Abstract: A coordinate measuring machine operable to employ pentapod kinematics to determine the absolute position at a measuring point tip by measuring about five axes. The machine comprises a first, bifurcated linkage, a second, trifurcated linkage, and a plurality of elongate struts. First and second ones of the plurality of struts share the first linkage, third, fourth and fifth ones of the plurality of struts share the second linkage, and the first and second linkages are coupled via a handle. The first and second struts are preferably rotatably engaged to the first linkage, and the third, fourth and fifth struts may be rotatably engaged to the second linkage. First through fifth nodes may be provided, each node being slidably engaged to a corresponding one of the first through fifth struts. The nodes may comprise means for measuring the displacement of the corresponding strut relative to the node.

Abstract: A probe head having a probe head base and a stylus is provided for contacting a surface point on a workpiece. The stylus is moveable relative to the probe head base and has a defined rest position relative to the probe head base. For the contacting, the probe head is moved relative to the workpiece until the stylus touches the surface point with a defined contacting force. A correction data record representing a hysteresis behavior of the stylus with respect to the rest position is provided, and the contacting force is determined using the correction data record.

Abstract: An approach controller (234) of a coordinate measuring instrument enables a position control loop (RP) and drives an actuator (133) so that a force sensor (1) is brought to a close position under a position control. When recognizing that the force sensor (1) reaches the close position, a contact controller (235) controls a switch (227) to enable a force control loop (RF) and drives the actuator (133) to bring the force sensor (1) into contact with a workpiece under a force control.

Abstract: A measuring apparatus includes a workbench including a fixing board, four trigger units, a sliding member, a positioning unit for fixing an article, an electrical controlling cage, and an indicating member electrically connected to the trigger units. The sliding member includes a receiving body defining a guiding hole, and distal ends of the trigger units are received in the guiding hole. The fixing board, the indicating member and the trigger units are electrically connected to the electrical controlling cage. The electrical controlling cage is turned on, and the article is passed through the guiding hole. If any trigger unit cannot be triggered to turn on the corresponding indicating member, the portion to be measured of the article is qualified; if any trigger unit is triggered to turn on the corresponding indicating member, the portion to be measured on the article is disqualified.

Abstract: A contour measuring device includes a guide rail, a slidable assembly, and a measuring probe. The slidable assembly is slidably engaged with the guide rail. The slidable assembly includes a weight adjusting unit connected to the slidable assembly. At least part of the weight adjusting unit is detachable from the slidable assembly. The measuring probe is fixed on the slidable assembly. A weight of the slidable assembly provides a measuring force and a weight of the weight adjusting unit is adjustable to adjust a value of the measuring force.

Abstract: A device, a method and a guiding device for setting out contours, points or works, comprising a computer-controlled measuring device provided with a movable measuring probe and a portable base unit provided with a rotatably supported elongate arm. The measuring probe is connected to the measuring device by means of a cord or a wire via the elongate arm, and the measuring device is provided with sensors for measuring a length or a change in the length of the cord or the wire and rotation of the arm in at least one degree of freedom for providing position data of the measuring probe. A guiding device communicatively connected to the measuring device is designed for providing guidance for positioning the measuring probe for the purpose of reducing a difference between a measured position of the measuring probe and a desired position of the measuring probe in accordance with a contour, point or work to be set out.

Abstract: The present invention concerns a connection device for use in an articulated apparatus comprising two or more tandemly arranged interconnected movable segments, for limiting rotation between two adjoining segments connected by a joint having a single axis of rotation, comprising: a spring assembly comprising one or more helical torsion springs, which assembly has a first end and a second end, configured for placement co-axially along the joint axis of rotation; a stop pin adapted for attachment to one adjoining segment, another stop pin adapted for attachment to the other adjoining segment, each pin moveable around the axis of rotation in fixed relation to the attached segment, wherein the first end of the spring assembly is configured for disengageable connection with the stop pin of one segment, and the second end is configured for disengageable connection with the stop pin of the other segment, such that the degree of rotation by the one segment about the joint axis relative to the other segment is limited

Abstract: A scale base is fixed to a base in a plurality of locations which are aligned in a measuring direction (a Y direction) in which measurement by a scale is carried out, slits are provided in the scale base in positions lying between the locations where the scale base is fixed to the base, the scale is supported by the scale base in two or more of the locations where the scale base is fixed to the base, and the scale base has gaps between the base and the scale base in positions other than the locations where the scale base is fixed to the base and between the scale and the scale base in the positions other than the locations where the scale base is fixed to the base.

Abstract: In one embodiment, a coordinate measurement apparatus includes an articulated arm having a first end and a second end with at least a first arm segment and a second arm segment therebetween. Further, the apparatus can comprise at least one ball and socket joint connecting the first arm segment to the second arm segment, with the ball and socket joint including a ball member and a socket member, and a measurement probe attached to the first end of said articulated arm.

Abstract: An exemplary contour measuring probe includes a guide (12), a movable rack, a counter-balancing mechanism, a linear measuring scale (24), and a displacement sensor (26). The movable rack comprises a tip extension (20) for touching a surface of an object. The tip extension (20) is pushed to move towards the object under a gravitational force acting on the movable rack. The counter-balancing mechanism is configured to partially counter balance the gravitational force acting on the movable rack. The linear measuring scale (24) displays values of displacements of the tip extension (20). The displacement sensor (26) detects and reads the displacement values displayed by the linear measuring scale (24).

Abstract: A surface texture measuring instrument includes: a movement-estimating unit for estimating a movement condition of a drive mechanism based on a scanning vector command issued by a scanning vector commander to calculate an estimated operation state quantity; and a correction-calculating unit for correcting a detection value of a drive sensor in accordance with the estimated operation state quantity calculated by the movement-estimating unit. The movement-estimating unit includes: a nominal-model setting unit in which a nominal model representing signal transfer function of the scanning vector command from the issuance of the scanning vector command to a reflection on a movement position of the scanning probe is stored.

Abstract: The base of the micrometer is made of steel (1). The base of the micrometer is attached to three rubber micrometer feet (2). The rubber micrometer feet help reduce vibrations which lead to accurate test sample measurements. Recessed in the base of the micrometer is the bottom anvil (3). Directly above the bottom anvil is the top anvil (4), which is screwed into the plunger (5). The plunger has a set screw which holds the steel shaft (6) to the plunger in order for the plunger and steel shaft to work as one unit. The steel shaft fits up inside of the brass bushing (7) which results in a tight tolerance. The micrometer frame (8) is the unit that holds all the components together. The brass bushing is pressed into the micrometer frame. The base of the micrometer is screwed to the frame with four screws. The micrometer frame stop (9) is screwed to the top of the micrometer frame with four screws.

Abstract: In probing by scanning a workpiece (71) to be measured using a coordinate measuring machine a stylus tip is moved before the scanning along a scanning path (73) along an initialization path (83) or/and after the scanning path (73) along a finalization path (85). A length (Lv, Ln) of the initialization path, respectively finalization path, is chosen in dependence of parameters of a concrete measuring task, in particular in dependence of a pre-determined scanning speed, a stiffness of the stylus or a mass of the stylus.

Abstract: A method for sensing an object profile shape involves relatively sweeping (whisking or translating) in angular or translational increments an elongated whisker element having a deflectable cantilever region and an object so that the cantilever region bends as a result of sliding along an object periphery. The moment (torque) at a base region of the whisker element as a result of the bending is determined. The method then iteratively determines successive contact point locations on the object periphery based on small successive increments in angle or position of the whisker element and the sensed moment (torque).

Abstract: An exemplary base includes a first elastic element, a second elastic, two first adjustable spacers and two second adjustable spacers. The first elastic element includes two first spaced plates and a first connecting element for connecting the two first spaced plates. The second elastic element includes two second spaced plates and a second connecting element for connecting the two second spaced plates. The first connecting element and the second connecting element are not in a plane. Two first adjustable spacers connect the two first spaced plates and adjust a distance between the two first spaced plates. Two second adjustable spacers connect the two second spaced plates and adjust a distance between the two second spaced plates.

Abstract: The positioning and measuring system includes a coordinate positioning machine comprising a movable spindle (60) movable relative to a reference surface 30, a rotor (100) rotatably connected with the movable spindle, an actuator (500) for driving the rotor (100) in rotation around a rotation axis (65), and a coordinate probe (150, 190) detachably connectable to the rotor (100) for measuring coordinate of points (350) of a workpiece (200, 201, 250) along a path resulting from the composition of a translation movement of the spindle (60) and a rotation of the rotor (100). The points (350) are offset (r) with respect to the rotation axis (65) of the rotor (100).

Abstract: A method is described for measuring a workpiece on a machine tool using an analogue probe having a deflectable stylus. The method comprises the step of taking a workpiece having a nominal surface profile, the workpiece being located within the working area of the machine tool. The machine tool is used to move the analogue probe along a predetermined (known) measurement path relative to the workpiece whilst deflection of the stylus is measured. The analogue probe is moved relative to the workpiece at a speed greater than five millimeters per second and the predetermined measurement path is selected to provide intermittent contact between the stylus and the workpiece.

Abstract: An edge detect system, using a torch height control system based on the use of a free floating probe in contact with the workpiece, uses a drop in pressurized air supplied to the probe tip in contact with the workpiece when the probe moves off the plate edge to generate a signal that prevents the torch from following the free floating probe downwardly and thereby prevents the cutting tool from crashing into the workpiece.

Abstract: An exemplary contour measuring probe (10) includes a tube guide (12), a tip extension (20), a pair of hollow tubes (16), a plurality of pipes (104, 106), a linear measuring scale (18), and a displacement sensor (19). The tip extension (20) is configured to touch a surface of an object (50). The hollow tubes (16) are configured to be driven by a flux of air to push the tip extension (20) to move. The pipes (104, 106) are obliquely disposed in a tube guide (12) relative to the hollow tubes (16). The pipes (104, 106) allow the flux of air to be pumped on a sidewall of the hollow tubes (16). A part of the flux of air is ejected out of the tube guide (12). The linear measuring scale (18) and the displacement sensor (19) are respectively fixed relative to one of the tube guide (12) and the tip extension (20). The linear measuring scale (18) displays values of displacements of the tip extension (20). The displacement sensor (19) detects and reads the displacement values displayed by the linear measuring scale (18).

Abstract: A method for scanning a surface of a workpiece 1 at a constant scanning speed /va/ using a scanning probe 2 mounted on a support 3 on a coordinate measuring machine (CMM) 4. The CMM contains a first set of drive means (6, 7, 8) to move the support according to three linear axis (x,y,z), and the support 3 contains a second set of drive means (14, 17) for actuating the movement of the scanning probe 2 with two degrees of freedom relative to said support 3. The method involves control means 33 coupled to the sets of drive means (6, 14, 17), and memory means for storing theoretical profiles and coordinates of the surface to scan.

Abstract: A method for scanning a work piece surface uses a coordinate measurement device. A probe element is brought into contact with the surface and the probe element is moved along the surface. The coordinate measurement device has a plurality of degrees of freedom, which are independent of one another, in the possible movements of the probe element with respect to the work piece. Maximum speeds which describe the maximum of a movement speed component of the probe element based on the respective degree of freedom are defined for the degrees of freedom. An estimated path on which the probe element is intended to move during scanning is predefined. The actual scanning path can differ from the estimated scanning path. A maximum scanning speed at which the estimated scanning path can be traveled with a constant speed of the probe element is determined.

Abstract: A depth checking device includes a body member, a pressing member, a checking member and an adjustment nut. The body member defines a stepped through hole forming a stopping surface inside. The pressing member includes a first end and an opposite second end. The first end includes a first end surface defining a first opening. The second end defines a second opening. The checking member is mounted in the stepped through hole and includes an indication end adjacent to the first end and a probe end. The indication end includes a second end surface. The adjustment nut is screwed on the checking member and supported by the stopping surface in a position where the first end surface is coplanar with the second end surface and the probe end protrudes from the body member with a protruding length of the probe end same as a designed depth of a fixing hole.

Abstract: A measurement probe for use in coordinate measuring machines, which measurement probe includes a base (1) connected with a coordinate measuring machine, a measurement tip (4) and a ball (5) arranged at the first end of the measurement tip (4). The measurement tip (4) is supported at its other end with the aid of at least three rigid supports (2) supported by the base (1), whereby the supports (2) are connected with the measurement tip by way of spherical connections and where the supports (2) can be displaced along their longitudinal directions relative to the base (1).

Abstract: A moving vector calculation unit calculates a moving vector M representing a quantity and a direction of movement of a probe on basis of a stylus displacement vector, a stylus displacement vector D, and a direction change angle ? of the stylus displacement vector D that is caused by a frictional force between a stylus 32 and the measuring surface 5a during scanning of the measuring surface 5a by the stylus 32. The stylus displacement vector D is a vector including a quantity and a direction of position displacement of the stylus 32 relative to the probe 5. Movement of an XY-stage 7 is controlled so that the probe 6 moves in accordance with the moving vector M.

Abstract: An exemplary contour measuring probe (10) includes a tip extension (16) and two driving members (13). The tip extension is configured for touching a surface of an object. The driving members are configured for driving the tip extension linearly moving along a first direction. The driving members are tapered and a diameter of each driving member increases along the first direction. The driving members are driven to move by gas pressure acting on an outer side surface thereof.

Abstract: A coordinate measuring machine to determine the coordinates of a number of points on the surface of a measured object, includes a support beam, supporting a measuring head over the surface of a support table that supports the test object. The measuring machine is constructed from separately manufactured units, which include at least a support beam, a measurement trolley and a measurement head. The support beam supports the measurement trolley, which is displaceable along the support beam. The measurement trolley in turn supports the measurement head. The beam, head and trolley are individually calibrated, and the trolley includes both mechanical and electrical attachment points for the head and the beam, where the mechanical attachment points are designed such that no geometric deformation can take place when these units are joined together such that the units, which have been individually manufactured, can be simply joined to the coordinate measuring machine.

Abstract: A metal element inspection device comprising a conveying portion for sequentially transporting a plurality of metal elements, wherein a flank side recessed part formed in a metal element for a Continuously Variable Transmission belt is placed on a rail and travels along that rail; and an inspection rod inserted in noncontact with an opposite side recessed part of that metal element in the conveying state. The inspection device inspects for the existence of foreign matter being present as a result of interference by an uplifted portion of a metal element from the rail due to foreign matter lodged between a flank side recessed part of a metal element and the inspection rod, or interference by foreign matter lodged between an opposite side recessed part of that metal element and the inspection rod.

Abstract: A stylus for key duplicating machine with replaceable segmented stylus comprising a cylindrical body; a spring-loaded tracer having a slide spindle movably engaged in one end of the cylindrical body, and a replaceable segmented stylus releasably secured on the front end of the slide spindle for replacement of the worn replaceable segmented stylus damaged during key duplicating by new one easily; and a regulating grip angularly movably engaged in the other end of the cylindrical body.

Abstract: A coordinate measurement machine can include a battery positioned at least partially within the base of the machine. The battery allows operation of the coordinate measurement machine in locations that are remote from an AC power supply. The battery can be rechargeable and can be positioned in a battery adapter that serves as a battery charger. The coordinate measurement machine can also include a cover to enclose the battery within the base. The cover can include one or more sealing members to keep contaminants and other external objects away from the battery. The cover can be fastened to be base, for example, with bolts. The sealing members can be o-rings, gaskets, silicon membranes, seals, sealants, or another material. This sealed cover can meet or exceed industry standards for the protection of electrical components, such as ingress protection standard IP65 as administered by the International Electrotechnical Commission.

Abstract: A probe head having a probe head base and a stylus is provided for contacting a surface point on a workpiece. The stylus is moveable relative to the probe head base and has a defined rest position relative to the probe head base. For the contacting, the probe head is moved relative to the workpiece until the stylus touches the surface point with a defined contacting force. A correction data record representing a hysteresis behavior of the stylus with respect to the rest position is provided, and the contacting force is determined using the correction data record.

Abstract: A measurement probe 1 for measuring a surface of sample S comprises a base section 10, a head section 30 having a probe tip 31, and a support structure section 15 which supports the head section 30 with the base section 10 along a support axis substantially orthogonal to the vertical axis in the direction of protrusion of the probe tip 31. The support structure section 15 includes two spring structure sections of a first spring structure section 20 deformable in the direction of the vertical axis; and a second spring structure section 25 deformable in the direction of the lateral axis, and a reflection surface 32 which is formed with a reflection pattern varying the reflectance within the surface is provided at the side opposite to the probe tip 31 of the head section 30.

Abstract: A clamping device for a machine tool for processing workpieces, comprises a clamping body having at least one clamping face for clamping an object to be clamped, in particular a tool or a workpiece, and a sensor arrangement for measurement of a planar setting of a face of the object to be clamped on at the least one clamping face or a possible gap between the face of the object to be clamped and the at least one clamping face. In the case of the clamping device for the machine tool there is a provision such that the sensor arrangement has at one planar setting sensor for the detection of a distance between the at least one planar setting sensor and a portion of the object clamped in the clamping device, projecting laterally in front of the at least one clamping face, and that the at least one planar setting sensor is arranged on a portion, which is set back in relation to the at least one clamping face, of the clamping body.

Abstract: A probe system includes a probe head and a transceiver element. The probe head has a feeler and a sensor element. Moreover, the probe head is able to be transferred from a passive state to an active state, a sensor signal being able to be generated by the sensor element in the active state. The probe head and the transceiver element are configured such that a wireless data transmission is possible between them in a manner that the sensor signal is convertible in the probe head into a switching signal which is transmittable from the probe head to the transceiver element. During the active state, a control command is able to be transmitted continuously in wireless fashion by the transceiver element, the active state of the probe head being able to be maintained by the continuously transmitted control command. Furthermore, the switching signal is able to be transmitted without collision with respect to the transmission of the control command.

Abstract: A spherometer for measuring at least one physical parameter of the workpiece includes at least on fluid-actuated linearly extensible probe member having an output indicative of an amount of linear travel and a chamber housing the linearly extensible probe member. The chamber has an aperture for supporting a workpiece and a vacuum line is coupled to the chamber for creating a vacuum. The probe member is activated as a result of the vacuum in the chamber, causing it to extend linearly toward the workpiece until touching it. The linear extension of the probe may be used as a measurement of distance. The distance measured to a workpiece may be compared to a standard to determine a physical parameter of the workpiece.

Abstract: The invention relates to a method for determining the co-ordinates of a workpiece (9). According to said method: a first co-ordinate system, which has a fixed position in relation to the workpiece (9), is defined; first co-ordinates of the workpiece (9) are measured using a first co-ordinate measuring device (3); second co-ordinates of the workpiece (9) are measured using a second co-ordinate measuring device (5); and a common set of co-ordinates is generated from the first co-ordinates and the second co-ordinates in the first co-ordinate system or in a second co-ordinate system, which has a fixed position in relation to the workpiece (9). The method can be used in particular to determine co-ordinates of a plurality of workpieces (9) during and/or after the production and/or processing of the workpieces (9).

Abstract: A system and a method for the transmission of signals representative of an event include a first low frequency clock (101) and a low frequency counter (102) for generating a first delay (TL), and a second high frequency clock (106) and a high frequency counter (104) for generating a second delay (TH). The system further includes a transmitter (105) for transmitting the representative signals after a delay from the event made up by the sum of the first and the second delay. The second delay can be generated also by an analogic device including for example a capacitor (99), and devices (97) for charging the capacitor up to the reaching of a preset voltage at its ends. A wireless transmission system according to the invention is utilized in a checking system with a contact detecting probe (1), for transmitting a signal representative of contact with the piece to be checked.

Abstract: An exemplary contour measuring probe (10) includes a tip extension (16) and two driving members (13). The tip extension is configured for touching a surface of an object. The driving members are configured for driving the tip extension linearly moving along a first direction. The driving members are tapered and a diameter of each driving member increases along the first direction. The driving members are driven to move by gas pressure acting on an outer side surface thereof.

Abstract: A probe includes a sensor having a pressure-sensitive surface, electrical signals being producible by the sensor when pressure forces are acting that have a directional component orthogonal to the pressure-sensitive surface. The probe includes a probe element, which is supported in a movable manner relative to the sensor, and a mechanical transmission element. The probe includes a diaphragm, which is arranged between the transmission element and the pressure-sensitive surface of the sensor. The probe element, the transmission element, the diaphragm and the sensor are in a mechanical operative connection such that by contacting the probe element, a change in the level of the electrical signal is producible by the sensor.

Abstract: A spherometer for measuring at least one physical parameter of the workpiece includes at least on fluid-actuated linearly extensible probe member having an output indicative of an amount of linear travel and a chamber housing the linearly extensible probe member. The chamber has an aperture for supporting a workpiece and a vacuum line is coupled to the chamber for creating a vacuum. The probe member is activated as a result of the vacuum in the chamber, causing it to extend linearly toward the workpiece until touching it. The linear extension of the probe may be used as a measurement of distance. The distance measured to a workpiece may be compared to a standard to determine a physical parameter of the workpiece.

Abstract: A metrology instrument, such as a probe, probe head, stylus or stylus arm, for mounting on a coordinate position apparatus. The metrology instrument is at least partially constructed from at least one sheet of thermally stable metallic material which is folded to form a three dimensional structure. The at least one sheet of thermally stable material is utilized in the metrology loop of the metrology instrument.

Abstract: A measurement probe for use in coordinate measuring machines, which probe comprises a base (1) connected to a coordinate measuring machine, a measurement tip (4) and a ball (5) arranged at the first end of the measurement tip (4). The measurement tip (4) is supported at its second end with the aid of at least three rigid supports (2) supported by the base (1), whereby the supports (2) are connected to the measurement tip by means of spherical connections and where the supports (2) can be displaced along their longitudinal directions relative to the base (1). The supports (2) are arranged such that they pass through the base (1), and can be displaced along their longitudinal directions by protruding to a greater or lesser degree on the side of the base (1) that is opposite relative to the measurement tip holder (3).

Abstract: An exemplary measuring device (100) for measuring aspects of objects includes a first contour measuring probe (10), a second contour measuring probe (20) and a processor (30). The first contour measuring probe (10) has a first tip extension (16) and a first displacement sensor (19). The first tip extension (16) is slidable in a first direction. The first displacement sensor (19) is used to sense a displacement of the first tip extension (16). The second contour measuring probe (20) has a second tip extension (26) and a second displacement sensor. The second tip extension (26) is slidable in the first direction. The second displacement sensor is used to sense a displacement of the second tip extension (26). The processor (30) is electrically connected to the first displacement sensor (19) and the second displacement sensor respectively.

Abstract: An exemplary contour measuring method for measuring aspects of objects includes: (1) providing a measuring device including two contour measuring probes and a processor, the contour measuring probe having a tip extension and a displacement sensor used to sense a displacement of the tip extension, the processor being electrically connected to the displacement sensors; (2) driving two tip extensions to contact two opposite surfaces of an object respectively; (3) driving the two tip extensions to move and contacting the two opposite surfaces of the object respectively, while the displacement sensors sending the displacement information on the tip extensions to the processor; (4) computing a cross-section of the object by the processor according to the displacement information on the tip extensions; (5) repeating the step (3) and (4), the processor computing a plurality of cross-sections of the object, the cross-sections compiled to obtain aspects of object.

Abstract: A probe has internal circuitry capable of operating in a plurality of different modes, for example a variety of filter modes and turn off modes. A switch on the probe sends an input to a controller which is arranged to set the mode in response to operation of the switch. The switch may be a push button which is operated externally of the probe by means of an actuator in the form of a plunger. The probe has a workpiece-contacting stylus mounted on a seat from which it is deflectable. The stylus and the seat may comprise the switch. An indicator, e.g., an LED, indicates the mode in response to an output from the controller. The controller outputs a plurality of indications of different modes in a sequence and a mode is selected by operating the switch once the desired mode is indicated.

Abstract: An exemplary base includes a first elastic element, a second elastic, two first adjustable spacers and two second adjustable spacers. The first elastic element includes two first spaced plates and a first connecting element for connecting the two first spaced plates. The second elastic element includes two second spaced plates and a second connecting element for connecting the two second spaced plates. The first connecting element and the second connecting element are not in a plane. Two first adjustable spacers connect the two first spaced plates and adjust a distance between the two first spaced plates. Two second adjustable spacers connect the two second spaced plates and adjust a distance between the two second spaced plates.

Abstract: An exemplary contour measuring probe (10) includes a tube guide (12), a tip extension (20), a pair of hollow tubes (16), a plurality of pipes (104, 106), a linear measuring scale (18), and a displacement sensor (19). The tip extension (20) is configured to touch a surface of an object (50). The hollow tubes (16) are configured to be driven by a flux of air to push the tip extension (20) to move. The pipes (104, 106) are obliquely disposed in a tube guide (12) relative to the hollow tubes (16). The pipes (104, 106) allow the flux of air to be pumped on a sidewall of the hollow tubes (16). A part of the flux of air is ejected out of the tube guide (12). The linear measuring scale (18) and the displacement sensor (19) are respectively fixed relative to one of the tube guide (12) and the tip extension (20). The linear measuring scale (18) displays values of displacements of the tip extension (20). The displacement sensor (19) detects and reads the displacement values displayed by the linear measuring scale (18).

Abstract: An exemplary contour measuring probe includes a guide (12), a movable rack, a counter-balancing mechanism, a linear measuring scale (24), and a displacement sensor (26). The movable rack comprises a tip extension (20) for touching a surface of an object. The tip extension (20) is pushed to move towards the object under a gravitational force acting on the movable rack. The counter-balancing mechanism is configured to partially counter balance the gravitational force acting on the movable rack. The linear measuring scale (24) displays values of displacements of the tip extension (20). The displacement sensor (26) detects and reads the displacement values displayed by the linear measuring scale (24).

Abstract: A probe head includes a feeler, a sensor unit, a CPU, a transmitting stage and a producer of electrical energy for supplying energy to the sensor unit, to the CPU and to the transmitting stage. An electrical signal is triggerable by the sensor unit in response to a deflection of the feeler which is convertible in the transmitting stage into an electromagnetic signal. The producer of electrical energy includes a turbine having rotor disk rotatable about an axis. Magnets are mounted on the rotor disk of the turbine, which are arranged across from stationary electrically conductive windings at an axial distance. The probe head includes a voltage transformer, at the output of which an output voltage is producible, which is greater than the input voltage applied to the voltage transformer, the output voltage being used to supply energy to the transmitting stage.

Abstract: Orientable probe (10) comprising a probe feeler (6) capable of being oriented along a plurality of indexed directions around a rotation center (O), thanks to two mobile elements (4, 5) that can turn: the first around a first axis (B) and relatively to a fixed support (3); the second around a second axis (A) and relatively to the first mobile element. The feeler (6) is fixed in a shifted position relatively to the rotation center (O).

Abstract: An apparatus for profiling the surface of a workpiece, including a probe adapted to make contact with the surface of a workpiece, a sensor for determining or deriving the force between the probe and the workpiece surface, an actuator that adjusts the position of the probe along an axis, which is generally perpendicular to the surface of the workpiece, in order to maintain a constant force between the probe and the surface, and a closed control loop, including a controller that controls the operation of the actuator based on information from the sensor.