To Detect A Flaw Or Defect Patents (Class 324/718)
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Patent number: 12234953Abstract: A device for measuring a conduit arranged in a submerged or subterraneous environment and surrounded by an insulator layer. The device includes a first electrode; a mounting unit to be arranged on a surface of the conduit to create an enclosure against the surface, the enclosure containing the first electrode and configured to form a dielectric between the first electrode and the environment. A second electrode is configured to be arranged at a distance of the surface and at a distance of the first electrode and is intended to be in contact with the environment. A measurement instrument is configured to determine a value which is representative of an impedance between the first electrode and the second electrode.Type: GrantFiled: December 9, 2022Date of Patent: February 25, 2025Assignee: ISENSPRO NVInventor: Yves Marie-Louis Gabriël Desmet
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Patent number: 11913895Abstract: To easily detect a crack having occurred in a steel material. A current measurement device measures a value of a current flowing through a target steel material that is immersed in an electrolyte aqueous solution and applied with tensile stress while subjected to hydrogen charging, and a device for detecting the occurrence of a crack or the like uses the measured current value to determine the occurrence of a crack in the target steel material when the amount of change in the current flowing through the target steel material, the change rate of the amount of change in the current, or the change rate of the change rate of the amount of change in the current exceeds a threshold value.Type: GrantFiled: May 28, 2019Date of Patent: February 27, 2024Assignee: NIPPON TELEGRAPH AND TELEPHONE CORPORATIONInventors: Yosuke Takeuchi, Takuya Kamisho, Masamitsu Watanabe
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Patent number: 11808797Abstract: An electrical resistivity tomography system having a novel electrode geometry and method of use is provided. The novel electrode geometry radiates a uniform electric field which produces greatly improved resistivity data.Type: GrantFiled: March 19, 2021Date of Patent: November 7, 2023Assignee: EarthSystems Technologies, Inc.Inventors: John Bryant, Frederick Hershel Savage, Timothy Beets
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Patent number: 11656201Abstract: According to one implementation, a structural health monitoring system includes an ultrasonic transducer, an ultrasonic sensor, a strain sensor and a signal processing part. The ultrasonic transducer oscillates an ultrasonic wave to the first inspection area. The ultrasonic sensor detects a waveform of at least one of a transmission wave of the ultrasonic wave and a reflected wave of the ultrasonic wave. The transmission wave has transmitted the first inspection area. The reflected wave has been reflected in the first inspection area. The strain sensor detects a strain amount of the second inspection area. The signal processing part obtains at least one index, representing health of the structural object including the first inspection area and the second inspection area, based on the waveform detected by the ultrasonic sensor and the strain amount detected by the strain sensor.Type: GrantFiled: December 29, 2020Date of Patent: May 23, 2023Assignee: SUBARU CORPORATIONInventors: Hideki Soejima, Takuya Nakano
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Patent number: 11549797Abstract: A device for detecting wear of a wear member composed of electrically resistive material. The wear member comprises at least two electrodes separated from each other, where each electrode overlies, or is embedded in, an outer surface of the electrically resistive material. One of the electrodes is connected to a resistor at a measurement node to form a resistive voltage divider. A voltage measurement device measures a change in voltage at the measurement node, where the change is voltage is indicative of the degree of removal of resistive material from a face of the wear member and where the change in voltage is continuously variable and not limited to discrete wear levels.Type: GrantFiled: October 26, 2018Date of Patent: January 10, 2023Assignee: DEERE & COMPANYInventors: Noel W. Anderson, Michael L. Rhodes
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Patent number: 11035812Abstract: According to one embodiment, a structural health monitoring apparatus for monitoring health of a structure includes a resistance measurement unit and an evaluation unit. The resistance measurement unit measures a resistance value between one terminal and another terminal of a set of two terminals. The set of two terminals is selected from a plurality of terminals provided on the electrical paths formed in the assembled body that forms frames of the structure. The evaluation unit evaluates the health of the structure by using a difference between the resistance value between terminals of the set of two terminals and a reference resistance value between the two terminals, and outputs evaluation result information.Type: GrantFiled: May 11, 2017Date of Patent: June 15, 2021Assignee: UNEBE CORPORATIONInventor: Takeshi Togaru
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Patent number: 10036823Abstract: A method for monitoring and early warning of structural collapse, having following steps of: installing at least one electric field sensor in a monitoring area, wherein the at least one electric field sensor is used for measuring an electric field signal of the monitoring area; receiving the electric field signal and applying a signal analysis to the electric field signal; and issuing a warning signal when a critical transition feature occurs in the electric field signal to which the signal analysis is applied.Type: GrantFiled: June 6, 2016Date of Patent: July 31, 2018Assignee: National Central UniversityInventors: Chien-Chih Chen, Yi-Heng Li
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Patent number: 9621421Abstract: A computer-implemented method for prognostic network management may include (1) monitoring a health indicator of a physical component of a device in a network, (2) using the health indicator to estimate a remaining useful life of the physical component, (3) detecting that the remaining useful life of the physical component has reached a predetermined threshold, and (4) reconfiguring the network in response to detecting that the remaining useful life of the physical component has reached the predetermined threshold so that failure of the physical component does not cause the network to become unavailable to any user of the network. Various other methods, systems, and computer-readable media are also disclosed.Type: GrantFiled: June 30, 2014Date of Patent: April 11, 2017Assignee: Juniper Networks, Inc.Inventors: Elmer Tolentino, Graham S Pritchard, Steven Keck, Jayesh Champaneri, Dharini Hiremagalur
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Patent number: 9018958Abstract: An apparatus for measuring electrical parameters for an electrical system measures a first and second parameters of the electrical system between connections to the electrical system. A processor determines a third electrical parameter of the electrical system as a function of the first parameter and the second parameter. Wireless communication is provided between components of the apparatus.Type: GrantFiled: October 19, 2011Date of Patent: April 28, 2015Assignee: Midtronics, Inc.Inventor: Kevin I. Bertness
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Patent number: 8928339Abstract: A structure is described that includes a first faying surface, a second faying surface for creating an electrical bond with the first faying surface, and a sensor operatively placed proximate the first faying surface and the second faying surface. The sensor includes a current port for injecting a fixed current through the electrical bond, a voltage port for sensing a voltage across the electrical bond induced by the fixed current, a processing device programmed to determine a resistance of the electrical bond based on the fixed current and sensed voltage, and a wireless interface for transmitting at least one of the sensed voltage and the determined resistance to an external device.Type: GrantFiled: October 29, 2010Date of Patent: January 6, 2015Assignee: The Boeing CompanyInventors: Jason P. Bommer, Andrew M. Robb, Stephen Lee Fahley
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Patent number: 8846448Abstract: The present disclosure relates to a tool arrangement and method to reduce warpage within a package-on-package semiconductor structure, while minimizing void formation within an electrically-insulating adhesive which couples the packages. A pressure generator and a variable frequency microwave source are coupled to a process chamber which encapsulates a package-on-package semiconductor structure. The package-on-package semiconductor structure is simultaneously heated by the variable frequency microwave source at variable frequency, variable temperature, and variable duration and exposed to an elevated pressure by the pressure generator. This combination for microwave heating and elevated pressure limits the amount of warpage introduced while preventing void formation within an electrically-insulating adhesive which couples the substrates of the package-on-package semiconductor structure.Type: GrantFiled: August 10, 2012Date of Patent: September 30, 2014Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.Inventors: Meng-Tse Chen, Wei-Hung Lin, Kuei-Wei Huang, Tsai-Tsung Tsai, Ai-Tee Ang, Ming-Da Cheng, Chung-Shi Liu
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Patent number: 8822993Abstract: An Integrated Circuit (IC) and a method of making the same. In one embodiment, an integrated circuit includes: a substrate; a first metal layer disposed on the substrate and including a sensor structure configured to indicate a crack in a portion of the integrated circuit; and a second metal layer disposed proximate the first metal layer, the second metal layer including a wire component disposed proximate the sensor structure.Type: GrantFiled: July 17, 2012Date of Patent: September 2, 2014Assignee: International Business Machines CorporationInventors: Edward C. Cooney, III, Jeffrey P. Gambino, Zhong-Xiang He, Tom C. Lee
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Patent number: 8810255Abstract: An in-situ system for detecting damage in an electrically conductive wire. The system includes a substrate at least partially covered by a layer of electrically conductive material forming a continuous or non-continuous electrically conductive layer connected to an electrical signal generator adapted to delivering electrical signals to the electrically conductive layer. Data is received and processed to identify damage to the substrate or electrically conductive layer. The electrically conductive material may include metalized carbon fibers, a thin metal coating, a conductive polymer, carbon nanotubes, metal nanoparticles or a combination thereof.Type: GrantFiled: July 26, 2010Date of Patent: August 19, 2014Assignee: The United States of America as Represented by the Administrator of the National Aeronautics and Space AdministrationInventors: Martha K. Williams, Luke B. Roberson, Lanetra C. Tate, Trent M. Smith, Tracy L. Gibson, Scott T. Jolley, Pedro J. Medelius
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Patent number: 8679862Abstract: A method for manufacturing a thin film photoelectric conversion module includes the steps of forming a plurality of photoelectric conversion elements connected in series on a substrate, and carrying out reverse bias processing simultaneously on a group of photoelectric conversion elements including a plurality of the photoelectric conversion elements positioned with one or a plurality of the photoelectric conversion elements interposed between each of them, by applying a plurality of voltages electrically isolated from one another to the group of photoelectric conversion elements.Type: GrantFiled: January 28, 2009Date of Patent: March 25, 2014Assignee: Sharp Kabushiki KaishaInventor: Shinsuke Tachibana
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Patent number: 8617410Abstract: A method for inspecting semiconductor wafers patterned by a photomask includes loading a first wafer and scanning a first image of the first wafer, loading a second wafer and scanning a second image of the second wafer, comparing the first and second images, and classifying a difference detected between the first and second images as a potential defect on the photomask. The potential defect includes a haze defect on the photomask.Type: GrantFiled: October 13, 2011Date of Patent: December 31, 2013Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.Inventors: Chang-Cheng Hung, Tsai-Sheng Gau
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Patent number: 8593153Abstract: A system and method for detecting damage in an electrical wire, including delivering at least one test electrical signal to an outer electrically conductive material in a continuous or non-continuous layer covering an electrically insulative material layer that covers an electrically conductive wire core. Detecting the test electrical signals in the outer conductive material layer to obtain data that is processed to identify damage in the outer electrically conductive material layer.Type: GrantFiled: July 26, 2010Date of Patent: November 26, 2013Assignee: The United States of America as Represented by the United States National Aeronautics and Space AdministrationInventors: Pedro J. Medelius, Tracy L. Gibson, Mark E. Lewis
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Patent number: 8593164Abstract: In one general aspect, an apparatus can include a block defining a temperature control channel therethrough and a defining a sample chamber. The apparatus can also include an electrode disposed inside of the block such that the sample chamber is fluidically isolated from the temperature control channel by the electrode. The electrode can be configured to receive a signal from an impedance analyzer during a dielectric spectroscopy experiment related to a sample included in the sample chamber.Type: GrantFiled: October 15, 2010Date of Patent: November 26, 2013Assignee: Brigham Young University (BYU)Inventors: Satyan Chandra, Brian Anthony Mazzeo
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Patent number: 8587327Abstract: A device for use with a conduit having a first conduit end and a conduit second end, into which conduit a cable can be installed using a flow of air into the first conduit end, the device being suitable for confirming that the air is flowing out from the second conduit end. In an embodiment, the device includes a housing, means to enable connection of the device to the second conduit end, a detector arranged to detect an electrical property change, and an actuator for causing an electrical property change detectable by the detector, wherein in use, the air flowing into the device causes the detector and the actuator to move relative to each other, causing an electrical property change detectable by the detector.Type: GrantFiled: December 23, 2008Date of Patent: November 19, 2013Assignee: British Telecommunications Public Limited CompanyInventors: David John Taylor Heatley, Philip Alfred Barker, Ian Neild
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Patent number: 8552717Abstract: It is an object of the present invention to provide an eddy current testing apparatus capable of accurately detecting any flaws occurring in a columnar or cylindrical subject to be tested regardless of their extending directions, with the use of the same probe coil. The eddy current testing apparatus 100 according to the present invention comprises a spinning plate 1 and a probe coil 2 disposed on the spinning plate 1. The probe coil is a probe coil capable of obtaining a differential output about a scanning direction of a detection signal which corresponds to a detected eddy current induced in the subject to be tested. The spinning plate is disposed in such a position that a spinning center RC of the spinning plate faces with an axial center PC of the subject to be tested.Type: GrantFiled: March 17, 2008Date of Patent: October 8, 2013Assignee: Nippon Steel & Sumitomo Metal CorporationInventors: Shigetoshi Hyodo, Yoshiyuki Nakao
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Patent number: 8513941Abstract: A power detection regulation device including a power detection signal generator, a power state detector and a regulated output unit is disclosed. The power detection signal generator receives the input power from an external power supply and generates a power detection signal. The power state detector generates a power state signal based on the power state derived from the power detection signal. The regulated output unit receives the power state signal and generates a driving signal to an external electrical device in accordance with the feedback signal from the external electrical device. The power state signal is provided for the external electrical element to perform relevant processes, and the regulated output device can output the predetermined driving signal on receiving the power state signal indicating some abnormal situation in the input power so as to maintain the normal operation performed by the actuating element in the external electrical device.Type: GrantFiled: July 30, 2011Date of Patent: August 20, 2013Assignee: Inno-Tech Co., Ltd.Inventors: Ting-Chin Tsen, Shu-Chia Lin, Wen-Yueh Hsieh
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Patent number: 8482309Abstract: A failure detecting method for a solar power generation system having plural solar cell strings in each of which plural solar cell modules are connected to each other in series. Specifically, by comparing the current value of each of the solar cell modules or strings with the average current value per one module or string, calculated from the total current value of the entire solar cell modules or strings, one or more failure candidates can be detected with high precision.Type: GrantFiled: February 19, 2010Date of Patent: July 9, 2013Assignee: Onamba Co., Ltd.Inventors: Yukitaka Miyata, Jun Ishida, Osamu Shizuya
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Patent number: 8415967Abstract: A wafer inspection apparatus that performs surface inspection and internal inspection of solar cells using a single apparatus. The wafer inspection apparatus includes a loading unit configured to allow a cassette to be lifted up or lowered by an elevator. A surface inspection unit includes a plurality of stages, thus performing surface inspection of each wafer using a first vision module. A wafer transfer unit has a rotatably installed center portion and has both ends provided with adsorption parts. An internal inspection unit is configured such that a conveyor is installed to allow the wafer to be transferred, thus performing internal inspection of the transferred wafer through a second vision module. An unloading unit enables wafers having completed the internal inspection to be sequentially loaded onto the unloading unit. A control unit controls a series of wafer inspection procedures.Type: GrantFiled: July 15, 2010Date of Patent: April 9, 2013Assignee: Chang Sung Ace Co., Ltd.Inventors: Yeu Yong Lee, Jung-Jae Im
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Patent number: 8349623Abstract: A method for manufacturing a thin film photoelectric conversion module comprising the steps of: (A) forming a plurality of divided strings by dividing a string, in which thin film photoelectric conversion elements provided by sequentially laminating a first electrode layer, a photoelectric conversion layer and a second electrode layer on the surface of an insulating substrate are electrically connected in series, into a plurality of strings by dividing grooves, electrically insulating and separating the first electrode layer and the second electrode layer one from the other and extending in a serial connection direction; and (B) performing reverse biasing by applying a reverse bias voltage to each of thin film photoelectric conversion elements of the divided string.Type: GrantFiled: August 1, 2008Date of Patent: January 8, 2013Assignee: Sharp Kabushiki KaishaInventors: Shinsuke Tachibana, Takanori Nakano
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Patent number: 8319508Abstract: A leak in a membrane on top of a horizontal roof deck is located by applying conductive wires on the membrane underneath the aggregate in a grid pattern. A measuring and switching circuit generates voltage having a positive attached to the roof deck and a negative attached to the wires. The circuit has a relay for each wire which can be switched between a current sensor system and the negative potential. The sensor system is arranged to sense at each of the wires in turn the current flowing from the roof deck through any leak in the membrane to the wire. A micro-processor operates the relays in turn to connect all the other wires to the negative as a shield while each wire is sensed. From the output of the grid the changes in current in the x and y directions are analyzed to locate the leak in the membrane.Type: GrantFiled: December 23, 2009Date of Patent: November 27, 2012Assignee: Detec Systems LLCInventor: David E. Vokey
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Patent number: 8314622Abstract: A detection membrane (11) is joined to a first surface (10a) of an electrolyte membrane (10), and hydrogen gas is supplied to a second surface (10b) thereof. If the electrolyte membrane has a defect (10c), hydrogen gas leaks to the first surface, resulting in a change in electric resistance of the detection membrane near the defect. The defect is recognized by this change. FA hydrogen electrode (14) is joined to the second surface, and an electric circuit (17) is connected between the detection membrane and the hydrogen electrode. Hydrogen gas supplied to a space facing the hydrogen electrode is ionized at the hydrogen electrode, and hydrogen ions permeates through the electrolyte membrane and hydrogenates the detection membrane. Whether or not hydrogen ion conductivity is uniform is examined by measuring electric resistance of the detection membrane, which varies depending on the amount of hydrogen ions, for each of regions.Type: GrantFiled: July 3, 2008Date of Patent: November 20, 2012Assignee: Kabushiki Kaisha AsumitecInventor: Naoki Uchiyama
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Patent number: 8310243Abstract: A system and associated methods for acquiring and analyzing LEIS data from a buried structure, such as a pipeline. A special probe having adjustable electrodes is placed in the soil above the structure. A voltage is applied to the structure, causing more current to emanate from a coating defect than from intact coating. The probe electrodes acquire a response signal, which is analyzed to detect the defect.Type: GrantFiled: August 10, 2010Date of Patent: November 13, 2012Assignee: Southwest Research InstituteInventors: Pavan K. Shukla, Todd S. Mintz, Biswajit Dasgupta, Jay L. Fisher, Osvaldo Pensado-Rodriguez
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Patent number: 8305096Abstract: An apparatus and method for measuring and monitoring layer properties in web-based processes are described. The apparatus includes multiple electrode devices adjacently positioned on a surface of a web material, which advances with a predetermined speed. The electrode devices perform measurements of electrical parameters of a layer of the web material and provide an electrical signal to a layer deposition system for further adjustment of layer properties of the layer.Type: GrantFiled: October 30, 2006Date of Patent: November 6, 2012Assignee: Hewlett-Packard Development Company, L.P.Inventors: Warren Jackson, Carl Taussig
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Patent number: 8228078Abstract: A method for monitoring and detecting coating defects in a defined section of a coated underground or underwater pipeline provided with a monitoring unit fixedly mounted by sections and at the end of the respective section and an apparatus used in the method.Type: GrantFiled: July 25, 2006Date of Patent: July 24, 2012Assignee: EUPEC Pipeline Services España, S.A.U.Inventors: Carlos Herraez, Alvaro Aballe
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Patent number: 8183879Abstract: The invention relates to a measuring arrangement, a semiconductor arrangement and a method for operating a reference source, wherein at least one semiconductor component and a voltage source are connected to a measuring unit and the measuring unit provides a measured value that is proportional to the number of defects.Type: GrantFiled: March 6, 2009Date of Patent: May 22, 2012Assignee: Infineon Technologies AGInventors: Ralf Brederlow, Roland Thewes
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Patent number: 8154380Abstract: Sensor mount assemblies and sensor assemblies are provided. In an embodiment, by way of example only, a sensor mount assembly includes a busbar, a main body, a backing surface, and a first finger. The busbar has a first end and a second end. The main body is overmolded onto the busbar. The backing surface extends radially outwardly relative to the main body. The first finger extends axially from the backing surface, and the first finger has a first end, a second end, and a tooth. The first end of the first finger is disposed on the backing surface, and the tooth is formed on the second end of the first finger.Type: GrantFiled: October 31, 2008Date of Patent: April 10, 2012Assignee: GM Global Technology Operations LLCInventor: David H. Miller
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Patent number: 8111081Abstract: The present invention is a method for evaluating a silicon wafer by measuring, after fabricating a MOS capacitor by forming an insulator film and one or more electrodes sequentially on a silicon wafer, a dielectric breakdown characteristic of the insulator film by applying an electric field from the electrodes thus formed to the insulator film, the method in which the silicon wafer is evaluated at least by setting an area occupied by all the electrodes thus formed to 5% or more of an area of a front surface of the silicon wafer when the one or more electrodes are formed. This provides an evaluation method that can detect a defect by a simple method such as the TDDB method with the same high degree of precision as that of the DSOD method.Type: GrantFiled: December 14, 2007Date of Patent: February 7, 2012Assignee: Shin-Etsu Handotai Co., Ltd.Inventor: Hisayuki Saito
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Method to detect and locate a breach in vertical or horizontal intersections in a membrane of a roof
Patent number: 7847560Abstract: A defect in a horizontal or vertical seam at the edge of a roof membrane is detected by applying a DC voltage between the roof deck a probe in the form of a flexible wetted sponge and wiping the sponge probe over the seams. The current to the probe is detected and indicated to the operator so that the operator may determine a maximum current at the defect. The receiver provides an audible signal emitter to the operator and includes a calibration circuit arranged to automatically maintain, despite changes in voltage applied between the roof deck and the peripheral conductor, a “0” set calibration point so as to indicate at the calibration point when zero difference in voltage is detected. Conductors can be applied to the membrane to define an area to be tested within the conductors.Type: GrantFiled: February 13, 2008Date of Patent: December 7, 2010Assignee: Detec Systems LLC.Inventor: David E. Vokey -
Patent number: 7821247Abstract: A system for measuring a voltage differential in a current-carrying pipe using a propulsion vehicle for conveying the system inside the pipe, the system including a first contact for maintaining electrical contact with the pipe as the vehicle moves through the pipe; a second contact positioned in a spaced apart relationship from the first contact for maintaining electrical contact with the pipe as the vehicle moves through the pipe; and an AC voltage reading device connected to the first contact and the second contact for measuring the AC voltage between the first contact and the second contact as the vehicle moves through the pipe.Type: GrantFiled: December 20, 2007Date of Patent: October 26, 2010Assignee: Shell Oil CompanyInventors: Rasheed Kolawole Fagbayi, Mark Wilson Mateer, Bernardus Franciscus Maria Pots, Paul Kevin Scott
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Patent number: 7819283Abstract: A strip ejection system for holding and ejecting a strip is provided. The system includes a body and a strip movement section. The strip moving section includes all elements of the system that are involved with moving the strip, including a pressing element for pressing against the strip to move the strip from a first position to a second position. The pressing element is the only element of the strip movement section that is movable relative to the body.Type: GrantFiled: February 17, 2005Date of Patent: October 26, 2010Assignee: Universal Biosensors Pty LtdInventors: Garry Chambers, Alastair Hodges, David Sayer
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Publication number: 20100225497Abstract: A cementitious compound provides a brittle undercoat for making a surface-mounted crack sensor on a surface. A low percent elongation and low tensile strength of the cementitious compound have proven valuable in ensuring that cracks in the underlying surface are transmitted through the undercoat so that a trace of conductive ink or paint on the undercoat more reliably detects the crack.Type: ApplicationFiled: September 20, 2006Publication date: September 9, 2010Applicant: NATIONAL RESEARCH COUNCIL OF CANADAInventor: Anton Marincak
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Publication number: 20100225341Abstract: An apparatus, system and method for detecting defects in building structures is provided. The apparatus includes a detector operable to determine an indication of the defect; and a transmitter operable to wirelessly transmit the indication from the apparatus to a central controller. The system includes the detection unit; a locator operable to determine the location of the detection unit; and a memory for storing the indication and the location in association with each other. The memory may be part of a central controller in wireless communication with the detection unit. The apparatus or central controller may include a processor operable to determine from a plurality of measurements performed by the detection unit a resultant measurement vector indicating a direction from the detection unit toward the defect. The detection unit may be operable to autonomously change its location. A display showing resultant measurement vectors at various locations can be produced.Type: ApplicationFiled: March 3, 2010Publication date: September 9, 2010Applicant: SMT Research Ltd.Inventors: Alistair C. BURROWS, Chris BUZUNIS, Geoffrey CHEN, Gregory P. JAMAN, Stephen LIAO, Gamal K. MUSTAPHA, Ryan RAMCHANDAR, Jason G. TEETAERT
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Patent number: 7786736Abstract: Methods and structural defect detectors for detecting a structural defect in composites are presented. An exemplary method includes forming a nanocomposite including a plurality of nanotubes mechanically aligned in a principal direction within a polymer matrix. A voltage is applied to the nanocomposite and a resistance of the nanocomposite is measured using the applied voltage to detect the structural defect. An exemplary structural defect detector includes a nanocomposite including a plurality of mechanically aligned nanotubes within the polymer matrix, electrodes coupled to the nanocomposite, a voltage source for applying a voltage to the electrodes, and a resistance detector for measuring a resistance of the nanocomposite that allows identification of a structural defect. The plurality of nanotubes form a conducting percolating network of sensors.Type: GrantFiled: October 2, 2007Date of Patent: August 31, 2010Assignee: University of DelawareInventors: Erik T. Thostenson, Tsu-Wei Chou
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Patent number: 7772590Abstract: The present disclosure relates to a metal comb structure including a first comb which includes a first set of metal fingers each of the metal fingers being connected at one end thereof by a connecting member from which the metal fingers extend. The metal comb structure also includes a second comb which includes a first set of metal fingers inter-digitated with the metal fingers of the first comb, a first set of vias associated with the metal fingers of the second comb and a connecting member connected to the vias thereby connecting the metal fingers of the second comb. The vias extend from the metal fingers of the second comb such that the connecting member of the second comb is located outside a plane defined by the metal fingers of the first and second combs.Type: GrantFiled: March 5, 2007Date of Patent: August 10, 2010Assignee: Systems on Silicon Manufacturing Co. Pte. Ltd.Inventor: Hing Poh Kuan
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Patent number: 7750643Abstract: Processes and systems for detecting surface anomalies in components generally includes contacting a surface of the component with a detection apparatus, wherein the detection apparatus includes at least one post, a wire extending from the post and a sensor in operative communication the wire; and sensing the surface anomaly as an increase in resistance of the wire across the surface.Type: GrantFiled: October 30, 2007Date of Patent: July 6, 2010Assignee: General Electric CompanyInventor: Curtis Wayne Rose
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Patent number: 7701231Abstract: An apparatus, system, and method are disclosed for detecting cracking in a particulate filter. The method may include providing an apparatus comprising an aftertreatment device with a substrate and a substrate surface, a conductive material forming a conduction path bonded to the surface of the substrate surface, and access points configured to allow a resistance measurement of the conduction path. The method may include measuring the resistance of the conduction path, and determining if one or more cracks have occurred on the substrate surface based on the resistance measurement. The method may further include labeling the degradation level of the aftertreatment device based on the indicated amount of cracking, and replacing the aftertreatment device with an equivalent aftertreatment device, based on the degradation level, after a service event.Type: GrantFiled: March 20, 2007Date of Patent: April 20, 2010Assignee: Cummins Filtration IP, IncInventors: Thomas M. Yonushonis, Randall J. Stafford, Edgar Lara-Curzio, Amit Shyam
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Patent number: 7683796Abstract: An open-wire detection system and method includes a current transmitter that can be connected to one or more wires, wherein the current transmitter provides a minimum current and/or a current that is greater than the minimum current. An anti-aliasing filter is connected to an analog-to-digital converter, such that the anti-aliasing filter receives the minimum current provided by the current transmitter and provides an output signal to the analog-to-digital converter. A noise filter is generally connected to an open-wire threshold detector, wherein the noise filter and the open-wire threshold detector permit detection of input levels below the minimum current provided by the current transmitter. An output from the open-wire threshold detector can be sampled multiple times at intervals that correlate with a frequency of a plurality of digital signals to produce sampled data, such that if the sampled data is below the minimum current, one or more of the wires (e.g.Type: GrantFiled: October 4, 2006Date of Patent: March 23, 2010Assignee: Honeywell International Inc.Inventors: Benjamin J. Stad, Sudhir Thalore
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Publication number: 20100045311Abstract: In the two-probe case, a detector circuit to detect stress or damage in an object may include a first electrode to be positioned on the object, a second electrode to be positioned on the object, a current circuit to measure the current to the first electrode, a voltage circuit to generate a voltage for the first electrode, a controller circuit to determine and record the changing impedance between the first electrode and a second electrode.Type: ApplicationFiled: August 20, 2008Publication date: February 25, 2010Inventor: Jaycee Howard Chung
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Publication number: 20100039127Abstract: A method and system for assessment of a pipe (110) is provided. The system can include a probe (100) having first (120) and second (130) electrodes and a processor (200) in communication with the probe (100). The probe (100) can be in a medium (140) proximate to a section of the pipe (110) to be analyzed. The section of the pipe (110) can have a coating (115) thereon. The processor (200) can measure a difference in potential between the first (120) and second (130) electrodes. The processor (200) can determine a local impedance with respect to the section of the pipe (110) based at least in part on the difference in potential. The processor (200) can evaluate a condition of the coating (115) on the section of the pipe (110) based at least in part on the local impedance or a parameter derived from the local impedance.Type: ApplicationFiled: January 3, 2008Publication date: February 18, 2010Applicant: University of Florida Research Foundation, IncInventor: Mark E. Orazem
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Patent number: 7616014Abstract: A method and apparatus for measuring a pulsed I-V characteristic of a DUT that has a signal terminal and a return terminal includes connecting a pulse unit between the signal and return terminals, the pulse unit having a pulse source and a pulsed current measuring device; pulsing the signal terminal with the pulse unit; measuring a pulsed current through the signal terminal with the current measuring device in response to the pulsing; and outputting, storing, displaying, or otherwise using the current measurement.Type: GrantFiled: February 8, 2007Date of Patent: November 10, 2009Assignee: Keithley Instruments, Inc.Inventor: Gregory Sobolewski
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Patent number: 7602196Abstract: A defect in a roof membrane is detected by applying a DC voltage between the roof deck and a perimeter conductor and using a detection probe pair to provide a signal indicative of the differences in voltage detected by the pair of probes so as to allow the operator to locate the defect by moving the probes to different locations. The probes are mounted on a rigid common frame such that the probe pair has a fixed separation and the frame includes a handle portion which allows ready manipulation of the frame carrying the probes by the operator. The receiver provides an audible signal emitter to the operator and includes a calibration circuit arranged to automatically maintain, despite changes in voltage applied between the roof deck and the peripheral conductor, a “0” set calibration point so as to indicate at the calibration point when zero difference in voltage is detected.Type: GrantFiled: January 28, 2008Date of Patent: October 13, 2009Assignee: Detec Systems Inc.Inventor: David E. Vokey
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Patent number: 7554345Abstract: A leak in a membrane on top of a horizontal roof deck is located by a manually operable carriage which is swept over the upper surface of the membrane on the roof deck. A measuring and switching circuit generates a voltage having a positive attached to the roof deck and a negative attached to conductive brushes on the carriage. The brushes are arranged to form an outer peripheral contact with an inner contact inside the outer contact. Thus the presence of a leak is detected by the outer set of conductive brushes at distance from the leak and by the inner conductive brush when directly over the leakage site.Type: GrantFiled: December 3, 2007Date of Patent: June 30, 2009Assignee: Detec Systems LLCInventor: David E. Vokey
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Publication number: 20090108856Abstract: An apparatus, system, and method are disclosed for detecting cracking in a particulate filter. The method may include providing an apparatus comprising an aftertreatment device with a substrate and a substrate surface, a conductive material forming a conduction path bonded to the surface of the substrate surface, and access points configured to allow a resistance measurement of the conduction path. The method may include measuring the resistance of the conduction path, and determining if one or more cracks have occurred on the substrate surface based on the resistance measurement. The method may further include labeling the degradation level of the aftertreatment device based on the indicated amount of cracking, and replacing the aftertreatment device with an equivalent aftertreatment device, based on the degradation level, after a service event.Type: ApplicationFiled: March 20, 2007Publication date: April 30, 2009Inventors: Thomas M. Yonushonis, Randall J. Stafford, Edgar Lara-Curzio, Amit Shyam
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Patent number: 7525324Abstract: A method for inspecting a piezoelectric element includes first-inspection-signal application step of applying to the piezoelectric element a first inspection signal Vp(1) having a first predetermined voltage waveform; first-characteristic-value measurement step of measuring, as a first characteristic value, an electrical characteristic value of the piezoelectric element after application of the first inspection signal; second-inspection-signal application step of applying to the piezoelectric element a second inspection signal Vp(2) having a second predetermined voltage waveform and an electrical power greater than that of the first inspection signal; second-characteristic-value measurement step of measuring, as a second characteristic value, the electrical characteristic value of the piezoelectric element after application of the second inspection signal; and anomaly determination step of determining whether or not the piezoelectric element is anomalous on the basis of a value corresponding to the differenceType: GrantFiled: September 17, 2007Date of Patent: April 28, 2009Assignee: NGK Insulators, Ltd.Inventors: Takao Ohnishi, Tomohiro Yamada, Takatoshi Nehagi
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Patent number: 7479237Abstract: The present invention relates to a method of fabricating a vertical probe head, whereas the vertical probe head is formed by the combination of at least a probe, a bottom guide plate and a top guide plate having at least a hole matching the probe. The probe is fabricated by a LIGA-like process combining with the processes of photolithography, etching and electroforming, and so on, so that the probe is equipped with comparatively better precision, strength and reliability and yet can be custom-made for satisfying various demands. In addition, both the top and bottom guide plates are made by a means of non-mechanical machining, which respectively is fabricated by processing a substrate using means of photolithography, etching and mask so as to fabricate holes for matching with the aforesaid probe.Type: GrantFiled: December 20, 2006Date of Patent: January 20, 2009Assignee: Industrial Technology Research InstituteInventors: Jiu-Shu Tsai, Min-Chieh Chou, Fuh-Yu Chang
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Patent number: 7319418Abstract: A method of transmitting data from a sensor (1) to a receiver (4) in which each original data word is split in positional fashion into at least two separate short data words (MSN, LSN). The separate short data words (MSN, LSN) are each converted by digital-to-analog conversion (15) into an analog pseudosignal and transmitted in a multiplex mode via an output of the sensor and a transmission path (3) to the receiver (4). In the receiver, the analog pseudosignals are converted back into short data words (MSN, LSM) and joined together in correct bit sequence by means of an analog-to-digital converter (15), so that the resulting data word corresponds to the original word.Type: GrantFiled: February 14, 2005Date of Patent: January 15, 2008Assignee: Micronas GmbHInventor: Hans-Joerg Fink