Abstract: Provided is a spectrum analysis system that measures a signal component at each frequency of an input signal, comprising a sampling section that samples the input signal at prescribed bandwidths to digitize the input signal, and outputs a resulting digital output signal; a converting section that converts the digital output signal from the sampling section into the signal component at each frequency of a unit bandwidth; and an output section that (i) outputs the digital output signal output by the sampling section when a frequency span, which is a frequency range in which the measurement result of the signal component at each frequency of the input signal is output, is greater than or equal to a predetermined reference bandwidth and (ii) outputs the signal component at each frequency converted by the converting section when the frequency span is less than the predetermined reference bandwidth.

Abstract: A system for phonon spectroscopy for attaining a phonon spectrum of a sample of a material. Current may be injected into the material to result in electrical noise in the material. The electrical noise may be processed to result in information revealing a phonon spectrum of the material. The phonon spectrum may be useful for analyzing and monitoring various features of the material. Other information about the material may be obtained from the electrical noise.

Abstract: A testing method or apparatus utilizes multiple frequencies applied to a device under test for measuring newly discovered frequency modulation effects. An embodiment may include a lower frequency signal with a smaller amplitude higher frequency signal to test a dynamic change in frequency response, gain, and or phase. This dynamic test can reveal frequency modulation effects. Another embodiment may include the use of a multiple frequency signal to dynamically induce a time varying phase or frequency distortion for the device that has differential phase distortion. The device's output is then measured with an FM detector to measure a shift in one of the frequencies used in the test signal or to measure frequency modulation effects of any signals, including distortion products, from the device.

Abstract: A method for determining input tones required to produce a desired output includes the step of extracting a linearization of a spectral map representing a device under test (DUT) that i) is under drive of a large signal having one or more fundamental frequencies with associated amplitudes and phases, and ii) produces an approximation of a desired output having at least one unwanted spectral component. The method includes the further step of using an inverse of the extracted linearization to determine the input tones required to produce the desired output under a given load condition.

Abstract: Parametric measurement of first- and second-generation telecommunications equipment has been relatively straightforward. The evolution to more complex transmission schemes such as those proposed for third-generation (3G) telecommunications devices can employ the subject methods and apparatus and apply AM-PM test procedures to a multicarrier amplifier RF environment to properly characterize the parametric performance of these transmission systems, particularly those operating in a multicarrier environment.

Abstract: A frequency characteristic measuring apparatus capable of measuring a frequency characteristic of a device under test in which the frequency of an input signal and the frequency of an output signal differ from each other, capable of simplifying the configuration of a tracking generator and peripheral circuits associated with the tracking generator, and capable of simultaneously measuring the characteristics of the input signal and the output signal of the device under test.

Abstract: There is provided a method that includes (a) acquiring a first spectral component of a single noise pulse on a power line, and a second spectral component of the single noise pulse, (b) determining that the single noise pulse is synchronous with a power voltage on the power line, (c) determining a first magnitude of the first spectral component, (d) determining a second magnitude of the second spectral component, and (e) determining a condition of the power line from the first and second magnitudes. There is also provided a system that employs the method.

Abstract: The present invention provides a system for computing the frequency of a low frequency wave. The system includes: a wave producer (3) configured for sending out a first wave with a high frequency; a device (4) configured for sending out a second wave with a low frequency to be computed, the first wave and the second wave interfering with each other thereby producing a third wave; a sensor (2) configured for receiving the third wave; and a computer (1) installed with wave analyzing software and linked with the sensor, and configured for receiving and analyzing the third wave to compute the frequency of the second wave.

Abstract: An electronic component tester characterizes electronic components such as magnetic head/media components measure performance parameters such as signal-to-noise ratio and overwrite evaluation. The electronic component tester has a tester process controller and a spectrum analyzer. The tester process controller generates calibration and control signals for the electronic component tester. The spectrum analyzer is in communication with electronic components such as magnetic head or media components to receive a response characterization signal resulting from a stimulus signal applied to the electronic components. The spectrum analyzer then determines a frequency spectrum of the response characterization signal. The spectrum analyzer is also in communication with the tester process controller for transferring the frequency spectrum to the tester process controller.

Abstract: An apparatus for detecting spectral components in a predetermined frequency band within a signal includes first and second processing devices and first, second, and third connectors tuned to the frequency band. The first processing device includes first, second, and third elements. The second processing device includes fourth, fifth, and sixth elements. The first connector is coupled to the first and fourth elements, the second connector to the second and fifth elements, and the third connector to the third and sixth elements. An apparatus for analyzing spectral components in predetermined frequency bands within a signal includes an input for receiving the signal, a device for isolating a portion of the signal, and frequency detectors coupled in parallel to the device. Each frequency detector corresponds to a frequency band and generates an output signal component corresponding to a proportion of energy of the spectral components detected by the frequency detector.

Abstract: Disclosed is a method of equalization of a vector/signal analyzer including: providing a structured test signal within a selected frequency range, the structured test signal comprising a plurality of frequency components each having a respective amplitude and phase; inputting the test signal to the analyzer; the analyzer operating to condition the test signal; determining information representative of frequency distortion of the conditioned test signal introduced by the analyzer; generating a set of equalization coefficients based on the information representative of the frequency distortion, the set of coefficients corresponding to the selected frequency range; and storing the set of equalization coefficients and the correspondence of the set of coefficients to the selected frequency range.

Abstract: Apparatus and methods are provided to allow multiple, possibly overlapping, regions of interest within a frequency spectrum to be defined, and managed. Each of these regions of interest may be selected for further testing or identification. Unselected regions are allowed to collapse into narrow bars so as not to interfere with the selected region. Multiple rows are provided to allow for the definition and selection of overlapping regions of interest. Furthermore, in some embodiments aid is provided for identifying the signal type by providing a list of signal type candidates based upon such parameters as region of interest bandwidth, region of interest center frequency and geographic location.

Abstract: A vector network analysis system and a method of measuring use offset stimulus signals to stimulate a balanced device under test (DUT) to determine performance parameters. The system includes an offset stimulus source that provides a plurality of stimulus signals and a vector network analyzer. At least one stimulus signal is offset from another stimulus signal of the plurality in one or both of frequency and time-varying phase. The offset stimulus source includes a first signal source and a second signal source that respectively provides the offset stimulus signals. The method of measuring includes generating the offset stimulus signals and applying the offset stimulus signals to a balanced port of the DUT to stimulate the DUT. The performance parameters are determined from measurements of the offset stimulus signals and one or more response signals from the stimulated DUT.

Abstract: A spectrum analyzer is described which comprises a mixer for mixing the conjugate complex input signal v*(t) into a base band signal x(t), and a resolution filter for narrow-band filtering the base band signal. The resolution filter has a complex, discrete impulse response using a variation parameter k0 set to compensate for the frequency overshoot determined by the group delay of the resolution filter.

Abstract: System and method for specifying a signal analysis function. First user input is received, e.g., to a graphical user interface (GUI), indicating a parameter for a first operation implementing at least a portion of the function. The first operation is programmatically included in a sweep loop. Second user input is received specifying a sweep configuration for a sweep on the parameter. The signal includes signal data, e.g., signal plot data or tabular data. The sweep configuration includes: a range of values for the indicated parameter, a number of iterations for the sweep, an interpolation type, step size for the sweep on the indicated parameter, specific values in the range of values for the parameter, source for at least some of the sweep configuration, and/or resultant data. The sweep is performed on the parameter per the sweep configuration, generating resultant data which is stored, and optionally displayed, e.g., in the GUI.

Abstract: A measuring receiver comprises a spectrum analyzer having a local oscillator for sweeping the measurement frequency of the spectrum analyzer through multiple frequency bands. A preselector has multiple filter paths with frequency bands corresponding to frequency bands of the spectrum analyzer. The filter paths for passing signals through the preselector and outputting filtered signals to the spectrum analyzer. Switches of the preselector switch between filter paths to switch in a filter path having a frequency band corresponding to a frequency band being swept by the spectrum analyzer. A controller delays the sweeping of the measurement frequency during intervals when the switches are switching between filter paths.

Abstract: Spectrum analyzer circuits and methods are provided which implement “zero-IF” (direct conversion) or “near-zero IF” (or very low IF) architectures that enable implementation of integrated (on-chip) spectrum analyzers for measuring the frequency spectrum of internal chip signals. An integrated spectrum analyzer circuit, which comprises a zero IF or near-zero IF framework, enables a low-power compact design with sufficient resolution bandwidth for on-chip implementation and diagnostics of internal chip signals.

Abstract: A method, performed by a power sourcing apparatus is provided. The method includes (a) providing an electronic signal to a powered device (PD) over a wire through a circuit device, the circuit device permitting current to flow at pre-determined frequencies, the pre-determined frequencies forming a first set of frequency components, (b) sensing the electronic signal over the wire to detect frequency components present in the electronic signal, the detected frequency components forming a second set of frequency components, and (c) classifying the electronic signal into one of a plurality of classes according to a pattern of frequency components present in the first and second sets. Apparatus for use in conjunction with the method are also provided.

Abstract: To create a broad band spectrometer, a plurality of individual antenna based bolometers are fabricated on the surface of a single spectrometer chip, each bolometer having an individual antenna which is sized differently from all others, thus being responsive to a generally unique frequency of radiation. Each antenna is coupled to a related transistor, which is easily formed using CMOS technology. The antennas are connected to opposite sides of a transistor gate, thus creating a termination resistor for the particular antenna. Multiple outputs from the various antennas are then coupled, thus providing responsiveness to electromagnetic radiation of a very broad spectrum.

Abstract: An apparatus for detecting spectral components in a predetermined frequency band within a signal includes first and second processing devices and first, second, and third connectors tuned to the frequency band. The first processing device includes first, second, and third elements. The second processing device includes fourth, fifth, and sixth elements. The first connector is coupled to the first and fourth elements, the second connector to the second and fifth elements, and the third connector to the third and sixth elements. An apparatus for analyzing spectral components in predetermined frequency bands within a signal includes an input for receiving the signal, a device for isolating a portion of the signal, and frequency detectors coupled in parallel to the device. Each frequency detector corresponds to a frequency band and generates an output signal component corresponding to a proportion of energy of the spectral components detected by the frequency detector.

Abstract: A method for diagnosing the health of a transducer may include transmitting a signal to a transducer to cause the transducer to transmit a stress wave into an object being monitored, wherein the signal has a predetermined frequency range or bandwidth. The method may also include receiving response data for the transducer and transforming the response data to data representative of an impedance curve of impedance versus frequency for the predetermined frequency range. The method may further include extracting selected parameters from the impedance curve to diagnose the health of the transducer.

Abstract: Events discovered by an automatic measurement subsystem in the trace of a DSO are visited using a set of event navigation controls. In a TIME Mode the controls operate to display the first of those events, display the next event after the one currently displayed, display the previous event before the one currently displayed, and, display the last event. In a SEVERITY Mode the controls operate to display the best of those events, display the next best event relative to the one currently displayed, display the next worst event before the one currently displayed, and, display the worst event. The sets of navigation controls may be a mode control menu accompanied by four stylized arrow shaped buttons within a GUI that are clicked on by an operator using a mouse. One set of arrow shaped button can serve both modes, or different sets of buttons can serve each respective mode.

Abstract: An apparatus comprising a housing, a circuit board disposed within the housing, the circuit board further comprising a radio, a processing device, a memory, and a connector suitable for connecting with a port of a computing device. The circuit board is a small form factor circuit board, the radio is suitable for detecting a frequency spectrum and the processing device is suitable for transferring detected frequency spectrum data to the computing device via the connector and interfacing with a display to provide a manipulatable graphical user interface for analyzing the detected frequency spectrum data.

Abstract: A measurement device is provided for measuring a predetermined physical quantity which is contained in the measurement signal over a predetermined measurement range which relates to a specific property for the physical quantity according to the measurement signal which is obtained from an object for measurement so as to display the measurement result as an image in a measurement display which comprises a display range setting section which sets the measurement range, a measurement display generating section which generates the measurement display by using the measurement result in a display range which is set by the measurement range setting section among the measurement result which is measured over the measurement range which is set by the measurement range setting section, and a display section which displays the measurement display which is generated by the measurement display generating section.

Abstract: A synthetic test system for swept-frequency measurements that has a clock synchronization device to enable test boxes and devices that form the synthetic test system to have a common sense of time when conducting swept-frequency tests.

Abstract: Spectrum analyzer circuits and methods are provided which implement “zero-IF” (direct conversion) or “near-zero IF” (or very low IF) architectures that enable implementation of integrated (on-chip) spectrum analyzers for measuring the frequency spectrum of internal chip signals. An integrated spectrum analyzer circuit, which includes a zero IF or near-zero IF framework, enables a low-power compact design with sufficient resolution bandwidth for on-chip implementation and diagnostics of internal chip signals.

Abstract: Parametric measurement of first- and second-generation telecommunications equipment has been relatively straightforward. The evolution to more complex transmission schemes such as those proposed for third-generation (3G) telecommunications devices can employ the subject methods and apparatus and apply AM-PM test procedures to a multicarrier amplifier RF environment to properly characterize the parametric performance of these transmission systems, particularly those operating in a multicarrier environment.

Abstract: A spectrum analyzer that measures a signal component for every frequency of an input signal includes a local signal generating section generating a local signal having a designated frequency, a multiplying section outputting a synthesized signal obtained by multiplying the local signal with the input signal, a band-pass filter through which a signal component having a prescribed frequency band of the synthesized signal is passed, an A-D conversion section outputting a digital output signal obtained by sampling and digitalizing the passed signal component, a spectrum generation section that passes a signal component within a measured frequency range of the input signal through the band-pass filter and generates a first frequency spectrum based on the digital output signal acquired from the signal component passed through the band-pass filter, and an elimination section generating a frequency spectrum free of noise based on the first frequency spectrum generated by the spectrum generation section.

Abstract: Provided are methods and apparatus for characterizing a power waveform. Some such methods include sampling the power waveform to generate a plurality of samples and, for each of the samples, recursively processing the sample to generate an aggregate signal energy value, processing the sample to generate a harmonic component signal energy value associated with at least one target harmonic frequency, and accumulating the aggregate signal energy value and the component signal energy value with previously generated aggregate signal energy values and component signal energy values to generate an accumulated aggregate signal energy value and an accumulated harmonic component signal energy value. Methods also include characterizing the power waveform responsive to the accumulated aggregate signal energy value and the accumulated harmonic component signal energy value.

Abstract: The disclosure relates to a method for determining the envelope curve of a modulated input signal with the following method steps: generating digital samples by digital sampling of the input signal, generating Fourier-transformed samples by Fourier transforming the digital samples, generating sideband-cleaned, Fourier-transformed samples (B?n) by removing a range with negative frequencies or a range with positive frequencies from the Fourier-transformed samples (Bn), generating inverse-transformed samples by inverse Fourier transforming the sideband-cleaned, Fourier-transformed samples and forming the absolute value of the inverse-transformed samples.

Abstract: Detecting a pulse of a signal includes receiving the signal and a light beam. The signal drives a spatial light modulator to modulate the light beam, where the complex amplitude of the modulated light beam is proportional to the signal current. The modulated light beam passes through an optical system and is detected by an optical detector array. A processor identifies a portion of the signal comprising the pulse.

Abstract: A method measures current harmonics or voltage harmonics that occur in power supply networks. In the method, an instrument transformer produces a measurement signal for a current flowing in a conductor in a power supply network, or for a voltage that occurs on the conductor. A filter is disposed adjacent to the instrument transformer and filters out that component of the measurement signal that is associated with the current or voltage fundamental, and amplifies those components of the measurement signal that are associated with the current or voltage harmonics. The measurement signal that has been changed in this way is transmitted to an evaluation device, which is configured to determine the magnitude of the harmonics. A configuration for performing the method has such an instrument transformer and filter.

Abstract: A magnetic device and a frequency analyzer are provided as those industrially utilizing a resonance phenomenon of a direction of magnetization of a magnetoresistive element. Since polarities of an alternating current i vary with time, the direction of magnetization oscillates as affected by the magnitude and frequency of the alternating current. When the frequency fF of the direction of magnetization of a free layer in the magnetoresistive element coincides with the frequency f of the alternating current flowing in the magnetoresistive element, the oscillation of the direction of magnetization resonates to increase a voltage between output terminals. A magnetic yoke applies such a magnetic field as to cause resonance, to the free layer. A direct current is used as an electric current outputted from a current control circuit and, while this direct current is swept, voltages at respective specific resonance frequencies are detected by a monitor circuit.

Abstract: Parametric measurement of first- and second-generation telecommunications equipment has been relatively straightforward. The evolution to more complex transmission schemes such as those proposed for third-generation (3G) telecommunications devices can employ the subject methods and apparatus and apply AM-PM test procedures to a multicarrier amplifier RF environment to properly characterize the parametric performance of these transmission systems, particularly those operating in a multicarrier environment.

Abstract: A signal analyzer repetitively memorizes waveform data of a signal under test to detect peaks P1-P6 of the waveform data. Waveform widths of the waveform data at a mask reference level, or a predetermined level down from the respective peaks, are evaluated as mask reference widths and then masks of the respective peaks are set using the mask reference level and mask reference widths. Hence the masks are automatically set, so a user can easily obtain time domain data and/or frequency domain data including characterizing portions in the signal under test.

Abstract: Apparatus and associated systems and methods may relate to a wide bandwidth cable assembly that may include an active amplification stage to receive high frequency signals (e.g., 1 GHz or above) through a transmission line extending distally to a passive, high density signal probe stage. In an illustrative example, the probe stage may receive multiple analog or digital signals from a device under test (DUT). In some embodiments, the probe stage may include probe pins with integrated series resistance to control signal loading, and an equalizer to shape the signal path's frequency response. The amplification stage may provide a virtual ground reference for a termination impedance that may match the transmission line's impedance and may connect in series with a feedback impedance. In one example, a minimally invasive probe head may facilitate measurement of multiple channels of a high speed data bus with minimal signal distortion and/or attenuation.

Abstract: A diagnosis apparatus for a switchgear comprises a sensing unit which detects a partial discharge signal of the switchgear, an amplifying unit which amplifies the partial discharge signal detected from the sensing unit, a frequency spectrum generation unit which converts the amplified partial discharge signal into a frequency spectrum; and an analysis-diagnosis unit which analyzes and diagnoses the frequency spectrum.

Abstract: A range of a frequency measuring device having limited range is extended by pre-processing an input signal. The input signal is divided into a plurality of channels. In each channel, the input signal is divided into sub-bands. A frequency of the input signal is determined using a frequency measuring device having limited range. The frequencies are stored in a frequency set. The frequency set is used to determine a frequency associated with the input signal according a set of pre-determined reconstruction rules.

Abstract: Apparatus and associated systems and methods may relate to a wide bandwidth cable assembly that may include an active amplification stage to receive high frequency signals (e.g., 1 GHz or above) through a transmission line extending distally to a passive, high density signal probe stage. In an illustrative example, the probe stage may receive multiple analog or digital signals from a device under test (DUT). In some embodiments, the probe stage may include probe pins with integrated series resistance to control signal loading, and an equalizer to shape the signal path's frequency response. The amplification stage may provide a virtual ground reference for a termination impedance that may match the transmission line's impedance and may connect in series with a feedback impedance. In one example, a minimally invasive probe head may facilitate measurement of multiple channels of a high speed data bus with minimal signal distortion and/or attenuation.

Abstract: A wideband signal analyzing apparatus for analyzing an input signal includes frequency-shifting means for generating a plurality of intermediate frequency signals by shifting a frequency of the input signal as much as respectively different frequency-shifting amounts, so that if a frequency band of the input signal is divided into a plurality of frequency bands, each of the frequency bands can be shifted to a predetermined intermediate band, spectrum measuring means for outputting a complex spectrum of each of the intermediate frequency signals, and spectrum reconstructing means for merging the complex spectra.

Abstract: A mechanism for measuring noise densities below the noise floor of a measuring instrument. The measuring instrument may first acquire a fully-averaged reference spectral noise density trace and estimate corresponding reference statistical parameters. Based on the reference statistical parameters, the measuring instrument may construct a reference spectral noise density distribution. The measuring instrument may also acquire a fully-averaged sum spectral noise density trace and estimate corresponding sum statistical parameters. Based on the sum statistical parameters, the measuring instrument may construct a sum spectral noise density distribution. The measuring instrument may extract a spectral noise density distribution from the reference and sum distributions. The measuring instrument may also determine a confidence interval based on a desired confidence level.

Abstract: A method and system characterizes an IF response of a receiver under test, such that an effect on the characterization by errors associated with uncertainties in knowledge of an RF stimulus signal used to perform the characterization is reduced. The method includes determining an estimate of an actual IF response of the receiver under test from IF responses of the receiver under test measured at overlapping frequency bands and a set of conversion coefficients computed therefrom, such that the estimate reduces the effect of the errors. The system includes a signal generator, an IF processor, a computer program, and a controller that controls the generator and the processor and executes the computer program. When a receiver under test is characterized, the receiver is connected between the signal generator, the IF processor and the controller. The computer program includes instructions that implement characterizing the receiver IF response.

Abstract: Disclosed are a method and apparatus for detecting minute oscillation in a WiBro repeater, and the WiBro repeater having the same. The method of detecting minute oscillation in a WiBro repeater includes: calculating an autocorrelation value of an input signal inputted to the repeater; calculating energy of the input signal; calculating the amount of oscillation by dividing the autocorrelation value by the energy; and comparing the amount of oscillation with a predetermined threshold value to determine whether or not the minute oscillation occurs in the repeater.

Abstract: A high-frequency power source supplies high-frequency power to a load whose reflection characteristic for the power varies with time. The power source includes a frequency-variable power generator, a power detector for detecting the power into the load and the power from the load, a reflection coefficient calculator for calculating a reflection coefficient based on the detection of the power into and from the load, a frequency detector causing the power generator to generate high-frequency powers at various frequencies within a predetermined frequency range for obtaining the frequency that gives a minimum value to the calculated reflection coefficient, and a power supply controller for causing the power generator to generate a high-frequency power of the frequency obtained by the frequency detector and for supplying the high-frequency power to the load.

Abstract: A spectrum analyzer includes an array of frequency-selective bulk acoustic wave (BAW) resonators each tuned to a predetermined different resonant frequency. The spectrum analyzer further includes a broadband BAW resonator that generates acoustic energy when connected to a signal source. An acoustic coupling transmits the acoustic energy generated by the broadband BAW resonator to the frequency-selective BAW resonators so that one of the frequency-selective BAW resonators will generate an electrical output signal if the acoustic energy transmitted from the broadband BAW resonator contains spectral components at its predetermined resonant frequency.

Abstract: A handheld portable battery powered digital antenna and/or network analyzer which derives complex impedance values at a given frequency includes an internal direct digital synthesis generator and provides software-defined multiple operating modes and real time graphic scalar and polar displays of results in a multiplicity of user-selectable visual formats.

Abstract: A system, apparatus and method for performing differential return loss measurements and other measurements as a function of frequency uses a digital storage oscilloscope (DSO) having spectral analysis functions. A waveform generator generates a differential test signal in the form of a series of pulses where each pulse includes spectral components associated with each of a plurality of frequencies of interest. A test fixture presents the differential test waveform to a load including at least one of a device under test (DUT), a short circuit, an open circuit and a balanced load. A signal acquisition device differentially measures the test waveform during each of the load conditions. The signal acquisition device computes an error correction parameter using measurements made during the short circuit, open circuit and balanced load conditions. The correction parameter tends to offset signal acquisition errors within measurements made during the DUT load condition.

Abstract: In an electronic device having an interface circuit which operates using a fast clock source, frequency deviation of the clock source is inspected in the mounted state. The clock pulses of the fast clock source are counted in synchronization with an electronic device serving as reference, and the result is checked; or, alignment data of transfer data and overflow/underflow of the FIFO buffer are utilized; or, the count values of an internal counter and a fast clock counter are utilized, to check for frequency deviation of the fast clock source. In the state of being mounted in the device, tests can be performed of the clock sources of all units.

Abstract: A method of displaying signals containing a spatial and a temporal aspect, where multiple signals are received by multiple sensors. The received signals are decomposed into separate signal components within one or more distinct frequency bands. Signal components are isolated within each frequency band based on differences between the signal components within the same frequency band, and the signal components are displayed. The signal components may be analyzed to determine a time course of activity and a location of the associated source. Representations of the source may also be generated and displayed to aid in monitoring the signals.

Abstract: A spectrum analyzer includes a resonator board that in turn has a substrate and a plurality of resonators. Each resonator may include a first segment that includes a first segment discontinuity and that may also define a boundary and a second segment that has a second segment discontinuity. The second segment may be spaced from the first segment and wherein the second segment is disposed within the boundary defined by the first segment. The resonator board may also include a plurality of wires each of which may be generally parallel to each other and each having a resonator interposed therebetween.