Abstract: A liquid crystal display (LCD) includes a pixel unit having pixels, each of the pixels positioned at a corresponding intersection of gate lines and data lines. A drive circuit unit is positioned at one side of the pixel unit to supply driving signals to the gate lines and the data lines. Test pads are connected to the data lines. In the LCD, each of the data lines is electrically connected between the pixel unit and the drive circuit unit via one or more lines among a first line formed in a first layer and a second line formed in a second layer, and wherein each of the data lines is connected to a different test pad from the test pad connected to adjacent data lines in each of the first and second layers.

Abstract: A test device for a liquid crystal display device includes a first shorting bar, a first, a second and a third control line, transmission lines and thin film transistor switch elements; in which the gate electrodes of thin film transistor switch element are respectively arranged on the first, the second and the third control line; the data lines are respectively connected to the first, the second and the third control line via the drain electrodes of thin film transistor switch elements, in which data lines for controlling the blue pixel units are connected to the first control line, data lines for controlling the red pixel units are connected to the second control line, data lines for controlling the green pixel units are connected to the third control line; and the source electrodes of multiple thin film transistor switch elements are connected to the first shorting bar via multiple transmission lines.

Abstract: A device and method for testing a display panel are disclosed. The display panel includes a plurality of pixels arranged in a matrix. Each of the pixels is controlled by a charging gate line and a sharing gate line. The testing circuit includes a first, second, third data testing pad electrically coupling a plurality of red, green, and blue sub-pixels respectively, and k gate testing pad. The sharing gate line of m-th sub-pixel row electrically connects to the charging gate line of (m+2n)-th sub-pixel row, wherein m is a positive integer, and n is the positive integer not less than 2. A row number of the sub-pixel row is divided by k to obtain a remainder q. The q-th gate testing pad electrically connects to the charging gate lines coupled with the sub-pixel row, and k and q are positive integers. And 2n is not divisible by k.

Abstract: A detecting method of abnormality of a differential signal receiving terminal of a liquid crystal displaying module, including: inputting high level signals to LVDS0+, LVDS0?, LVDS1+, LVDS? in order, in which only one high level signal is inputted to one of the differential signal lines and the other differential signal lines are kept in high impedance states simultaneously; and receiving feedback signals from all the differential signal lines and determining whether the differential signal lines of detecting units are abnormal or not according to the received feedback signals. The abnormality of the differential signal lines includes terminal resistive opens of the differential signal lines, a short circuit between two adjacent groups of differential signal lines, and short circuits of the differential signal lines to ground or to a power supply caused by abnormal power supplying sequence.

Abstract: The present invention provides a panel alignment apparatus and a panel alignment method. The panel alignment apparatus comprises an image detection device and a first clamp. The method comprises the following steps: utilizing the image detection device to detect a position of a display panel, and to calculate a position adjustment value; and utilizing the first clamp to hold the standing display panel, and to rotate the display panel according to the position adjustment value for adjusting a position of the display panel. The present invention can utilize the clamps to precisely align the standing display panel.

Abstract: A light emitting device control circuit controls a light emitting array which includes a plurality of light emitting device strings. Each light emitting device string includes a first terminal which is connected to a common node, a second terminal, and a plurality of light emitting devices connected in series. The light emitting device control circuit includes: a short detection circuit, coupled to the second terminals to receive second terminal signals from the second terminals, generating comparison signals according to whether the second terminal signals are higher than a reference signal, and generating a short detection signal according to whether a number of the comparison signals is between a first setting value and a second setting value.

Abstract: An object is to provide a measuring method with high reproducibility in a bias-temperature stress test of a transistor in which an oxide semiconductor is used for a semiconductor layer. Provided is a measuring method of a transistor, which includes the steps of disposing a transistor in which an oxide semiconductor is used for a semiconductor layer in a measurement room having a light-blocking property, introducing dry air, nitrogen, or argon into the measurement room, and applying a predetermined voltage to a gate electrode of the transistor in the measurement room kept under an atmosphere where the dew point is greater than or equal to ?110° C. and less than or equal to ?60° C., whereby the amount of change in threshold voltage over time is measured.

Abstract: A substrate evaluation apparatus and method which includes a substrate storage portion accommodating a substrate, first and second fastening portions are arranged in the substrate storage portion and are each fastened to a side of the substrate, a driving portion driving the first and second fastening portions, and a measurement portion measuring electrical characteristics of the substrate through application of an electrical signal to the substrate.

Abstract: A probe apparatus and method of terminating a probe that probes a semiconductor device with a signal cable from a tester side by side at a proximal end of the probe and a distal end of the signal cable. In one embodiment, the probe apparatus includes: a chassis; a dielectric block mounted in the chassis for retaining the probe, the probe extending on the chassis from a proximal end of the probe to the dielectric block, extending through the dielectric block, and projecting from the dielectric block towards the semiconductor device at a distal end of the probe; and a terminating apparatus, mounted in the chassis, for terminating the proximal end of the probe with a distal end of the signal cable side by side.

Abstract: A voltage test device used in liquid crystal display (LCD) panels, including test solder pads and test lines, is proposed. The test solder pads are connected to an LCD panel through the test lines. Each of the test lines includes a switch test line and a signal-inputting test line. The voltage test device further includes a first connector. The switch test line includes a first portion of the switch test line and a second portion of the switch test line. The first portion of the switch test line is connected to the second portion of the switch test line through the first connector. The first connector is used for preventing the electric current in excess of a predetermined threshold from flowing inside the LCD panel. Meanwhile, a voltage testing system used in LCD panels is proposed.

Abstract: An organic electroluminescence device is provided, which comprises: a lighting region, a wiring region, a bonding region and a wiring extending region (300), the lighting region comprises an anode, an organic functional layer, a cathode; the wiring region comprises wirings connecting the anode and cathode with a driving chip or a circuit board; the bonding region is a region in which the wirings connect with the driving chip or the circuit board; the ends of the wirings locate in the wiring extending region, the wirings in the wiring extending region are parallel with the wirings in the wiring region or form an angle with the wirings in the wiring region. A method for testing the organic electroluminescence device is also provided. With improving the wiring arrangement of the organic electroluminescence device, it is easier and more accurate to press bond a conductive adhesive tape and the wirings, and, the row wirings and the column wirings are protected from being shorted during screen testing.

Abstract: The present technology discloses a testing apparatus and a testing method for liquid crystal display (LCD). The apparatus comprises a testing chamber, at least one support device in the testing chamber and an adjusting device. The support device comprises a support stage located at the bottom of the testing chamber and a support rail located on a side wall of the testing chamber. The LCD is supported by the support stage and the support rail. The adjusting device is used to control the support rail to adjust angle of the LCD relative to the support stage.

Abstract: A built-in self-test (BIST) circuit for a liquid crystal display (LCD) source driver includes at least one digital-to-analog converter (DAC) and at least one buffer coupled to the respective DAC, wherein the buffer is reconfigurable as a comparator. A first input signal and a second input signal are coupled to the comparator. The first input signal is a predetermined reference voltage level. The second input signal is a test offset voltage in a test range.

Abstract: A micro-spray cooling system beneficial for use in testers of electrically stimulated integrated circuit chips is disclosed. The system includes micro-spray heads disposed about a probe head. The spray heads and probe head are disposed in a sealed manner inside a spray chamber that, during operation, is urged in a sealing manner onto a sealing plate holding the integrated circuit under test. The atomized mist cools the integrated circuit and then condenses on the spray chamber wall. The condensed fluid is pumped out of the chamber and is circulated in a chiller, so as to be re-circulated and injected again into the micro-spray heads. The pressure inside the spray chamber may be controlled to provide a desired boiling point.

Abstract: The invention relates to the operation of illuminants, in particular OLEDs. The invention relates to a method and a measuring instrument for determining the electrical properties of an OLED, the equivalent circuit diagram of which is composed of the parallel connection of an equivalent diode DE and an equivalent capacitance CE as well as an equivalent resistance RE that is connected in series to said parallel connection. The values for the equivalent resistance RE and the equivalent capacitance CE are determined at a different time than are the values for the equivalent diode DE.

Abstract: An example embodiment includes a continuity testing method of a pixel in a liquid crystal on silicon integrated circuit. The method includes writing a first voltage to a pixel. The pixel is isolated and a wire that is selectively coupled to the pixel is discharged. The method also includes enabling a sensing amplifier configured to sense voltage on the wire. The pixel is electrically coupled to the wire and a resultant voltage on the wire is sensed.

Abstract: In a position detector having two sensors, a first sensor detects a position indicated by a first indicator by electromagnetic induction and a second sensor detects a position indicated by a second indicator by a detection method other than electromagnetic induction. The position detector reduces adverse effects of the transmission signal supplied to the second sensor on the electromagnetic induction position detection circuit. The position indication state of the first and second indicators is determined based on a signal output from the first sensor according to the position indication by the first indicator on the first sensor and a signal output from the second sensor according to the position indication by the second indicator on the second sensor. According to the determination results of the position indication state, the level of the transmission signal provided to the second sensor to detect the position indication by the second indicator is controlled.

Abstract: Disclosed is a test method an apparatus in which an area for test and an area for analysis are specified based on the design information of the display device having a non-rectangular display area. To carry out testing, parasitic capacitances are found using the design information, and operations for weighting are performed on test data or threshold values based on which a decision on pass/fail is to be made.

Abstract: An embodiment of the present invention provides a test apparatus for a liquid crystal module, comprising: a light up module, being configured for being coupled to the liquid crystal module to be tested for lighting up the liquid crystal module, and providing a test image to the liquid crystal module; a flickering degree obtaining module, being configured for obtaining a flickering degree of the liquid crystal module; a voltage module, being configured for being coupled to the liquid crystal module to be tested, and supplying a voltage to the liquid crystal module; a control module, being respectively coupled to the flickering degree obtaining module and the voltage module, and being configured for controlling the voltage module to output the voltage and receiving the flickering degree of the liquid crystal module in association with the corresponding voltage obtained by the flickering degree obtaining module.

Abstract: A display device and a method of testing the display device. The display device includes a substrate including both a display region on which pixel cells are located and a peripheral region; test pads, main pins connected to the pixel cells, and dummy pins that are respectively connected to the test pads, the test pads, the main pins, and the dummy pins being on the peripheral region of the substrate, and visual test lines on the peripheral region of the substrate. The visual test lines include a first portion connected to the main pins and a second portion connected to the test pads, and the first and second portions are disconnected from each other.

Abstract: A driving method of an electrophoretic display is provided. The driving method includes the following steps. A plurality of pixels of a display panel of the electrophoretic display are configured as a plurality of blocks. A common voltage of the display panel is set to a first voltage. A plurality of scanning signals are inputted to a plurality of scanning lines of the display panel in order in which scanning lines corresponding to the same block receives the same scanning signal. A plurality of data lines of the display panel are measured to obtain at least one peak voltage corresponding to each of the blocks. A feed through voltage corresponding to each of the blocks is determined according the peak voltages corresponding to the blocks. A plurality of driving signals which drive each of the blocks are adjusted according the feed through voltage corresponding to each of the blocks.

Abstract: An organic light emitting display device having a lighting test circuit. The organic light emitting display device includes: a pixel unit including pixels at crossing regions of scan lines and data lines; a scan driving circuit configured to supply scan signals to the scan lines; and a lighting test circuit configured to supply lighting test signals to the data lines, the lighting test circuit including a plurality of transistors, the plurality of transistors including source electrodes, drain electrodes, and gate electrodes, the source electrodes being coupled, in common, to input lines to which the lighting test signals are input, the drain electrodes being coupled to the data lines, the gate electrodes being coupled, in common, to an input line of test control signals, and the gate electrodes and the source electrodes being coupled through a resistor composed of a semiconductor material.

Abstract: A display device having repair and detect structure includes a substrate, a pixel array, a first shorting bar and a first repair line. The pixel array disposed on the substrate includes a plurality of data lines and a plurality of gate lines. The first shorting bar disposed on the substrate is connected to the gate lines for testing the gate lines, and the first shorting bar includes a first shorting segment. The first repair line is disposed on the substrate for repairing at least one of the data lines. The first shorting segment of the first shorting bar is electrically connected to the first repair line. Furthermore, another repair and detect structure of a display device is disclosed, wherein the first shorting bar includes a first shorting segment, the first repair line includes a first repair segment, and the first shorting segment overlaps with the first repair segment.

Abstract: A display panel includes a first substrate, a plurality of pixel units, a plurality of first signal lines, a first testing line and a second testing line. The first signal lines are disposed on a peripheral area and electrically connected to corresponding pixel units. The first signal lines include a plurality of first sets of signal lines and a plurality of second sets of signal lines alternatively arranged. The first and second sets of signal lines are formed on different layers. The first testing line is electrically connected to the first sets of signal lines. The second testing line is electrically connected to the second sets of signal lines.

Abstract: A method for testing an LCD panel is proposed. The method includes: dividing a scanning period into a first sub-period and a second sub-period; in the first sub-period, inputting a first scanning signal to a first set of scan lines, inputting a first testing signal to a first set of data lines, and inputting a second testing signal to a second set of data lines; and in the second sub-period, inputting a second scanning signal to a second set of scan lines, inputting a first scanning signal to a first set of scan lines, inputting a second testing signal to a first set of data lines, and inputting a first testing signal to a second set of data lines. By using the procedure, the present invention uses the testing method in the cell process to test the image blur phenomenon. This can improve the testing ability and raise the yield.

Abstract: A device for panel reliability testing and method thereof are proposed. The device includes a connection module, for connecting the panel and an aging module; a reliability chamber control module for sending a voltage regulation command to a bias module and/or a switch control command to the aging module; the bias module, for regulating voltage and transmitting information about voltage regulation to the aging module; and the aging module, for performing an aging operation on the panel depending on the switch control command sent from the reliability chamber control module and the information about voltage regulation transmitted from the bias module. Compared with the prior art, LCD panels undergo the aging testing before being packaged, thereby shortening a time period of manufacturing LCD panels and enhancing production efficiency.

Abstract: A method for testing a mask article includes the steps of electrically connecting the mask article to an electrical sensor, applying a bias voltage to a plurality of testing sites of the mask article with a conductor, measuring at least one current distribution of the testing sites with the electrical sensor, and determining the quality of the mask article by taking the at least one current distribution into consideration.

Abstract: An embodiment of the present invention discloses a method for detecting crosstalk of a liquid crystal display panel, involving detection on a liquid crystal display panel for defect of special crosstalk of the liquid crystal display panel. The method comprises: inputting signals into the liquid crystal display panel to be detected so that a detection pattern is displayed on the liquid crystal display panel to be detected; a gray-scale value for all the pixels in an intermediate region is 0; in other regions a gray-scale value for all the pixels in first pixel groups is the same, a color and gray-scale value for all the pixels in second pixel groups are the same, and the gray-scale value for all the pixels in the second pixel groups differs from that for all the pixels in the first pixel groups; the first pixel groups and the second pixel groups are same in shape, and both are distributed alternatively in both transverse and longitudinal directions in the other regions.

Abstract: An embodiment of the present disclosure provides a method of manufacturing an array substrate, comprising at least a step of forming a TFT pattern in a pixel region and correspondingly forming a TFT testing pattern in a testing region, wherein before forming a passivation layer to cover the pixel region and the testing region, a step of removing a gate insulation layer thin film above a testing line lead in the TFT testing pattern.

Abstract: Systems, methods, and devices are provided to reduce or eliminate mura artifacts on electronic displays. For example, pixels may be programmed to a uniform gray level before all or a substantial number of gates of the pixels are activated. The voltages on some or all source lines that supply the pixels may be measured. A mura artifact may be seen when voltage differences on the source lines are present. As such, operational parameters of the electronic display may be adjusted to reduce or eliminate the mura artifact by reducing the voltage differences.

Abstract: A mother substrate including a plurality of organic light emitting display panels that include pixel circuits having a simple structure, is designed so that a sheet unit test may be performed while preventing or reducing brightness variation during sheet unit test, and a sheet unit test method for the mother substrate. The mother substrate also includes first and second wiring line groups and a compensating unit. The compensating unit is coupled to a coupling line for coupling a wiring line from among the first and second wiring line groups for transmitting a sheet unit test signal to the panels. The compensating unit is also for subtracting a voltage corresponding to a threshold voltage of a driving transistor included in a pixel of the panels from the sheet unit test signal before transmitting the sheet unit test signal to the panels.

Abstract: An electronic test system to evaluate the pixel and array properties of active-matrix displays that use charge or current sensitive circuits attached to the array data lines is described. Leakage-current, charging time, and other metrics can be measured for all pixels in the array without electrical or optical connection to the interior of the array. Charge or current sensitive amplifiers and selected voltage drivers may be used in conjunction with variable timing and voltages to determine individual transistor properties over an entire array in just a few seconds. Signals to be measured may be injected in several ways. Ultimately, an output signal for each pixel is measured. Thus, based on the output signal, the charging time or current, the leakage time or current, and other pixel or transistor parameters may be characterized for the entire array.

Abstract: An organic light emitting diode display device that includes a first substrate, a second substrate, a sealing material sealing a space between the first and second substrates and applied along an edge of the second substrate, an interconnection disposed inside the sealing material, and a test unit connected to both ends of the interconnection and configured to measure a preset voltage applied to the interconnection and compare the measured voltage with a reference voltage to determine whether a crack occurred in the sealing material or not. Further, the same effect can be obtained by measuring and comparing currents instead of the voltages.

Abstract: A method for testing a mask article includes steps of electrically connecting the mask article to an electrical sensor, applying a bias voltage to a plurality of testing sites of the mask article with a conductor, measuring at least one current distribution of the testing sites with the electrical sensor, and determining the quality of the mask article by taking the at least one current distribution into consideration.

Abstract: The present provide a technical solution by introducing a method of detecting a liquid crystal display panel, characterized in that the method includes a) providing an all-connection lit-up fixture having a plurality of probes. And b) performing a lit-up test by establishing an electrical coupling between the probes and a plurality of contacts on the liquid crystal display panel. By this arrangement. the liquid crystal display panel can be readily pin-pointed the defects after the shorting bar is cut off as the fixture provided can readily restore the lit-up test Accordingly, the capability of lit-up test is therefore enhanced.

Abstract: A detecting method of abnormality of a differential signal receiving terminal of a liquid crystal displaying module, including: inputting high level signals to LVDS0+, LVDS0?, LVDS1+, LVDS? in order, in which only one high level signal is inputted to one of the differential signal lines and the other differential signal lines are kept in high impedance states simultaneously; and receiving feedback signals from all the differential signal lines and determining whether the differential signal lines of detecting units are abnormal or not according to the received feedback signals. The abnormality of the differential signal lines includes terminal resistive opens of the differential signal lines, a short circuit between two adjacent groups of differential signal lines, and short circuits of the differential signal lines to ground or to a power supply caused by abnormal power supplying sequence.

Abstract: A method and a device for carrying out the method are disclosed in order to aid in the search for faulty photovoltaic modules. In a photovoltaic system comprising multiple PV units electrically connected in parallel, each PV unit is assigned its own fixed current sensor. Furthermore, each PV unit can be removed from the parallel circuit by a switching device.

Abstract: A method for detecting a foreign particle trapped between substrates of a liquid crystal display panel, by which a potential short caused by the particle can be made into a short with reliability, and thus it is possible to make a display defect manifest itself that is caused by the particle. The method is for detecting the presence of a foreign particle trapped between flexible substrates (21, 26) of a liquid crystal display panel (20), between the substrates liquid crystals filled, and the method includes making the panel pass between supporting rollers (3) arranged to support one surface of the panel, and a pressing roller (4) disposed at a position opposed to a space between the supporting units and arranged to press the other surface of the panel, bending the panel, and displacing the substrates with respect to each other in their surface directions.

Abstract: An inspection circuit for inspecting an electro-optic device that includes a data line, a scanning line, a pixel portion, a driving circuit, and a first terminal portion through which a first power supply voltage is supplied to the driving circuit. The inspection circuit includes an inspection line electrically connected to an inspection unit inspecting the pixel portion, a connection circuit electrically connecting the inspection line to the data line, and a supply circuit supplying a control signal for controlling conduction between the data line and the inspection line to the connection circuit. The supply circuit is driven using a second power supply voltage supplied through a second terminal portion.

Abstract: An electronic test system to evaluate the pixel and array properties of active-matrix displays that use charge or current sensitive circuits attached to the array data lines is described. Leakage-current, charging time, and other metrics can be measured for all pixels in the array without electrical or optical connection to the interior of the array. Charge or current sensitive amplifiers and selected voltage drivers may be used in conjunction with variable timing and voltages to determine individual transistor properties over an entire array in just a few seconds. Signals to be measured may be injected in several ways. Ultimately, an output signal for each pixel is measured. Thus, based on the output signal, the charging time or current, the leakage time or current, and other pixel or transistor parameters may be characterized for the entire array.

Abstract: The present invention discloses a detection circuit in the assembly process of an LCD panel. Through the testing pad collection and the switch collection, the signal line of each of the panel units connects to the corresponding testing signal pad of the testing pad collection respectively through the input terminal and the output terminal of the control switch of the switch collection, and the control terminal of the control switch electrically connects to the control signal pad in order to selectively apply an individual testing to one of the panel units. The present invention also provides a manufacturing method for an LCD panel. Accordingly, the present invention can simplify the detection circuit and reduce the load of the detection circuit.

Abstract: The present invention discloses a switch control unit, a test apparatus and method for a liquid crystal cell. The switch control unit controls a signal input to the liquid crystal display driver and controls the output of the signal from the liquid crystal display driver accordingly, and includes a control signal generator and a switch module. The test apparatus for the liquid crystal cell comprises: a switch control unit connected with a gate driver, for controlling ON and OFF of a signal input to the gate driver and controlling ON and OFF of a gate scan signal accordingly. The test method for the liquid crystal cell comprises: inputting a test signal; controlling ON and OFF of a gate scan signal by controlling ON and OFF of a signal input to a gate driver so as to determine the badness positions on a screen.

Abstract: A test method of a liquid crystal display panel is provided. The liquid crystal display panel includes a plurality of pixels and a testing pad. The pixels are disposed at intersections between a first, a second, and a third data lines and a plurality of scan lines. In the test method, each of the scan lines is driven to connect liquid crystal capacitors of the pixels to the first, the second, and the third data lines. A first and a second test voltages are respectively supplied to the first and the second data lines, wherein the first test voltage is not equal to the second test voltage. The first data line is floated. The floated first data line is measured through the testing pad to determine whether the liquid crystal capacitors of the pixels electrically connected to the first and the second data lines are electrically connected with each other.

Abstract: A method for testing a mask article includes the steps of electrically connecting the mask article to an electrical sensor, applying a bias voltage to a plurality of testing sites of the mask article with a conductor, measuring at least one current distribution of the testing sites with the electrical sensor, and determining the quality of the mask article by taking the at least one current distribution into consideration.

Abstract: The present invention relates to a substrate with a substrate test circuit. In an embodiment, by making the length of the wiring from a first data-line-test input terminal to a first panel equal to that of the wiring from a second data-line-test input terminal to the first panel, the input resistances between two test input terminals of a first data-line-test line and the first panel are identical, and thus when a data line of the first panel is detected, the voltage drops of test signals inputted from the two test input terminals are the same, and the test signals actually loaded to the first panel are the same and the detecting abilities are identical.

Abstract: A semiconductor device includes a common probing pad; an internal voltage generation unit having a plurality of internal voltage generation blocks configured to generate a plurality of internal voltages; and a probing voltage selection unit configured to transfer an internal voltage selected from the internal voltages to the common probing pad in response to a plurality of voltage selection signals.

Abstract: A method and system for determining the Vcom for a liquid crystal display by using a light diffusing unit.

Abstract: A method for characterizing an electric signal (10), includes the propagation of a first light beam (18) through an electro-optical medium (17) in a first propagation direction, wherein at least one optical property of the medium changes when it is submitted to an electrical field, and the propagation of a second light beam (19) through the electro-optical medium in a second propagation direction different from the first direction. For each light beam, a measurement of a variation in an optical property of the light beam (18; 19) due to the propagation of the beam in the medium (17) is used for determining the propagation direction (20) of an electric signal (10) submitting the medium to an electrical field. A device for implementing the method, and an electro-optical probe implemented in the device are also disclosed. Applicability: electro-optical sampling of a component, characterization of electric pulses in guided structures.

Abstract: The embodiment is to provide a liquid crystal display device capable of detecting malfunctions. The liquid crystal display device includes pixels configured to be connected to scan lines and data lines, data pads electrically connected to the data lines, a data integrated circuit supplying data signals to the data lines through the data pads, first data transistors coupled to the data pads, and second data transistors coupled to the data lines. The first data transistors are disposed on the data integrated circuit and the second data transistors are separated from the data integrated circuit.

Abstract: In a test method of a display panel, a test signal and a test voltage are generated according to a test control signal. A display area of the display panel is tested based on the test signal and the test voltage. A driving voltage line and an on/off voltage line formed on the display panel are tested based on the test signal and the test voltage.