Abstract: A system for inspection of electrical circuits, which electrical circuits include a multiplicity of conductors which are mutually spaced from each other, the system including a voltage driver operative to apply different electrical voltages to a plurality of conductors from among the multiplicity of conductors, which plurality of conductors are in spatial propinquity to each other, a sensor operative to sense at least one characteristic of a test region defined thereby with respect to the electrical circuits, the sensor lacking sufficient spatial resolution to distinguish between the locations of individual ones of the plurality of conductors and a defect indicator responsive to at least one output of the sensor for ascertaining whether a defect exists in the plurality of conductors.

Abstract: A test apparatus of a liquid crystal display is provided, which includes a heating platform, a temperature control box, a tubular assembly, a photoelectric detector assembly and a shutter assembly. An upper surface of the heating platform is provided with a heating area. An opening is defined in a top of the temperature control box. The tubular assembly is connected to the temperature control box around the opening. The shutter assembly is disposed within the tubular assembly. The photoelectric detector assembly is disposed on a top of the tubular assembly and faces toward to the temperature control box.

Abstract: A thermal gradient is induced in a device-under-test (DUT) and used to determine the location of a defect. In one embodiment, a static thermal gradient is induced across at least a portion of the DUT along a first axis. The thermal gradient is incrementally walked along the first axis until the condition associated with the defect is triggered, thereby defining a first region. The thermal gradient is then induced along a second axis of the DUT and the process is repeated to define a second region. The location of the defect is determined to be the intersection of the first region with the second region.

Abstract: An apparatus for electrical impedance imaging has electrodes arranged on an electrode carrier in an arrangement including a unit of repetition. The unit of repetition repeats over the electrode carrier and has an angle of rotational symmetry less than 90°. Specifically, the unit of repetition is an equilateral triangle or a hexagon.

Abstract: A method for identifying EMI sources in a system having a plurality of electrical components connected together by cables wherein each set of two electrical components connected by a cable forms a potential EMI source. A plurality of antennas are positioned around the vehicle and the EMI from each antenna is measured over a plurality of frequencies and the frequencies having an EMI greater than a predetermined threshold and a measurement profile of the received EMI versus the antennas for each of the identified frequencies is created. EMI reception is then simulated for each potential EMI source and a simulation profile of the received EMI versus the antennas is plotted for each potential EMI source. The actual source of the EMI is then identified by comparing the measurement profile with the simulation profile for the potential EMI sources at each frequency to determine a match of the profiles.

Abstract: An apparatus for determining a type of an electromagnetic wave generating source, including: a measurement unit that measures electromagnetic field strength at first and second measurement points at vertically different respective distances from a main surface of an object to be measured; a calculation unit that calculates an attenuation amount of the electromagnetic field strength between the first and second measurement points using measured values of the electromagnetic field strength measured by the measurement unit; and a determination unit that determines whether the generating source is the electric current source or the magnetic current source by judging which one of a reference value of an electric current source and a reference value of a magnetic current source is close to a value of the attenuation amount calculated by the calculation unit.

Abstract: A light source for injecting excess carriers into a semiconductor wafer, fully illuminating a surface of the wafer. According to the disclosed embodiments, the source includes at least one set of point sources which are spaced apart at regular intervals along the X and Y axes, such that the source emits a monochromatic beam of a size that is at least equal to that of the semiconductor wafer surface to be illuminated. Each of the point sources is sinusoidally modulated by a common electrical modulator, the distance between two point sources and the distance between the source and the semiconductor wafer surface to be illuminated being selected such that the monochromatic light beam uniformly illuminates the surface.

Abstract: There are provided an inspection apparatus and method that can locally perform sample temperature regulation, so that the sample drift can be suppressed. There are included a sample stage 109 that holds a semiconductor sample 118, multiple probes 106 used to measure electrical characteristics of a semiconductor device on the semiconductor sample 118, a power source that applies voltage and/or current to the probe 106, a detector that measures electrical characteristics of the semiconductor device on the sample with which the probe is brought into contact, and an electromagnetic wave irradiating mechanism that irradiates electromagnetic wave on a measurement section of the semiconductor sample 118.

Abstract: Systems and methods to stir an electromagnetic (EM) field of an EM reverberation chamber are disclosed. A particular system includes an EM reverberation chamber. The system also includes a transmit antenna and a receive antenna operable to generate an EM field within the EM reverberation chamber. The system further includes a variable charged particle source to stir the EM field by varying introduction of charged particles into the EM field.