Abstract: A liquid crystal display panel, an array substrate and a manufacturing method for the same are provided. Designing a black matrix for light shielding, and an insulation layer between a pixel electrode and other structures in order to reduce the type and the number of the masks, simplify the manufacturing process and decrease the production cost. Besides, a distance between the black matrix located above a data line and the data line is shorten such that lights of a pixel emitting out through an adjacent pixel is avoided in order to reduce the light leakage at a large viewing angle.

Abstract: Methods and apparatus for testing operation of a single or multiple tunable active optical device(s) operated by one or more driving electrodes are described. Test methods and apparatus are provided for device testing without necessarily requiring direct physical contact with the driving electrodes. Testing subjects devices to incident light along an optical path and to an external electric field applied to the device producing a dipolar charge distribution within the electrodes, causing the device to operate. The effect of device operation on incident light is optically sensed. The sensed effect is analyzed to identify device defects. Test methods and apparatus are provided for testing multiple unsingulated devices during fabrication employing a strip contact structure having contact strips connected to multiple devices and extending to wafer edges, such that singulating devices leaves portions of the strip contact structure exposed on device dice edges providing electrical contacts in use.

Abstract: Provided is a method for compensating for a defective pixel of a display. The method includes identifying at least one of a plurality of pixels of a display as a defective pixel and compensating for a function of the defective pixel by using at least one pixel from a first pixel group located in a first partial region corresponding to the defective pixel and a second pixel group located in a second partial region located adjacent to the first partial region among a plurality of partial regions, each partial region comprising some adjacent pixels among the plurality of pixels.

Abstract: There are provided an array substrate and method for manufacturing the same, a display panel and method for testing the same, and a display apparatus. The array substrate comprises a display region and at least one bond region located outside of the display region; wherein a plurality of signal lines are disposed within the display region, and a plurality of wiring terminals connected to multiple ones of the plurality of signal lines through a plurality of first lead wires are disposed within each bond region; the array substrate further comprises one or more test regions corresponding to arbitrary one or more of the at least one bond region; wherein a plurality of test terminals are disposed within each test region, and the plurality of test terminals within any one of the one or more test regions are connected with the plurality of wiring terminals within a respective one of the at least one bond region through a plurality of second lead wires.

Abstract: A touch panel and a driving method are described in the present disclosure. A driving chip is arranged within a chip area of a non-display area. The driving chip includes a plurality of pins. At least a portion of the pins outputs first driving signals for controlling the pixel electrodes, and outputs second driving signals for controlling the touch sensor. A plurality of wirings corresponding to the pins is arranged within the fan area, and the wirings transmit the first driving signals and the second driving signals outputted by the pins. In view of the above, the difficulties of the bonding manufacturing process are reduced. At the same time, the coupling capacitance between the wirings is reduced, and thus the display performance and the touch sensibility of the touch panel 10 are enhanced.

Abstract: A touch display device including multiple data lines, multiple scan lines and a substrate is provided. The data lines and the scan lines are formed on the substrate. The touch display device includes multiple pixel elements arranged in the form of a pixel array and coupled to the corresponding data lines and the corresponding scan lines and multiple touch sensor electrodes arranged in the form of a sensor array. The touch display device further includes a touch gate pad formed on the substrate and multiple first switch transistors. Each first switch transistors includes a first end, a second end and a control end. The first end is coupled to one of the touch sensor electrodes in a first column of the touch sensor electrodes, and a touch display driver. The second end is coupled to a first test pad. The control end is coupled to the touch gate pad.

Abstract: A flexible display device includes a display panel, at least one inspection part, and a detector. The display panel includes at least one bending portion and a display area. The inspection part is located on the bending portion and bends in a manner similar to the bending portion. The detector applies an inspection signal to the inspection part and receives an output signal from the inspection part. A crack in the inspection part is then determined based on a comparison of the inspection and output signals.

Abstract: An electro-optical device includes: a display unit having a plurality of pixel circuits each including a driving transistor and a light emitting element that emits light depending on a current output from the driving transistor when a voltage is applied to a gate terminal of the driving transistor; and a test unit having a test unit connection switch connected to the gate terminal of the driving transistor of each of the pixel circuits, and a test voltage supply circuit connected to the gate terminal of each of the driving transistors through the test unit connection switch and configured to supply a test voltage to the gate terminal of each of the driving transistors when the test unit connection switch is turned on.

Abstract: Methods, systems and apparatuses, including computer program products, are described for determining a performance metric of a mobile computing device application. A test computing device captures a plurality of images displayed on a mobile computing device based on execution of a mobile computing device application. The test computing device determines a first property for first and second images of the plurality of images. A first performance parameter is set based on a difference between the first properties of the first and second images. The test computing device determines a first property for third and fourth images of the plurality of images. A second performance parameter is set based on a difference between the first properties of the third and fourth image. A performance metric is determined based on a difference between the first performance parameter and the second performance parameter.

Abstract: A manufacturing method of a display device includes forming a pixel in a display area of a panel, forming a transistor circuit in a peripheral area of the panel, the peripheral area being located in the vicinity of the display area, forming a first pad in a part of the peripheral area, forming a second pad in a peripheral area of another panel adjacent to the part of the panel, the second pad being electrically connected to the transistor circuit, performing a driving inspection on the transistor circuit by use of the second pad, and separating the first pad and the second pad from each other after the driving inspection.

Abstract: Embodiments of the present invention disclose a display motherboard and a manufacturing method thereof. The display motherboard includes a plurality of process areas, the process area includes a plurality of display panels and the display panel includes a color filter substrate and an array substrate provided opposite to each other. The technical solution of the present invention first determines the process area, to which the display panel belongs, by the predetermined number for transitional sub-pixels in the part of the non-display area on one side of the display area on the color filter substrate, and then determines the specific position of the display panel in the process area, to which the display panel belongs, by the location identifier on the array substrate, so that the identification for the display panel is realized, which improves capacity of production line while optimizing design space of peripheral area for the display panel.

Abstract: A method of controlling a driving voltage of a display apparatus includes transmitting a ready signal from a timing control circuit of the display apparatus to a power management circuit of the display apparatus through a connection area of a connection member of the display apparatus, which is disposed between a display panel and a main circuit board of the display apparatus, and controlling a generation of the driving voltage from the power management circuit based on the ready signal received by the power management circuit, where the display apparatus includes a gate driver circuit disposed on the display panel, and the timing control circuit and the power management circuit are disposed on the main circuit board.

Abstract: A display device includes a display panel including a substrate having a display area and a non-display area outside the display area, a display unit being in the display area, and a plurality of pads in the non-display are, a sealing unit covering the display unit, and a circuit board including a plurality of terminals electrically coupled to the plurality of pads. The circuit board has a plurality of folding portions such that the circuit board is folded at least two times in directions different from each other.

Abstract: A detecting method and a detecting apparatus for detection of a gate line disconnection. The gate line disconnection detecting method includes step 1: providing a first unit (41) at least capable of receiving signals at one end of a gate line to be detected (2), and providing a second unit (42) at least capable of transmitting signals at the other end of it; step 2: providing a first signal receiving unit (51) for receiving signals on a gate line other than the gate line to be detected (2). With respect to the gate line disconnection detecting method, whether disconnection occurs or not is judged depending on the signal strength received by the first signal receiving unit (51), and thus, the case that in a gate line disconnection detection of a bilateral drive type display device, whether a gate line is disconnected or not can be accurately detected, is realized. By it, technical supports are provided for getting rid of bad products timely, and a goal of promoting the yield of products is achieved.

Abstract: The present disclosure provides a display device, including: a display region; and a non-display region adjacent to the display region, wherein the non-display region includes: a gate-driving circuit; a driving unit; and a test pad, wherein the driving unit electrically connects the gate-driving circuit through the test pad. The present disclosure also provides a test pad.

Abstract: A display device includes a display unit including pixels in an area defined by a plurality of scan lines and a plurality of data lines, a scan driving unit configured to apply a plurality of scan signals to the scan lines, a data driving unit configured to apply a plurality of data signals to the data lines, an inspection circuit unit configured to apply a plurality of inspection signals to the data lines, a plurality of inspection pads configured to transmit a plurality of inspection control signals to the inspection circuit unit, a plurality of first inspection lines electrically connecting the inspection circuit unit to the inspection pads, and a plurality of second inspection lines branching off from the first inspection lines and electrically connecting the inspection circuit unit to the data driving unit.

Abstract: The embodiments of the present invention relate to a display device and a driving method thereof, wherein the display device according to an exemplary embodiment of the present invention includes a plurality of pixels a voltage transmitting line transmitting a first voltage to a first pixel among the plurality of pixels, a data line transmitting a data voltage to the first pixel, and a plurality of sensing units including a first sensing unit connected to the voltage transmitting line, wherein the first pixel includes a first switching element including an input terminal connected to the voltage transmitting line and a second switching element including an input terminal connected to the data line, and the first sensing unit includes a control switching element including an input terminal connected to the voltage transmitting line.

Abstract: Aspects of the present disclosure directs to inspection of pixels of a display device using photon collection. In certain embodiments, the display device includes a display panel defining multiple pixels in a pixel matrix. A controller divides the pixel matrix into multiple areas, with each area including at least one pixel, and assigns a threshold value for each area. The controller then controls the pixels in one area to emit light displaying a color. A transparent photon collection panel attached to the display panel receives the light displayed by the area, and generates an analog signal in response to the light. An analog to digital (A/D) converter converts the analog signal to a photon current value. The controller receives the photon current values corresponding to each area, and compares the photon current value with the threshold value for each area to determine a flag value for the area.

Abstract: Systems and methods for frequency specific closed loop feedback control of integrated circuits. In one embodiment, a plurality of controllable inputs to an integrated circuit is adjusted to achieve a frequency specific predetermined value of a dynamic operating indicator of the integrated circuit at the desired specific operating frequency. The predetermined value is stored in a data structure within a computer usable media. The data structure comprises a plurality of frequency specific predetermined values for a variety of operating frequencies. An operating condition of an integrated circuit is controlled via closed loop feedback based on dynamic operating indicators of the measured behavior of the integrated circuit.

Abstract: A mother substrate includes a display substrate cell defined by a scribe line, the display substrate cell including a plurality of gate lines, a gate circuit part driving the gate lines, and a gate pad part connected to the gate circuit part, a gate test pad part in a peripheral area surrounding the display substrate cell, the gate test pad part being configured to receive a gate test signal, a gate test line part connecting the gate test pad part and the gate pad part, and a switching part connected to the gate test line part and configured to control turning on and turning off of the gate test line part.

Abstract: A method and device for testing a thin film transistor (TFT) provided on an array substrate are provided in an embodiment. The method comprises determining periods and signal amplitudes in each period of the gate electrode test voltage signal and the source-drain-electrode test voltage signal corresponding to the TFT characteristics to be tested, wherein both the gate electrode test voltage signal and the source-drain-electrode test voltage signal are alternative current signals; according to the period and the signal amplitude in each period of the gate electrode test voltage signal and those of the source-drain-electrode test voltage signal, applying the gate electrode test voltage signal to a gate electrode of the TFT to be tested, and applying the source-drain-electrode test voltage signal across source and drain electrodes of the TFT; and obtaining the TFT output signals related to the TFT characteristics to be tested.

Abstract: An optical measuring apparatus for measuring optical characteristics of a stereoscopic display device includes a test image supplier for generating a 3D test signal, a 3D display for displaying left-eye image and/or right-eye image based on the 3D test signal supplied from the test image supplier, a image selection member for selectively transmitting the left-eye image and right-eye image to be displayed on the 3D display, and a light measuring device for measuring intensity or color information of the image transmitted via the image selection member.

Abstract: The present invention provides a method for manufacturing an array substrate, wherein each data line in a plurality of data line groups forms an integral structure with a first shorting bar, and after etching a source-drain component to form a source electrode and a drain electrode, the data line groups which do not correspond to the first shorting bar is disconnected from the first shorting bar. By adopting the method provided by the present invention, electrostatic breakdown in the manufacturing process of the array substrate can be reduced.

Abstract: A liquid crystal alignment test method includes: connecting a liquid crystal array substrate to be tested with a liquid crystal alignment test apparatus; applying corresponding voltages to signal input ports of the liquid crystal array substrate via a voltage providing device and then to execute an image check for the liquid crystal array substrate; and detecting resistance values of each two signal input ports of the liquid crystal array substrate via s resistance detection device to judge whether each two of the signal input ports are short-circuited.

Abstract: A liquid crystal display includes a pixel that includes a first sub-pixel chargeable with a first voltage and a second sub-pixel chargeable with a second voltage different from the first voltage, a pixel electrode that includes a first sub-pixel electrode in the first sub-pixel and a second sub-pixel electrode in the second sub-pixel, a common electrode that faces the pixel electrode, and a liquid crystal layer between the pixel electrode and the common electrode. The first sub-pixel electrode includes a first trunk portion and a plurality of first branch portions protruding from and extending from one side of the first trunk portion. The second sub-pixel electrode includes a second trunk portion and a plurality of second and third branch portions that protrude from both sides of the second trunk portion and extend substantially parallel to the first branch portions.

Abstract: A test cell structure of a display panel is disposed in the peripheral region of the display panel. First conductive lines and second conductive lines extend from the display region to the peripheral region, and the amounts of the first and second conductive lines are the same. The test cell structure includes a plurality of first test transistors, a plurality of second test transistors, and a plurality of first shorting bars. The drains of the first test transistors are electrically connected to the first conductive lines respectively, and their sources are electrically connected to the first shorting bars. The sources of the second test transistors are electrically connected to the drains of the first test transistors respectively, and their drains are electrically connected to the second conductive lines. The first test transistors are disposed between the second test transistors and the display region.

Abstract: Reception devices 201 to 20N are arranged one-dimensionally in this order. The reception device 20n has a data input buffer 21, a first clock input buffer 221, and a first clock output buffer 231. The first clock input buffer 221 buffers a clock input to the first clock terminals P21 and P22, and outputs it to the first clock output buffer 231. The first clock output buffer 231 buffers a clock input from the first clock input buffer 221 and outputs it from the second clock terminals P31 and P32. The data input terminals P11 and P12 are located between the first clock terminal and the second clock terminal.

Abstract: An apparatus and method for determining and quantifying “sparkle”—the random noise that is generated when a pixelated image is viewed through a roughened surface of a transparent sample. The apparatus includes a pixelated source and an imaging system located in an optical path originating from the pixelated source, wherein a transparent sample may be placed in the optical path between the pixelated source and the optical system. The degree of sparkle is determined by obtaining an integrated image for the pixelated image; and calculating a standard deviation of the integrated pixel power. An objective level of sparkle can be defined by correlating the amount of sparkle provided by the apparatus with visual impressions.

Abstract: A display panel includes a substrate including a display area displaying an image and a peripheral area. A plurality of shorting bar connection parts are formed in the peripheral area. A plurality of step adjustment parts are formed on the plurality of shorting bar connection parts. A plurality of pad parts are formed on the plurality of step adjustment parts. Each of the pad parts is connected to a first end of the shorting bar connection parts through a first contact hole. A plurality of shorting bar pads is formed on the plurality of shorting bar connection parts. Each of the shorting bar pads is connected to a second end of the shorting bar connection parts through a second contact hole. The plurality of shorting bar connection parts are formed in lower regions of the plurality of pad parts. The shorting bar connection parts overlap each other.

Abstract: Embodiments relate to a defect detecting method of a line and a demultiplexer, a defect detecting device, and a display panel including the defect detecting device. A demultiplexer may connect a plurality of data lines to a plurality of corresponding lines. The defect detecting device includes DC lines supplied with respective DC voltages, first switches connected to the DC lines and configured to transmit the respective DC voltages to the corresponding first data lines among a plurality of data lines according to a first gate signal, and second switches connected to the first to third DC lines and configured to transmit one of the respective DC voltages to corresponding second data lines among a plurality of data lines according to a second gate signal.

Abstract: A disclosed display device capable of detecting bonding defects includes: a display panel having an active area used to display images and a pad area in which pads are formed; driver IC (Integrated Circuit) chip mounted on a pad region of the display panel; a flexible printed circuit board bonded to the pad region of the display panel; and a bonding resistance detection circuit disposed in the driver IC chip. The display panel includes: first and second bonding portions formed in a mounting region of the driver IC chip within the pad area of the display panel; and third and fourth bonding portions formed in a bonding region of the flexible printed circuit board within the pad area of the display panel. The first through fourth bonding portions are electrically connected to one another, and the first and second bonding portions are connected to the bonding resistance detection circuit.

Abstract: A display device is disclosed which includes: gate lines and data lines crossing each other to define unit pixel regions in a display area; a pixel electrode in each unit pixel region; a data shorting bar in a non-display area in substantially parallel with the gate lines; a gate shorting bar in the non-display area in substantially parallel with the data lines; gate link lines electrically connecting the gate lines to the gate shorting bar; data link lines electrically connecting the data lines to the data shorting bar; and shield electrodes on at least one of the gate link lines and the data link lines, the shield electrodes including a conductive material that has a higher melting temperature than that of the at least one of the gate link lines and the data link lines.

Abstract: A liquid crystal alignment control method includes: obtaining a production substrate information of the liquid crystal substrate, wherein the production substrate information comprises a test information of each panel of the liquid crystal substrate; determining the panels of the liquid crystal substrate are qualified or unqualified according to the test information of the liquid crystal substrate; controlling a driving power source to provide voltage to the qualified panels of the liquid crystal substrate by a first mode; and controlling the driving power source to provide voltage to the unqualified panel of the liquid crystal substrate by a second mode.

Abstract: A pixel circuit for an active matrix organic light-emitting diode display system includes a first input node, a second input node, first power supply node, a second power supply node, a triode switch circuit, a storage capacitor, an organic light emitting diode, and a resistive element. The triode switch circuit is connected to the first and second input nodes. The storage capacitor is connected between an output of the triode switch circuit and the second power supply node. The organic light-emitting diode is connected between the output of the triode switch circuit and the second power supply node. The first resistive element is connected between the output of the triode switch circuit and the first power supply node.

Abstract: In one embodiment, a first wiring line is pulled out from an active area, and a short ring circuit is provided in a peripheral portion of the active area. A first electrode is formed in the same layer as the first wiring line. A semiconductor layer is formed on the first electrode. A portion of a second electrode faces the first electrode through an insulating layer and arranged on the semiconductor layer. A third electrode is arranged on the semiconductor layer in the same layer as the second electrode. The first electrode includes a cutout portion arranged under an edge of the second electrode.

Abstract: An organic light-emitting display panel includes a pixel unit including a plurality of pixels respectively located at intersections between scan lines and data lines and displaying different colors; a plurality of pads respectively coupled to ends of the data lines; and a test unit selectively performing an array test to detect a defect of a pixel circuit of the pixels or a cell test to detect a defect of a light-emitting device of the pixels.

Abstract: In one embodiment, a first substrate includes a gate line, a source line, a switching element electrically connected with the gate line and the source line, and a pixel electrode including a sub-pixel electrode electrically connected with the switching element in the shape of a belt, and a main pixel electrode electrically connected with the sub-pixel electrode. A first alignment film covers the pixel electrode. A second substrate includes a common electrode having a pair of main common electrodes arranged on both sides sandwiching the main pixel electrode. A second alignment film covers the common electrode. A liquid crystal layer including liquid crystal molecules is held between the first substrate and the second substrate. Volume resistivity values of the first and second alignment films are lower than that of the liquid crystal layer.

Abstract: A liquid crystal display having a touch screen panel (TSP) function includes a sensor unit formed on the first substrate; a first sensor wire disposed on the first substrate and a second sensor wire extending perpendicular to the first sensor wire, wherein the sensor unit includes a first sensor electrode connected to the first sensor wire and a second sensor electrode connected to the second sensor wire, wherein said first sensor electrode and said second sensor electrode connect when touched, and said first and second sensor wires confirm a touch position by transmitting a sensing current through the connection between the first sensor electrode and the second sensor electrode, a trench is formed near the sensor unit and a silicon protrusion pattern to increase the sensitivity of the touch screen panel.

Abstract: A display driver circuit, including a source driver configured to drive source lines of a display panel, and a timing controller configured to transfer image data to the source driver and to control the source driver such that the transferred image data is displayed via the display panel, the timing controller also being configured to transfer to the source driver a control signal and a test pattern, which are used to test a bit error rate, and the source driver being configured to test the bit error rate of the transferred test pattern in response to the transferred control signal.

Abstract: An integrated circuit is provided. The integrated circuit includes a plurality of output pads, a plurality of test pads, and a plurality of channel shift switches respectively connected between the plurality of output pads and the plurality of test pads and operated by a plurality of channel shift switch enable signals. A short path between the plurality of output pads may be detected when each of the plurality of channel shift switch enable signals are simultaneously at a high level.

Abstract: An organic light emitting display device and a testing method thereof for detecting a failure occurring in a cutting process of a protective film attached to an upper end of a panel. The organic light emitting display device includes a first substrate on which a pixel unit and a tester are formed. The pixel unit includes a plurality of pixels positioned at intersection portions of scan lines and data lines, and the tester includes a plurality of transistors coupled to the respective data lines so as to supply test signals to the data lines. The transistors are divided into at least two groups, so that transistors of one group are turned on/off by a first test control line, and transistors of another group are turned on/off by a second test control line, the first and second test control lines being disposed on opposite sides of the substrate.

Abstract: The present invention provides a testing device and a testing method. The testing method comprises: providing a testing device; bonding at least one connecting terminal of the testing device to signal lines of the display panel; and inputting test signals to the signal lines of the display panel through at least one test contact of the testing device. In the present invention, it is not required to arrange shorting bars on the display panel.

Abstract: A detecting circuit for pixel electrode voltage of a flat panel display device, the flat panel display device having a plurality of scanning lines and a plurality of data lines crossing with the plurality of scanning lines, the plurality of scanning lines and data lines define a plurality of pixel units, and each of the pixel units including a pixel switching element and a pixel electrode. The detecting circuit for pixel electrode voltage includes at least one detecting sub-circuit for pixel electrode voltage. The detecting sub-circuit for pixel electrode voltage includes: a signal amplifying unit connected with the pixel electrode in the pixel unit, for amplifying a voltage signal of the pixel electrode; and a signal detecting unit connected with the signal amplifying unit, for detecting the voltage signal of the pixel electrode that has been amplified by the signal amplifying unit, and outputting a variation in the voltage signal of the pixel electrode with time.

Abstract: An electro-optic device includes pixel electrodes; a data line block for providing an image signal to a first pixel electrode group and a second pixel electrode group in one column of pixel electrodes arrayed in a line in a first direction, the data line block being configured by data line pairs in which a pair of a first data line and a second data line extending in the first direction is arranged for each column; an image signal supplying unit for sequentially providing an image signal in time-series to each of the data line pairs configuring the data line block from one end of each of the data line pairs; and an inspection voltage supplying unit for supplying an inspection voltage from another end of each of the data line pairs each to the data line block and separately to each of the first data line and the second data line.

Abstract: A circuit structure of a test-key and a test method thereof are provided. The circuit structure comprises a plurality of transistors, a first conductive contact, a plurality of second conductive contacts and a plurality of third conductive contacts. The transistors are arranged in a matrix. The first conductive contact is electrically connected to one source/drain of each transistor in each column of the matrix. Each second conductive contact is electrically connected to the other source/drain of each transistor in a corresponding column of the matrix. Each third conductive contact is electrically connected to the gate of each transistor in a corresponding row of the matrix. In the method, a plurality of driving pulses are provided to the third conductive contacts in sequence, and a plurality of output signals are read from the second conductive contacts to perform an element-character analyzing operation when a row of the transistors is turned on.

Abstract: The present invention discloses a voltage applying device for an LCD substrate, and the voltage applying device includes a base, a probe bar, and probe pins. The base includes a first slide rail. The probe bar is movably disposed on the first slide rail of the base, and the probe bar includes a second slide rail. The probe pins are movably disposed on the second slide rail of the probe bar, and the probe pins are utilized to contact a plurality of contact pads of the LCD substrate, so as to apply voltage on the LCD substrate. The voltage applying device of the present invention can overcome a problem of increased costs for a conventional voltage applying device can not be shared.

Abstract: A TFT-LCD array substrate includes a display area, a peripheral area located at a periphery of the display area, and a connecting device. Wherein, the display area includes a plurality of data lines and gate lines. The peripheral area provides with a first test short bar provided with a plurality of data test lines for transmitting a test signal for the data lines, and a second test short bar provided with a gate test line for transmitting a test signal for the gate lines. The connecting device includes a first connection layer and a second connection layer. The connecting device is disposed at a connection location between one of the data test lines and one of the data lines, or between the gate test line and one of the gate lines. A test method for testing the TFT-LCD array substrate is also provided.

Abstract: Illustrative embodiments of systems and methods for variation-tolerant, self-repairing displays are disclosed. In one illustrative embodiment, a display panel may include one or more defective pixels and a compensation circuit may be configured to extend a charging time of each of the one or more defective pixels. In another illustrative embodiment, a method may include detecting one or more defective pixels in a pixel array and extending a charging time of each of the one or more defective pixels.

Abstract: Various embodiments are described and illustrated for mitigating a potential system or screen freeze during an electrostatic discharge.

Abstract: A display apparatus includes a display panel including a plurality of pixels, a plurality of first lines and a plurality of second lines, a plurality of first pads electrically connected to the first lines, respectively, where the first pads are divided into a first group and a second group, a plurality of pads including a second pad, a third pad, a fourth pad and a fifth pad, a first shorting bar configured to be connected to the first group of the first pads and to be connected between the second pad and the fourth pad during a test process of the first lines, and a second shorting bar configured to be connected to the second group of the first pads and to be connected between the third pad and the fifth pad during the test process of the first lines.