Abstract: In one embodiment, an integrated circuit may be designed using a library of clocked circuits that have programmable clock delays that may be inserted on the clock input to the clocked circuits. During the design process, timing paths which are challenging due to significant variations across operating states, process corners, and/or temperature may be met by using the clocked circuits with programmable delays and inserting a delay control circuit that programs the delays based on the current operating state, process corner used to manufacture the integrated circuit, and/or temperature. That is, different delays may be selected by the delay control circuit depending on inputs that identify the operating state, the process corner, and/or the temperature. Because the clock delay is intentionally skewed, the timing of the path may be different at different operating states, temperatures, or process corners and thus may meet timing by changing the clock skew during operation.

Abstract: According to one or more embodiments of the present invention, a delay circuit includes a first sub-circuit that delays a leading edge of an input signal according to first control settings, the input signal being for an electric device. The delay circuit further includes a second sub-circuit that delays a trailing edge of the input signal according to second control settings. An output signal from the delay circuit is received by the electric device.

Abstract: A timing circuit includes an input for receiving the control signal from a logic circuit operating with a first supply voltage and an output for supplying a control signal to a circuit operating with a second supply voltage different from the first supply voltage. The timing circuit also includes a plurality of delay elements connected in series between the input and output and supplied with the first supply voltage, and one or more NFET footer transistors that couple respective delay elements to a negative supply rail, the NFET footer transistors having the second supply voltage applied to their gates. A memory apparatus employing such a circuit is provided.

Abstract: A delay cell includes: a plurality of delay elements coupled in series; and at least one three-phase inverter that is coupled in parallel to at least one of the delay elements, and that receives through a first control terminal a first bias voltage for compensating for a variation of a power source voltage, and receives through a second control terminal a second bias voltage for compensating for a variation of a ground voltage.

Abstract: A motor drive device includes an inverter circuit, a first switching circuit to switch a path between a power supply and the inverter circuit to conduction and interruption, a second switching circuit to switch a path between the inverter circuit and the motor, a current detector to detect a current of the inverter circuit, a controller to, in a case in which a current value of the detected current is not within a predetermined range, output a command voltage which commands switching from the conduction to the interruption, a driver to boost the command voltage input from the controller and output the boosted command voltage to each switching circuit, and a delay circuit disposed between the second switching circuit and the driver to set a timing at which the command voltage is input to the second switching circuit to be later than a timing at which the command voltage is input to the first switching circuit.

Abstract: Provided is a selectable delay buffer for tuning a delay path in a circuit. The selectable delay buffer comprises a first delay segment configured to pass an input signal to an output terminal within a first range of time delays, a second delay segment configured to pass the input signal to the output terminal within a second range of time delays that is different from the first range, and a segment selection switch configured to selectively couple the delay segments to the output terminal based on received selection information that indicates which delay segment to couple to the output terminal.

Abstract: A delay circuit and an electronic system equipped with the delay circuit are provided. The delay circuit includes an input terminal, an output terminal, a bias current generator and a delay generator. The bias current generator is coupled between a first reference voltage and a second reference voltage, and is configured to generate a bias current. The delay generator is coupled between the first reference voltage and the second reference voltage, and is configured to generate a delay of the delay signal relative to the input signal according to the bias current. The bias current generator includes a current mirror, a current module and a transistor. The delay generator includes a first current mirror sub-circuit, a second current mirror sub-circuit, a transistor, a capacitor, a switch circuit and a Schmitt inverter, wherein the output terminal is coupled to the Schmitt inverter to output the delay signal.

Abstract: A current shunt monitor (CSM) circuit for monitoring the current through a sense resistor. An analog circuit provides an analog output signal proportional to the voltage across the sense resistor. A power supply includes a fixed voltage power supply at a first voltage supply level and a floating power supply. The floating power supply operates at a second voltage supply level referenced from the voltage level on a voltage input and a floating ground. The voltage input varies from a voltage level above the first voltage supply level to a voltage level below the first voltage supply level, and the floating power supply provides power to the analog circuit at least when the voltage level of the voltage input is above the first voltage supply level. A crossover circuit switches power from the floating power to the fixed voltage power supply at the first voltage supply level upon detecting the voltage level on the voltage input proximate in value to the first voltage supply level.

Abstract: Methods and apparatus relating to techniques for power management. In an example, an apparatus comprises logic, at least partially comprising hardware logic, to generate a voltage/frequency curve for at least one of a core or a sub-core in a processor and manage an operating voltage level of the at least one of a core or a sub-core using the voltage/frequency curve. Other embodiments are also disclosed and claimed.

Abstract: Techniques are disclosed relating to dual-edge triggered (DET) clock gater circuitry. In some embodiments, an apparatus includes a first series of DET clock gater circuits configured, when the DET clock gater circuits are not gating an input clock signal, to provide an output clock signal to sequential circuitry. In some embodiments, ones of the DET clock gater circuits are controlled by respective control signals and are configured to maintain a mode indicator indicating whether or not the DET clock gater circuit is inverting the polarity of its input clock when generating an output clock. In some embodiments, the apparatus also includes a first adjustable delay circuit configured to adjust delay imposed on the output clock signal from the first series of DET clock gater circuits based on the number of DET clock gater circuits in the series that are in a particular mode.

Abstract: A delay circuit includes a plurality of cascaded delay elements responsive to control signals. Each delay element is configurable to receive an input signal on a forward path and return the input signal on two return paths. A control unit is connected to the plurality of cascaded delay elements and configured to generate a first set of control signals for defining a first configuration of the plurality of cascaded delay elements, a second set of control signals for causing a delay element of the plurality of cascaded delay elements to change from a powered off status to a powered on status while configured in an initialization mode, and a third set of control signals for defining a second configuration of the plurality of cascaded delay elements.

Abstract: An input interface circuit is provided. When a pad voltage is higher than a default operating voltage, a clamping circuit maintains the voltage at a first node at the default operating voltage. A first inverter is coupled between the first node and a second node. A voltage of a third node is adjusted along with the pad voltage (input end of a high-voltage buffering circuit) and the voltage at the second node, and causes the voltage at the third node has a same voltage change trend as the pad voltage. A second inverter is coupled between the third node and a fourth node. A voltage recovery circuit has its input end coupled to the fourth node and its output end coupled to the third node, and selectively couples the third node to a power line or a ground line according to the voltage at the fourth node.

Abstract: An example method of calibrating a source-synchronous system includes: performing initial calibration of a source-synchronous receiver, which is configured to receive data signals and a strobe, to determine an initial strobe delay and initial data delays; setting a strobe delay circuit that delays the strobe to have the initial strobe delay and data delay circuits that delay the data signals to have the initial data delays; measuring first data eye margins of the data signals at a first time; calculating metrics for the data signals based on the first data eye margins; and measuring second data eye margins of the data signals at a second time; and updating the data delay circuits and the strobe delay circuit based on the second data eye margins and the metrics.

Abstract: There is disclosed herein current-mode circuitry for measuring a timing difference between first and second signals, the circuitry comprising: a tail node configured during a measurement operation to receive a current pulse in dependence upon the first signal; first and second nodes conductively connectable to said tail node along respective first and second paths; and steering circuitry configured during the measurement operation to control such connections between the tail node and the first and second nodes based on the second signal to steer the current pulse so that a first portion of the current pulse passes along the first path and a second portion of the current pulse passes along the second path in dependence upon the timing difference between said first and second signals; and a signal output unit configured to output a measurement-result signal indicating a measure of said timing difference based upon one or both of the first and second portions.

Abstract: A source driver circuit is provided which includes a plurality of digital multi-spread (hereinafter referred to as “DMS”) blocks configured to generate DMS signals for controlling an output timing of a data signal to be transmitted to a display panel from a plurality of clocks which are delayed as much as a reference period one another. Each DMS block includes a plurality of sub blocks. Each of the sub blocks includes an enable signal generator and a delay unit. The enable signal generator generates an enable signal for outputting target DMS signals of the DMS signals using clocks selected from the plurality of clocks. The delay unit delays the DMS signals such that the DMS signals are sequentially delayed by the reference period.

Abstract: The present invention teaches a level shift device and a related method. The level shift device contains a first input terminal, a second input terminal, a number of output terminals, and a pulse generation circuit. The first input terminal is for receiving a first pulse input signal. The second input terminal is for receiving a second pulse input signal. The pulse generation circuit cyclically produces pulse output signals, one on each output terminal, according to the first and second pulse input signals. The level shift device further contains a third input terminal for receiving a third pulse input signal. The pulse generation circuit controls the number of pulse output signals produced within each cycle according to third pulse input signal. The present invention is able to produce various numbers of pulse output signals, which is flexible for different applications without investing a new design.

Abstract: A tunable delay circuit includes a first multiplexer, a delay chain, and a second multiplexer. The first multiplexer selects an input signal or a feedback signal as a first output signal according to an enable signal. The delay chain delays the first output signal for different time periods so as to generate a plurality of delay signals. One of the delay signals is used as the feedback signal. The second multiplexer selects one of the delay signals as a second output signal according to a pass signal.

Abstract: Provided is a semiconductor switching device such that there is a reduction in surge or loss in multiple kinds of semiconductor switching element provided in parallel and of differing turn-on/turn-off operation characteristics. The semiconductor switching device includes a switching circuit unit that includes in parallel multiple kinds of semiconductor switching element having different turn-on/turn-off operation characteristics and turns a main current on and off, a driver circuit that includes a current source terminal and a current sink terminal and outputs drive signals that collectively turn the semiconductor switching elements on and off from the current source terminal and the current sink terminal, and an impedance element that is interposed between the current source terminal and the current sink terminal in the driver circuit and causes timings of operations by which the semiconductor switching elements are turned on and off to differ from each other.

Abstract: In a semiconductor device for power management and a semiconductor system including the same, the semiconductor device includes an open loop source generator configured to generate an open loop source, an interface configured to output a dynamic voltage source (DVS) code based on the open loop source, a monitoring unit configured to receive a power supply voltage generated based on the DVS code as a feedback and generate a monitoring signal, and a phase difference measurement unit configured to compare the open loop source with the monitoring signal and set a hold time corresponding to an arithmetic period in a closed loop.

Abstract: Provided is a battery pack, which can prevent a plurality of battery modules from being abnormally assembled. The battery pack may include n battery modules; n slave battery management systems (BMSs) corresponding to the n battery modules, the n slave BMSs respectively and sequentially coupled to each other; and a master BMS coupled to the n slave BMSs. Here, the master BMS is configured to apply a trigger signal to a first slave BMS, the first to (n?1)th slave BMSs are configured to transmit the trigger signal and first to (n?1)th signals, which are different from each other, to a next slave BMS, an nth slave BMS is configured to transmit an nth signal to the master BMS.

Abstract: An integrated circuit includes a signal generating unit, a signal monitoring unit and a processing unit. The signal generating unit is configured to generate a control signal. The signal monitoring unit is configured to receive the control signal and accordingly output a monitor signal. The processing unit is configured to receive the monitor signal. The control signal is adjusted until the monitor signal is located within a preset range. A signal monitoring method used with the integrated circuit and a signal monitoring method used with a plurality of transistors are also provided.

Abstract: A signal compensation circuit includes a first path configured to cause a source signal to pass therethrough and be outputted as a first signal; a delay block configured to output a second signal by delaying the source signal by a predetermined time; a second path configured to cause the second signal to pass therethrough and be outputted as a third signal; and a signal combination block configured to generate a compensated signal by combining the first signal and the third signal.

Abstract: According to the present invention, a ring oscillator coupled to an output node operable to output a clock signal including a first logic level generated by a first odd number of delay circuits, and a second logic level different from the first logic level generated by a second odd number of delay circuits different from the first odd number of delay circuits.

Abstract: A shift register unit includes a latch circuit and a transmission circuit. The latch circuit is configured to process a clock signal received by its first clock signal end and a low level signal by a NOR operation to obtain a signal and output the obtained signal when a selection signal is of a high level; during a first time period where the selection signal is of a low level, process a signal outputted by the latch circuit when the selection signal is of a high level by a NOT operation, then process the resultant signal with a feedback signal by a NOR operation to obtain a signal and output the obtained signal; output a low level signal during a time period where the selection signal is of a low level other than the first time period.

Abstract: The present disclosure provides circuit and method embodiments for calibrating a signal of an integrated circuit. A programmable resistive element is coupled in series with a node of the integrated circuit, where at least part of the integrated circuit is formed in at least one front end of line (FEOL) device level. The programmable resistive element is formed in at least one back end of line (BEOL) wiring level, and the programmable resistive element is in a non-volatile resistive state that is variable across a plurality of non-volatile resistive states in response to a program signal applied to the programmable resistive element.

Abstract: Methods and systems for integrated circuit design using dynamic voltage scaling may comprise (a) designing an IC to meet a voltage dependent frequency specification, the IC design including feedback circuitry for controlling a power supply voltage to a fabricated instance of the IC design, (b) characterizing a fabrication process for corner lots for the IC design at a range of power supply voltage levels achievable by the feedback circuitry; (c) validating the IC design against the fabrication process if the frequency specification is achievable for essentially all instances of the IC design fabricated, wherein the feedback circuitry in each IC resulting from the IC design is operable to respectively adjust the power supply voltage of each IC resulting from the IC design by reducing the power supply voltage if the IC is from a fast corner lot and increasing power supply voltage if from a slow corner lot.

Abstract: A MOS device includes a number of standard cells configured to reduce routing congestions while providing area savings on the MOS device. The standard cells may be single height standard cells that share an n-type well isolated from other nearby n-type wells. The input and output signal pins of the single height standard cells may be configured in a lowest possible metal layer (e.g., M1), while the secondary power pins of the single height standard cells may be configured in a higher metal layer (e.g., M2). Interconnects supplying power to secondary power pins may be configured along vertical tracks and shared among different sets of standard cells, which may reduce the number of vertical tracks used in the MOS device. The number of available horizontal routing tracks in the MOS device may remain unaffected, since the horizontal tracks already used by the primary power/ground mesh are used for power connection.

Abstract: A delay line circuit is provided and includes a fine delay unit and coarse delay units. Each fine delay circuit includes a first PMOS transistor; a first NMOS transistor; second PMOS transistors whose widths of gate features of the second PMOS transistor are equal; at least one third PMOS transistor, coupled between the power voltage and the source of the first PMOS transistor, whose width of gate features is smaller than the widths of the gate features of the second PMOS transistors, second NMOS transistors whose widths of gate features of the second NMOS transistors are equal; and at least one third NMOS transistor, coupled between the ground voltage and the source of the first NMOS transistor, whose width of gate features is smaller than the widths of the gate features of the second NMOS transistors.

Abstract: A delay line circuit is provided and includes a fine delay unit and coarse delay units. Each fine delay circuit includes a first PMOS transistor; a first NMOS transistor; second PMOS transistors whose widths of gate features of the second PMOS transistor are equal; at least one third PMOS transistor, coupled between the power voltage and the source of the first PMOS transistor, whose width of gate features is smaller than the widths of the gate features of the second PMOS transistors, second NMOS transistors whose widths of gate features of the second NMOS transistors are equal; and at least one third NMOS transistor, coupled between the ground voltage and the source of the first NMOS transistor, whose width of gate features is smaller than the widths of the gate features of the second NMOS transistors.

Abstract: A controllable delay element includes a delay element to provide a variable delay from an input signal to an output signal. The variable delay can be controlled by a digital delay input. The delay element has a delay range that is controlled in response to a delay range input. The delay range of the delay element can be calibrated to a desired range of delays in response to a relative delay between a first timing reference and a second timing reference. A common timing reference is applied to a plurality of receivers and a strobe receiver. The delay through the strobe receiver is adjusted to measure the delay mismatches between the plurality of receivers. The mismatches are used to select a value for the delay through the strobe receiver.

Abstract: The present invention discloses a time-to-digital converter. The time-to-digital converter includes: a phase interpolation circuit and a time-to-digital conversion circuit. The phase interpolation circuit is configured to receive a first reference clock signal and a second reference clock signal; perform phase interpolation on the first reference clock signal and the second reference clock signal to generate a third reference clock signal; and output the third reference clock signal to the time-to-digital conversion circuit.

Abstract: An apparatus may include a delay line having a first delay value corresponding to first operating conditions of the apparatus and a second delay value corresponding to second operating conditions of the apparatus. A monitoring circuit may monitor a time taken for a first clock edge of a clock signal to propagate through the delay line. A determining circuit may determine whether operating conditions of the apparatus are acceptable in response to the time taken.

Abstract: A method and an apparatus from such method for designing an integrated circuit (IC) that mitigates the effects of process, voltage, and temperature dependent characteristics on the fabrication of advanced IC's but provides high die yields, lower power usage, and faster circuits. Conventional design process takes into account power supply voltage Vdd as a variable that must be considered in a skewed corner analysis. The disclosure teaches that the IC design process can be substantially simplified by essentially factoring out voltage based variations in corner lot analysis for IC designs that include dynamic voltage scaling circuitry, because each fabricated IC die of an IC design having dynamic voltage scaling can individually adjust the applied supply voltage Vdd within a range to offset local process-induced variations in the performance of that specific IC die.

Abstract: A method for controlling charging of a secondary cell including a positive electrode containing a positive-electrode active substance having that increases resistance in accordance with an increase in the SOC, a negative electrode; and a non-aqueous electrolyte includes performing constant-current charging at a set current value to a prescribed upper-limit voltage, performing constant-voltage charging at the upper-limit voltage after the upper-limit voltage V1 has been reached, and terminating charging of the secondary cell when the charging current in the constant-voltage charging has decreased to a cutoff current value, the cutoff current value being set to a current value that complies with the relationships in formulas (I) and (II): Cutoff current value A2?set current value A1×X??(I) X=(cell resistance R1 of secondary cell in target SOC [?]×set current value A1 [A])/upper-limit voltage V1 [V].

Abstract: Disclosed herein is an apparatus that includes a first semiconductor chip including a first electrode, and a second semiconductor chip including a second electrode connected to the first electrode. One of the first and second semiconductor chips includes a first temperature sensor circuit generating a first detection signal, the first detection signal taking a first level when a temperature is equal to or higher than a first temperature, the first detection signal taking a second level when the temperature is lower than the first temperature; and a first delay code generation circuit outputting a first delay code signal in response to the first level of the first detection signal, and outputting a second delay code signal different from the first delay code signal in response to the second level of the first detection signal.

Abstract: An apparatus for providing time adjustment of an input signal includes a coarse timing digital-to-analog converter (DAC), a replica delay element and an interpolator. The coarse timing DAC has multiple delay settings for providing a coarse timing adjustment of the input signal, and outputs a first delayed signal by delaying the input signal by a first delay time corresponding to a selected setting of the multiple delay settings. The replica delay element receives the first delayed signal from the coarse timing DAC and outputs a second delayed signal by delaying the first delayed signal by a predetermined second delay time. The interpolator blends either the input signal and the first delayed signal or the first delayed signal and the second delayed signal for providing a fine timing adjustment of the input signal, and outputs a timing adjusted output signal including the coarse timing adjustment and the fine timing adjustment.

Abstract: A semiconductor device including an input terminal to receive an input signal and an output terminal to output an output signal includes delay elements connected in series with the input terminal and each to assign the delay to the input signal input from the input terminal, selectors connected to output sides of the delay elements and each to select one of output signals of the delay elements based on a selection signal for selecting the one of the output signals of the delay elements to return the selected one of the output signals to the output terminal, and delay circuits disposed corresponding to the selectors and each to cause switching of the selection signal input into a corresponding one of the selectors to occur after switching of a signal level of the input signal input into the corresponding one of the selectors serving as a signal turning point.

Abstract: A panel display device is provided, which includes: a transparent back panel having a first surface and a second surface, where the first surface is adapted for reflecting incident lights from the outside, and the second surface is adapted for transmitting lights from the outside; a backlight source, disposed at one side of the second surface of the transparent back panel, which is adapted for emitting lights to the transparent back panel; a polarized grating, disposed at one side of the first surface of the transparent back panel, which includes a plurality of grating strips with gaps formed between neighboring grating strips, where the polarized grating enables the incident lights from the transparent back panel to be polarized and then pass through the gaps; a semiconductor switch array; and a transmission light valve array. The panel display device of the disclosure increase the utilization efficiency of lights.

Abstract: Representative implementations of devices and techniques provide a time delay based on an input value. A digital delay may be generated based on a coarse delay and a fine delay. The coarse delay may be selected based on the input value. The fine delay may be selected from an overlapping set of fine delay intervals, based on the selected coarse delay. In some implementations, a control component may be used to select the fine delay when more than one fine delay interval is indicated.

Abstract: Adaptive voltage scalers (AVSs), systems, and related methods are disclosed. The AVSs are configured to adaptively adjust voltage levels powering a functional circuit(s) based on target operating frequencies and delay variation conditions to avoid or reduce voltage margin. In one embodiment, the AVS includes an AVS database. The AVS database can be configured to store voltage levels for various operating frequencies of a functional circuit(s) to avoid or reduce voltage margin. The AVS database allows rapid voltage level decisions. The voltage levels stored in the AVS database may be initial, minimum, learned, populated, explored, backed out, temperature-based, and/or age-based voltage levels according to disclosed embodiments to further avoid or reduce voltage margin. An AVS module may be a software-based module that consults the AVS database to make voltage level decisions. Providing the AVS module as a software-based module may allow flexibility in configuring the AVS module and/or the AVS database.

Abstract: A ring oscillator (RO) based Design-For-Trust (DFTr) technique is described. Functional paths of integrated circuit (IC) are included in one or more embedded ROs by (1) selecting a path in the IC, based on path selection criteria, that has one or more unsecured gates, and (2) embedding one or more ROs on the IC until a stop condition is met. An input pattern to activate embedded RO is determined. Further, a golden frequency which is a frequency at which the embedded RO oscillates, and a frequency range of the embedded RO are determined. A Trojan in the IC may be detected by activating the embedded RO (by applying the input pattern), measuring a frequency at which the embedded RO oscillates, and determining whether or not a Trojan is present based on whether or not the measured frequency of the RO is within a predetermined operating frequency range of the RO.

Abstract: Techniques for fixing hold violations using metal-programmable cells are described herein. In one embodiment, a system comprises a first flip-flop, a second flip-flop, and a data path between the first and second flip-flops. The system further comprises a metal-programmable cell connected to the data path, wherein the metal-programmable cell is programmed to implement at least one capacitor to add a capacitive load to the data path. The capacitive load adds delay to the data path that prevents a hold violation at one of the first and second flip-flops.

Abstract: A method of and circuit for improving stabilization of a non-Foster circuit. The method comprises steps of and the circuit includes means for measuring a noise hump power at an antenna port or an output port of the non-Foster circuit, comparing the measured noise hump power with a desired level of noise power that corresponds to a desired operating state of the non-Foster circuit, and tuning the non-Foster circuit to generate the desired level of noise power to achieve the desired operating state of the non-Foster circuit.

Abstract: A pulse generator comprising: an input for receiving a trigger; an output node for outputting a signal; a delay line comprising one or more delay units and a plurality of taps; one or more pull-up devices each connected to the output node for increasing the output voltage on the output node; and/or one or more pull-down devices each connected to the output node for decreasing the output voltage on the output node; wherein the taps of the delay line are operably connected to the pull-up and/or pull-down devices such that a trigger passing along the delay line activates one or more of the pull-up and/or one or more of the pull-down devices more than once. Re-use of the pull-up and/or pull-down devices enables longer and more complex pulse shapes, such as high-order Gaussian pulse shapes to be produced while keeping the number of components low, thus reducing chip area, power requirements and parasitic capacitance.

Abstract: An integrated circuit (IC) includes a plurality of input/output (I/O) terminals through which signals pass into or out of the IC and an I/O timing module. The I/O timing module is configured to add propagation delay to signals passing between the I/O terminals and I/O subsystems of the IC. The I/O timing module includes a plurality of delay elements associated with each of the I/O terminals, a control register associated with each of the I/O terminals, a memory, and I/O delay control logic. The control register is coupled to each of the delay elements associated with the I/O terminal. The memory is encoded with delay information. The I/O delay control logic is configured to initialize the propagation delay associated with each of the I/O terminals by selecting which of the delay elements are to be applied to produce the propagation delay based on the delay information stored in the memory.

Abstract: In an embodiment, a delay circuit includes a delay line with a clock input signal and a delayed clock output signal that is based on a setting value. Each delay element of the delay line receives one of several delay element select signals and outputs a delayed signal based on the delay element select signal. The setting value may be a binary encoded value representing the desired delay. The delay element select signals may correspond to a thermometer encoded value of the binary encoded setting value.

Abstract: Representative implementations of devices and techniques provide bipolar time-to-digital conversion. For example, either a positive time duration or a negative time duration may be converted to a digital representation by a linear time-to-digital converter (TDC). A set of logic functions may be applied to the input of the TDC to provide start and/or stop signals for the TDC. Further, a correction component may be applied to an input or an output of the TDC to compensate for a delay offset of the TDC.

Abstract: An apparatus for delaying a plurality of chain-based time-to-digital circuits (TDCs). The apparatus includes a plurality of propagation path devices each connected to a respective one of the plurality of TDCs, each propagation path device delays a common start signal by a selectable amount based on a delay selection signal received by the propagation path device, and transmits the delayed start signal to the respective one of the TDCs.

Abstract: In an embodiment, a delay circuit includes a delay line with a clock input signal and a delayed clock output signal that is based on a setting value. Each delay element of the delay line receives one of several delay element select signals and outputs a delayed signal based on the delay element select signal. The setting value may be a binary encoded value representing the desired delay. The delay element select signals may correspond to a thermometer encoded value of the binary encoded setting value.

Abstract: A computing circuit that includes clocked circuitry, a controller, and a clock generator. The clocked circuitry is configured to receive data and to perform data manipulation on the data based on a first clock signal. The controller is configured to control the transmission of the data to the clocked circuitry. The clock generator is configured to receive as inputs a second clock signal and a delay control signal from the controller, and to delay the second clock signal to generate the first clock signal. The clock generator includes a main delay component configured to receive the second clock signal and to output the first clock signal. The clock generator also includes a switchable delay component connected in parallel with the main delay component, where the switchable delay component is configured to receive as an input the delay control signal from the controller.