To Detect A Flaw Or Defect Patents (Class 324/718)
  • Patent number: 10036823
    Abstract: A method for monitoring and early warning of structural collapse, having following steps of: installing at least one electric field sensor in a monitoring area, wherein the at least one electric field sensor is used for measuring an electric field signal of the monitoring area; receiving the electric field signal and applying a signal analysis to the electric field signal; and issuing a warning signal when a critical transition feature occurs in the electric field signal to which the signal analysis is applied.
    Type: Grant
    Filed: June 6, 2016
    Date of Patent: July 31, 2018
    Assignee: National Central University
    Inventors: Chien-Chih Chen, Yi-Heng Li
  • Patent number: 9621421
    Abstract: A computer-implemented method for prognostic network management may include (1) monitoring a health indicator of a physical component of a device in a network, (2) using the health indicator to estimate a remaining useful life of the physical component, (3) detecting that the remaining useful life of the physical component has reached a predetermined threshold, and (4) reconfiguring the network in response to detecting that the remaining useful life of the physical component has reached the predetermined threshold so that failure of the physical component does not cause the network to become unavailable to any user of the network. Various other methods, systems, and computer-readable media are also disclosed.
    Type: Grant
    Filed: June 30, 2014
    Date of Patent: April 11, 2017
    Assignee: Juniper Networks, Inc.
    Inventors: Elmer Tolentino, Graham S Pritchard, Steven Keck, Jayesh Champaneri, Dharini Hiremagalur
  • Patent number: 9018958
    Abstract: An apparatus for measuring electrical parameters for an electrical system measures a first and second parameters of the electrical system between connections to the electrical system. A processor determines a third electrical parameter of the electrical system as a function of the first parameter and the second parameter. Wireless communication is provided between components of the apparatus.
    Type: Grant
    Filed: October 19, 2011
    Date of Patent: April 28, 2015
    Assignee: Midtronics, Inc.
    Inventor: Kevin I. Bertness
  • Patent number: 8928339
    Abstract: A structure is described that includes a first faying surface, a second faying surface for creating an electrical bond with the first faying surface, and a sensor operatively placed proximate the first faying surface and the second faying surface. The sensor includes a current port for injecting a fixed current through the electrical bond, a voltage port for sensing a voltage across the electrical bond induced by the fixed current, a processing device programmed to determine a resistance of the electrical bond based on the fixed current and sensed voltage, and a wireless interface for transmitting at least one of the sensed voltage and the determined resistance to an external device.
    Type: Grant
    Filed: October 29, 2010
    Date of Patent: January 6, 2015
    Assignee: The Boeing Company
    Inventors: Jason P. Bommer, Andrew M. Robb, Stephen Lee Fahley
  • Patent number: 8846448
    Abstract: The present disclosure relates to a tool arrangement and method to reduce warpage within a package-on-package semiconductor structure, while minimizing void formation within an electrically-insulating adhesive which couples the packages. A pressure generator and a variable frequency microwave source are coupled to a process chamber which encapsulates a package-on-package semiconductor structure. The package-on-package semiconductor structure is simultaneously heated by the variable frequency microwave source at variable frequency, variable temperature, and variable duration and exposed to an elevated pressure by the pressure generator. This combination for microwave heating and elevated pressure limits the amount of warpage introduced while preventing void formation within an electrically-insulating adhesive which couples the substrates of the package-on-package semiconductor structure.
    Type: Grant
    Filed: August 10, 2012
    Date of Patent: September 30, 2014
    Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
    Inventors: Meng-Tse Chen, Wei-Hung Lin, Kuei-Wei Huang, Tsai-Tsung Tsai, Ai-Tee Ang, Ming-Da Cheng, Chung-Shi Liu
  • Patent number: 8822993
    Abstract: An Integrated Circuit (IC) and a method of making the same. In one embodiment, an integrated circuit includes: a substrate; a first metal layer disposed on the substrate and including a sensor structure configured to indicate a crack in a portion of the integrated circuit; and a second metal layer disposed proximate the first metal layer, the second metal layer including a wire component disposed proximate the sensor structure.
    Type: Grant
    Filed: July 17, 2012
    Date of Patent: September 2, 2014
    Assignee: International Business Machines Corporation
    Inventors: Edward C. Cooney, III, Jeffrey P. Gambino, Zhong-Xiang He, Tom C. Lee
  • Patent number: 8810255
    Abstract: An in-situ system for detecting damage in an electrically conductive wire. The system includes a substrate at least partially covered by a layer of electrically conductive material forming a continuous or non-continuous electrically conductive layer connected to an electrical signal generator adapted to delivering electrical signals to the electrically conductive layer. Data is received and processed to identify damage to the substrate or electrically conductive layer. The electrically conductive material may include metalized carbon fibers, a thin metal coating, a conductive polymer, carbon nanotubes, metal nanoparticles or a combination thereof.
    Type: Grant
    Filed: July 26, 2010
    Date of Patent: August 19, 2014
    Assignee: The United States of America as Represented by the Administrator of the National Aeronautics and Space Administration
    Inventors: Martha K. Williams, Luke B. Roberson, Lanetra C. Tate, Trent M. Smith, Tracy L. Gibson, Scott T. Jolley, Pedro J. Medelius
  • Patent number: 8679862
    Abstract: A method for manufacturing a thin film photoelectric conversion module includes the steps of forming a plurality of photoelectric conversion elements connected in series on a substrate, and carrying out reverse bias processing simultaneously on a group of photoelectric conversion elements including a plurality of the photoelectric conversion elements positioned with one or a plurality of the photoelectric conversion elements interposed between each of them, by applying a plurality of voltages electrically isolated from one another to the group of photoelectric conversion elements.
    Type: Grant
    Filed: January 28, 2009
    Date of Patent: March 25, 2014
    Assignee: Sharp Kabushiki Kaisha
    Inventor: Shinsuke Tachibana
  • Patent number: 8617410
    Abstract: A method for inspecting semiconductor wafers patterned by a photomask includes loading a first wafer and scanning a first image of the first wafer, loading a second wafer and scanning a second image of the second wafer, comparing the first and second images, and classifying a difference detected between the first and second images as a potential defect on the photomask. The potential defect includes a haze defect on the photomask.
    Type: Grant
    Filed: October 13, 2011
    Date of Patent: December 31, 2013
    Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
    Inventors: Chang-Cheng Hung, Tsai-Sheng Gau
  • Patent number: 8593153
    Abstract: A system and method for detecting damage in an electrical wire, including delivering at least one test electrical signal to an outer electrically conductive material in a continuous or non-continuous layer covering an electrically insulative material layer that covers an electrically conductive wire core. Detecting the test electrical signals in the outer conductive material layer to obtain data that is processed to identify damage in the outer electrically conductive material layer.
    Type: Grant
    Filed: July 26, 2010
    Date of Patent: November 26, 2013
    Assignee: The United States of America as Represented by the United States National Aeronautics and Space Administration
    Inventors: Pedro J. Medelius, Tracy L. Gibson, Mark E. Lewis
  • Patent number: 8593164
    Abstract: In one general aspect, an apparatus can include a block defining a temperature control channel therethrough and a defining a sample chamber. The apparatus can also include an electrode disposed inside of the block such that the sample chamber is fluidically isolated from the temperature control channel by the electrode. The electrode can be configured to receive a signal from an impedance analyzer during a dielectric spectroscopy experiment related to a sample included in the sample chamber.
    Type: Grant
    Filed: October 15, 2010
    Date of Patent: November 26, 2013
    Assignee: Brigham Young University (BYU)
    Inventors: Satyan Chandra, Brian Anthony Mazzeo
  • Patent number: 8587327
    Abstract: A device for use with a conduit having a first conduit end and a conduit second end, into which conduit a cable can be installed using a flow of air into the first conduit end, the device being suitable for confirming that the air is flowing out from the second conduit end. In an embodiment, the device includes a housing, means to enable connection of the device to the second conduit end, a detector arranged to detect an electrical property change, and an actuator for causing an electrical property change detectable by the detector, wherein in use, the air flowing into the device causes the detector and the actuator to move relative to each other, causing an electrical property change detectable by the detector.
    Type: Grant
    Filed: December 23, 2008
    Date of Patent: November 19, 2013
    Assignee: British Telecommunications Public Limited Company
    Inventors: David John Taylor Heatley, Philip Alfred Barker, Ian Neild
  • Patent number: 8552717
    Abstract: It is an object of the present invention to provide an eddy current testing apparatus capable of accurately detecting any flaws occurring in a columnar or cylindrical subject to be tested regardless of their extending directions, with the use of the same probe coil. The eddy current testing apparatus 100 according to the present invention comprises a spinning plate 1 and a probe coil 2 disposed on the spinning plate 1. The probe coil is a probe coil capable of obtaining a differential output about a scanning direction of a detection signal which corresponds to a detected eddy current induced in the subject to be tested. The spinning plate is disposed in such a position that a spinning center RC of the spinning plate faces with an axial center PC of the subject to be tested.
    Type: Grant
    Filed: March 17, 2008
    Date of Patent: October 8, 2013
    Assignee: Nippon Steel & Sumitomo Metal Corporation
    Inventors: Shigetoshi Hyodo, Yoshiyuki Nakao
  • Patent number: 8513941
    Abstract: A power detection regulation device including a power detection signal generator, a power state detector and a regulated output unit is disclosed. The power detection signal generator receives the input power from an external power supply and generates a power detection signal. The power state detector generates a power state signal based on the power state derived from the power detection signal. The regulated output unit receives the power state signal and generates a driving signal to an external electrical device in accordance with the feedback signal from the external electrical device. The power state signal is provided for the external electrical element to perform relevant processes, and the regulated output device can output the predetermined driving signal on receiving the power state signal indicating some abnormal situation in the input power so as to maintain the normal operation performed by the actuating element in the external electrical device.
    Type: Grant
    Filed: July 30, 2011
    Date of Patent: August 20, 2013
    Assignee: Inno-Tech Co., Ltd.
    Inventors: Ting-Chin Tsen, Shu-Chia Lin, Wen-Yueh Hsieh
  • Patent number: 8482309
    Abstract: A failure detecting method for a solar power generation system having plural solar cell strings in each of which plural solar cell modules are connected to each other in series. Specifically, by comparing the current value of each of the solar cell modules or strings with the average current value per one module or string, calculated from the total current value of the entire solar cell modules or strings, one or more failure candidates can be detected with high precision.
    Type: Grant
    Filed: February 19, 2010
    Date of Patent: July 9, 2013
    Assignee: Onamba Co., Ltd.
    Inventors: Yukitaka Miyata, Jun Ishida, Osamu Shizuya
  • Patent number: 8415967
    Abstract: A wafer inspection apparatus that performs surface inspection and internal inspection of solar cells using a single apparatus. The wafer inspection apparatus includes a loading unit configured to allow a cassette to be lifted up or lowered by an elevator. A surface inspection unit includes a plurality of stages, thus performing surface inspection of each wafer using a first vision module. A wafer transfer unit has a rotatably installed center portion and has both ends provided with adsorption parts. An internal inspection unit is configured such that a conveyor is installed to allow the wafer to be transferred, thus performing internal inspection of the transferred wafer through a second vision module. An unloading unit enables wafers having completed the internal inspection to be sequentially loaded onto the unloading unit. A control unit controls a series of wafer inspection procedures.
    Type: Grant
    Filed: July 15, 2010
    Date of Patent: April 9, 2013
    Assignee: Chang Sung Ace Co., Ltd.
    Inventors: Yeu Yong Lee, Jung-Jae Im
  • Patent number: 8349623
    Abstract: A method for manufacturing a thin film photoelectric conversion module comprising the steps of: (A) forming a plurality of divided strings by dividing a string, in which thin film photoelectric conversion elements provided by sequentially laminating a first electrode layer, a photoelectric conversion layer and a second electrode layer on the surface of an insulating substrate are electrically connected in series, into a plurality of strings by dividing grooves, electrically insulating and separating the first electrode layer and the second electrode layer one from the other and extending in a serial connection direction; and (B) performing reverse biasing by applying a reverse bias voltage to each of thin film photoelectric conversion elements of the divided string.
    Type: Grant
    Filed: August 1, 2008
    Date of Patent: January 8, 2013
    Assignee: Sharp Kabushiki Kaisha
    Inventors: Shinsuke Tachibana, Takanori Nakano
  • Patent number: 8319508
    Abstract: A leak in a membrane on top of a horizontal roof deck is located by applying conductive wires on the membrane underneath the aggregate in a grid pattern. A measuring and switching circuit generates voltage having a positive attached to the roof deck and a negative attached to the wires. The circuit has a relay for each wire which can be switched between a current sensor system and the negative potential. The sensor system is arranged to sense at each of the wires in turn the current flowing from the roof deck through any leak in the membrane to the wire. A micro-processor operates the relays in turn to connect all the other wires to the negative as a shield while each wire is sensed. From the output of the grid the changes in current in the x and y directions are analyzed to locate the leak in the membrane.
    Type: Grant
    Filed: December 23, 2009
    Date of Patent: November 27, 2012
    Assignee: Detec Systems LLC
    Inventor: David E. Vokey
  • Patent number: 8314622
    Abstract: A detection membrane (11) is joined to a first surface (10a) of an electrolyte membrane (10), and hydrogen gas is supplied to a second surface (10b) thereof. If the electrolyte membrane has a defect (10c), hydrogen gas leaks to the first surface, resulting in a change in electric resistance of the detection membrane near the defect. The defect is recognized by this change. FA hydrogen electrode (14) is joined to the second surface, and an electric circuit (17) is connected between the detection membrane and the hydrogen electrode. Hydrogen gas supplied to a space facing the hydrogen electrode is ionized at the hydrogen electrode, and hydrogen ions permeates through the electrolyte membrane and hydrogenates the detection membrane. Whether or not hydrogen ion conductivity is uniform is examined by measuring electric resistance of the detection membrane, which varies depending on the amount of hydrogen ions, for each of regions.
    Type: Grant
    Filed: July 3, 2008
    Date of Patent: November 20, 2012
    Assignee: Kabushiki Kaisha Asumitec
    Inventor: Naoki Uchiyama
  • Patent number: 8310243
    Abstract: A system and associated methods for acquiring and analyzing LEIS data from a buried structure, such as a pipeline. A special probe having adjustable electrodes is placed in the soil above the structure. A voltage is applied to the structure, causing more current to emanate from a coating defect than from intact coating. The probe electrodes acquire a response signal, which is analyzed to detect the defect.
    Type: Grant
    Filed: August 10, 2010
    Date of Patent: November 13, 2012
    Assignee: Southwest Research Institute
    Inventors: Pavan K. Shukla, Todd S. Mintz, Biswajit Dasgupta, Jay L. Fisher, Osvaldo Pensado-Rodriguez
  • Patent number: 8305096
    Abstract: An apparatus and method for measuring and monitoring layer properties in web-based processes are described. The apparatus includes multiple electrode devices adjacently positioned on a surface of a web material, which advances with a predetermined speed. The electrode devices perform measurements of electrical parameters of a layer of the web material and provide an electrical signal to a layer deposition system for further adjustment of layer properties of the layer.
    Type: Grant
    Filed: October 30, 2006
    Date of Patent: November 6, 2012
    Assignee: Hewlett-Packard Development Company, L.P.
    Inventors: Warren Jackson, Carl Taussig
  • Patent number: 8228078
    Abstract: A method for monitoring and detecting coating defects in a defined section of a coated underground or underwater pipeline provided with a monitoring unit fixedly mounted by sections and at the end of the respective section and an apparatus used in the method.
    Type: Grant
    Filed: July 25, 2006
    Date of Patent: July 24, 2012
    Assignee: EUPEC Pipeline Services España, S.A.U.
    Inventors: Carlos Herraez, Alvaro Aballe
  • Patent number: 8183879
    Abstract: The invention relates to a measuring arrangement, a semiconductor arrangement and a method for operating a reference source, wherein at least one semiconductor component and a voltage source are connected to a measuring unit and the measuring unit provides a measured value that is proportional to the number of defects.
    Type: Grant
    Filed: March 6, 2009
    Date of Patent: May 22, 2012
    Assignee: Infineon Technologies AG
    Inventors: Ralf Brederlow, Roland Thewes
  • Patent number: 8154380
    Abstract: Sensor mount assemblies and sensor assemblies are provided. In an embodiment, by way of example only, a sensor mount assembly includes a busbar, a main body, a backing surface, and a first finger. The busbar has a first end and a second end. The main body is overmolded onto the busbar. The backing surface extends radially outwardly relative to the main body. The first finger extends axially from the backing surface, and the first finger has a first end, a second end, and a tooth. The first end of the first finger is disposed on the backing surface, and the tooth is formed on the second end of the first finger.
    Type: Grant
    Filed: October 31, 2008
    Date of Patent: April 10, 2012
    Assignee: GM Global Technology Operations LLC
    Inventor: David H. Miller
  • Patent number: 8111081
    Abstract: The present invention is a method for evaluating a silicon wafer by measuring, after fabricating a MOS capacitor by forming an insulator film and one or more electrodes sequentially on a silicon wafer, a dielectric breakdown characteristic of the insulator film by applying an electric field from the electrodes thus formed to the insulator film, the method in which the silicon wafer is evaluated at least by setting an area occupied by all the electrodes thus formed to 5% or more of an area of a front surface of the silicon wafer when the one or more electrodes are formed. This provides an evaluation method that can detect a defect by a simple method such as the TDDB method with the same high degree of precision as that of the DSOD method.
    Type: Grant
    Filed: December 14, 2007
    Date of Patent: February 7, 2012
    Assignee: Shin-Etsu Handotai Co., Ltd.
    Inventor: Hisayuki Saito
  • Patent number: 7847560
    Abstract: A defect in a horizontal or vertical seam at the edge of a roof membrane is detected by applying a DC voltage between the roof deck a probe in the form of a flexible wetted sponge and wiping the sponge probe over the seams. The current to the probe is detected and indicated to the operator so that the operator may determine a maximum current at the defect. The receiver provides an audible signal emitter to the operator and includes a calibration circuit arranged to automatically maintain, despite changes in voltage applied between the roof deck and the peripheral conductor, a “0” set calibration point so as to indicate at the calibration point when zero difference in voltage is detected. Conductors can be applied to the membrane to define an area to be tested within the conductors.
    Type: Grant
    Filed: February 13, 2008
    Date of Patent: December 7, 2010
    Assignee: Detec Systems LLC.
    Inventor: David E. Vokey
  • Patent number: 7821247
    Abstract: A system for measuring a voltage differential in a current-carrying pipe using a propulsion vehicle for conveying the system inside the pipe, the system including a first contact for maintaining electrical contact with the pipe as the vehicle moves through the pipe; a second contact positioned in a spaced apart relationship from the first contact for maintaining electrical contact with the pipe as the vehicle moves through the pipe; and an AC voltage reading device connected to the first contact and the second contact for measuring the AC voltage between the first contact and the second contact as the vehicle moves through the pipe.
    Type: Grant
    Filed: December 20, 2007
    Date of Patent: October 26, 2010
    Assignee: Shell Oil Company
    Inventors: Rasheed Kolawole Fagbayi, Mark Wilson Mateer, Bernardus Franciscus Maria Pots, Paul Kevin Scott
  • Patent number: 7819283
    Abstract: A strip ejection system for holding and ejecting a strip is provided. The system includes a body and a strip movement section. The strip moving section includes all elements of the system that are involved with moving the strip, including a pressing element for pressing against the strip to move the strip from a first position to a second position. The pressing element is the only element of the strip movement section that is movable relative to the body.
    Type: Grant
    Filed: February 17, 2005
    Date of Patent: October 26, 2010
    Assignee: Universal Biosensors Pty Ltd
    Inventors: Garry Chambers, Alastair Hodges, David Sayer
  • Publication number: 20100225497
    Abstract: A cementitious compound provides a brittle undercoat for making a surface-mounted crack sensor on a surface. A low percent elongation and low tensile strength of the cementitious compound have proven valuable in ensuring that cracks in the underlying surface are transmitted through the undercoat so that a trace of conductive ink or paint on the undercoat more reliably detects the crack.
    Type: Application
    Filed: September 20, 2006
    Publication date: September 9, 2010
    Applicant: NATIONAL RESEARCH COUNCIL OF CANADA
    Inventor: Anton Marincak
  • Publication number: 20100225341
    Abstract: An apparatus, system and method for detecting defects in building structures is provided. The apparatus includes a detector operable to determine an indication of the defect; and a transmitter operable to wirelessly transmit the indication from the apparatus to a central controller. The system includes the detection unit; a locator operable to determine the location of the detection unit; and a memory for storing the indication and the location in association with each other. The memory may be part of a central controller in wireless communication with the detection unit. The apparatus or central controller may include a processor operable to determine from a plurality of measurements performed by the detection unit a resultant measurement vector indicating a direction from the detection unit toward the defect. The detection unit may be operable to autonomously change its location. A display showing resultant measurement vectors at various locations can be produced.
    Type: Application
    Filed: March 3, 2010
    Publication date: September 9, 2010
    Applicant: SMT Research Ltd.
    Inventors: Alistair C. BURROWS, Chris BUZUNIS, Geoffrey CHEN, Gregory P. JAMAN, Stephen LIAO, Gamal K. MUSTAPHA, Ryan RAMCHANDAR, Jason G. TEETAERT
  • Patent number: 7786736
    Abstract: Methods and structural defect detectors for detecting a structural defect in composites are presented. An exemplary method includes forming a nanocomposite including a plurality of nanotubes mechanically aligned in a principal direction within a polymer matrix. A voltage is applied to the nanocomposite and a resistance of the nanocomposite is measured using the applied voltage to detect the structural defect. An exemplary structural defect detector includes a nanocomposite including a plurality of mechanically aligned nanotubes within the polymer matrix, electrodes coupled to the nanocomposite, a voltage source for applying a voltage to the electrodes, and a resistance detector for measuring a resistance of the nanocomposite that allows identification of a structural defect. The plurality of nanotubes form a conducting percolating network of sensors.
    Type: Grant
    Filed: October 2, 2007
    Date of Patent: August 31, 2010
    Assignee: University of Delaware
    Inventors: Erik T. Thostenson, Tsu-Wei Chou
  • Patent number: 7772590
    Abstract: The present disclosure relates to a metal comb structure including a first comb which includes a first set of metal fingers each of the metal fingers being connected at one end thereof by a connecting member from which the metal fingers extend. The metal comb structure also includes a second comb which includes a first set of metal fingers inter-digitated with the metal fingers of the first comb, a first set of vias associated with the metal fingers of the second comb and a connecting member connected to the vias thereby connecting the metal fingers of the second comb. The vias extend from the metal fingers of the second comb such that the connecting member of the second comb is located outside a plane defined by the metal fingers of the first and second combs.
    Type: Grant
    Filed: March 5, 2007
    Date of Patent: August 10, 2010
    Assignee: Systems on Silicon Manufacturing Co. Pte. Ltd.
    Inventor: Hing Poh Kuan
  • Patent number: 7750643
    Abstract: Processes and systems for detecting surface anomalies in components generally includes contacting a surface of the component with a detection apparatus, wherein the detection apparatus includes at least one post, a wire extending from the post and a sensor in operative communication the wire; and sensing the surface anomaly as an increase in resistance of the wire across the surface.
    Type: Grant
    Filed: October 30, 2007
    Date of Patent: July 6, 2010
    Assignee: General Electric Company
    Inventor: Curtis Wayne Rose
  • Patent number: 7701231
    Abstract: An apparatus, system, and method are disclosed for detecting cracking in a particulate filter. The method may include providing an apparatus comprising an aftertreatment device with a substrate and a substrate surface, a conductive material forming a conduction path bonded to the surface of the substrate surface, and access points configured to allow a resistance measurement of the conduction path. The method may include measuring the resistance of the conduction path, and determining if one or more cracks have occurred on the substrate surface based on the resistance measurement. The method may further include labeling the degradation level of the aftertreatment device based on the indicated amount of cracking, and replacing the aftertreatment device with an equivalent aftertreatment device, based on the degradation level, after a service event.
    Type: Grant
    Filed: March 20, 2007
    Date of Patent: April 20, 2010
    Assignee: Cummins Filtration IP, Inc
    Inventors: Thomas M. Yonushonis, Randall J. Stafford, Edgar Lara-Curzio, Amit Shyam
  • Patent number: 7683796
    Abstract: An open-wire detection system and method includes a current transmitter that can be connected to one or more wires, wherein the current transmitter provides a minimum current and/or a current that is greater than the minimum current. An anti-aliasing filter is connected to an analog-to-digital converter, such that the anti-aliasing filter receives the minimum current provided by the current transmitter and provides an output signal to the analog-to-digital converter. A noise filter is generally connected to an open-wire threshold detector, wherein the noise filter and the open-wire threshold detector permit detection of input levels below the minimum current provided by the current transmitter. An output from the open-wire threshold detector can be sampled multiple times at intervals that correlate with a frequency of a plurality of digital signals to produce sampled data, such that if the sampled data is below the minimum current, one or more of the wires (e.g.
    Type: Grant
    Filed: October 4, 2006
    Date of Patent: March 23, 2010
    Assignee: Honeywell International Inc.
    Inventors: Benjamin J. Stad, Sudhir Thalore
  • Publication number: 20100045311
    Abstract: In the two-probe case, a detector circuit to detect stress or damage in an object may include a first electrode to be positioned on the object, a second electrode to be positioned on the object, a current circuit to measure the current to the first electrode, a voltage circuit to generate a voltage for the first electrode, a controller circuit to determine and record the changing impedance between the first electrode and a second electrode.
    Type: Application
    Filed: August 20, 2008
    Publication date: February 25, 2010
    Inventor: Jaycee Howard Chung
  • Publication number: 20100039127
    Abstract: A method and system for assessment of a pipe (110) is provided. The system can include a probe (100) having first (120) and second (130) electrodes and a processor (200) in communication with the probe (100). The probe (100) can be in a medium (140) proximate to a section of the pipe (110) to be analyzed. The section of the pipe (110) can have a coating (115) thereon. The processor (200) can measure a difference in potential between the first (120) and second (130) electrodes. The processor (200) can determine a local impedance with respect to the section of the pipe (110) based at least in part on the difference in potential. The processor (200) can evaluate a condition of the coating (115) on the section of the pipe (110) based at least in part on the local impedance or a parameter derived from the local impedance.
    Type: Application
    Filed: January 3, 2008
    Publication date: February 18, 2010
    Applicant: University of Florida Research Foundation, Inc
    Inventor: Mark E. Orazem
  • Patent number: 7616014
    Abstract: A method and apparatus for measuring a pulsed I-V characteristic of a DUT that has a signal terminal and a return terminal includes connecting a pulse unit between the signal and return terminals, the pulse unit having a pulse source and a pulsed current measuring device; pulsing the signal terminal with the pulse unit; measuring a pulsed current through the signal terminal with the current measuring device in response to the pulsing; and outputting, storing, displaying, or otherwise using the current measurement.
    Type: Grant
    Filed: February 8, 2007
    Date of Patent: November 10, 2009
    Assignee: Keithley Instruments, Inc.
    Inventor: Gregory Sobolewski
  • Patent number: 7602196
    Abstract: A defect in a roof membrane is detected by applying a DC voltage between the roof deck and a perimeter conductor and using a detection probe pair to provide a signal indicative of the differences in voltage detected by the pair of probes so as to allow the operator to locate the defect by moving the probes to different locations. The probes are mounted on a rigid common frame such that the probe pair has a fixed separation and the frame includes a handle portion which allows ready manipulation of the frame carrying the probes by the operator. The receiver provides an audible signal emitter to the operator and includes a calibration circuit arranged to automatically maintain, despite changes in voltage applied between the roof deck and the peripheral conductor, a “0” set calibration point so as to indicate at the calibration point when zero difference in voltage is detected.
    Type: Grant
    Filed: January 28, 2008
    Date of Patent: October 13, 2009
    Assignee: Detec Systems Inc.
    Inventor: David E. Vokey
  • Patent number: 7554345
    Abstract: A leak in a membrane on top of a horizontal roof deck is located by a manually operable carriage which is swept over the upper surface of the membrane on the roof deck. A measuring and switching circuit generates a voltage having a positive attached to the roof deck and a negative attached to conductive brushes on the carriage. The brushes are arranged to form an outer peripheral contact with an inner contact inside the outer contact. Thus the presence of a leak is detected by the outer set of conductive brushes at distance from the leak and by the inner conductive brush when directly over the leakage site.
    Type: Grant
    Filed: December 3, 2007
    Date of Patent: June 30, 2009
    Assignee: Detec Systems LLC
    Inventor: David E. Vokey
  • Publication number: 20090108856
    Abstract: An apparatus, system, and method are disclosed for detecting cracking in a particulate filter. The method may include providing an apparatus comprising an aftertreatment device with a substrate and a substrate surface, a conductive material forming a conduction path bonded to the surface of the substrate surface, and access points configured to allow a resistance measurement of the conduction path. The method may include measuring the resistance of the conduction path, and determining if one or more cracks have occurred on the substrate surface based on the resistance measurement. The method may further include labeling the degradation level of the aftertreatment device based on the indicated amount of cracking, and replacing the aftertreatment device with an equivalent aftertreatment device, based on the degradation level, after a service event.
    Type: Application
    Filed: March 20, 2007
    Publication date: April 30, 2009
    Inventors: Thomas M. Yonushonis, Randall J. Stafford, Edgar Lara-Curzio, Amit Shyam
  • Patent number: 7525324
    Abstract: A method for inspecting a piezoelectric element includes first-inspection-signal application step of applying to the piezoelectric element a first inspection signal Vp(1) having a first predetermined voltage waveform; first-characteristic-value measurement step of measuring, as a first characteristic value, an electrical characteristic value of the piezoelectric element after application of the first inspection signal; second-inspection-signal application step of applying to the piezoelectric element a second inspection signal Vp(2) having a second predetermined voltage waveform and an electrical power greater than that of the first inspection signal; second-characteristic-value measurement step of measuring, as a second characteristic value, the electrical characteristic value of the piezoelectric element after application of the second inspection signal; and anomaly determination step of determining whether or not the piezoelectric element is anomalous on the basis of a value corresponding to the difference
    Type: Grant
    Filed: September 17, 2007
    Date of Patent: April 28, 2009
    Assignee: NGK Insulators, Ltd.
    Inventors: Takao Ohnishi, Tomohiro Yamada, Takatoshi Nehagi
  • Patent number: 7479237
    Abstract: The present invention relates to a method of fabricating a vertical probe head, whereas the vertical probe head is formed by the combination of at least a probe, a bottom guide plate and a top guide plate having at least a hole matching the probe. The probe is fabricated by a LIGA-like process combining with the processes of photolithography, etching and electroforming, and so on, so that the probe is equipped with comparatively better precision, strength and reliability and yet can be custom-made for satisfying various demands. In addition, both the top and bottom guide plates are made by a means of non-mechanical machining, which respectively is fabricated by processing a substrate using means of photolithography, etching and mask so as to fabricate holes for matching with the aforesaid probe.
    Type: Grant
    Filed: December 20, 2006
    Date of Patent: January 20, 2009
    Assignee: Industrial Technology Research Institute
    Inventors: Jiu-Shu Tsai, Min-Chieh Chou, Fuh-Yu Chang
  • Patent number: 7319418
    Abstract: A method of transmitting data from a sensor (1) to a receiver (4) in which each original data word is split in positional fashion into at least two separate short data words (MSN, LSN). The separate short data words (MSN, LSN) are each converted by digital-to-analog conversion (15) into an analog pseudosignal and transmitted in a multiplex mode via an output of the sensor and a transmission path (3) to the receiver (4). In the receiver, the analog pseudosignals are converted back into short data words (MSN, LSM) and joined together in correct bit sequence by means of an analog-to-digital converter (15), so that the resulting data word corresponds to the original word.
    Type: Grant
    Filed: February 14, 2005
    Date of Patent: January 15, 2008
    Assignee: Micronas GmbH
    Inventor: Hans-Joerg Fink
  • Patent number: 7317308
    Abstract: A system for measuring a voltage differential in a current-carrying pipe using a propulsion vehicle for conveying the system inside the pipe. The system includes a first contact for maintaining electrical contact with the pipe as the vehicle moves through the pipe, a second contact positioned in a spaced apart relationship from the first contact for maintaining electrical contact with the pipe as the vehicle moves through the pipe, and a voltage reading device connected to the first contact and the second contact for measuring the voltage between the first contact and the second contact as the vehicle moves through the pipe.
    Type: Grant
    Filed: July 28, 2006
    Date of Patent: January 8, 2008
    Assignee: Shell Oil Company
    Inventors: Rasheed Kolawole Fagbayi, Mark Wilson Mateer, Bernardus Franciscus Maria Pots, Paul Kevin Scott
  • Patent number: 7292054
    Abstract: An impedance measuring apparatus includes a plurality of RF (radio frequency) probes; a plurality of rotation mechanisms coupled to the plurality of RF probes, respectively; a processing unit, and a mechanical controller. The mechanical controller controls the plurality of rotation mechanisms and the plurality of RF probes to measure package RF signals between terminals formed on a package substrate. The processing unit measures calibration RF signals between terminals formed on at least one calibration substrate; determines RF impedances of the package substrate from the package RF signals and phase differences corresponding to a thickness of the package substrate and distances between the terminals on the package substrate from the calibration RF signals, and calibrates the RF impedances based on the phase differences.
    Type: Grant
    Filed: March 17, 2006
    Date of Patent: November 6, 2007
    Assignee: NEC Electronics Corporation
    Inventor: Ryuichi Oikawa
  • Patent number: 7274194
    Abstract: Methods and apparatuses to repair defects in a circuit, such as during or subsequent to the manufacture of the circuit. Defects may be detected through, for example, optical processing of an acquired image of the circuit or by measuring the strength of a signal emitted across a pair of conductor plates. If defects are detected, conductive particles may be applied to the circuit to correct the detected defects.
    Type: Grant
    Filed: March 17, 2006
    Date of Patent: September 25, 2007
    Assignee: Lexmark International, Inc.
    Inventors: Frank Edward Anderson, Elios Klemo, Bryan Dale McKinley, George Nelson Woolcott
  • Patent number: 7242201
    Abstract: Provided is an apparatus for concurrently detecting a defect occurring in a heat exchanger tube and a geometric transition of the heat exchanger tube. The apparatus for detecting the state of a heat exchanger tube, including: the first detection unit detecting a defect of the heat exchanger tube; and the second detection unit detecting a geometric transition of the heat exchanger tube, in which the first detection unit and the second detection unit are disposed at the same circumferential position of a cylindrical body separately, installed to have a certain distance in the lengthwise direction of the cylindrical body, and inserted inside the heat exchanger tube. According to the present invention, not only a defect but also the type of geometric transition, which may accelerate the initiation and growth of a defect, is identified and the size of the geometric transition is concurrently measured, thereby improving the reliability in early detection of a defect.
    Type: Grant
    Filed: November 1, 2005
    Date of Patent: July 10, 2007
    Assignees: Korea Atomic Energy Research Institute, Korea Hydro & Nuclear Power Co., Ltd.
    Inventors: Deok Hyun Lee, Myung Sik Choi, Do Haeng Hur, Jung Ho Han
  • Patent number: 7185545
    Abstract: Instrumentation for monitoring crack growth using a change in electric potential across a starter crack as the crack propagates is disclosed. The instrumentation includes a specimen of a material to be analyzed for crack growth propagation having a surface with a starter crack formed therein, a plurality of current leads to pass electric current through the specimen, a layer of insulating material disposed on each of opposite sides of the crack, a layer of conductive material disposed on each layer of insulating material, where a portion of each layer of conductive material is in electrical contact with the first specimen surface, and a pair of sensing leads, one sensing lead attached to each layer of conductive material. A method for using the instrumentation to monitor crack growth by measuring is also disclosed.
    Type: Grant
    Filed: December 29, 2004
    Date of Patent: March 6, 2007
    Assignee: General Electric Company
    Inventor: Philemon Kennard Wright, III
  • Patent number: 7186484
    Abstract: A measurement mark (3) for determining the relative positional accuracy of a progressive projection onto a wafer (5), the projection being performed with two masks (3, 4), comprising two structure elements (10, 20) formed on a respective one of the masks (1, 2). The structure elements (10, 20) overlap with regard to their position on the masks so that, during the projection of the second structure element (20), an electrically conductive structure (30) formed on the basis of the first structure element on the wafer (5) is overformed by removal of a portion (31). In an electrical line width measurement, the reduced width (CD, CD30a) of the structure (30) is measured and compared either with the original width (62) or with that width (CD30b) of a further partial element (30b) produced by the overforming.
    Type: Grant
    Filed: September 24, 2004
    Date of Patent: March 6, 2007
    Assignee: Infineon Technologies AG
    Inventors: Heiko Hommen, Jens Stäcker, Maria de la Piedad Fernandez-Martinez, Jens Uwe Bruch, Thorsten Schedel