Abstract: A magnetic sensor packaging structure with a hysteresis coil comprising a substrate, a sensor chip, a spiral hysteresis coil on the substrate, and wire bonding pads. The sensor bridge arms are composed of magnetoresistive sensing elements. The sensor bridge arms are deposited on the sensor chip, and the sensor bridge arms are electrically interconnected to form a magnetoresistive sensor bridge that is located on the hysteresis coil. The magnetic field generated by the spiral hysteresis coil is collinear with a sensitive axis of the sensor bridge. The magnetoresistive sensor bridge is located on the substrate and encapsulated. By placing the spiral hysteresis coil on the substrate, it is capable of supporting larger currents with smaller resistance value. This allows the sensor hysteresis to be effectively eliminated. In addition, the packaging structure manufacturing process is simple and cost effective.

Abstract: An example welding-type system includes: processing circuitry; and a machine readable storage medium comprising a machine readable instruction, when executed by the processing circuitry, cause the processing circuitry to: control a first switch to disconnect a motor circuit from a motor power source, the motor circuit comprising a wire feed motor and a second switch; control the second switch to permit current to flow while the first switch disconnects the motor circuit from the motor power source during a test period; and in response to feedback indicative of a current through the motor circuit while the first switch is open and the second switch is closed, detecting a fault condition associated with the motor circuit.

Abstract: A method of determining an equivalent source associated with a device under test by an over-the-air test (OTA) test system is described. The OTA test system includes an analysis circuit and at least one measurement antenna. The method includes the steps of: conducting, by the at least one measurement antenna, at least two sets of measurements of electromagnetic waves emitted by the device under test, thereby generating measurement signals associated with the electromagnetic waves; determining, by the analysis circuit, at least one radiation parameter of the device under test based on the measurement signals, wherein the at least one radiation parameter is associated with the electromagnetic waves emitted by the device under test; and determining, by the analysis circuit, an equivalent source on a Huygens surface based on the at least one determined radiation parameter, wherein the equivalent source is associated with the device under test.

Abstract: The processing device includes: a temperature transition acquisition unit that acquires rising transition of the temperature of the winding in a state in which a first voltage is applied in order to raise a temperature of the winding to a first temperature and further acquires falling transition of the temperature of the winding in a state in which a second voltage is applied in order to lower the temperature of the winding to a second temperature that is lower than the first temperature after the temperature of the winding converges to the first temperature; and a decision unit that calculates stator-related parameters on the basis of the falling transition to decide a stator temperature characteristic mode and further calculates winding-related parameters on the basis of the rising transition and a stator temperature characteristic model to decide a winding temperature characteristic model.

Abstract: A magnetic field sensing device includes first magnetoresistor units, second magnetoresistor units, a first testing conductive line, a second testing conductive line, and a driver. The first magnetoresistor units are arranged in a first direction. The second magnetoresistor units are arranged in the first direction, and the second magnetoresistor units are disposed on a side of the first magnetoresistor units in a second direction. The first testing conductive line is disposed on a side of the first magnetoresistor units in a third direction, and extends in the first direction. The second testing conductive line is disposed on a side of the second magnetoresistor units in the third direction, and extends in the first direction. The driver is configured to make two currents in a same direction and two currents in opposite directions pass through the first testing conductive line and the second testing conductive line at different times, respectively.

Abstract: A single flux quantum (SFQ) circuit can include a combinational logic network, which can include a set of SFQ logic cells. The SFQ circuit can also include an SFQ sequencing circuit, which can be used to generate delayed versions of clock pulses to clock the set of SFQ logic cells.

Abstract: A light-on module testing device, a method for testing a light-on module and a method for testing a display panel are disclosed. The light-on module testing device includes a base, a support element disposed on the base, and a test platform disposed on the base, wherein an arm is disposed on the support element, and the arm is configured to fix a light-on module to be tested, and a tester is disposed on the test platform and the tester has a signal output end.

Abstract: In accordance with exemplary embodiments, rotor temperature estimation is provided for estimating rotor temperatures of an electric motor in an electric vehicle. A method comprises estimating a rotor temperature in a controller for an electric motor of a vehicle using a fast-mode rotor temperature estimator for a time interval, and then deactivating the fast-mode rotor temperate estimator after the time interval and activating a normal-mode rotor temperature estimator in the controller for the electric motor of the vehicle. A system comprises an electric motor, a resistance rotor temperature estimator including a limit value limiting a temperature estimate increase for temperature estimates, and a controller for the electric motor, which uses the temperature estimate and is configured to temporarily increase the limit value of the resistance rotor temperature estimator providing a fast-mode rotor temperature estimate.

Abstract: A testing device for testing electric conductors includes a probe configured to measure a magnetic field caused by a current in one or more electric conductors of a device under testing (DUT). An output generator configured to generate output data, wherein the output data depend on the measured magnetic field.

Abstract: Apparatus and method for contactless testing a closed loop electrical connection in particular suited for testing the interconnection of photovoltaic cells in a solar pane. The apparatus comprises two coils. The first coil is a driving coil (11) comprising at least one first winding (15) for generating a varying magnetic field in the area (14) enclosed by the closed loop electrical connection. The second coil is a detection coil (12) comprising at least one second winding (16) for generating a voltage when being subjected to the magnetic field generated by the current in the closed loop electrical connection. The apparatus further comprises a compensation loop (13) for intrinsically compensating the direct mutual induction of the first coil and the second coil. The compensation loop allows the use of uncomplicated electronics for testing the interconnection, which electronics can easily be implemented in a hand held device.

Abstract: The invention relates to a contactless measuring system having at least one test probe forming part of a coupling structure for the contactless decoupling of a signal running on a signal waveguide, wherein the signal waveguide is designed as a conductor of the electric circuit on a circuit board and as part of an electric circuit. To this end, at least one contact structure is configured and disposed on the circuit board such that said contact structure is galvanically separated from the signal waveguide, forms part of the coupling structure, is displaced completely within the near field of the signal waveguide, and has at least one contact point, which may be electrically contacted by a contact of the test probe.

Abstract: A magnetic sensor inspection apparatus has a rectangular frame including a stage, a probe card, and a plurality of magnetic field generating coils. A wafer-like array of magnetic sensors is mounted on the stage, which is movable in horizontal and vertical directions. The probe card includes a plurality of probes which are brought into contact with a plurality of magnetic sensors encompassed in a measurement area. The magnetic field generating coils are driven to generate a magnetic field toward the stage. A plurality of magnetic field environment measuring sensors is arranged in the peripheral portion of the probe card surrounding the probes. A magnetic field controller controls magnetic fields generated by the magnetic field generating coils based on the measurement result of the magnetic field environment measuring sensors. Thus, it is possible to concurrently inspect a wafer-like array of magnetic sensors with the probe card.

Abstract: Disclosed are a method and an apparatus of near field scan calibration, and more particularly, a method and an apparatus for near field scan calibration for calibrating a characteristic of an antenna for near field scan measurement of a semiconductor chip. The apparatus for near field scan calibration includes: a plane-type text fixture having a plane shape; an antenna positioned spaced apart from the plane-type test fixture by a set spacing distance and acquiring data including a magnetic field; and a spectrum analyzer analyzing the data acquired by the antenna.

Abstract: Disclosed herein is a semiconductor integrated circuit capable of detecting an abnormality that can cause a malfunction in signal transmission via an isolation element and of issuing a stop signal to the target to be controlled. The semiconductor integrated circuit includes a transmission circuit generating and outputting a transmission signal reflecting transmission data supplied from outside, a reception circuit reproducing the transmission data based on a reception signal, an isolation element isolating the transmission circuit from the reception circuit and transmitting the transmission signal as the reception signal, an abnormality detection part detecting an abnormality that can cause a malfunction in signal transmission via the isolation element, and a control part outputting a stop signal if the abnormality detection part detects the abnormality, regardless of the transmission data supplied to the transmission circuit from outside.

Abstract: High-frequency resonance method is used to measure magnetic parameters of magnetic thin film stacks that show magnetoresistance including MTJs and giant magnetoresistance spin valves. The thin film sample can be unpatterned. Probe tips are electrically connected to the surface of the film (or alternatively one probe tip can be punched into the thin film stack) and voltage measurements are taken while injecting high frequency oscillating current between them to cause a change in electrical resistance when one of the layers in the magnetic film stack changes direction. A measured resonance curve can be determined from voltages at different current frequencies. The damping, related to the width of the resonance curve peak, is determined through curve fitting. In embodiments of the invention a variable magnetic field is also applied to vary the resonance frequency and extract the magnetic anisotropy and/or magnetic saturation of the magnetic layers.

Abstract: A planar magnetic field probe is provided. The planar magnetic field probe increases the sensitivity of magnetic field intensity detection by using a left multi-sensor loop and a right multi-sensor loop formed by a first patterned metal layer and a second patterned metal layer, and decreases the electric field noise coupling by surrounding the left multi-sensor loop and the right multi-sensor loop with a symmetrical shielding metal structure formed by a first patterned shielding metal layer, a second patterned shielding metal layer and a plurality of through vias.

Abstract: Provided is a magnetic sensor device capable of suppressing a variation in determination for detection or canceling of a magnetic field intensity, which is caused by noise generated from respective constituent elements included in the magnetic sensor device and external noise, to thereby achieve high-precision magnetic reading. The magnetic sensor device includes: a first D-type flip-flop and a second D-type flip-flop each having an input terminal connected to an output terminal of a comparator; an XOR circuit having a first input terminal and a second input terminal which are connected to an output terminal of the first D-type flip-flop and an output terminal of the second D-type flip-flop, respectively; a selector circuit; and a third D-type flip-flop having an input terminal connected to an output terminal of the selector circuit.

Abstract: A detector detects an electromagnetic wave having a frequency of 0.01 THz?f?100 THz and transmitted through a device under test (DUT). A changer changes a relative position of an intersection of an optical path of the electromagnetic wave and the DUT, with respect to the DUT. A deriver derives a characteristic value of the electromagnetic wave based on a detection result of the detector, while the characteristic value is associated with an assumed relative position, which is the relative position if the electromagnetic wave is not refracted by the DUT. A corrector changes the assumed relative position to an actual relative position, which is the relative position if the refraction of the electromagnetic wave by the DUT is considered. A corrected deriver derives the characteristic value associated with a predetermined relative position based on an output from the corrector.

Abstract: An apparatus for determining a type of an electromagnetic wave generating source, including: a measurement unit that measures electromagnetic field strength at first and second measurement points at vertically different respective distances from a main surface of an object to be measured; a calculation unit that calculates an attenuation amount of the electromagnetic field strength between the first and second measurement points using measured values of the electromagnetic field strength measured by the measurement unit; and a determination unit that determines whether the generating source is the electric current source or the magnetic current source by judging which one of a reference value of an electric current source and a reference value of a magnetic current source is close to a value of the attenuation amount calculated by the calculation unit.

Abstract: The present invention restrains adverse effects caused by refraction of a terahertz wave by a device under test when the terahertz wave is fed to the device under test for measurement. A container 10 contains at least part of a device under test 1 to be measured by a terahertz wave measurement device. The container 10 includes a gap portion 11 that internally arranges at least a part of the device under test 1, and an enclosure portion 12 that includes a first curved surface portion S1, and a second curved surface portion S2, and arranges the gap portion 11 between the first curved surface portion S1 and the second curved surface portion S2, thereby enclosing the gap portion 11. Moreover, a relationship n1<n2 holds where n2 is the refractive index of the enclosure portion, and n1 is the refractive index of the device under test. Further, both the first curved surface portion S1 and the second curved surface portion S2 are convex surfaces.

Abstract: A method for altering an impedance of a conductive pathway on a microelectronic package includes applying a magnetic field to the conductive pathway. The microelectronic package may be, for example, a printed circuit board. The method also includes controlling a magnitude of the magnetic field at the conductive pathway for altering the impedance of the conductive pathway. The magnetic field may be applied by, for example, an electromagnet or a permanent magnet. A magnetic field may also be applied for simulating crosstalk effects on a conductive pathway.

Abstract: A measuring apparatus includes a measuring body and a probe device. The probe device includes a dome-shaped metal shield, a probe, and a cable. The metal shield defines an opening in a bottom of the shield. The probe is mounted inside the metal shield. A first end of the cable is connected to the probe, and a second end of the cable passes through a top of the metal shield and then is connected to the measuring body.