Abstract: A machine handling device for handling a sheet-metal workpiece includes a control device that comprises two sensing elements, and a testing station that includes a testing device configured to test functional capability of the control device. The testing device includes a respective electrically conductive testing-contact body for each of the two sensing elements of the control device. The testing station further includes a testing-evaluation device configured to apply a testing voltage between the respective sensing element and the corresponding testing-contact body. The testing-evaluation device includes a testing-measuring unit and a testing-comparing unit. The testing-measuring unit is configured to measure an actual value of a contact-dependent electrical variable that is dependent on a state of an electrically conducting contact between the sensing element and the testing-contact body.

Abstract: A current sensor of a detection target current using a shunt resistor includes: a resistance value correction circuit having: a correction resistor; a signal application unit that applies an alternating current signal to a series circuit of the shunt resistor and the correction resistor; a first voltage detection unit that detects the terminal voltage of the shunt resistor; a second voltage detection unit that detects a terminal voltage of the correction resistor; and a correction unit that calculates the resistance value of the shunt resistor based on a first voltage detection value by the first voltage detection unit and a second voltage detection value by the second voltage detection unit, and corrects the resistance value for current detection based on a calculated resistance value of the shunt resistor.

Abstract: A connector controller controls a connector with a power pin, a communication pin, and a ground pin. The connector detects the voltage at the communication pin at least twice to generate first and second voltages respectively. A bus power is supplied at the power pin. The first voltage is detected when a bus current to/from the bus power is about zero. The connector controller controls the bus power in response to a difference between the first and second voltage.

Abstract: Systems and methods for synchronizing subunits a multi-unit power distribution network contemplate selectively opening and closing a switch at the power source to disconnect and reconnect the power source to power conductors to send a synchronization signal to one or more remote subunits. Once the remote subunits are synchronized and able to disconnect from the power conductors, leak detection at the power source may be enabled to detect inadvertent loads on the power conductors (e.g., a human touching the power conductors). Further, the remote subunits may power off and on based on the synchronization signal thereby ensuring that an end device may receive power concurrently from multiple remote subunits so as to meet the power requirements of the end device. Enabling the leak detection improves the safety features of the power distribution network and synchronized power delivery to the end device prevents improper shut downs.

Abstract: An integrated circuit that controls distributed temperature sensors in a semiconductor die is described. This integrated circuit may include: memory; a controller (such as a PTAT controller) coupled to the memory; temperature sensors distributed at measurement locations in the semiconductor die (such as remote locations from the controller), where a given temperature sensor includes building blocks (or components) that are common to the temperature sensors; and routing between the controller and the building blocks over an addressable bus, where signal lines for analog signals in the addressable bus are reused when communicating between the controller and different temperature sensors.

Abstract: A signal receiver adaptive to a noise level includes a first comparator, a second comparator, a control unit, and a reference voltage changing unit. The first comparator compares a voltage of a received signal with a first reference voltage, and the second comparator compares the voltage of the received signal with a second reference voltage. The control unit outputs a control voltage having a voltage level corresponding to the number of output pulses per unit time of the first comparator. The reference voltage changing unit changes the magnitudes of the first reference voltage and the second reference voltage in response to a voltage level of a control voltage. The second comparator compares the changed second reference voltage with the received signal to output a transmission signal from which noise is cancelled. A voltage level of noise to be cancelled from the received signal varies according to a noise level, so the noise cancellation adaptive to the noise level is performed.

Abstract: A method is for determining a status of a track section of a railroad. Each end of the track section is connected to a respective detector. One of the two detectors transmits a current along the rails of the track section towards the other detector and receives a current transmitted along the rails of the track section from the other detector. The track section is further equipped with a computer in communication with the two detectors. The computer calculates an instant value of the status of the track section as a function of an instant vector based on a measure of an intensity of the current transmitted by a first of the detectors as measured by the first detector (Txl1), a measure of an intensity of the current received by the first detector as measured by the first detector (Rxl1) and a measure of an intensity of the current transmitted by the second detector as measured by the second detector (Txl2).

Abstract: Techniques are described that can solve the problem of being low power while running a device on battery and alternatively running on the output of a switching regulator. In a low power mode, a voltage regulator circuit can be powered down and a switch can connect an input voltage of the regulator, e.g., a battery, to the CPU. In addition, internal and/or external loads, such as voltage feedback resistors, can be disconnected in order to further reduce the power consumption. If the device is going into operation, the CPU can be disconnected from the input voltage of the regulator, e.g., the battery, and switched to the output of the regulator. This can ensure that the circuit consumes very little power consumption in standby mode.

Abstract: A battery pack may include a battery (60), a board (10), a first connection terminal (12), a second connection terminal (11), a control circuit (620), and a busbar (18). The first connection terminal is provided on the board and is configured to be connected to an electric work machine (500). The second connection terminal is provided on the board and is connected to the battery. The control circuit is provided on the board and is configured to control discharging of the battery. The busbar is provided on the board in a current discharge path between the first connection terminal and the second connection terminal.

Abstract: A connector system includes a connector for connecting a first conductor in electrical communication with a second conductor, and a sensor supported adjacent the connector. The sensor is in electrical communication with the first conductor and in electrical communication with the second conductor. The sensor detects a characteristic of the connection between the first conductor and the second conductor.

Abstract: A system for ground fault detection includes an alternating current (AC) excitation source configured to provide an AC test signal to a circuit under test; a current transformer configured to detect a current of the AC test signal; a capacitive pickup configured to detect a voltage of the AC test signal; and a receiver which includes a display; and a processor configured to receive the voltage from the capacitive pickup; receive the current from the current transformer; and display on the display one or more components of the current.

Abstract: An autocalibration method includes generating at least one sensor signal in response to measuring a physical quantity; compensating the at least one sensor signal based on at least one compensation parameter to generate at least one compensated sensor signal; generating the at least one compensation parameter based on the at least one sensor signal or the at least one compensated sensor signal; comparing each of the at least one compensation parameter to a respective tolerance range; on a condition that each of the at least one compensation parameter is within its respective tolerance range, transmitting the at least one compensation parameter as at least one validated compensation parameter to be used for compensating the at least one sensor signal; and on a condition that at least one of the at least one compensation parameter is not within its respective tolerance range, generating a fault detection signal.

Abstract: A current sensor includes a battery terminal portion that is conductive and is fastened to a battery post; a shunt resistor for current detection, which is formed in a plate shape and is electrically connected to the battery terminal portion; and a circuit board that is formed in a plate shape and is electrically connected to the shunt resistor, in which the shunt resistor is erected on a main surface of the circuit board. With this configuration, since the shunt resistor and the circuit board can be arranged so as not to face each other and not confront each other, the influence of heat generated by the shunt resistor can be suppressed.

Abstract: A calibration operation determines a resistance of a sense resistor in a POE system. A voltage measurement is taken with a first current flowing through the sense resistor. A second voltage measurement is taken with a second current flowing through the resistor. A resistance value of the sense resistor is determined based on a voltage difference between the first and second voltage measurements and a current difference between the first current and the second currents.

Abstract: The embodiments herein are directed to technologies for backside security meshes of semiconductor packages. One package includes a substrate having a first interconnect terminal of a first type and a second interconnect terminal of a second type. The package also includes a first security mesh structure disposed on a first side of an integrated circuit die and a conductive path coupled between the first interconnect terminal and the second interconnect terminal. The first security mesh structure is coupled to the first interconnect terminal and the second interconnect terminal being coupled to a terminal on a second side of the integrated circuit die.

Abstract: The present disclosure provides a semiconductor structure having a test structure. The semiconductor structure includes a wafer and a test structure. The test structure is disposed on the wafer, and includes a first device and a second device. The first device includes a first source/drain layer and a first gate layer disposed above the first source/drain layer. The second device includes a second source/drain layer and a second gate layer disposed above the second source/drain layer. The second gate layer is connected to the first gate layer. The first gate layer is disposed along a first direction and the second gate layer is disposed along a second direction orthogonal to the first direction.

Abstract: Switching of particular inputs in a signal processing channel permits an independent evaluation of that signal processing channel, in a system where there are at least two signal processing channels, one of which is able to be calibrated while the other of which is measuring current in a shunt. Switching a controlled current through a shunt, the controlled current being small in value compared with an overall current being measured, permits yet another independent evaluation of the shunt.

Abstract: Various embodiments provide a multi-dimensional electric potential sensor array to remotely quantitatively measure static, quasi-static, and dynamic electric potential and electric field in free space, and emanating and propagating from objects. Various embodiments enable the evaluation of the integrity of electronic circuits and electronic components by quantitatively and dynamically imaging electric potential generated during electronic circuit activation, operation, and deactivation. In various embodiments, the electrical potential of active electronics and objects of interest in containers may be quantitatively measured by the electric potential and electric field methods and by using specified materials in a combined structural and electronic component design to construct a multi-dimensional sensor array.

Abstract: Methods, systems, and devices for erroneous bit discovery in a memory system are described. A controller or memory controller, for example, may read a code word from a memory medium. The code word may include a set of bits that each correspond to a respective Minimum Substitution Region (MSR) of the memory medium. Each MSR may include a portion of memory cells of the memory medium and be associated with a counter to count a quantity of erroneous bits in each MSR. When the controller identifies a quantity of erroneous bits in the code word using an error control operation, the controller may update values of counters associated with respective MSRs that correspond to the quantity of erroneous bits to count erroneous bit counts for each MSR. In some cases, the controller may perform operations described herein as part of a background operation.

Abstract: An optocoupler is placed in series between the field ground pin of digital input circuitry and the field ground of an industrial controller. A capacitor to field ground is provided for each digital input. A resistor is provided to the input pin of the digital input circuitry. To detect a broken wire a test pulse is provided to the optocoupler connected in the ground path. This test pulse isolates the digital input circuitry from field ground. As current is always being provided from the field when the wire is not broken, the capacitor connected between the input and ground charges. After the test pulse has completed, the output signal of the digital input circuitry is examined. If the level indicates the input is high, the wire is not broken. If, however, the output remains low indicating that the input is low, the wire has broken.

Abstract: Methods and systems for compensating display panel operations providing a current from power circuitry over a first path between a display panel and the power circuitry are provided. A sensing current may be injected into the first path via a second path between the power circuitry and the first path. An equivalent series resistance (ESR) of the first path may be calculated using a third path and the sensing current. A processor may compensate for electrical fluctuations from the power circuitry to the display panel based at least in part on the measured ESR.

Abstract: A position tracking system includes an electrical interface and a processor. The electrical interface is configured to communicate with one or more electrodes that are coupled to a distal end of a probe inserted into a heart of a patient. The electrical interface is further configured to receive, from a plurality of electrode-patches attached to a skin of the patient, position signals that are indicative of positions of the one or more electrodes in the heart. The processor is configured to select, based on the position signals, a partial subset of the electrode-patches whose position signals are least-correlated with one another, and to estimate a position of at least one of the electrodes in the heart, based on the position signals received from the selected partial subset of the electrode-patches.

Abstract: Systems and methods for detecting a crack or defect in a material are described. An example method may include determining, by a computing device, for each respective adjacent pair of electrodes of a plurality of electrodes electrically coupled to the material, a respective electrode pair voltage. The method also may include determining, by the computing device, for each respective adjacent pair of electrodes, a respective temperature-corrected electrode pair value based on the respective electrode pair voltage and at least one of a respective control voltage associated with the respective adjacent pair of electrodes or a temperature correction factor. The method may further include determining, by the computing device, whether the material includes a crack or defect based on the plurality of respective temperature-corrected electrode pair values.

Abstract: A circuit includes a switching circuit including a first switch and a second switch. A current sensing circuit is coupled to the switching circuit to sense a first current through the first switch and to generate a first sensed current signal based on the sensed first current, and configured to sense a second current through the second switch and to generate a second sensed current signal based on the sensed second current. An output circuit is coupled to the current sensing circuit and is configured to generate a failure signal based on the first sensed current signal and the second sensed current signal.

Abstract: A probe having a temperature sensor on its distal portion is introduced into a fluid-filled body cavity of a subject, and an irrigating fluid passed through the probe. The temperature of the irrigating fluid exiting the probe differs from the temperature of the body cavity. Temperature readings of the irrigating fluid exiting the probe are recorded. A determination is made from the temperature readings that predetermined contact criteria between the probe and the interior wall of the body cavity are satisfied.

Abstract: The invention relates to a measuring arrangement (12) for measuring an electric current (I) in the high-current range, in particular in the current range of more than 1 kA, having a low-resistance current sense resistor (1) for measuring current in accordance with four conductor technology and a physically integrated measuring circuit (17) for measuring the voltage which is dropped across the current sense resistor (1). The invention provides several pairs of voltage taps for measuring the electrical voltage which is dropped across the resistor element (4), wherein the pairs of voltage taps are connected to the measuring circuit (17). The invention further provides two busbar connections (13, 14) for connection to two busbars (15, 16). Corrections of the temperature coefficient, the thermoelectric voltage and the offset and also a high sampling rate and resolution allow high-resolution measurement of a DC current in a high AC current.

Abstract: A touch panel includes a substrate having insulating properties and including a sensing region and a non-sensing region, a plurality of sensor electrodes formed in the sensing region, a plurality of external connection terminals formed in the non-sensing region, and a lead-out wiring line electrically connecting one end of each of the plurality of sensor electrodes to each of the plurality of external connection terminals. The external connection terminal and the lead-out wiring line are continuously divided by a single slit along an extension direction of the external connection terminal and the lead-out wiring line in an entire length, or in a portion of the entire length from which an end portion in a sensor electrode side of the lead-out wiring line is excluded.

Abstract: A method for determining an output voltage of a transistor, the transistor comprising an input electrode, a first output electrode and a second output electrode, the potential of the first output electrode being higher than the potential of the second output electrode the output voltage being the difference in potential between the first output electrode and the second output electrode. The method includes a step for measuring the evolution over time of a control voltage of the transistor, the control voltage being the difference in potential between the input electrode and the second output electrode, and determining the output voltage from the measured control voltage.

Abstract: A method monitors capacitor bushings of a three-phase AC mains, which has first, second, and third mains lines respectively associated with first, second, and third: phases, capacitor bushings, and mains voltages. Each of the capacitor bushings has: a conductor connected with the associated mains line, and an electrically conductive foil enclosing the conductor. The method includes, for each of the phases: determining, at a predetermined initial instant for a characteristic variable, which is characteristic for the respective capacitor bushing, a corresponding characteristic value; determining, at a predetermined later instant after the initial instant for the characteristic variable, a corresponding normalised characteristic value in dependence on the respective characteristic value and/or on at least one of remaining characteristic values; and checking whether the normalised characteristic value has impermissibly changed.

Abstract: A diagnostic system includes a detection circuit comprising a first impedance, a second impedance, a first input pin, a second input pin, a first output pin and a second output pin. The detection circuit is configured to receive an input signal via the first and the second input pins. The first impedance is configured to electrically couple the first input pin and the first output pin, and the second impedance is configured to electrically couple the first input pin with the second input pin and second output pin. The diagnostic system also includes a communication channel. The diagnostic system further includes an input circuit comprising a third input pin, a fourth input pin and a third output pin. The input circuit is configured to provide, via the third output pin, a voltage signal.

Abstract: Current measurement apparatus comprises a measurement arrangement and a signal source. The measurement arrangement is configured to measure a current signal drawn by a load. The signal source is operative to apply a reference input signal to the measurement arrangement whereby an output signal from the measurement arrangement comprises a load output signal corresponding to the load drawn current signal and a reference output signal corresponding to the reference input signal.

Abstract: A current detection device includes a current sensor and a controller. The current sensor outputs a detection voltage according to a conduction current flowing through a bi-directional circuit in which current is capable of flowing in a positive direction and a negative direction that is a direction opposite to the positive direction. The controller calculates the conduction current based on the detection voltage output from the current sensor. For example, the controller calculates the conduction current based on an absolute value of a difference between a reference voltage that is the detection voltage output during a non-conductive state in which current is not flowing through the bi-directional circuit, and the detection voltage output during a conductive state in which current is flowing through the bi-directional circuit.

Abstract: A method and a circuit arrangement for testing and/or calibration, the circuit arrangement having a sensor electrode and a first and second circuit unit coupled thereto, the second circuit unit having a capacitor, and the sensor electrode being kept at a specified electrical target potential by the capacitor and the sensor electrode being coupled such that matching of the electrical potential is made possible. The second circuit unit is configured such that, if the electrical potential of the capacitor is outside a reference range, second circuit unit detects this event and brings the capacitor to a reference potential. For the purpose of testing and/or calibration, a reference current source is provided for injecting an adjustable reference current into the sensor electrode, a reference current injected into another circuit unit is measured, and/or a reference current is injected into different portions of the sensor electrode.

Abstract: A method (60) for determining resistances (R1, R2, R3, RN) on a voltage level of a multiphase transformer (10) comprising one winding (u, v, w; U, V, W) for each phase comprises injecting a particular first current into the particular winding (u, v, w; U, V, W); recording a particular first voltage caused by the injected first currents in the plurality of phases; injecting a particular second current into the particular winding (u, v, w; U, V, W), wherein the particular injected second current differs from the particular injected first current in at least one of the plurality of phases; recording a particular second voltage caused by the injected second currents in the plurality of phases, and determining the resistances (R1, R2, R3, RN) on the voltage level on the basis of the injected first and second currents and the recorded first and second voltages. An apparatus (70) for determining resistances (R1, R2, R3, RN) on a voltage level of a multiphase transformer (10) is also proposed.

Abstract: In examples, an apparatus for sensing current comprises a power transistor; a sense transistor coupled to the power transistor; and an offset addition circuit coupled to the power transistor and the sense transistor, the offset addition circuit comprising a first pair of transistors and a differential amplifier. The apparatus also comprises a cascode amplifier circuit coupled to the offset addition circuit, the cascode amplifier circuit comprising a second pair of transistors, and a gain trim circuit coupled to the cascode amplifier circuit, the gain trim circuit including another differential amplifier and a third transistor. The apparatus further includes an analog-to-digital converter (ADC) coupled to the gain trim circuit and storage coupled to the ADC.

Abstract: A detecting apparatus that uses a redundancy configuration comprising plural sensor sections including plural detecting sections, accurately performs abnormality detection and function continuation in a control apparatus such as an ECU in a case that abnormality is occurred in the sensor sections or a signal line, and has simple manufacturing processes, and an electric power steering apparatus equipped with the detecting apparatus. The apparatus includes plural sensor sections which include plural detecting sections that detect a same object or a same state quantity, and detects at least one of the state quantities in at least two of the sensor sections, wherein each of the sensor sections has a communication section that outputs the state quantities, which the detecting sections detect, as an error detectable signal.

Abstract: Systems and methods for an open wire scan are provided. In certain embodiments, An apparatus comprising a circuit includes a plurality of inputs for connecting with a plurality of outputs of a multi-cell battery pack; and an open connection detection circuit, formed within the circuit, for detecting an open connection on at least one of the plurality of inputs connected to the multi-cell battery pack and generating a fault condition responsive thereto. The open connection detection circuit comprises at least one current source device; and at least one device for turning on and off the at least one current source device. The open connection detection circuit also comprises at least one amplifier; an analog to digital converter; and a control logic circuit.

Abstract: A semiconductor test device for measuring a contact resistance includes: first fin structures, upper portions of the first fin structures protruding from an isolation insulating layer; epitaxial layers formed on the upper portions of the first fin structures, respectively; first conductive layers formed on the epitaxial layers, respectively; a first contact layer disposed on the first conductive layers at a first point; a second contact layer disposed on the first conductive layers at a second point apart from the first point; a first pad coupled to the first contact layer via a first wiring; and a second pad coupled to the second contact layer via a second wiring. The semiconductor test device is configured to measure the contact resistance between the first contact layer and the first fin structures by applying a current between the first pad and the second pad.

Abstract: The present invention relates to a Powered Device (PD) in a Power-over-Ethernet (PoE) system. The invention proposes that the PD selectively transmit to a Power Sourcing Equipment (PSE) a power request based on the support of that PSE for autoclass. An autoclass supporting PSE will determine the maximum power that needs to be allocated to the PD based on measuring the power used by the autoclass supporting PD during classification. If the PSE does not support autoclass, it will instead allocate a default maximum power (based on the classification) to the PD. When the PD is operational it determines whether autoclass is supported by the PSE (230). If autoclass is supported then no power request should be sent (250) as otherwise the PSE will allocate power based on this request instead of on the more accurate measurement.

Abstract: Provided herein is a preprocessing apparatus for gas analysis that enables preprocessing for gas analysis to be performed without requiring a cryogen. A preprocessing apparatus for gas analysis 101 mainly includes a gas flow path 103, a cooling portion 105, and a plurality of valves V101 to V105 that serve as gas flow path connection changing means for changing the gas flow path. The cooling portion 105 is operable to cool the collecting portion 113, and is constituted from a heat conductor 121, a cooling device 127, and a sealed structure 129. The cooling device 127 can cooled a contact cooling section 131 to an extremely low temperature by utilizing electrical energy. The cooling device 127 is used to bring the collecting portion 113 to a first temperature at which the target gas to be analyzed is solidified, and to thereafter bring the collecting portion 113 to a second temperature at which only the target gas to be analyzed is gasified.

Abstract: Systems and methods for real-time detecting and quantification of surface and bulk corrosion and erosion in materials involve measuring and characterizing the electrical resistances, capacitances, and/or inductances of the materials and their interfaces, preferably by using an impedance analyzer precision LCR meter. The materials may be metals, non-metals (such as plastics, polymers, cements, concrete, ceramics, rocks and soils) and composite materials with various types of material constituents (such as metals, plastics, polymers, and cements).

Abstract: A sensor, for measuring current in a conductor, has a stack with at least one isolation layer and at least two metallization layers stacked in a z direction, a first winding of conductive material and a second winding of conductive material, the first and second winding each having first and second parts formed in a metallization layer in the stack and mainly extending respectively in y and z directions and respectively having first and second centers of gravity. The first and second centers of gravity are respectively in first and second planes, wherein the first plane intersects with the second plane in a common intersection line in the second direction. The z direction and the y direction are orthogonal. The sensor has measurer configured to measure current through the first and second winding.

Abstract: A semiconductor test device for measuring a contact resistance includes: first fin structures, upper portions of the first fin structures protruding from an isolation insulating layer; epitaxial layers formed on the upper portions of the first fin structures, respectively; first conductive layers formed on the epitaxial layers, respectively; a first contact layer disposed on the first conductive layers at a first point; a second contact layer disposed on the first conductive layers at a second point apart from the first point; a first pad coupled to the first contact layer via a first wiring; and a second pad coupled to the second contact layer via a second wiring. The semiconductor test device is configured to measure the contact resistance between the first contact layer and the first fin structures by applying a current between the first pad and the second pad.

Abstract: A semiconductor system includes a first semiconductor device suitable for outputting an external command and a termination control signal and being inputted with a data signal; and a second semiconductor device suitable for generating a termination enable signal in response to the external command and the termination control signal, generating a pull-up signal in response to the termination enable signal, and generating a pull-down signal in response to the termination enable signal and a test mode signal.

Abstract: In one embodiment, the present invention includes a processor having a plurality of cores and a control logic to control provision of a voltage/frequency to a first core of the plurality of cores independently of provision of a voltage/frequency to at least a second core of the plurality of cores. In some embodiments, the voltages may be provided from one or more internal voltage regulators of the processor. Other embodiments are described and claimed.

Abstract: A solar power generation system includes a solar module, a power converter, and a control device. The power converter is configured to control an output voltage of the solar module such that the output voltage matches a target output voltage. The control device is configured to determine a lower limit value of the target output voltage based on the following general formula. V TL ? ( I rr , T ) = V OC ? ( I rr , T ) · n - 1 n - V BD ? ( T ) - ? ( 1 ) In the general formula, Irr denotes a used light intensity, and T denotes a temperature. VTL(Irr, T) denotes the lower limit value of the target output voltage. VOC(Irr, T) denotes an open-circuit voltage of the solar module. The number of the solar cells connected in series is denoted by n. VBD(T) denotes a positive value of a reverse breakdown voltage of one solar cell. A tolerable error is denoted by ?.

Abstract: Described herein are methods and devices for capturing and determining the identity of molecules using nanopores. The molecules can be counted, sorted and/or binned rapidly in a parallel manner using a large number of nanopores (e.g., 132,000 nanopores reading 180 million molecules in 1 hour). This fast capture and reading of a molecule can be used to capture probe molecules or other molecules that have been generated to represent an original, hard to detect molecule or portions of an original molecule. Precise counting of sample molecules or surrogates for sample molecules can occur. The methods and devices described herein can, among other things, replace flow cytometers and other counting instruments (e.g., while providing increased precision and throughput relative to a flow cytometer).

Abstract: A testing system includes a subtractor and a divider. The subtractor is configured to receive a first voltage of a circuit being tested and a second voltage of the circuit, and to derive a difference between the first voltage and the second voltage. The divider is configured to receive the difference between the first voltage and the second voltage, and to derive a resistance of the circuit by dividing (i) the difference between the first voltage and the second voltage by (ii) a difference between a first current applied to the circuit and a second current applied to the circuit. The first voltage is corresponding to the first current, and the second voltage is corresponding to the second current.

Abstract: A voltage generation apparatus includes: a controller, a first voltage division controller, a second voltage division controller, and a voltage detector. The first voltage division controller and a load are connected in series between an input power supply and ground. The second voltage division controller and the load are connected in parallel between ground and a connection point between the first voltage division controller and the load. The voltage detector is electrically connected to the load, and is configured to: detect a load voltage of the load, and feed back a detected value of the load voltage to the controller. The controller is configured to: receive the detected value fed back by the voltage detector, and generate a control signal based on the detected value. The control signal is used to control the first voltage division controller and the second voltage division controller.

Abstract: The present invention relates to a metallic device for near-field optical microscopy and spectroscopy, as well as to a method of preparing it. Said device comprises a single body (1) with longitudinal prolongation (2), nanometric apex (4) and has at least one trimming (3) on its surface, being applied as a probe of high optical efficiency, with adequate dimensions and details that enable the best photon-plasmon coupling, enabling the analysis, with high space resolution, of structures of nanometric dimensions with high efficiency and reproducibility.