Abstract: The present invention provides an apparatus and method for performing an ion concentration analysis in an LCD panel. The method comprises: adjusting common voltage of an LCD panel to be tested and a standard LCD panel, respectively, and obtaining a first common voltage of the LCD panel to be tested and a first common voltage of the standard LCD panel; adjusting the first common voltage of the standard LCD panel and the first common voltage of the LCD panel to be tested, respectively, according to a predetermined testing voltage; loading a first image to the standard LCD panel and the LCD panel to be tested, respectively, and maintaining the first image in the standard LCD panel and the LCD panel to be tested for a period of time; switching the loaded first image to a second image; and analyzing ion concentration in the LCD panel to be tested on the basis of image sticking levels appearing in the standard LCD panel and the LCD panel to be tested.

Abstract: In a mother substrate for a lower substrate, a substrate for a display panel and a method of manufacturing a display panel, the substrate for the display panel includes a lower substrate and an upper substrate facing the lower substrate. The lower substrate includes an inspection line that receives a first inspection signal externally provided, a gate driving part that outputs a second inspection signal in response to the first inspection signal from the inspection line, and a pixel part driven in response to the second inspection signal. The inspection line is disposed on a grinding area. Thus, the display panel may have an enhanced productivity and an improved yield, on which the gate driving part is formed.

Abstract: A method of controlling a picture quality of a flat panel display for automatically analyzing a shape, a size, and brightness of a display stain of indeterminate shape having an irregular pattern, and compensating brightness of the display stain of indeterminate shape on the basis of the analyzed result is disclosed.

Abstract: A display device testing system and a method for testing a display device using the same, which are capable of testing whether a display panel is defective or not according to a variation of the frame frequency and whether the driver module operates normally or not even at a voltage higher than a normal operation voltage. The display device testing system includes a display panel including a plurality of gate lines; a driver module including a gate driver unit for sequentially supplying a gate voltage to the plurality of gate lines in response to a test, vertical synchronization start signal; and a testing module for supplying a test vertical synchronization start signal to the driver module.

Abstract: A liquid crystal display includes; a plurality of pixels, each of which comprises a switching element having a control terminal and an input terminal connected to a corresponding gate line of a plurality of gate lines and a corresponding data line of a plurality of data lines, respectively, at least one test pixel comprising at least one test switching element having a control terminal connected to a corresponding at least one gate line of a plurality of gate lines, and a sensing unit which measures a leakage current flowing through the test pixel and to control compensation driving of a threshold voltage of a switching element of a pixel according to the measured leakage current.

Abstract: A differential signaling system, wherein a first wiring and a second wiring are coupled between a sending end and a receiving end as a differential signal line. A termination resistor is coupled between the first wiring and the second wiring in the receiving end side. A test circuit is coupled to the termination resistor in parallel, and amplifies and detects a variation of a differential impedance due to the differential signal line. The test circuit includes: a differential test amplifier for amplifying a variation in the differential impedance of the first wiring or the second wiring; a switching unit installed at an input terminal of the differential test amplifier for controlling an operation of the differential test amplifier; and a peak detector for converting an output signal of the differential test amplifier into a direct current component; and a phase detector for detecting a skew, a time delay, and/or a phase difference of a signal inputted to the differential signal line.

Abstract: A test device for detecting malfunction of a liquid crystal display device, and also provide a liquid crystal display device incorporated with such test device. The test device comprising a comparator circuit for detecting which of the rows or columns of the lines is selected, an encoder circuit receiving the detection result from the comparator circuit, a plurality of bus lines and a read-out circuit reading the voltage level of the bus lines from the encoder circuit to determine if the encoded number is identical with the number of the selected row or column line, wherein the comparator circuit, the encoder circuit, and the read-out circuit being built in the same substrate as the liquid crystal display elements.

Abstract: The present technology discloses a testing apparatus and a testing method for liquid crystal display (LCD). The apparatus comprises a testing chamber, at least one support device in the testing chamber and an adjusting device. The support device comprises a support stage located at the bottom of the testing chamber and a support rail located on a side wall of the testing chamber. The LCD is supported by the support stage and the support rail. The adjusting device is used to control the support rail to adjust angle of the LCD relative to the support stage.

Abstract: A liquid crystal which self-generates a high voltage for a high voltage stress test, a connector for testing the liquid crystal display and a method of testing the liquid crystal display include an internal connector having an input pin which receives a power supply voltage from an outside source, a no-connect pin, a ground pin and a power supply unit connected to the no-connect pin and the ground pin. The power supply unit receives the power supply voltage and outputs a gate-on voltage and a gate-off voltage whose levels are adjusted according to whether there is an electrical connection between the no-connect pin and the ground pin. Agate driving unit receives the gate-on voltage and the gate-off voltage and outputs a gate signal and a liquid crystal panel having a plurality of pixels receives the gate signal and displays images in response to the gate signal.

Abstract: A liquid crystal display device includes a pixel matrix where a plurality of gate lines and a plurality of data lines cross each other and a plurality of liquid crystal cells are arranged, first data switching thin film transistors respectively connected to data lines of a first group of the data lines, and second data switching thin film transistors respectively connected to data lines of a second group of the data lines.

Abstract: An active device array includes a plurality of scan lines, a plurality of data lines, a plurality of pixel structures, a first testing circuit, a second testing circuit, a third testing circuit and a fourth testing circuit. Each of the pixel structures is connected to one of the scan lines and one of the data lines. The first testing circuit is electrically connected to the odd scan lines; the second testing circuit is electrically connected to the (4n+1)th scan lines wherein n is zero or a positive integer; the third testing circuit is electrically connected to the even scan lines; the fourth testing circuit is electrically connected to the (4n+2)th scan lines.

Abstract: It is the primary object of the present invention to provide a simple and accurate testing circuit and a testing method while occupying as small space as possible in an image display device. The testing circuit including a NAND circuit connected in series is mounted on the image display device. A broken wiring on a data signal line and a defect in a data latch circuit can be detected by observing an output waveform from the testing circuit. Accordingly, a broken wiring or the like on the data signal line and a scanning line and a defect in the latch circuit can be tested simply and accurately without an expensive testing apparatus and a great deal of time while occupying as small space as possible.

Abstract: A method for detecting a foreign particle trapped between substrates of a liquid crystal display panel, by which a potential short caused by the particle can be made into a short with reliability, and thus it is possible to make a display defect manifest itself that is caused by the particle. The method is for detecting the presence of a foreign particle trapped between flexible substrates (21, 26) of a liquid crystal display panel (20), between the substrates liquid crystals filled, and the method includes making the panel pass between supporting rollers (3) arranged to support one surface of the panel, and a pressing roller (4) disposed at a position opposed to a space between the supporting units and arranged to press the other surface of the panel, bending the panel, and displacing the substrates with respect to each other in their surface directions.

Abstract: A COG type LCD device includes a first substrate including a display area and first, second, third and fourth non-display areas, gate and data lines in the display area on the first substrate and defining pixel regions, switching thin film transistor at each crossing portion of the gate and data lines and connected to the gate and data lines, a pixel electrode in each pixel region and connected to the thin film transistor, first testing thin film transistors in the second non-display area connected to the data lines and spaced apart from each other with a constant interval therebetween, first, second and third data testing lines connected to one ends of the data lines through the first testing thin film transistors, first, second and third data testing pads connected to the first, second and third data testing lines, respectively, data link lines in the first non-display area and connected to another ends of the data lines, second testing thin film transistors in the first non-display area and connected to th

Abstract: A test method of a liquid crystal display device includes driving pixel electrodes through a plurality of switching elements by applying a first test signal to a first pad and a second test signal to a second pad, and cutting a connection between a driving signal wire and a first display signal wire. The liquid crystal display device includes a first display signal wire having a plurality of a first display signal lines, a second display signal wire having a plurality of a second display signal lines that cross the first display signal lines, a plurality of switching elements each of which is connected to both of one of the first display signal lines, pixel electrodes connected to the switching elements, and a driving signal wire including first and second pads respectively connected to the first display signal wire at a near end thereof and at an intermediate portion thereof.

Abstract: A test device for checking the validity of display signals pertaining to a predefined image includes a device for ascertaining image data from the display signals, device for determining a test value of the image data, and a comparator unit for comparing the ascertained test value with a stored test value pertaining to the image, a validity of the display signals being established in the case where the two test values coincide.

Abstract: An evaluation device of ion behavior includes: a voltage oscillator (17) for applying, to a liquid crystal cell, a voltage including a direct-current voltage component and a voltage including no direct-current voltage component; a residual DC voltage measuring section (20) for measuring, per predetermined temperature, a plurality of combinations of (a) an application time during which the voltage including a direct-current voltage component is applied and (b) a residual DC voltage occurring after the application of the voltage; a rate measuring section (21) for measuring, per temperature, an adsorption rate coefficient of ions to an interface between a liquid crystal and an alignment film, and a desorption rate coefficient of ions from the interface, by performing curve fitting according to [Math.