring the voltage of each of the at least two different groups or at least two voltages that are dependent on these at least two measured voltages are compared.
    Type: Grant
    Filed: October 27, 2011
    Date of Patent: January 13, 2015
    Assignee: Infineon Technologies Austria AG
    Inventor: Gerald Deboy
  • Patent number: 8933722
    Abstract: A measuring device is provided, the measuring device including: a power supply to provide electric power to a chip via at least one of a chip connection and a chip-carrier connection; a chip arrangement receiving portion configured to receive a chip arrangement, the chip arrangement including a chip and a plurality of chip-to-chip-carrier connections; a detection portion including: a plate; a detection circuit coupled to the plate and configured to detect an electrical signal from the plate; wherein the plate is configured such that it covers at least part of the chip arrangement; and wherein at least one chip-carrier connection is in electrical connection with the plate.
    Type: Grant
    Filed: August 31, 2011
    Date of Patent: January 13, 2015
    Assignee: Infineon Technologies AG
    Inventor: Ming Xue
  • Patent number: 8933703
    Abstract: A module is used for interfacing between a particular device to be tested (DUT) and a test station having a universal set of connections. The module is adapted for bridging both the physical and electrical differences between connection points available on the DUT and the universal test connections. The module contains information (personality data) unique to the particular DUT and is designed to mount in a tray in which the DUT is positioned. The personality module resides partially within an environmentally controlled area and an area outside of the environmentally controlled area and is adapted to seal the environmentally controlled area so as to maintain testing integrity therein. In one embodiment, the connections between the module and the test station occur outside of the environmentally controlled area.
    Type: Grant
    Filed: September 28, 2007
    Date of Patent: January 13, 2015
    Assignee: Keysight Technologies, Inc.
    Inventors: David Henderson, Sean P. Cortright, Calvin Krug, Ryan Kelley
  • Patent number: 8922224
    Abstract: An electronic system having a high speed signaling bus requiring training (calibration) of a calibrated item in a driver circuitry or a receiver circuitry for reliable operation. At manufacturing or in a secure location, secure calibration coefficients are determined for the electronic system and are stored in a non-volatile storage. During operation, the high speed signaling bus may be re-calibrated, resulting in a new currently active calibration coefficient for the calibrated item. A coefficient watchdog checks a new coefficient value selected by the re-calibration at present environmental conditions such as voltage and temperature against the secure calibration coefficients. If the new calibration coefficient value is the same as a calibration coefficient value in an acceptably close secure calibration coefficient, the new calibration coefficient is accepted; if not, a potentially probed warning is created by the coefficient watchdog.
    Type: Grant
    Filed: August 7, 2012
    Date of Patent: December 30, 2014
    Assignee: Lenovo Enterprise Solutions (Singapore) Pte. Ltd.
    Inventors: Ronald L. Billau, Roger J. Gravrok, Brian G. Holthaus, Darryl Solie
  • Patent number: 8912802
    Abstract: In a component-embedded circuit substrate having a plurality of capacitors embedded therein, the capacitors are connected in parallel, inspection electrodes are formed, and the inspection electrodes connect to respective terminal electrodes of the capacitor through via conductors. At the terminal electrodes of the capacitor, the connection position of the via conductors for connecting the inspection electrodes differs from the connection position of via conductors for connecting respective terminal electrodes of the capacitor.
    Type: Grant
    Filed: March 17, 2014
    Date of Patent: December 16, 2014
    Assignee: Taiyo Yuden Co., Ltd.
    Inventors: Shigeo Sakurai, Tetsuo Saji
  • Patent number: 8912803
    Abstract: A DC high potential testing meter comprises first and second probes. The first probe comprises an insulated shield supporting an electrode extending from a distal end of the shield. A high voltage resistor and a high voltage diode in the shield are connected in series with the electrode. A capacitance formed by a metallic collar across the high voltage diode provides uniform voltage distribution along the high voltage diode. The second probe comprises an insulated shield supporting an electrode. A high voltage resistor in the shield is connected in series with the electrode. A meter comprises a housing enclosing an electrical circuit for measuring voltage across the electrodes and provides an output representing measured voltage.
    Type: Grant
    Filed: September 19, 2011
    Date of Patent: December 16, 2014
    Assignee: Honeywell International, Inc.
    Inventor: Vasu Mogaveera
  • Publication number: 20140361790
    Abstract: Provided is a test apparatus, a switch apparatus, and a drive circuit comprising a current source having one end thereof connected to a reference potential; a first switch connected between the current source and a first voltage source that outputs a first power supply voltage; a first output terminal that outputs a voltage between the first switch and the first voltage source; a power supply section that outputs a second power supply voltage when the first switch is ON and outputs a third power supply voltage, which is lower than the second power supply voltage, when the first switch is OFF; a second switch connected between the power supply section and the current source; and a second output terminal that outputs a voltage between the second switch and the power supply section.
    Type: Application
    Filed: June 11, 2013
    Publication date: December 11, 2014
    Applicant: ADVANTEST CORPORATION
    Inventors: Makoto NAKANISHI, Yoshiyuki HATA, Masahiko TAKIKAWA
  • Patent number: 8907679
    Abstract: A meter apparatus having three-phase judgment function includes a control unit, a multimeter measurement unit electrically connected to the control unit, a three-phase judgment unit electrically connected to the control unit, a first measurement jack electrically connected to the multimeter measurement unit and the three-phase judgment unit, a second measurement jack electrically connected to the multimeter measurement unit and the three-phase judgment unit, and a third measurement jack electrically connected to the multimeter measurement unit and the three-phase judgment unit.
    Type: Grant
    Filed: June 1, 2012
    Date of Patent: December 9, 2014
    Assignee: Brymen Technology Corporation
    Inventor: Po-Chao Tan
  • Patent number: 8896323
    Abstract: Systems and methods for radiation-tolerant overcurrent detection are disclosed. In some embodiments, an integrated circuit may include a plurality of overcurrent detectors, each of the plurality of overcurrent detectors configured to detect a candidate overcurrent event. The integrated circuit may also include a voting circuit coupled to the overcurrent detectors, the voting circuit configured to indicate an overcurrent in response to receiving a selected number of candidate overcurrent events from the overcurrent detectors. At least one of the overcurrent detectors may be subject to detecting the candidate overcurrent in error, at least in part, due to exposure to ionizing radiation.
    Type: Grant
    Filed: October 21, 2011
    Date of Patent: November 25, 2014
    Assignee: Texas Instruments Incorporated
    Inventors: Charles Parkhurst, Mark Hamlyn
  • Patent number: 8896316
    Abstract: In a device having capacitive loads in which a plurality of capacitive loads are connected in parallel, power is supplied from an AC power source to a load group comprising the plurality of capacitive loads, the load group is divided into a plurality of small load groups, and a current detecting sensor for detecting a current which flows in at least one small load group at a side which is closer to the load side than a branch point at which the load group is divided into the plurality of small load groups and a current abnormality detecting part for determining an abnormality of a load by a current detecting signal which is detected by the current detecting sensor are equipped.
    Type: Grant
    Filed: June 17, 2010
    Date of Patent: November 25, 2014
    Assignee: Mitsubshi Electric Corporation
    Inventors: Kazutoshi Kurahashi, Takashi Kumagai, Taichiro Tamida, Hajime Nakatani, Daisuke Takauchi
  • Patent number: 8896322
    Abstract: A method for dispensing and detecting solid pharmaceutical articles includes: forcing an article through a dispensing channel and past a sensor configured and positioned to detect the article passing through the dispensing channel, wherein the article includes one of the solid pharmaceutical articles; generating a detection signal using the sensor responsive to the article passing through the dispensing channel, wherein the detection signal indicates a time that the article takes to traverse the sensor; and determining whether the article is a complete article or an article fragment responsive to a comparison of the time indicated by the detection signal and an article fragment travel time representing an expected travel time for a complete article to traverse the sensor that is determined independent of physical attributes of the solid pharmaceutical articles.
    Type: Grant
    Filed: September 23, 2011
    Date of Patent: November 25, 2014
    Assignee: Parata Systems, LLC
    Inventor: James Robert Rivenbark, Jr.
  • Patent number: 8890540
    Abstract: A partial discharge test power supply system for an extra high voltage transformer comprises: an electric motor (1); an intermediate frequency generator (2) driven by the electric motor and outputting an intermediate frequency voltage; a middle transformer (9) receiving the intermediate frequency voltage and outputting a test voltage to be applied to a test sample (11) by a generator outlet (5); a low-voltage compensating reactor (8) connected between the intermediate frequency generator and the middle transformer; a high-voltage compensating reactor (10) connected between the middle transformer and the sample; wherein the electric motor and the intermediate frequency generator are arranged in a metal housing (100).
    Type: Grant
    Filed: November 12, 2010
    Date of Patent: November 18, 2014
    Assignee: China Electric Power Research Institute
    Inventors: Guangfan Li, Jie Yang, Jinzhong Li, Xiaocen Hu, Shuqi Zhang, Yuewen Qi, Xiaoning Wang, Ninghua Wang
  • Patent number: 8884629
    Abstract: A digital sensing device includes a sensor diagnostic system for detecting sensor fault conditions. The sensor diagnostic system including an input multiplexer applying a first burnout current or a second burnout current to a selected input channel and a near-rail detector configured to detect when an input voltage of the digital sensing device is near a positive power supply or near a negative power supply. The burnout current injection is applied without interfering with the sensor data. In other embodiments, the sensor diagnostic system may further include an overload detector configured to detect an overflow or underflow condition at the analog-to-digital converter. The sensor diagnostic system may further include a window comparator to detect when the ADC digital output is near a zero digital value. Finally, the sensor diagnostic system may further include a sensor flag generator to generate data flags indicative of sensor fault conditions.
    Type: Grant
    Filed: May 9, 2011
    Date of Patent: November 11, 2014
    Assignee: National Semiconductor Corporation
    Inventors: D V J Ravi Kumar, Theertham Srinivas, Gururaj Ghorpade
  • Patent number: 8878546
    Abstract: An apparatus for quickly determining a fault in an electric power system includes a current transformer, a current determination unit and a fault determination unit. The current transformer detects current supplied to the electric power system and outputs a current detection voltage. The current determination unit respectively compares the current detection voltage, the first-order differential voltage of the current detection voltage and the second-order differential voltage of the current detection voltage with predetermined first, second and third reference voltages. The fault determination unit determines whether a fault occurs based on the compared result of the current determination unit and generates a trip signal when it is determined that the fault has occurred.
    Type: Grant
    Filed: August 25, 2011
    Date of Patent: November 4, 2014
    Assignee: LSIS Co., Ltd.
    Inventors: Young Woo Jeong, Hyun Wook Lee
  • Patent number: 8872524
    Abstract: A package of a switching apparatus that houses an actuator having a movable contact point and in which a fixed contact point, which is electrically connected to or disconnected form the movable contact point, is accurately formed. Provided is a switching apparatus comprising a first substrate provided with a via that electrically connects a top surface thereof and a bottom surface thereof, while maintaining an air-tight state between the top surface and the bottom surface; a second substrate provided on the first substrate and in which is formed a through-hole that houses an actuator; and a third substrate provided on the second substrate and supporting the actuator, which has a moveable contact point.
    Type: Grant
    Filed: October 23, 2011
    Date of Patent: October 28, 2014
    Assignee: Advantest Corporation
    Inventors: Hisao Hori, Yoshikazu Abe, Yoshihiro Sato
  • Patent number: 8872521
    Abstract: An electrical parameter detection device is configured for detecting electrical parameters of a peripheral component interconnect (PCI) connector including a plurality of power pins. The electrical parameter detection device includes a processor module, a first detection module, and a second detection module. The processor module continuously detects voltage values of electric potentials provided by each of the power pins of the PCI connector using the first detection module, and determines time sequences of the electric potentials according to the voltage values of the electric potentials. Furthermore, the processor module detects the amount of power provided by each of the power pins of the PCI connector using the second detection module.
    Type: Grant
    Filed: March 20, 2012
    Date of Patent: October 28, 2014
    Assignees: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Hon Hai Precision Industry Co., Ltd.
    Inventors: Ya-Jun Pan, Qi-Yan Luo, Peng Chen, Song-Lin Tong
  • Publication number: 20140253146
    Abstract: Disclosed herein are various embodiments of electrical test switches. According to one embodiment, a test switch may include a switch lever, a test port configured to directly couple to a standard connector, a relay port, a field port, and an insulated frame configured to electrically insulate at least some electrically conductive portions of the test port, the relay connector, and the field connector from contact by a user. A user may actuate the switch lever in order to reconfigure the electrical test switch from a first configuration to a second configuration. In the first configuration, the test port contact is electrically isolated from the relay connector and the field connector is electrically connected to the relay connector. In the second configuration, the test port contact is electrically connected to the relay connector and the relay connector is electrically isolated from the field connector.
    Type: Application
    Filed: March 7, 2013
    Publication date: September 11, 2014
    Applicant: SCHWEITZER ENGINEERING LABORATORIES, INC.
    Inventor: James R. Kesler
  • Patent number: 8829920
    Abstract: Disclosed are a circuit and method for amplifying the power of a multi-tone input signal. The multi-tone input signal is filtered separating out one signal having a tone at a fundamental frequency from another signal having additional tones at additional frequencies. The signal having the tone at the fundamental frequency is amplified and then filtered removing any harmonics added during amplification. The signals are then recombined generating a multi-tone output signal, wherein the tone at the fundamental frequency is boosted (i.e., has a higher power in the multi-tone output signal than in the multi-tone input signal), but the additional tones at the additional frequencies are not (i.e., the additional tones at the additional frequencies have essentially the same power in the multi-tone output and input signals). Also disclosed herein are embodiments of a testing system and method incorporating the above-described circuit to allow for testing of high power devices.
    Type: Grant
    Filed: May 31, 2012
    Date of Patent: September 9, 2014
    Assignee: International Business Machines Corporation
    Inventor: Randy L. Wolf
  • Patent number: 8810255
    Abstract: An in-situ system for detecting damage in an electrically conductive wire. The system includes a substrate at least partially covered by a layer of electrically conductive material forming a continuous or non-continuous electrically conductive layer connected to an electrical signal generator adapted to delivering electrical signals to the electrically conductive layer. Data is received and processed to identify damage to the substrate or electrically conductive layer. The electrically conductive material may include metalized carbon fibers, a thin metal coating, a conductive polymer, carbon nanotubes, metal nanoparticles or a combination thereof.
    Type: Grant
    Filed: July 26, 2010
    Date of Patent: August 19, 2014
    Assignee: The United States of America as Represented by the Administrator of the National Aeronautics and Space Administration
    Inventors: Martha K. Williams, Luke B. Roberson, Lanetra C. Tate, Trent M. Smith, Tracy L. Gibson, Scott T. Jolley, Pedro J. Medelius
  • Patent number: 8803543
    Abstract: A device is configured to evaluate electromagnetic characteristics of an integrated circuit. The device includes a fluid chamber, a first impeller, a second impeller, and a radio frequency measurement antenna. The fluid chamber is configured to receive the integrated circuit and to cool the integrated circuit. The first impeller is disposed within the fluid chamber and configured to distribute a first electromagnetic field produced by the integrated circuit within the fluid chamber along a first axis. The second impeller is within the fluid chamber and configured to distribute the first electromagnetic field produced by the integrated circuit within the fluid chamber along a second axis. The radio frequency measurement antenna is disposed proximate the fluid chamber and configured to measure an electric field and a magnetic field of the first electromagnetic field.
    Type: Grant
    Filed: November 21, 2011
    Date of Patent: August 12, 2014
    Assignee: Dell Products, LP
    Inventors: Todd W. Steigerwald, Jeffrey C. Hailey
  • Patent number: 8797046
    Abstract: A method of sharing a test resource at a plurality of test sites executes respective test flows at the plurality of test sites with an offset in time, the respective test flows accessing the test resource at a predetermined position in the test flow.
    Type: Grant
    Filed: September 18, 2008
    Date of Patent: August 5, 2014
    Assignee: Advantest (Singapore) Pte Ltd
    Inventors: Jochen Rivoir, Markus Rottacker
  • Patent number: 8791714
    Abstract: Fault detection apparatuses and methods for detecting a processing or hardware performance fault of a semiconductor production tool have been provided. In an exemplary embodiment, a method for detecting a fault of a semiconductor production tool includes sensing a signal associated with a test component of the production tool during operation of the production tool and converting the signal to an electronic test signal. A prerecorded signature signal corresponding to the test component is provided and the test signal and the prerecorded signature signal are compared.
    Type: Grant
    Filed: January 23, 2012
    Date of Patent: July 29, 2014
    Assignee: Novellus Systems, Inc.
    Inventor: Keith John Hansen
  • Patent number: 8773144
    Abstract: To detect whether energy accumulated in an inductive load section has been discharged. Provided is a test apparatus that tests a device under test, comprising a power supply section that generates a power supply voltage to be supplied to the device under test; an inductive load section that is provided in a path between the power supply section and the device under test; a housing section that houses a substrate that includes at least the inductive load section; and a lock maintaining section that keeps an opening/closing section, which allows an operator to access the substrate within the housing section, in a locked state when a voltage at a predetermined position on the substrate is greater than a set voltage.
    Type: Grant
    Filed: October 6, 2011
    Date of Patent: July 8, 2014
    Assignee: Advantest Corporation
    Inventor: Kenji Hashimoto
  • Patent number: 8770437
    Abstract: An apparatus for dispensing solid articles includes a housing and at least one vacuum source. The housing defines a hopper chamber to hold the articles and a dispensing channel fluidly connected to the hopper chamber. The dispensing channel has an inlet and an outlet defining a dispensing flow path therebetween. The vacuum source is adapted to provide a vacuum pressure and induce a gas flow in the housing. The apparatus is configured to generate a forward drive gas flow from the vacuum pressure and induced gas flow, and the forward drive gas flow conveys articles through the dispensing channel along the dispensing flow path in a direction from the inlet to the outlet to dispense the articles.
    Type: Grant
    Filed: July 3, 2013
    Date of Patent: July 8, 2014
    Assignee: Parata Systems, LLC
    Inventor: Richard D. Michelli
  • Publication number: 20140184240
    Abstract: In this invention, a test system includes a tester and a switching module for connecting any pin to the tester for testing a device-under-test (DUT), the test system has a rectifying device between the ground of the DUT and the ground of the switching module in order to isolate the DUT from the switching module, thereby blocking unwanted current flowing between the DUT and the switching module to ensure the correctness of the testing. Since the ground of the switching module is not directly connected to the ground of the DUT and the tester, the rectifying device will keep the voltage difference between the ground of the switching module and the DUT in a range between zero and the cut-in voltage of the rectifying device, thereby allowing single-ended signals to be used between the switching module and the tester or the DUT.
    Type: Application
    Filed: December 30, 2012
    Publication date: July 3, 2014
    Inventors: CHING-TSUNG CHEN, WEICHUNG CHEN
  • Patent number: 8766653
    Abstract: A measuring device for measuring insulation resistance of an electric vehicle includes a measuring unit, a voltage detecting unit, and a control unit. The measuring unit includes a first tap, a second tap, a switch, and a measuring resistor. The first tap is to be electrically coupled to a high potential side of a high voltage system. The second tap is to be electrically coupled to a ground side of a low voltage system. The switch and the measuring resistor are connected in series between the first tap and the second tap. The voltage detecting unit is for detecting a voltage formed between the first tap and the second tap. The control unit is operable for controlling ON and OFF states of the switch, and is configured to determine the high potential insulation resistance and the low potential insulation resistance after operating the switch in the ON and OFF states.
    Type: Grant
    Filed: March 15, 2011
    Date of Patent: July 1, 2014
    Assignee: Automotive Research & Testing Center
    Inventors: Chia-Cheng Tu, Jia-Sing Hsu
  • Patent number: 8769314
    Abstract: A test fixture includes a first RS-232 connector and a second RS-232 connector. The data terminal ready (DTR) pin of the first RS-232 connector is connected to the DTR pin of the second RS-232 connector, and the clear to send (CTS) pin of the first RS-232 connector is connected to the CTS pin of the second RS-232 connector. The DTR pins are further connected to a power pin of each of the test computers. The test fixture sets a high level voltage for the connected DTR pins, and sets a low level voltage for the connected CTS pins according to the commands of turning on the test computers sent by the control computer, to turn on the test computers. An auto shutdown software included in each of the test computers is executed to shut down the test computers.
    Type: Grant
    Filed: August 17, 2010
    Date of Patent: July 1, 2014
    Assignees: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Hon Hai Precision Industry Co., Ltd.
    Inventors: Zhi-Chun Liang, Jun-Min Chen, Zhi-Jian Long, Fang Tian
  • Patent number: 8760171
    Abstract: The present invention relates to a method for determining partial discharges at an electrical component (10). In the case of the method, an electrical signal that comprises partial discharge pulses due to the partial discharges at the electrical component (10) is detected. Through filtering of the electrical signal by means of n filters (18-20) having n differing filter characteristics, n filtered partial discharge signals are generated. Respectively one of the filtered partial discharge signals is assigned, respectively, to one of the n filters (18-20), n being greater than or equal to two. Finally, the partial discharges are determined by linking the n filtered partial discharge signals.
    Type: Grant
    Filed: December 23, 2009
    Date of Patent: June 24, 2014
    Assignee: Omicron Electronics GmbH
    Inventors: Caspar Steineke, Harald Emanuel, Ronald Plath
  • Patent number: 8756025
    Abstract: Methods and apparatus are provided related to thermal protection of electrical batteries. A sensor senses the temperature of a battery and a corresponding digital signal is digitally derived. Date, time and temperature data are written to storage media. A time-rate-of-change of the battery's temperature is determined and used to establish operational periodicity. Stored digital data can be communicated to another entity, temperature or time-rate-of-change values used to trigger an alarm or system shut-down, and so on. Electronic circuitry toggles between an active mode and a power-conserving sleep mode in accordance with periodic operating schedule.
    Type: Grant
    Filed: January 18, 2011
    Date of Patent: June 17, 2014
    Assignee: Hewlett-Packard Development Company, L.P.
    Inventors: Neel Banerjee, Anton Nicholas Clarkson
  • Patent number: 8749249
    Abstract: A test handler comprises a package support for holding an electronic device in a certain orientation and for transporting the electronic device to a testing station for testing the electronic device. An orientation correction device is actuable and operative to engage the package support and to rotate the package support so as to change the orientation of the electronic device.
    Type: Grant
    Filed: October 14, 2009
    Date of Patent: June 10, 2014
    Assignee: ASM Assembly Automation Ltd
    Inventors: Chak Tong Albert Sze, Pei Wei Tsai, Wa Sing Tsang
  • Publication number: 20140139235
    Abstract: An automatic test equipment and a testing method thereof are disclosed. The automatic test equipment includes a test apparatus, a first control device, a first assisting device, and a second control device. The test apparatus is applied for testing a first object, wherein the test apparatus has a first cover. The first control device has an activating device. The first assisting device is electrically connected to the first control device. The second control device is electrically connected to the first control device and the test apparatus. When the activating device is activated, the first control device controls the first assisting device to lower the first cover and then the first control device transmits a first control signal to the second control device for allowing the test apparatus to test the first object.
    Type: Application
    Filed: May 20, 2013
    Publication date: May 22, 2014
    Applicant: Wistron Corporation
    Inventors: Chun-Kai WANG, Hai-Jun PENG
  • Patent number: 8729905
    Abstract: This invention relates to a method of detecting faults on an electrical power line (7) and a sensor (5) for use in such a method. Preferably, the sensor is a line-mounted sensor (5). The method comprises the initial step of determining an initial impedance profile for the power line (7), and thereafter the method comprises the subsequent steps of the line-mounted sensor (5) transmitting a conducted communication signal (41) along the power line, receiving a reflected signal (43) particular to the transmitted communication signal and correlating the transmitted signal and the reflected signal. By correlating the signals, it is possible to determine the actual impedance of the power line. The actual impedance of the power line may then be compared with the initial impedance profile and it is possible to ascertain whether a fault exists on the power line. Preferably, the method uses an adaptive filter to determine the location of the fault.
    Type: Grant
    Filed: May 22, 2007
    Date of Patent: May 20, 2014
    Assignee: General Electric Company
    Inventors: Michael Anthony McCormack, Charles Brendan O'Sullivan
  • Publication number: 20140132281
    Abstract: The present disclosure concerns a state monitoring or diagnostics system, and also a method for monitoring the state of devices or for diagnosing devices, in particular for overvoltage protection devices, as well as a method for transmitting measured values. Each of the devices comprises a functional component to be monitored and a monitoring and transmitting apparatus, wherein the monitoring and transmitting apparatus consists solely of a resonator circuit made of passive electrical components with no microchip, in particular with no RFID transponder. The information to be interrogated resides in the resonant frequency of the resonator circuit.
    Type: Application
    Filed: June 21, 2012
    Publication date: May 15, 2014
    Applicant: PHOENIX CONTACT GMBH & CO KG
    Inventors: Roland Bent, Johannes Kalhoff