Abstract: A high performance dynamic logic compatible transparent latch is provided. The latch comprises a first switchable invertor circuit, a second invertor circuit, and a third switchable invertor circuit. The first invertor, having a data input, a clock input and an output, is enabled by a first phase of an input clock and is disabled by a second phase of the input clock. The second invertor has an input connected to the first invertor output. The third invertor has a clock input, and is enabled by the second phase of the input clock and disabled by the first phase of the input clock, and further has an input connected to the second invertor output and an output connected to the second invertor input.

Abstract: A high-performance dynamic flip-flop circuit implementation. The dynamic flip-flop circuit comprises an "implicit" one-shot to generate a delayed clock output (319). The flip-flop comprises a delay block (317) coupled to a clock input (305). The flip-flop may be a D-type flip-flop. In a positive-edge-triggered embodiment of the flip-flop, a falling edge (440) of the delayed clock output (319) follows a rising edge (444) of a clock signal after a delay period (448). The flip-flop clocks in new data at a data input (305) in response to the clock input (310) during this delay period (448). Data is held in a storage block (360). The flip-flop has extremely good transient characteristics, especially set-up and clock-to-output times. The flip-flop consumes no static power.

Abstract: A clock signal providing circuit with enable and pulse generator with enable for use in a block clock circuit of a programmable logic device (PLD), the block clock circuit for allocating multiple clock signals to each macrocell of the PLD. The clock signal providing circuit includes circuitry which functions to change states in response to a pin clock signal when an enable signal is active, and to maintain its current state when the enable signal is inactive. The pulse generator includes circuitry which functions to provide a pulse at a first edge of a pin clock signal if an enable signal remains active from prior to receipt of the first edge of the pin clock signal.

Abstract: A latch comprises first and second NFETs and a first inverter. Data is applied without inversion to the gate of the first NFET and via the first inverter to the gate of the second NFET. A third NFET has a drain connected to the sources of the first and second NFETs. A clock is applied to the gate of the third NFET. Thus, there is only one NFET subject to the constant switching the clock, and therefore the constant power dissipation caused by the clock. To latch the data from the first and second NFETS, first and second inverters are connected in paralle with each other such that the output of each inverter is connected to the input of the other inverter. The input of one of the inverters is connected to the drain of the first NFET and the input of the other inverter is connected to the drain of the second NFET. A second stage of latching is also disclosed.

Abstract: Systems allowing smooth, trouble-free, "transparent" switchover from a "Primary clock" to a "Secondary clock", with no loss of clock or essential pulse-width, and where the "Secondary clock" may be completely separate from, and independent of, the "Primary clock.

Abstract: A logic circuit is described. The logic circuit generates a first signal state in response to a first set of input signals, generates a second signal state in response to a second set of input signals, activates a bypass switch in response to the first signal state, and bypasses a domino logic unit in response to the first signal state.

Abstract: A scan cell is described which can function as either a positive edge triggered latch or a double edge triggered latch during normal functional operation of circuitry to be scan tested. It functions only as a positive edge triggered latch when scan testing of a logic structure is to be performed.

Abstract: A scan flip-flop includes a data input, a scan input, a mode selection input, a mode control input and a clock input. When the mode selection input is set to a first selection value, and the mode control input is set to a first control value, the scan flip-flop operates as a D flip-flop. When the mode selection input is set to a second selection value, the scan flip-flop shifts in a scan input value on the scan input when one of the mode control input and the clock input is toggled. Also, as long as the mode selection input is set to the first selection value, and the mode control input is set to a second control value, the scan flip-flop holds a current value within the scan flip-flop.

Abstract: A digital integrated circuit provided with a dual latch clocked LSSD that includes a master latch coupled to a slave latch such that it operates in at least three operational modes. Preferably the three modes of the dual latch clocked LSSD include a functional mode, a capture mode, and a shift mode. In the functional mode, the dual latch clocked LSSD operates as an edge-triggered flip-flop storage element. In the capture mode, the dual latch clocked LSSD operates as a level sensitive latch storage element controlled by the system clock, one of two scan clock signals, and, preferably, by a test mode input signal. In the shift mode, the dual latch clocked LSSD again operates as a level sensitive latch storage element, but is controlled by a pair of shift clocks. By separating the capture mode from the functional mode, the dual latch clocked LSSD is exceptionally resistant to skew problems in both the capture and the shift modes.

Abstract: A data latch with reduced data signal leakage includes a latch circuit and a clock buffer circuit which provides a differential clock signal to the input transmission gate of the latch circuit. The clock buffer circuit is biased between upper and lower supply voltage potentials which are higher and lower, respectively, than those between which the latch circuit is biased. This causes the differential clock signal to be overdriven with respect to the incoming data signal which is latched by the latch circuit. As a result, the input transmission gate of the latch circuit is reverse-biased during the inactive state of the differential clock signal, thereby isolating the storage node within the latch circuit and preventing signal leakage therefrom.

Abstract: A high speed bi-polar D latch circuit uses cross-coupled current-biased buffering transistors to block control current from output resistors so that the clock and data controls are not connected directly to the outputs of the latch. The memory cell portion of the latch which controls the latch output is constantly biased. Latch output swing is minimally affected by clock/data switching due to the buffering action of the emitter followers on the latch outputs. Changing the latch state is accomplished by changing the base-emitter voltage of the buffering transistors through the emitter followers. The circuit provides greater noise immunity at latch outputs during clock transitions and faster rise/fall times of output waveforms.

Abstract: A shift register for scanning a liquid crystal display includes cascaded stages. A given stage is formed with an input transistor switch that is responsive to an output pulse of a stage upstream in the chain of the cascaded stages. An output pulse of the given stage is produced in a pull-up transistor of a push-pull amplifier. A third transistor responsive to an output signal of a stage downstream of the given stage applies a control signal to a gate electrode of the pull-down transistor to render the pull-down transistor conductive.

Abstract: A differential latch circuit which places very little capacitance on the clock line is described. The invented differential latch circuit utilizes differential data signals, and thus, has two data lines. The transfer portion of the latch receives the differential data signals and passes them to the storage portion responsive to a control signal. The storage portion stores and outputs the differential data signals. In a first embodiment, each data line in the transfer portion comprises a single transistor pass gate for selectively passing one of the differential data signals responsive to the control signal, which is coupled to the gate terminals of both pass gates.

Abstract: A flip-flop circuit includes a first switch for controlling passing of input data in response to a single clock signal, a first inverter for inverting the data passed through the first switch, a second inverter for inverting the data output from the first inverter into inverted data and for inputting the inverted data to the first inverter, a second switch for controlling passing of the data output from the first inverter in response to the single clock signal, a third inverter for inverting the data passed through the second switch, and a fourth inverter for inverting the data output from the third inverter into inverted data and for inputting the inverted data to the third inverter, where the first inverter has a driving capability larger than that of the second inverter, and the third inverter has a driving capability larger than that of the fourth inverter.

Abstract: A digital integrated circuit provided with a dual latch clocked LSSD that includes a master latch coupled to a slave latch such that it operates in at least three operational modes. Preferably the three modes of the dual latch clocked LSSD include a functional mode, a capture mode, and a shift mode. In the functional mode, the dual latch clocked LSSD operates as an edge-triggered flip-flop storage element. In the capture mode, the dual latch clocked LSSD operates as a level sensitive latch storage element controlled by the system clock, one of two scan clock signals, and, preferably, by a test mode input signal. In the shift mode, the dual latch clocked LSSD again operates as a level sensitive latch storage element, but is controlled by a pair of shift clocks. By separating the capture mode from the functional mode, the dual latch clocked LSSD is exceptionally resistant to skew problems in both the capture and the shift modes.

Abstract: A shift register for scanning a liquid crystal display includes cascaded stages. A given stage is formed with an input transistor switch that is responsive to an output pulse of a stage upstream in the chain of the cascaded stages. The input transistor switch charges a capacitance associated with a control electrode of a switched pull-up output transistor. The voltage in the capacitance conditions the output transistor for generating an output pulse when subsequently a clock signal occurs to the output transistor. A clamping transistor discharges the capacitance in a manner to prevent further generation of the output pulse when subsequent pulses of the clock signal occur. The clamping transistor is responsive to an output pulse of a stage downstream in the chain. An impedance that is developed at the control electrode is substantially higher after the clamping operation occurs and remain high for most of the vertical interval.

Abstract: A high speed processing flip-flop contains a header circuit and a pulse flip-flop circuit. The header circuit is a clock pre-processing circuit that generates clock pulses for operation of the pulse flip-flop circuit, and the pulse flip-flop circuit is a single stage latch. The header circuit contains functional logic including the flip-flop functionality for the high speed processing flip-flop, and any additional processing functions, such as multiplexing. The header circuit also contains a pulse modulator that generates selected clock pulses, based on the functional logic, for the pulse flip-flop circuit. The pulse flip-flop circuit contains storage, a driver circuit, and, for each data input, an input buffer, and a pass gate. The pulse flip-flop circuit couples the data to the driver circuit and storage during an active clock pulse for the corresponding data. Consequently, data input to the pulse flip-flop is not delayed by logic processing.

Abstract: A data compressor generates codewords representative of the location and length of a string match between an input data stream and a CAM array vocabulary table. A data decompressor looks up the codewords for a string match in its vocabulary table. The CAM array is arranged in a serpentine configuration to reduce track layout. A column priority encoder reverses the priority of alternate rows to maintain the logical flow through the CAM array. The CAM array uses a flipflop with a common control circuit to transfer and refresh data through the flipflop.

Abstract: A semiconductor integrated circuit comprises a pair of complementary groups of MOS transistors disposed between first and second reference potentials and switched on and off through a pair of complementary groups of input signals inputted to gates thereof, a first switching transistor switched on and off by a clock signal, and a pair of cross-connected second switching transistors disposed between the reference potentials and connected with the pair of groups of MOS transistors. With this construction, unlike prior art techniques, the semiconductor integrated circuit of the present invention operates with greater speed and reduced power consumption, without increasing the channel width of the constituent transistor, and without the need for an inverted clock signal.